CN101738505B - Test pallet - Google Patents
Test pallet Download PDFInfo
- Publication number
- CN101738505B CN101738505B CN2009101801665A CN200910180166A CN101738505B CN 101738505 B CN101738505 B CN 101738505B CN 2009101801665 A CN2009101801665 A CN 2009101801665A CN 200910180166 A CN200910180166 A CN 200910180166A CN 101738505 B CN101738505 B CN 101738505B
- Authority
- CN
- China
- Prior art keywords
- unit
- connector
- tray unit
- backlight
- panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a test pallet. According to one embodiment of the invention, the test pallet electrically connected with an object to be tested comprises a pallet unit provided with an installation unit on which the object to be tested is mounted, a connector unit electrically connected to the object to be tested, and a terminal unit electrically connected to the connector unit. The test pallet according to the embodiment of the invention can form the common electric connection with the object to be tested to test the electricity characteristic of the object.
Description
Quoting of related application
The rights and interests that the korean patent application that the application requires to submit to Korea S Department of Intellectual Property on November 25th, 2008 is 10-2008-0117723 number are hereby expressly incorporated by reference its whole disclosure contents.
Technical field
The present invention relates to a kind of test pallet (test tray).
Background technology
Power supply is used for operating the display device such as computer monitor and TV.Through being installed in, various electronic components make power supply on the printed circuit board (PCB); But; Before power supply prepare to be used, power supply must pass through a series of tests, comprised the test of checking electrical characteristics and was used to check the burn-in test (burn-in test) of its operating characteristic at high temperature.
For the electrical characteristics of testing power supply, must form a large amount of the electrical connection with proving installation, for example, receive the parts of electric power (or electric power, electric power) from the outside, be connected to the parts of display panel and be connected to parts backlight.
For each test process, for each electrical connection, the operator must be connected to each connector power supply and separate with power supply.This needs a large amount of labours, and has reduced work efficiency.In addition, the operator possibly cause damaging power supply and causing product defects to the repetitive operation of power supply.
Summary of the invention
The invention provides a kind of test pallet, it can carry out the electrical testing of the tested object with many wires through the many wires of common connection.
One aspect of the present invention provides a kind of test pallet.According to one embodiment of the present invention; Tray unit (or the disc unit that provides the test pallet that is electrically connected with object to be tested to comprise to be formed with installation unit on it; Pallet unit) (wherein, tested object is installed on the installation unit), the terminal unit (terminal unit) that is electrically connected to the connector unit of tested object and is electrically connected to connector unit.
Terminal unit can form on a side of tray unit.Test pallet can further comprise the block that is inserted in the fixed orifice, makes tested object be fixed to installation unit, wherein, is formed with a plurality of fixed orifices on the installation unit.In addition, test pallet can further comprise snap (snap fit) or Velcro band (Velcro band, velcro tape), and it is coupled to tray unit contiguously, makes the electric wire of tested object be fixed to tray unit.
Test pallet can further comprise sub-tray unit, and it is coupled to tray unit by this way, make sub-tray unit can be attached to tray unit and can separate with tray unit, but and installation testing object.Test pallet also can comprise the block that is inserted in the fixed orifice, makes tested object be coupled to sub-tray unit, wherein, is formed with a plurality of fixed orifices on the sub-tray unit.
Here, test pallet can further comprise the Velcro band, and it is coupled to sub-tray unit makes the electric wire of tested object be fixed to sub-tray unit.Then; Test pallet can further comprise socket tray unit (socket pallet unit), and wherein, the socket tray unit comprises the framework of tray unit on it and is positioned at the inlet unit on framework one side; Wherein, terminal unit is inserted in the inlet unit.
Tested object is a display power supply; It comprises the external power unit that is supplied with external power, with power be supplied to display panel the panel power cell, receive the feedback signal of display panel the panel signal receiver, power is supplied to the backlight power unit of display backlight and the backlight signal receiver that receives the feedback signal of display backlight; Wherein, Connector unit comprises external power connector, panel power connector, panel signal connector, backlight power connector and backlight signal connector; The external power connector is coupled to the external power unit; Make the external power connector can be connected to the external power unit and separate with the external power unit; The panel power connector is coupled to the panel power cell and makes the panel power connector can be connected to the panel power cell and separate with the panel power cell; The panel signal connector is coupled to the panel signal receiver and makes the panel signal connector can be connected to the panel signal receiver and separate with the panel signal receiver; The backlight power connector is coupled to the backlight power unit and makes the backlight power connector can be connected to the backlight power unit and separate with the backlight power unit, and the backlight signal connector is coupled to the backlight signal receiver and makes the backlight signal connector can be connected to the backlight signal receiver and separate with the backlight signal receiver.
