CN102782869A - 使用三维半导体吸收器的高效光伏背触点太阳能电池的结构和制造方法 - Google Patents

使用三维半导体吸收器的高效光伏背触点太阳能电池的结构和制造方法 Download PDF

Info

Publication number
CN102782869A
CN102782869A CN2010800634967A CN201080063496A CN102782869A CN 102782869 A CN102782869 A CN 102782869A CN 2010800634967 A CN2010800634967 A CN 2010800634967A CN 201080063496 A CN201080063496 A CN 201080063496A CN 102782869 A CN102782869 A CN 102782869A
Authority
CN
China
Prior art keywords
contact
dimensional
solar cell
back side
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2010800634967A
Other languages
English (en)
Other versions
CN102782869B (zh
Inventor
M·M·穆斯利赫
P·卡普尔
K·J·克拉默
D·X·王
S·苏特
V·V·雷纳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beamreach Solexel Assets Inc
Original Assignee
Solexel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solexel Inc filed Critical Solexel Inc
Publication of CN102782869A publication Critical patent/CN102782869A/zh
Application granted granted Critical
Publication of CN102782869B publication Critical patent/CN102782869B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • H01L31/035281Shape of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0236Special surface textures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/02002Arrangements for conducting electric current to or from the device in operations
    • H01L31/02005Arrangements for conducting electric current to or from the device in operations for device characterised by at least one potential jump barrier or surface barrier
    • H01L31/02008Arrangements for conducting electric current to or from the device in operations for device characterised by at least one potential jump barrier or surface barrier for solar cells or solar cell modules
    • H01L31/0201Arrangements for conducting electric current to or from the device in operations for device characterised by at least one potential jump barrier or surface barrier for solar cells or solar cell modules comprising specially adapted module bus-bar structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0216Coatings
    • H01L31/02161Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02167Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022408Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/022425Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • H01L31/022441Electrode arrangements specially adapted for back-contact solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022408Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/022425Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • H01L31/022441Electrode arrangements specially adapted for back-contact solar cells
    • H01L31/022458Electrode arrangements specially adapted for back-contact solar cells for emitter wrap-through [EWT] type solar cells, e.g. interdigitated emitter-base back-contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0236Special surface textures
    • H01L31/02363Special surface textures of the semiconductor body itself, e.g. textured active layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • H01L31/03529Shape of the potential jump barrier or surface barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/036Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
    • H01L31/0392Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
    • H01L31/03921Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including only elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/054Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
    • H01L31/056Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means the light-reflecting means being of the back surface reflector [BSR] type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/068Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
    • H01L31/068Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
    • H01L31/0682Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells back-junction, i.e. rearside emitter, solar cells, e.g. interdigitated base-emitter regions back-junction cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1892Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof methods involving the use of temporary, removable substrates
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/52PV systems with concentrators
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Sustainable Energy (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Photovoltaic Devices (AREA)

Abstract

提供了背结背触点三维太阳能电池及其制造方法。背结背触点三维太阳能电池包括三维衬底。该衬底包括具有钝化层的光捕获正面表面,掺杂的基极区域,和极性与掺杂的基极区域相反的掺杂的背面发射极区域。背面钝化层置于掺杂的背面发射极区域上。背面发射极触点和背面基极触点,其连接至金属互连件且选择性地在三维太阳能电池背面的三维特征上形成。

