ATE545148T1 - Thermischgesprühte, yttriumoxyd enthaltende beschichtung für plasmareaktoren - Google Patents

Thermischgesprühte, yttriumoxyd enthaltende beschichtung für plasmareaktoren

Info

Publication number
ATE545148T1
ATE545148T1 AT03737030T AT03737030T ATE545148T1 AT E545148 T1 ATE545148 T1 AT E545148T1 AT 03737030 T AT03737030 T AT 03737030T AT 03737030 T AT03737030 T AT 03737030T AT E545148 T1 ATE545148 T1 AT E545148T1
Authority
AT
Austria
Prior art keywords
yttrium oxide
coating containing
sprayed coating
thermally sprayed
plasma reactors
Prior art date
Application number
AT03737030T
Other languages
English (en)
Inventor
Robert O'donnell
John Daugherty
Original Assignee
Lam Res Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Res Corp filed Critical Lam Res Corp
Application granted granted Critical
Publication of ATE545148T1 publication Critical patent/ATE545148T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32467Material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4404Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32477Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/3255Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/34Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
    • H01L21/46Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
    • H01L21/461Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Organic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • General Chemical & Material Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Coating By Spraying Or Casting (AREA)
  • Plasma Technology (AREA)
AT03737030T 2002-06-27 2003-06-12 Thermischgesprühte, yttriumoxyd enthaltende beschichtung für plasmareaktoren ATE545148T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/180,504 US7311797B2 (en) 2002-06-27 2002-06-27 Productivity enhancing thermal sprayed yttria-containing coating for plasma reactor
PCT/US2003/018502 WO2004003962A2 (en) 2002-06-27 2003-06-12 Thermal sprayed yttria-containing coating for plasma reactor

Publications (1)

Publication Number Publication Date
ATE545148T1 true ATE545148T1 (de) 2012-02-15

Family

ID=29778939

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03737030T ATE545148T1 (de) 2002-06-27 2003-06-12 Thermischgesprühte, yttriumoxyd enthaltende beschichtung für plasmareaktoren

Country Status (9)

Country Link
US (2) US7311797B2 (de)
EP (1) EP1518255B1 (de)
JP (2) JP2005531157A (de)
KR (2) KR101030935B1 (de)
CN (1) CN1663017A (de)
AT (1) ATE545148T1 (de)
AU (1) AU2003238006A1 (de)
TW (1) TWI328411B (de)
WO (1) WO2004003962A2 (de)