Here, panel power connector, panel signal connector, backlight power connector, backlight signal connector and terminal unit can be formed on the printed circuit board (PCB), and printed circuit board (PCB) is formed on the side of tray unit.
In description subsequently, will partly set forth of the present invention other aspect and advantage, and partly will be obvious from describe, perhaps can know through practice of the present invention.
Description of drawings
Fig. 1 is the skeleton view according to the test pallet of one embodiment of the present invention.
Fig. 2 is the planimetric map according to the test pallet of one embodiment of the present invention.
Fig. 3 shows the planimetric map that is installed in according to the display power supply on the test pallet of one embodiment of the present invention.
Fig. 4 is the decomposition diagram according to the test pallet of another embodiment of the invention.
Fig. 5 is the skeleton view according to the sub-tray unit of another embodiment of the invention.
Fig. 6 is the planimetric map according to the sub-tray unit of another embodiment of the invention.
Fig. 7 shows the planimetric map that is installed in according to the display power supply on the test pallet of another embodiment of the invention.
Fig. 8 is the skeleton view according to the test pallet of another embodiment of the present invention.
Fig. 9 is the exploded view according to the socket tray unit of another embodiment of the present invention.
Figure 10 is the cut-open view according to the inlet unit of the socket tray unit of another embodiment of the present invention.
Figure 11 shows the front view that is inserted into the test pallet in the aging equipment (burn-in device) according to another embodiment of the present invention.
Embodiment
Through following accompanying drawing and description, it is obvious that feature and advantage of the present invention will become.
Below will the test pallet according to some embodiment of the present invention be described in more detail with reference to accompanying drawing.No matter figure number how, those identical or corresponding parts are all given identical reference number, and omit unnecessary description.
Fig. 1 is the skeleton view according to the test pallet 1000 of one embodiment of the present invention.As shown in Figure 1; Comprise according to being used to provide of one embodiment of the present invention with the test pallet that is electrically connected 1000 of tested object: surround tray unit 100, a plurality of connector unit 140 that is electrically connected to tested object of the installation unit 110 that tested object wherein is installed, and the terminal unit 132 that is electrically connected to a plurality of connector units 140.Test pallet 1000 according to one embodiment of the present invention can form common electrical connection the (collective electrical connection) with tested object, with the electrical characteristics of test tested object.
Except being used to install and transmit the function vector of tested object, test pallet 1000 can provide and being electrically connected of tested object through forming with being electrically connected with the electrical testing tested object of tested object.Tested object in this embodiment can be a display power supply, below described.
Fig. 2 is the planimetric map according to the test pallet 1000 of one embodiment of the present invention.As depicted in figs. 1 and 2, the installation unit 110 that display power supply is installed on it can be formed on the tray unit 100.Installation unit 110 be the parts that on a surface of tray unit 100, form the plane (part, part).Display power supply can be installed on the installation unit 110 and by its support.
A plurality of fixed orifices 112 can be formed on the installation unit 110.A plurality of fixed orifices 112 can be formed on the installation unit 110 with lattice with rule at interval.Block 120 can be inserted in the fixed orifice 112, with the edge of restriction display power supply.
Display power supply and test pallet 1000 can be electrically connected through using electric wire, and snap 116 can couple near installation unit 110 with Velcro band 118, make can fitly arrange and (or organize organize) electric wire.Here, electric wire can be inserted in the snap 116, or uses the Velcro band 118 that hitches electric wire to be fixed to tray unit 100.
Fig. 3 shows the planimetric map that is installed in according to the display power supply 50 on the test pallet 1000 of one embodiment of the present invention.As shown in Figure 3, connector unit 140 can be electrically connected to display power supply 50.
External power unit 58 can be such parts: (primary power mainpower) is supplied to the display device that display power supply 50 is installed on it through these parts to main power.The common alternating current (AC) of 110V or 220V can be supplied to external power unit 58.
