|
US7097541B2
(en)
|
2002-01-22 |
2006-08-29 |
Cabot Microelectronics Corporation |
CMP method for noble metals
|
|
US7316603B2
(en)
|
2002-01-22 |
2008-01-08 |
Cabot Microelectronics Corporation |
Compositions and methods for tantalum CMP
|
|
JP2004101849A
(ja)
*
|
2002-09-09 |
2004-04-02 |
Mitsubishi Gas Chem Co Inc |
洗浄剤組成物
|
|
US7071105B2
(en)
*
|
2003-02-03 |
2006-07-04 |
Cabot Microelectronics Corporation |
Method of polishing a silicon-containing dielectric
|
|
US20050028450A1
(en)
*
|
2003-08-07 |
2005-02-10 |
Wen-Qing Xu |
CMP slurry
|
|
US7514363B2
(en)
*
|
2003-10-23 |
2009-04-07 |
Dupont Air Products Nanomaterials Llc |
Chemical-mechanical planarization composition having benzenesulfonic acid and per-compound oxidizing agents, and associated method for use
|
|
US20050189322A1
(en)
*
|
2004-02-27 |
2005-09-01 |
Lane Sarah J. |
Compositions and methods for chemical mechanical polishing silica and silicon nitride
|
|
TW200613485A
(en)
*
|
2004-03-22 |
2006-05-01 |
Kao Corp |
Polishing composition
|
|
US20060021972A1
(en)
*
|
2004-07-28 |
2006-02-02 |
Lane Sarah J |
Compositions and methods for chemical mechanical polishing silicon dioxide and silicon nitride
|
|
JP4814502B2
(ja)
*
|
2004-09-09 |
2011-11-16 |
株式会社フジミインコーポレーテッド |
研磨用組成物及びそれを用いた研磨方法
|
|
JP5026665B2
(ja)
*
|
2004-10-15 |
2012-09-12 |
株式会社フジミインコーポレーテッド |
研磨用組成物及びそれを用いた研磨方法
|
|
US20060097219A1
(en)
*
|
2004-11-08 |
2006-05-11 |
Applied Materials, Inc. |
High selectivity slurry compositions for chemical mechanical polishing
|
|
JP4027929B2
(ja)
*
|
2004-11-30 |
2007-12-26 |
花王株式会社 |
半導体基板用研磨液組成物
|
|
US7208325B2
(en)
*
|
2005-01-18 |
2007-04-24 |
Applied Materials, Inc. |
Refreshing wafers having low-k dielectric materials
|
|
US7449124B2
(en)
*
|
2005-02-25 |
2008-11-11 |
3M Innovative Properties Company |
Method of polishing a wafer
|
|
US7081041B1
(en)
|
2005-02-28 |
2006-07-25 |
Hitachi Global Storage Technologies Netherlands B.V. |
Manufacturing method for forming a write head top pole using chemical mechanical polishing with a DLC stop layer
|
|
US20060205218A1
(en)
*
|
2005-03-09 |
2006-09-14 |
Mueller Brian L |
Compositions and methods for chemical mechanical polishing thin films and dielectric materials
|
|
US7497938B2
(en)
*
|
2005-03-22 |
2009-03-03 |
Cabot Microelectronics Corporation |
Tribo-chronoamperometry as a tool for CMP application
|
|
JP2006269910A
(ja)
*
|
2005-03-25 |
2006-10-05 |
Fuji Photo Film Co Ltd |
金属用研磨液及びこれを用いた研磨方法
|
|
JP2006318952A
(ja)
*
|
2005-05-10 |
2006-11-24 |
Hitachi Chem Co Ltd |
Cmp研磨剤及び基板の研磨方法
|
|
US7731864B2
(en)
*
|
2005-06-29 |
2010-06-08 |
Intel Corporation |
Slurry for chemical mechanical polishing of aluminum
|
|
US7708904B2
(en)
*
|
2005-09-09 |
2010-05-04 |
Saint-Gobain Ceramics & Plastics, Inc. |
Conductive hydrocarbon fluid
|
|
US8353740B2
(en)
|
2005-09-09 |
2013-01-15 |
