WO2019022230A1 - 酸化銅インク及びこれを用いた導電性基板の製造方法、塗膜を含む製品及びこれを用いた製品の製造方法、導電性パターン付製品の製造方法、並びに、導電性パターン付製品 - Google Patents
酸化銅インク及びこれを用いた導電性基板の製造方法、塗膜を含む製品及びこれを用いた製品の製造方法、導電性パターン付製品の製造方法、並びに、導電性パターン付製品 Download PDFInfo
- Publication number
- WO2019022230A1 WO2019022230A1 PCT/JP2018/028238 JP2018028238W WO2019022230A1 WO 2019022230 A1 WO2019022230 A1 WO 2019022230A1 JP 2018028238 W JP2018028238 W JP 2018028238W WO 2019022230 A1 WO2019022230 A1 WO 2019022230A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- copper oxide
- copper
- conductive pattern
- product
- reducing agent
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/06—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/14—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by electrical means
- B05D3/141—Plasma treatment
- B05D3/145—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/03—Printing inks characterised by features other than the chemical nature of the binder
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/03—Printing inks characterised by features other than the chemical nature of the binder
- C09D11/033—Printing inks characterised by features other than the chemical nature of the binder characterised by the solvent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/03—Printing inks characterised by features other than the chemical nature of the binder
- C09D11/037—Printing inks characterised by features other than the chemical nature of the binder characterised by the pigment
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/52—Electrically conductive inks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/02—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
- H01B13/0026—Apparatus for manufacturing conducting or semi-conducting layers, e.g. deposition of metal
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
- H01B13/003—Apparatus or processes specially adapted for manufacturing conductors or cables using irradiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/14—Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q1/00—Details of, or arrangements associated with, antennas
- H01Q1/36—Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith
- H01Q1/38—Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith formed by a conductive layer on an insulating support
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
Definitions
- the present invention relates to a copper oxide ink, a method of manufacturing a conductive substrate using the same, a product including a coating, a method of manufacturing a product using the same, a method of manufacturing a conductive pattern-containing product, and a conductive pattern-containing product About.
- the circuit board has a structure in which conductive wiring is provided on the board.
- the method of manufacturing the circuit board is generally as follows. First, a photoresist is applied on a substrate to which metal foils are bonded. The photoresist is then exposed and developed to obtain the desired negative pattern of the circuit pattern. Next, the metal foil not covered with the photoresist is removed by chemical etching to form a pattern. Thus, a high performance circuit board can be manufactured.
- the conventional method has many steps and is complicated, and has disadvantages such as requiring a photoresist material.
- PE Print Electronics
- Dispersions include metal inks and metal pastes.
- the metal ink is a dispersion in which metal ultrafine particles having an average particle diameter of several to several tens of nanometers are dispersed in a dispersion medium. After the metal ink is applied to a substrate and dried, when it is heat-treated, it is sintered at a temperature lower than the melting point of the metal due to the melting point drop unique to metal ultrafine particles, and a conductive metal film (hereinafter also referred to as a conductive film) Can be formed.
- the metal film obtained using the metal ink has a thin film thickness and is close to a metal foil.
- the metal paste is a dispersion obtained by dispersing metal particles of micrometer size and a binder resin in a dispersion medium. Because of the large size of the microparticles, they are usually supplied at a fairly high viscosity to prevent settling. Therefore, it is suitable for application by screen printing or dispenser suitable for high viscosity materials.
- the metal paste has a feature that it can form a thick metal film because the size of the metal particles is large.
- ITO indium tin oxide
- a copper oxide ultrafine particle is used as a precursor, and in a suitable atmosphere, energy such as heat or actinic ray is used to reduce the copper oxide to copper to form a copper thin film Has been proposed (see, for example, Patent Document 1).
- Patent Document 2 proposes a copper oxide dispersion which exhibits excellent stability with time and can form a conductive film having a fine pattern shape.
- the metal thin film obtained by the PE method using the metal ink and the metal paste is required to have not only a low resistivity but also a small change with time.
- silver paste it is known that silver is susceptible to oxidation in the atmosphere and is oxidized to increase resistivity, so that the resistivity between silver particles is deteriorated with time.
- the dispersion has high dispersion stability with respect to temporal change.
- the present invention has been made in view of the foregoing points, and is a copper oxide ink capable of forming a conductive film having high dispersion stability as ink, excellent storage stability, and low resistance on a substrate, and a conductive substrate using the same. It is an object of the present invention to provide a method for producing a film, a product comprising a coating and a method for producing a product using the same, a method for producing a conductive patterned product, and a conductive patterned product.
- the copper oxide ink according to one aspect of the present invention contains copper oxide, a dispersant, and a reducing agent, the content of the reducing agent is in the range of the following formula (1), and the content of the dispersing agent is as follows: It is characterized by being in the range of Formula (2). 0.00010 ⁇ (mass of reducing agent / mass of copper oxide) ⁇ 0.10 (1) 0.0050 ⁇ (mass of dispersant / mass of copper oxide) ⁇ 0.30 (2)
- the copper oxide ink according to one aspect of the present invention contains cuprous oxide, a dispersant, and a reducing agent, and the dispersant has an acid value of 20 or more and 130 or less, and is a phosphorus-containing organic substance,
- the content of the dispersant is in the range of the following formula (1)
- the reducing agent contains at least one selected from hydrazine and hydrazine hydrate
- the content of the reducing agent is in the range of the following formula (2) It is characterized by being. 0.00010 ⁇ (mass of reducing agent / mass of copper oxide) ⁇ 0.10 (1) 0.0050 ⁇ (mass of dispersant / mass of copper oxide) ⁇ 0.30 (2)
- a product containing the coating film of one embodiment of the present invention contains copper oxide, a dispersant, and a reducing agent, the content of the reducing agent is in the range of the following formula (1), and the content of the dispersing agent Is a range of the following formula (2).
- a product containing the coating film of one embodiment of the present invention contains cuprous oxide, a dispersant, and a reducing agent, and the dispersant has an acid value of 20 or more and 130 or less, and is a phosphorus-containing organic substance.
- the content of the dispersant is in the range of the following formula (1)
- the reducing agent contains at least one selected from hydrazine and hydrazine hydrate
- the content of the reducing agent is the following formula (2) It is characterized by being in the range of 0.00010 ⁇ (mass of reducing agent / mass of copper oxide) ⁇ 0.10 (1) 0.0050 ⁇ (mass of dispersant / mass of copper oxide) ⁇ 0.30 (2)
- the method for producing a conductive substrate according to one aspect of the present invention is characterized by using the above-described copper oxide ink and performing a firing process on a pattern formed on the substrate by generating plasma in an atmosphere containing a reducing gas. Do.
- the method for producing a conductive substrate according to an aspect of the invention includes the steps of forming a coating on the substrate using the above-described copper oxide ink, and irradiating the coating with a laser beam. Do.
- the method for producing a conductive substrate according to one aspect of the present invention includes the steps of: forming a coating on the substrate using the copper oxide ink described above; and irradiating the coating with xenon light. I assume.
- the method for producing a product according to one aspect of the present invention uses a product containing the above-mentioned coating film, and generates a plasma in an atmosphere containing a reducing gas to perform baking treatment on the product to obtain a conductive pattern. It features.
- the method for producing a product according to one aspect of the invention is characterized by including the step of irradiating the product with a laser beam to obtain a conductive pattern, using a product containing the above-mentioned coating film.
- the method for producing a product according to one aspect of the invention is characterized by including the step of irradiating the product with xenon light to obtain a conductive pattern, using a product containing the above-mentioned coating film.
- a conductive pattern-added product comprises a substrate, a first copper oxide-containing layer formed on the surface of the substrate, and a conductive layer formed on the surface of the first copper oxide-containing layer.
- the conductive layer is a wiring having a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less, and the wiring contains reduced copper.
- a conductive pattern-added product comprises a substrate, a first copper oxide-containing layer formed on the surface of the substrate, and a conductive layer formed on the surface of the first copper oxide-containing layer.
- the conductive layer is a wire having a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less, and the wire includes reduced copper, copper and tin.
- the product with a conductive pattern comprises a substrate and a conductive pattern formed on the surface of the substrate, and the conductive pattern is a wire having a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less.
- the wiring contains reduced copper, phosphorus and voids.
- the product with a conductive pattern comprises a substrate and a conductive pattern formed on the surface of the substrate, and the conductive pattern is a wire having a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less.
- the wiring is characterized by containing reduced copper, copper and tin.
- the product with a conductive pattern comprises a substrate and a conductive pattern formed on the surface of the substrate, and the conductive pattern is a wire having a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less.
- the wiring includes reduced copper, copper oxide and phosphorus, and a resin is disposed so as to cover the wiring.
- a conductive film having high dispersion stability, excellent storage stability, and low resistance on a substrate can be formed as an ink.
- FIG. 6A is a photograph of the conductive substrate on which the solder layer according to the present embodiment is formed.
- FIG. 6B is a schematic view of FIG. 6A.
- ⁇ Overview of the copper oxide ink of the present embodiment> By using a copper oxide ink with high dispersion stability and excellent storage stability, handling in the atmosphere can be facilitated, and control of particle size, concentration, viscosity and solvent, and various printing methods are possible. Application, and further, firing on a general-purpose resin substrate can be performed.
- a dispersant is included to prevent aggregation of the nanoparticles.
- the reducing agent is also contained in a small amount.
- a predetermined amount of reducing agent is included.
- reducing agents such as hydrazine
- a reducing agent such as hydrazine also contributes to the storage stability of the copper oxide ink, and the present invention has been completed.
- FIG. 1 is a schematic view showing the relationship between copper oxide and a phosphate ester salt according to the present embodiment.
- FIG. 2 is a schematic cross-sectional view showing the conductive substrate according to the present embodiment.
- the copper oxide ink of the present embodiment is characterized in that the dispersion medium contains (1) copper oxide, (2) a dispersant, and (3) a reducing agent.
- the inclusion of the reducing agent in the copper oxide ink promotes the reduction of copper oxide to copper in the firing and promotes the sintering of copper.
- the “copper oxide ink” is an ink or paste in which copper oxide is dispersed in a dispersion medium.
- the copper oxide ink can also be referred to as a dispersion.
- the "reducing agent” is one having a reducing action on copper oxide and promotes reduction to copper.
- the reducing agent is selected as a substance having a stronger reducing action than the dispersing agent and the dispersing medium.
- the "dispersion medium” functions as a solvent.
- the “dispersion medium” corresponds to two or more of the dispersant, the reducing agent, and the dispersion medium, or in any case, it is defined as a dispersion medium in the present embodiment. Ru.
- the “dispersing agent” contributes to the dispersion in the dispersion medium so that the copper oxides do not aggregate each other.
- the content of the reducing agent satisfies the range of the following formula (1). 0.00010 ⁇ (mass of reducing agent / mass of copper oxide) ⁇ 0.10 (1)
- the storage stability can be further improved by setting the reducing agent content to the above formula (1).
- the storage stability of a copper oxide ink improves that it is 0.10 or less.
- content of a dispersing agent satisfy
- it is 0.050 or more and 0.30 or less, more preferably 0.10 or more and 0.30 or less, still more preferably 0.20 or more and 0.30 or less, and still more preferably 0.20 or more and 0 .25 or less.
- the acid value of a dispersing agent is 20 or more and 130 or less. This improves the dispersion stability of the copper oxide ink. If it is in this range, the average particle diameter of copper oxide can be 3.0 nm or more and 50 nm or less.
- the acid value of the dispersant is more preferably 25 or more and 120 or less, still more preferably 36 or more and 110 or less, and still more preferably 36 or more and 101 or less.
- the dispersion stability is effectively improved.
- baking treatment can be performed using plasma, light, or laser light, an organic substance in copper oxide is decomposed, baking of copper oxide is promoted, and a conductive film with low resistance can be formed. Therefore, it is possible to provide various copper wirings such as a wiring for flowing electricity, heat radiation, an electromagnetic wave shield, a circuit, and the like.
- copper oxide has antibacterial and antifungal properties.
- the particle diameter of the copper oxide in the above-described range, low-temperature firing can be performed, and copper produced by reduction can be easily sintered.
- the baking treatment can be performed using plasma, light, or laser light, the organic substance in the copper oxide is decomposed, the baking of the copper oxide is promoted, and a conductive film having low resistance can be formed, and the dispersion stability is achieved. Improve.
- copper oxide is cuprous oxide. Thereby, the reduction of copper oxide is facilitated, and the copper produced by the reduction can be easily sintered.
- the copper oxide ink of the present embodiment includes the following configuration.
- A Containing cuprous oxide, a dispersant, and a reducing agent.
- the dispersant has an acid value of 20 or more and 130 or less, is a phosphorus-containing organic substance, and the content of the dispersant is within the range of the following formula (2).
- C The reducing agent contains at least one selected from hydrazine and hydrazine hydrate, and the content of the reducing agent is in the range of the following formula (1). 0.00010 ⁇ (mass of reducing agent / mass of copper oxide) ⁇ 0.10 (1) 0.0050 ⁇ (mass of dispersant / mass of copper oxide) ⁇ 0.30 (2)
- dispersion stability improves because a dispersing agent is a phosphorus containing organic substance.
- the copper oxide ink of the present embodiment it is preferable that the copper oxide further contains a dispersing medium, a dispersing agent, a reducing agent, and a dispersing agent.
- the dispersion medium preferably has the following configuration.
- the dispersion medium is a monoalcohol having 7 or less carbon atoms, and the content of the dispersion medium in the copper oxide ink is 30% by mass or more and 95% by mass or less.
- This configuration enables low temperature firing.
- the baking treatment can be performed using plasma, light, or laser light, the organic substance in the copper oxide is decomposed, the baking of the copper oxide is promoted, and a conductive film having low resistance can be formed, and the dispersion stability is achieved. Improve.
- a phosphate ester salt 3 which is an example of a phosphorus-containing organic substance as a dispersing agent is inside phosphorus 3a.
- it surrounds the ester salt 3b outward. Since phosphoric acid ester salt 3 exhibits electrical insulation, electrical conduction between adjacent copper oxides 2 is hindered.
- the phosphate ester salt 3 suppresses aggregation of the copper oxide ink 1 by the steric hindrance effect.
- the copper oxide 2 is a semiconductor, is conductive, and is covered with the phosphate ester salt 3 exhibiting electrical insulation, the copper oxide ink 1 exhibits electrical insulation, and the cross-sectional view (FIG. 2)
- the insulation between conductive pattern regions (described later) adjacent to both sides of the copper oxide ink 1 can be secured in the cross section along the vertical direction shown).
- the conductive pattern area is irradiated with light to a partial area of the coating layer containing copper oxide and a phosphorus-containing organic substance to reduce copper oxide to copper in the partial area. Copper in which copper oxide is reduced in this manner is called reduced copper. Moreover, in the said some area
- conductive pattern region a region having excellent electrical conductivity
- the phosphorus element In the conductive pattern area, the phosphorus element remains in the reduced copper.
- the phosphorus element is present as at least one of a phosphorus element alone, a phosphorus oxide, and a phosphorus-containing organic substance.
- the remaining phosphorus element is segregated and present in the conductive pattern area, and there is no possibility that the resistance of the conductive pattern area will be increased.
- copper oxide is used as one of the metal oxide components.
- cuprous oxide Cu 2 O
- metal oxides it is easy to reduce, and it is easy to sinter by using fine particles, and it is also inexpensive in terms of cost, so it is inexpensive compared to noble metals such as silver, etc. against migration. It is because it is advantageous.
- the preferable range of the average particle diameter of the copper oxide particles is 3.0 nm or more and 50 nm or less, more preferably 5.0 nm or more and 40 nm or less, and further preferably 10 nm or more and 29 nm or less.
- the average particle size is 50 nm or less, low temperature baking is possible, and the versatility of the substrate is expanded. In addition, it is preferable because the fine pattern tends to be easily formed on the substrate.