Description

使用三维半导体吸收器的高效光伏背触点太阳能电池的结构和制造方法
相关申请
本申请要求2009年12月9日提交的临时专利申请61/285140的权益,其通过引用并入本文中。
技术领域
本发明大体涉及光伏和太阳能电池技术领域,更具体地涉及背结背触点薄太阳能电池及其制造方法。
背景技术
目前,晶体硅在光伏(PV)产业的市场份额最大,占整个PV市场的80%以上。尽管制造更薄的晶体硅太阳能电池长期以来被认为是降低PV成本最有效的策略之一(因为太阳能电池中使用的晶体硅晶片的相对较高的材料成本占了PV模块总成本的一部分),但是由于衬底尺寸较大较薄,这使得使用较薄的晶体的过程中存在很多机械破损问题。其他问题包括在薄结构中存在光捕获不充分,这是由于硅是一种间接能隙半导体材料。另外,在PV工厂中,在制造量较高的情况下很难以一种有效节约成本的方式取得高机械产量和降低的晶片破损率之间的平衡。
对于无支撑的独立式晶体硅太阳能电池而言,比当前的厚度范围140μm-250μm再稍微降低一点也会在制造过程中严重危害到机械产量。薄膜硅尤其具有机械脆性,会造成制造和处理困难。因此,任何处理非常薄的太阳能电池结构的方案可采用在整个电池工艺中电池完全由主载体支撑的电池工艺,或者是采用新颖的自支撑、独立、具有结构创新的衬底的电池工艺。
尽管过去太阳能电池行业很多人尝试使用诸如玻璃的载体来支撑薄衬底,然而这些载具有很严重的缺陷,包括最高处理温度很低(在玻璃情况下),这会潜在地影响太阳能电池的效率。还有人尝试制造小面积薄的电池,这样就不会有严重的破损问题了;然而,商业可行性要求大的电池面积。
以较低制造成本获得较高的电池和模组效率对于太阳能电池发展和制造而言很关键。背结/背触点电池体系结构非常高效,主要是由于电池正面无金属遮挡,前面无发射极,无由此导致的高蓝光响应,并且还因为背面可能较低的金属电阻。本领域的技术人员知道背触点电池要求少数载流子扩散长度与衬底厚度的比值要非常高(同时任何太阳能电池都要有好的标准,包括正面触点电池,这对背触点电池尤其重要)该比值典型地应大于五。
由于在不影响机械产量的情况下很难降低电池的厚度,因此目前的背结背触点太阳能电池的重点在于使用寿命很长的材料。虽然这会产生较大的扩散长度,但是使用寿命长的材料也会增加衬底的成本。然而,使用较薄的电池,其扩散长度不一定要要求如此高,这就使得材料质量的要求很容易满足,因此电池的成本也会降低。除这种成本降低之外,使用较少的硅成本会明显降低。因此,在非常薄的晶体硅衬底上的背结/背触点电池具有大的成本和性能优势。
发明内容
根据本发明,提供了用于制造超薄晶体硅、大面积(适合于商业应用)的、背结背触点太阳能电池的方法及其创新结构。
本发明提供了背结背触点三维太阳能电池及其制造方法。背结背触点三维太阳能电池包括三维衬底。该衬底包括具有钝化层的光俘获正面表面,掺杂的基极区域,和极性与掺杂的基极区域相反的掺杂的背面发射极区域。背面钝化层置于掺杂的背面发射极区域上。背面发射极触点和背面基极触点,其连接至金属互连件且选择性地在三维太阳能电池背面的三维特征上形成。
由于此处提供的描述,本发明以及其它新颖特征会很明显。本简要内容不是要对权利要求的主题进行综合描述,而是对本发明的功能性进行简短的概述。在查阅以下图表和详细描述时,此处提供的其它系统、方法、特征和优点对于本领域的技术人员来说将变得明显。本简要内容的意图是将所有包含在本描述内的这些其它的系统、方法、特征和优点包括在伴随的权利要求的范围内。
附图说明
现参考以下结合附图的描述,以便对本发明及其优点有一个更全面的理解,附图中相似的标号表示相似的特征,其中:
图1A和1B是可重复使用的模板的侧视图和俯视图;
图2A和2B是硅衬底的照片;
图3是示出制造背结背触点薄太阳能电池的工艺流程;
图4A-4C是制造可重复使用的模板的剖面图;
图5A至5D是制造衬底的剖面图
图6A至6H是经过图3流程中的关键制造工艺步骤后太阳能电池的剖面图;
图7是制造示例性太阳能电池的工艺流程;
图8A至8H是经过图7中制造工艺流程的关键处理步骤后太阳能电池的剖视图;
图9是制造另一种示例性太阳能电池的工艺流程;
图10是图9中电池的最终结构的剖面图;
图11是制造另一种示例性太阳能电池的工艺流程;
图12A-12H是图示经过图11中工艺流程的关键制造步骤后电池的剖面图;
图13图示了制造另一种示例性太阳能电池的工艺流程;
图14是图13中电池的最终结构的剖面图;
图15图示了制造另一种示例性太阳能电池的工艺流程;
图16是图15中电池的最终结构的剖面图;
图17图示了制造另一种示例性太阳能电池的工艺流程;
图18A-18F是经过图17中流程的关键处理步骤后太阳能电池的剖视图;
图19图示了制造另一种示例性太阳能电池的工艺流程;
图20是图19中电池的最终结构的剖面图;
图21图示了制造另一种示例性太阳能电池的工艺流程;
图22是图21中电池的最终结构的剖面图;
图23图示了制造另一种示例性太阳能电池的工艺流程;和
图24是图23中电池的最终结构的剖面图。
具体实施方式
以下描述没有限制意义,其目的是为了描述本发明的一般原理。本发明的范围应该根据权利要求而定。本发明的示例性实施例在附图中图示,相同标号在在附图中表示相同或相应部件。
本发明提供了背结背触点薄半导体电池的结构方案和制造工艺方案。尽管以上描述是针对硅这种薄膜硅衬底(TFSS),但也可以使用其它半导体材料如锗或砷化镓,而不脱离本发明的结构和方法的范围。使用硅或其它半导体材料的异质结和多结太阳能电池也在本发明的范围内。另外,三维背结背触点太阳能电池及其制造方法适用于衬底上任何三维形状/结构或微观结构,但是所显示并描述的是倒金字塔结构。术语“PyCell”此处指的是倒金字塔型结构的背结触点太阳能电池。
在操作中,首先使用外延生长在可重复使用的模板顶面制造一般厚度小于100um(尤其是在15um至50um范围内)的大面积(在156mmX156mm的范围内)薄太阳能电池衬底,且随后该衬底被移出。该可重复使用的模板可具有三维结构,或在另一种实施例中大体上是平面的。它可重复使用多次用于外延生长,这样便可分摊模板成本。TFSS可利用牺牲层从模板上分离,该牺牲层不仅可以将结晶性从模板传送到TFSS,而且与TFSS和可重复使用的模板相比还可以容易地、可选择性地被去除。牺牲层的一个例子是多孔硅,其孔隙率可被调整或分级以便获得上述两个重要功能。使用上述方法制造薄太阳能电池衬底之后,关键挑战是在制造太阳能电池的过程中处理这些TFSS,且不造成破损和分裂。从经营成本的角度来看,沉积非常薄的硅层是可取的。随着层逐渐变薄,应对薄层衬底进行增强以保证通过此工艺流程可获得较高的机械产量,例如带有超薄(1um到30um)硅层的大(156mmx156mm近似方形)三维TFSS。以下结构和方法用于解决TFSS加工问题并可增大总效率。
图1A和1B分别为PyCell可重复使用的硅模板的剖面图和俯视图。图1A图示了可重复使用的倒金字塔型模板的部分剖面图,该金字塔型模板剖面由大金字塔型空腔和小金字塔型空腔组成。由于是通过各向异性硅蚀刻对金字塔型空腔进行化学蚀刻,所以侧壁和顶部横向平面之间的角度是54.7度,即(111)和(100)硅结晶平面之间的角度是54.7度。图1B图示了本发明中所制造的模板的俯视图。结构化的硅模板由各向异性蚀刻的大金字塔型空腔和小金字塔型空腔组成。大空腔的顶部开口尺寸在10μm到1mm的范围内,小空腔的顶部开口尺寸是大空腔开口尺寸的一部分。例如,大空腔开口大约是200μm,而小空腔开口大约是100μm。在这种情况下,大空腔的深度大约是140μm,而小空腔的深度大约是70μm。
图2A和2B是PyCell硅衬底背面视图和正面视图的照片。图2A图示了衬底背面,所有的基极和发射极触点、结、金属指状电极和汇流条都在衬底背面上制造。由于背面表面不是平面,优选地将触点和金属指状电极放置在顶部表面,比如放置在脊的顶部。图2B图示了衬底正面,也就是太阳能电池的向阳面。规则的金字塔型结构可提供有效的光捕获效果。
图3是示出制造背结背触点薄太阳能电池,PyCell-1的制造工艺的工艺流程。工艺流程包括三个竖栏:模板、衬底和电池,分别与模板、衬底和电池处理步骤相对应。图4A至4C是当根据图3中的模板制造工艺制造可重复使用的模板时在关键制造工艺步骤后制造可重复使用的模板的剖视图。
如图4A所示,模板制作过程从使用单晶硅晶片(100)开始。起始的晶片可以是圆形、正方形或近似方形的形状。此步骤包括在暴露的晶片表面形成薄而硬的掩蔽层。硬掩蔽层用于掩蔽后续步骤中不需要蚀刻的硅表面区域。硬度适当的掩蔽层包括,但不局限于,热生长的硅氧化物和低压汽相沉积的(LPCVD)氮化硅。下一个步骤包括光刻步骤,其光刻涂胶、烘焙、在光掩模上方进行紫外线曝光、后烘焙、光刻胶显影以及晶片清洗和干燥构成。经过这些步骤,光掩模上的图案,比如错开的正方形开口,被转移到光刻层。图案化的光刻层在后续步骤中作为软掩蔽层用于硬掩蔽层蚀刻。下一个步骤包括通过化学蚀刻将光刻图案进一步转移到下面的硬掩蔽层,比如用缓冲HF溶液蚀刻薄硅氧化层。也可以使用其它已知的用于半导体和MEMS晶片处理的湿蚀刻方法和干蚀刻方法。在下一个步骤中,去除剩余的软掩蔽层即光刻层,并清洁晶片。光刻去除工艺的例子包括湿法,如使用丙酮或食人鱼溶液(硫酸和过氧化氢的混合液),或干法,如氧等离子体灰化。在下一个步骤中,晶片被批量装入各向异性的硅液体蚀刻剂中,如KOH溶液。典型的蚀刻温度在50°C到80°C之间,蚀刻速率大约是0.2μm/min-1μm/min。在一个实施例中,大金字塔型空腔的蚀刻深度在50μm-200μm的范围内。TMAH(四甲基氢氧化铵)是另一种选择性的各向异性硅蚀刻化学品。KOH或TMAH硅蚀刻速率取决于对晶体硅平面的取向。结晶平面(111)族的蚀刻速率都非常慢,且对于用图案化的硬掩膜对硅晶片(100)进行各向异性蚀刻而言,这些结晶平面通常是“停止(stop)”面。结果,交叉的水平面(111)形成具有尖头空腔底部和四个平面侧壁(111)的金字塔型空腔,如图4B所示。在制造模板的最后一个步骤中,如图4C所示,除去硬蚀刻掩膜。
图5A至5D为根据图3中的衬底制造工艺,关键制造工艺步骤后制造衬底的剖面图。图5A至5D中的剖面图描述的结构特征是一致的,除非另行标注。
第一个步骤以预结构化的模板开始,通过对模板表面的正面和背面的硅进行电化学阳极HF蚀刻,在该模板上形成多孔硅层。在HF/IPA(或HF/醋酸)溶液中形成多孔硅的过程中,周期性地将电流极性在正电流和负电流之间转换,使得每一个模板面/表面都能被顺序地蚀刻,以在模板的正面和背面形成双层或多层多孔硅结构。除了周期性的电流极性转换,电流强度也以一种受控的方式被改变以形成优选地由两个孔隙率不同的(低和高)薄层组成的多孔硅层。第一薄多孔硅层在顶部,且首先由块状硅晶片制成。第一薄层优选地具有较低的孔隙率,其孔隙率在15%到30%之间。第二薄多孔硅层被直接蚀刻到块状硅中,且位于第一薄多孔硅层下面。第二薄多孔硅层优选地具有较高孔隙率,其孔隙率在40%到80%的范围内。顶部较低孔隙率多孔硅层用作为晶体种子层,以获得高质量的外延硅生长,下面的较高孔隙率多孔硅层由于其物理连接(在外延硅和块状硅界面之间)密度较低以及机械强度弱,因此被用于促进TFSS的分离。选择性地,也可使用孔隙率从顶部到底部逐渐增大的单多孔分离层。在这种情况下,多孔硅层顶部的孔隙率较低,在15%到30%之间,而多孔硅层下部的孔隙率较高,在40%以80%之间。在下一个步骤中,在外延硅生长之前,将晶片放入外延硅沉积反应器内,在高温(950度到1200度,且优选地在1050度到1150度的范围内)氢环境下烘焙,以便在较高孔隙率掩埋的多孔硅层内形成联合结构(空隙相对较大),同时在孔隙率较低的多孔硅层顶部形成连续的晶体硅表面种子层。接下来,在模板上沉积单晶外延硅层,优选地在生产量高,批量大的外延火炉中进行。外延层可原位掺杂。在该工艺流程中,外延层的块状基极是N(磷)型掺杂,内层可以是掺杂等级比n-型基极高的n+(磷)型掺杂,如此形成前表面场(FSF),并且外层可以是P(硼)掺杂以形成太阳能电池的发射极区域。外延层是薄的,优选地100μm。更具体地,除了硅掺入(三氯氢硅-TCS)和其它必要的气体外,基极掺杂可通过使用磷化氢(磷掺入)气体获得,且在外延工艺最后发射极生长结束时,可按程序控制反应器将其切换到乙硼烷(硼掺入)替代磷化氢。应优化基极和发射极区域的厚度以获得最佳的太阳能电池性能。在一个实施例中,优选地基极厚度小于100μm,掺杂在5e14和1e17cm-3之间,发射极厚度小于3μm,掺杂在1e18和3e20cm-3之间。发射极也可以分很多步骤,每一个步骤产生一个不同的浓度。这种外延结构有利于太阳能电池产生高的开路电压,从而实现更高的效率。在下一个步骤中,薄氧化层在外延表面热生长。薄氧化层用于太阳能电池表面钝化,以及用于后续选择性表面开口的掩蔽层。图5A图示了薄氧化步骤后的剖面图。
在下一个步骤中,施加增强层以填充空腔且覆盖整个顶部表面。增强层的材料须能承受高温,比如200-300度,以用于后续的前表面PECVD氮化硅钝化工艺。作为例子,聚酰亚胺可用于所述增强目的。增强层可通过喷雾涂覆,之后进行固化或进行薄膜真空分层工艺来施加。选择性地,增强可通过夹紧载板来实现。夹紧可通过使用真空力来完成,或由静电夹头(ESC)或可移动静电载具(MESC)辅助或实现。图5B示出背面增强后的剖面图。在如图3所示,在下一个步骤中,对模板边缘顶部表面以及斜表面进行机械抛光以便在模板边缘将外延硅层与模板进行物理分离。通过进行局部浅层激光切割穿越外延层而不损害下面模板的表面可进一步在模板上限定PyCell TFSS的边界。在下一个步骤中,被强化的硅外延层从模板上分离/分开。在一个公开的方法中,TFSS是在超声波DI-水浴中被分离。然而在另一种公开的方法中,在晶片背面和顶部外延被真空吸紧的情况下,通过直接拉拔分离TFSS。分离的三维TFSS的厚度在50μm到200μm的范围内(取决于可重复使用的模板上倒金字塔型空腔的深度)而无需考虑增强层。强化的三维TFSS的厚度在0.2mm到1mm的范围内。在下一个步骤中,通过使用KOH或TMAH溶液进行短硅蚀刻来清洁被分离的TFSS背面表面以便去除硅碎片且完整地或局部地去除近似单晶硅(QMS)层。与此同时,且在边缘外延硅层从模板上被去除后,使用稀释的HF和稀释的湿硅蚀刻溶液清洁模板,比如使用TMAH和/或KOH去除剩余的多孔硅层和硅粒子。然后,通过传统的硅晶片清洗方法进一步清洗模板,比如使用SC1和SC2湿法净化(或所谓的RCA清洗工艺)去除可能的有机污染和金属污染。最后,用去离子水进行适当的冲洗且干燥后,该模板便可用于另一个重复使用循环。如图5C所示,强化的PyCell衬底,被称为三维TFSS,已制成,并且准备好进行后续的电池制造工艺。
图6A到6H是当根据图3中的制造工艺制造太阳能电池时在关键的电池制造工艺步骤后太阳能电池PyCell-1的剖面图。图6A至6H中的剖面图描述的结构特征是一致的,除非另行标注。图6A至6H中,太阳能电池的剖面图显示其正面(向阳面)朝下,背面(非-向阳/触点面)朝上以便更好地图示处理步骤。
如图6A所示,厚度优选地在60nm到100nm之间的PECVD氮化硅层在正面沉积,该正面是PyCell衬底的金字塔面(向阳面)。PECVD氮化硅层用作为表面钝化层和抗反射涂层(ARC)。对于晶体硅太阳能电池而言,降低表面载流子复合是获得高效率的一项重要要求,且由于较大的面容比,这对于薄而大的硅衬底而言更加关键。用介电层进行表面钝化是一种降低表面载流子复合速率的有效方法,因为好的表面钝化层不仅降低表面状态的密度,使介电层产生固定绝缘体电荷,还可提供能将少数载流子从表面逐走的有源场,因此进一步减低表面载流子复合率。氮化硅层也可在正面表面作为抗反射涂层(ARC),以及作为增强物的内部光学反射层以在前表面更好地捕获光。在下一个步骤中,如图6B所示,PyCell衬底正面通过施加一层支撑材料,比如PV-级EVA、Z68或硅树脂而被强化。施加方法包括,但不局限于,热喷涂和真空层压。正面增强后,可完全去除背面增强层,比如通过松开MESC或MOVAC载板,或去除沉积层,如所示的聚酰亚胺层。在另一种实施例中,可局部去除背面增强层(如聚酰亚胺层)以局部暴露衬底背面表面,以便形成结、触点和金属化。
在下一个步骤中,使用对准的激光烧蚀从背面的脊打开发射极触点开口。要求激光烧蚀波长、脉宽和能量剂量能选择性地去除介电层(这种情况下为薄氧化层)而不损伤到下面的硅表面或造成最低损伤。背面增强层去除后且发射极触点开口后的剖面图在图6C中示出。
在下一个步骤中,通过覆盖式喷涂或对准印刷,在表面沉积磷液体掺杂物。在将磷液体掺杂物进行固化后,将激光束指向基极触点区域。通过在基极触点区域顶部烧蚀介电层,受控的激光束将基极触点打开并且驱入磷掺杂物来形成n++基极结。激光处理步骤的剖面图在图6D中示出。在下一个步骤中,在湿蚀刻工艺中,比如使用稀释的HF蚀刻剂除去剩余的磷掺杂物。图6E图示了形成的发射极触点开口、基极触点开口和n++基极结。应注意,在PyCell-1流程中发射极和基极触点开口是离散的,这意味着这些开口没有被连接起来以形成连续的交叉指状线条开口。在下一个步骤中,在脊表面喷墨印刷金属,比如镍((Ni)纳米粒子墨汁以将触点开口连接到交叉指状发射极和基极电极图案。烧结后,印刷的镍薄图案也用作为种子层用于后续的较厚金属电镀工艺。印刷镍的剖面图在图6F中示出,电镀的厚Ni+Cu+Sn的剖面图在图6G中示出。
