CN105242415A - Probe substrate and display panel detection device - Google Patents
Probe substrate and display panel detection device Download PDFInfo
- Publication number
- CN105242415A CN105242415A CN201510587282.4A CN201510587282A CN105242415A CN 105242415 A CN105242415 A CN 105242415A CN 201510587282 A CN201510587282 A CN 201510587282A CN 105242415 A CN105242415 A CN 105242415A
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- probe
- adjustment unit
- probe module
- driver element
- unit
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a probe substrate and a display panel detection device. The probe substrate is used for a detection device of a display panel. The probe substrate comprises a bearing platform, a first probe module, a second probe module, a first driver unit group, a second driver unit group, and an angle adjusting mechanism. When the first driver unit group drives the first probe module to move along a second direction, a first driver unit drives a first end, and a second driver unit synchronously drives a second end, so that the first end and the second end of the first probe module move synchronously and displacements are the same. In display panel detection, the probe substrate and the display panel detection device can make a probe align accurately, thereby ensuring reliable and stable detection results of the display panel, and improving detection precision.
Description
Technical field
The present invention relates to a kind of probe substrate and display panel testing, particularly relate to a kind of can the probe substrate of fine adjustment aligning accuracy and the automatic detection device of display panel.
Background technology
General display panel such as the display panels such as liquid crystal display (LiquidCrystalDisplay, LCD), OLED (OrganicLight-EmittingDiode) will be manufactured by the manufacturing process in multiple stage.Usually, the processing procedure of display panel comprises the preparation of array base palte (TFT), the preparation of colored filter (ColorFilter) substrate, array base palte and colored filter substrate to organizing the assembling etc. forming display panel and display panel and backlight module.
Display panel needs to carry out lighting detection after completing group, it is generally be connected with the detection pad of display panel by pick-up unit that lighting detects, thus give pixel cell conveying R, G, B drive singal of display panel, picture is detected to show, as abnormal in detected picture, then can find the bad of display panel in advance.
Display panel production firm can produce the display panel of sizes usually, to meet the demand of different user.The position of the detection pad of the display panel of different size is arranged may be also different, cause like this needing to use different lighting pick-up units to carry out lighting detection to the display panel of different size, or adopt the pick-up unit of adjustable probe location to carry out lighting detection.
Inventor finds that in prior art, at least there are the following problems: as shown in Figure 1, and Fig. 1 is existing probe substrate structural representation.Probe substrate 100 comprises the first side 11 and the 3rd side 13 that be arranged in parallel, and the second side 12 be arranged in parallel and four side 14, first side 11 and the 3rd side 13 are respectively arranged with the first probe module 101 and probe module 103, probe module 101,103 can move along first direction, and first direction is X-direction and the direction in contrast to X in figure; In the same manner second side 12 and four side 14 are respectively arranged with probe module 102 and probe module 104, probe module 102,104 can move along second direction, and second direction is Y-direction and the direction in contrast to Y in figure.Corresponding probe module 101 and probe module 103 arrange the first driver element 21 and the second driver element 23 respectively at the two ends of four side 14, first driver element 21 and the second driver element 23 are respectively used to drive probe module 101 and probe module 103 to move along first direction, driver element 21 is connected with the first end 101b of probe module 101, driver element 21 drives first end 101b to move along first direction, the second end 101a then moves with the second end 101a under the drive of first end 101b, therefore there will be probe module 101 position adjustment terminate after, first end 101b is larger than the distance of the second end 101a movement, namely the first end 101b of probe module 101 is asynchronous with the displacement of the second end 101a, cause probe module 101 deflection, similarly, driver element 23 drives the nonsynchronous problem of two ends 103a and 103b that also there will be probe module 103 during probe module 103, probe module 103 is caused also to produce deflection, finally cause probe module 101, 103 is bad with display panel contraposition, affect testing result and the accuracy of detection of pick-up unit.
Summary of the invention
Therefore, an object of the present invention is to provide a kind of probe substrate and display panel testing, to solve prior art middle probe module and the bad technical matters causing affecting the testing result and accuracy of detection etc. of pick-up unit of display panel contraposition.The invention provides a kind of probe substrate, for the pick-up unit of display panel, described probe substrate comprises: plummer, for rectangular box, this rectangular box has two first sides along first direction and two second sides along second direction, this first direction is the length direction of first side, and this second direction is the length direction of second side; First probe module, arrange, and this first probe module has relative first end and the second end along first direction; And first sets of drive units, comprise the first driver element and the second driver element, this first driver element and this second driver element are individually fixed in this two second side, and this first driver element connects this first end of this first probe module, this second driver element connects this second end of this first probe module; This first sets of drive units moves along this second direction for driving this first probe module;
Wherein, when this first sets of drive units drives this first probe module to move along this second direction, this this first end of the first drive unit drives, and this second driver element synchronously drives this second end, makes this first end of this first probe module with this second end synchronizing moving and displacement is identical.
