WO2009028037A1 - システム、中継装置、試験装置、およびデバイスの製造方法 - Google Patents
システム、中継装置、試験装置、およびデバイスの製造方法 Download PDFInfo
- Publication number
- WO2009028037A1 WO2009028037A1 PCT/JP2007/066554 JP2007066554W WO2009028037A1 WO 2009028037 A1 WO2009028037 A1 WO 2009028037A1 JP 2007066554 W JP2007066554 W JP 2007066554W WO 2009028037 A1 WO2009028037 A1 WO 2009028037A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- access
- access information
- block
- section
- end device
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Data Exchanges In Wide-Area Networks (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/066554 WO2009028037A1 (ja) | 2007-08-27 | 2007-08-27 | システム、中継装置、試験装置、およびデバイスの製造方法 |
DE112007003637T DE112007003637T5 (de) | 2007-08-27 | 2007-08-27 | System, Weitergabeeinrichtung, Prüfvorrichtung, und Herstellungsverfahren für eine Einheit |
JP2009529887A JP5080580B2 (ja) | 2007-08-27 | 2007-08-27 | システム、中継装置、および試験装置 |
US12/712,168 US20100191895A1 (en) | 2007-08-27 | 2010-02-24 | System, test apparatus and relay apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/066554 WO2009028037A1 (ja) | 2007-08-27 | 2007-08-27 | システム、中継装置、試験装置、およびデバイスの製造方法 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/712,168 Continuation US20100191895A1 (en) | 2007-08-27 | 2010-02-24 | System, test apparatus and relay apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009028037A1 true WO2009028037A1 (ja) | 2009-03-05 |
Family
ID=40386781
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/066554 WO2009028037A1 (ja) | 2007-08-27 | 2007-08-27 | システム、中継装置、試験装置、およびデバイスの製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20100191895A1 (ja) |
JP (1) | JP5080580B2 (ja) |
DE (1) | DE112007003637T5 (ja) |
WO (1) | WO2009028037A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011154026A (ja) * | 2010-01-26 | 2011-08-11 | Advantest Corp | 試験装置および試験方法 |
KR101554024B1 (ko) * | 2012-10-26 | 2015-09-30 | 주식회사 씽크윈텍 | 정보의 고속 획득을 위한 데이터 중계 시스템 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2012073395A1 (ja) * | 2010-11-29 | 2014-05-19 | 株式会社アドバンテスト | 通信システムおよび試験装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH022262A (ja) * | 1988-06-15 | 1990-01-08 | Fuji Facom Corp | 階層型データ伝送システムのポーリング方法 |
JPH1051867A (ja) * | 1996-08-01 | 1998-02-20 | Nec Eng Ltd | デバイス監視システム |
JP2003008600A (ja) * | 2001-06-25 | 2003-01-10 | Nec Corp | データ収集方式および方法 |
JP2003087417A (ja) * | 2001-09-10 | 2003-03-20 | Toshiba Corp | 遠隔地立会試験システム |
JP2003229880A (ja) * | 2002-02-05 | 2003-08-15 | Yokogawa Electric Corp | 広域監視制御システム |
JP2005260635A (ja) * | 2004-03-12 | 2005-09-22 | Matsushita Electric Works Ltd | 中継親装置及び遠隔監視システム |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6267950A (ja) * | 1985-09-19 | 1987-03-27 | Toshiba Corp | フアクシミリ伝送方式 |
JPS62199162A (ja) * | 1986-02-27 | 1987-09-02 | Toshiba Corp | フアクシミリ通信方式 |
JPH07118828B2 (ja) * | 1987-12-03 | 1995-12-18 | 富士通株式会社 | 伝送装置制御信号伝送方式 |
JPH02234560A (ja) * | 1989-03-08 | 1990-09-17 | Fuji Xerox Co Ltd | 中継同報送信システム |
JPH04115395A (ja) * | 1990-09-06 | 1992-04-16 | Hochiki Corp | 防災監視装置 |
JPH06225058A (ja) * | 1993-01-22 | 1994-08-12 | Konica Corp | ファクシミリ装置 |
JP3295193B2 (ja) * | 1993-10-19 | 2002-06-24 | 能美防災株式会社 | 火災報知設備 |
JP3295194B2 (ja) * | 1993-10-19 | 2002-06-24 | 能美防災株式会社 | 火災報知設備 |
JPH10170602A (ja) * | 1996-12-10 | 1998-06-26 | Oki Electric Ind Co Ltd | 検査システム |
US6499121B1 (en) * | 1999-03-01 | 2002-12-24 | Formfactor, Inc. | Distributed interface for parallel testing of multiple devices using a single tester channel |
US6779140B2 (en) * | 2001-06-29 | 2004-08-17 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with test sites operating in a slave mode |
JP2004040630A (ja) * | 2002-07-05 | 2004-02-05 | Canon Inc | 遠隔監視装置及び遠隔監視装置の制御方法及び遠隔監視装置の制御プログラム及び記憶媒体 |
US7290192B2 (en) * | 2003-03-31 | 2007-10-30 | Advantest Corporation | Test apparatus and test method for testing plurality of devices in parallel |
JP2007047008A (ja) | 2005-08-10 | 2007-02-22 | Advantest Corp | 半導体試験装置 |
US8145958B2 (en) * | 2005-11-10 | 2012-03-27 | Arm Limited | Integrated circuit and method for testing memory on the integrated circuit |
WO2008044421A1 (fr) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Testeur et procédé de commande |
US8258803B2 (en) * | 2010-01-26 | 2012-09-04 | Advantest Corporation | Test apparatus and test method |
-
2007
- 2007-08-27 WO PCT/JP2007/066554 patent/WO2009028037A1/ja active Application Filing
- 2007-08-27 DE DE112007003637T patent/DE112007003637T5/de not_active Withdrawn
- 2007-08-27 JP JP2009529887A patent/JP5080580B2/ja not_active Expired - Fee Related
-
2010
- 2010-02-24 US US12/712,168 patent/US20100191895A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH022262A (ja) * | 1988-06-15 | 1990-01-08 | Fuji Facom Corp | 階層型データ伝送システムのポーリング方法 |
JPH1051867A (ja) * | 1996-08-01 | 1998-02-20 | Nec Eng Ltd | デバイス監視システム |
JP2003008600A (ja) * | 2001-06-25 | 2003-01-10 | Nec Corp | データ収集方式および方法 |
JP2003087417A (ja) * | 2001-09-10 | 2003-03-20 | Toshiba Corp | 遠隔地立会試験システム |
JP2003229880A (ja) * | 2002-02-05 | 2003-08-15 | Yokogawa Electric Corp | 広域監視制御システム |
JP2005260635A (ja) * | 2004-03-12 | 2005-09-22 | Matsushita Electric Works Ltd | 中継親装置及び遠隔監視システム |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011154026A (ja) * | 2010-01-26 | 2011-08-11 | Advantest Corp | 試験装置および試験方法 |
US8258803B2 (en) | 2010-01-26 | 2012-09-04 | Advantest Corporation | Test apparatus and test method |
KR101554024B1 (ko) * | 2012-10-26 | 2015-09-30 | 주식회사 씽크윈텍 | 정보의 고속 획득을 위한 데이터 중계 시스템 |
Also Published As
Publication number | Publication date |
---|---|
JP5080580B2 (ja) | 2012-11-21 |
JPWO2009028037A1 (ja) | 2010-11-25 |
DE112007003637T5 (de) | 2010-07-15 |
US20100191895A1 (en) | 2010-07-29 |
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