WO2009144837A1 - 試験装置および情報処理システム - Google Patents
試験装置および情報処理システム Download PDFInfo
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- WO2009144837A1 WO2009144837A1 PCT/JP2008/064251 JP2008064251W WO2009144837A1 WO 2009144837 A1 WO2009144837 A1 WO 2009144837A1 JP 2008064251 W JP2008064251 W JP 2008064251W WO 2009144837 A1 WO2009144837 A1 WO 2009144837A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
Definitions
- the present invention relates to a test apparatus and an information processing system for testing a device under test.
- a test apparatus for designated countries where incorporation by reference of documents is permitted, the contents described in the following application are incorporated into this application by reference and made a part of this application. 1. US Patent Application No. 61/057206 Filing Date May 30, 2008
- a test apparatus for testing a semiconductor device or the like includes one or a plurality of test units and a control device. Each test unit provides a test signal to the device under test.
- the control device is realized by a computer connected to each test unit with a serial communication cable or the like.
- the control device gives a command to each of the plurality of test units to control the plurality of test units.
- a test apparatus includes a timer device or the like that is frequently accessed by the control device in the vicinity of the control device.
- the control device first issues a command for causing the test unit to start predetermined processing, then issues a timer start command for instructing the timer device to start timing, and then after the set time elapses to the test unit. Issue a command to start another process.
- a read command to the test unit is issued and read according to the read command. It is conceivable to issue a timer start command after receiving data from the test unit. This ensures that the command issued to the test unit prior to the timer start command has already been started by the test unit. That is, the execution order of processing by the test unit and the timer device can be matched with the order of commands issued by the control device.
- control device that has issued the read command cannot issue another command until data read in response to the read command is received from the test unit. Therefore, when the read command to the test unit is inserted before the timer start command in this way, the control device has to consume a redundant waiting time.
- an object of the present invention is to provide a test apparatus and an information processing system that can solve the above-described problems. This object is achieved by a combination of features described in the independent claims.
- the dependent claims define further advantageous specific examples of the present invention.
- a test apparatus for testing a device under test which controls a test unit that transmits and receives signals to and from the device under test A control device, and a relay device that relays between the control device and the test unit.
- the relay device receives a command from the control device to the relay device and transfers the command to the test unit;
- the second communication unit that receives a return command that the test unit that has received the command returns to the relay device, and executes the processing specified by the return command in response to the second communication unit receiving the return command And a test device having a portion.
- a processing unit a control device that controls the processing unit, and a relay device that relays between the control device and the processing unit.
- a first communication unit that receives a command to the apparatus and transfers the command to the processing unit; a second communication unit that receives a return command that the processing unit that receives the command returns to the relay apparatus; and a second communication unit that receives the return command.
- An information processing system is provided that includes an execution unit that executes a process specified by a return command in response to receiving the command.
- FIG. 1 shows a configuration of a test apparatus 10 according to an embodiment of the present invention.
- FIG. 2 shows the configuration of the test unit 12 and the relay device 16 according to the embodiment of the present invention.
- FIG. 3 shows an example of propagation of the write command when the control device 14 issues a write command to the test unit 12.
- FIG. 4 shows an example of propagation of the read command when the control device 14 issues a read command to the test unit 12.
- FIG. 5 shows a first example of propagation of the timer start command when the control device 14 issues a timer start command to the relay device 16.
- FIG. 6 shows an example of propagation of the timer read command when the control device 14 issues a timer read command to the relay device 16.
- FIG. 7 shows a second example of propagation of the timer start command when the control device 14 issues a timer start command to the relay device 16.
- FIG. 1 shows a configuration of a test apparatus 10 according to the present embodiment.
- the test apparatus 10 tests a device under test such as a semiconductor device.
- the test apparatus 10 includes one or a plurality of test units 12, a control device 14, and a relay device 16.
- Each test unit 12 exchanges signals with the device under test.
- the test unit 12 supplies a test signal having a waveform corresponding to the test pattern to the device under test, and compares the response signal from the device under test with a logical value corresponding to the expected value pattern. Judge the quality of the.
- the control device 14 gives a command to each of one or a plurality of test units 12 to control each test unit 12.
- the control device 14 may be realized by a computer that functions as the control device 14 by executing a program.
- the relay device 16 relays commands and responses transmitted between the control device 14 and each of the one or more test units 12.
- the control device 14 and each of the one or more relay devices 16 may be connected by one or a plurality of transmission paths 22 of about several meters for transmitting serial data.
- the relay device 16 and each test unit 12 may be connected by a tester bus 24 that transmits parallel data.