Families Citing this family (222)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW514996B (en) 1999-12-10 2002-12-21 Tokyo Electron Ltd Processing apparatus with a chamber having therein a high-corrosion-resistant sprayed film
US6805952B2 (en) * 2000-12-29 2004-10-19 Lam Research Corporation Low contamination plasma chamber components and methods for making the same
JP4104987B2 (ja) * 2001-03-29 2008-06-18 株式会社ブリヂストン タイヤおよびタイヤ構成部材の製造方法、ならびに、それに用いる装置
US7371467B2 (en) 2002-01-08 2008-05-13 Applied Materials, Inc. Process chamber component having electroplated yttrium containing coating
US8067067B2 (en) * 2002-02-14 2011-11-29 Applied Materials, Inc. Clean, dense yttrium oxide coating protecting semiconductor processing apparatus
US6798519B2 (en) * 2002-09-30 2004-09-28 Tokyo Electron Limited Method and apparatus for an improved optical window deposition shield in a plasma processing system
US7147749B2 (en) * 2002-09-30 2006-12-12 Tokyo Electron Limited Method and apparatus for an improved upper electrode plate with deposition shield in a plasma processing system
US6837966B2 (en) * 2002-09-30 2005-01-04 Tokyo Electron Limeted Method and apparatus for an improved baffle plate in a plasma processing system
US7204912B2 (en) 2002-09-30 2007-04-17 Tokyo Electron Limited Method and apparatus for an improved bellows shield in a plasma processing system
US7137353B2 (en) * 2002-09-30 2006-11-21 Tokyo Electron Limited Method and apparatus for an improved deposition shield in a plasma processing system
US7166166B2 (en) 2002-09-30 2007-01-23 Tokyo Electron Limited Method and apparatus for an improved baffle plate in a plasma processing system
CN1249789C (zh) 2002-11-28 2006-04-05 东京毅力科创株式会社 等离子体处理容器内部件
US20060226003A1 (en) * 2003-01-22 2006-10-12 John Mize Apparatus and methods for ionized deposition of a film or thin layer
CN100418187C (zh) * 2003-02-07 2008-09-10 东京毅力科创株式会社 等离子体处理装置、环形部件和等离子体处理方法
DE602004009982T2 (de) * 2003-03-31 2008-09-18 Sanyo Electric Co., Ltd., Moriguchi Metallschablone und Verfahren zum Drucken von bleifreier Lötpaste mit derselben
WO2004095530A2 (en) * 2003-03-31 2004-11-04 Tokyo Electron Limited Adjoining adjacent coatings on an element
US7297247B2 (en) * 2003-05-06 2007-11-20 Applied Materials, Inc. Electroformed sputtering target
US6843870B1 (en) * 2003-07-22 2005-01-18 Epic Biosonics Inc. Implantable electrical cable and method of making
US7220497B2 (en) * 2003-12-18 2007-05-22 Lam Research Corporation Yttria-coated ceramic components of semiconductor material processing apparatuses and methods of manufacturing the components
US8213467B2 (en) 2004-04-08 2012-07-03 Sonosite, Inc. Systems and methods providing ASICs for use in multiple applications
KR100855531B1 (ko) * 2004-04-13 2008-09-01 어플라이드 머티어리얼스, 인코포레이티드 전기 도금된 이트륨 함유 코팅을 갖는 프로세스 챔버 요소
US7119032B2 (en) 2004-08-23 2006-10-10 Air Products And Chemicals, Inc. Method to protect internal components of semiconductor processing equipment using layered superlattice materials
KR100953707B1 (ko) 2004-08-24 2010-04-19 생-고뱅 세라믹스 앤드 플라스틱스, 인코포레이티드 반도체 프로세싱 부품 및 이를 사용하는 반도체 제조방법
JP2006186306A (ja) * 2004-09-30 2006-07-13 Toshiba Ceramics Co Ltd ガス拡散プレートおよびその製造方法
US7226869B2 (en) * 2004-10-29 2007-06-05 Lam Research Corporation Methods for protecting silicon or silicon carbide electrode surfaces from morphological modification during plasma etch processing
KR100887271B1 (ko) * 2004-12-17 2009-03-06 도쿄엘렉트론가부시키가이샤 플라즈마 처리 장치
US9659758B2 (en) 2005-03-22 2017-05-23 Honeywell International Inc. Coils utilized in vapor deposition applications and methods of production
JP2006319043A (ja) * 2005-05-11 2006-11-24 Hitachi High-Technologies Corp プラズマ処理装置
WO2006135043A1 (ja) * 2005-06-17 2006-12-21 Tohoku University 金属部材の保護膜構造及び保護膜構造を用いた金属部品並びに保護膜構造を用いた半導体又は平板ディスプレイ製造装置
US20090194233A1 (en) * 2005-06-23 2009-08-06 Tokyo Electron Limited Component for semicondutor processing apparatus and manufacturing method thereof
JP4813115B2 (ja) * 2005-07-14 2011-11-09 国立大学法人東北大学 半導体製造装置用部材及びその洗浄方法
US7976641B1 (en) 2005-09-30 2011-07-12 Lam Research Corporation Extending storage time of removed plasma chamber components prior to cleaning thereof
JP4993610B2 (ja) * 2005-11-08 2012-08-08 国立大学法人東北大学 シャワープレート及びシャワープレートを用いたプラズマ処理装置
US20070108161A1 (en) * 2005-11-17 2007-05-17 Applied Materials, Inc. Chamber components with polymer coatings and methods of manufacture
JP4856978B2 (ja) * 2006-02-21 2012-01-18 株式会社日立ハイテクノロジーズ プラズマエッチング装置及び処理室の内壁の形成方法
US20070215278A1 (en) * 2006-03-06 2007-09-20 Muneo Furuse Plasma etching apparatus and method for forming inner wall of plasma processing chamber
JP5014656B2 (ja) * 2006-03-27 2012-08-29 国立大学法人東北大学 プラズマ処理装置用部材およびその製造方法
US7906032B2 (en) * 2006-03-31 2011-03-15 Tokyo Electron Limited Method for conditioning a process chamber
KR101344990B1 (ko) * 2006-04-20 2013-12-24 신에쓰 가가꾸 고교 가부시끼가이샤 도전성 내플라즈마 부재
US20070246795A1 (en) * 2006-04-20 2007-10-25 Micron Technology, Inc. Dual depth shallow trench isolation and methods to form same
US7884026B2 (en) * 2006-07-20 2011-02-08 United Microelectronics Corp. Method of fabricating dual damascene structure
