WO2009028037A1 - システム、中継装置、試験装置、およびデバイスの製造方法 - Google Patents

システム、中継装置、試験装置、およびデバイスの製造方法 Download PDF

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Publication number
WO2009028037A1
WO2009028037A1 PCT/JP2007/066554 JP2007066554W WO2009028037A1 WO 2009028037 A1 WO2009028037 A1 WO 2009028037A1 JP 2007066554 W JP2007066554 W JP 2007066554W WO 2009028037 A1 WO2009028037 A1 WO 2009028037A1
Authority
WO
WIPO (PCT)
Prior art keywords
access
access information
block
section
end device
Prior art date
Application number
PCT/JP2007/066554
Other languages
English (en)
French (fr)
Inventor
Kazumoto Tamura
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to PCT/JP2007/066554 priority Critical patent/WO2009028037A1/ja
Priority to DE112007003637T priority patent/DE112007003637T5/de
Priority to JP2009529887A priority patent/JP5080580B2/ja
Publication of WO2009028037A1 publication Critical patent/WO2009028037A1/ja
Priority to US12/712,168 priority patent/US20100191895A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)

Abstract

　複数のアクセスのそれぞれについて、アクセス対象の対象アドレスおよび当該アクセス対象に対して実行すべき内容を指示するアクセスコマンドを含むアクセス情報を格納したアクセス情報ブロックを生成するブロック生成部と、生成したアクセス情報ブロックを中継装置へ転送するブロック転送部とを有する要求側装置と、要求側装置からアクセス情報ブロックを受信するブロック受信部と、転送されたアクセス情報ブロックに含まれるそれぞれのアクセス情報に基づいて、対応するアクセスを応答側装置に対して順次発行するアクセス発行部とを有する中継装置と、中継装置からアクセス情報ブロックに含まれるそれぞれのアクセス情報に対応する各アクセスを受信するアクセス受信部と、受信したアクセスの対象アドレスに対応する記憶領域に対してアクセス処理を実行するアクセス処理部とを有する応答側装置と、を備えるシステムを提供する。
PCT/JP2007/066554 2007-08-27 2007-08-27 システム、中継装置、試験装置、およびデバイスの製造方法 WO2009028037A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
PCT/JP2007/066554 WO2009028037A1 (ja) 2007-08-27 2007-08-27 システム、中継装置、試験装置、およびデバイスの製造方法
DE112007003637T DE112007003637T5 (de) 2007-08-27 2007-08-27 System, Weitergabeeinrichtung, Prüfvorrichtung, und Herstellungsverfahren für eine Einheit
JP2009529887A JP5080580B2 (ja) 2007-08-27 2007-08-27 システム、中継装置、および試験装置
US12/712,168 US20100191895A1 (en) 2007-08-27 2010-02-24 System, test apparatus and relay apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/066554 WO2009028037A1 (ja) 2007-08-27 2007-08-27 システム、中継装置、試験装置、およびデバイスの製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/712,168 Continuation US20100191895A1 (en) 2007-08-27 2010-02-24 System, test apparatus and relay apparatus

Publications (1)

Publication Number Publication Date
WO2009028037A1 true WO2009028037A1 (ja) 2009-03-05

Family

ID=40386781

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/066554 WO2009028037A1 (ja) 2007-08-27 2007-08-27 システム、中継装置、試験装置、およびデバイスの製造方法

Country Status (4)

Country Link
US (1) US20100191895A1 (ja)
JP (1) JP5080580B2 (ja)
DE (1) DE112007003637T5 (ja)
WO (1) WO2009028037A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011154026A (ja) * 2010-01-26 2011-08-11 Advantest Corp 試験装置および試験方法
KR101554024B1 (ko) * 2012-10-26 2015-09-30 주식회사 씽크윈텍 정보의 고속 획득을 위한 데이터 중계 시스템