- it is used for a copper oxide ink as it is 3.0 nm or more, since dispersion stability is good and the long-term storage stability of a copper oxide ink improves, it is preferable. In addition, uniform thin films can be produced.
- the average particle size is a particle size when dispersed in a copper oxide ink, and is a value measured by the cumulant method using FPAR-1000 manufactured by Otsuka Electronics. That is, the particle diameter is not limited to the primary particle diameter, and may be the secondary particle diameter.
- the polydispersity is preferably in the range of 0.10 or more and 0.40 or less, and more preferably 0.20 or more and 0.30 or less. Within this range, the film forming property is good and the dispersion stability is also high.
- cuprous oxide a commercially available product may be used or may be synthesized and used.
- Commercially available products include those having an average primary particle diameter of 5 to 50 nm manufactured by Rare Metals Research Institute Co., Ltd. The following methods may be mentioned as synthetic methods.
- (1) Add water and a copper acetylacetonato complex in a polyol solvent, heat and dissolve the organic copper compound once, then add water necessary for the reaction, add temperature, and then raise the temperature to reduce the reduction temperature of organic copper Method of heating and reducing by heating.
- a method of reducing a copper salt dissolved in an aqueous solution with hydrazine is preferable because the operation is simple and a cuprous oxide having a small average particle size can be obtained.
- the reducing agent content in the copper oxide ink can be controlled, and the storage stability of the copper oxide ink can be further improved.
- the synthesis solution and cuprous oxide are separated, and a known method such as centrifugation may be used.
- the obtained cuprous oxide is dispersed by stirring with a known method such as a homogenizer, etc. by adding a dispersant and a dispersion medium described later.
- a dispersant such as hydrazine contained in the obtained cuprous oxide due to oxygen or water.
- the dispersion having copper oxide thus obtained may be mixed with copper particles or the like by the method described later, and the copper oxide ink of the present embodiment can be obtained. This copper oxide ink is used for printing and application.
- the dispersion medium is preferably a monoalcohol having 7 or less carbon atoms.
- the content of the dispersion medium in the copper oxide ink is preferably 30% by mass or more and 95% by mass or less. This enables low temperature firing.
- the baking treatment can be performed using plasma, light, or laser light, the organic substance in the copper oxide is decomposed, the baking of the copper oxide is promoted, and a conductive film having low resistance can be formed, and the dispersion stability is achieved. Improve.
- the dispersant in this case enhances the dispersibility of copper oxide in the copper ink.
- phosphorus containing organic substance is mentioned, for example.
- the phosphorus-containing organic substance may be adsorbed to copper oxide, and in this case, aggregation is suppressed by the steric hindrance effect.
- the phosphorus-containing organic substance is a material that exhibits electrical insulation in the insulating region.
- the phosphorus-containing organic substance may be a single molecule or a mixture of multiple types of molecules.
- the number average molecular weight of the dispersant is not particularly limited, but is preferably, for example, 300 to 300,000. When it is 300 or more, the insulation property is excellent, the dispersion stability of the obtained copper oxide ink tends to increase, and when it is 300,000 or less, it is easy to be fired.
- a phosphoric acid ester of a high molecular weight copolymer having a group having an affinity to copper oxide is preferable.
- the structure of the chemical formula (1) is preferable because it adsorbs to copper oxide, particularly cuprous oxide, and also has excellent adhesion to a substrate.
- the following compounds can be used as a phosphorus containing organic compound. Phosphines, phosphine oxides, phosphonates, phosphites, phosphates and the like can be used.
- l is an integer of 1 to 20, preferably an integer of 1 to 15, more preferably an integer of 1 to 10
- m is an integer of 1 to 20, preferably an integer of 1 to 15,
- n is an integer of 1 to 20, preferably an integer of 1 to 15, and more preferably an integer of 1 to 10.
- the dispersant the following known ones can be used in addition to those described above, for example, salts of long-chain polyaminoamide and polar acid ester, unsaturated polycarboxylic acid polyaminoamide, polyaminoamide polycarboxylate, long Examples include polymers having a basic group such as chain polyaminoamide and a salt of an acid polymer. Other examples include alkyl ammonium salts, amine salts and amidoamine salts of polymers such as acrylic polymers, acrylic copolymers, modified polyester acids, polyether ester acids, polyether carboxylic acids and polycarboxylic acids. As such a dispersing agent, those commercially available can also be used.
- Examples of the commercially available products include DISPERBYK (registered trademark) -101, DISPERBYK-102, DISPERBYK-110, DISPERBYK-111, DISPERBYK-112, DISPERBYK-118, DISPERBYK-130, DISPERBYK-130, DISPERBYK-140, DISPERBYK-142, DISPERBYK- 145, DISPERBYK-160, DISPERBYK-161, DISPERBYK-162, DISPERBYK-163, DISPERBYK-2155, DISPERBYK-2163, DISPERBYK-2164, DISPERBYK-180, DISPERBYK-2000, DISPERBYK-2000, DISPERBYK-2025, DISPERBYK-2163, DISPERBYK-21 4, BYK- 9076, BYK- 9077, TERRA-204, TERRA-U (abo
- the phosphorus-containing organic substance is easily decomposed or evaporated by light or heat.
- the residue of the organic substance hardly remains after baking, and a conductive pattern region with low resistivity can be obtained.
- the decomposition temperature of the phosphorus-containing organic substance is not limited, but is preferably 600 ° C. or less, more preferably 400 ° C. or less, and still more preferably 200 ° C. or less.
- the boiling point of the phosphorus-containing organic substance is not limited, but is preferably 300 ° C. or less, more preferably 200 ° C. or less, and still more preferably 150 ° C. or less.
- the absorption characteristic of the phosphorus-containing organic substance is not limited, it is preferable that it can absorb light used for firing.
- a phosphorus-containing organic substance that absorbs light having an emission wavelength of, for example, 355 nm, 405 nm, 445 nm, 450 nm, 532 nm, 1056 nm.
- the wavelengths are 355 nm, 405 nm, 445 nm, 450 nm, 532 nm.
- the required amount of dispersant is proportional to the amount of copper oxide and adjusted in consideration of the required dispersion stability.
- the mass ratio (dispersant mass / copper oxide mass) of the dispersant contained in the copper oxide ink of the present embodiment is not less than 0.0050 and not more than 0.30, preferably not less than 0.050 and not more than 0.30. More preferably, they are 0.10 or more and 0.30 or less, more preferably 0.20 or more and 0.30 or less, and still more preferably 0.20 or more and 0.25 or less.
- the amount of the dispersant affects the dispersion stability, and a smaller amount tends to cause aggregation, and a larger amount tends to improve the dispersion stability.
- the content of the dispersant in the copper oxide ink of the present embodiment is 35 mass% or less, in the conductive film obtained by firing, the influence of the residue derived from the dispersant can be suppressed, and the conductivity can be improved.
- the acid value (mg KOH / g) of the dispersant is preferably 20 or more and 130 or less.
- the acid value of the dispersant is more preferably 25 or more and 120 or less, still more preferably 36 or more and 110 or less, and still more preferably 36 or more and 101 or less.
- the dispersion stability is excellent, which is preferable. It is particularly effective in the case of copper oxide having a small average particle size.
- "DISPERBYK-102" (acid number 101), "DISPERBYK-140” (acid number 73), “DISPERBYK-142” (acid number 46), “DISPERBYK-145" (acid number) manufactured by BIC CHEMICAL CO., LTD. 76), "DISPERBYK-118" (acid number 36), “DISPERBYK-180 (acid number 94), and the like.
- the difference between the amine value (mg KOH / g) of the dispersant and the acid value (amine value-acid value) is preferably -50 or more and 0 or less.
- the amine value indicates the total amount of free base and base
- the acid number indicates the total amount of free fatty acid and fatty acid.
- the amine value and the acid value are measured by the method according to JIS K 7700 or ASTM D 2074. If it is -50 or more and 0 or less, it is preferable because the dispersion stability is excellent. More preferably, it is ⁇ 40 or more and 0 or less, and still more preferably ⁇ 20 or more and 0 or less.
- the amine value and the acid value of the dispersant contained in the copper oxide ink can be measured by the following method.
- the components of the copper oxide ink are separated by liquid chromatography or the like, and the amine value and the acid value can be measured by the above-mentioned method.
- the reducing agent of the present invention reduces copper oxide to copper. This copper is called reduced copper.
- reducing agent hydrazine, hydrazine hydrate, hydrazine derivative, sodium, carbon, potassium iodide, oxalic acid, iron (II) sulfide, sodium thiosulfate, ascorbic acid, tin (II) chloride, hydrogenated diisobutylaluminum, Formic acid, sodium hydride borate, sulfite and the like can be mentioned. From these materials, it is preferable to include at least one. Thereby, the storage stability of copper oxide is improved, and the reduction is promoted, whereby the resistance of the conductive film is reduced.
- the hydrazine derivatives include hydrazine salts, alkyl hydrazines, pyrazoles, triazoles, hydrazides and the like.
- Hydrazine salts include hydrazine monohydrochloride, hydrazine dihydrochloride, hydrazine monohydrobromide, hydrazine carbonate, etc.
- Pyrazoles include 3,5-dimethylpyrazole, 3-methyl-5-pyrazolone, etc.
- hydrazides include adipic acid dihydrazide, sebacic acid dihydrazide, dodecanediohydrazide, isophthalic acid dihydrazide, isophthalic acid dihydrazide, propionic acid hydrazide, salicylic acid hydrazide, 3-hydroxy-2-naphthoic acid hydrazide, benzophenone hydrazone and the like.
- the reducing agent is most preferably hydrazine or hydrazine hydrate. Further, by using hydrazine or hydrazine hydrate, the storage stability of copper oxide is improved, and the reduction is promoted, whereby the resistance of the conductive film is lowered.
- hydrazine hydrate may be used as a raw material, and it may be detected as hydrazine in a copper oxide ink as a resultant.
- the form of hydrazine contained in the raw material and the copper oxide ink as a resultant product or the coating film using the copper oxide ink may be different. The same applies to the case where a reducing agent other than hydrazine is used.
- the necessary amount of reducing agent is proportional to the amount of copper oxide and adjusted in consideration of the required reducibility.
- the mass ratio (reducing agent mass / copper oxide mass) of the reducing agent contained in the copper oxide ink of the present embodiment is preferably 0.00010 to 0.10, more preferably 0.0010 to 0.050, More preferably, it is 0.0010 or more and 0.030 or less, more preferably 0.0020 or more and 0.030 or less, and still more preferably 0.0040 or more and 0.030 or less.
- the mass ratio of the reducing agent is 0.00010 or more, the storage stability is improved, and the reduction further progresses to reduce the resistance of the copper film.
- the storage stability can be further improved by setting the reducing agent content to the above formula (1).
- the long-term stability of a copper oxide ink improves that it is 0.10 or less.
- the copper oxide ink contains a reducing agent such as hydrazine.
- the reducing agent is added to the copper oxide ink in the range of the above-mentioned formula (1) by adjusting the time and temperature conditions as described later, for example, in combination with an inert atmosphere such as a nitrogen atmosphere.
- Reductant can be included.
- the copper oxide ink of the present embodiment may contain a dispersion medium (solvent) in addition to the above-described components.
- the dispersion medium used in the present embodiment is selected from those which can dissolve the dispersant from the viewpoint of dispersion.
- the volatility of the dispersion medium affects the workability, so it is suitable for the method of forming a conductive pattern, for example, a printing or coating method. It needs to be. Therefore, the dispersion medium may be selected from the following solvents in accordance with the dispersibility and the workability of printing and coating.
- the following solvents can be mentioned as specific examples of the dispersion medium.
- Alcohol, glycol, glycol ether, and glycol esters solvents can be used as the dispersion medium other than those specifically described in these. These may be used alone or in combination of two or more, and are selected in consideration of the evaporation property and the solvent resistance of the printing equipment and the substrate to be printed according to the printing method.
- water or a monoalcohol having 10 or less carbon atoms is more preferable, and more preferably 7 or less carbon atoms.
- monoalcohols having 7 or less carbon atoms ethanol, n-propanol, i-propanol, n-butanol, i-butanol, sec-butanol and t-butanol are particularly preferable since dispersibility, volatility and viscosity are particularly suitable. .
- These monoalcohols may be used alone or in combination of two or more.
- the carbon number of the monoalcohol is preferably 7 or less in order to suppress the decrease in the dispersibility of copper oxide and also to disperse more stably due to the interaction with the dispersant. Further, when the number of carbon atoms is 7 or less, the resistance value is preferably lowered.
- the boiling point affects the workability of the copper oxide ink. If the boiling point is too low, the volatilization is fast, and the workability deteriorates due to the increase of defects due to the precipitation of solids and the increase of the frequency of cleaning.
- the boiling point is 40 ° C. or more
- the inkjet method, the screen method, the offset method is 120 ° C. or more, more preferably 150 ° C. or more, more preferably 200 ° C. or more. 300 degrees C or less is preferable from a viewpoint of.
- the content of the dispersion medium is preferably 30% by mass or more and 95% by mass or less, more preferably 40% by mass or more and 95% by mass or less, and further preferably 50% by mass or more and 90% by mass or less Preferably, 50% by weight or more and 70% by weight or less is the most preferable.
- the copper oxide ink has a characteristic part in containing a predetermined amount of a reducing agent such as hydrazine.
- a reducing agent such as hydrazine.
- the first method is a method of adding a reducing agent to copper oxide.
- This is a method of adding a reducing agent to a mixture (dispersion) of a composition such as copper oxide, a dispersing agent, and optionally a dispersion medium.
- the reducing agent may be added simultaneously with each element, or may be one of the elements added in order.
- it is preferable to add a reducing agent. For example, when concentration and dilution with a UF membrane module are repeated between (d) in FIG. 3 and (e) in FIG. 3 to be described later, the solvent is replaced, and a dispersion containing copper oxide fine particles is obtained.
- the reducing agent can be added to the dispersion to adjust the reducing agent content.
- the second method is a method in which a reducing agent, which is added for reduction of copper acetate when copper oxide is produced from copper acetate as described above, is also used in the ink. At this time, it is preferable to control by reaction temperature and reaction time. Usually, when copper oxide is produced from copper acetate, depending on the reaction temperature and reaction time, the reducing agent is consumed. In addition, when the reducing agent remains, it is positively removed by repeating concentration dilution. On the other hand, in this method, the reducing agent content is controlled by appropriately selecting the reaction temperature and the reaction time, and the concentration and dilution using a solvent are not performed, and the unreacted reducing agent is used as it is in the ink It is.
- hydrazine is very unstable, so it is preferable to carry out the reaction system from copper acetate to copper under an inert atmosphere such as nitrogen, and also to carry out stirring in a nitrogen atmosphere. The procedure is described in detail below.
- the present embodiment is characterized in that a reducing agent such as hydrazine is used as a reactant for particle synthesis, and the reducing agent is left after reaction.
- a reducing agent such as hydrazine is added to a solution in which copper acetate is dissolved, for example, for a first period of time under a nitrogen atmosphere, and stirred for a second period of time under a nitrogen atmosphere.
- cuprous oxide It is preferable to adjust to a predetermined temperature during the first time and the second time. Thereafter, the supernatant liquid and the precipitate containing cuprous oxide are separated by centrifugation etc., and a dispersant etc. is added to the obtained precipitate, and dispersed using a homogenizer under a nitrogen atmosphere, and copper oxide ink is obtained obtain.
- the first time for charging the above-mentioned reducing agent is preferably about 5.0 minutes to 60 minutes.
- the temperature for the first time is preferably ⁇ 10 ° C. to 10 ° C.
- the second time for stirring be about 30 minutes to about 120 minutes.
- the predetermined temperature at the time of stirring is preferably 10 ° C to 40 ° C.
- the temperature can be changed halfway by using an external temperature controller or the like.
- the dispersion treatment method is preferably a homogenizer, but is not limited to a homogenizer, and may be, for example, an ultrasonic wave, a ball mill, a bead mill, or a mixer.