US20080029032A1 (en) * 2006-08-01 2008-02-07 Sun Jennifer Y Substrate support with protective layer for plasma resistance
CN101123214B (zh) * 2006-08-07 2011-03-16 联华电子股份有限公司 双镶嵌结构的制作方法
JPWO2008032627A1 (ja) * 2006-09-11 2010-01-21 株式会社アルバック ドライエッチング方法
US7838800B2 (en) * 2006-09-25 2010-11-23 Tokyo Electron Limited Temperature controlled substrate holder having erosion resistant insulating layer for a substrate processing system
US7723648B2 (en) * 2006-09-25 2010-05-25 Tokyo Electron Limited Temperature controlled substrate holder with non-uniform insulation layer for a substrate processing system
JP2008103403A (ja) * 2006-10-17 2008-05-01 Tokyo Electron Ltd 基板載置台及びプラズマ処理装置
US8702866B2 (en) 2006-12-18 2014-04-22 Lam Research Corporation Showerhead electrode assembly with gas flow modification for extended electrode life
US8097105B2 (en) * 2007-01-11 2012-01-17 Lam Research Corporation Extending lifetime of yttrium oxide as a plasma chamber material
US20080196661A1 (en) * 2007-02-20 2008-08-21 Brian West Plasma sprayed deposition ring isolator
US7718559B2 (en) * 2007-04-20 2010-05-18 Applied Materials, Inc. Erosion resistance enhanced quartz used in plasma etch chamber
US10622194B2 (en) 2007-04-27 2020-04-14 Applied Materials, Inc. Bulk sintered solid solution ceramic which exhibits fracture toughness and halogen plasma resistance
US10242888B2 (en) 2007-04-27 2019-03-26 Applied Materials, Inc. Semiconductor processing apparatus with a ceramic-comprising surface which exhibits fracture toughness and halogen plasma resistance
JPWO2008140012A1 (ja) * 2007-05-11 2010-08-05 株式会社アルバック ドライエッチング装置及びドライエッチング方法
US20080289766A1 (en) * 2007-05-22 2008-11-27 Samsung Austin Semiconductor Lp Hot edge ring apparatus and method for increased etch rate uniformity and reduced polymer buildup
CN101889329B (zh) * 2007-10-31 2012-07-04 朗姆研究公司 长寿命可消耗氮化硅-二氧化硅等离子处理部件
US8129029B2 (en) * 2007-12-21 2012-03-06 Applied Materials, Inc. Erosion-resistant plasma chamber components comprising a metal base structure with an overlying thermal oxidation coating
US20090214825A1 (en) * 2008-02-26 2009-08-27 Applied Materials, Inc. Ceramic coating comprising yttrium which is resistant to a reducing plasma
JP2009212293A (ja) * 2008-03-04 2009-09-17 Tokyo Electron Ltd 基板処理装置用の部品及び基板処理装置
US20090261065A1 (en) * 2008-04-18 2009-10-22 Lam Research Corporation Components for use in a plasma chamber having reduced particle generation and method of making
US8120137B2 (en) * 2008-05-08 2012-02-21 Micron Technology, Inc. Isolation trench structure
CN101577211B (zh) * 2008-05-09 2011-07-20 中微半导体设备(上海)有限公司 抗等离子体腐蚀的反应室部件、其制造方法以及包含该部件的等离子体反应室
JP5390166B2 (ja) * 2008-10-30 2014-01-15 株式会社日本セラテック 耐食性部材
JP5390167B2 (ja) * 2008-10-30 2014-01-15 株式会社日本セラテック 耐食性部材
US8206829B2 (en) * 2008-11-10 2012-06-26 Applied Materials, Inc. Plasma resistant coatings for plasma chamber components
TWI456679B (zh) * 2009-03-27 2014-10-11 Advanced Micro Fab Equip Inc 抗電漿腐蝕之反應室部件、其製造方法以及包含該部件之電漿反應室
JP5837733B2 (ja) * 2009-04-24 2015-12-24 国立大学法人東北大学 水分発生用反応炉
KR20120090996A (ko) 2009-08-27 2012-08-17 어플라이드 머티어리얼스, 인코포레이티드 인-시튜 챔버 세정 후 프로세스 챔버의 제염 방법
US20110206833A1 (en) * 2010-02-22 2011-08-25 Lam Research Corporation Extension electrode of plasma bevel etching apparatus and method of manufacture thereof
CN102296263B (zh) * 2010-06-25 2013-04-24 中国科学院微电子研究所 等离子体刻蚀工艺腔室内表面的改性处理方法
KR101487342B1 (ko) 2010-07-30 2015-01-30 주식회사 잉크테크 투명 도전막의 제조방법 및 이에 의해 제조된 투명 도전막
JP5606821B2 (ja) * 2010-08-04 2014-10-15 東京エレクトロン株式会社 プラズマ処理装置
JP5389282B2 (ja) * 2010-08-12 2014-01-15 株式会社東芝 ガス供給部材、プラズマ処理装置およびイットリア含有膜の形成方法
JP5198611B2 (ja) * 2010-08-12 2013-05-15 株式会社東芝 ガス供給部材、プラズマ処理装置およびイットリア含有膜の形成方法
US20120052216A1 (en) * 2010-08-27 2012-03-01 Applied Materials, Inc. Gas distribution showerhead with high emissivity surface
KR101108692B1 (ko) * 2010-09-06 2012-01-25 한국기계연구원 다공성 세라믹 표면을 밀봉하는 치밀한 희토류 금속 산화물 코팅막 및 이의 제조방법
CN102456564A (zh) * 2010-10-29 2012-05-16 中芯国际集成电路制造(上海)有限公司 用于刻蚀腔的变压耦合式等离子体窗及包括其的刻蚀腔
DE202011002844U1 (de) 2011-02-17 2011-06-09 LAM RESEARCH CORPORATION (Delaware Corporation), California Erweiterungselektrode einer Plasmaschrägkantenätzvorrichtung
JP2012221979A (ja) * 2011-04-04 2012-11-12 Toshiba Corp プラズマ処理装置
KR101998440B1 (ko) * 2011-08-10 2019-07-09 엔테그리스, 아이엔씨. 선택적 이트리아 상부층을 가지는 AlON 피복 기판
US20130102156A1 (en) * 2011-10-21 2013-04-25 Lam Research Corporation Components of plasma processing chambers having textured plasma resistant coatings
US9034199B2 (en) 2012-02-21 2015-05-19 Applied Materials, Inc. Ceramic article with reduced surface defect density and process for producing a ceramic article
US9212099B2 (en) 2012-02-22 2015-12-15 Applied Materials, Inc. Heat treated ceramic substrate having ceramic coating and heat treatment for coated ceramics
US9090046B2 (en) * 2012-04-16 2015-07-28 Applied Materials, Inc. Ceramic coated article and process for applying ceramic coating
US9861973B2 (en) * 2012-05-10 2018-01-09 University Of Connecticut Methods and apparatus for making catalyst films
KR101637801B1 (ko) * 2012-05-22 2016-07-07 가부시끼가이샤 도시바 플라즈마 처리 장치용 부품 및 플라즈마 처리 장치용 부품의 제조 방법