The panel power cell can be supplied to display panel with direct current (DC) driving voltage, and the panel signal receiver can be the parts of reception according to the feedback signal of the operation of display panel (for example, LCD panel).
It is obvious that, the parts of the tested object that the quantity of connector unit 140 and form can be electrically connected as required and changing.
Panel power-signal receiving connector 134 can be realized (with reference to Fig. 2) with the form of the socket on the printed circuit board (PCB) 130, makes panel power-signal receiving connector 134 can be easily connected to and panel power-signal receiver 56 wire connecting 57.
Therefore, the operator can be inserted into simply through the terminal unit 132 with test pallet 1000 in the slot-like parts of proving installation and between tested object and proving installation, form and be electrically connected.
Therefore; The operator can be simply forms between display power supply 50 and proving installation in the following manner and is electrically connected: display power supply 50 is installed on the installation unit 110 of test pallet 1000; Connector unit 140 is common to be formed and being electrically connected of display power supply 50 through using, and the terminal unit 132 with test pallet 1000 is inserted in the connector of proving installation then.
Fig. 4 is the decomposition diagram according to the test pallet 2000 of another embodiment of the invention.As shown in Figure 4; Test pallet 2000 according to another embodiment of the invention further comprises sub-tray unit 200; It is coupled to tray unit 100 by this way, make sub-tray unit 200 be can be attached with dismountable, thereby display power supply can be installed.Through said structure, consistent with the display power supply greater than the installation unit 110 of tray unit 100, test pallet 2000 can be installed display power supply in its surface and provides and being electrically connected of display power supply.
Except sub-tray unit 200, can have and test pallet 1000 identical construction according to the test pallet 2000 of this embodiment according to embodiment before according to the present invention, therefore, with any unnecessary description of omitting about same configuration.
Fig. 5 is the skeleton view according to the sub-tray unit 200 of another embodiment of the invention, and Fig. 6 is the planimetric map according to the sub-tray unit 200 of another embodiment of the invention.Like Fig. 5 and shown in Figure 6; Sub-tray unit 200 can provide the additional installation surface of test pallet 2000; Can be through sub-tray unit 200 be coupled to tray unit 100, make and can install and unload sub-tray unit 200 and bigger display power supply is installed on the said installation surface.
Patchhole 230 can be formed on around the center of sub-tray unit 200, and patchhole 230 can be configured such that patchhole 230 aims at the patchhole 114 of tray unit 100.Then, can be inserted in patchhole 230 and 114, so that sub-tray unit 200 is fixed together with tray unit 100 such as the securing member (fastener) of screw 231 (with reference to Fig. 4).Therefore, sub-tray unit 200 can be coupled to tray unit 100 by this way, makes sub-tray unit 200 to be mounted and to unload.
Being formed on the edge of sub-tray unit 200 can be supporting hole (holding hole) 211, and the electric wire that connects display power supply and connector unit 140 can insert and be coupled to this supporting hole 211.
Fig. 7 shows the planimetric map that is installed in according to the display power supply 60 on the test pallet 2000 of another embodiment of the invention.As shown in Figure 7, a plurality of fixed orifices 212 can be formed on the edge of sub-tray unit 200.
Velcro band 218 can be coupled to the both sides of sub-tray unit 200, makes can to arrange and be used for the electric wire that is electrically connected with display power supply 60.
Here, reference number among Fig. 7 62,63,64,65,66,67 and 68 reference numbers 52,53,54,55,56,57 and 58 corresponding to Fig. 3.
Fig. 8 is the skeleton view according to the test pallet 3000 of another embodiment of the present invention, and Fig. 9 is the exploded view according to the socket tray unit 300 of another embodiment of the present invention.Like Fig. 8 and shown in Figure 9; Test pallet 3000 according to another embodiment of the present invention further comprises socket tray unit 300 and inlet unit 310; Socket tray unit 300 comprises the framework 305 that tray unit 100 is installed on it, and inlet unit 310 is positioned on the side of framework 305 and terminal unit 132 inserts wherein.Through this structure, test pallet 3000 can provide and being electrically connected of display power supply 60, to carry out burn-in test.