- the dispersion when a dispersion containing copper oxide, a dispersant, a reducing agent, and the like is stirred and dispersed by a known method such as a homogenizer, the dispersion is performed under an inert atmosphere such as a nitrogen atmosphere.
- the inert atmosphere is preferably a nitrogen atmosphere, but may be an argon atmosphere or a helium atmosphere other than the nitrogen atmosphere.
- the inert gas may be stirred and dispersed in an atmosphere containing a plurality of such inert gases.
- a reducing agent such as hydrazine may be added, for example, when adding the dispersing agent to the obtained precipitate as described above, or after obtaining a copper oxide ink It is. Thereby, the reducing agent content can be adjusted with high accuracy. At this time, the cuprous oxide contained in the copper oxide ink may be the precipitate or a commercially available product.
- reducing agents such as a hydrazine of Formula (1) described above, can be included.
- hydrazine, a hydrazine derivative or hydrazine hydrate be used as the reducing agent.
- These hydrazines may also contain other reducing agents.
- the reducing agent content of the formula (1) is contained by adjusting according to the adjusting method of the reducing agent mentioned above. Can.
- the surrogate method makes it possible to quantify the reducing agent.
- benzaldehyde is reacted with a reducing agent such as hydrazine, derivatized, and quantified by gas chromatography.
- a reducing agent such as hydrazine
- reducing agents such as hydrazine may be decomposed by oxygen in the atmosphere during the quantitative operation, making it difficult to quantify the reducing agents. Therefore, in the pretreatment of quantification, the inventors ionized copper oxide with an acid to eliminate the inhibition factor of quantification.
- it has become possible to quantify the reductant, which was difficult to quantify by using a surrogate substance to correct the dispersion of decomposition of the reductant such as hydrazine during the quantification operation.
- a dispersion containing cuprous oxide and copper particles is prepared by mixing the above-described copper oxide dispersion with copper fine particles, if necessary, a dispersion medium at a predetermined ratio, for example, a mixer method,
- the dispersion can be adjusted by using a sonication method, a three-roll method, a two-roll method, an attritor, a homogenizer, a Banbury mixer, a paint shaker, a kneader, a ball mill, a sand mill, a revolution mixer, or the like.
- the dispersion medium may be the same as or different from that added at the time of preparation of the copper oxide dispersion described above.
- an organic binder an antioxidant, a reducing agent, metal particles, and a metal oxide may be added, and as impurities, a metal, a metal oxide, a metal salt, and a metal complex may be included.
- wire-like, dendritic, and scaly copper particles have a large crack preventing effect, they may be added singly or in combination with a plurality of copper particles such as spheres, dices and polyhedrons or other metals. It may be coated with metal or another conductive metal such as silver.
- metal particles other than copper and having a wire-like, dendritic or scaly shape When one or more of metal particles other than copper and having a wire-like, dendritic or scaly shape is added, it has the same crack preventing effect as copper particles having similar shapes, and therefore copper particles having similar shapes may be used. It may be used in place of parts or in addition to copper particles of similar shape, but it is necessary to consider migration, particle strength, resistance value, copper corrosion, formation of intermetallic compounds, cost and the like.
- metal particles other than copper include gold, silver, tin, zinc, nickel, platinum, bismuth, indium and antimony.
- cuprous oxide can be used by replacing or adding silver oxide, cupric oxide and the like.
- metal particles it is necessary to consider migration, particle strength, resistance value, copper corrosion, formation of intermetallic compounds, cost and the like.
- the addition of these metal particles and metal oxide particles can be used to adjust the sintering of the conductive film, the resistance, the strength of the conductor, the absorbance during light baking, and the like. Even when these metal particles and metal oxide particles are added, cracks are sufficiently suppressed by the presence of wire-like, dendritic and scaly copper particles.
- These metal particles and metal oxide particles may be used alone or in combination of two or more kinds, and there is no limitation on the shape. For example, silver and silver oxide are expected to have effects such as a decrease in resistance and a decrease in firing temperature.
- silver is a noble metal, and from the viewpoint of cost increase and crack prevention, the addition amount of silver is preferably in a range not exceeding the wire-like, dendritic and scaly copper particles.
- tin is advantageous in that it is inexpensive and has a low melting point and thus is easy to sinter.
- the resistance tends to increase, and from the viewpoint of preventing cracks, the addition amount of tin is preferably in the range not exceeding the wire-like, dendritic, scaly copper particles and cuprous oxide.
- Cupric oxide works as a light absorber and a heat ray absorber in a method using light such as a flash lamp or a laser or infrared rays.
- cupric oxide is more difficult to reduce than cuprous oxide, and from the viewpoint of preventing peeling from the substrate due to a large amount of gas generation during reduction, the amount of cupric oxide added is smaller than that of cuprous oxide Is preferred.
- the crack preventing effect and the temporal stability improving effect of resistance It is exhibited.
- metal other than copper and copper particles other than wire, dendritic, scaly, and metal oxides other than copper oxide it is preferable to be less than wire, dendritic, scaly copper particles and copper oxide Is preferred.
- the present inventors have developed a product including a coating film using the above-described copper oxide ink. That is, the component which comprises a copper oxide ink is contained as a component of a coating film. Therefore, the coating film has the following constitution.
- the coating film contains a reducing agent such as hydrazine together with copper oxide and a dispersing agent.
- a reducing agent such as hydrazine together with copper oxide and a dispersing agent.
- the mass ratio (reducing agent mass / copper oxide mass) of the reducing agent is 0.00010 or more and 0.10 or less.
- the mass ratio of the dispersant (dispersant mass / copper oxide mass) is not less than 0.0050 and not more than 0.30.
- the presence of a reducing agent such as hydrazine in the coating film contributes to the reduction of copper oxide in baking, and a copper film with lower resistance can be produced.
- the mass ratio (reducing agent mass / copper oxide mass) of the reducing agent described in the above (F) is more preferably 0.0010 or more and 0.050 or less, more preferably 0.0010 or more and 0.030 or less, and still more preferably It is 0.0020 or more and 0.030 or less, and more preferably 0.0040 or more and 0.030 or less.
- the mass ratio of the reducing agent is 0.00010 or more, the storage stability is improved and the reduction proceeds, so the resistance of the conductive film obtained by firing the coating film is reduced. Moreover, the stability of the resistance as a conductive film improves that it is 0.10 or less.
- the mass ratio of the dispersant described in the above (G) is more preferably 0.050 or more and 0.30 or less, and still more preferably 0.10 or more and 0.30 or less. Still more preferably 0.20 or more and 0.30 or less, and still more preferably 0.20 or more and 0.25 or less.
- the amount of the dispersant affects the dispersion stability, and a smaller amount tends to cause aggregation, and a larger amount tends to improve the dispersion stability.
- the dispersibility of copper oxide in a coating film can be improved.
- the content of the dispersant in the coating film of the present embodiment is 35% by mass or less, in the conductive film obtained by firing, the influence of the residue derived from the dispersant can be suppressed, and the conductivity can be improved.
- the acid value (mg KOH / g) of the dispersant is preferably 20 or more and 130 or less, more preferably 25 or more and 120 or less, still more preferably 36 or more and 110 or less, and still more preferably 36 or more and 101 or less. Within this range, the dispersion stability is excellent, which is preferable. It is particularly effective in the case of copper oxide having a small average particle size.
- the dispersant specifically, “DISPERBYK-102” (acid number 101), “DISPERBYK-140” (acid number 73), “DISPERBYK-142” (acid number 46), “DISPERBYK-” manufactured by BIC CHEMICAL CO., LTD. 145 "(acid number 76)," DISPERBYK-118 "(acid number 36),” DISPERBYK-180 (acid number 94) and the like.
- the average particle diameter of the fine particles containing cuprous oxide in the coating film is 3.0 nm or more and 50 nm or less, more preferably 5.0 nm or more and 40 nm or less, and most preferably 10 nm or more and 29 nm or less.
- An average particle diameter of 50 nm or less is preferable because it tends to easily form a fine pattern on a substrate. If the average particle diameter is 3.0 nm or more, the stability of the resistance as a coating film can be improved.
- reducing agent in the coating
- reducing agent hydrazine, hydrazine hydrate, hydrazine derivative, sodium, carbon, potassium iodide, oxalic acid, iron (II) sulfide, sodium thiosulfate, ascorbic acid, tin (II) chloride, hydrogenated diisobutylaluminum, Formic acid, sodium hydride borate, sulfite and the like
- the hydrazine derivatives include hydrazine salts, alkyl hydrazines, pyrazoles, triazoles, hydrazides and the like.
- Hydrazine salts include hydrazine monohydrochloride, hydrazine dihydrochloride, hydrazine monohydrobromide, hydrazine carbonate, etc.
- Pyrazoles include 3,5-dimethylpyrazole, 3-methyl-5-pyrazolone, etc.
- hydrazides include adipic acid dihydrazide, sebacic acid dihydrazide, dodecanediohydrazide, isophthalic acid dihydrazide, isophthalic acid dihydrazide, propionic acid hydrazide, salicylic acid hydrazide, 3-hydroxy-2-naphthoic acid hydrazide, benzophenone hydrazone and the like.
- the reducing agent is most preferably hydrazine or hydrazine hydrate.
- the storage stability of the copper oxide ink can be maintained, and the reduction can proceed, so that the resistance of the conductive film can be lowered as a result.
- the coating film of the present embodiment can be produced on various materials such as a film substrate, a glass substrate, a molded product, and processed products. Another resin layer may be overlaid on the present membrane.
- the product containing the coating film of this Embodiment contains the following structures.
- the dispersant has an acid value of 20 or more and 130 or less, is a phosphorus-containing organic substance, and the content of the dispersant is within the range of the following formula (1):
- the reducing agent contains at least one selected from hydrazine and hydrazine hydrate, and the content of the reducing agent is in the range of the following formula (2). 0.00010 ⁇ (mass of reducing agent / mass of copper oxide) ⁇ 0.10 (1) 0.0050 ⁇ (mass of dispersant / mass of copper oxide) ⁇ 0.30 (2)
- the product containing the coating film of the present embodiment it is preferable to further contain a dispersion medium, cuprous oxide, a dispersant, a reducing agent, and the like.
- the dispersion medium preferably has the following configuration.
- the dispersion medium is a monoalcohol having 7 or less carbon atoms, and the content of the dispersion medium in the copper oxide ink is 30% by mass or more and 95% by mass or less.
- This configuration enables low temperature baking of the coating.
- the baking treatment can be performed using plasma, light, or laser light, the organic substance in the copper oxide is decomposed, the baking of the copper oxide is promoted, and a conductive film having low resistance can be formed, and the dispersion stability is achieved. Improve.
- the present inventors have conducted to develop a conductive substrate having excellent conductivity by using the above-described copper oxide ink. That is, the conductive substrate can be obtained by baking the pattern or the coating film formed using the copper oxide ink of the present embodiment.
- a conductive substrate shown in FIG. 2A can be obtained by forming a coating on the substrate with the above-described copper oxide ink and baking the copper oxide particles of the copper oxide ink by laser irradiation.
- the conductive substrate of FIG. 2B can be obtained.
- the conductive substrate 10 is reduced by baking the insulating region 12 containing copper oxide and a phosphorus-containing organic substance on the surface constituted by the substrate 11 and the substrate 11, and the copper oxide in a sectional view.
- the conductive pattern area 13 containing reduced copper may have a layer 14 disposed adjacent to each other.
- Conductive pattern region 13 constitutes a copper wiring.
- the conductive pattern area 13 contains a phosphorus element derived from a phosphorus-containing organic substance as a dispersant. Since the conductive pattern area 13 is formed by firing a copper oxide ink as a dispersion, a conductive pattern area 13 obtained by decomposition of an organic substance such as an organic binder contained in the copper oxide ink in the step of firing is obtained.
- the insulating region 12 preferably contains copper oxide, a phosphorus-containing organic substance as a dispersant, and hydrazine as a reducing agent, or hydrazine hydrate.
- the conductive substrate 10 may have a substrate 11 and a conductive pattern region 13 containing reduced copper on the surface of the substrate 11 in a cross sectional view.
- Conductive pattern region 13 constitutes a copper wiring.
- the conductive pattern area 13 preferably contains a phosphorus element.
- the organic matter such as the organic binder contained in the copper oxide ink is effectively decomposed in the step of firing the copper oxide ink, the wettability of the solder is effectively effective in the conductive pattern area 13. Become high. Therefore, a solder layer can be more easily formed on the surface of the conductive pattern area 13.
- the conductive pattern region 13 may partially contain, for example, cuprous oxide as copper oxide particles that are not reduced in the firing step.
- the conductive pattern area 13 may contain copper particles of a copper oxide ink as well as reduced copper, and may contain tin.
- the insulating region 12 and the conductive pattern region 13 may contain a void. By the presence of a void (air gap) in the conductive pattern area 13, the solder enters therein, and the adhesion between the conductive pattern area 13 and the solder layer is improved. By the way, solder means metal containing tin.
- the electrical conductivity, the particle state (fired and unfired), and the like gradually change along the surface of the substrate.
- a boundary may exist between the insulating region 12 and the conductive pattern region 13.
- cuprous oxide as copper oxide particles not reduced in the step of baking is contained in the surface of the substrate 11;
- the copper-containing layer 17 may be formed.
- a conductive layer 18 containing reduced copper obtained by reducing copper oxide particles is formed.
- the adhesion between the substrate 11 and the conductive layer 18 is improved by forming the first copper oxide-containing layer 17, which is preferable.
- the layer thickness of the cuprous oxide-containing layer 17 is preferably 0.0050 ⁇ m or more and 8.0 ⁇ m or less, more preferably 0.050 ⁇ m or more and 5.0 ⁇ m or less from the viewpoint of the adhesion between the substrate 11 and the conductive layer 18
- 0.10 ⁇ m or more and 3.0 ⁇ m or less are further more preferable, and 0.20 ⁇ m or more and 1.0 ⁇ m or less are particularly preferable.
- the conductive layer 18 may contain copper particles (Cu 3 P 4 ) of a copper oxide ink together with reduced copper (Cu) obtained by reducing copper oxide particles.
- the conductive layer 18 may also contain a void.
- the presence of voids in the conductive layer 18 causes tin (Sn) contained in the solder to enter the voids. Thereby, the adhesion between the conductive layer 18 and the solder layer is improved.
- the presence of reduced copper (Cu) around copper (Cu 3 P 4 ) further increases the adhesion between the conductive layer 18 and tin (Sn).
- the particle diameter of reduced copper (Cu) at this time is preferably 5 to 20 nm.
- the grain size of copper contained in conductive pattern region 13 and conductive layer 18 is preferably 0.10 ⁇ m to 100 ⁇ m, more preferably 0.50 ⁇ m to 50 ⁇ m, and 1.0 ⁇ m to 10 ⁇ m. Particularly preferred.
- the grain size refers to the size of the metal after firing.
- the surface roughness (arithmetic average roughness Ra) of the surfaces of the conductive pattern area 13 and the conductive layer 18 is preferably 20 nm to 500 nm, more preferably 50 nm to 300 nm, and still more preferably 50 nm to 200 nm.
- the solder layer easily adheres to the conductive pattern area 13 and the conductive layer 18, and the adhesion between the conductive pattern area 13 and the conductive layer 18 and the solder layer becomes high.
- the resin layer is formed to overlap the conductive pattern area 13 and the conductive layer 18, a part of the resin layer intrudes into the concavo-convex portion on the surface of the conductive pattern area 13 and the conductive layer 18, and adhesion is achieved. Can be improved.
- a wire having a line width of 0.10 ⁇ m or more and 1.0 cm or less can be drawn, and can be used as a copper wire or an antenna. It is more preferable that the line width of the conductive pattern area 13 or the conductive layer 18 be 0.50 ⁇ m or more and 10000 ⁇ m or less, taking advantage of the characteristics of the nanoparticles of copper oxide particles contained in the above-described copper oxide ink.
- the line width is 5.0 ⁇ m or less, the conductive pattern area 13 or the conductive layer 18 as a wiring can not be visually recognized, which is preferable from the viewpoint of design.