在这个阶段,太阳能电池(PyCell-1)已完成,并可以接着进行后续的测试和模块组装步骤。然而,在选择性的实施例中,通过实施改良的钝化层堆叠和背反射镜来进一步增大电池效率,背面增强层可被完整地除去,且可选择性地在没有金属触点的背面表面按顺序沉积薄铝氧化物钝化层和薄PVD铝镜层。由于PECVD三氧化二铝层内部存在固定的电荷,该固定电荷可有效降低少数载流子表面复合率,因此PECVD沉积的三氧化二铝层改善了背面表面钝化效果。PVD铝薄层被用作为背反射镜以将光线反射回硅中。沉积PECVD氧化铝和PVD铝之前可使用荫罩,将荫罩适当对准地覆盖到电镀的发射极和基极汇流条触点区域以避免氧化铝和铝层覆盖。可在实施正面增强层之后,随即去除整个背面增强层。图6H示出具有改善的背面表面钝化和增加的PVD铝背反射镜的PyCell-1太阳能电池的剖面图。
图7是根据本发明的制造PyCell太阳能电池另一种示例(PyCell-2)的工艺流程。PyCell-2的可重复使用的模板和PyCell衬底的制作过程可与PyCell-1的模板和衬底的制作过程相同。电池工艺步骤在发射极触点开口步骤之前也可以是相同的。然后,PyCell-2设计包括用于发射极和基极触点的连续的交叉指状线条开口,而非形成非连续的发射极和基极触点开口。结果,喷墨印刷金属纳米粒子墨汁的步骤被取消,因为在PyCell-1中,喷墨印刷镍的目的是用非连续的触点开口来形成连续的交叉指状线条基极和发射极图案。
图8A至8H是经过PyCell-2电池工艺流程的关键制造步骤后,太阳能电池的剖面图。图8A至8C中的处理步骤和结构设计与图6A到6C中的相同。然而,如图8D所示,用对准的激光束扫描连续的交叉指状线条以形成连续的交叉指状线条基极和发射极触点开口(如图8E所示)。所示的基极结也具有连续的交叉指状线条形状。形成触点开口和基极结之后,在暴露的硅表面对镍进行化学镀,然后电镀Cu和Sn以形成发射极和基极金属指状电极和汇流条,如图8G所示。如图6H所示的那样,图8H图示了选择性的实施例PyCell-2,其包括PECVD氧化铝钝化层和PVD铝背反射镜层。PECVD氧化铝钝化层和PVD铝背反射镜层未覆盖发射极和基极汇流条触点区域,此并未在图8(h)中示出。
图9是用于制造PyCell太阳能电池的另一种示例,PyCell-3A的工艺流程。与PyCell-1相比,PyCell-3A的一个不同之处在于背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。图10是图9中PyCell-3A电池工艺流程的最终结构的剖面图,示出有背面增强和漫反射镜层。
图11是用于制造PyCell太阳能电池的另一种示例,PyCell-3B的工艺流程。PyCell-3B的可重复使用的模板和PyCell衬底的制作过程可与PyCell-1的模板和衬底的制作过程相同。PyCell-3B的关键实施例为其具有选择性发射极,且背面增强层也用作为背面漫反射镜层。基极和发射极触点开口是离散的;因此需要喷墨印刷镍纳米粒子墨汁的步骤以便用离散的触点开口形成连续的交叉指状线条基极和发射极图案。
图12A-12H是图示经过图11PyCell-3B电池的工艺流程的关键制造步骤后,电池的剖面图。剖面图图12A到-12H中描述的结构特征是一致的,除非另行标注。
电池PyCell-3B的工艺从背面强化的衬底开始,且背面增强层也用作为背反射镜。如图12A所示,在电池正面沉积厚度在60nm至100nm之间的PECVD氮化硅层,它是PyCell衬底的金字塔型面。PECVD氮化硅层用作为表面钝化层和抗反射涂层(ARC)。在下一个步骤中,如图12B所示,PyCell衬底正面通过施加一层支撑材料,比如PV-级EVA、Z68或硅树脂而被强化。沉积方法包括但不局限于热喷涂和真空层压。正面增强后,可局部去除背面增强层,比如PTFE层,以局部暴露可以形成结、触点和金属化的衬底背面表面。可通过选择性激光烧蚀来部分去除背面增强层。如图12C所示,在下一个步骤中,通过覆盖式喷涂或对准印刷在表面沉积硼液体掺杂物。在将硼液体掺杂物进行固化后,将激光束指向发射极触点区域。通过烧蚀发射极区域顶部的介电层(薄硅氧化物)受控的激光束可打开发射极触点,以及驱入硼掺杂物以便同时形成p++选择性发射极结。在下一个步骤中,使用湿蚀刻工艺,比如使用稀释的HF蚀刻剂,除去剩余的硼掺杂物,且制造了选择性发射极结,在图12D中示出。选择性发射极p++结比p+外延发射极层的掺杂浓度高,且选择性发射极结的深度可以比外延发射极层更深。
接下来,如图12E所示,进行相似的工艺以形成选择性基极结。这一工艺从通过覆盖式喷涂或对准印刷而在表面沉积磷液体掺杂物开始。将磷液体掺杂物进行固化后,将激光束指向基极触点区域。通过烧蚀基极发射极区域顶部的介电层(薄硅氧化物)使用受控的激光束打开基极触点,以及驱入磷掺杂物以便同时形成n++选择性发射极结。在下一个步骤中,使用湿蚀刻工艺,比如使用稀释的HF蚀刻剂,除去剩余的硼掺杂物,并且制造了选择性基极结,在图12F中示出。通过反掺杂外延p+发射极层形成选择性基极n++结,且基极结深度比外延发射极层更深。图12F图示了形成的发射极触点开口、基极触点开口、p++选择性发射极结和n++基极结。应注意,在PyCell-3B流程中发射极和基极触点开口也是离散的,这意味着这些开口没有被连接起来以形成连续的交叉指状线条开口。
在下一个步骤中,在脊表面喷墨印刷金属,比如镍((Ni)纳米粒子墨汁以将触点开口连接到交叉指状发射极和基极电极图案。烧结后,印刷的镍薄图案也用作为种子层用于后续的较厚金属电镀工艺。印刷镍的剖面图在图12G中示出,电镀的厚Ni+Cu+Sn的剖面图在图12H中示出。在此阶段,PyCell-3B太阳能电池已完成(在图12H中示出),并且可开始进行后续的测试和模块组装步骤。
图13图示了制造PyCell太阳能电池的另一种示例,PyCell-4A的工艺流程。PyCell-4A的可重复使用的模板和PyCell衬底的制作过程大体上与PyCell-1的模板和衬底的制作过程相同。不同的是,在PyCell-4A中,背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。电池工艺步骤在发射极触点开口步骤之前也可以是相同的。然后,PyCel l-4A设计制造用于发射极和基极触点的连续的交叉指状线条开口,而非制造非连续的发射极和基极触点开口。结果,喷墨印刷镍纳米粒子墨汁的步骤被取消,因为在PyCell-1中,喷墨印刷镍的目的是用非连续的触点开口来形成连续的线条交叉的基极和发射极图案。也就是说,除了触点开口是连续的线条交叉的图案,且取消了喷墨印刷镍纳米粒子的步骤之外,电池PyCell4A的工艺流程可与图7和8中描述的相同。此外,由于背面增强层具有背反射镜效果,因此在PyCell-4A设计中免去了在背面施加PECVD氧化铝钝化层和PCD铝层的需要。
图14是根据本发明的PyCell-4A电池工艺流程的最终结构的剖面图。图中示出了背面增强和漫反射镜层,且发射极和基极触点开口和基极结为连续的线条交叉的图案。
图15图示了制造PyCell太阳能电池的另一种示例,PyCell-4B的工艺流程。PyCell-4B的可重复使用的模板和PyCell衬底的制作过程大部分与PyCell-1的模板和衬底的制作过程相同。不同的是,背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。除了发射极和基极触点开口和结是连续的线条交叉的图案之外,电池PyCell-4B的工艺流程大部分与电池PyCell-3B的工艺流程相同。PyCell-4B也具有选择性发射极(p++)结,除了PyCell-4B的选择性发射极设计是连续的线条交叉的图案外,其制造方法与PyCell-3B电池工艺中选择性发射极结的制造方法相同。
图16是图15中PyCell-4B电池工艺流程的最终结构的剖面图。PyCell-4B电池具有形成的选择性发射极。背面增强层也用作为漫反射镜层。发射极和基极触点开口和基极结为连续的线条交叉的图案。
图17图示了制造PyCell太阳能电池的另一种示例,PyCell-4C的工艺流程。PyCell-4C的可重复使用的模板和PyCell衬底的制作过程大部分与PyCell-1的模板和衬底的制作过程相同。不同的是,背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。除了发射极和基极触点开口和结是在单个激光烧蚀和掺杂工艺中形成的之外,电池PyCell-4C的工艺流程大部分与电池PyCell-4B的工艺流程相同。PyCell-4C也具有选择性发射极(p++)结,其制造方法与PyCell-4B电池工艺中的选择性发射极结的制造方法相同。
图18A-18F是经过根据本发明的电池PyCel l-4C工艺流程的关键处理步骤后的剖面图。电池PyCell-4C的工艺从背面强化的衬底开始,且背面增强层也用作为背反射镜。如图18A所示,在正面沉积厚度在60nm至100nm之间的PECVD氮化硅层,它是PyCell衬底的金字塔型面。PECVD氮化硅层用作为表面钝化层和抗反射涂层(ARC)。在下一个步骤中,如图18B所示,PyCell衬底正面通过沉积一层支撑材料,比如PV-级EVA、Z68或硅树脂而被强化。沉积方法包括,但不局限于,热喷涂和真空层压。正面增强后,可局部去除背面增强层,比如PTFE层,以局部暴露形成结、触点和金属化的衬底背面表面。可通过选择性激光烧蚀来部分去除背面增强层。如图18C所示,在下一个步骤中,通过喷墨工艺在电池表面沉积硼液体掺杂物和磷液体掺杂物。印刷磷和硼液体可在单个印片(print load)上一次完成,其中,所述两种液体分别从两个分离的印刷喷嘴喷出。选择性地,这两种液体可以在先后两个印片中印刷,中间有可选择的干燥步骤。接下来,印刷的磷和硼掺杂物完全干燥和固化,比如在对流烘箱中进行干燥和固化。
在下一个步骤中,如图18D所示,将对准的激光束指向发射极触点区域。通过烧蚀触点区域顶部的介电层(薄硅氧化物)受控的激光束将发射极触点打开,以及驱入硼掺杂物用于同时形成p++选择性发射极结和n++基极结。在下一个步骤中,剩余的硼和磷掺杂物在湿蚀刻工艺中,比如使用稀释的HF蚀刻剂,被去除,且形成了选择性发射极结和基极结,在图18E中示出。结和触点开口为连续的交叉指状线条图案。选择性发射极p++结比p+外延发射极层的掺杂浓度高,且选择性发射极结的深度可以比外延发射极层更深。接下来,如图18F所示,电镀厚的Ni+Cu+Sb金属层,且电镀的金属电极形成交叉指状金属线条以及基极和发射极汇流条。在此阶段,PyCell-4C太阳能电池已完成,在图18F中示出,并且可进行后续的测试和模块组装步骤。
图19图示了制造PyCell太阳能电池的另一种示例,PyCell-5A的工艺流程。PyCell-5A的可重复使用的模板和PyCell衬底的制作过程大部分与PyCell-1的模板和衬底的制作过程相同。例外的是,背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。电池PyCell-5A的工艺流程大部分与电池PyCell-4A的工艺流程相同。然而,为了进一步改善背面漫反射镜的效果,在电池背面施加了额外的漫反射镜堆叠。在制造出所描述的电池PyCell-4A之后,喷涂低密度的PTFE层并且覆盖除发射极和基极汇流条触点区域以外的背面表面,那些区域由荫罩覆盖。接下来,在背面和增加的PTFE层顶部沉积薄PVD铝层,该PVD铝用作为背反射镜。在PVD铝的沉积工艺过程中,发射极和基极汇流条触点区域也被荫罩覆盖以便发射极和基极金属不会因为PVD铝而产生分流。
图20是图19中描述的PyCell-5A电池工艺流程的最终结构的剖面图。PyCell-5A电池背面具有连续的交叉指状发射极和基极触点线条开口、具有额外低密度PTFE层的增强型背面漫反射镜,以及PVD铝层。PTFE和PVD铝层未覆盖发射极和基极汇流条触点区域,此并未在图20中示出。PyCell-5A电池没有选择性发射极。
图21是用于制造PyCell太阳能电池的另一种示例,PyCell-5B的工艺流程。PyCell-5B的可重复使用的模板和PyCell衬底的制作过程大部分与PyCell-1的模板和衬底的制作过程相同。例外的是,背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。电池PyCell-5B的工艺流程大部分与电池PyCell-4B的工艺流程相同。然而,为了进一步改善背面漫反射镜的效果,在电池背面施加了额外的漫反射镜堆叠。在制造出所描述的电PyCell-4B之后,喷涂低密度的PTFE层并且覆盖除发射极和基极汇流条触点区域以外的背面表面,那些区域由荫罩覆盖。接下来,在背面且在增加的PTFE层顶部沉积薄PVD铝层,该PVD铝用作为背反射镜。在PVD铝的沉积工艺过程中,发射极和基极汇流条触点区域也被荫罩覆盖以便发射极和基极金属不会因为PVD铝而产生分流。
图22是图21中PyCell-5B电池工艺流程的最终结构的剖面图。如所示,PyCell-5B电池背面具有连续的交叉指状线条发射极和基极结以及触点开口、具有额外低密度PTFE层的增强型背面漫反射镜,以及PVD铝层。PTFE和PVD铝层未覆盖发射极和基极汇流条触点区域,此并未在图22中示出。PyCell-5B电池没有选择性发射极。
图23是制造PyCell太阳能电池的另一种示例,PyCell-5C的工艺流程。PyCell-5C的可重复使用的模板和PyCell衬底的制作过程大部分与PyCell-1的模板和衬底的制作过程相同。例外的是,背面增强层也用作为背面漫反射镜。背面漫反射镜将透过的光线在各个方向反射回硅材料中。例如,热喷涂的PTFE背面增强层同时也可用作为漫反射镜层。电池PyCell-5C的工艺流程大部分与电池PyCell-4C的工艺流程相同。然而,为了进一步改善背面漫反射镜的效果,在电池背面施加了额外的漫反射镜堆叠。在制造出所描述的电PyCell-4C之后,喷涂低密度的PTFE层并且覆盖除发射极和基极汇流条触点区域以外的背面表面覆盖,那些区域由荫罩覆盖。接下来,在背面且在增加的PTFE层顶部沉积薄PVD铝层,PVD铝用作为背反射镜。在PVD铝的沉积工艺过程中,发射极和基极汇流条触点区域也被荫罩覆盖以便发射极和基极金属不会因为PVD铝而产生分流。
图24图示了图23中的PyCell-5C电池工艺流程的最终结构的剖面图。如所示,PyCell-5C电池背面具有连续的交叉指状线条发射极和基极结以及触点开口、具有额外低密度PTFE层的增强型背面漫反射镜,以及PVD铝层。PTFE和PVD铝层未覆盖发射极和基极汇流条触点区域,此并未在图24中示出。PyCell-5C电池没有选择性发射极。
在操作中,本发明描述了背结背触点晶体三维太阳能电池的结构,该电池沉积在具有三维结构的可重复使用的模板上,该模板作为耐高温的载具可以使工艺在模板上进行,且随后通过使用分离层可使得三维晶体太阳能电池与模板分离。进一步,本发明描述了用于三维电池的增强结构以及施加该增强结构的方法,这使得可将超薄半导体层用于三维电池,从而降低总成本并降低该层的整块(bulk)寿命要求。此外,本发明描述了使用具有亚纳秒脉冲宽度的短激光脉冲来完成以上描述的三维背结背触点太阳能电池触点的至少一个极性,优选地两个极性的触点开口。此外,描述了使用激光脉冲来完成以上描述的背结背触点太阳能电池触点区域至少一个极,优选地两个极的触点区域的掺杂。本发明描述了一些工艺流程,作为如何获得增强、用于隔离的介电层形成、钝化、反射镜的形成、分离和金属化的建议。该领域的技术人员可从所建议的示例的方法可推导出其它方法,推导出的方法也被认为是在本发明的范围内。
在一个实施例中,提供了使用外延硅层制造各种类型PyCell太阳能电池的方法。术语“超薄(ultra-thin)”指的是在1μm到50μm的范围内的生长材料的厚度。与同样是由超薄硅层制成的,大体上是平面的太阳能电池相比,PyCell具有两个优点:(1)在给定特定范围的厚度的话,PyCell衬底在机械上比具有相同厚度、大体上是平面的硅衬底更加坚固。(2)PyCell微观结构提供自然光捕获效果,因此不需要进行正面表面织构化工艺。事实上,进行有效的表面织构化(比如平均为5μm,平均金字塔高度),在平面硅表面上,会消耗一些平面硅衬底中硅的厚度。因此,与大体上是平面的超薄外延硅太阳能电池相比,超薄PyCell衬底节省了外延硅材料。
提供了各种具有背结和背触点的PyCell太阳能电池的制造方法和结构的描述。更具体地,PyCell的金字塔型面用作为向阳面,被称为正面;而PyCell的脊型面用作为触点、结和金属化面,被称为背面。此外,所有的基极和发射极触点、结、金属指状电极以及金属汇流条都在PyCell太阳能电池的背面上制造。
本发明的其它方面包括在外延硅生长期间进行原位掺杂步骤以形成原位掺杂的正面表面场(FSF)和发射极掺杂层。原位掺杂浓度分布可以是台阶形或梯形。短脉冲(比如亚纳秒)激光烧蚀,用于产生离散的或连续的电介质触点开口。激光表面处理,用于对以上描述的三维背结背触点太阳能电池触点区域至少一个极性,优选地两个极性的触点区域进行掺杂。背面和增强层用作为扩散的背反射镜。形成选择性发射极(在发射极触点区域内部具有较高的发射极掺杂)以增大电池效率。使用喷墨印刷液体掺杂物以及直写激光掺杂工艺,用于制造选择性发射极和基极触点。除了以上组合以外,本发明提供了使用脉冲激光的新颖制造方法。描述了一些工艺流程,作为如何获得增强、用于隔离的介电层、钝化、反射镜的形成、分离和金属化的建议。
提供上述优选地实施例的描述是为了使本领域的任何技术人员制造或使用所请求保护的主题。这些实施例的各种修改对本领域中的技术人员来说是很明显的,且此处确定的基本原则可应用于其它实施例,无需创造性劳动。因此,所要求保护的主题不是要限于此处展示的实施例,而是要覆盖与此处公开的原理和新颖特征相一致的最广的范围。