Except socket tray unit 300, can have and test pallet 2000 identical construction according to the test pallet 3000 of this embodiment according to above-mentioned embodiment of the present invention, therefore, with any unnecessary description of omitting about same configuration.
Burn-in test is a kind of test that is used for detecting the defective that display power supply 60 possibly occur under the artificial pressure condition, because test is under the temperature that raises and the voltage that possibly raise, to carry out, and display power supply 60 is at high temperature operated.
As shown in Figure 9, socket tray unit 300 can comprise framework 305 and inlet unit 310.
Figure 10 is the cut-open view according to the inlet unit 310 of the socket tray unit 300 of another embodiment of the present invention.Like Fig. 9 and shown in Figure 10, inlet unit 310 can comprise socket upper support element 316, socket printed circuit board (PCB) 314 and socket lower support 312, therefore, can be inserted in the inlet unit 310 through the terminal unit 132 with tray unit 100 and form electrical connection.
When tray unit 100 was inserted in the inlet unit 310, socket lower support 312 can support the downside of tray unit 100.Being formed on the socket printed circuit board (PCB) 314 can be electrode 315, and it forms electrical connection through contacting with terminal unit 132.
Can be formed in the lip-deep array of socket printed circuit board (PCB) 314 with the corresponding a plurality of electrodes 315 of the layout of terminal unit 132.Be formed on the socket printed circuit board (PCB) 314 can be the circuit pattern that is electrically connected to electrode 315.
Then, socket printed circuit board (PCB) 314 can outside connect connector 320 and is electrically connected providing between the outside of socket tray unit 300 and the display power supply 60 through socket printed circuit board (PCB) 314 is electrically connected to.The outside connector 320 that connects can form the socket shape on a side of socket tray unit 300, and a plurality of pins can be formed on the outside inside that connects connector 320 to be used for electrical connection.
Figure 11 shows the front view that is inserted into the test pallet 3000 in the aging equipment 10 according to another embodiment of the present invention.Shown in figure 11; A plurality of test pallets 3000 that display power supply 60 is installed on it can be inserted in the aging equipment 10; And connect connector 320 through the outside and be electrically connected to aging equipment 10, therefore, can under the hot operation condition, test the operating characteristic of display power supply 60.
Though described spirit of the present invention in detail with reference to embodiment, said embodiment only is used for illustrative purposes, and should not limit the present invention.Be appreciated that under the situation that does not deviate from scope of the present invention and spirit those skilled in the art can change or revises said embodiment.Equally, in accompanying claims, can find except those many embodiments embodiment of setting forth.
Claims (10)
1. one kind is configured to provide the test pallet that is electrically connected with tested object, and said test pallet comprises:
Tray unit is formed with installation unit on it, said tested object is installed on the said installation unit;
Connector unit is electrically connected to said tested object; And
Terminal unit is electrically connected to said connector unit,
Wherein, said tested object is a display power supply, and it comprises:
The external power unit is constructed to be supplied with external power;
The panel power cell is constructed to power is supplied to display panel;
The panel signal receiver is constructed to receive the feedback signal of said display panel;
The backlight power unit is constructed to power is supplied to display backlight; And
The backlight signal receiver is constructed to receive the feedback signal of said display backlight,
Wherein, said connector unit comprises:
The external power connector is coupled to said external power unit, makes said external power connector can be connected to said external power unit, also can separate with said external power unit;
The panel power connector is coupled to said panel power cell, makes said panel power connector can be connected to said panel power cell, also can separate with said panel power cell;
The panel signal connector is coupled to said panel signal receiver, makes said panel signal connector can be connected to said panel signal receiver, also can separate with said panel signal receiver;
The backlight power connector is coupled to said backlight power unit, makes said backlight power connector can be connected to said backlight power unit, also can separate with said backlight power unit; And
The backlight signal connector is coupled to said backlight signal receiver, makes said backlight signal connector can be connected to said backlight signal receiver, also can separate with said backlight signal receiver.
2. test pallet according to claim 1, wherein, said terminal unit is positioned on the side of said tray unit.
3. test pallet according to claim 1 further comprises block, and said block inserts in the fixed orifice, makes said tested object be fixed to said installation unit, wherein, is formed with a plurality of fixed orifices on the said installation unit.