- FIG. 2 shows the configuration of the test unit 12 and the relay device 16 according to the present embodiment.
- the relay device 16 includes a first communication unit 32, a second communication unit 34, an execution unit 36, and a bus IF unit 38.
- the first communication unit 32 receives a command transmitted from the control device 14 to the test unit 12 from the control device 14. The first communication unit 32 generates a packet including the received command. Then, the first communication unit 32 transmits the generated packet to the transmission path 22 connected to the test unit 12 to which the packet is to be transmitted, via the bus IF unit 38.
- the second communication unit 34 receives a packet transmitted from each of the one or more test units 12 via the bus IF unit 38.
- the second communication unit 34 takes out a command included in the packet or a response to the transmitted command. Then, the second communication unit 34 sends the extracted command or response to the control device 14.
- the execution unit 36 receives a command given to the relay device 16 and executes a process specified by the command. For example, the execution unit 36 performs a timer operation or a counter operation.
- the execution unit 36 when performing a timer operation, starts timing when it receives a timer start command.
- the execution unit 36 ends timing after a predetermined set time has elapsed since the start of timing.
- the execution unit 36 may write information such as a flag indicating that the timing has ended into a register, or may give an interrupt to the issuer of the timer start command.
- the execution unit 36 may continue timing until a timer end command or a timer pause command is given.
- the bus IF unit 38 converts data transmitted from the relay device 16 to the test unit 12 from a format handled by the relay device 16 (for example, parallel data) to a transmission format of the transmission path 22 (for example, serial data). In addition, the bus IF unit 38 converts the data transmitted from the test unit 12 to the relay device 16 from the transmission format (for example, serial data) of the transmission path 22 to the format handled by the relay device 16 (for example, parallel data). To do.
- Each of the one or more test units 12 includes a function test unit 42, a DC test unit 44, a bus IF unit 46, and a transmission / reception unit 48.
- the function test unit 42 performs a function test on the device under test.
- the function test unit 42 operates in accordance with a command given from the control device 14.
- DC test unit 44 supplies a DC power supply voltage to the device under test. Furthermore, the DC test unit 44 performs a DC test on the device under test. The DC test unit 44 operates in accordance with a command given from the control device 14.
- the bus IF unit 46 converts data transmitted from the test unit 12 to the relay device 16 from a format handled by the test unit 12 (for example, parallel data) to a transmission format of the transmission path 22 (for example, serial data). In addition, the bus IF unit 46 converts the data transmitted from the relay device 16 to the test unit 12 from the transmission format of the transmission path 22 (for example, serial data) to the format handled by the test unit 12 (for example, parallel data). To do.
- the transmission / reception unit 48 receives a packet including a command or a response transmitted from the control device 14 to the test unit 12 from the relay device 16 via the bus IF unit 46.
- the transmission / reception unit 48 extracts a command or response included in the packet. Then, the transmission / reception unit 48 sends the extracted command or response to the function test unit 42 or the DC test unit 44.
- the transmission / reception unit 48 receives a command or response to be transmitted from the function test unit 42 and the DC test unit 44 to the control device 14.
- the transmission / reception unit 48 generates a packet including the received command or response. Then, the transmission / reception unit 48 transmits the generated packet to the relay device 16 via the bus IF unit 46.
- the relay device 16 and the test unit 12 having such a configuration receive a command (for example, a timer start command or a counter start command) that causes the execution unit 36 to execute processing from the control device 14, the relay device 16 and the test unit 12 operate as follows. First, the first communication unit 32 of the relay device 16 receives a command from the control device 14 to the relay device 16.
- a command for example, a timer start command or a counter start command
- the first communication unit 32 when receiving a command from the control device 14 to the relay device 16, the first communication unit 32 generates a packet including the command and transfers it to the test unit 12. In this case, the first communication unit 32 may transfer the packet including the command to one test unit 12, or the command may be sent to each of the plurality of test units 12 connected to the relay device 16. May be forwarded.
- the transmission / reception unit 48 of the test unit 12 when receiving a command from the relay device 16, the transmission / reception unit 48 of the test unit 12 generates a return command for returning the received command to the relay device 16. Then, the transmitting / receiving unit 48 generates a packet including the return command and returns it to the relay device 16.
- the second communication unit 34 of the relay device 16 receives the packet including the return command
- the second communication unit 34 provides the execution unit 36 with the return command included in the received packet.
- the execution unit 36 executes processing (for example, timer operation or counter operation) specified by the return command in response to the second communication unit 34 receiving the return command.
- processing for example, timer operation or counter operation
- the execution unit 36 is designated by the return command in response to receiving the return command from all of the plurality of test units 12. May be executed.
