DE602004017327D1 - Testvorrichtung, korrekturwert-verwaltungsverfahren und entsprechendes computerprogramm - Google Patents

Testvorrichtung, korrekturwert-verwaltungsverfahren und entsprechendes computerprogramm

Info

Publication number
DE602004017327D1
DE602004017327D1 DE602004017327T DE602004017327T DE602004017327D1 DE 602004017327 D1 DE602004017327 D1 DE 602004017327D1 DE 602004017327 T DE602004017327 T DE 602004017327T DE 602004017327 T DE602004017327 T DE 602004017327T DE 602004017327 D1 DE602004017327 D1 DE 602004017327D1
Authority
DE
Germany
Prior art keywords
computer program
correction value
test device
corresponding computer
value management
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004017327T
Other languages
English (en)
Inventor
Shigeki Takizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602004017327D1 publication Critical patent/DE602004017327D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
DE602004017327T 2003-08-06 2004-07-30 Testvorrichtung, korrekturwert-verwaltungsverfahren und entsprechendes computerprogramm Active DE602004017327D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003287376 2003-08-06
PCT/JP2004/010964 WO2005015250A1 (ja) 2003-08-06 2004-07-30 試験装置、補正値管理方法、及びプログラム

Publications (1)

Publication Number Publication Date
DE602004017327D1 true DE602004017327D1 (de) 2008-12-04

Family

ID=34114018

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004017327T Active DE602004017327D1 (de) 2003-08-06 2004-07-30 Testvorrichtung, korrekturwert-verwaltungsverfahren und entsprechendes computerprogramm

Country Status (9)

Country Link
US (1) US7350123B2 (de)
EP (1) EP1655614B1 (de)
JP (1) JP4707557B2 (de)
KR (1) KR20060057600A (de)
CN (1) CN1829919A (de)
DE (1) DE602004017327D1 (de)
MY (1) MY135870A (de)
TW (1) TWI353516B (de)
WO (1) WO2005015250A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW525216B (en) * 2000-12-11 2003-03-21 Semiconductor Energy Lab Semiconductor device, and manufacturing method thereof
SG111923A1 (en) * 2000-12-21 2005-06-29 Semiconductor Energy Lab Light emitting device and method of manufacturing the same
DE10324080B4 (de) * 2003-05-27 2006-03-23 Infineon Technologies Ag Verfahren zum Testen von zu testenden Schaltungseinheiten in einer Testvorrichtung
JP2006275986A (ja) * 2005-03-30 2006-10-12 Advantest Corp 診断プログラム、切替プログラム、試験装置、および診断方法
JP4721762B2 (ja) * 2005-04-25 2011-07-13 株式会社アドバンテスト 試験装置
JP4571534B2 (ja) * 2005-05-12 2010-10-27 株式会社アドバンテスト 試験装置、診断プログラムおよび診断方法
US8242796B2 (en) * 2008-02-21 2012-08-14 Advantest (Singapore) Pte Ltd Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive units
KR101215388B1 (ko) * 2008-05-30 2012-12-26 가부시키가이샤 어드밴티스트 시험 장치 및 송신 장치
WO2009144837A1 (ja) 2008-05-30 2009-12-03 株式会社アドバンテスト 試験装置および情報処理システム
KR100912716B1 (ko) * 2009-02-24 2009-08-19 한영흠 비파괴 도막 두께 측정기의 캘리브레이션 이식 방법
JP5359570B2 (ja) * 2009-06-03 2013-12-04 富士通株式会社 メモリ試験制御装置およびメモリ試験制御方法
KR20120061140A (ko) * 2010-10-25 2012-06-13 삼성전자주식회사 피시험 소자의 테스트 장치 및 이를 이용한 피시험 소자의 테스트 방법
JP5841458B2 (ja) * 2012-03-01 2016-01-13 株式会社アドバンテスト 試験装置および試験モジュール
DE102012108458A1 (de) * 2012-09-11 2014-03-13 Endress + Hauser Process Solutions Ag Verfahren zum sicheren Betreiben einer Anlage der Prozess- und/oder Automatisierungstechnik
US20220299567A1 (en) * 2021-03-17 2022-09-22 Changxin Memory Technologies, Inc. Method and device for testing integrated circuit
CN113064048A (zh) * 2021-03-17 2021-07-02 长鑫存储技术有限公司 集成电路测试方法及设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5262716A (en) * 1992-04-21 1993-11-16 Hewlett-Packard Company Tester calibration procedure which includes fixturing
JPH06148279A (ja) * 1992-10-30 1994-05-27 Yokogawa Hewlett Packard Ltd 電子デバイス試験・測定装置、およびそのタイミングならびに電圧レベル校正方法
JPH10105385A (ja) * 1996-09-27 1998-04-24 Ando Electric Co Ltd オブジェクトファイル情報表示装置
JPH10170603A (ja) * 1996-12-13 1998-06-26 Ando Electric Co Ltd Ｉｃテスタのキャリブレーション方法
US5793815A (en) * 1996-12-13 1998-08-11 International Business Machines Corporation Calibrated multi-voltage level signal transmission system
JP2000137057A (ja) * 1998-10-30 2000-05-16 Ando Electric Co Ltd Ｉｃ試験装置
JP2003504713A (ja) * 1999-07-05 2003-02-04 バース・テック・リミテッド 家庭および商用機器用のデジタル電子制御装置
JP2001124817A (ja) * 1999-10-28 2001-05-11 Ando Electric Co Ltd バーンインボード、テストバーンイン装置およびテストバーンイン装置におけるスキュー補正方法
KR100341599B1 (ko) * 2000-02-12 2002-06-22 장성환 모듈디바이스용 테스팅장치 및 방법
US6573990B1 (en) * 2000-02-21 2003-06-03 Tektronix, Inc. Optical system providing concurrent detection of a calibration signal and a test signal in an optical spectrum analyzer
JP2002199217A (ja) * 2000-12-25 2002-07-12 Canon Inc 画像読み取り装置及び画像読み取り方法
JP4366018B2 (ja) * 2001-01-17 2009-11-18 キヤノン株式会社 キャリブレーション方法およびプリント装置
WO2002075343A1 (en) * 2001-03-19 2002-09-26 Teradyne, Inc. Ate calibration method and corresponding test equipment

Also Published As

Publication number Publication date
EP1655614A4 (de) 2006-08-16
TWI353516B (en) 2011-12-01
KR20060057600A (ko) 2006-05-26
EP1655614B1 (de) 2008-10-22
TW200516383A (en) 2005-05-16
EP1655614A1 (de) 2006-05-10
US20050034043A1 (en) 2005-02-10
JPWO2005015250A1 (ja) 2007-09-27
MY135870A (en) 2008-07-31
JP4707557B2 (ja) 2011-06-22
US7350123B2 (en) 2008-03-25
CN1829919A (zh) 2006-09-06
WO2005015250A1 (ja) 2005-02-17

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