- the conductive pattern may be formed in a mesh shape.
- the mesh shape is a grid-like wiring, which is preferable because the transmittance is high and it becomes transparent.
- the substrate used in the present embodiment has a surface on which a coating of copper oxide ink is to be formed, and may have a plate shape or may be a three-dimensional object.
- the conductive pattern can also be formed on a surface including a curved surface, a step, or the like formed by a three-dimensional object.
- the substrate in the present embodiment means a substrate material of a circuit board sheet for forming a wiring pattern, a casing material of a casing with a wire, or the like.
- a light transmissive resin layer (not shown) may be provided to cover the layer 14 or the conductive pattern area 13.
- the resin layer can prevent the coating film from being exposed to oxygen at the time of light irradiation and can promote reduction of copper oxide in the method for producing the conductive substrate 10 described later. This eliminates the need for equipment for making the periphery of the coating film an oxygen-free or low-oxygen atmosphere at the time of light irradiation, for example, a vacuum atmosphere or an inert gas atmosphere, thereby reducing manufacturing costs.
- the resin layer can prevent the conductive pattern area 13 from peeling or scattering due to heat or the like of light irradiation. Thereby, the conductive substrate 10 can be manufactured with high yield.
- the conductive substrate formed as shown in FIG. 2C and FIG. 2D can be used as a product with a conductive pattern.
- the conductive patterned product comprises a substrate, a copper oxide-containing layer formed on the surface of the substrate, and a conductive layer formed on the surface of the copper-oxide-containing layer, the conductive layer comprising
- the wiring has a line width of 1.0 ⁇ m to 1000 ⁇ m, and the wiring contains reduced copper.
- the cuprous oxide containing layer is a layer having a copper / oxygen ratio Cu / O of 0.5 or more and 3.0 or less.
- the Cu / O in the cuprous oxide-containing layer can be quantified by analyzing the cross section of the conductive patterned product by EDX method.
- the product with a conductive pattern includes a substrate, a cuprous oxide-containing layer formed on the surface of the substrate, and a conductive layer formed on the surface of the cuprous oxide-containing layer, and is conductive.
- the layer is a wire having a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less, and the wire is characterized by containing reduced copper (including copper in some cases) and tin.
- the product with a conductive pattern comprises a substrate and a conductive pattern formed on the surface of the substrate, and the conductive pattern is a wiring with a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less, and reduced copper, phosphorus and voids. It is characterized by including. With this configuration, it is possible to form a wire of a good shape on a substrate of a desired shape as described later.
- the product with a conductive pattern comprises a substrate and a conductive pattern formed on the surface of the substrate, the conductive pattern is a wire with a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less, and the wire is reduced copper, copper And tin.
- the wiring can be used as an antenna. With this configuration, an antenna with a good shape can be formed.
- a solder layer be formed on a part of the surface of the conductive layer or the conductive pattern.
- the conductive pattern is formed by firing the copper oxide of the above-described dispersion, so that organic matter such as an organic binder is decomposed in the firing step. For this reason, in the conductive pattern, the wettability of the solder is high, and the solder layer can be easily formed. Therefore, compared to the conductive pattern formed without using the above-mentioned dispersion, electrons in the conductive pattern are obtained. Easy to solder parts.
- the product with a conductive pattern comprises a substrate and a conductive pattern formed on the surface of the substrate, and the conductive pattern is a wiring with a line width of 1.0 ⁇ m or more and 1000 ⁇ m or less, and reduced copper, oxidized It is characterized in that it contains copper and phosphorus and a resin is disposed so as to cover the wiring.
- a coating method using a copper oxide ink will be described.
- the coating method is not particularly limited, and printing methods such as screen printing, intaglio direct printing, intaglio offset printing, flexographic printing, reverse printing, offset printing, a dispenser drawing method, a spray method, and the like can be used.
- methods such as die coating, spin coating, slit coating, bar coating, knife coating, spray coating, dip coating and the like can be used.
- the substrate used in the present embodiment is not particularly limited, and is made of an inorganic material or an organic material.
- the inorganic material examples include glass such as soda lime glass, non-alkali glass, borosilicate glass, quartz glass, and ceramic materials such as alumina.
- Examples of the organic material include polymer materials and paper.
- a resin film can be used as the polymer material, and polyimide (PI), polyethylene terephthalate (PET), polyether sulfone (PES), polyethylene naphthalate (PEN), polyester, polycarbonate (PC), polyvinyl alcohol (PVA) ), Polyvinyl butyral (PVB), polyacetal (POM), polyarylate (PAR), polyamide (PA), polyamide imide (PAI), polyether imide (PEI), polyphenylene ether (PPE), modified polyphenylene ether (m-PPE) ), Polyphenylene sulfide (PPS), polyether ketone (PEK), polyphthalamide (PPA), polyether nitrile (PEN), polybenzimidazole (PBI), polycarbodiimide, , Polysiloxane, polymethacrylamide, nitrile rubber, acrylic rubber, polyethylene tetrafluoride, epoxy resin, phenol resin, melamine
- the thickness of the substrate can be, for example, 1 ⁇ m to 10 mm, preferably 25 ⁇ m to 250 ⁇ m. It is preferable that the thickness of the substrate is 250 ⁇ m or less because the manufactured electronic device can be reduced in weight, space, and flexibility.
- the paper examples include high-quality paper made of general pulp, medium-grade paper, coated paper, cardboard, cardboard, etc., and paper made of cellulose nanofibers as a raw material.
- paper it is possible to use one in which a polymer material is dissolved, or one in which a sol-gel material or the like is impregnated and cured.
- these materials may be laminated and used.
- substrate in this Embodiment means the board
- the method for producing a conductive film according to the present embodiment copper oxide in the coating film is reduced to form copper, which is fused itself, and when copper particles are added to the copper oxide ink, the copper particles are mixed with the copper particles.
- the conductive film (copper film) is formed by fusion bonding and integration. This process is called firing. Therefore, the method is not particularly limited as long as it is a method capable of forming a conductive film by reduction and fusion of copper oxide and integration with copper particles. Firing in the method for manufacturing a conductive film of this embodiment may be performed, for example, in a baking furnace, or may be performed using plasma, infrared light, a flash lamp, a laser, or the like alone or in combination. After firing, it is possible to form a solder layer described later on a part of the conductive film.
- the coating film can be subjected to a baking treatment to form a conductive pattern on the substrate.
- the coating liquid can be formed directly on the substrate in a desired pattern, the productivity can be improved as compared with the conventional method using a photoresist.
- a method of manufacturing a conductive substrate in the case of using laser irradiation for firing according to the present embodiment will be described more specifically with reference to FIG.
- copper acetate is dissolved in a mixed solvent of water and propylene glycol (PG), and hydrazine is added and stirred.
- PG propylene glycol
- a copper oxide ink (dispersion) is applied onto a substrate made of, for example, PET (described as “PET” in FIG. 3 (f)) by a spray coating method, and oxidized.
- PET described as “PET” in FIG. 3 (f)
- a coated layer (coated film) containing copper and a phosphorus-containing organic substance (described as “Cu 2 O” in FIG. 3F) is formed.
- the conductive pattern region may contain, for example, cuprous oxide as copper oxide particles that are not reduced in the firing step.
- the insulating region and the conductive pattern region may contain copper particles of a copper oxide ink, and may contain tin.
- the insulating region and the conductive pattern region may contain a void.
- the firing by laser irradiation firing of the copper particles of the copper oxide ink and formation of the conductive pattern region can be performed at one time.
- the organic particles such as the organic binder contained in the copper oxide ink are decomposed by the baking of the copper particles, the wettability of the solder becomes high in the obtained conductive pattern.
- the insulating region can contain copper oxide, a phosphorus-containing organic substance as a dispersant, and hydrazine or a hydrazine hydrate as a reducing agent.
- a copper oxide ink (dispersion) is printed in a desired pattern by, for example, inkjet printing on a substrate made of, for example, PET, and coated with a copper oxide and a phosphorus-containing organic substance.
- a layer (denoted as “Cu 2 O” in FIG. 3 (i)) is formed.
- FIG. 5 shows a method of manufacturing a conductive substrate in the case of using laser irradiation for firing.
- the steps (a) to (h) in FIG. 5 are the same as in FIG.
- the insulating area is further cleaned.
- the form by which copper wiring (it describes as "C” in FIG. 5 (K)) was pattern-formed on a support body can be obtained.
- the copper wiring C is the same layer as the conductive pattern area B.
- sealing can be performed with a resin layer (denoted as “D” in FIG. 5 (l)).
- the resin layer D can be formed so as to cover at least the copper wiring C as the conductive pattern area B.
- the resin layer secures long-term stability.
- the resin layer is a sealing material layer, and it is preferable to make the moisture permeability sufficiently low. It is for preventing the mixing of the water from the exterior of a sealing material layer, and suppressing the oxidation of copper wiring.
- the moisture permeability of the encapsulant layer is preferably 1.0 g / m 2 / day or less, more preferably 0.5 g / m 2 / day or less, and still more preferably 0.1 g / m 2 / day. It is below.
- Polypropylene polyimide (PI), polyethylene terephthalate (PET), polyether sulfone (PES), polyethylene naphthalate (PEN), polyester, polycarbonate (PC), polyvinyl alcohol (PVA), polyvinyl butyral (PVB), Polyacetal (POM), polyarylate (PAR), polyamide (PA), polyamide imide (PAI), polyether imide (PEI), polyphenylene ether (PPE), modified polyphenylene ether (m-PPE), polyphenylene sulfide (PPS), Polyether ketone (PEK), polyphthalamide (PPA), polyether nitrile (PENt), polybenzimidazole (PBI), polycarbodiimide, polysiloxane, poly Tacrylamide, nitrile rubber, acrylic rubber, polyethylene tetrafluoride, epoxy resin, phenol resin, melamine resin, urea resin
- moisture permeability can be lowered by mixing fine particles of silicon oxide or aluminum oxide with the above material, or providing a layer of silicon oxide or aluminum oxide as a moisture barrier layer on the surface of these materials.
- water or an alcohol such as ethanol, propanol, butanol, isopropyl alcohol, methanol, ethylene glycol or glycerol, or an organic solvent such as ketones, esters or ethers can be used.
- water, ethanol, propanol, butanol and isopropyl alcohol are preferred in view of the cleaning performance of the insulating region.
- the configuration in which the copper wiring is covered with the resin layer is also applicable to FIG.
- a plasma is generated in an atmosphere containing a reducing gas and a baking process is performed on a pattern formed on the substrate.
- This configuration enables low temperature firing.
- the organic substance in the copper oxide is effectively decomposed, the baking of the copper oxide is further promoted, and a conductive substrate provided with a conductive film with lower resistance can be manufactured.
- the method of manufacturing a conductive substrate includes the steps of forming a coating film on a substrate using a copper oxide ink, and irradiating the coating film with a laser beam.
- baking by laser irradiation, baking of copper particles of the copper oxide ink and formation of a conductive pattern can be performed at one time.
- the wavelength of light can be selected, the absorption wavelengths of light from the copper oxide ink and the substrate can be taken into consideration.
- the baking time can be shortened, the organic substance in copper oxide can be effectively decomposed while suppressing damage to the substrate, and a conductive substrate provided with a conductive film with low resistance can be manufactured.
- the method for producing a conductive substrate includes the steps of forming a coating on a substrate using a copper oxide ink, and irradiating the coating with xenon light. According to this configuration, since the firing time can be shortened, the organic substance in copper oxide can be effectively decomposed while suppressing damage to the substrate, and a conductive substrate provided with a conductive film with low resistance can be manufactured.
- the method of firing treatment is not particularly limited as long as a conductive film exhibiting the effects of the present invention can be formed, but specific examples include a method using an incinerator, a plasma firing method, an optical firing method, etc. .
- a coating film is formed with a copper oxide ink as a dispersion, and laser irradiation of a coating film can perform baking and patterning of copper particles at once.
- a conductive pattern can be obtained by printing a desired pattern with a copper oxide ink and baking it.
- the adhesion between the conductive pattern and the substrate is preferably improved because a part of the first copper oxide is not reduced and remains on the contact surface with the substrate.
- the non-oxidizing atmosphere is an atmosphere which does not contain an oxidizing gas such as oxygen, and is an atmosphere filled with an inert gas such as nitrogen, argon, helium, or neon.
- the reducing atmosphere refers to an atmosphere in which a reducing gas such as hydrogen and carbon monoxide is present, but may be mixed with an inert gas.
- the coating film of the copper oxide ink may be fired while filling these gases in a firing furnace and flowing the gas continuously or in a closed system. The firing may be performed in a pressurized atmosphere or a reduced pressure atmosphere.
- the plasma method of this embodiment can be processed at a lower temperature than a method using a firing furnace, and one of the better methods as a firing method using a resin film with low heat resistance as a substrate It is. Further, since it is possible to remove the organic substance on the surface of the pattern and the oxide film by plasma, there is also an advantage that good solderability can be secured. Specifically, a reducing gas or a mixed gas of a reducing gas and an inert gas is flowed into a chamber, a plasma is generated by a microwave, and the active species generated thereby are heated for reduction or sintering. As a source, it is a method of obtaining a conductive film by using for decomposition of the organic substance further contained in a dispersing agent etc.
- the deactivation of the active species is large, the metal part is selectively heated, and the temperature of the substrate itself does not easily rise. Therefore, the invention can be applied to a resin film as a substrate.
- the copper oxide ink contains copper as a metal, and since copper oxide changes to copper as the baking proceeds, heating of only the pattern portion is promoted.
- the sintering tends to be hindered and the resistance tends to increase.
- the plasma method has a large effect of removing the organic substance in the conductor pattern.
- Hydrogen or the like can be used as the reducing gas component, and nitrogen, helium, argon or the like can be used as the inert gas component. These may be used alone or as a mixture of a reducing gas component and an inert gas component in any ratio. Moreover, you may mix and use 2 or more types of inert gas components.
- the plasma firing method can adjust the microwave input power, the introduced gas flow rate, the chamber internal pressure, the distance from the plasma source to the treatment sample, the treatment sample temperature, and the treatment time, and adjusting the intensity of the treatment Can change. Therefore, if optimization of the above adjustment items is attempted, not only the substrate made of inorganic material but also thermosetting resin film of organic material, paper, thermoplastic resin film with low heat resistance such as PET, PEN can be used as substrate It is possible to obtain a conductive film with low resistance. However, since the optimum conditions differ depending on the device structure and sample type, adjustment is made according to the situation.
- the light baking method of the present embodiment is applicable to a flash light method or a laser light method using a discharge tube such as xenon as a light source. These methods are a method in which high intensity light is exposed for a short time, and a copper oxide ink coated on a substrate is raised to a high temperature for a short time to be fired, reduction of copper oxide, sintering of copper particles, integration of these And decomposition of the organic component to form a conductive film. Since the baking time is very short, application to a resin film substrate with low heat resistance is possible by a method with less damage to the substrate.
- the flash light method is a method of instantaneously discharging the charge stored in the capacitor using a xenon discharge tube, generating pulse light of a large light quantity, and oxidizing it by irradiating the copper oxide ink formed on the substrate. It is a method of instantaneously heating copper to a high temperature and changing it to a conductive film.
- the exposure dose can be adjusted by the light intensity, the light emission time, the light irradiation interval, the number of times, and if the light transmittance of the substrate is large, the resin substrate with low heat resistance such as PET, PEN or paper is also obtained by copper oxide ink It is possible to form a conductive pattern.
- the light emission source is different, the same effect can be obtained by using a laser light source.
- a laser in addition to the adjustment item of the flash light system, there is freedom of wavelength selection, and it is possible to select in consideration of the light absorption wavelength of the copper oxide ink having a pattern formed and the absorption wavelength of the substrate. Further, it is characterized in that exposure by beam scanning is possible, and adjustment of the exposure range is easy, such as exposure to the entire surface of the substrate or selection of partial exposure.