Saint-Gobain Ceramics & Plastics, Inc. |
Conductive hydrocarbon fluid
|
|
US7803203B2
(en)
|
2005-09-26 |
2010-09-28 |
Cabot Microelectronics Corporation |
Compositions and methods for CMP of semiconductor materials
|
|
US7842193B2
(en)
*
|
2005-09-29 |
2010-11-30 |
Fujifilm Corporation |
Polishing liquid
|
|
US20070077865A1
(en)
*
|
2005-10-04 |
2007-04-05 |
Cabot Microelectronics Corporation |
Method for controlling polysilicon removal
|
|
US20090301996A1
(en)
*
|
2005-11-08 |
2009-12-10 |
Advanced Technology Materials, Inc. |
Formulations for removing cooper-containing post-etch residue from microelectronic devices
|
|
US20070129682A1
(en)
*
|
2005-12-02 |
2007-06-07 |
Tracee Eidenschink |
Guidewire with perfusion capability
|
|
US20070209287A1
(en)
*
|
2006-03-13 |
2007-09-13 |
Cabot Microelectronics Corporation |
Composition and method to polish silicon nitride
|
|
US7732393B2
(en)
*
|
2006-03-20 |
2010-06-08 |
Cabot Microelectronics Corporation |
Oxidation-stabilized CMP compositions and methods
|
|
US20080182413A1
(en)
*
|
2006-08-16 |
2008-07-31 |
Menk Gregory E |
Selective chemistry for fixed abrasive cmp
|
|
KR100800481B1
(ko)
*
|
2006-08-16 |
2008-02-04 |
삼성전자주식회사 |
화학기계적 연마방법 및 이를 이용한 소자 분리막 형성방법
|
|
US7776230B2
(en)
*
|
2006-08-30 |
2010-08-17 |
Cabot Microelectronics Corporation |
CMP system utilizing halogen adduct
|
|
US7629258B2
(en)
|
2006-11-22 |
2009-12-08 |
Clarkson University |
Method for one-to-one polishing of silicon nitride and silicon oxide
|
|
US7723234B2
(en)
|
2006-11-22 |
2010-05-25 |
Clarkson University |
Method for selective CMP of polysilicon
|
|
US20080116171A1
(en)
*
|
2006-11-22 |
2008-05-22 |
Clarkson University |
Method For The Preferential Polishing Of Silicon Nitride Versus Silicon Oxide
|
|
KR100725803B1
(ko)
*
|
2006-12-05 |
2007-06-08 |
제일모직주식회사 |
실리콘 웨이퍼 최종 연마용 슬러리 조성물 및 이를 이용한실리콘 웨이퍼 최종 연마 방법
|
|
US9343330B2
(en)
*
|
2006-12-06 |
2016-05-17 |
Cabot Microelectronics Corporation |
Compositions for polishing aluminum/copper and titanium in damascene structures
|
|
US8591764B2
(en)
*
|
2006-12-20 |
2013-11-26 |
3M Innovative Properties Company |
Chemical mechanical planarization composition, system, and method of use
|
|
DE102006061891A1
(de)
*
|
2006-12-28 |
2008-07-03 |
Basf Se |
Zusammensetzung zum Polieren von Oberflächen aus Siliziumdioxid
|
|
US20100087065A1
(en)
*
|
2007-01-31 |
2010-04-08 |
Advanced Technology Materials, Inc. |
Stabilization of polymer-silica dispersions for chemical mechanical polishing slurry applications
|
|
KR100807220B1
(ko)
*
|
2007-02-01 |
2008-02-28 |
삼성전자주식회사 |
불휘발성 메모리 장치의 제조 방법
|
|
DE102007035992A1
(de)
*
|
2007-05-25 |
2008-11-27 |
Evonik Degussa Gmbh |
Ceroxid, Siliciumdioxid oder Schichtsilikat und Aminosäure enthaltende Dispersion
|
|
US20080314872A1
(en)
*
|
2007-06-19 |
2008-12-25 |
Ferro Corporation |