Further, described first probe module comprises adjustment plate and the first probe unit be arranged on this adjustment plate, this first sets of drive units also comprises micro-move device unit, this micro-move device unit to be arranged on this adjustment plate and to connect this first probe unit, this micro-move device unit, for driving this first probe unit, makes this first probe unit move along this first direction.
In the technical program, described probe substrate also comprises at least one angle adjusting mechanism, angle adjusting mechanism comprises the first adjustment unit and the second adjustment unit, this first adjustment unit connects this first end of this first driver element and this first probe module, and this second adjustment unit to be fixed on this first end and to be folded between this adjustment unit and this first end; Wherein, when this this first end of the first drive unit drives moves along this second direction, this first adjustment unit produces the first displacement along the first sense of rotation, this second adjustment unit is relative with the first adjustment unit to be rotated, make second displacement of this first end generation along this first sense of rotation of this first probe module, and this second displacement is less than this first displacement.
Alternatively, described probe substrate also comprises at least one angle adjusting mechanism, angle adjusting mechanism comprises the first adjustment unit and the second adjustment unit, this first adjustment unit connects this second end of this second driver element and this probe module, and this second adjustment unit to be fixed on this second end and to be folded between this first adjustment unit and this second end; Wherein, when this second end of this second drive unit drives moves along this second direction, this first adjustment unit produces the first displacement along the second sense of rotation, this second adjustment unit is relative with the first adjustment unit to be rotated, make second displacement of this second end generation along this second sense of rotation of this first probe module, and this second displacement is less than this first displacement.
Further, described first adjustment unit is square structure part and has pivot end, this pivot end and this second adjustment unit pivot joint.
Further, described second adjustment unit comprises Part I and Part II, and wherein this Part I is connected with this first adjustment unit, and this Part II is connected with this first probe module, and this Part I can rotate relatively with this Part II.
Further, described probe substrate also comprises the second probe module, and this second probe module is arranged along second direction, and this second probe module has the 3rd relative end and the 4th end, and the 3rd end is connected this two first side respectively with the 4th end.
Further, described probe substrate also comprises the second sets of drive units, and this second sets of drive units is for driving the 3rd end of this second probe module and the 4th end along this first direction synchronizing moving.
Further, described probe substrate, is characterized in that, this first driver element and/or this second driver element are motor.
The present invention also provides a kind of display panel testing, and this display panel testing comprises the probe substrate as mentioned above described in any one, and this probe substrate is used for detection signal to transfer to panel to be detected.
Compared with prior art, usefulness of the present invention is: because driver element has all been installed in the top and the bottom of substrate the right and left side probe unit driver part, make the two ends of probe module can synchronizing moving and displacement is equal, improve the adjustment degree of accuracy of probe module, and then improve the aligning accuracy of probe, ensure that the testing result of display panel is reliable and stable, substantially increase Detection results and the accuracy of detection of display panel testing.
Accompanying drawing explanation
Fig. 1 is existing probe substrate structural representation;
Fig. 2 is the structural representation of the probe substrate of one embodiment of the invention;
Fig. 3 A to Fig. 3 B is the schematic diagram of the angle adjusting mechanism of one embodiment of the invention;
Embodiment
For making there is further understanding to object of the present invention, structure, feature and function thereof, embodiment is hereby coordinated to be described in detail as follows.
The invention provides a kind of display panel testing, display panel testing comprises probe substrate, and described probe substrate is used for detection signal to transfer to panel to be detected.