- the relay device 16 when the relay device 16 receives a command from the control device 14 for instructing execution to the execution unit 36 provided therein, the relay device 16 temporarily transfers the command to the test unit 12 and receives a return. The execution of 36 is started. Thereby, according to the test apparatus 10, even if the command propagation time from the control apparatus 14 to the test unit 12 is longer than the command propagation time from the control apparatus 14 to the execution unit 36, the test unit 12 and The command execution order by the execution unit 36 can be matched with the command issue order by the control device 14.
- control device 14 issues a write command as a command for instructing the execution unit 36 included in the relay device 16 to start execution.
- the control device 14 can issue the next command and execute other processes after issuing the command, the relay device 16 can be operated without consuming redundant waiting time. it can.
- the relay device 16 When the relay device 16 having such a configuration receives a read command (for example, a timer read command or a counter read command) for reading the execution result of the process by the execution unit 36 from the control device 14, the relay device 16 operates as follows. To do. First, the first communication unit 32 of the relay device 16 receives a read command for reading the execution result of the execution unit 36 from the control device 14.
- a read command for example, a timer read command or a counter read command
- the execution unit 36 returns an execution result to the control device 14 via the second communication unit 34 in response to the first communication unit 32 receiving the read command.
- the relay device 16 receives a setting command for setting a value in the execution unit 36 and a pause command for temporarily stopping the processing of the execution unit 36 instead of the read command for reading the execution result. Processing may be performed.
- the relay device 16 when the relay device 16 receives a read command from the control device 14 to the execution unit 36 included therein, the relay device 16 returns a response to the read command to the control device 14 without transferring it to the test unit 12.
- a response to the read command can be returned to the control apparatus 14 in a short time.
- FIG. 3 shows an example of propagation of the write command when the control device 14 issues a write command to the test unit 12.
- the vertical axis represents time
- the horizontal axis represents command propagation position at each time. The same applies to the drawings after FIG.
- a command described as “swt” at the beginning represents a write command for writing data to a specified address of the storage device.
- “TH1, PG” following “swt” represents an address designating a place to write data.
- “DATA” following the address (“TH1 PG”) represents data to be written. The same applies to the drawings after FIG.
- the write command issued by the control device 14 is sequentially transferred in the order of the control device 14 ⁇ the relay device 16 ⁇ the transmission / reception unit 48 of the test unit 12 ⁇ the function test unit 42 of the test unit 12.
- the functional test unit 42 of the test unit 12 writes the data included in the write command to the designated address.
- controller 14 when the controller 14 issues a write command, it can execute the next process immediately after issuing the write command. Accordingly, in the example of FIG. 3, the control device 14 can execute another process after time 2.
- FIG. 4 shows an example of propagation of the read command when the control device 14 issues a read command to the test unit 12.
- a command described as “srd” at the beginning represents a read command for reading data from a specified address of the storage device.
- “TH1 PG” following “srd” represents an address for designating a location to read data.
- a command including “DATA” following “srd TH1, PG” represents a response corresponding to the read command.
- “DATA” represents the data read in response to the read command.
- the read command shown in FIG. 4 is issued by the control device 14.
- the read command issued by the control device 14 is sequentially transferred in the order of the control device 14 ⁇ the relay device 16 ⁇ the transmission / reception unit 48 of the test unit 12 ⁇ the function test unit 42 of the test unit 12.
- the functional test unit 42 of the test unit 12 reads data from the address indicated by the read command and issues a response including the read data.
- the response issued by the function test unit 42 of the test unit 12 is sequentially transferred in the order of the function test unit 42 of the test unit 12 ⁇ the transmission / reception unit 48 of the test unit 12 ⁇ the relay device 16 ⁇ the control device 14.
- control device 14 issues a read command, it cannot execute the next process until a response is received. Therefore, in this example, the control device 14 cannot execute processing from time 2 to time 13.
- FIG. 5 shows a first example of propagation of the timer start command when the control device 14 issues a timer start command to the relay device 16.
- a command described as “swt TimerStart” represents a write command that causes the execution unit 36 in the relay device 16 to start a timer operation. The same applies to FIG.
- the timer start command shown in FIG. The timer start command issued by the control device 14 is transferred from the control device 14 to the relay device 16.
- the relay device 16 transfers the timer start command to the test unit 12.
- the transmission / reception unit 48 of the test unit 12 When the transmission / reception unit 48 of the test unit 12 receives the timer start command from the relay device 16, it returns the received command to the relay device 16 as a return command. Then, the execution unit 36 in the relay device 16 starts the timer operation in response to receiving the return command from the test unit 12.