Chemical-Mechanical Polishing Compositions Containing Aspartame And Methods Of Making And Using The Same
|
|
KR20100051839A
(ko)
*
|
2007-08-02 |
2010-05-18 |
어드밴스드 테크놀러지 머티리얼즈, 인코포레이티드 |
마이크로전자 장치로부터 잔사를 제거하기 위한 플루오라이드 비-함유 조성물
|
|
US20090031636A1
(en)
*
|
2007-08-03 |
2009-02-05 |
Qianqiu Ye |
Polymeric barrier removal polishing slurry
|
|
KR101232442B1
(ko)
*
|
2007-09-21 |
2013-02-12 |
캐보트 마이크로일렉트로닉스 코포레이션 |
아미노실란으로 처리된 연마제 입자를 이용한 연마 조성물 및 방법
|
|
JP2009123880A
(ja)
|
2007-11-14 |
2009-06-04 |
Showa Denko Kk |
研磨組成物
|
|
US7955520B2
(en)
*
|
2007-11-27 |
2011-06-07 |
Cabot Microelectronics Corporation |
Copper-passivating CMP compositions and methods
|
|
JP5306644B2
(ja)
*
|
2007-12-29 |
2013-10-02 |
Hoya株式会社 |
マスクブランク用基板の製造方法、多層反射膜付き基板の製造方法、及び反射型マスクブランクの製造方法、並びに反射型マスクの製造方法
|
|
US7922926B2
(en)
*
|
2008-01-08 |
2011-04-12 |
Cabot Microelectronics Corporation |
Composition and method for polishing nickel-phosphorous-coated aluminum hard disks
|
|
CN101492592B
(zh)
*
|
2008-01-25 |
2014-01-29 |
安集微电子(上海)有限公司 |
一种化学机械抛光液
|
|
SG10201605686XA
(en)
*
|
2008-02-01 |
2016-08-30 |
Fujimi Inc |
Polishing Composition And Polishing Method Using The Same
|
|
JP5326492B2
(ja)
*
|
2008-02-12 |
2013-10-30 |
日立化成株式会社 |
Cmp用研磨液、基板の研磨方法及び電子部品
|
|
JP5375025B2
(ja)
*
|
2008-02-27 |
2013-12-25 |
日立化成株式会社 |
研磨液
|
|
DE102008002321A1
(de)
|
2008-06-10 |
2009-12-17 |
Evonik Degussa Gmbh |
Ceroxid und partikuläres Additiv enthaltende Dispersion
|
|
WO2009150938A1
(ja)
|
2008-06-11 |
2009-12-17 |
信越化学工業株式会社 |
合成石英ガラス基板用研磨剤
|
|
JP5369506B2
(ja)
*
|
2008-06-11 |
2013-12-18 |
信越化学工業株式会社 |
合成石英ガラス基板用研磨剤
|
|
KR101604328B1
(ko)
*
|
2008-06-18 |
2016-03-17 |
가부시키가이샤 후지미인코퍼레이티드 |
연마용 조성물 및 이를 이용한 연마 방법
|
|
US8247327B2
(en)
*
|
2008-07-30 |
2012-08-21 |
Cabot Microelectronics Corporation |
Methods and compositions for polishing silicon-containing substrates
|
|
WO2010037730A1
(en)
*
|
2008-10-03 |
2010-04-08 |
Basf Se |
Chemical mechanical polishing (cmp) polishing solution with enhanced performance
|
|
KR101377902B1
(ko)
|
2008-12-11 |
2014-03-24 |
히타치가세이가부시끼가이샤 |
Cmp용 연마액 및 이것을 이용한 연마 방법
|
|
CN101475791B
(zh)
*
|
2009-01-20 |
2012-08-29 |
江苏工业学院 |
氧化铈/氧化硅复合磨料的制备方法和用途
|
|
US20120077419A1
(en)
*
|
2009-06-05 |
2012-03-29 |
Basf Se |
Raspberry-type metal oxide nanostructures coated with ceo2 nanoparticles for chemical mechanical planarization (cmp)
|
|
CN101906359A
(zh)
*
|
2009-06-08 |
2010-12-08 |
安集微电子科技(上海)有限公司 |
一种化学机械抛光清洗液
|
|
CN101906270A
(zh)
*
|
2009-06-08 |
2010-12-08 |
安集微电子科技(上海)有限公司 |
一种化学机械抛光液
|
|
MY156687A
(en)
*
|
2009-06-22 |
2016-03-15 |
Cabot Microelectronics Corp |
Cmp compositions and method for suppressing polysilicon removal rates
|
|
JP6005516B2
(ja)
*
|
2009-11-13 |
2016-10-12 |
ビーエーエスエフ ソシエタス・ヨーロピアBasf Se |
無機粒子及びポリマー粒子を含む化学的機械研磨(cmp)組成物
|
|
JP2011110637A
(ja)
*
|
2009-11-25 |
2011-06-09 |