KR101466967B1 (ko) 2012-06-13 2014-12-15 한국과학기술연구원 내식성이 향상된 다성분계 열용사용 코팅물질, 그 제조방법 및 코팅방법
US20140007901A1 (en) * 2012-07-06 2014-01-09 Jack Chen Methods and apparatus for bevel edge cleaning in a plasma processing system
US9604249B2 (en) 2012-07-26 2017-03-28 Applied Materials, Inc. Innovative top-coat approach for advanced device on-wafer particle performance
US9343289B2 (en) * 2012-07-27 2016-05-17 Applied Materials, Inc. Chemistry compatible coating material for advanced device on-wafer particle performance
US9132436B2 (en) 2012-09-21 2015-09-15 Applied Materials, Inc. Chemical control features in wafer process equipment
CN103794460B (zh) * 2012-10-29 2016-12-21 中微半导体设备(上海)有限公司 用于半导体装置性能改善的涂层
CN103794458B (zh) * 2012-10-29 2016-12-21 中微半导体设备(上海)有限公司 用于等离子体处理腔室内部的部件及制造方法
US9916998B2 (en) 2012-12-04 2018-03-13 Applied Materials, Inc. Substrate support assembly having a plasma resistant protective layer
US9685356B2 (en) 2012-12-11 2017-06-20 Applied Materials, Inc. Substrate support assembly having metal bonded protective layer
US9385018B2 (en) 2013-01-07 2016-07-05 Samsung Austin Semiconductor, L.P. Semiconductor manufacturing equipment with trace elements for improved defect tracing and methods of manufacture
KR102094304B1 (ko) * 2013-02-05 2020-03-30 (주) 코미코 표면 처리 방법 및 이를 이용한 세라믹 구조물
US10256079B2 (en) 2013-02-08 2019-04-09 Applied Materials, Inc. Semiconductor processing systems having multiple plasma configurations
US9123651B2 (en) * 2013-03-27 2015-09-01 Lam Research Corporation Dense oxide coated component of a plasma processing chamber and method of manufacture thereof
JP6076838B2 (ja) * 2013-05-31 2017-02-08 住友重機械イオンテクノロジー株式会社 絶縁構造及び絶縁方法
US9865434B2 (en) 2013-06-05 2018-01-09 Applied Materials, Inc. Rare-earth oxide based erosion resistant coatings for semiconductor application
US9850568B2 (en) 2013-06-20 2017-12-26 Applied Materials, Inc. Plasma erosion resistant rare-earth oxide based thin film coatings
WO2015061616A1 (en) 2013-10-24 2015-04-30 Surmet Corporation High purity polycrystalline aluminum oxynitride bodies
US20150126036A1 (en) * 2013-11-05 2015-05-07 Tokyo Electron Limited Controlling etch rate drift and particles during plasma processing
WO2015077601A1 (en) * 2013-11-21 2015-05-28 Entegris, Inc. Surface coating for chamber components used in plasma systems
US20230386795A1 (en) * 2013-11-21 2023-11-30 Entegris, Inc. Surface coating for chamber components used in plasma systems
CN104701125A (zh) * 2013-12-05 2015-06-10 中微半导体设备(上海)有限公司 气体分布板
US9873940B2 (en) * 2013-12-31 2018-01-23 Lam Research Corporation Coating system and method for coating interior fluid wetted surfaces of a component of a semiconductor substrate processing apparatus
US9869013B2 (en) * 2014-04-25 2018-01-16 Applied Materials, Inc. Ion assisted deposition top coat of rare-earth oxide
US9976211B2 (en) 2014-04-25 2018-05-22 Applied Materials, Inc. Plasma erosion resistant thin film coating for high temperature application
US10730798B2 (en) * 2014-05-07 2020-08-04 Applied Materials, Inc. Slurry plasma spray of plasma resistant ceramic coating
JP6714978B2 (ja) 2014-07-10 2020-07-01 東京エレクトロン株式会社 プラズマ処理装置用の部品、プラズマ処理装置、及びプラズマ処理装置用の部品の製造方法
KR101465640B1 (ko) * 2014-08-08 2014-11-28 주식회사 펨빅스 불화알루미늄 생성방지막이 형성된 cvd 공정챔버 부품
WO2016025573A1 (en) * 2014-08-15 2016-02-18 Applied Materials, Inc. Method and apparatus of processing wafers with compressive or tensile stress at elevated temperatures in a plasma enhanced chemical vapor deposition system
JP6544902B2 (ja) * 2014-09-18 2019-07-17 東京エレクトロン株式会社 プラズマ処理装置
US9355922B2 (en) 2014-10-14 2016-05-31 Applied Materials, Inc. Systems and methods for internal surface conditioning in plasma processing equipment
US9966240B2 (en) 2014-10-14 2018-05-08 Applied Materials, Inc. Systems and methods for internal surface conditioning assessment in plasma processing equipment
US11637002B2 (en) 2014-11-26 2023-04-25 Applied Materials, Inc. Methods and systems to enhance process uniformity
US10573496B2 (en) 2014-12-09 2020-02-25 Applied Materials, Inc. Direct outlet toroidal plasma source
US9728437B2 (en) 2015-02-03 2017-08-08 Applied Materials, Inc. High temperature chuck for plasma processing systems
JP6396819B2 (ja) * 2015-02-03 2018-09-26 東京エレクトロン株式会社 プラズマ処理方法及びプラズマ処理装置
US20160225652A1 (en) 2015-02-03 2016-08-04 Applied Materials, Inc. Low temperature chuck for plasma processing systems
SG11201707660VA (en) 2015-03-18 2017-10-30 Entegris Inc Articles coated with fluoro-annealed films
KR102376982B1 (ko) * 2015-04-14 2022-03-21 삼성전자주식회사 세라믹을 이용하여 파티클 저감 효과를 가지는 원격 플라즈마 발생장치
KR20160124992A (ko) * 2015-04-20 2016-10-31 삼성전자주식회사 기판 제조 장치, 및 그의 세라믹 박막 코팅 방법
KR102447682B1 (ko) 2015-05-29 2022-09-27 삼성전자주식회사 코팅층 형성 방법, 플라즈마 처리 장치 및 패턴 형성 방법
US20160358749A1 (en) * 2015-06-04 2016-12-08 Lam Research Corporation Plasma etching device with plasma etch resistant coating
KR20170006807A (ko) 2015-07-09 2017-01-18 (주)티티에스 공정 챔버의 부품파트 및 화학기상증착에 의해 이트리아를 부품파트에 증착하는 방법
KR20170015615A (ko) * 2015-07-29 2017-02-09 삼성전자주식회사 플라즈마 처리 장치
US9691645B2 (en) 2015-08-06 2017-06-27 Applied Materials, Inc. Bolted wafer chuck thermal management systems and methods for wafer processing systems