4. test pallet according to claim 1 further comprises the hasp that is coupled to said tray unit contiguously, makes the electric wire of said tested object be fixed to said tray unit.
5. test pallet according to claim 1; Further comprise sub-tray unit, it is coupled to said tray unit, makes said sub-tray unit can be attached to said tray unit; Also can separate with said tray unit, wherein said tested object can be installed on the said sub-tray unit.
6. test pallet according to claim 5 further comprises block, and said block inserts in the fixed orifice, makes said tested object be coupled to said sub-tray unit, wherein, is formed with a plurality of fixed orifices on the said sub-tray unit.
7. test pallet according to claim 5 further comprises the Velcro band, and it is coupled to said sub-tray unit, makes the electric wire of said tested object be fixed to said sub-tray unit.
8. test pallet according to claim 2 further comprises the socket tray unit, and wherein, said socket tray unit comprises:
Framework, said tray unit are installed on the said framework; And
Inlet unit is positioned on the side of said framework, and said terminal unit is inserted in the said inlet unit.
9. test pallet according to claim 1; Wherein, Said panel power connector, said panel signal connector, said backlight power connector, said backlight signal connector and said terminal unit are formed on the printed circuit board (PCB), and said printed circuit board (PCB) is formed on the side of said tray unit.
10. test pallet according to claim 1 further comprises the Velcro band that is coupled to said tray unit contiguously, makes the electric wire of said tested object be fixed to said tray unit.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2008-0117723 | 2008-11-25 | ||
| KR1020080117723A KR101011714B1 (en) | 2008-11-25 | 2008-11-25 | Test Tray |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101738505A CN101738505A (en) | 2010-06-16 |
| CN101738505B true CN101738505B (en) | 2012-11-07 |
Family
ID=42360429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009101801665A Expired - Fee Related CN101738505B (en) | 2008-11-25 | 2009-11-11 | Test pallet |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101011714B1 (en) |
| CN (1) | CN101738505B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101706982B1 (en) * | 2012-08-16 | 2017-02-16 | (주)테크윙 | Insert for test handler |
| KR101718446B1 (en) * | 2015-07-01 | 2017-03-21 | 주식회사 딜라이브 | Test apparatus comprising a mounting device |
| CN109471280A (en) * | 2018-12-25 | 2019-03-15 | 中航华东光电有限公司 | Universal backlight tooling and production method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2641630Y (en) * | 2003-06-20 | 2004-09-15 | 顺德市顺达电脑厂有限公司 | Mother board clamping tool |
| CN1922687A (en) * | 2005-04-26 | 2007-02-28 | 创新塑科技有限公司 | Test bracket for storage device |
| CN101114040A (en) * | 2006-07-27 | 2008-01-30 | 鸿富锦精密工业（深圳）有限公司 | Bracket tray positioning platform |
| CN101191809A (en) * | 2006-11-28 | 2008-06-04 | 未来产业株式会社 | Apparatus for rotating a test tray in a handler |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR19980027504A (en) * | 1996-10-16 | 1998-07-15 | 김영환 | Driving circuit check device of heat resistance test system for liquid crystal display device |
| KR100716038B1 (en) * | 2005-05-13 | 2007-05-08 | 강성일 | Test jig of liquid crystal module |
-
2008
- 2008-11-25 KR KR1020080117723A patent/KR101011714B1/en not_active IP Right Cessation
-
2009
- 2009-11-11 CN CN2009101801665A patent/CN101738505B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2641630Y (en) * | 2003-06-20 | 2004-09-15 | 顺德市顺达电脑厂有限公司 | Mother board clamping tool |
| CN1922687A (en) * | 2005-04-26 | 2007-02-28 | 创新塑科技有限公司 | Test bracket for storage device |
| CN101114040A (en) * | 2006-07-27 | 2008-01-30 | 鸿富锦精密工业（深圳）有限公司 | Bracket tray positioning platform |
| CN101191809A (en) * | 2006-11-28 | 2008-06-04 | 未来产业株式会社 | Apparatus for rotating a test tray in a handler |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101011714B1 (en) | 2011-01-28 |
| KR20100059080A (en) | 2010-06-04 |
| CN101738505A (en) | 2010-06-16 |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121107 Termination date: 20151111 |
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| EXPY | Termination of patent right or utility model |