Asahi Glass Co Ltd |
磁気ディスク用ガラス基板の製造方法
|
|
KR101675378B1
(ko)
*
|
2010-02-25 |
2016-11-23 |
삼성전자주식회사 |
연마 슬러리 및 그를 이용한 절연막 평탄화 방법
|
|
JP5648567B2
(ja)
*
|
2010-05-07 |
2015-01-07 |
日立化成株式会社 |
Cmp用研磨液及びこれを用いた研磨方法
|
|
JP5141792B2
(ja)
*
|
2010-06-29 |
2013-02-13 |
日立化成工業株式会社 |
Cmp研磨液及び研磨方法
|
|
SG188460A1
(en)
|
2010-09-08 |
2013-04-30 |
Basf Se |
Aqueous polishing composition and process for chemically mechanically polishing substrate materials for electrical, mechanical and optical devices
|
|
RU2608890C2
(ru)
|
2010-09-08 |
2017-01-26 |
Басф Се |
Водные полирующие композиции, содержащие n-замещенные диазений диоксиды и/или соли n -замещенных n'-гидрокси-диазений оксидов
|
|
SG11201606187RA
(en)
|
2010-09-08 |
2016-09-29 |
Basf Se |
Aqueous polishing composition and process for chemically mechanically polishing substrates containing silicon oxide dielectric and polysilicon films
|
|
JP2012069785A
(ja)
*
|
2010-09-24 |
2012-04-05 |
Fujimi Inc |
研磨用組成物および研磨方法
|
|
US8497210B2
(en)
|
2010-10-04 |
2013-07-30 |
International Business Machines Corporation |
Shallow trench isolation chemical mechanical planarization
|
|
MY160307A
(en)
*
|
2010-12-06 |
2017-02-28 |
Moresco Corp |
Compositon for polishing glass substrate, and polishing slurry
|
|
KR101919750B1
(ko)
|
2010-12-10 |
2018-11-19 |
바스프 에스이 |
산화규소 유전체 및 폴리실리콘 필름을 함유하는 기판의 화학적 기계적 연마를 위한 수성 연마 조성물 및 방법
|
|
SG191909A1
(en)
*
|
2011-01-11 |
2013-08-30 |
Cabot Microelectronics Corp |
Metal-passivating cmp compositions and methods
|
|
US8986524B2
(en)
|
2011-01-28 |
2015-03-24 |
International Business Machines Corporation |
DNA sequence using multiple metal layer structure with different organic coatings forming different transient bondings to DNA
|
|
CN102268225B
(zh)
*
|
2011-05-30 |
2014-03-26 |
上海百兰朵电子科技有限公司 |
永悬浮钻石研磨液
|
|
EP2568024A1
(en)
|
2011-09-07 |
2013-03-13 |
Basf Se |
A chemical mechanical polishing (cmp) composition comprising a glycoside
|
|
JP6125507B2
(ja)
|
2011-09-07 |
2017-05-10 |
ビーエーエスエフ ソシエタス・ヨーロピアBasf Se |
グリコシドを含む化学機械研磨(cmp)組成物
|
|
KR101411019B1
(ko)
*
|
2011-12-29 |
2014-06-24 |
제일모직주식회사 |
Cmp 슬러리 조성물 및 이를 이용한 연마 방법
|
|
KR101385044B1
(ko)
*
|
2011-12-30 |
2014-04-15 |
제일모직주식회사 |
Cmp 슬러리 조성물 및 이를 이용한 연마 방법
|
|
TWI573864B
(zh)
*
|
2012-03-14 |
2017-03-11 |
卡博特微電子公司 |
具有高移除率及低缺陷率之對氧化物及氮化物有選擇性之cmp組成物
|
|
US10029915B2
(en)
*
|
2012-04-04 |
2018-07-24 |
International Business Machines Corporation |
Functionally switchable self-assembled coating compound for controlling translocation of molecule through nanopores
|
|
US8778212B2
(en)
*
|
2012-05-22 |
2014-07-15 |
Cabot Microelectronics Corporation |
CMP composition containing zirconia particles and method of use
|
|
US9039914B2
(en)
|
2012-05-23 |
2015-05-26 |
Cabot Microelectronics Corporation |
Polishing composition for nickel-phosphorous-coated memory disks
|
|
EP2858097B1
(en)
|