Claims (23)

1.一种背结背触点三维薄太阳能电池,包括:
具有正面和背面的三维沉积的半导体层,包括:
具有钝化层的光俘获正面表面,
掺杂的基极区域,和
掺杂的背面发射极区域,其极性与所述掺杂的基极区域相反;
在所述掺杂的背面发射极区域上的背面钝化层;
背面发射极触点和背面基极触点,其连接至金属互连件且选择性地在所述三维沉积的半导体层背面的三维特征上形成;和
在所述背结背触点三维薄太阳能电池的正面设置的透明正面永久性支撑增强物。
2.如权利要求1所述的背结背触点三维薄太阳能电池,其中,所述沉积的半导体层是厚度在1到30微米范围内的外延硅层。
3.如权利要求1所述的背结背触点三维薄太阳能电池,其中,所述掺杂的背面发射极区域是外延原位掺杂发射极区域。
4.如权利要求1所述的背结背触点三维薄太阳能电池,其中,所述背面发射极触点和背面基极触点离散地位于所述三维沉积的半导体层背面的三维特征上。
5.如权利要求1所述的背结背触点三维薄太阳能电池,其中,所述背面发射极触点和背面基极触点在所述三维沉积的半导体层背面的三维特征上以连续的交叉指状图案形成。
6.如权利要求1所述的背结背触点三维薄太阳能电池,其中,所述具有钝化层的光俘获正面表面用作抗反射涂层。
7.如权利要求1所述的背结背触点三维薄太阳能电池,其中,所述具有钝化层的光俘获正面表面提供场辅助钝化。
8.如权利要求1所述的背结背触点三维薄太阳能电池,还包括填充所述三维沉积的薄半导体层背面上的三维特征的空腔的背面增强层。
9.一种背结背触点三维薄太阳能电池,包括:
具有正面和背面的三维沉积的半导体层,所述沉积的半导体层具有倒金字塔型结构,其中,背面表面脊限定倒金字塔型空腔的开口,包括:
具有钝化层的光俘获正面表面,
掺杂的基极区域,和
掺杂的背面发射极区域,其极性与所述掺杂的基极区域相反;
在所述掺杂的背面发射极区域上的背面钝化层;和
背面发射极触点和背面基极触点,其选择性地在所述三维沉积的半导体层的背面表面脊上形成且连接至金属互连件。
10.如权利要求9所述的背结背触点三维薄太阳能电池,其中,在所述背结背触点三维薄太阳能电池的正面上有透明永久性正面支撑增强物。
11.如权利要求9所述的背结背触点三维薄太阳能电池,其中,所述沉积的半导体层是厚度在1到30微米范围内的外延硅层。
12.如权利要求9所述的背结背触点三维薄太阳能电池,其中,所述掺杂的背面发射极区域是外延原位掺杂发射极区域。
13.如权利要求9所述的背结背触点三维薄太阳能电池,其中,所述倒金字塔型空腔包括多个尺寸不同的倒金字塔型空腔。
14.如权利要求9所述的背结背触点三维薄太阳能电池,其中,所述倒金字塔型空腔包括一组较大的倒金字塔型空腔和一组较小的倒金字塔型空腔。
15.如权利要求9所述的背结背触点三维薄太阳能电池,其中,所述背面发射极触点和背面基极触点离散地位于所述三维沉积的薄半导体层背面的倒金字塔型空腔的背面表面脊上。
16.如权利要求9所述的背结背触点三维薄太阳能电池,其中,所述背面发射极触点和背面基极触点在所述三维沉积的薄半导体层背面的倒金字塔型空腔的脊上以连续的线条图案形成。
17.如权利要求9所述的背结背触点三维薄太阳能电池,还包括背面增强层,其至少部分填充所述三维沉积的薄半导体层背面上的倒金字塔形空腔。
18.从晶体半导体层制造三维背结背触点薄太阳能电池的方法,所述方法为所述晶体半导体层提供连续的结构性支撑,所述方法包括:
在三维模板上形成保形多孔半导体层,所述三维模板具有倒金字塔型结构,其具有背面表面脊,所述背面表面脊限定倒金字塔型空腔的开口,其中,所述模板提供结构性支撑,且在背结背触点太阳能电池的背面处理步骤中充当高温临时载具,所述背面处理步骤包括:
在所述多孔半导体层上沉积保形的掺杂的基极晶体半导体层;
在所述掺杂的基极晶体半导体层上形成保形掺杂的发射极层;
沿着所述多孔半导体层将所述掺杂的基极晶体半导体层与所述模板分离,其中,在分离之前将电池背面增强层附着到所述太阳能电池背面以为电池正面处理步骤提供支撑,所述正面处理步骤包括在所述晶体半导体层正面形成具有钝化和抗反射层的光捕获正面表面;
将透明永久性正面增强物附着到电池正面;
在所述掺杂的发射极层上沉积背面钝化介电层;
在所述倒金字塔型空腔的脊上形成穿越所述介电层的选择性背面基极和发射极触点开口;
掺杂暴露的区域以形成发射极区域和基极区域;和
将所述电池背面金属化以在所述倒金字塔型空腔的脊上形成背面基极和发射极触点。
19.如权利要求18所述的方法,其中,所述电池背面增强层充当所述背结背触点三维薄太阳能电池的背面漫反射镜。
20.如权利要求18所述的方法,其中,所述沉积掺杂的基极晶体半导体层的步骤包括沉积厚度在1到30微米范围内的掺杂的基极外延硅层。
21.如权利要求18所述的方法,其中,在所述掺杂的基极晶体半导体层上形成掺杂的发射极层的所述步骤还包括形成原位掺杂的发射极外延层。
22.如权利要求18所述的方法,其中,使用脉冲宽度激光烧蚀在所述倒金字塔型空腔的脊上形成穿越所述介电层的选择性背面基极和发射极触点开口。
23.如权利要求18所述的方法,其中,使用亚纳秒脉冲宽度的激光烧蚀在所述倒金字塔型空腔的脊上形成穿越所述介电层的选择性背面基极和发射极触点开口。
CN2010800634967A 2009-12-09 2010-12-09 背结背触点三维薄太阳能电池及其制造方法 Expired - Fee Related CN102782869B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US28514009P 2009-12-09 2009-12-09
US61/285,140 2009-12-09
PCT/US2010/059748 WO2011072153A2 (en) 2009-12-09 2010-12-09 High-efficiency photovoltaic back-contact solar cell structures and manufacturing methods using three-dimensional semiconductor absorbers

Publications (2)

Publication Number Publication Date
CN102782869A true CN102782869A (zh) 2012-11-14
CN102782869B CN102782869B (zh) 2013-12-25

Family

ID=44146184

Family Applications (3)

Application Number Title Priority Date Filing Date
CN2010800634967A Expired - Fee Related CN102782869B (zh) 2009-12-09 2010-12-09 背结背触点三维薄太阳能电池及其制造方法
CN201080063494.8A Expired - Fee Related CN102763226B (zh) 2009-12-09 2010-12-09 使用薄平面半导体的高效光伏背触点太阳能电池结构和制造方法
CN201080063303.8A Expired - Fee Related CN102763225B (zh) 2009-12-09 2010-12-09 使用半导体晶片的高效率光伏背结背触点太阳能电池结构和制造方法

Family Applications After (2)

Application Number Title Priority Date Filing Date
CN201080063494.8A Expired - Fee Related CN102763226B (zh) 2009-12-09 2010-12-09 使用薄平面半导体的高效光伏背触点太阳能电池结构和制造方法
CN201080063303.8A Expired - Fee Related CN102763225B (zh) 2009-12-09 2010-12-09 使用半导体晶片的高效率光伏背结背触点太阳能电池结构和制造方法

Country Status (5)

Country Link
US (5) US20130233378A1 (zh)
EP (3) EP2510551B1 (zh)
CN (3) CN102782869B (zh)
MY (1) MY166305A (zh)
WO (3) WO2011072179A2 (zh)