US9741593B2 (en) 2015-08-06 2017-08-22 Applied Materials, Inc. Thermal management systems and methods for wafer processing systems
US9349605B1 (en) 2015-08-07 2016-05-24 Applied Materials, Inc. Oxide etch selectivity systems and methods
US10854492B2 (en) * 2015-08-18 2020-12-01 Lam Research Corporation Edge ring assembly for improving feature profile tilting at extreme edge of wafer
US10504700B2 (en) 2015-08-27 2019-12-10 Applied Materials, Inc. Plasma etching systems and methods with secondary plasma injection
JP6573820B2 (ja) 2015-11-09 2019-09-11 東京エレクトロン株式会社 プラズマ処理装置用部材及びプラズマ処理装置
WO2017087474A1 (en) 2015-11-16 2017-05-26 Coorstek, Inc. Corrosion-resistant components and methods of making
US10020218B2 (en) 2015-11-17 2018-07-10 Applied Materials, Inc. Substrate support assembly with deposited surface features
KR102504290B1 (ko) * 2015-12-04 2023-02-28 삼성전자 주식회사 수소 플라스마 어닐링 처리 준비 방법, 수소 플라스마 어닐링 처리 방법, 및 수소 플라스마 어닐링 장치
US10488397B2 (en) 2016-04-05 2019-11-26 University Of Connecticut Metal oxide based sensors for sensing low concentration of specific gases prepared by a flame based process
US10504754B2 (en) 2016-05-19 2019-12-10 Applied Materials, Inc. Systems and methods for improved semiconductor etching and component protection
US10522371B2 (en) 2016-05-19 2019-12-31 Applied Materials, Inc. Systems and methods for improved semiconductor etching and component protection
JP6908973B2 (ja) * 2016-06-08 2021-07-28 三菱重工業株式会社 遮熱コーティング、タービン部材、ガスタービン、ならびに遮熱コーティングの製造方法
US9865484B1 (en) 2016-06-29 2018-01-09 Applied Materials, Inc. Selective etch using material modification and RF pulsing
KR101885570B1 (ko) * 2016-07-05 2018-08-07 세메스 주식회사 윈도우 부재, 그 제조 방법, 및 그를 포함하는 기판 처리 장치
US10629473B2 (en) 2016-09-09 2020-04-21 Applied Materials, Inc. Footing removal for nitride spacer
US10546729B2 (en) 2016-10-04 2020-01-28 Applied Materials, Inc. Dual-channel showerhead with improved profile
US9934942B1 (en) 2016-10-04 2018-04-03 Applied Materials, Inc. Chamber with flow-through source
US10163696B2 (en) 2016-11-11 2018-12-25 Applied Materials, Inc. Selective cobalt removal for bottom up gapfill
US10026621B2 (en) 2016-11-14 2018-07-17 Applied Materials, Inc. SiN spacer profile patterning
EP3526177B1 (de) * 2016-11-16 2021-06-09 Coorstek Inc. Korrosionsbeständige komponenten und verfahren zur herstellung
US9773665B1 (en) * 2016-12-06 2017-09-26 Applied Materials, Inc. Particle reduction in a physical vapor deposition chamber
KR101877017B1 (ko) * 2017-01-09 2018-07-12 한국과학기술연구원 반도체 반응기 및 반도체 반응기용 금속모재의 코팅층 형성방법
US10431429B2 (en) 2017-02-03 2019-10-01 Applied Materials, Inc. Systems and methods for radial and azimuthal control of plasma uniformity
US10319739B2 (en) 2017-02-08 2019-06-11 Applied Materials, Inc. Accommodating imperfectly aligned memory holes
US10943834B2 (en) 2017-03-13 2021-03-09 Applied Materials, Inc. Replacement contact process
US11251026B2 (en) 2017-03-31 2022-02-15 Mattson Technology, Inc. Material deposition prevention on a workpiece in a process chamber
US11276559B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Semiconductor processing chamber for multiple precursor flow
US11276590B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Multi-zone semiconductor substrate supports
US10497579B2 (en) 2017-05-31 2019-12-03 Applied Materials, Inc. Water-free etching methods
US10920320B2 (en) 2017-06-16 2021-02-16 Applied Materials, Inc. Plasma health determination in semiconductor substrate processing reactors
US10541246B2 (en) 2017-06-26 2020-01-21 Applied Materials, Inc. 3D flash memory cells which discourage cross-cell electrical tunneling
US10727080B2 (en) 2017-07-07 2020-07-28 Applied Materials, Inc. Tantalum-containing material removal
US10541184B2 (en) 2017-07-11 2020-01-21 Applied Materials, Inc. Optical emission spectroscopic techniques for monitoring etching
CN110997972B (zh) * 2017-07-31 2022-07-26 京瓷株式会社 部件及半导体制造装置
US10043674B1 (en) 2017-08-04 2018-08-07 Applied Materials, Inc. Germanium etching systems and methods
US10297458B2 (en) 2017-08-07 2019-05-21 Applied Materials, Inc. Process window widening using coated parts in plasma etch processes
JP7239935B2 (ja) * 2017-09-01 2023-03-15 学校法人 芝浦工業大学 部品および半導体製造装置
US11183373B2 (en) 2017-10-11 2021-11-23 Honeywell International Inc. Multi-patterned sputter traps and methods of making
US10903054B2 (en) 2017-12-19 2021-01-26 Applied Materials, Inc. Multi-zone gas distribution systems and methods
US11328909B2 (en) 2017-12-22 2022-05-10 Applied Materials, Inc. Chamber conditioning and removal processes
US10854426B2 (en) 2018-01-08 2020-12-01 Applied Materials, Inc. Metal recess for semiconductor structures
CN111566778A (zh) * 2018-01-08 2020-08-21 朗姆研究公司 管理等离子体处理副产物材料的组件和工艺
US10964512B2 (en) 2018-02-15 2021-03-30 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus and methods
US10679870B2 (en) 2018-02-15 2020-06-09 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus
US11047035B2 (en) 2018-02-23 2021-06-29 Applied Materials, Inc. Protective yttria coating for semiconductor equipment parts