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2012073395A1 (ja) * 2010-11-29 2014-05-19 株式会社アドバンテスト 通信システムおよび試験装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH022262A (ja) * 1988-06-15 1990-01-08 Fuji Facom Corp 階層型データ伝送システムのポーリング方法
JPH1051867A (ja) * 1996-08-01 1998-02-20 Nec Eng Ltd デバイス監視システム
JP2003008600A (ja) * 2001-06-25 2003-01-10 Nec Corp データ収集方式および方法
JP2003087417A (ja) * 2001-09-10 2003-03-20 Toshiba Corp 遠隔地立会試験システム
JP2003229880A (ja) * 2002-02-05 2003-08-15 Yokogawa Electric Corp 広域監視制御システム
JP2005260635A (ja) * 2004-03-12 2005-09-22 Matsushita Electric Works Ltd 中継親装置及び遠隔監視システム

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* Cited by examiner, † Cited by third party
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JPS6267950A (ja) * 1985-09-19 1987-03-27 Toshiba Corp フアクシミリ伝送方式
JPS62199162A (ja) * 1986-02-27 1987-09-02 Toshiba Corp フアクシミリ通信方式
JPH07118828B2 (ja) * 1987-12-03 1995-12-18 富士通株式会社 伝送装置制御信号伝送方式
JPH02234560A (ja) * 1989-03-08 1990-09-17 Fuji Xerox Co Ltd 中継同報送信システム
JPH04115395A (ja) * 1990-09-06 1992-04-16 Hochiki Corp 防災監視装置
JPH06225058A (ja) * 1993-01-22 1994-08-12 Konica Corp ファクシミリ装置
JP3295193B2 (ja) * 1993-10-19 2002-06-24 能美防災株式会社 火災報知設備
JP3295194B2 (ja) * 1993-10-19 2002-06-24 能美防災株式会社 火災報知設備
JPH10170602A (ja) * 1996-12-10 1998-06-26 Oki Electric Ind Co Ltd 検査システム
US6499121B1 (en) * 1999-03-01 2002-12-24 Formfactor, Inc. Distributed interface for parallel testing of multiple devices using a single tester channel
US6779140B2 (en) * 2001-06-29 2004-08-17 Agilent Technologies, Inc. Algorithmically programmable memory tester with test sites operating in a slave mode
JP2004040630A (ja) * 2002-07-05 2004-02-05 Canon Inc 遠隔監視装置及び遠隔監視装置の制御方法及び遠隔監視装置の制御プログラム及び記憶媒体
US7290192B2 (en) * 2003-03-31 2007-10-30 Advantest Corporation Test apparatus and test method for testing plurality of devices in parallel
JP2007047008A (ja) 2005-08-10 2007-02-22 Advantest Corp 半導体試験装置
US8145958B2 (en) * 2005-11-10 2012-03-27 Arm Limited Integrated circuit and method for testing memory on the integrated circuit
WO2008044421A1 (fr) * 2006-10-12 2008-04-17 Advantest Corporation Testeur et procédé de commande
US8258803B2 (en) * 2010-01-26 2012-09-04 Advantest Corporation Test apparatus and test method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH022262A (ja) * 1988-06-15 1990-01-08 Fuji Facom Corp 階層型データ伝送システムのポーリング方法
JPH1051867A (ja) * 1996-08-01 1998-02-20 Nec Eng Ltd デバイス監視システム
JP2003008600A (ja) * 2001-06-25 2003-01-10 Nec Corp データ収集方式および方法
JP2003087417A (ja) * 2001-09-10 2003-03-20 Toshiba Corp 遠隔地立会試験システム
JP2003229880A (ja) * 2002-02-05 2003-08-15 Yokogawa Electric Corp 広域監視制御システム
JP2005260635A (ja) * 2004-03-12 2005-09-22 Matsushita Electric Works Ltd 中継親装置及び遠隔監視システム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011154026A (ja) * 2010-01-26 2011-08-11 Advantest Corp 試験装置および試験方法
US8258803B2 (en) 2010-01-26 2012-09-04 Advantest Corporation Test apparatus and test method
KR101554024B1 (ko) * 2012-10-26 2015-09-30 주식회사 씽크윈텍 정보의 고속 획득을 위한 데이터 중계 시스템

Also Published As

Publication number Publication date
JP5080580B2 (ja) 2012-11-21
JPWO2009028037A1 (ja) 2010-11-25
DE112007003637T5 (de) 2010-07-15
US20100191895A1 (en) 2010-07-29

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