- YAG yttrium aluminum garnet
- YVO yttrium vanadate
- Yb ytterbium
- semiconductor laser GaAs, GaAlAs, GaInAs
- carbon dioxide gas etc.
- its emission wavelength is preferably 300 nm or more and 1500 nm or less.
- 355 nm, 405 nm, 445 nm, 450 nm, 532 nm, 1056 nm and the like are preferable.
- the substrate or the housing is a resin
- laser wavelengths of 355 nm, 405 nm, 445 nm, 450 nm, and 532 nm are particularly preferable.
- the light beam is preferably a laser beam having a central wavelength of 355 nm or more and 532 nm or less.
- the support transparent to light, the light passes through the support, so that it is possible to appropriately fire part of the coating layer.
- a part of the coating layer containing copper oxide and the phosphorus-containing organic substance is baked by a laser to form a conductive pattern area,
- the unfired portion can be used to isolate the conductive pattern area. Therefore, it is not necessary to remove the unfired part of the coated layer. For this reason, the manufacturing process can be reduced, and since the solvent and the like are unnecessary, the manufacturing cost can be reduced.
- the manufacturing process can be reduced accordingly. However, the insulating layer may be removed.
- water or an alcohol such as ethanol, propanol, butanol, isopropyl alcohol, methanol, ethylene glycol or glycerin, or an organic solvent such as ketones, esters or ethers can be used.
- water, ethanol, propanol, butanol and isopropyl alcohol are preferred in view of the cleaning performance of the insulating region.
- solder layer on conductive pattern In the conductive substrate manufactured using the dispersion according to the present embodiment, since the dispersing agent that deteriorates the solderability and the dispersion medium are decomposed in the step of the baking treatment, the conductive substrate can be bonded to the conductive pattern.
- soldering for example, an electronic component
- solder is an alloy mainly composed of lead and tin, and includes lead-free solder containing no lead. Since the conductive pattern according to the present embodiment has voids (voids), the adhesion of the conductive pattern and the solder layer is enhanced by the solder entering the voids.
- the grain size of copper contained in the conductive pattern and conductive layer is preferably 0.10 ⁇ m to 100 ⁇ m, more preferably 0.50 ⁇ m to 50 ⁇ m, and particularly preferably 1.0 ⁇ m to 10 ⁇ m. preferable. Thereby, the adhesiveness of a conductive pattern and a solder layer becomes high.
- the electronic components include semiconductors, integrated circuits, active components such as diodes and liquid crystal displays, passive components such as resistors and capacitors, and mechanical components such as connectors, switches, electric wires, heat sinks and antennas. , At least one.
- solder paste cream solder
- the application of the solder paste is performed, for example, by contact printing using a metal mask and a metal squeegee.
- a solder layer is formed on part of the surface of the conductive pattern. That is, after the process of FIG. 3 (h), a conductive substrate is obtained in which a solder layer is formed on part of the surface of the conductive pattern in the layer.
- FIG. 3 (h) a conductive substrate is obtained in which a solder layer is formed on part of the surface of the conductive pattern in the layer.
- the conductive substrate in which a solder layer is formed in a part of surface of a conductive pattern is obtained.
- the area of the surface of the conductive pattern on which the solder layer is formed is not particularly limited, as long as the conductive pattern and the electronic component can be bonded to each other.
- FIG. 6 is a top view of the conductive substrate on which the solder layer according to the present embodiment is formed.
- FIG. 6A shows a photograph of a conductive substrate on which a solder layer is formed, and
- FIG. 6B shows a schematic view thereof.
- a conductive pattern B formed by firing a copper oxide ink as a dispersion is formed on the flexible substrate 11.
- the solder layer 20 is formed on the surface of the conductive pattern B.
- the conductive pattern B and the conducting wire 90 are appropriately soldered by the solder layer 20, and the conducting pattern B and the electronic component 91 are properly connected via the conducting wire 90.
- the copper oxide ink as the dispersion is fired to form the conductive pattern, and thus the organic binder contained in the dispersion is decomposed.
- the wettability of the solder becomes high, and the solder layer can be easily formed on the surface of the conductive pattern. For this reason, soldering of electronic parts becomes possible.
- the value of the Y-section obtained from the calibration curve was divided by the weight of added hydrazine / the weight of added surrogate material to obtain the weight of hydrazine.
- Example 1 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (made by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes (first time) and stirring for 30 minutes (first time), the liquid temperature is adjusted by an external temperature controller. Was brought to 25.degree. C.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 21 nm.
- the hydrazine content was 3000 ppm.
- Example 2 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- II copper acetate
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 700 ppm.
- Example 3 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 2900 ppm.
- Example 4 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 16 nm.
- the hydrazine content was 2700 ppm.
- Example 5 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- II copper acetate
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 24 nm.
- the hydrazine content was 3000 ppm.
- Example 6 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 3000 ppm.
- Example 7 In 98.5 g of the dispersion obtained in Example 1, 1.5 g of hydrazine (manufactured by Tokyo Chemical Industry Co., Ltd.) was placed under a nitrogen atmosphere.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 29 nm.
- the hydrazine content was 18,000 ppm.
- Example 8 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 20 nm.
- the hydrazine content was 3000 ppm.
- Example 9 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 24 nm.
- the hydrazine content was 3000 ppm.
- Example 10 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- II copper acetate
- Example 11 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- Example 12 In 1000 g of the dispersion obtained in Example 2, 0.30 g of hydrazine (manufactured by Tokyo Chemical Industry Co., Ltd.) was placed under a nitrogen atmosphere.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 1000 ppm.
- Example 13 In 1000 g of the dispersion obtained in Example 2, 0.80 g of hydrazine (manufactured by Tokyo Chemical Industry Co., Ltd.) was placed under a nitrogen atmosphere.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 1500 ppm.
- Example 14 In 1000 g of the dispersion obtained in Example 2, 0.80 g of adipositohydrazide (manufactured by Fujifilm Wako Pure Chemical Industries, Ltd.) was placed under a nitrogen atmosphere.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 700 ppm, and the adiposihydrazide content was 800 ppm.
- Example 15 In 1000 g of the dispersion obtained in Example 2, 0.80 g of 4-amino-1,2,4-triazole (manufactured by Fujifilm Wako Pure Chemical Industries, Ltd.) was placed under a nitrogen atmosphere.
- the dispersion was well dispersed.
- the content of cuprous oxide was 20%, and the particle size was 23 nm.
- the hydrazine content was 700 ppm and the 4-amino-1,2,4-triazole content was 800 ppm.
- Example 16 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- II copper acetate
- distilled water manufactured by Kyoei Pharmaceutical Co., Ltd.
- 1,2-propylene glycol manufactured by Kanto Chemical Co., Ltd.
- Example 17 Dissolve 806 g of copper acetate (II) monohydrate (manufactured by Kanto Chemical Co., Ltd.) in a mixed solvent of 7560 g of distilled water (manufactured by Kyoei Pharmaceutical Co., Ltd.) and 3494 g of 1,2-propylene glycol (manufactured by Kanto Chemical Co., Ltd.) The liquid temperature was adjusted to -5 ° C by an external temperature controller. After adding 235 g of hydrazine monohydrate (manufactured by Tokyo Chemical Industry Co., Ltd.) in a nitrogen atmosphere over 20 minutes and stirring for 30 minutes, the liquid temperature is brought to 25 ° C. by an external temperature controller and stirred in a nitrogen atmosphere for 90 minutes did.
- II copper acetate
- distilled water manufactured by Kyoei Pharmaceutical Co., Ltd.
- 1,2-propylene glycol manufactured by Kanto Chemical Co., Ltd.
- the evaluation criteria of the dispersibility of the copper oxide ink are as follows. A: The particle size of the copper oxide particles immediately after the dispersion by the homogenizer is 50 nm or less, and the sedimentation of the particles does not occur within 30 minutes of the dispersion by the homogenizer. B: The diameter of the copper oxide particles immediately after the dispersion by the homogenizer is larger than 50 nm, and the sedimentation of the particles does not occur within 30 minutes of the dispersion by the homogenizer. C: Precipitation of particles occurs within 30 minutes of dispersion by a homogenizer.
- a pattern-like coating was formed on the substrate by reverse printing using a copper oxide ink.
- a coating of copper oxide ink of uniform thickness was formed on the surface of the blanket.
- the surface material of the blanket is usually composed of silicone rubber, and it was confirmed that the copper oxide ink adhered well to this silicone rubber and a uniform coating was formed.
- a print pattern was formed on the coating of the copper oxide ink remaining on the surface of the blanket.
- the blanket in this state was pressed against the surface of the substrate to be printed, and the coating film of the copper oxide ink remaining on the blanket was transferred to form a pattern-like coating film. Evaluation criteria are as follows. A: Reverse printing was possible. B: Some print patterns were not formed. C: Reverse printing was not possible.
- Examples 1 to 17 low resistance was maintained when the copper film was formed on the PEN film without aggregation of the copper oxide ink.
- the value of (mass of reducing agent / mass of copper oxide) was 0.00010 or more and 0.10 or less, and the value of (mass of dispersing agent / mass of copper oxide) was 0.0050 or more and 0.30 or less .
- the dispersant had an acid value of 20 or more and 130 or less. It is thought that reduction of copper oxide is promoted by using hydrazine as a reducing agent, and a copper film with low resistance is produced.
- Example 16 the acid value of the dispersant of Example 16 was 130. In Example 16, the dispersibility was slightly inferior to that in Examples 1 to 15, and the resistance of the sintered and produced copper film increased.
- Comparative Example 3 no hydrazine was added to the copper oxide ink. In this case, since the hydrazine which is presumed to contribute to the storage stability is not added, the average particle diameter of copper oxide is larger than that of the example, and the storage stability is lowered. In Comparative Example 4, the reducing agent mass was out of 0.00010 ⁇ (reducing agent mass / copper oxide mass) ⁇ 0.10. In this case, since the copper oxide ink was aggregated, reverse printing and resistance measurement could not be performed.
- the average particle diameter of cuprous oxide was 3.0 nm or more and 50 nm or less. Furthermore, printability is also good, and as in Examples 1-9 and 12-15, when the dispersion medium is a monoalcohol having 7 or less carbon atoms, Examples 10 and 11 in which the dispersion medium has 8 or more carbon atoms In comparison, the printability was better.
- Example 16 in which the acid value of the dispersant is greater than 130, the average particle diameter of cuprous oxide exceeds 50 nm, the resistance is increased, and the printability is lower than in Examples 1 to 15. did.
- Example 14 after the copper oxide ink was prepared, azide hydrazide was added as a reducing agent, and in Example 15, 4-amino-1,2,4-triazole was added after addition. Also in these cases, the dispersibility, printability and storage stability were good, and the copper film could maintain low resistance.
- the reducing agent was added after the preparation of the copper oxide ink, Examples 7, 12 and 13 in which hydrazine was used as the reducing agent maintained lower resistance than in the case of using other reducing agents.
- the reducing agent when the copper oxide ink was produced, the reducing agent was added under a predetermined time condition, and dispersed under a nitrogen atmosphere, whereby the reducing agent was effectively left in the copper oxide ink. Thereby, it turned out that the mass of the reducing agent and dispersing agent to copper oxide can be made into a predetermined range, and a copper oxide ink excellent in storage stability can be produced.
- the reducing agent was effectively left in the copper oxide ink by adding the reducing agent to the copper oxide ink in a nitrogen atmosphere.
- the polydispersity of Examples 1 to 17 was 0.20 to 0.30.
- the acid value of is 20 or more and 130 or less, and the average particle diameter of copper oxide is 3.0 nm or more and 50 nm or less.
- the average particle diameter of copper oxide is 25 nm or more and 120 or less, and 5.0 nm or more and 40 nm or less.
- the average particle diameter of copper oxide is 36 nm or more and 110 or less, and 5.0 nm or more and 40 nm or less.
- the average particle diameter of copper oxide be 36 or more and 101 or less, and 10 nm or more and 29 nm or less.
- Example 1 The copper oxide ink of Example 1 was bar-coated on a PET substrate to a predetermined thickness (800 nm), and dried at room temperature for 10 minutes to obtain Sample A in which a coating layer was formed on PET.
- Laser beam (wavelength 445 nm, output 1.1 W, continuous wave (CW)) is applied to sample A while moving the focal position at maximum speed 300 mm / min using a galvano scanner, 25 mm x 1 mm A conductive film containing copper of the following dimensions was obtained, the resistance was 20 ⁇ cm, and the conductive film could be prepared also by laser firing.
- the sample A laser light (wavelength 355 nm, output 50%, pulse repetition frequency 300 kHz) at a speed of 100 mm / sec in nitrogen atmosphere. Irradiated. The resistance was 15 ⁇ cm. The conductive film was able to be produced also in the laser firing.
- sample B is obtained in which a coated layer (film thickness: 700 nm) of a 60 ⁇ m wide line is formed on PET by the reverse printing method described above.
- the copper oxide ink of the present invention can obtain a conductive film with less breakage or breakage by plasma or light baking treatment. Therefore, the copper oxide ink of the present invention is suitably used for the production of printed wiring boards, electronic devices, transparent conductive films, electromagnetic wave shields, antistatic films and the like.