2012-05-30 |
2019-02-27 |
Kuraray Co., Ltd. |
Slurry for chemical mechanical polishing and chemical mechanical polishing method
|
|
EP2682440A1
(en)
*
|
2012-07-06 |
2014-01-08 |
Basf Se |
A chemical mechanical polishing (cmp) composition comprising a non-ionic surfactant and a carbonate salt
|
|
US9633863B2
(en)
*
|
2012-07-11 |
2017-04-25 |
Cabot Microelectronics Corporation |
Compositions and methods for selective polishing of silicon nitride materials
|
|
US8859428B2
(en)
|
2012-10-19 |
2014-10-14 |
Air Products And Chemicals, Inc. |
Chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) applications and methods of making thereof
|
|
EP2914675A4
(en)
*
|
2012-11-02 |
2016-10-05 |
L Livermore Nat Security Llc |
METHOD FOR PREVENTING AGGLOMERATION OF LOADED COLLOIDS WITHOUT LOSS OF SURFACE ACTIVITY
|
|
US9434859B2
(en)
*
|
2013-09-24 |
2016-09-06 |
Cabot Microelectronics Corporation |
Chemical-mechanical planarization of polymer films
|
|
US9340706B2
(en)
|
2013-10-10 |
2016-05-17 |
Cabot Microelectronics Corporation |
Mixed abrasive polishing compositions
|
|
US9279067B2
(en)
|
2013-10-10 |
2016-03-08 |
Cabot Microelectronics Corporation |
Wet-process ceria compositions for polishing substrates, and methods related thereto
|
|
US9281210B2
(en)
*
|
2013-10-10 |
2016-03-08 |
Cabot Microelectronics Corporation |
Wet-process ceria compositions for polishing substrates, and methods related thereto
|
|
JP6191433B2
(ja)
*
|
2013-12-11 |
2017-09-06 |
旭硝子株式会社 |
研磨剤および研磨方法
|
|
US9238754B2
(en)
*
|
2014-03-11 |
2016-01-19 |
Cabot Microelectronics Corporation |
Composition for tungsten CMP
|
|
CN104073170B
(zh)
*
|
2014-06-24 |
2015-11-18 |
江苏天恒纳米科技股份有限公司 |
一种铝合金表面超精密加工专用纳米浆料及其制备方法
|
|
WO2015200663A1
(en)
*
|
2014-06-25 |
2015-12-30 |
Cabot Microelectronics Corporation |
Colloidal silica chemical-mechanical polishing composition
|
|
JP6435689B2
(ja)
*
|
2014-07-25 |
2018-12-12 |
Agc株式会社 |
研磨剤と研磨方法、および研磨用添加液
|
|
US9530655B2
(en)
*
|
2014-09-08 |
2016-12-27 |
Taiwan Semiconductor Manufacting Company, Ltd. |
Slurry composition for chemical mechanical polishing of Ge-based materials and devices
|
|
CN104263320B
(zh)
*
|
2014-09-10 |
2016-03-02 |
句容金猴机械研究所有限公司 |
一种机械设备耐高温研磨剂及其制备方法
|
|
JP5893700B1
(ja)
|
2014-09-26 |
2016-03-23 |
花王株式会社 |
酸化珪素膜用研磨液組成物
|
|
JP6611485B2
(ja)
|
2014-11-07 |
2019-11-27 |
株式会社フジミインコーポレーテッド |
研磨方法およびポリシング用組成物
|
|
CN104650740B
(zh)
*
|
2014-12-10 |
2017-07-14 |
深圳市力合材料有限公司 |
一种可实现快速稳定抛光的抛光液
|
|
SG11201705419RA
(en)
*
|
2015-01-12 |
2017-07-28 |
Versum Mat Us Llc |
Composite abrasive particles for chemical mechanical planarization composition and method of use thereof
|
|
US9803107B2
(en)
|
2015-02-12 |
2017-10-31 |
Asahi Glass Company, Limited |
Polishing agent, polishing method and method for manufacturing semiconductor integrated circuit device
|
|
WO2016132952A1
(ja)
*
|