- the timer start command does not arrive at the execution unit 36 in the relay apparatus 16 before the command issued before the timer start command arrives at the test unit 12.
- the command execution order by the test unit 12 and the execution unit 36 can be matched with the command issue order by the control apparatus 14.
- control device 14 issues a timer start command that is a write command. Therefore, the control device 14 can execute the next process immediately after issuing the timer start command. Therefore, according to the test apparatus 10, the control apparatus 14 can start the timer operation without consuming redundant waiting time. Note that the test apparatus 10 also transfers a command in the same manner as the timer start command when the execution unit 36 of the relay apparatus 16 starts an operation other than the timer operation (for example, a counter operation).
- FIG. 6 shows an example of propagation of the timer read command when the control device 14 issues a timer read command to the relay device 16.
- a command described as “srd TimerRead” represents a timer read command for reading the time measurement result of the execution unit 36 in the relay device 16.
- the timer read command issued by the control device 14 is transmitted from the control device 14 to the relay device 16.
- the relay device 16 receives the timer read command
- the relay device 16 reads the current timer measurement result and issues a response including the read data. Then, the response issued by the relay device 16 is transmitted to the control device 14.
- the relay device 16 responds directly without transferring a command to the test unit 12 when the control device 14 reads the time measurement result by the timer. Thereby, the control apparatus 14 can read the timing result of a timer in a short time.
- the control device 14 may issue a read command similar to the timer read command also when setting the initial value of the timer, when stopping the timer operation, when temporarily stopping the timer operation, or the like.
- FIG. 7 shows a second example of propagation of the timer start command when the control device 14 issues a timer start command to the relay device 16.
- the timer start command issued by the control apparatus 14 may be propagated as shown in FIG. 7 instead of being propagated as shown in FIG. .
- the relay device 16 transfers the timer start command to each of the plurality of test units 12.
- the transmission / reception unit 48 of each of the plurality of test units 12 receives the timer start command from the relay device 16, it returns the received command to the relay device 16 as a return command.
- the execution unit 36 in the relay device 16 starts a timer operation in response to receiving the return command from all of the plurality of test units 12.
- a test apparatus 10 controls the execution order of commands by the plurality of test units 12 and the execution unit 36 even when the command propagation times from the relay apparatus 16 to each of the plurality of test units 12 are different from each other.
- the order of commands issued by the device 14 can be matched.
- the technology described through the above embodiment can be applied to a general information processing system that is not limited to the test apparatus 10.
- the technology described through the above embodiment in an information processing system including one or a processing unit that processes information, a control device that controls the processing unit, and a relay device that relays between the control device and the processing unit Can be applied.
- the processing unit of the information processing system has the same function and configuration as the test unit 12 of the above embodiment
- the control device of the information processing system has the same function and the same as the control device 14 of the above embodiment.
- the relay device of the information processing system has the same function and configuration as the relay device 16 of the above embodiment.
