DE602004022347D1 - Testeinrichtung und Testverfahren - Google Patents

Testeinrichtung und Testverfahren

Info

Publication number
DE602004022347D1
DE602004022347D1 DE602004022347T DE602004022347T DE602004022347D1 DE 602004022347 D1 DE602004022347 D1 DE 602004022347D1 DE 602004022347 T DE602004022347 T DE 602004022347T DE 602004022347 T DE602004022347 T DE 602004022347T DE 602004022347 D1 DE602004022347 D1 DE 602004022347D1
Authority
DE
Germany
Prior art keywords
test
facility
procedure
test procedure
test facility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004022347T
Other languages
English (en)
Inventor
Selji Ichiyoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602004022347D1 publication Critical patent/DE602004022347D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
DE602004022347T 2003-03-31 2004-03-24 Testeinrichtung und Testverfahren Expired - Lifetime DE602004022347D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/403,817 US7290192B2 (en) 2003-03-31 2003-03-31 Test apparatus and test method for testing plurality of devices in parallel

Publications (1)

Publication Number Publication Date
DE602004022347D1 true DE602004022347D1 (de) 2009-09-10

Family

ID=32990043

Family Applications (2)

Application Number Title Priority Date Filing Date
DE602004016973T Expired - Lifetime DE602004016973D1 (de) 2003-03-31 2004-03-24 Testeinrichtung und testverfahren
DE602004022347T Expired - Lifetime DE602004022347D1 (de) 2003-03-31 2004-03-24 Testeinrichtung und Testverfahren

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE602004016973T Expired - Lifetime DE602004016973D1 (de) 2003-03-31 2004-03-24 Testeinrichtung und testverfahren

Country Status (9)

Country Link
US (2) US7290192B2 (de)
EP (2) EP1884789B1 (de)
JP (2) JP3748269B2 (de)
KR (1) KR20050113271A (de)
CN (3) CN101231325B (de)
DE (2) DE602004016973D1 (de)
MY (1) MY131932A (de)
TW (1) TWI315406B (de)
WO (1) WO2004088339A1 (de)

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* Cited by examiner, † Cited by third party
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Also Published As

Publication number Publication date
EP1884789B1 (de) 2009-07-29
DE602004016973D1 (de) 2008-11-20
TWI315406B (en) 2009-10-01
JPWO2004088339A1 (ja) 2006-07-06
EP1884789A3 (de) 2008-02-13
US7290192B2 (en) 2007-10-30
JP2006053160A (ja) 2006-02-23
KR20050113271A (ko) 2005-12-01
CN100489554C (zh) 2009-05-20
EP1610135A4 (de) 2006-12-20
JP4704178B2 (ja) 2011-06-15
US20040193990A1 (en) 2004-09-30
EP1884789A2 (de) 2008-02-06
CN101231325B (zh) 2011-08-31
US7272765B2 (en) 2007-09-18
TW200506397A (en) 2005-02-16
CN1756960A (zh) 2006-04-05
US20040255216A1 (en) 2004-12-16
EP1610135B1 (de) 2008-10-08
CN101231325A (zh) 2008-07-30
EP1610135B8 (de) 2009-03-04
EP1610135A1 (de) 2005-12-28
MY131932A (en) 2007-09-28
CN1768275A (zh) 2006-05-03
JP3748269B2 (ja) 2006-02-22
CN100432689C (zh) 2008-11-12
WO2004088339A1 (ja) 2004-10-14

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