Abstract
Description
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2)
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2)
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2)
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2)
高い分散安定性、及び優れた貯蔵安定性を備えた酸化銅インクを用いることで、大気下での取り扱いを容易にでき、また、粒径、濃度、粘度及び溶媒のコントロール、各種印刷手法への適用、更には汎用樹脂基板上での焼成等が可能となる。
本実施の形態の酸化銅インクは、分散媒に、(1)酸化銅と、(2)分散剤と、(3)還元剤とを含むことを特徴とする。酸化銅インクに還元剤が含まれることにより、焼成において酸化銅の銅への還元が促進され、銅の焼結が促進される。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
これにより還元剤の質量比率が0.00010以上であると、より焼成の際の還元が進み、銅膜の抵抗が低下する。更に、本実施の形態では、還元剤含有量を上記式(1)とすることで、貯蔵安定性をより向上させることができる。貯蔵安定性が向上する原理は不明であるが、A.還元剤が酸素を消費する、B.酸化銅粒子のゼータ電位を還元剤が制御している、と推定される。また、0.10以下であると酸化銅インクの貯蔵安定性が向上する。より好ましくは0.0010以上0.050以下、より好ましくは0.0010以上0.030以下、さらに好ましくは0.0020以上0.030以下、さらにより好ましくは0.0040以上0.030以下である。
これにより、酸化銅の凝集を抑制して、分散安定性が向上する。より好ましくは0.050以上0.30以下であり、さらに好ましくは0.10以上0.30以下であり、さらにより好ましくは0.20以上0.30以下、さらにより好ましくは0.20以上0.25以下である。
(A)酸化第一銅と、分散剤と、還元剤とを含むこと。
(B)分散剤は、酸価が、20以上、130以下であり、リン含有有機物であり、前記分散剤の含有量が下記式(2)の範囲であること。
(C)還元剤は、ヒドラジン及びヒドラジン水和物から選ばれる少なくとも1つを含み、前記還元剤の含有量が下記式(1)の範囲であること。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2)
(D)分散媒が炭素数7以下のモノアルコールであり、前記分散媒の酸化銅インク中の含有量が30質量%以上、95質量%以下であること。
本実施形態においては金属酸化物成分の一つとして酸化銅を用いる。酸化銅としては、酸化第一銅(Cu2O)が好ましい。これは、金属酸化物の中でも還元が容易で、さらに微粒子を用いることで焼結が容易であること、価格的にも銅であるがゆえに銀などの貴金属類と比較し安価で、マイグレーションに対し有利であるためである。
(1)ポリオール溶剤中に、水と銅アセチルアセトナト錯体を加え、いったん有機銅化合物を加熱溶解させ、次に、反応に必要な水を後添加し、さらに昇温して有機銅の還元温度で加熱する加熱還元する方法。
(2)有機銅化合物(銅-N-ニトロソフェニルヒドロキシアミン錯体)を、ヘキサデシルアミンなどの保護材存在下、不活性雰囲気中で、300℃程度の高温で加熱する方法。
(3)水溶液に溶解した銅塩をヒドラジンで還元する方法。
この中では(3)の方法は操作が簡便で、かつ、平均粒子径の小さい酸化第一銅が得られるので好ましい。この反応において、温度と時間を制御することで、酸化銅インク中の還元剤含有量を制御することができ、酸化銅インクの貯蔵安定性をより良くすることが可能となる。
次に分散剤について説明する。本件における分散剤は、銅インクの中で酸化銅の分散性を高める。分散剤としては、例えば、リン含有有機物が挙げられる。リン含有有機物は酸化銅に吸着してもよく、この場合立体障害効果により凝集を抑制する。また、リン含有有機物は、絶縁領域において電気絶縁性を示す材料である。リン含有有機物は、単一分子であってよいし、複数種類の分子の混合物でもよい。
次に還元剤について説明する。本件の還元剤とは、酸化銅を還元して、銅にする。この銅を還元銅という。
本実施の形態の酸化銅インクは、上述の構成成分の他に、分散媒(溶媒)が含まれていてもよい。
本実施の形態では、既述の<本実施の形態の酸化銅インクの概要>に記載したように、酸化銅インク中に、ヒドラジン等の還元剤を所定量含ませることに特徴的部分がある。このように、酸化銅インク中に、所定量の還元剤を含ませる調整方法としては、以下の方法を提示することができる。
酸化第一銅と銅粒子を含む分散体、すなわち酸化銅インクは、前述の酸化銅分散体に、銅微粒子、必要に応じ分散媒を、それぞれ所定の割合で混合し、例えば、ミキサー法、超音波法、3本ロール法、2本ロール法、アトライター、ホモジナイザー、バンバリーミキサー、ペイントシェイカー、ニーダー、ボールミル、サンドミル、自公転ミキサーなどを用いて分散処理することにより調整することができる。
本発明者らは、上記した酸化銅インクを用いた、塗膜を含む製品を開発するに至った。すなわち、酸化銅インクを構成する成分は、塗膜の成分として含まれる。したがって、塗膜は、以下の構成を備えている。
(F)還元剤の質量比率(還元剤質量/酸化銅質量)は、0.00010以上0.10以下である。
(G)分散剤の質量比率(分散剤質量/酸化銅質量)は、0.0050以上0.30以下である。
(H)酸化第一銅と、分散剤と、還元剤とを含むこと。
(I)分散剤が、酸価が、20以上、130以下であり、リン含有有機物であり、前記分散剤の含有量が下記式(1)の範囲であること、
(J)還元剤が、ヒドラジン及びヒドラジン水和物から選ばれる少なくとも1つを含み、前記還元剤の含有量が下記式(2)の範囲であること。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2)
(K)分散媒が炭素数7以下のモノアルコールであり、前記分散媒の酸化銅インク中の含有量が30質量%以上、95質量%以下であること。
本発明者らは、上記した酸化銅インクを用いることで、導電性に優れた導電性基板を開発するに行った。すなわち、本実施の形態の酸化銅インクを用いて形成されたパターン、或いは塗膜に対し焼成処理を行うことで、導電性基板を得ることができる。
本実施の形態に係る酸化銅インクを用いた際、焼成の方法により、2種類の導電性基板を得ることができる。基板上に上記の酸化銅インクで塗膜を形成し、酸化銅インクの酸化銅粒子をレーザ照射で焼成することで、図2Aの導電性基板を得ることができる。基板上に酸化銅インクで所望のパターンを印刷し、これをプラズマで焼成することで、図2Bの導電性基板を得ることができる。
酸化銅インクを用いた塗布方法について説明する。塗布方法としては特に制限されず、スクリーン印刷、凹版ダイレクト印刷、凹版オフセット印刷、フレキソ印刷、反転印刷法、オフセット印刷などの印刷法やディスペンサー描画法、スプレー法などを用いることができる。塗布法としては、ダイコート、スピンコート、スリットコート、バーコート、ナイフコート、スプレーコート、ディツプコートなどの方法を用いることができる。
本実施の形態で用いられる基板は、特に限定されるものではなく、無機材料又は有機材料で構成される。
本実施の形態の導電膜の製造方法は、塗膜における酸化銅を還元し銅を生成させ、これ自体の融着、及び酸化銅インクに銅粒子が加えられている場合はその銅粒子との融着、一体化、により導電膜(銅膜)を形成するものである。この工程を焼成と呼ぶ。従って、酸化銅の還元と融着、銅粒子との一体化による導電膜の形成ができる方法であれば特に制限はない。本実施の形態の導電膜の製造方法における焼成は、例えば、焼成炉で行ってもよいし、プラズマ、赤外線、フラッシュランプ、レーザなどを単独もしくは組み合わせて用いて行ってもよい。焼成後には、導電膜の一部に、後述するハンダ層の形成が可能となる。
焼成処理の方法には、本発明の効果を発揮する導電膜を形成可能であれば、特に限定されないが、具体例としては、焼却炉、プラズマ焼成法、光焼成法などを用いる方法が挙げられる。光焼成におけるレーザ照射においては、分散体としての酸化銅インクで塗膜を形成し、塗膜にレーザ照射することで、銅粒子の焼成と、パターニングを一度に行うことができる。その他の焼成法においては、酸化銅インクで所望のパターンを印刷し、これを焼成することで、導電性パターンを得ることができる。導電性パターンを作製する上で、基板との接触面に一部の酸化第一銅が還元されずに残ることで、導電性パターンと基板との密着性が向上するため、好ましい。
酸素の影響を受けやすい焼成炉などで焼成を行う方法では、非酸化性雰囲気において酸化銅インクの塗膜を処理することが好ましい。また酸化銅インク中に含まれる有機成分だけでは酸化銅が還元されにくい場合、還元性雰囲気で焼成することが好ましい。非酸化性雰囲気とは、酸素などの酸化性ガスを含まない雰囲気であり、例えば、窒素、アルゴン、ヘリウム、ネオンなどの不活性ガスで満たされた雰囲気である。また還元性雰囲気とは、水素、一酸化炭素などの還元性ガスが存在する雰囲気を指すが、不活性ガスと混合して使用してよい。これらのガスを焼成炉中に充填し密閉系でもしくはガスを連続的に流しながら酸化銅インクの塗膜を焼成してもよい。また、焼成は、加圧雰囲気で行ってもよいし減圧雰囲気で行ってもよい。
本実施形態のプラズマ法は焼成炉を用いる方法と比較し、より低い温度での処理が可能であり、耐熱性の低い樹脂フィルムを基材とする場合の焼成法として、よりよい方法の一つである。またプラズマにより、パターン表面の有機物質除去や酸化膜の除去が可能であるため、良好なハンダ付け性を確保できるという利点もある。具体的には、還元性ガスもしくは還元性ガスと不活性ガスとの混合ガスをチャンバ内に流し、マイクロ波によりプラズマを発生させ、これにより生成する活性種を、還元または焼結に必要な加熱源として、さらには分散剤などに含まれる有機物の分解に利用し導電膜を得る方法である。
本実施形態の光焼成法は、光源としてキセノンなどの放電管を用いたフラッシュ光方式やレーザ光方式が適用可能である。これらの方法は強度の大きい光を短時間露光し、基板上に塗布した酸化銅インクを短時間で高温に上昇させ焼成する方法で、酸化銅の還元、銅粒子の焼結、これらの一体化、及び有機成分の分解を行い、導電膜を形成する方法である。焼成時間がごく短時間であるため基板へのダメージが少ない方法で、耐熱性の低い樹脂フィルム基板への適用が可能である。
本実施の形態に係る分散体を用いて作製された導電性基板は、ハンダ付け性を悪化させる分散剤、分散媒が、焼成処理の工程で分解しているため、導電性パターンに被接合体(例えば、電子部品等)をハンダ付けするとき、溶融ハンダがのりやすいという利点がある。ここで、ハンダとは鉛とスズを主成分とする合金であり、鉛を含まない鉛フリーハンダも含まれる。本実施の形態に係る導電性パターンは空隙(ボイド)を有するため、このボイドにハンダが入ることで、導電性パターンとハンダ層との密着性が高まる。
次に、塗布されたソルダーペースト(ハンダ層)の一部に、電子部品の被接合部を接触させた状態になるように電子部品を導電性基板上に載置する。その後、電子部品が載置された導電性基板を、リフロー炉に通して加熱して、導電性パターン領域の一部(ランド等)及び電子部品の被接合部をハンダ付けする。図6は、本実施の形態に係るハンダ層が形成された導電性基板の上面図である。図6Aは、ハンダ層が形成された導電性基板の写真を、図6Bは、その模式図を示す。
サロゲート法によりヒドラジンの定量を行った。
酸化銅インクの平均粒子径は、大塚電子製FPAR-1000を用いてキュムラント法によって測定した。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間(第一の時間)かけて加え、30分間(第一の時間)攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間(第二の時間)攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し酸化第一銅分散液(酸化銅インク)1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し酸化第一銅分散液1365gを得た。さらに空気で3時間バブリングし、バブリングによる分散媒の減少分をエタノールを追加して元の1365gに戻した。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-118(ビックケミー製、固形分80%)68.5g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)893gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-102(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)1.37g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)960gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)82.2g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)880gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液(酸化銅インク)1365gを得た。
実施例1で得られた分散液98.5gに、ヒドラジン(東京化成工業株式会社製)1.5gを窒素雰囲気下で入れた。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びブタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びプロパノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びデカノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びオクタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
実施例2で得られた分散液1000gに、ヒドラジン(東京化成工業株式会社製)0.30gを窒素雰囲気下で入れた。
実施例2で得られた分散液1000gに、ヒドラジン(東京化成工業株式会社製)0.80gを窒素雰囲気下で入れた。
実施例2で得られた分散液1000gに、アジポジヒドラジド(富士フイルム和光純薬株式会社製)0.80gを窒素雰囲気下で入れた。
実施例2で得られた分散液1000gに、4-アミノ-1,2,4-トリアゾール(富士フイルム和光純薬株式会社製)0.80gを窒素雰囲気下で入れた。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-106(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)54.8g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)907gを加え、窒素雰囲気下でホモジナイザーを用いて分散し酸化第一銅分散液1365gを得た。さらに空気で10時間バブリングし、バブリングによる分散媒の減少分をエタノールを追加して元の1365gに戻した。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)110g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)851gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液(酸化銅インク)1365gを得た。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、DisperBYK-145(ビックケミー製)0.82g、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)960gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液(酸化銅インク)1365gを得た。
エタノール(関東化学株式会社製)15gに、酸化第一銅(EMジャパン製MP-CU2O-25)4g、DisperBYK-145(ビックケミー製)0.8g、サーフロンS611(セイミケミカル製)0.2gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液(酸化銅インク)20gを得た。
実施例1で得られた分散液97gに、ヒドラジン(東京化成工業株式会社製)3.0gを窒素雰囲気下で入れた。
蒸留水(共栄製薬株式会社製)7560g、1,2-プロピレングリコール(関東化学株式会社製)3494gの混合溶媒中に酢酸銅(II)一水和物(関東化学株式会社製)806gを溶かし、外部温調器によって液温を-5℃にした。ヒドラジン一水和物(東京化成工業株式会社製)235gを窒素雰囲気中で20分間かけて加え、30分間攪拌した後、外部温調器によって液温を25℃にし、窒素雰囲気中で90分間攪拌した。攪拌後、遠心分離で上澄みと沈殿物に分離した。得られた沈殿物390gに、サーフロンS611(セイミケミカル製)13.7g、及びエタノール(関東化学株式会社製)961gを加え、窒素雰囲気下でホモジナイザーを用いて分散し、酸化第一銅分散液(酸化銅インク)1365gを得た。
酸化銅インクの分散性の評価基準は以下の通りである。
A:ホモジナイザーによる分散直後の酸化銅粒子径が50nm以下で、ホモジナイザーによる分散30分以内に粒子の沈降が発生しない。
B:ホモジナイザーによる分散直後の酸化銅粒子径が50nmより大きく、ホモジナイザーによる分散30分以内に粒子の沈降が発生しない。
C:ホモジナイザーによる分散30分以内に粒子の沈降が発生。
酸化銅インクを用いて、反転印刷によって基板上にパターン状の塗膜を形成した。まず、ブランケットの表面に均一な厚みの酸化銅インクの塗膜を形成した。ブランケットの表面材料は通常シリコーンゴムから構成されており、このシリコーンゴムに対して酸化銅インクが良好に付着し、均一な塗膜が形成されているかを確認した。次いで、表面に酸化銅インクの塗膜が形成されたブランケットの表面を凸版に押圧、接触させ、凸版の凸部の表面に、ブランケット表面上の酸化銅インクの塗膜の一部を付着、転移させた。これによりブランケットの表面に残った酸化銅インクの塗膜には印刷パターンが形成された。次いで、この状態のブランケットを被印刷基板の表面に押圧して、ブランケット上に残った酸化銅インクの塗膜を転写し、パターン状の塗膜を形成した。評価基準は以下の通りである。
A:反転印刷が可能であった。
B:一部印刷パターンが形成されなかった。
C:反転印刷ができなかった。
PENフィルム上にバーコーターを用いて600nm厚みの膜を作製し、プラズマ焼成装置で1.5kw、420秒間、加熱焼成して還元し、銅膜(導電膜)を作製した。導電膜の体積抵抗率は、三菱化学製の低抵抗率計ロレスターGPを用いて測定した。酸化銅インクと塗膜の性能結果を表1に示す。
酸化銅インクを-17℃の冷蔵庫で6か月貯蔵し、貯蔵後の酸化銅インクの酸化銅粒子の粒子径を測定し、粒子径変化率を求めた。貯蔵安定の評価基準は、下記の通りである。
粒子径変化率=|貯蔵後粒子径-貯蔵前粒子径|/貯蔵前粒子径
A:粒子径変化率が25%未満
B:粒子径変化率が25%以上50%未満
C:粒子径変化率が50%以上100%未満
D:粒子径変化率が100%以上
PET基板上に実施例1の酸化銅インクを所定の厚み(800nm)になるようバーコートし、室温で10分間乾燥することで、PET上に塗布層が形成されたサンプルAを得た。
NOVACENTRIX社製のPET基板上に実施例1の酸化銅インクを用いて、前記記載の反転印刷法でPET上に60μm幅のラインの塗布層(膜厚:700nm)が形成されたサンプルBを得た。
Claims (33)
- 酸化銅と、分散剤と、還元剤とを含み、
前記還元剤の含有量が下記式(1)の範囲であり、
前記分散剤の含有量が下記式(2)の範囲であることを特徴とする酸化銅インク。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2) - 前記分散剤の酸価が20以上、130以下であることを特徴とする請求項1に記載の酸化銅インク。
- 前記酸化銅が酸化第一銅であることを特徴とする請求項1又は請求項2に記載の酸化銅インク。
- 前記還元剤が、ヒドラジン、ヒドラジン水和物、ヒドラジン誘導体、ナトリウム、カーボン、ヨウ化カリウム、シュウ酸、硫化鉄(II)、チオ硫酸ナトリウム、アスコルビン酸、塩化スズ(II)、水素化ジイソブチルアルミニウム、蟻酸、水素化ホウ酸ナトリウム、亜硫酸塩の群から選ばれる少なくとも1つを含むことを特徴とする請求項1から請求項3のいずれかに記載の酸化銅インク。
- 前記還元剤が、ヒドラジンまたはヒドラジン水和物であることを特徴とする請求項1から請求項4のいずれかに記載の酸化銅インク。
- 酸化第一銅と、分散剤と、還元剤とを含み、
前記分散剤は、酸価が20以上、130以下であり、リン含有有機物であり、
前記分散剤の含有量が下記式(1)の範囲であり、
前記還元剤は、ヒドラジン及びヒドラジン水和物から選ばれる少なくとも1つを含み、
前記還元剤の含有量が下記式(2)の範囲であることを特徴とする酸化銅インク。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2) - 前記酸化銅の平均粒子径が3.0nm以上、50nm以下であることを特徴とする請求項1から請求項6のいずれかに記載の酸化銅インク。
- 酸化第一銅と、前記分散剤と、前記還元剤と、分散媒とを含み、
前記分散媒が炭素数7以下のモノアルコールであり、前記分散媒の酸化銅インク中の含有量が30質量%以上、95質量%以下であることを特徴とする請求項1から請求項7のいずれかに記載の酸化銅インク。 - 酸化銅と、分散剤と、還元剤とを含み、