Families Citing this family (115)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7057256B2 (en) 2001-05-25 2006-06-06 President & Fellows Of Harvard College Silicon-based visible and near-infrared optoelectric devices
US7442629B2 (en) 2004-09-24 2008-10-28 President & Fellows Of Harvard College Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate
US8637340B2 (en) 2004-11-30 2014-01-28 Solexel, Inc. Patterning of silicon oxide layers using pulsed laser ablation
US8399331B2 (en) 2007-10-06 2013-03-19 Solexel Laser processing for high-efficiency thin crystalline silicon solar cell fabrication
US9508886B2 (en) 2007-10-06 2016-11-29 Solexel, Inc. Method for making a crystalline silicon solar cell substrate utilizing flat top laser beam
US9455362B2 (en) 2007-10-06 2016-09-27 Solexel, Inc. Laser irradiation aluminum doping for monocrystalline silicon substrates
US8749053B2 (en) 2009-06-23 2014-06-10 Intevac, Inc. Plasma grid implant system for use in solar cell fabrications
US9673243B2 (en) 2009-09-17 2017-06-06 Sionyx, Llc Photosensitive imaging devices and associated methods
US9911781B2 (en) 2009-09-17 2018-03-06 Sionyx, Llc Photosensitive imaging devices and associated methods
EP2510551B1 (en) * 2009-12-09 2017-08-02 Solexel, Inc. Method for manufacturing back contact back junction solar cells
US8692198B2 (en) 2010-04-21 2014-04-08 Sionyx, Inc. Photosensitive imaging devices and associated methods
WO2011160130A2 (en) 2010-06-18 2011-12-22 Sionyx, Inc High speed photosensitive devices and associated methods
DE102010024309A1 (de) * 2010-06-18 2011-12-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Herstellung einer photovoltaischen Solarzelle
US8946547B2 (en) 2010-08-05 2015-02-03 Solexel, Inc. Backplane reinforcement and interconnects for solar cells
WO2012135395A2 (en) 2011-03-28 2012-10-04 Solexel, Inc. Active backplane for thin silicon solar cells
JP5842173B2 (ja) * 2011-03-28 2016-01-13 パナソニックIpマネジメント株式会社 光電変換装置及び光電変換装置の製造方法
US9496308B2 (en) 2011-06-09 2016-11-15 Sionyx, Llc Process module for increasing the response of backside illuminated photosensitive imagers and associated methods
WO2013010127A2 (en) 2011-07-13 2013-01-17 Sionyx, Inc. Biometric imaging devices and associated methods
AU2012294932B2 (en) * 2011-08-09 2016-08-11 Solexel, Inc. High-efficiency solar photovoltaic cells and modules using thin crystalline semiconductor absorbers
US20130168792A1 (en) * 2011-09-16 2013-07-04 Sionyx, Inc. Three Dimensional Architecture Semiconductor Devices and Associated Methods
CN103030106B (zh) * 2011-10-06 2015-04-01 清华大学 三维纳米结构阵列
DE102011084644A1 (de) * 2011-10-17 2013-04-18 Osram Gmbh Verfahren zur herstellung eines photovoltaischen elements mit einer siliziumdioxidschicht
CN103094374B (zh) * 2011-10-27 2016-03-09 清华大学 太阳能电池
CN103890978A (zh) * 2011-10-28 2014-06-25 应用材料公司 用于太阳能电池制造的背接点通孔形成工艺
MY175007A (en) 2011-11-08 2020-06-02 Intevac Inc Substrate processing system and method
US20130147003A1 (en) * 2011-12-13 2013-06-13 Young-Su Kim Photovoltaic device
US8822262B2 (en) * 2011-12-22 2014-09-02 Sunpower Corporation Fabricating solar cells with silicon nanoparticles
KR101654548B1 (ko) * 2011-12-26 2016-09-06 솔렉셀, 인크. 태양 전지에서 향상된 광 포획을 위한 시스템 및 방법
US9293635B2 (en) * 2012-03-19 2016-03-22 Rec Solar Pte. Ltd. Back junction back contact solar cell module and method of manufacturing the same
US9064764B2 (en) 2012-03-22 2015-06-23 Sionyx, Inc. Pixel isolation elements, devices, and associated methods
US9054255B2 (en) 2012-03-23 2015-06-09 Sunpower Corporation Solar cell having an emitter region with wide bandgap semiconductor material
US20130247967A1 (en) * 2012-03-23 2013-09-26 Scott Harrington Gaseous ozone (o3) treatment for solar cell fabrication
FR2988908B1 (fr) * 2012-04-03 2015-03-27 Commissariat Energie Atomique Procede de fabrication d'une cellule photovoltaique a contacts interdigites en face arriere
US8486747B1 (en) * 2012-04-17 2013-07-16 Boris Gilman Backside silicon photovoltaic cell and method of manufacturing thereof
GB2502293A (en) * 2012-05-22 2013-11-27 Renewable Energy Corp Asa A method for manufacturing a back contacted back junction solar cell module
MY184055A (en) * 2012-05-29 2021-03-17 Solexel Inc Structures and methods of formation of contiguous and non-contiguous base regions for high efficiency back-contact solar cells
NL2009754C2 (en) * 2012-11-05 2014-05-08 M4Si B V Protective cover for a copper containing conductor.
US9379258B2 (en) 2012-11-05 2016-06-28 Solexel, Inc. Fabrication methods for monolithically isled back contact back junction solar cells
US9515217B2 (en) 2012-11-05 2016-12-06 Solexel, Inc. Monolithically isled back contact back junction solar cells
KR101971202B1 (ko) * 2012-11-22 2019-04-23 삼성디스플레이 주식회사 유기 발광 표시 장치 및 그 제조방법
US9088020B1 (en) * 2012-12-07 2015-07-21 Integrated Photovoltaics, Inc. Structures with sacrificial template
US20140166087A1 (en) * 2012-12-18 2014-06-19 Intevac, Inc. Solar cells having graded doped regions and methods of making solar cells having graded doped regions
US9318332B2 (en) 2012-12-19 2016-04-19 Intevac, Inc. Grid for plasma ion implant
JP5584846B1 (ja) * 2012-12-20 2014-09-03 株式会社カネカ 太陽電池およびその製造方法、ならびに太陽電池モジュール
US9263601B2 (en) * 2012-12-21 2016-02-16 Sunpower Corporation Enhanced adhesion of seed layer for solar cell conductive contact
KR102044466B1 (ko) * 2013-01-16 2019-11-13 엘지전자 주식회사 태양 전지 및 그 제조 방법
CN103151395A (zh) * 2013-01-25 2013-06-12 友达光电股份有限公司 太阳能电池
CN105122463A (zh) * 2013-02-12 2015-12-02 索莱克赛尔公司 使用体晶片的单片岛型背接触背结太阳能电池
KR20150130303A (ko) 2013-02-15 2015-11-23 사이오닉스, 아이엔씨. 안티 블루밍 특성 및 관련 방법을 가지는 높은 동적 범위의 cmos 이미지 센서
WO2014137283A1 (en) * 2013-03-05 2014-09-12 Trina Solar Energy Development Pte Ltd Method of fabricating a solar cell
US9939251B2 (en) 2013-03-15 2018-04-10 Sionyx, Llc Three dimensional imaging utilizing stacked imager devices and associated methods
KR101997922B1 (ko) * 2013-04-18 2019-07-08 엘지전자 주식회사 태양전지 및 이의 제조 방법
US9545549B2 (en) 2013-05-15 2017-01-17 Cobra Golf Incorporated Golf bag with a docking station for an electronic device
US11121271B2 (en) * 2013-05-22 2021-09-14 W&WSens, Devices, Inc. Microstructure enhanced absorption photosensitive devices
JP6126219B2 (ja) * 2013-06-07 2017-05-10 信越化学工業株式会社 バックコンタクト型太陽電池セル
WO2014209421A1 (en) 2013-06-29 2014-12-31 Sionyx, Inc. Shallow trench textured regions and associated methods
US20150040979A1 (en) * 2013-08-12 2015-02-12 Crystal Solar Incorporated Silicon Wafers with p-n Junctions by Epitaxial Deposition and Devices Fabricated Therefrom
US20150050816A1 (en) * 2013-08-19 2015-02-19 Korea Atomic Energy Research Institute Method of electrochemically preparing silicon film
US20150162486A1 (en) * 2013-09-16 2015-06-11 Solexel, Inc. Laser processing for solar cell base and emitter regions
DE102013219342A1 (de) * 2013-09-26 2015-03-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Strukturierung von Schichten oxidierbarer Materialien mittels Oxidation sowie Substrat mit strukturierter Beschichtung
MY164423A (en) 2013-12-09 2017-12-15 Mimos Berhad Process of texturing silicon surface for optimal sunlight capture in solar cells
US9218958B2 (en) 2013-12-10 2015-12-22 Infineon Technologies Ag Method for forming a semiconductor device
US9570576B2 (en) * 2013-12-10 2017-02-14 Infineon Technologies Ag Method for forming a semiconductor device having insulating parts or layers formed via anodic oxidation
US9653638B2 (en) * 2013-12-20 2017-05-16 Sunpower Corporation Contacts for solar cells formed by directing a laser beam with a particular shape on a metal foil over a dielectric region
US20150221792A1 (en) * 2013-12-23 2015-08-06 Solexel, Inc. Self Aligned Contacts for Solar Cells
JP2017508292A (ja) * 2014-02-26 2017-03-23 ソレクセル、インコーポレイテッド 背面接触太陽電池のための自己整合接触
JP5885891B2 (ja) * 2014-03-05 2016-03-16 三菱電機株式会社 太陽電池の製造方法および太陽電池
JP2015185743A (ja) * 2014-03-25 2015-10-22 シャープ株式会社 光電変換素子
US9627558B2 (en) 2014-04-09 2017-04-18 Arizona Board Of Regents On Behalf Of Arizona State University Methods and apparatuses for manufacturing self-aligned integrated back contact heterojunction solar cells
US9355985B2 (en) * 2014-05-30 2016-05-31 Freescale Semiconductor, Inc. Microelectronic packages having sidewall-deposited heat spreader structures and methods for the fabrication thereof
CN104009128A (zh) * 2014-06-12 2014-08-27 电子科技大学 用于太阳能电池的非晶硅薄膜陷光结构制备方法
KR101622091B1 (ko) * 2014-08-20 2016-05-18 엘지전자 주식회사 태양 전지 및 이의 제조 방법
US9837259B2 (en) 2014-08-29 2017-12-05 Sunpower Corporation Sequential etching treatment for solar cell fabrication
WO2016033614A1 (en) * 2014-08-31 2016-03-03 Solexel, Inc. Laser doping for making back contact back junction solar cells
WO2016047564A1 (ja) * 2014-09-22 2016-03-31 京セラ株式会社 太陽電池素子
US9559236B2 (en) * 2014-09-24 2017-01-31 Sunpower Corporation Solar cell fabricated by simplified deposition process
CN105742375B (zh) * 2014-12-10 2017-09-22 北京创昱科技有限公司 一种背接触晶硅电池及其制备方法
US9997652B2 (en) 2015-03-23 2018-06-12 Sunpower Corporation Deposition approaches for emitter layers of solar cells
CN107735866B (zh) * 2015-05-29 2021-05-14 松下知识产权经营株式会社 太阳能电池
US9583649B2 (en) 2015-06-22 2017-02-28 International Business Machines Corporation Thin film solar cell backside contact manufacturing process
KR101661859B1 (ko) 2015-09-09 2016-09-30 엘지전자 주식회사 태양 전지 모듈 및 그 제조 방법
KR101910642B1 (ko) * 2016-01-28 2018-12-28 엘지전자 주식회사 태양 전지 및 그 제조 방법
WO2017164099A1 (ja) * 2016-03-23 2017-09-28 シャープ株式会社 光電変換装置、光電変換モジュールおよび太陽光発電システム
US10075194B2 (en) * 2016-05-13 2018-09-11 Qualcomm Incorporated Tail biting convolutional code (TBCC) enhancement with state propagation and list decoding
TWI626758B (zh) * 2016-09-22 2018-06-11 長生太陽能股份有限公司 太陽能電池及其製造方法
US10629758B2 (en) 2016-09-30 2020-04-21 Sunpower Corporation Solar cells with differentiated P-type and N-type region architectures
US9960302B1 (en) 2016-10-18 2018-05-01 Tesla, Inc. Cascaded photovoltaic structures with interdigitated back contacts
US10937915B2 (en) 2016-10-28 2021-03-02 Tesla, Inc. Obscuring, color matching, and camouflaging solar panels
ES2864687T3 (es) * 2016-11-09 2021-10-14 Meyer Burger Germany Gmbh Célula solar cristalina con una capa conductora transparente entre los contactos de la cara frontal y un procedimiento para la fabricación de dicha célula solar
WO2019168536A1 (en) 2017-03-01 2019-09-06 Tesla, Inc. System and method for packaging photovoltaic roof tiles
US10381973B2 (en) 2017-05-17 2019-08-13 Tesla, Inc. Uniformly and directionally colored photovoltaic modules
US11258398B2 (en) 2017-06-05 2022-02-22 Tesla, Inc. Multi-region solar roofing modules
US10734938B2 (en) 2017-07-21 2020-08-04 Tesla, Inc. Packaging for solar roof tiles
US10857764B2 (en) 2017-07-25 2020-12-08 Tesla, Inc. Method for improving adhesion between glass cover and encapsulant for solar roof tiles
US10978990B2 (en) 2017-09-28 2021-04-13 Tesla, Inc. Glass cover with optical-filtering coating for managing color of a solar roof tile
WO2019069643A1 (ja) * 2017-10-04 2019-04-11 株式会社カネカ 太陽電池の製造方法、太陽電池および太陽電池モジュール
US10454409B2 (en) 2018-02-02 2019-10-22 Tesla, Inc. Non-flat solar roof tiles
US10862420B2 (en) 2018-02-20 2020-12-08 Tesla, Inc. Inter-tile support for solar roof tiles
US11190128B2 (en) 2018-02-27 2021-11-30 Tesla, Inc. Parallel-connected solar roof tile modules
CN108549921A (zh) * 2018-03-28 2018-09-18 深圳市傲科微创有限公司 一种无源光标签及光识别标签系统
US11431279B2 (en) 2018-07-02 2022-08-30 Tesla, Inc. Solar roof tile with a uniform appearance
US11245354B2 (en) 2018-07-31 2022-02-08 Tesla, Inc. Solar roof tile spacer with embedded circuitry
US11082005B2 (en) 2018-07-31 2021-08-03 Tesla, Inc. External electrical contact for solar roof tiles
US11245355B2 (en) 2018-09-04 2022-02-08 Tesla, Inc. Solar roof tile module
US11581843B2 (en) 2018-09-14 2023-02-14 Tesla, Inc. Solar roof tile free of back encapsulant layer
CN111192934B (zh) * 2018-11-14 2021-09-21 苏州纳捷森光电技术有限公司 用于硅基底的氧化硅刻蚀模板的制备方法、硅基底及应用
CN109461782A (zh) * 2018-12-25 2019-03-12 浙江晶科能源有限公司 P型背接触型太阳能电池及其制作方法
US11431280B2 (en) 2019-08-06 2022-08-30 Tesla, Inc. System and method for improving color appearance of solar roofs
US11164740B2 (en) 2019-10-09 2021-11-02 Newport Fab, Llc Semiconductor structure having porous semiconductor layer for RF devices
US11195920B2 (en) * 2019-10-09 2021-12-07 Newport Fab, Llc Semiconductor structure having porous semiconductor segment for RF devices and bulk semiconductor region for non-RF devices
US11145572B2 (en) 2019-10-09 2021-10-12 Newport Fab, Llc Semiconductor structure having through-substrate via (TSV) in porous semiconductor region
CN111477718A (zh) * 2019-10-22 2020-07-31 国家电投集团西安太阳能电力有限公司 一种简易ibc电池电极制作的工艺
CN112466967B (zh) * 2020-11-23 2023-08-22 浙江晶科能源有限公司 一种选择性发射极太阳能电池及其制备方法
DE102021118693A1 (de) 2021-07-20 2023-01-26 Helmholtz-Zentrum Dresden - Rossendorf E. V. Ladungsträger-Trennvorrichtung und Verfahren zum Erzeugen einer elektrischen Spannung und/oder eines elektrischen Stroms
CN114597280B (zh) * 2022-05-05 2022-07-12 晶科能源(海宁)有限公司 太阳能电池、光伏组件