TWI766433B (zh) 2018-02-28 2022-06-01 美商應用材料股份有限公司 形成氣隙的系統及方法
US10593560B2 (en) 2018-03-01 2020-03-17 Applied Materials, Inc. Magnetic induction plasma source for semiconductor processes and equipment
US11087961B2 (en) * 2018-03-02 2021-08-10 Lam Research Corporation Quartz component with protective coating
US10319600B1 (en) 2018-03-12 2019-06-11 Applied Materials, Inc. Thermal silicon etch
US10497573B2 (en) 2018-03-13 2019-12-03 Applied Materials, Inc. Selective atomic layer etching of semiconductor materials
US11139151B1 (en) * 2018-03-15 2021-10-05 Intel Corporation Micro-surface morphological matching for reactor components
US10573527B2 (en) 2018-04-06 2020-02-25 Applied Materials, Inc. Gas-phase selective etching systems and methods
US10490406B2 (en) 2018-04-10 2019-11-26 Appled Materials, Inc. Systems and methods for material breakthrough
US10699879B2 (en) 2018-04-17 2020-06-30 Applied Materials, Inc. Two piece electrode assembly with gap for plasma control
US10886137B2 (en) 2018-04-30 2021-01-05 Applied Materials, Inc. Selective nitride removal
US10872778B2 (en) 2018-07-06 2020-12-22 Applied Materials, Inc. Systems and methods utilizing solid-phase etchants
US10755941B2 (en) 2018-07-06 2020-08-25 Applied Materials, Inc. Self-limiting selective etching systems and methods
US11667575B2 (en) 2018-07-18 2023-06-06 Applied Materials, Inc. Erosion resistant metal oxide coatings
US10672642B2 (en) 2018-07-24 2020-06-02 Applied Materials, Inc. Systems and methods for pedestal configuration
US10892198B2 (en) 2018-09-14 2021-01-12 Applied Materials, Inc. Systems and methods for improved performance in semiconductor processing
US11049755B2 (en) 2018-09-14 2021-06-29 Applied Materials, Inc. Semiconductor substrate supports with embedded RF shield
US11062887B2 (en) 2018-09-17 2021-07-13 Applied Materials, Inc. High temperature RF heater pedestals
US11417534B2 (en) 2018-09-21 2022-08-16 Applied Materials, Inc. Selective material removal
US11682560B2 (en) 2018-10-11 2023-06-20 Applied Materials, Inc. Systems and methods for hafnium-containing film removal
US11121002B2 (en) 2018-10-24 2021-09-14 Applied Materials, Inc. Systems and methods for etching metals and metal derivatives
US11437242B2 (en) 2018-11-27 2022-09-06 Applied Materials, Inc. Selective removal of silicon-containing materials
KR102621279B1 (ko) * 2018-12-05 2024-01-05 교세라 가부시키가이샤 플라스마 처리 장치용 부재 및 이것을 구비하는 플라스마 처리 장치
US11721527B2 (en) 2019-01-07 2023-08-08 Applied Materials, Inc. Processing chamber mixing systems
US10920319B2 (en) 2019-01-11 2021-02-16 Applied Materials, Inc. Ceramic showerheads with conductive electrodes
CN111627790B (zh) * 2019-02-27 2024-05-03 Toto株式会社 半导体制造装置构件、半导体制造装置、显示器制造装置
JP2020141123A (ja) 2019-02-27 2020-09-03 Toto株式会社 半導体製造装置用部材および半導体製造装置用部材を備えた半導体製造装置並びにディスプレイ製造装置
JP6801773B2 (ja) * 2019-02-27 2020-12-16 Toto株式会社 半導体製造装置用部材および半導体製造装置用部材を備えた半導体製造装置並びにディスプレイ製造装置
WO2020180502A1 (en) * 2019-03-01 2020-09-10 Lam Research Corporation Surface coating for aluminum plasma processing chamber components
WO2020180853A1 (en) * 2019-03-05 2020-09-10 Lam Research Corporation Laminated aerosol deposition coating for aluminum components for plasma processing chambers
CN112017932B (zh) * 2019-05-31 2022-11-29 中微半导体设备(上海)股份有限公司 等离子体处理装置中气体输送系统的耐腐蚀结构
KR20210012178A (ko) * 2019-07-24 2021-02-03 삼성전자주식회사 기판 처리장치 및 이를 구비하는 기판 처리 시스템
US20210032750A1 (en) * 2019-07-31 2021-02-04 Taiwan Semiconductor Manufacturing Co., Ltd. Deposition apparatus and method of forming metal oxide layer using the same
EP4010916A4 (de) * 2019-08-09 2023-08-09 Applied Materials, Inc. Mehrlagige schutzschicht für die verarbeitung von kammerkomponenten
CN112713072B (zh) * 2019-10-24 2024-03-12 中微半导体设备(上海)股份有限公司 等离子体处理腔室内部部件及其制造方法
KR102225604B1 (ko) * 2019-12-18 2021-03-10 피에스케이 주식회사 기판 처리 장치
US20230088848A1 (en) * 2020-01-23 2023-03-23 Lam Research Corporation Yttrium aluminum coating for plasma processing chamber components
US11661650B2 (en) 2020-04-10 2023-05-30 Applied Materials, Inc. Yttrium oxide based coating composition
US11881385B2 (en) * 2020-04-24 2024-01-23 Applied Materials, Inc. Methods and apparatus for reducing defects in preclean chambers
CN113802094B (zh) * 2020-06-16 2024-04-05 中微半导体设备(上海)股份有限公司 耐腐蚀涂层的镀膜方法及等离子体刻蚀零部件和反应装置
US20220013336A1 (en) * 2020-07-10 2022-01-13 Applied Materials, Inc. Process kit with protective ceramic coatings for hydrogen and nh3 plasma application
US20220037126A1 (en) * 2020-08-03 2022-02-03 Applied Materials, Inc. Fluoride coating to improve chamber performance
KR102497053B1 (ko) 2020-09-25 2023-02-08 한국과학기술연구원 레이저 소결을 이용한 내플라즈마 코팅막 치밀화 방법
KR102496309B1 (ko) 2020-09-25 2023-02-07 한국과학기술연구원 레이저를 이용한 내플라즈마 코팅막 형성방법
US20220341018A1 (en) * 2021-04-21 2022-10-27 Toto Ltd. Semiconductor manufacturing apparatus member and semiconductor manufacturing apparatus
US20230366074A1 (en) * 2022-05-16 2023-11-16 Andrei V. Ivanov Oxygen Interception for Air Plasma Spray Processes
WO2024097506A1 (en) * 2022-10-31 2024-05-10 Lam Research Corporation Refractory components for a semiconductor processing chamber
CN117265480B (zh) * 2023-10-31 2024-05-10 华南理工大学 一种低粗糙度氧化钇涂层的制备方法