前記還元剤の含有量が下記式(1)の範囲であり、
前記分散剤の含有量が下記式(2)の範囲であることを特徴とする塗膜を含む製品。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2) - 前記分散剤の酸価が20以上、130以下であることを特徴とする請求項9に記載の塗膜を含む製品。
- 前記酸化銅が酸化第一銅であることを特徴とする請求項9又は請求項10に記載の塗膜を含む製品。
- 前記還元剤が、ヒドラジン、ヒドラジン水和物、ヒドラジン誘導体、ナトリウム、カーボン、ヨウ化カリウム、シュウ酸、硫化鉄(II)、チオ硫酸ナトリウム、アスコルビン酸、塩化スズ(II)、水素化ジイソブチルアルミニウム、蟻酸、水素化ホウ酸ナトリウム、亜硫酸塩の群から選ばれる少なくとも1つを含むことを特徴とする請求項9から請求項11のいずれかに記載の塗膜を含む製品。
- 前記還元剤が、ヒドラジンまたはヒドラジン水和物であることを特徴とする請求項9から請求項12のいずれかに記載の塗膜を含む製品。
- 酸化第一銅と、分散剤と、還元剤とを含み、
前記分散剤は、酸価が20以上、130以下であり、リン含有有機物であり、
前記分散剤の含有量が下記式(1)の範囲であり、
前記還元剤は、ヒドラジン及びヒドラジン水和物から選ばれる少なくとも1つを含み、
前記還元剤の含有量が下記式(2)の範囲であることを特徴とする塗膜を含む製品。
0.00010≦(還元剤質量/酸化銅質量)≦0.10 (1)
0.0050≦(分散剤質量/酸化銅質量)≦0.30 (2) - 前記酸化銅の平均粒子径が3.0nm以上、50nm以下であることを特徴とする請求項9から請求項14のいずれかに記載の塗膜を含む製品。
- 酸化第一銅と、前記分散剤と、前記還元剤と、分散媒とを含み、
前記分散媒が炭素数7以下のモノアルコールであり、前記分散媒の塗膜中の含有量が30質量%以上、95質量%以下であることを特徴とする請求項9から請求項15のいずれかに記載の塗膜を含む製品。 - 請求項1から請求項8のいずれかに記載の酸化銅インクを用い、基板上に形成したパターンに、還元性ガスを含む雰囲気下でプラズマを発生させ焼成処理を行うことを特徴とする導電性基板の製造方法。
- 請求項1から請求項8のいずれかに記載の酸化銅インクを用い、基板上に塗膜を形成する工程と、
その塗膜にレーザ光を照射させる工程と、を含むことを特徴とする導電性基板の製造方法。 - 請求項1から請求項8のいずれかに記載の酸化銅インクを用い、基板上に塗膜を形成する工程と、
その塗膜にキセノン光を照射させる工程と、を含むことを特徴とする導電性基板の製造方法。 - 請求項9から請求項16のいずれかに記載の塗膜を含む製品を用い、
前記製品に、還元性ガスを含む雰囲気下でプラズマを発生させ焼成処理を行い、導電性パターンを得ることを特徴とする製品の製造方法。 - 請求項9から請求項16のいずれかに記載の塗膜を含む製品を用い、
前記製品に、レーザ光を照射させ、導電性パターンを得る工程を含むことを特徴とする製品の製造方法。 - 請求項9から請求項16のいずれかに記載の塗膜を含む製品を用い、
前記製品に、キセノン光を照射させ、導電性パターンを得る工程を含むことを特徴とする製品の製造方法。 - 前記導電性パターンがアンテナであることを特徴とする請求項20から請求項22のいずれかに記載の導電性パターン付製品の製造方法。
- 前記導電性パターンがメッシュ形状であることを特徴とする請求項20から請求項22のいずれかに記載の導電性パターン付製品の製造方法。
- 基板と、
前記基板の表面に形成された酸化第一銅含有層と、
前記酸化第一銅含有層の表面に形成された導電性層と、を具備し、
前記導電性層は線幅1.0μm以上、1000μm以下の配線であり、
前記配線は還元銅を含むことを特徴とする導電性パターン付製品。 - 基板と、
前記基板の表面に形成された酸化第一銅含有層と、
前記酸化第一銅含有層の表面に形成された導電性層と、を具備し、
前記導電性層は線幅1.0μm以上、1000μm以下の配線であり、
前記配線は還元銅、銅及びスズを含むことを特徴とする導電性パターン付製品。 - 基板と、
前記基板の表面に形成された導電性パターンと、を具備し、
前記導電性パターンは線幅1.0μm以上、1000μm以下の配線であり、
前記配線は還元銅、リン及びボイドを含むことを特徴とする導電性パターン付製品。 - 基板と、
前記基板の表面に形成された導電性パターンと、を具備し、
前記導電性パターンは線幅1.0μm以上、1000μm以下の配線であり、
前記配線は還元銅、銅及びスズを含むことを特徴とする導電性パターン付製品。 - 前記銅のグレインサイズが0.10μm以上、100μm以下であることを特徴とする請求項26又は請求項28に記載の導電性パターン付製品。
- 前記導電性層または前記導電性パターンの表面の表面粗さが20nm以上500nm以下であることを特徴とする請求項25から請求項29のいずれかに記載の導電性パターン付製品。
- 前記配線がアンテナとして利用できることを特徴とする請求項25から請求項30のいずれかに記載の導電性パターン付製品。
- 前記導電性層または前記導電性パターンの表面の一部にハンダ層が形成されていることを特徴とする請求項25から請求項31のいずれかに記載の導電性パターン付製品。
- 基板と、
前記基板の表面に形成された導電性パターンと、を具備し、
前記導電性パターンは線幅1.0μm以上、1000μm以下の配線であり、
前記配線は還元銅、酸化銅及びリンを含み、前記配線を覆うように樹脂が配置されていることを特徴とする導電性パターン付製品。
Priority Applications (10)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201880046305.2A CN110933948B (zh) | 2017-07-27 | 2018-07-27 | 氧化铜油墨和其在制品中的应用及各制品的制造方法 |
EP18837533.1A EP3660112B1 (en) | 2017-07-27 | 2018-07-27 | Copper oxide ink and method for producing conductive substrate using same, product containing coating film and method for producing product using same, method for producing product with conductive pattern, and product with conductive pattern |
CN202210063036.9A CN114395292B (zh) | 2017-07-27 | 2018-07-27 | 带导电性图案的制品 |
JP2019532881A JP7291078B2 (ja) | 2017-07-27 | 2018-07-27 | 酸化銅インク及びこれを用いた導電性基板の製造方法、塗膜を含む製品及びこれを用いた製品の製造方法、導電性パターン付製品の製造方法、並びに、導電性パターン付製品 |
KR1020227035809A KR102559500B1 (ko) | 2017-07-27 | 2018-07-27 | 산화구리 잉크 및 이것을 이용한 도전성 기판의 제조 방법, 도막을 포함하는 제품 및 이것을 이용한 제품의 제조 방법, 도전성 패턴을 갖는 제품의 제조 방법, 및 도전성 패턴을 갖는 제품 |
KR1020207000544A KR102456821B1 (ko) | 2017-07-27 | 2018-07-27 | 산화구리 잉크 및 이것을 이용한 도전성 기판의 제조 방법, 도막을 포함하는 제품 및 이것을 이용한 제품의 제조 방법, 도전성 패턴을 갖는 제품의 제조 방법, 및 도전성 패턴을 갖는 제품 |
EP21187184.3A EP3922451B1 (en) | 2017-07-27 | 2018-07-27 | Copper oxide ink and method for producing conductive substrate using same, product containing coating film and method for producing product using same, method for producing product with conductive pattern, and product with conductive pattern |
US16/633,396 US11760895B2 (en) | 2017-07-27 | 2018-07-27 | Copper oxide ink and method for producing conductive substrate using same, product containing coating film and method for producing product using same, method for producing product with conductive pattern, and product with conductive pattern |
JP2021159842A JP7403512B2 (ja) | 2017-07-27 | 2021-09-29 | 酸化銅インク及びこれを用いた導電性基板の製造方法、塗膜を含む製品及びこれを用いた製品の製造方法、導電性パターン付製品の製造方法、並びに、導電性パターン付製品 |
US18/199,739 US20230374329A1 (en) | 2017-07-27 | 2023-05-19 | Copper Oxide Ink and Method for Producing Conductive Substrate Using Same, Product Containing Coating Film and Method for Producing Product Using Same, Method for Producing Product with Conductive Pattern, and Product with Conductive Pattern |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017145188 | 2017-07-27 | ||
JP2017145187 | 2017-07-27 | ||
JP2017-145188 | 2017-07-27 | ||
JP2017-145187 | 2017-07-27 | ||
JP2018-023239 | 2018-02-13 | ||
JP2018023239 | 2018-02-13 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US16/633,396 A-371-Of-International US11760895B2 (en) | 2017-07-27 | 2018-07-27 | Copper oxide ink and method for producing conductive substrate using same, product containing coating film and method for producing product using same, method for producing product with conductive pattern, and product with conductive pattern |
US18/199,739 Division US20230374329A1 (en) | 2017-07-27 | 2023-05-19 | Copper Oxide Ink and Method for Producing Conductive Substrate Using Same, Product Containing Coating Film and Method for Producing Product Using Same, Method for Producing Product with Conductive Pattern, and Product with Conductive Pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2019022230A1 true WO2019022230A1 (ja) | 2019-01-31 |
Family
ID=65039831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2018/028238 WO2019022230A1 (ja) | 2017-07-27 | 2018-07-27 | 酸化銅インク及びこれを用いた導電性基板の製造方法、塗膜を含む製品及びこれを用いた製品の製造方法、導電性パターン付製品の製造方法、並びに、導電性パターン付製品 |
Country Status (7)
Country | Link |
---|---|
US (2) | US11760895B2 (ja) |
EP (2) | EP3660112B1 (ja) |
JP (4) | JP7291078B2 (ja) |
KR (2) | KR102456821B1 (ja) |
CN (2) | CN110933948B (ja) |
TW (1) | TWI704191B (ja) |
WO (1) | WO2019022230A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021075714A (ja) * | 2019-11-06 | 2021-05-20 | 旭化成株式会社 | 分散体及びこれを用いた導電性パターン付構造体の製造方法 |
US11520451B2 (en) | 2018-07-30 | 2022-12-06 | Asahi Kasei Kabushiki Kaisha | Conductive film and conductive film roll, electronic paper, touch panel and flat-panel display comprising the same |
EP4056365A4 (en) * | 2019-11-08 | 2023-01-04 | Asahi Kasei Kabushiki Kaisha | STRUCTURE COMPRISING A CONDUCTIVE PATTERN AND METHOD OF MANUFACTURING THEREOF |
US11877391B2 (en) | 2018-07-30 | 2024-01-16 | Asahi Kasei Kabushiki Kaisha | Conductive film and conductive film roll, electronic paper, touch panel and flat-panel display comprising the same |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112044497B (zh) * | 2020-08-26 | 2021-11-16 | 湖南环城高科农业发展有限公司 | 一种提高碾米率避免过碾的碾米机 |
Citations (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01220303A (ja) * | 1988-02-11 | 1989-09-04 | Heraeus Inc | 非酸化性の鋼製厚膜導体 |
JPH0714427A (ja) * | 1993-06-25 | 1995-01-17 | Hitachi Chem Co Ltd | 導電ペースト |
WO2003051562A1 (fr) | 2001-12-18 | 2003-06-26 | Asahi Kasei Kabushiki Kaisha | Dispersion d'oxyde metallique |
JP2004119686A (ja) * | 2002-09-26 | 2004-04-15 | Harima Chem Inc | 微細配線パターンの形成方法 |
JP2004253794A (ja) * | 2003-01-29 | 2004-09-09 | Fuji Photo Film Co Ltd | プリント配線基板形成用インク、プリント配線基板の形成方法及びプリント配線基板 |
JP2007080720A (ja) * | 2005-09-15 | 2007-03-29 | Asahi Kasei Corp | 導電性金属ペースト |
JP2009283547A (ja) * | 2008-05-20 | 2009-12-03 | Dainippon Printing Co Ltd | 導電性パターンの形成方法とその形成装置並びに導電性基板 |
JP2013115004A (ja) * | 2011-11-30 | 2013-06-10 | Nippon Parkerizing Co Ltd | 水系銅ペースト材料及び導電層の形成方法 |
WO2014119498A1 (ja) * | 2013-02-04 | 2014-08-07 | 富士フイルム株式会社 | 導電膜形成用組成物、導電膜の製造方法 |
JP2015018675A (ja) * | 2013-07-10 | 2015-01-29 | 富士フイルム株式会社 | 導電膜の製造方法および導電膜 |
WO2015012264A1 (ja) | 2013-07-23 | 2015-01-29 | 旭化成株式会社 | 銅及び/又は銅酸化物分散体、並びに該分散体を用いて形成された導電膜 |
JP2015210973A (ja) * | 2014-04-28 | 2015-11-24 | 大日本印刷株式会社 | 銅ナノ粒子分散体、及び導電性基板の製造方法 |
JP2016527665A (ja) * | 2013-06-13 | 2016-09-08 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニーE.I.Du Pont De Nemours And Company | ポリマー厚膜銅導体組成物の光焼結 |
EP3127969A1 (en) * | 2014-04-01 | 2017-02-08 | Korea Electronics Technology Institute | Ink composition for light sintering, wiring board using same and manufacturing method therefor |
JP2017145187A (ja) | 2016-02-16 | 2017-08-24 | パナソニックIpマネジメント株式会社 | 電気化学式水素ポンプ |
JP2017145188A (ja) | 2017-03-14 | 2017-08-24 | 日東電工株式会社 | 可撓性フィルムの製造方法 |
JP2018023239A (ja) | 2016-08-05 | 2018-02-08 | 東芝三菱電機産業システム株式会社 | 電力変換装置 |
Family Cites Families (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS549793A (en) | 1977-06-23 | 1979-01-24 | Bara Erekutoronikusu Corp | Copper base thick film conductive paste* conductive element and method of making same |
JPS60244093A (ja) | 1984-05-18 | 1985-12-03 | 株式会社東芝 | 回路基板の製造方法 |
JPS6381997A (ja) | 1986-09-26 | 1988-04-12 | 株式会社東芝 | レ−ザ光による導体路形成方法 |
JPH01129492A (ja) | 1987-11-16 | 1989-05-22 | Fuji Kagakushi Kogyo Co Ltd | プリント基板製造方法 |
JPH02174145A (ja) | 1988-12-26 | 1990-07-05 | Fujitsu Ltd | 窒化アルミニウム構造体及びその製造方法 |
JP2912737B2 (ja) | 1991-08-06 | 1999-06-28 | イビデン株式会社 | バイアホールを備えたプリント配線板の製造方法 |
JP4746252B2 (ja) | 1998-07-08 | 2011-08-10 | イビデン株式会社 | 多層プリント配線板 |
CN1199536C (zh) | 1999-10-26 | 2005-04-27 | 伊比登株式会社 | 多层印刷配线板及多层印刷配线板的制造方法 |
JP2003051562A (ja) | 2001-08-06 | 2003-02-21 | Matsushita Electric Ind Co Ltd | 半導体装置 |
JP4127379B2 (ja) | 2002-11-18 | 2008-07-30 | 電気化学工業株式会社 | アルミニウム−炭化珪素複合体の製造方法 |
DE10393790B4 (de) | 2002-12-03 | 2013-05-16 | Asahi Kasei Kabushiki Kaisha | Kupferoxid-Ultrafeinteilchen |
US20040185388A1 (en) | 2003-01-29 | 2004-09-23 | Hiroyuki Hirai | Printed circuit board, method for producing same, and ink therefor |
JP2004327703A (ja) | 2003-04-24 | 2004-11-18 | Konica Minolta Holdings Inc | 回路基板及び回路基板の製造方法 |