2015-02-20 |
2016-08-25 |
株式会社フジミインコーポレーテッド |
研磨用組成物
|
|
US10414947B2
(en)
|
2015-03-05 |
2019-09-17 |
Cabot Microelectronics Corporation |
Polishing composition containing ceria particles and method of use
|
|
US9505952B2
(en)
|
2015-03-05 |
2016-11-29 |
Cabot Microelectronics Corporation |
Polishing composition containing ceria abrasive
|
|
US9758697B2
(en)
|
2015-03-05 |
2017-09-12 |
Cabot Microelectronics Corporation |
Polishing composition containing cationic polymer additive
|
|
US10032644B2
(en)
*
|
2015-06-05 |
2018-07-24 |
Versum Materials Us, Llc |
Barrier chemical mechanical planarization slurries using ceria-coated silica abrasives
|
|
WO2017011451A1
(en)
*
|
2015-07-13 |
2017-01-19 |
Cabot Microelectronics Corporation |
Methods and compositions for processing dielectric substrate
|
|
US10619075B2
(en)
*
|
2015-07-13 |
2020-04-14 |
Cabot Microelectronics Corporation |
Self-stopping polishing composition and method for bulk oxide planarization
|
|
EP3344716A4
(en)
*
|
2015-09-03 |
2019-04-10 |
Cabot Microelectronics Corporation |
METHODS AND COMPOSITIONS FOR TREATING DIELECTRIC SUBSTRATE
|
|
US10144850B2
(en)
*
|
2015-09-25 |
2018-12-04 |
Versum Materials Us, Llc |
Stop-on silicon containing layer additive
|
|
KR102543680B1
(ko)
|
2015-12-17 |
2023-06-16 |
솔브레인 주식회사 |
화학기계적 연마 슬러리 조성물
|
|
JP6657935B2
(ja)
*
|
2015-12-25 |
2020-03-04 |
日立化成株式会社 |
研磨液
|
|
KR102731867B1
(ko)
*
|
2015-12-29 |
2024-11-18 |
씨엠씨 머티리얼즈 엘엘씨 |
알킬아민 및 사이클로덱스트린을 포함하는 화학적-기계적 폴리싱(cmp) 처리용 조성물
|
|
WO2018038885A1
(en)
*
|
2016-08-26 |
2018-03-01 |
Ferro Corporation |
Slurry composition and method of selective silica polishing
|
|
EP3526298B1
(en)
|
2016-10-17 |
2024-07-10 |
CMC Materials LLC |
Cmp compositions selective for oxide and nitride with improved dishing and pattern selectivity
|
|
US10570315B2
(en)
*
|
2016-11-08 |
2020-02-25 |
Fujimi Incorporated |
Buffered slurry formulation for cobalt CMP
|
|
CN108117839B
(zh)
|
2016-11-29 |
2021-09-17 |
安集微电子科技(上海)股份有限公司 |
一种具有高氮化硅选择性的化学机械抛光液
|
|
CN108117840B
(zh)
*
|
2016-11-29 |
2021-09-21 |
安集微电子科技(上海)股份有限公司 |
一种氮化硅化学机械抛光液
|
|
KR102677797B1
(ko)
*
|
2016-12-22 |
2024-06-24 |
주식회사 케이씨텍 |
Sti 공정용 연마 슬러리 조성물
|
|
US10286518B2
(en)
|
2017-01-31 |
2019-05-14 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Chemical mechanical polishing method for tungsten
|
|
US9984895B1
(en)
|
2017-01-31 |
2018-05-29 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Chemical mechanical polishing method for tungsten
|
|
US20180244955A1
(en)
*
|
2017-02-28 |
2018-08-30 |
Versum Materials Us, Llc |
Chemical Mechanical Planarization of Films Comprising Elemental Silicon
|
|
US10319601B2
(en)
*
|
2017-03-23 |
2019-06-11 |
Applied Materials, Inc. |
Slurry for polishing of integrated circuit packaging
|
|
JP6708994B2
(ja)
|
2017-03-27 |
2020-06-10 |
日立化成株式会社 |
スラリ及び研磨方法
|
|
WO2018179061A1