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080006319A1 (en) * 2006-06-05 2008-01-10 Martin Bettge Photovoltaic and photosensing devices based on arrays of aligned nanostructures
US20080072958A1 (en) * 2006-09-26 2008-03-27 Banpil Photonics, Inc. High efficiency photovoltaic cells with self concentrating effect
US20080289684A1 (en) * 2006-10-09 2008-11-27 Soltaix, Inc. Pyramidal three-dimensional thin-film solar cells

Family Cites Families (205)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4082570A (en) 1976-02-09 1978-04-04 Semicon, Inc. High intensity solar energy converter
US4070206A (en) 1976-05-20 1978-01-24 Rca Corporation Polycrystalline or amorphous semiconductor photovoltaic device having improved collection efficiency
US4043894A (en) 1976-05-20 1977-08-23 Burroughs Corporation Electrochemical anodization fixture for semiconductor wafers
US4165252A (en) 1976-08-30 1979-08-21 Burroughs Corporation Method for chemically treating a single side of a workpiece
US4348254A (en) 1978-12-27 1982-09-07 Solarex Corporation Method of making solar cell
US4251679A (en) 1979-03-16 1981-02-17 E-Cel Corporation Electromagnetic radiation transducer
US4249959A (en) 1979-11-28 1981-02-10 Rca Corporation Solar cell construction
US4361950A (en) 1980-03-24 1982-12-07 Exxon Research & Engineering Co. Method of making solar cell with wrap-around electrode
US4394529A (en) 1981-08-05 1983-07-19 Rca Corporation Solar cell array with lightweight support structure
US4427839A (en) 1981-11-09 1984-01-24 General Electric Company Faceted low absorptance solar cell
US4479847A (en) 1981-12-30 1984-10-30 California Institute Of Technology Equilibrium crystal growth from substrate confined liquid
US4409423A (en) 1982-03-09 1983-10-11 The United States Of America As Represented By The Secretary Of The Air Force Hole matrix vertical junction solar cell
US4430519A (en) 1982-05-28 1984-02-07 Amp Incorporated Electron beam welded photovoltaic cell interconnections
US4461922A (en) 1983-02-14 1984-07-24 Atlantic Richfield Company Solar cell module
US4626613A (en) * 1983-12-23 1986-12-02 Unisearch Limited Laser grooved solar cell
US4672023A (en) 1985-10-21 1987-06-09 Avantek, Inc. Method for planarizing wafers
US5024953A (en) * 1988-03-22 1991-06-18 Hitachi, Ltd. Method for producing opto-electric transducing element
US4922277A (en) 1988-11-28 1990-05-01 The United States Of America As Represented By The Secretary Of The Air Force Silicon wafer photoresist developer
US5208068A (en) 1989-04-17 1993-05-04 International Business Machines Corporation Lamination method for coating the sidewall or filling a cavity in a substrate
DE69024304T2 (de) * 1989-09-06 1996-07-18 Sanyo Electric Co Herstellungsverfahren für eine biegsame photovoltaische Vorrichtung
GB8927709D0 (en) 1989-12-07 1990-02-07 Secretary Of The State For Def Silicon quantum wires
US5073230A (en) 1990-04-17 1991-12-17 Arizona Board Of Regents Acting On Behalf Of Arizona State University Means and methods of lifting and relocating an epitaxial device layer
US5420067A (en) 1990-09-28 1995-05-30 The United States Of America As Represented By The Secretary Of The Navy Method of fabricatring sub-half-micron trenches and holes
US5248621A (en) 1990-10-23 1993-09-28 Canon Kabushiki Kaisha Method for producing solar cell devices of crystalline material
US5112453A (en) 1990-10-31 1992-05-12 Behr Omri M Method and apparatus for producing etched plates for graphic printing
JP2912496B2 (ja) 1991-09-30 1999-06-28 シャープ株式会社 太陽電池モジュール
JPH0690014A (ja) 1992-07-22 1994-03-29 Mitsubishi Electric Corp 薄型太陽電池及びその製造方法,エッチング方法及び自動エッチング装置,並びに半導体装置の製造方法
US5458755A (en) 1992-11-09 1995-10-17 Canon Kabushiki Kaisha Anodization apparatus with supporting device for substrate to be treated
US5316593A (en) 1992-11-16 1994-05-31 Midwest Research Institute Heterojunction solar cell with passivated emitter surface
JPH088370B2 (ja) * 1993-03-05 1996-01-29 株式会社日立製作所 太陽電池用光閉じ込め構造体
DE4310206C2 (de) 1993-03-29 1995-03-09 Siemens Ag Verfahren zur Herstellung einer Solarzelle aus einer Substratscheibe
EP0742959B1 (de) 1993-07-29 2001-11-14 Gerhard Willeke Verfahren zur Herstellung einer Solarzelle, sowie nach diesem verfahren hergestellte Solarzelle
US5660680A (en) 1994-03-07 1997-08-26 The Regents Of The University Of California Method for fabrication of high vertical aspect ratio thin film structures
US5645684A (en) 1994-03-07 1997-07-08 The Regents Of The University Of California Multilayer high vertical aspect ratio thin film structures
US5538564A (en) 1994-03-18 1996-07-23 Regents Of The University Of California Three dimensional amorphous silicon/microcrystalline silicon solar cells
JPH07302923A (ja) 1994-04-28 1995-11-14 Canon Inc 光起電力素子
US5899360A (en) 1995-06-09 1999-05-04 Colgate - Palmolive Company Multi-chamber refillable dispenser
US5882988A (en) 1995-08-16 1999-03-16 Philips Electronics North America Corporation Semiconductor chip-making without scribing
WO1997013280A1 (en) 1995-10-05 1997-04-10 Ebara Solar, Inc. Self-aligned locally deep- diffused emitter solar cell
US5616185A (en) 1995-10-10 1997-04-01 Hughes Aircraft Company Solar cell with integrated bypass diode and method
US5681392A (en) 1995-12-21 1997-10-28 Xerox Corporation Fluid reservoir containing panels for reducing rate of fluid flow
US5935653A (en) 1996-01-18 1999-08-10 Micron Technology, Inc. Methods for coating a substrate
US6399143B1 (en) 1996-04-09 2002-06-04 Delsys Pharmaceutical Corporation Method for clamping and electrostatically coating a substrate
US6058945A (en) 1996-05-28 2000-05-09 Canon Kabushiki Kaisha Cleaning methods of porous surface and semiconductor surface
US6091021A (en) 1996-11-01 2000-07-18 Sandia Corporation Silicon cells made by self-aligned selective-emitter plasma-etchback process
AUPO347196A0 (en) 1996-11-06 1996-12-05 Pacific Solar Pty Limited Improved method of forming polycrystalline-silicon films on glass
US6054363A (en) 1996-11-15 2000-04-25 Canon Kabushiki Kaisha Method of manufacturing semiconductor article
US6756289B1 (en) 1996-12-27 2004-06-29 Canon Kabushiki Kaisha Method of producing semiconductor member and method of producing solar cell
US20030039843A1 (en) 1997-03-14 2003-02-27 Christopher Johnson Photoactive coating, coated article, and method of making same
US7176111B2 (en) 1997-03-28 2007-02-13 Interuniversitair Microelektronica Centrum (Imec) Method for depositing polycrystalline SiGe suitable for micromachining and devices obtained thereof
DE19715788C1 (de) 1997-04-16 1998-10-08 Eurocopter Deutschland Solargenerator für Satelliten
JP3740251B2 (ja) 1997-06-09 2006-02-01 キヤノン株式会社 太陽電池モジュールの製造方法
US6645833B2 (en) 1997-06-30 2003-11-11 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E. V. Method for producing layered structures on a substrate, substrate and semiconductor components produced according to said method
JP3889856B2 (ja) 1997-06-30 2007-03-07 松下電器産業株式会社 突起電極付きプリント配線基板の製造方法
US6114046A (en) 1997-07-24 2000-09-05 Evergreen Solar, Inc. Encapsulant material for solar cell module and laminated glass applications
JP3501642B2 (ja) 1997-12-26 2004-03-02 キヤノン株式会社 基板処理方法
EP1062689B1 (de) 1998-03-13 2009-09-09 Peter Dr. Fath Solarzellenanordnung und verfahren zur herstellung einer solarzellenanordnung
DE19811878C2 (de) 1998-03-18 2002-09-19 Siemens Solar Gmbh Verfahren und Ätzlösung zum naßchemischen pyramidalen Texturätzen von Siliziumoberflächen
US6416647B1 (en) 1998-04-21 2002-07-09 Applied Materials, Inc. Electro-chemical deposition cell for face-up processing of single semiconductor substrates
US6331208B1 (en) 1998-05-15 2001-12-18 Canon Kabushiki Kaisha Process for producing solar cell, process for producing thin-film semiconductor, process for separating thin-film semiconductor, and process for forming semiconductor
AUPP437598A0 (en) 1998-06-29 1998-07-23 Unisearch Limited A self aligning method for forming a selective emitter and metallization in a solar cell
JP2000022185A (ja) 1998-07-03 2000-01-21 Sharp Corp 太陽電池セル及びその製造方法
US6096229A (en) 1998-07-30 2000-08-01 Lucent Technologies Inc. Method of making alignment grooves in an optical connector support member
CA2246087A1 (en) 1998-08-28 2000-02-28 Northern Telecom Limited Method of cleaving a semiconductor wafer
EP0996145A3 (en) 1998-09-04 2000-11-08 Canon Kabushiki Kaisha Process for producing semiconductor substrate
US6555443B1 (en) 1998-11-11 2003-04-29 Robert Bosch Gmbh Method for production of a thin film and a thin-film solar cell, in particular, on a carrier substrate
US6461932B1 (en) 1998-12-14 2002-10-08 National Semiconductor Corporation Semiconductor trench isolation process that utilizes smoothening layer
JP2000277478A (ja) 1999-03-25 2000-10-06 Canon Inc 陽極化成装置、陽極化成システム、基板の処理装置及び処理方法、並びに基板の製造方法
US6881644B2 (en) 1999-04-21 2005-04-19 Silicon Genesis Corporation Smoothing method for cleaved films made using a release layer
JP3619053B2 (ja) 1999-05-21 2005-02-09 キヤノン株式会社 光電変換装置の製造方法
US6664169B1 (en) 1999-06-08 2003-12-16 Canon Kabushiki Kaisha Process for producing semiconductor member, process for producing solar cell, and anodizing apparatus
JP2001007362A (ja) 1999-06-17 2001-01-12 Canon Inc 半導体基材および太陽電池の製造方法
WO2001015211A1 (en) 1999-08-26 2001-03-01 Brewer Science Improved fill material for dual damascene processes
JP4329183B2 (ja) * 1999-10-14 2009-09-09 ソニー株式会社 単一セル型薄膜単結晶シリコン太陽電池の製造方法、バックコンタクト型薄膜単結晶シリコン太陽電池の製造方法および集積型薄膜単結晶シリコン太陽電池の製造方法
NL1013900C2 (nl) * 1999-12-21 2001-06-25 Akzo Nobel Nv Werkwijze voor de vervaardiging van een zonnecelfolie met in serie geschakelde zonnecellen.
US6274402B1 (en) 1999-12-30 2001-08-14 Sunpower Corporation Method of fabricating a silicon solar cell
JP3300812B2 (ja) * 2000-01-19 2002-07-08 独立行政法人産業技術総合研究所 光電変換素子
US6602767B2 (en) 2000-01-27 2003-08-05 Canon Kabushiki Kaisha Method for transferring porous layer, method for making semiconductor devices, and method for making solar battery
US6964732B2 (en) 2000-03-09 2005-11-15 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for continuous formation and lift-off of porous silicon layers
AU781761B2 (en) 2000-03-09 2005-06-09 Interuniversitair Micro-Elektronica Centrum (Imec) Method for the formation and lift-off of porous silicon layers
JP2001284622A (ja) 2000-03-31 2001-10-12 Canon Inc 半導体部材の製造方法及び太陽電池の製造方法
US6294725B1 (en) 2000-03-31 2001-09-25 Trw Inc. Wireless solar cell array electrical interconnection scheme
DE10021440A1 (de) 2000-05-03 2001-11-15 Univ Konstanz Verfahren zur Herstellung einer Solarzelle und nach diesem Verfahren hergestellte Solarzelle
US6518172B1 (en) 2000-08-29 2003-02-11 Micron Technology, Inc. Method for applying uniform pressurized film across wafer
US6551908B2 (en) 2000-10-02 2003-04-22 Canon Kabushiki Kaisha Method for producing semiconductor thin films on moving substrates
JP2002124692A (ja) * 2000-10-13 2002-04-26 Hitachi Ltd 太陽電池およびその製造方法
US7632434B2 (en) 2000-11-17 2009-12-15 Wayne O. Duescher Abrasive agglomerate coated raised island articles
NL1016779C2 (nl) 2000-12-02 2002-06-04 Cornelis Johannes Maria V Rijn Matrijs, werkwijze voor het vervaardigen van precisieproducten met behulp van een matrijs, alsmede precisieproducten, in het bijzonder microzeven en membraanfilters, vervaardigd met een dergelijke matrijs.
US6602760B2 (en) 2000-12-21 2003-08-05 Interuniversitair Microelektronica Centrum (Imec) Method of producing a semiconductor layer on a substrate
US6969472B2 (en) 2001-04-19 2005-11-29 Lsi Logic Corporation Method of fabricating sub-micron hemispherical and hemicylidrical structures from non-spherically shaped templates
US6524880B2 (en) 2001-04-23 2003-02-25 Samsung Sdi Co., Ltd. Solar cell and method for fabricating the same
JP2002353423A (ja) 2001-05-25 2002-12-06 Canon Inc 板部材の分離装置及び処理方法
JP2003052185A (ja) 2001-05-30 2003-02-21 Canon Inc 電力変換器およびそれを用いる光起電力素子モジュール並びに発電装置
US6903512B2 (en) * 2001-08-07 2005-06-07 Konica Corporation Half mirror film producing method and optical element comprising a half mirror film
DE10140589A1 (de) 2001-08-18 2003-02-27 Heraeus Gmbh W C Sputtertarget aus einer Siliziumlegierung und Verfahren zur Herstellung eines Sputtertargets
AU2002344596B2 (en) 2001-10-30 2006-07-27 Catalysts & Chemicals Industries Co., Ltd. Tubular titanium oxide particles, method for preparing the same, and use of the same
US6995032B2 (en) 2002-07-19 2006-02-07 Cree, Inc. Trench cut light emitting diodes and methods of fabricating same
JP2004055803A (ja) 2002-07-19 2004-02-19 Renesas Technology Corp 半導体装置