Fig. 2 is the structural representation of the probe substrate of one embodiment of the invention.As shown in Figure 2, probe substrate 100 comprises: plummer 110, first probe module 120 and the first sets of drive units.Plummer 110 is rectangular box, rectangular box has two first sides 111,113 along first direction and two second sides 112,114 along second direction, wherein, first direction is the length direction of first side 111,113, namely the Y direction shown in Fig. 2, and second direction is the length direction of second side 112,114, the X-direction namely shown in Fig. 2; First probe module 120, arrange, and the first probe module 120 has relative first end 120a and the second end 120b along first direction; First sets of drive units comprises the first driver element 131 and the second driver element 132, first driver element 131 and the second driver element 132 are individually fixed on two second sides 112,114, namely the first driver element 131 is fixed on second side 112, second driver element 132 is fixed on second side 114, and the first driver element 131 connects the first end 120a of the first probe module 120, the second driver element 132 connects the second end 120b of the first probe module 120; First sets of drive units moves along second direction for driving the first probe module 120.Wherein, when first sets of drive units drives the first probe module 120 to move along second direction, first driver element 131 drives first end 12a, and the second driver element 132 synchronously drives the second end 120b, make the first end 120a of the first probe module 120 with the second end 120b synchronizing moving and displacement is identical, namely under the synchronous driving of the first driver element 131 with the second driver element 132, the first end 120a of the first probe module 120 and the second end 120b synchronizing moving, and displacement in same time is identical.Therefore, by arranging the first driver element 131 and the second driver element 132 at the first end 120a of the first probe module 120 and the second end 120b simultaneously, and the first driver element 131 is synchronous with the second driver element 132 drives described first end 120a and the second end 120b, make the first probe module 120 first end 120a when moving along second direction identical with the displacement of the second end 120b, namely can not there is deflection in the first probe module 120 in moving process, ensure that the displacement of the first probe module 120 is through determining, and then ensure that the aligning accuracy of probe substrate 100 and display panel.
Further, described first probe module 120 comprises adjustment plate 121 and is arranged at the first probe unit 122 adjusted on plate 121, first sets of drive units also comprises micro-move device unit 133, micro-move device unit 133 is arranged at and adjusts on plate 121 and connect the first probe unit 122, micro-move device unit 133 is for driving the first probe unit 122, make the first probe unit 122 mobile along first direction (Y direction), to realize the fine setting of the first probe unit 122 along first direction, thus improve the aligning accuracy of probe substrate 100 further.
In an embodiment, described probe substrate 100 also comprises at least one angle adjusting mechanism.Please refer to Fig. 3 A to Fig. 3 B, Fig. 3 A to Fig. 3 B is the schematic diagram of the angle adjusting mechanism of one embodiment of the invention.As shown in Fig. 3 A to Fig. 3 B, angle adjusting mechanism comprises the first adjustment unit 141 and the second adjustment unit 142, first adjustment unit 141 connects the first end 120a of the first driver element 131 and the first probe module 120, second adjustment unit 142 is fixed on first end 120a, and the second adjustment unit 142 is folded between the first adjustment unit 141 and first end 120a, as shown in Fig. 3 A and Fig. 3 B, i.e. the second adjustment unit 142, first adjustment unit 141 is set in turn on first end 120a from the bottom to top, when the first adjustment unit 141 and the second adjustment unit 142 are assembled in after on first end 120a, second adjustment unit 142 is capped on below the first adjustment unit 141, as shown in Figure 3A, wherein, when the first driver element 131 drives first end 120a to move along second direction, first adjustment unit 141 produces the first displacement along the first sense of rotation ω 1 (in figure shown in rotation arrows direction), second adjustment unit 142 is relative with the first adjustment unit 141 to be rotated, make second displacement of first end 120a generation along the first sense of rotation ω 1 of the first probe module 120, and the second displacement is less than the first displacement.So, when the first driver element 131 drives the first probe module 120 pairs of larger driving forces of first end 120a generation to cause the first probe module 120 may produce larger angular deflection, because the first adjustment unit 141 can rotate relatively with the second adjustment unit 142, the first end 120a of the first probe module 120 can't produce larger rotation with the first adjustment unit 141, thus achieves the fine setting of angle.Simultaneously, first driver element 131 can not produce excessive torsion to the first probe module 120 and cause the first probe module 120 to damage, on the other hand, the first probe module 120 also can not produce excessive reacting force to the first driver element 131 and cause the first driver element 131 to damage.
In a specific embodiment, second adjustment unit 142 comprises Part I 142a and Part II 142b, Part I 142a is connected with the first adjustment unit 131, Part II 142b is connected with the first end 120a of the first probe module 120, and Part I 142a can rotate relatively with Part II 142b.When the first adjustment unit 141 produces the first displacement along the first sense of rotation ω 1 under the driving of the first driver element 131, the Part I 142a that second adjustment unit 142 is connected with the first adjustment unit 141 produces the first displacement along the first sense of rotation ω 1 with the first adjustment unit 141, but Part II 142b can rotate mutually with Part I 142a, thus make that the first adjustment unit 141 is relative with the first end 120a of the first probe module 120 to be rotated, cause first end 120a generation along second displacement in ω 1 direction, and the second displacement is less than the first displacement.