(ja)
*
|
2017-03-27 |
2018-10-04 |
日立化成株式会社 |
研磨液、研磨液セット及び研磨方法
|
|
US10106705B1
(en)
|
2017-03-29 |
2018-10-23 |
Fujifilm Planar Solutions, LLC |
Polishing compositions and methods of use thereof
|
|
CN110520493B
(zh)
*
|
2017-04-17 |
2022-11-22 |
Cmc材料股份有限公司 |
自停止性抛光组合物及用于块状氧化物平坦化的方法
|
|
CN109251680A
(zh)
*
|
2017-07-13 |
2019-01-22 |
安集微电子科技(上海)股份有限公司 |
一种化学机械抛光液
|
|
CN109251677B
(zh)
*
|
2017-07-13 |
2021-08-13 |
安集微电子科技(上海)股份有限公司 |
一种化学机械抛光液
|
|
US10428241B2
(en)
|
2017-10-05 |
2019-10-01 |
Fujifilm Electronic Materials U.S.A., Inc. |
Polishing compositions containing charged abrasive
|
|
KR102533083B1
(ko)
*
|
2017-12-18 |
2023-05-17 |
주식회사 케이씨텍 |
다결정실리콘을 함유하는 웨이퍼의 연마 슬러리 조성물
|
|
KR20190074597A
(ko)
|
2017-12-20 |
2019-06-28 |
주식회사 케이씨텍 |
Sti 공정용 연마 슬러리 조성물
|
|
US10584266B2
(en)
*
|
2018-03-14 |
2020-03-10 |
Cabot Microelectronics Corporation |
CMP compositions containing polymer complexes and agents for STI applications
|
|
WO2019181013A1
(ja)
|
2018-03-22 |
2019-09-26 |
日立化成株式会社 |
研磨液、研磨液セット及び研磨方法
|
|
WO2020021680A1
(ja)
|
2018-07-26 |
2020-01-30 |
日立化成株式会社 |
スラリ及び研磨方法
|
|
US11643599B2
(en)
|
2018-07-20 |
2023-05-09 |
Versum Materials Us, Llc |
Tungsten chemical mechanical polishing for reduced oxide erosion
|
|
US11718767B2
(en)
*
|
2018-08-09 |
2023-08-08 |
Versum Materials Us, Llc |
Chemical mechanical planarization composition for polishing oxide materials and method of use thereof
|
|
WO2020065723A1
(ja)
|
2018-09-25 |
2020-04-02 |
日立化成株式会社 |
スラリ及び研磨方法
|
|
US20200102475A1
(en)
*
|
2018-09-28 |
2020-04-02 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Chemical mecahnical polishing composition and method of polishing silcon dioxide over silicon nitiride
|
|
US11180678B2
(en)
|
2018-10-31 |
2021-11-23 |
Versum Materials Us, Llc |
Suppressing SiN removal rates and reducing oxide trench dishing for Shallow Trench Isolation (STI) process
|
|
US20200172759A1
(en)
*
|
2018-12-04 |
2020-06-04 |
Cabot Microelectronics Corporation |
Composition and method for cobalt cmp
|
|
US10988635B2
(en)
*
|
2018-12-04 |
2021-04-27 |
Cmc Materials, Inc. |
Composition and method for copper barrier CMP
|
|
US10763119B2
(en)
|
2018-12-19 |
2020-09-01 |
Fujifilm Electronic Materials U.S.A., Inc. |
Polishing compositions and methods of using same
|
|
US10759970B2
(en)
*
|
2018-12-19 |
2020-09-01 |
Fujifilm Electronic Materials U.S.A., Inc. |
Polishing compositions and methods of using same
|
|
KR102709495B1
(ko)
*
|
2018-12-31 |
2024-09-25 |
주식회사 동진쎄미켐 |
화학-기계적 연마 입자 및 이를 포함하는 연마 슬러리 조성물
|
|
US11608451B2
(en)
|
2019-01-30 |
2023-03-21 |
Versum Materials Us, Llc |
Shallow trench isolation (STI) chemical mechanical planarization (CMP) polishing with tunable silicon oxide and silicon nitride removal rates
|
|
US20200270479A1
(en)
*
|
2019-02-26 |
2020-08-27 |
Versum Materials Us, Llc |