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961111A (en) * 1975-03-18 1976-06-01 Pennwalt Corporation Method of increasing corrosion resistance of anodized aluminum
US4340462A (en) 1981-02-13 1982-07-20 Lam Research Corporation Adjustable electrode plasma processing chamber
US5262029A (en) 1988-05-23 1993-11-16 Lam Research Method and system for clamping semiconductor wafers
US4948458A (en) 1989-08-14 1990-08-14 Lam Research Corporation Method and apparatus for producing magnetically-coupled planar plasma
JPH03287797A (ja) * 1990-04-03 1991-12-18 Sumitomo Electric Ind Ltd 耐食部材
US5200232A (en) 1990-12-11 1993-04-06 Lam Research Corporation Reaction chamber design and method to minimize particle generation in chemical vapor deposition reactors
JP3308091B2 (ja) * 1994-02-03 2002-07-29 東京エレクトロン株式会社 表面処理方法およびプラズマ処理装置
US5798016A (en) 1994-03-08 1998-08-25 International Business Machines Corporation Apparatus for hot wall reactive ion etching using a dielectric or metallic liner with temperature control to achieve process stability
DE9421671U1 (de) 1994-08-26 1996-07-11 Siemens AG, 80333 München Entladungskammer für eine Plasmaätzanlage in der Halbleiterfertigung
JP3164200B2 (ja) 1995-06-15 2001-05-08 住友金属工業株式会社 マイクロ波プラズマ処理装置
US5824605A (en) 1995-07-31 1998-10-20 Lam Research Corporation Gas dispersion window for plasma apparatus and method of use thereof
US5838529A (en) 1995-12-22 1998-11-17 Lam Research Corporation Low voltage electrostatic clamp for substrates such as dielectric substrates
US5820723A (en) 1996-06-05 1998-10-13 Lam Research Corporation Universal vacuum chamber including equipment modules such as a plasma generating source, vacuum pumping arrangement and/or cantilevered substrate support
US5863376A (en) 1996-06-05 1999-01-26 Lam Research Corporation Temperature controlling method and apparatus for a plasma processing chamber
US6048798A (en) 1996-06-05 2000-04-11 Lam Research Corporation Apparatus for reducing process drift in inductive coupled plasma etching such as oxide layer
US5788799A (en) 1996-06-11 1998-08-04 Applied Materials, Inc. Apparatus and method for cleaning of semiconductor process chamber surfaces
US5916454A (en) * 1996-08-30 1999-06-29 Lam Research Corporation Methods and apparatus for reducing byproduct particle generation in a plasma processing chamber
KR100296692B1 (ko) 1996-09-10 2001-10-24 사토 도리 플라즈마cvd장치
US6152070A (en) 1996-11-18 2000-11-28 Applied Materials, Inc. Tandem process chamber
US6388226B1 (en) 1997-06-26 2002-05-14 Applied Science And Technology, Inc. Toroidal low-field reactive gas source
KR100311487B1 (ko) 1997-12-16 2001-11-15 김영환 산화막식각방법
US6123791A (en) 1998-07-29 2000-09-26 Applied Materials, Inc. Ceramic composition for an apparatus and method for processing a substrate
US6227140B1 (en) 1999-09-23 2001-05-08 Lam Research Corporation Semiconductor processing equipment having radiant heated ceramic liner
JP3510993B2 (ja) 1999-12-10 2004-03-29 トーカロ株式会社 プラズマ処理容器内部材およびその製造方法
TW514996B (en) 1999-12-10 2002-12-21 Tokyo Electron Ltd Processing apparatus with a chamber having therein a high-corrosion-resistant sprayed film
JP2001250814A (ja) * 2000-03-06 2001-09-14 Hitachi Ltd プラズマ処理装置
TW503449B (en) 2000-04-18 2002-09-21 Ngk Insulators Ltd Halogen gas plasma-resistive members and method for producing the same, laminates, and corrosion-resistant members
US6645585B2 (en) 2000-05-30 2003-11-11 Kyocera Corporation Container for treating with corrosive-gas and plasma and method for manufacturing the same
JP4651166B2 (ja) * 2000-06-30 2011-03-16 京セラ株式会社 耐食性部材
JP2002033309A (ja) * 2000-07-18 2002-01-31 Hitachi Ltd プラズマ処理装置及び該装置用部品の製作方法
TWI290589B (en) 2000-10-02 2007-12-01 Tokyo Electron Ltd Vacuum processing device
US6805952B2 (en) 2000-12-29 2004-10-19 Lam Research Corporation Low contamination plasma chamber components and methods for making the same
US6776873B1 (en) * 2002-02-14 2004-08-17 Jennifer Y Sun Yttrium oxide based surface coating for semiconductor IC processing vacuum chambers