Above-described embodiment is arranged at the first end 120a of the first probe module 120 so that embodiments of the present invention to be described for angle adjusting mechanism.Alternatively, angle adjusting mechanism can also be arranged at the second end 120b of the first probe module 120, and the second adjustment unit 142 to be fixed on the second end 120b and to be folded between the first adjustment unit 141 and the second end 120b; Wherein, when the second driver element 132 drives the second end 120b to move along second direction, first adjustment unit 141 produces the first displacement along the second sense of rotation (not illustrating), second adjustment unit 142 is relative with the first adjustment unit 141 to be rotated, make second displacement of the second end 120b generation along this second sense of rotation of the first probe module 120, and the second displacement is less than the first displacement.
Further, as shown in Figure 3A, described first adjustment unit 141 is square structure part and has pivot end, pivot end and this second adjustment unit 142 pivot joint.
Further, as shown in Figure 3 B, described second adjustment unit 142 can be bearing, bearing and the first adjustment unit 141 pivot joint.
What deserves to be explained is, above-described embodiment all carries out signal explanation with the first probe module 120 being arranged at side, first side 111, in other embodiment, side, first side 113 can also arrange the first probe module 120, and arranging of the first sets of drive units of the setting of the first sets of drive units, angle adjusting mechanism and side, first side 111, angle adjusting mechanism is similar, repeats no more herein.
Further, described probe substrate 100 also comprises the second probe module 160, second probe module 160 is arranged along second direction, as shown in Figure 2, and the second probe module 160 has the 3rd relative end 160a and the 4th end 160b, the 3rd end 160a and the 4th end 160b are connected two first sides 111,113 respectively.The present embodiment is also only illustrate with the second probe module 160 arranged along second side 112, in other embodiments, can also be provided with the second probe module 160. along second side 114
Further, as shown in Figure 2, described probe substrate also comprises the second sets of drive units (not illustrating), and the second sets of drive units is for driving the 3rd end 160a of this second probe module 160 and the 4th end 160b along first direction synchronizing moving.
Further, the first driver element 131 and/or the second driver element 132 are motor.
In sum, the two ends of probe module of the present invention can synchronizing moving and displacement is equal, improve the adjustment degree of accuracy of probe module, and then improve the aligning accuracy of probe, ensure that the testing result of display panel is reliable and stable, substantially increase Detection results and the accuracy of detection of display panel testing.The present invention is described by above-mentioned related embodiment, but above-described embodiment is only enforcement example of the present invention.Must it is noted that the embodiment disclosed limit the scope of the invention.On the contrary, change done without departing from the spirit and scope of the present invention and retouching, all belong to scope of patent protection of the present invention.
Claims (10)
1. a probe substrate, for the pick-up unit of display panel, is characterized in that, described probe substrate comprises:
Plummer is rectangular box, and this rectangular box has two first sides along first direction and two second sides along second direction, and this first direction is the length direction of first side, and this second direction is the length direction of second side;
First probe module, arrange, and this first probe module has relative first end and the second end along first direction; And
First sets of drive units, comprise the first driver element and the second driver element, this first driver element and this second driver element are individually fixed in this two second side, and this first driver element connects this first end of this first probe module, this second driver element connects this second end of this first probe module; This first sets of drive units moves along this second direction for driving this first probe module;
Wherein, when this first sets of drive units drives this first probe module to move along this second direction, this this first end of the first drive unit drives, and this second driver element synchronously drives this second end, makes this first end of this first probe module with this second end synchronizing moving and displacement is identical.
2. probe substrate as claimed in claim 1, it is characterized in that, this the first probe module comprises adjustment plate and the first probe unit be arranged on this adjustment plate, this first sets of drive units also comprises micro-move device unit, this micro-move device unit to be arranged on this adjustment plate and to connect this first probe unit, this micro-move device unit, for driving this first probe unit, makes this first probe unit move along this first direction.