EP1385199A1 (en) 2002-07-24 2004-01-28 IMEC vzw, Interuniversitair Microelectronica Centrum vzw Method for making thin film devices intended for solar cells or SOI application
KR20050032114A (ko) 2002-08-06 2005-04-06 아베시아 리미티드 유기 전기 소자
US6908846B2 (en) 2002-10-24 2005-06-21 Lam Research Corporation Method and apparatus for detecting endpoint during plasma etching of thin films
EP1555696B1 (en) 2002-10-25 2010-12-15 Nakajima Glass Co., Inc. Solar battery module manufacturing method
GB0227902D0 (en) 2002-11-29 2003-01-08 Ingenia Holdings Ltd Template
JP2004193350A (ja) * 2002-12-11 2004-07-08 Sharp Corp 太陽電池セルおよびその製造方法
NL1022155C2 (nl) 2002-12-12 2004-06-22 Otb Group Bv Werkwijze, alsmede inrichting voor het behandelen van een oppervlak van ten minste één substraat.
US7312440B2 (en) 2003-01-14 2007-12-25 Georgia Tech Research Corporation Integrated micro fuel processor and flow delivery infrastructure
US7402448B2 (en) 2003-01-31 2008-07-22 Bp Corporation North America Inc. Photovoltaic cell and production thereof
US6911379B2 (en) 2003-03-05 2005-06-28 Taiwan Semiconductor Manufacturing Company, Ltd. Method of forming strained silicon on insulator substrate
US20040175893A1 (en) 2003-03-07 2004-09-09 Applied Materials, Inc. Apparatuses and methods for forming a substantially facet-free epitaxial film
US7388147B2 (en) 2003-04-10 2008-06-17 Sunpower Corporation Metal contact structure for solar cell and method of manufacture
US7339110B1 (en) * 2003-04-10 2008-03-04 Sunpower Corporation Solar cell and method of manufacture
US7170001B2 (en) 2003-06-26 2007-01-30 Advent Solar, Inc. Fabrication of back-contacted silicon solar cells using thermomigration to create conductive vias
JP4761706B2 (ja) 2003-12-25 2011-08-31 京セラ株式会社 光電変換装置の製造方法
JP3982502B2 (ja) 2004-01-15 2007-09-26 セイコーエプソン株式会社 描画装置
EP1711967A1 (en) * 2004-01-23 2006-10-18 Origin Energy Solar Pty Ltd. Solar panel
EP1560272B1 (en) 2004-01-29 2016-04-27 Panasonic Intellectual Property Management Co., Ltd. Solar cell module
US7144751B2 (en) 2004-02-05 2006-12-05 Advent Solar, Inc. Back-contact solar cells and methods for fabrication
US7335555B2 (en) 2004-02-05 2008-02-26 Advent Solar, Inc. Buried-contact solar cells with self-doping contacts
US20070074755A1 (en) 2005-10-03 2007-04-05 Nanosolar, Inc. Photovoltaic module with rigidizing backplane
JP2005268719A (ja) 2004-03-22 2005-09-29 Sharp Corp 薄膜太陽電池
US7244682B2 (en) 2004-05-06 2007-07-17 Micron Technology, Inc. Methods of removing metal-containing materials
US7431795B2 (en) 2004-07-29 2008-10-07 Applied Materials, Inc. Cluster tool and method for process integration in manufacture of a gate structure of a field effect transistor
US20060021565A1 (en) 2004-07-30 2006-02-02 Aonex Technologies, Inc. GaInP / GaAs / Si triple junction solar cell enabled by wafer bonding and layer transfer
WO2006031798A2 (en) 2004-09-10 2006-03-23 Jx Crystals Inc. Solar photovoltaic mirror modules
JP4464240B2 (ja) 2004-10-06 2010-05-19 キヤノン株式会社 部材の処理装置及び処理方法
DE102004050269A1 (de) 2004-10-14 2006-04-20 Institut Für Solarenergieforschung Gmbh Verfahren zur Kontakttrennung elektrisch leitfähiger Schichten auf rückkontaktierten Solarzellen und Solarzelle
JP4334455B2 (ja) 2004-10-22 2009-09-30 シャープ株式会社 太陽電池モジュール
US7309658B2 (en) 2004-11-22 2007-12-18 Intermolecular, Inc. Molecular self-assembly in substrate processing
US8420435B2 (en) 2009-05-05 2013-04-16 Solexel, Inc. Ion implantation fabrication process for thin-film crystalline silicon solar cells
US8129822B2 (en) 2006-10-09 2012-03-06 Solexel, Inc. Template for three-dimensional thin-film solar cell manufacturing and methods of use
JP3962086B2 (ja) * 2004-12-27 2007-08-22 直江津電子工業株式会社 裏面接合型太陽電池及びその製造方法
JP4340246B2 (ja) 2005-03-07 2009-10-07 シャープ株式会社 薄膜太陽電池およびその製造方法
US7402523B2 (en) 2005-03-31 2008-07-22 Tokyo Electron Limited Etching method
US7687372B2 (en) 2005-04-08 2010-03-30 Versatilis Llc System and method for manufacturing thick and thin film devices using a donee layer cleaved from a crystalline donor
US20060266916A1 (en) 2005-05-25 2006-11-30 Molecular Imprints, Inc. Imprint lithography template having a coating to reflect and/or absorb actinic energy
US20070095386A1 (en) 2005-06-06 2007-05-03 Solaria Corporation Method and system for integrated solar cell using a plurality of photovoltaic regions
US7648927B2 (en) 2005-06-21 2010-01-19 Applied Materials, Inc. Method for forming silicon-containing materials during a photoexcitation deposition process
US7259102B2 (en) 2005-09-30 2007-08-21 Molecular Imprints, Inc. Etching technique to planarize a multi-layer structure
KR100699348B1 (ko) 2005-10-11 2007-03-23 삼성전자주식회사 포토레지스트 용액을 효율적으로 사용하는 분사식포토레지스트 코팅 장치 및 방법
CN100483750C (zh) * 2005-12-15 2009-04-29 无锡尚德太阳能电力有限公司 基于丝网印刷工艺的背面点接触硅太阳电池的制造方法
JP5142980B2 (ja) 2006-03-01 2013-02-13 三洋電機株式会社 太陽電池セル、及び、この太陽電池セルを用いた太陽電池モジュール
US7737357B2 (en) * 2006-05-04 2010-06-15 Sunpower Corporation Solar cell having doped semiconductor heterojunction contacts
US7786376B2 (en) 2006-08-22 2010-08-31 Solexel, Inc. High efficiency solar cells and manufacturing methods
TWI401810B (zh) * 2006-10-04 2013-07-11 Gigastorage Corp 太陽能電池
US20080264477A1 (en) 2006-10-09 2008-10-30 Soltaix, Inc. Methods for manufacturing three-dimensional thin-film solar cells
US8035027B2 (en) 2006-10-09 2011-10-11 Solexel, Inc. Solar module structures and assembly methods for pyramidal three-dimensional thin-film solar cells
US8293558B2 (en) 2006-10-09 2012-10-23 Solexel, Inc. Method for releasing a thin-film substrate
US7745313B2 (en) 2008-05-28 2010-06-29 Solexel, Inc. Substrate release methods and apparatuses
US8512581B2 (en) 2006-10-09 2013-08-20 Solexel, Inc. Methods for liquid transfer coating of three-dimensional substrates
US20080230782A1 (en) * 2006-10-09 2008-09-25 Homer Antoniadis Photoconductive devices with enhanced efficiency from group iv nanoparticle materials and methods thereof
US7999174B2 (en) 2006-10-09 2011-08-16 Solexel, Inc. Solar module structures and assembly methods for three-dimensional thin-film solar cells
US20100304521A1 (en) 2006-10-09 2010-12-02 Solexel, Inc. Shadow Mask Methods For Manufacturing Three-Dimensional Thin-Film Solar Cells
US20080128641A1 (en) 2006-11-08 2008-06-05 Silicon Genesis Corporation Apparatus and method for introducing particles using a radio frequency quadrupole linear accelerator for semiconductor materials
JP4846551B2 (ja) 2006-12-18 2011-12-28 シャープ株式会社 太陽電池およびその製造方法
WO2008136872A2 (en) 2006-12-22 2008-11-13 Adriani Paul M Structures for low cost, reliable solar modules
WO2008080160A1 (en) 2006-12-22 2008-07-03 Advent Solar, Inc. Interconnect technologies for back contact solar cells and modules
CN101017858A (zh) * 2007-01-10 2007-08-15 北京市太阳能研究所有限公司 一种背接触式太阳能电池及其制作方法
EP2264755A3 (en) 2007-01-24 2011-11-23 S.O.I.TEC Silicon on Insulator Technologies S.A. Method for manufacturing silicon on insulator wafers and corresponding wafer
EP2109149A4 (en) * 2007-01-25 2011-04-20 Sharp Kk SOLAR BATTERY CELL, SOLAR BATTERY ARRAY, SOLAR BATTERY MODULE AND METHOD FOR PRODUCING A SOLAR BATTERY ARRAY
EP2122691A4 (en) * 2007-02-16 2011-02-16 Nanogram Corp SOLAR CELL STRUCTURES, PV MODULES AND CORRESPONDING METHODS
KR20100015622A (ko) 2007-03-16 2010-02-12 비피 코포레이션 노쓰 아메리카 인코포레이티드 태양 전지
FR2914501B1 (fr) 2007-03-28 2009-12-04 Commissariat Energie Atomique Dispositif photovoltaique a structure a heterojonctions interdigitee discontinue
WO2008157577A2 (en) * 2007-06-18 2008-12-24 E-Cube Technologies, Inc. Methods and apparatuses for improving power extraction from solar cells
EP2165371B1 (en) * 2007-07-18 2012-02-29 Imec Method for producing an emitter structure and emitter structures resulting therefrom
US8349644B2 (en) 2007-10-18 2013-01-08 e-Cube Energy Technologies, Ltd. Mono-silicon solar cells
US7888168B2 (en) 2007-11-19 2011-02-15 Applied Materials, Inc. Solar cell contact formation process using a patterned etchant material
CN101874304B (zh) 2007-11-22 2012-07-18 夏普株式会社 元件间布线构件、光电转换元件及使用其的光电转换元件连接体和光电转换组件
JP2009135338A (ja) 2007-11-30 2009-06-18 Sanyo Electric Co Ltd 太陽電池及び太陽電池の製造方法
DE102007059490B4 (de) * 2007-12-11 2012-10-25 Institut Für Solarenergieforschung Gmbh Rückkontaktsolarzelle mit integrierter Bypassdioden-Funktion sowie Herstellungsverfahren hierfür
DE102007059486A1 (de) 2007-12-11 2009-06-18 Institut Für Solarenergieforschung Gmbh Rückkontaktsolarzelle mit länglichen, ineinander verschachtelten Emitter- und Basisbereichen an der Rückseite und Herstellungsverfahren hierfür
EP2071632B1 (en) 2007-12-14 2013-02-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Thin-film solar cell and process for its manufacture
US8481845B2 (en) * 2008-02-05 2013-07-09 Gtat Corporation Method to form a photovoltaic cell comprising a thin lamina
DE102008013446A1 (de) 2008-02-15 2009-08-27 Ersol Solar Energy Ag Verfahren zur Herstellung monokristalliner n-Silizium-Solarzellen sowie Solarzelle, hergestellt nach einem derartigen Verfahren
KR101155343B1 (ko) * 2008-02-25 2012-06-11 엘지전자 주식회사 백 콘택 태양전지의 제조 방법
US8049521B2 (en) 2008-04-14 2011-11-01 Applied Materials, Inc. Solar parametric testing module and processes
JP4948473B2 (ja) * 2008-04-21 2012-06-06 三洋電機株式会社 太陽電池モジュール
US20090301559A1 (en) 2008-05-13 2009-12-10 Georgia Tech Research Corporation Solar cell having a high quality rear surface spin-on dielectric layer
US20100144080A1 (en) 2008-06-02 2010-06-10 Solexel, Inc. Method and apparatus to transfer coat uneven surface
US7851698B2 (en) 2008-06-12 2010-12-14 Sunpower Corporation Trench process and structure for backside contact solar cells with polysilicon doped regions
TW201013961A (en) 2008-07-16 2010-04-01 Applied Materials Inc Hybrid heterojunction solar cell fabrication using a metal layer mask
US20100051085A1 (en) 2008-08-27 2010-03-04 Weidman Timothy W Back contact solar cell modules
WO2010030511A2 (en) * 2008-09-09 2010-03-18 Vanguard Solar, Inc. Solar cells and photodetectors with semiconducting nanostructures
US7999175B2 (en) 2008-09-09 2011-08-16 Palo Alto Research Center Incorporated Interdigitated back contact silicon solar cells with laser ablated grooves
US20100108130A1 (en) 2008-10-31 2010-05-06 Crystal Solar, Inc. Thin Interdigitated backside contact solar cell and manufacturing process thereof
US20100148319A1 (en) 2008-11-13 2010-06-17 Solexel, Inc. Substrates for High-Efficiency Thin-Film Solar Cells Based on Crystalline Templates
US8288195B2 (en) 2008-11-13 2012-10-16 Solexel, Inc. Method for fabricating a three-dimensional thin-film semiconductor substrate from a template
EP2371006A4 (en) 2008-11-26 2013-05-01 Solexel Inc TRUNCATED PYRAMID STRUCTURES FOR TRANSPARENT SOLAR CELLS
CN101447532A (zh) * 2008-12-22 2009-06-03 上海晶澳太阳能光伏科技有限公司 一种双面钝化晶体硅太阳电池的制备方法
CN101447518A (zh) * 2008-12-31 2009-06-03 江苏艾德太阳能科技有限公司 一种背点接触异质结太阳能电池及其制造方法
EP2395544A4 (en) 2009-02-05 2013-02-20 Sharp Kk METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
MY162405A (en) 2009-02-06 2017-06-15 Solexel Inc Trench Formation Method For Releasing A Thin-Film Substrate From A Reusable Semiconductor Template
US8828517B2 (en) 2009-03-23 2014-09-09 Solexel, Inc. Structure and method for improving solar cell efficiency and mechanical strength
JP2012521662A (ja) 2009-03-26 2012-09-13 ビーピー・コーポレーション・ノース・アメリカ・インコーポレーテッド 熱拡散ドープ領域中にレーザー焼成コンタクトを有する太陽電池セルのための装置及び方法
WO2010120850A1 (en) 2009-04-14 2010-10-21 Solexel, Inc. High efficiency epitaxial chemical vapor deposition (cvd) reactor
CN102405534A (zh) 2009-04-23 2012-04-04 夏普株式会社 布线板、带布线板的太阳能电池单元以及太阳能电池模块
US9099584B2 (en) 2009-04-24 2015-08-04 Solexel, Inc. Integrated three-dimensional and planar metallization structure for thin film solar cells
CN102460716B (zh) 2009-05-05 2015-03-25 速力斯公司 高生产率多孔半导体制造设备
US8445314B2 (en) 2009-05-22 2013-05-21 Solexel, Inc. Method of creating reusable template for detachable thin film substrate
WO2010138976A1 (en) 2009-05-29 2010-12-02 Solexel, Inc. Three-dimensional thin-film semiconductor substrate with through-holes and methods of manufacturing
US8624436B2 (en) 2009-06-09 2014-01-07 Andre Poskatcheev Willis Power harvesting circuit and method for serially coupled DC power sources
US20110083724A1 (en) * 2009-10-08 2011-04-14 Ovshinsky Stanford R Monolithic Integration of Photovoltaic Cells
EP2510551B1 (en) * 2009-12-09 2017-08-02 Solexel, Inc. Method for manufacturing back contact back junction solar cells
JP2011198965A (ja) 2010-03-19 2011-10-06 Fuji Electric Co Ltd レーザースクライブ装置
KR20110124112A (ko) 2010-05-10 2011-11-16 경희대학교 산학협력단 레이저 리프트 오프 공정을 이용한 플렉서블 cis계 태양전지의 제조 방법
US20120111399A1 (en) * 2010-11-08 2012-05-10 E. I. Du Pont De Nemours And Company Solar cell electrode