Shallow Trench Isolation Chemical And Mechanical Polishing Slurry
|
|
EP3963019A4
(en)
*
|
2019-04-29 |
2023-01-18 |
Versum Materials US, LLC |
SELECTIVE CHEMICAL-MECHANICAL PLANARIZATION POLISHING
|
|
JP7518824B2
(ja)
*
|
2019-06-06 |
2024-07-18 |
株式会社レゾナック |
研磨液及び研磨方法
|
|
KR102814738B1
(ko)
*
|
2019-08-06 |
2025-05-30 |
삼성디스플레이 주식회사 |
연마 슬러리, 이를 이용한 표시 장치의 제조방법 및 표시 장치
|
|
JP2022553346A
(ja)
*
|
2019-10-22 |
2022-12-22 |
シーエムシー マテリアルズ,インコーポレイティド |
酸化ケイ素及び炭素ドープ酸化ケイ素cmpのための組成物並びに方法
|
|
CN113004798B
(zh)
*
|
2019-12-19 |
2024-04-12 |
安集微电子(上海)有限公司 |
一种化学机械抛光液
|
|
JP7409899B2
(ja)
*
|
2020-02-18 |
2024-01-09 |
株式会社フジミインコーポレーテッド |
研磨用組成物、研磨方法、および半導体基板の製造方法
|
|
JP7409918B2
(ja)
*
|
2020-03-13 |
2024-01-09 |
株式会社フジミインコーポレーテッド |
研磨用組成物、研磨用組成物の製造方法、研磨方法および半導体基板の製造方法
|
|
JP7487507B2
(ja)
*
|
2020-03-23 |
2024-05-21 |
株式会社レゾナック |
研磨剤及び研磨方法
|
|
US11680186B2
(en)
|
2020-11-06 |
2023-06-20 |
Fujifilm Electronic Materials U.S.A., Inc. |
Polishing compositions and methods of using same
|
|
CN114621683A
(zh)
*
|
2020-12-11 |
2022-06-14 |
安集微电子(上海)有限公司 |
一种化学机械抛光液及其使用方法
|
|
KR20220120864A
(ko)
*
|
2021-02-24 |
2022-08-31 |
에스케이하이닉스 주식회사 |
실리콘 산화막 연마용 cmp 슬러리 조성물
|
|
WO2022240842A1
(en)
*
|
2021-05-13 |
2022-11-17 |
Araca, Inc. |
Silicon carbide (sic) wafer polishing with slurry formulation and process
|
|
WO2023013059A1
(ja)
*
|
2021-08-06 |
2023-02-09 |
昭和電工マテリアルズ株式会社 |
Cmp用研磨液、cmp用研磨液セット及び研磨方法
|
|
KR102677801B1
(ko)
*
|
2021-10-14 |
2024-06-25 |
주식회사 케이씨텍 |
연마 슬러리 조성물
|
|
KR20230063182A
(ko)
*
|
2021-11-01 |
2023-05-09 |
주식회사 케이씨텍 |
연마용 슬러리 조성물
|
|
US20250101261A1
(en)
*
|
2022-02-07 |
2025-03-27 |
Araca, Inc. |
Chemical mechanical planarization slurry processing techniques and systems and methods for polishing substrate using the same
|
|
KR20230144386A
(ko)
|
2022-04-07 |
2023-10-16 |
삼성전자주식회사 |
반도체 소자 및 그 제조방법
|
|
CN115160933B
(zh)
*
|
2022-07-27 |
2023-11-28 |
河北工业大学 |
一种用于钴互连集成电路钴cmp的碱性抛光液及其制备方法
|
|
CN115746711B
(zh)
*
|
2022-11-08 |
2023-07-14 |
东莞领航电子新材料有限公司 |
一种铝合金镜面抛光液以及抛光方法
|
|
CN115710464A
(zh)
*
|
2022-11-11 |
2023-02-24 |
博力思(天津)电子科技有限公司 |
一种低表面粗糙度的氧化硅介质层化学机械抛光液
|
|
CN117229716A
(zh)
*
|
2023-08-23 |
2023-12-15 |
上海集成电路材料研究院有限公司 |
一种含吗啉环水溶性小分子的用途及化学机械抛光液
|
|
CN117229717A
(zh)
*
|
2023-08-23 |
2023-12-15 |
上海集成电路材料研究院有限公司 |
一种化学机械抛光液及其制备方法和用途
|
|
KR20250051317A
(ko)
*
|
2023-10-10 |
2025-04-17 |
주식회사 케이씨텍 |
표면 개질된 나노 세리아 입자를 포함하는 cmp 슬러리 조성물
|
|
CN117683468A
(zh)
*
|
2023-11-16 |
2024-03-12 |
江苏山水半导体科技有限公司 |
一种用于sti结构的化学机械抛光液及其制备方法和应用
|
|
WO2025141810A1
(ja)
*
|
2023-12-27 |
2025-07-03 |
株式会社レゾナック |
研磨液及び研磨方法
|
|
US20250297135A1
(en)
*
|
2024-03-25 |
2025-09-25 |
Entegris, Inc. |
Ceria and hydroxamic acid cmp composition
|
|
CN119039991B
(zh)
*
|
2024-10-30 |
2025-06-03 |
西安蓝桥新能源科技有限公司 |
一种用于硅片碱刻蚀抛光的添加剂、反应液及方法与应用
|
|
CN119432234A
(zh)
*
|
2024-10-31 |
2025-02-14 |
西北工业大学宁波研究院 |
一种用于sti技术的氧化铈抛光液及抛光条件
|