3. probe substrate as claimed in claim 1, it is characterized in that, this probe substrate also comprises at least one angle adjusting mechanism, angle adjusting mechanism comprises the first adjustment unit and the second adjustment unit, this first adjustment unit connects this first end of this first driver element and this first probe module, and this second adjustment unit to be fixed on this first end and to be folded between this first adjustment unit and this first end; Wherein, when this this first end of the first drive unit drives moves along this second direction, this first adjustment unit produces the first displacement along the first sense of rotation, this second adjustment unit is relative with the first adjustment unit to be rotated, make second displacement of this first end generation along this first sense of rotation of this first probe module, and this second displacement is less than this first displacement.
4. probe substrate as claimed in claim 1, it is characterized in that, this probe substrate also comprises at least one angle adjusting mechanism, angle adjusting mechanism comprises the first adjustment unit and the second adjustment unit, this first adjustment unit connects this second end of this second driver element and this first probe module, and this second adjustment unit to be fixed on this second end and to be folded between this first adjustment unit and this second end; Wherein, when this second end of this second drive unit drives moves along this second direction, this first adjustment unit produces the first displacement along the second sense of rotation, this second adjustment unit is relative with the first adjustment unit to be rotated, make second displacement of this second end generation along this second sense of rotation of this first probe module, and this second displacement is less than this first displacement.
5. the probe substrate as described in claim 3 or 4, is characterized in that, this first adjustment unit is square structure part and has pivot end, this pivot end and this second adjustment unit pivot joint.
6. the probe substrate as described in claim 3 or 4, it is characterized in that, this second adjustment unit comprises Part I and Part II, wherein this Part I is connected with this first adjustment unit, this Part II is connected with this first probe module, and this Part I can rotate relatively with this Part II.
7. probe substrate as claimed in claim 1, it is characterized in that, this probe substrate also comprises the second probe module, and this second probe module is arranged along second direction, and this second probe module has the 3rd relative end and the 4th end, the 3rd end is connected this two first side respectively with the 4th end.
8. probe substrate as claimed in claim 7, it is characterized in that, this probe substrate also comprises the second sets of drive units, and this second sets of drive units is for driving the 3rd end of this second probe module and the 4th end along this first direction synchronizing moving.
9. probe substrate as claimed in claim 1, it is characterized in that, this first driver element and/or this second driver element are motor.
10. a display panel testing, is characterized in that, this display panel testing comprises the probe substrate as described in claim 1-9 any one, and this probe substrate is used for detection signal to transfer to panel to be detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510587282.4A CN105242415B (en) | 2015-09-16 | 2015-09-16 | Probe substrate and display panel testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510587282.4A CN105242415B (en) | 2015-09-16 | 2015-09-16 | Probe substrate and display panel testing |
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| Publication Number | Publication Date |
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| CN105242415A true CN105242415A (en) | 2016-01-13 |
| CN105242415B CN105242415B (en) | 2018-10-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510587282.4A Active CN105242415B (en) | 2015-09-16 | 2015-09-16 | Probe substrate and display panel testing |
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| CN (1) | CN105242415B (en) |
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| CN106501974A (en) * | 2015-09-04 | 2017-03-15 | De&T株式会社 | The contact unit position regulator of LCD board checking device |
| CN107966271A (en) * | 2017-12-08 | 2018-04-27 | 昆山精讯电子技术有限公司 | A kind of display panel measurement jig |
| CN108982931A (en) * | 2018-09-21 | 2018-12-11 | 京东方科技集团股份有限公司 | Probe unit, probe jig |
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| CN2828831Y (en) * | 2005-04-14 | 2006-10-18 | 均豪精密工业股份有限公司 | Automatic size regulator of liquid crystal panel detector |
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| CN107966271A (en) * | 2017-12-08 | 2018-04-27 | 昆山精讯电子技术有限公司 | A kind of display panel measurement jig |
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| CN105242415B (en) | 2018-10-02 |
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Address after: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant after: Wuhan fine test electronics group Limited by Share Ltd Address before: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant before: Wuhan Jingce Electronic Technology Co., Ltd. |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20220422 Address after: 430205 1st floor, No.3 workshop, No.22, South liufangyuan Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province Patentee after: WUHAN JINGYITONG ELECTRONIC TECHNOLOGY Co.,Ltd. Patentee after: Wuhan jingce Electronics Group Co., Ltd Address before: 430070 Hongshan building center 4, Nanhu Avenue, Hongshan District, Wuhan, Hubei, 4 Patentee before: WUHAN JINGCE ELECTRONIC GROUP Co.,Ltd. |