Also Published As

Publication number Publication date
AU2003238006A8 (en) 2004-01-19
US7311797B2 (en) 2007-12-25
TWI328411B (en) 2010-08-01
CN1663017A (zh) 2005-08-31
TW200412827A (en) 2004-07-16
WO2004003962A3 (en) 2004-04-01
AU2003238006A1 (en) 2004-01-19
EP1518255A2 (de) 2005-03-30
EP1518255B1 (de) 2012-02-08
KR20110015676A (ko) 2011-02-16
US20040002221A1 (en) 2004-01-01
US20050150866A1 (en) 2005-07-14
JP2005531157A (ja) 2005-10-13
KR101030935B1 (ko) 2011-04-28
US7300537B2 (en) 2007-11-27
WO2004003962A2 (en) 2004-01-08
KR20050008855A (ko) 2005-01-21
KR101107542B1 (ko) 2012-02-08
JP2010283361A (ja) 2010-12-16

Similar Documents

Publication Publication Date Title
ATE545148T1 (de) Thermischgesprühte, yttriumoxyd enthaltende beschichtung für plasmareaktoren
JP2019094566A (ja) フッ素プラズマに対する保護に適した保護コーティングを有するチャンバ構成要素
DE60306817D1 (de) Metallkorrosionsschutz
JP4796464B2 (ja) 耐食性に優れたアルミニウム合金部材
WO2006017070A3 (en) Protective cotaing on a substrate and method of making thereof
ATE454710T1 (de) Zirkonverstärkte keramische komponenten und beschichtungen bei halbleiterherstellungsgeräten und verfahren zu ihrer herstellung
TW201936389A (zh) 稀土氧化物系抗電漿腐蝕薄膜塗層
WO2010053687A3 (en) Thermal spray coatings for semiconductor applications
GB2419896A (en) Chemical vapor deposition reactor
WO2008018956A3 (en) Coating composition, article, and associated method
KR101249951B1 (ko) 공정 장비의 코팅 방법 및 이를 이용한 코팅 구조
MX9206475A (es) Metodo para recubrir un substrato de metal, para proporcionarle proteccion contra la corrosion
BRPI0501083A (pt) Eletrodoméstico, particularmente eletrodoméstico para cozinhar, e, método para prover uma superfìcie metálica de um eletrodoméstico, particularmente um eletrodoméstico para cozinhar, com um revestimento resistente a temperatura
ATE492656T1 (de) Vorrichtung zum schutz metallischer flächen vor kondensaten korrosiver medien hoher temperatur in technischen anlagen
GB0612399D0 (en) Improvements in coated materials
WO2008127289A3 (en) Materials coatings and methods for self-cleaning and self-decontamination of metal surfaces
SG150492A1 (en) Ceramic cover wafers of aluminum nitride or beryllium oxide
JP2010106327A (ja) 耐食性部材
ATE463837T1 (de) Inline-heizelement zur verwendung bei der chemischen halbleiter-nassbearbeitung und herstellungsverfahren dafür
Tian et al. Role of potassium tolyltriazole as an inhibitor in H2O2-based slurry on Cu/Ru patterned wafer CMP
TW200506036A (en) Production method of substrate with black film and substrate with black film
MXPA03002138A (es) Cubiertas protectoras temporales que contienen superficies hidrofilicas.
TR200102255T2 (tr) Suyla kullanìlan seramik rn ve bu rne y”nelik lekeye diren‡ i‡in kimyasal uygulama y”ntemi
ATE438596T1 (de) Feinlaminare barriereschutzschicht
JP2008274342A (ja) プラズマ耐蝕性材料およびそれを含んでなる部材