US20040211979A1 (en) | 2003-04-24 | 2004-10-28 | Konica Minolta Holdings, Inc. | Circuit board and method for manufacturing the circuit board |
JP2005071805A (ja) | 2003-08-25 | 2005-03-17 | Fuji Photo Film Co Ltd | 金属酸化物及び/又は金属水酸化物の粒子と金属の粒子を含む組成物、組成物を用いたプリント配線基板、その製造方法及びそれに用いるインク |
JP4710224B2 (ja) | 2003-12-24 | 2011-06-29 | ソニー株式会社 | 電界効果型トランジスタ及びその製造方法 |
US7981327B2 (en) | 2005-10-14 | 2011-07-19 | Toyo Ink Mfg. Co. Ltd. | Method for producing metal particle dispersion, conductive ink using metal particle dispersion produced by such method, and conductive coating film |
US8945686B2 (en) * | 2007-05-24 | 2015-02-03 | Ncc | Method for reducing thin films on low temperature substrates |
JP2008193067A (ja) | 2007-01-10 | 2008-08-21 | Sumitomo Electric Ind Ltd | 金属膜パターン形成方法 |
KR100951320B1 (ko) | 2007-07-26 | 2010-04-05 | 주식회사 엘지화학 | 레이저 조사에 의한 전기전도성 구리 패턴층의 형성방법 |
CN102137728B (zh) | 2008-08-29 | 2013-09-11 | 石原产业株式会社 | 金属铜分散液和其制造方法,以及使用它形成的电极、布线图案、涂膜、形成该涂膜的装饰物品、抗菌性物品和它们的制造方法 |
JPWO2010119787A1 (ja) | 2009-04-14 | 2012-10-22 | 旭化成イーマテリアルズ株式会社 | 導体層形成用組成物及び導体基板、並びに導体基板の製造方法 |
JP2011054748A (ja) | 2009-09-01 | 2011-03-17 | Fujifilm Corp | 有機電界発光素子、有機電界発光素子の製造方法、表示装置及び照明装置 |
CN104588643B (zh) | 2009-09-30 | 2017-08-29 | 大日本印刷株式会社 | 金属微粒分散体、导电性基板的制造方法及导电性基板 |
JP2011104815A (ja) | 2009-11-13 | 2011-06-02 | Asahi Kasei E-Materials Corp | 積層体および積層体の製造方法 |
JP2012009753A (ja) | 2010-06-28 | 2012-01-12 | Sekisui Chem Co Ltd | 太陽電池モジュール用導電材料及び太陽電池モジュール |
JP2012085215A (ja) | 2010-10-14 | 2012-04-26 | Panasonic Corp | アンテナ装置、電子機器 |
JP5513366B2 (ja) | 2010-12-28 | 2014-06-04 | 三ツ星ベルト株式会社 | パターン基板の製造方法 |
US8735874B2 (en) | 2011-02-14 | 2014-05-27 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device, display device, and method for manufacturing the same |
JP5849426B2 (ja) | 2011-03-31 | 2016-01-27 | 大日本印刷株式会社 | 金属酸化物微粒子分散体、導電性基板及びその製造方法 |
EP2741300B1 (en) | 2011-08-03 | 2019-04-17 | Hitachi Chemical Company, Ltd. | Composition set, conductive substrate and method of producing the same, and conductive adhesive composition |
JP2013072091A (ja) | 2011-09-26 | 2013-04-22 | Hitachi Cable Ltd | 金属微粒子およびその製造方法、金属微粒子を含む金属ペースト、並びに金属ペーストから形成される金属被膜 |
JP5926644B2 (ja) | 2011-09-30 | 2016-05-25 | Dowaエレクトロニクス株式会社 | 亜酸化銅粉末およびその製造方法 |
JP5772539B2 (ja) | 2011-11-21 | 2015-09-02 | 日立化成株式会社 | 酸化銅ペースト及び金属銅層の製造方法 |
TW201339279A (zh) * | 2011-11-24 | 2013-10-01 | Showa Denko Kk | 導電圖型形成方法及藉由光照射或微波加熱的導電圖型形成用組成物 |
CN102585602A (zh) * | 2012-02-13 | 2012-07-18 | 苏州晶讯科技股份有限公司 | 一种取代贵金属的印刷电路用催化油墨 |
JP5275498B1 (ja) | 2012-07-03 | 2013-08-28 | 石原薬品株式会社 | 導電膜形成方法及び焼結進行剤 |
WO2014017323A1 (ja) | 2012-07-26 | 2014-01-30 | Dic株式会社 | 反転印刷用導電性インキ及び薄膜トランジスタの製造方法及び該製造法方法で形成された薄膜トランジスタ |
JP2014041969A (ja) | 2012-08-23 | 2014-03-06 | Sumitomo Electric Printed Circuit Inc | プリント配線板の製造方法 |
JP6011254B2 (ja) | 2012-11-02 | 2016-10-19 | 住友金属鉱山株式会社 | Biを主成分とするはんだ合金との接合部を有する電子部品 |
JP2014167872A (ja) | 2013-02-28 | 2014-09-11 | Fujifilm Corp | 導電膜の製造方法、配線基板 |
JP2014199720A (ja) | 2013-03-29 | 2014-10-23 | 富士フイルム株式会社 | 導電膜形成用組成物およびこれを用いる導電膜の製造方法 |
JP5615401B1 (ja) | 2013-05-14 | 2014-10-29 | 石原ケミカル株式会社 | 銅微粒子分散液、導電膜形成方法及び回路基板 |
US20140377457A1 (en) | 2013-06-24 | 2014-12-25 | Xerox Corporation | Method of forming metal nanoparticle dispersion and dispersion formed thereby |
JP6118666B2 (ja) | 2013-07-02 | 2017-04-19 | 株式会社ディスコ | 切削装置 |
KR101594060B1 (ko) * | 2014-04-01 | 2016-02-16 | 전자부품연구원 | 나노산화구리 잉크 조성물, 그를 이용한 배선기판 및 그의 제조 방법 |
JP6316683B2 (ja) | 2014-07-03 | 2018-04-25 | 株式会社ノリタケカンパニーリミテド | 銅微粒子およびその製造方法 |
KR102018194B1 (ko) | 2014-08-29 | 2019-09-04 | 미쓰이금속광업주식회사 | 도전체의 접속 구조 및 그 제조 방법, 도전성 조성물 그리고 전자부품 모듈 |
US9999137B2 (en) * | 2014-11-04 | 2018-06-12 | Intrinsiq Materials, Inc. | Method for forming vias on printed circuit boards |
US11104813B2 (en) | 2015-06-02 | 2021-08-31 | Asahi Kasei Kabushiki Kaisha | Dispersion |
JP6033485B2 (ja) | 2016-04-21 | 2016-11-30 | 協立化学産業株式会社 | 被覆銅粒子 |
JP6726745B2 (ja) * | 2016-07-22 | 2020-07-22 | 富士フイルム株式会社 | 酸化銅微粒子の製造方法及び分散液 |
JP7139590B2 (ja) | 2017-09-28 | 2022-09-21 | 昭和電工マテリアルズ株式会社 | 導体形成用組成物、並びに接合体及びその製造方法 |
-
2018
- 2018-07-27 KR KR1020207000544A patent/KR102456821B1/ko active IP Right Grant
- 2018-07-27 EP EP18837533.1A patent/EP3660112B1/en active Active
- 2018-07-27 WO PCT/JP2018/028238 patent/WO2019022230A1/ja active Application Filing
- 2018-07-27 CN CN201880046305.2A patent/CN110933948B/zh active Active
- 2018-07-27 US US16/633,396 patent/US11760895B2/en active Active
- 2018-07-27 JP JP2019532881A patent/JP7291078B2/ja active Active
- 2018-07-27 KR KR1020227035809A patent/KR102559500B1/ko active IP Right Grant
- 2018-07-27 EP EP21187184.3A patent/EP3922451B1/en active Active
- 2018-07-27 TW TW107126156A patent/TWI704191B/zh active
- 2018-07-27 CN CN202210063036.9A patent/CN114395292B/zh active Active
-
2021
- 2021-01-12 JP JP2021002951A patent/JP7076591B2/ja active Active
- 2021-09-29 JP JP2021159842A patent/JP7403512B2/ja active Active
- 2021-12-27 JP JP2021213456A patent/JP2022048151A/ja active Pending
-
2023
- 2023-05-19 US US18/199,739 patent/US20230374329A1/en active Pending
Patent Citations (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01220303A (ja) * | 1988-02-11 | 1989-09-04 | Heraeus Inc | 非酸化性の鋼製厚膜導体 |
JPH0714427A (ja) * | 1993-06-25 | 1995-01-17 | Hitachi Chem Co Ltd | 導電ペースト |
WO2003051562A1 (fr) | 2001-12-18 | 2003-06-26 | Asahi Kasei Kabushiki Kaisha | Dispersion d'oxyde metallique |
JP2004119686A (ja) * | 2002-09-26 | 2004-04-15 | Harima Chem Inc | 微細配線パターンの形成方法 |
JP2004253794A (ja) * | 2003-01-29 | 2004-09-09 | Fuji Photo Film Co Ltd | プリント配線基板形成用インク、プリント配線基板の形成方法及びプリント配線基板 |
JP2007080720A (ja) * | 2005-09-15 | 2007-03-29 | Asahi Kasei Corp | 導電性金属ペースト |
JP2009283547A (ja) * | 2008-05-20 | 2009-12-03 | Dainippon Printing Co Ltd | 導電性パターンの形成方法とその形成装置並びに導電性基板 |
JP2013115004A (ja) * | 2011-11-30 | 2013-06-10 | Nippon Parkerizing Co Ltd | 水系銅ペースト材料及び導電層の形成方法 |
WO2014119498A1 (ja) * | 2013-02-04 | 2014-08-07 | 富士フイルム株式会社 | 導電膜形成用組成物、導電膜の製造方法 |
JP2016527665A (ja) * | 2013-06-13 | 2016-09-08 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニーE.I.Du Pont De Nemours And Company | ポリマー厚膜銅導体組成物の光焼結 |
JP2015018675A (ja) * | 2013-07-10 | 2015-01-29 | 富士フイルム株式会社 | 導電膜の製造方法および導電膜 |
WO2015012264A1 (ja) | 2013-07-23 | 2015-01-29 | 旭化成株式会社 | 銅及び/又は銅酸化物分散体、並びに該分散体を用いて形成された導電膜 |
EP3127969A1 (en) * | 2014-04-01 | 2017-02-08 | Korea Electronics Technology Institute | Ink composition for light sintering, wiring board using same and manufacturing method therefor |
JP2015210973A (ja) * | 2014-04-28 | 2015-11-24 | 大日本印刷株式会社 | 銅ナノ粒子分散体、及び導電性基板の製造方法 |
JP2017145187A (ja) | 2016-02-16 | 2017-08-24 | パナソニックIpマネジメント株式会社 | 電気化学式水素ポンプ |
JP2018023239A (ja) | 2016-08-05 | 2018-02-08 | 東芝三菱電機産業システム株式会社 | 電力変換装置 |
JP2017145188A (ja) | 2017-03-14 | 2017-08-24 | 日東電工株式会社 | 可撓性フィルムの製造方法 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11520451B2 (en) | 2018-07-30 | 2022-12-06 | Asahi Kasei Kabushiki Kaisha | Conductive film and conductive film roll, electronic paper, touch panel and flat-panel display comprising the same |
US11620028B2 (en) | 2018-07-30 | 2023-04-04 | Asahi Kasei Kabushiki Kaisha | Conductive film and conductive film roll, electronic paper, touch panel and flat-panel display comprising the same |
US11635863B2 (en) | 2018-07-30 | 2023-04-25 | Asahi Kasei Kabushiki Kaisha | Conductive film and conductive film roll, electronic paper, touch panel and flat-panel display comprising the same |
US11877391B2 (en) | 2018-07-30 | 2024-01-16 | Asahi Kasei Kabushiki Kaisha | Conductive film and conductive film roll, electronic paper, touch panel and flat-panel display comprising the same |
JP2021075714A (ja) * | 2019-11-06 | 2021-05-20 | 旭化成株式会社 | 分散体及びこれを用いた導電性パターン付構造体の製造方法 |
JP7159262B2 (ja) | 2019-11-06 | 2022-10-24 | 旭化成株式会社 | 分散体及びこれを用いた導電性パターン付構造体の製造方法 |
EP4056365A4 (en) * | 2019-11-08 | 2023-01-04 | Asahi Kasei Kabushiki Kaisha | STRUCTURE COMPRISING A CONDUCTIVE PATTERN AND METHOD OF MANUFACTURING THEREOF |
Also Published As
Publication number | Publication date |
---|---|
EP3660112A4 (en) | 2020-11-18 |
CN110933948A (zh) | 2020-03-27 |
EP3660112B1 (en) | 2021-08-25 |
US20230374329A1 (en) | 2023-11-23 |
EP3660112A1 (en) | 2020-06-03 |
JP7076591B2 (ja) | 2022-05-27 |
US20210155818A1 (en) | 2021-05-27 |
KR20220142551A (ko) | 2022-10-21 |
JP2022048151A (ja) | 2022-03-25 |
JP2022008655A (ja) | 2022-01-13 |
JP2021077648A (ja) | 2021-05-20 |
JPWO2019022230A1 (ja) | 2020-05-28 |
JP7403512B2 (ja) | 2023-12-22 |
KR20200018583A (ko) | 2020-02-19 |
KR102559500B1 (ko) | 2023-07-24 |
CN114395292B (zh) | 2023-03-10 |
KR102456821B1 (ko) | 2022-10-19 |
CN110933948B (zh) | 2022-07-19 |
TW201910448A (zh) | 2019-03-16 |
JP7291078B2 (ja) | 2023-06-14 |
EP3922451B1 (en) | 2023-06-28 |
TWI704191B (zh) | 2020-09-11 |
EP3922451A1 (en) | 2021-12-15 |
US11760895B2 (en) | 2023-09-19 |
CN114395292A (zh) | 2022-04-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7403512B2 (ja) | 酸化銅インク及びこれを用いた導電性基板の製造方法、塗膜を含む製品及びこれを用いた製品の製造方法、導電性パターン付製品の製造方法、並びに、導電性パターン付製品 | |
JP7316414B2 (ja) | 分散体並びにこれを用いた導電性パターン付構造体の製造方法及び導電性パターン付構造体 | |
JP7430483B2 (ja) | 導電性パターン領域付構造体及びその製造方法 | |
JP2022106695A (ja) | 分散体、塗膜を含む製品、導電性パターン付き構造体の製造方法、及び、導電性パターン付き構造体 | |
JP7208803B2 (ja) | 導電性パターン領域付構造体及びその製造方法 | |
JP6847994B2 (ja) | 分散体の製造方法 | |
JP7174618B2 (ja) | 錫又は酸化錫インク、塗膜を含む製品及び導電性基板の製造方法 | |
JP7193433B2 (ja) | 分散体及びこれを用いた導電性パターン付構造体の製造方法 | |
JP2019210469A (ja) | インクジェット用酸化銅インク及びこれを用いて導電性パターンを付与した導電性基板の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 18837533 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2019532881 Country of ref document: JP Kind code of ref document: A |
|
ENP | Entry into the national phase |
Ref document number: 20207000544 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2018837533 Country of ref document: EP |
|
ENP | Entry into the national phase |
Ref document number: 2018837533 Country of ref document: EP Effective date: 20200227 |