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080006319A1 (en) * 2006-06-05 2008-01-10 Martin Bettge Photovoltaic and photosensing devices based on arrays of aligned nanostructures
US20080072958A1 (en) * 2006-09-26 2008-03-27 Banpil Photonics, Inc. High efficiency photovoltaic cells with self concentrating effect
US20080289684A1 (en) * 2006-10-09 2008-11-27 Soltaix, Inc. Pyramidal three-dimensional thin-film solar cells

Also Published As

Publication number Publication date
CN102782869B (zh) 2013-12-25
WO2011072153A2 (en) 2011-06-16
US9196759B2 (en) 2015-11-24
US20150243814A1 (en) 2015-08-27
WO2011072179A2 (en) 2011-06-16
CN102763225B (zh) 2016-01-20
US20130167915A1 (en) 2013-07-04
WO2011072179A3 (en) 2011-11-17
US20130233378A1 (en) 2013-09-12
EP2510552A2 (en) 2012-10-17
CN102763226B (zh) 2016-01-27
WO2011072161A2 (en) 2011-06-16
EP2510550A2 (en) 2012-10-17
MY166305A (en) 2018-06-25
CN102763226A (zh) 2012-10-31
US20160336465A1 (en) 2016-11-17
EP2510551A4 (en) 2014-11-26
US20120305063A1 (en) 2012-12-06
CN102763225A (zh) 2012-10-31
US8962380B2 (en) 2015-02-24
WO2011072153A3 (en) 2011-11-17
EP2510551B1 (en) 2017-08-02
WO2011072161A3 (en) 2011-11-10
EP2510552A4 (en) 2014-11-05
EP2510550A4 (en) 2014-12-24
EP2510551A2 (en) 2012-10-17

Similar Documents

Publication Publication Date Title
CN102782869B (zh) 背结背触点三维薄太阳能电池及其制造方法
AU2012294932B2 (en) High-efficiency solar photovoltaic cells and modules using thin crystalline semiconductor absorbers
US9318644B2 (en) Ion implantation and annealing for thin film crystalline solar cells
US8263856B2 (en) Inverted metamorphic multijunction solar cells with back contacts
JP6199323B2 (ja) 効率的化合物の半導体太陽電池のための構造及び方法
US20170278991A1 (en) Multi-level solar cell metallization
US20130228221A1 (en) Manufacturing methods and structures for large-area thin-film solar cells and other semiconductor devices
US20130213469A1 (en) High efficiency solar cell structures and manufacturing methods
US20170236954A1 (en) High efficiency solar cell structures and manufacturing methods
US20130330872A1 (en) Ion implantation fabrication process for thin-film crystalline silicon solar cells
AU2014208227A1 (en) Multi-level solar cell metallization
EP2416377A2 (en) Solar cell and manufacturing method thereof
AU2013272248A1 (en) Manufacturing methods and structures for large-area thin-film solar cells and other semiconductor devices
CN101969082B (zh) 一种两次丝网印刷与刻槽结合的太阳能电池制造工艺
KR101396027B1 (ko) 고효율 후면 접촉 후면 접합 태양 전지의 이온 주입 및 어닐링
AU2013289151A1 (en) High efficiency solar cell structures and manufacturing methods
KR101449336B1 (ko) 그리드 전극 구조 및 이를 포함하는 화합물 반도체 태양전지의 제조방법

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20131225

Termination date: 20171209