Abstract
Description
1.米国特許出願第61/057206号 出願日 2008年5月30日
Claims (6)
- 被試験デバイスを試験する試験装置であって、
前記被試験デバイスとの間で信号を授受する試験ユニットと、
前記試験ユニットを制御する制御装置と、
前記制御装置と前記試験ユニットとの間を中継する中継装置と、
を備え、
前記中継装置は、
前記制御装置から当該中継装置へのコマンドを受けて、前記試験ユニットへ転送する第1通信部と、
前記コマンドを受け取った前記試験ユニットが当該中継装置へ折り返し返送する折返コマンドを受け取る第2通信部と、
前記第2通信部が前記折返コマンドを受け取ったことに応じて、前記折返コマンドにより指定される処理を実行する実行部と、
を有する試験装置。 - 前記実行部は、前記折返コマンドを受けたことに応じて、タイマ動作またはカウンタ動作を開始する
請求項1に記載の試験装置。 - 複数の前記試験ユニットを備え、
前記中継装置は、前記制御装置と、前記複数の試験ユニットのそれぞれとの間を中継し、
前記第1通信部は、前記複数の試験ユニットのそれぞれに対して、前記コマンドを転送し、
前記実行部は、前記複数の試験ユニットの全てから前記折返コマンドを受けたことに応じて、前記折返コマンドにより指定される処理を実行する
請求項1から2の何れかに記載の試験装置。 - 前記制御装置は、前記中継装置へ書込コマンドを発行し、
前記中継装置の前記第1通信部は、前記制御装置により発行された前記書込コマンドを、前記試験ユニットへ転送し、
前記試験ユニットは、前記中継装置から前記書込コマンドを受けると、受け取った前記書込コマンドを前記折返コマンドとして前記中継装置へ返送し、
前記中継装置の前記実行部は、前記試験ユニットから前記折返コマンドを受け取ったことに応じて処理を実行する
請求項1から3の何れかに記載の試験装置。 - 前記第1通信部は、前記制御装置から、前記実行部の実行結果を読み出す読出コマンドを受け取り、
前記実行部は、前記第1通信部が前記読出コマンドを受け取ったことに応じて、実行結果を前記制御装置に返信する
請求項1から4の何れかに記載の試験装置。 - 処理ユニットと、
前記処理ユニットを制御する制御装置と、
前記制御装置と前記処理ユニットとの間を中継する中継装置と、
を備え、
前記中継装置は、
前記制御装置から当該中継装置へのコマンドを受けて、前記処理ユニットへ転送する第1通信部と、
前記コマンドを受け取った前記処理ユニットが当該中継装置へ折り返し返送する折返コマンドを受け取る第2通信部と、
前記第2通信部が前記折返コマンドを受け取ったことに応じて、前記折返コマンドにより指定される処理を実行する実行部と、
を有する情報処理システム。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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JP2010514324A JP4674273B2 (ja) | 2008-05-30 | 2008-08-07 | 試験装置および情報処理システム |
KR1020107025746A KR101137537B1 (ko) | 2008-05-30 | 2008-08-07 | 시험 장치 및 정보 처리 시스템 |
US12/945,736 US8942946B2 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
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US5720608P | 2008-05-30 | 2008-05-30 | |
US61/057,206 | 2008-05-30 |
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US12/945,736 Continuation US8942946B2 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
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PCT/JP2008/064349 WO2009144839A1 (ja) | 2008-05-30 | 2008-08-08 | 試験装置および情報処理システム |
PCT/JP2008/064347 WO2009144838A1 (ja) | 2008-05-30 | 2008-08-08 | 試験装置、情報処理システムおよびデータ伝送方法 |
PCT/JP2008/065598 WO2009144844A1 (ja) | 2008-05-30 | 2008-08-29 | 試験装置および試験方法 |
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PCT/JP2008/064347 WO2009144838A1 (ja) | 2008-05-30 | 2008-08-08 | 試験装置、情報処理システムおよびデータ伝送方法 |
PCT/JP2008/065598 WO2009144844A1 (ja) | 2008-05-30 | 2008-08-29 | 試験装置および試験方法 |
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JP (4) | JP4674273B2 (ja) |
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US10288685B2 (en) * | 2014-04-30 | 2019-05-14 | Keysight Technologies, Inc. | Multi-bank digital stimulus response in a single field programmable gate array |
TWI615619B (zh) * | 2016-06-24 | 2018-02-21 | 致伸科技股份有限公司 | 與受測物通訊之方法以及應用該方法之系統 |
TWI653519B (zh) * | 2017-05-03 | 2019-03-11 | 和碩聯合科技股份有限公司 | 配置單元、檢測系統及檢測方法 |
CN114968365B (zh) * | 2022-07-27 | 2022-10-28 | 广州智慧城市发展研究院 | 适配器寄存器单元及包含其的主机适配器电路 |
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WO2008044421A1 (fr) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Testeur et procédé de commande |
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JP4674274B2 (ja) | 2011-04-20 |
KR20110005271A (ko) | 2011-01-17 |
JP4674275B2 (ja) | 2011-04-20 |
KR101215387B1 (ko) | 2012-12-26 |
US20110208448A1 (en) | 2011-08-25 |
KR20110005273A (ko) | 2011-01-17 |
JPWO2009144839A1 (ja) | 2011-09-29 |
JPWO2009144837A1 (ja) | 2011-09-29 |
KR101137539B1 (ko) | 2012-04-23 |
KR20110005265A (ko) | 2011-01-17 |
JP4674273B2 (ja) | 2011-04-20 |
WO2009144838A1 (ja) | 2009-12-03 |
US20110208465A1 (en) | 2011-08-25 |
KR20110005283A (ko) | 2011-01-17 |
US20110282616A1 (en) | 2011-11-17 |
JPWO2009144844A1 (ja) | 2011-09-29 |
US20110196638A1 (en) | 2011-08-11 |
WO2009144839A1 (ja) | 2009-12-03 |
KR101137537B1 (ko) | 2012-04-23 |
US8942946B2 (en) | 2015-01-27 |
KR101138198B1 (ko) | 2012-05-14 |
JPWO2009144838A1 (ja) | 2011-09-29 |
WO2009144844A1 (ja) | 2009-12-03 |
US8805634B2 (en) | 2014-08-12 |
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