DE602004016891D1 - Testvorrichtung - Google Patents

Testvorrichtung

Info

Publication number
DE602004016891D1
DE602004016891D1 DE602004016891T DE602004016891T DE602004016891D1 DE 602004016891 D1 DE602004016891 D1 DE 602004016891D1 DE 602004016891 T DE602004016891 T DE 602004016891T DE 602004016891 T DE602004016891 T DE 602004016891T DE 602004016891 D1 DE602004016891 D1 DE 602004016891D1
Authority
DE
Germany
Prior art keywords
test device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004016891T
Other languages
English (en)
Inventor
Shinsaku Higashi
Seiji Ichiyoshi
Ankan Pramanick
Mark Elston
Leon Chen
Robert Sauer
Ramachandran Krishnaswamy
Harsanjeet Singh
Toshiaki Adachi
Yoshihumi Tahara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/404,002 external-priority patent/US7460988B2/en
Priority claimed from US10/403,817 external-priority patent/US7290192B2/en
Priority claimed from PCT/JP2004/001649 external-priority patent/WO2004072670A1/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602004016891D1 publication Critical patent/DE602004016891D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
DE602004016891T 2003-03-31 2004-03-30 Testvorrichtung Expired - Lifetime DE602004016891D1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US10/404,002 US7460988B2 (en) 2003-03-31 2003-03-31 Test emulator, test module emulator, and record medium storing program therein
US10/403,817 US7290192B2 (en) 2003-03-31 2003-03-31 Test apparatus and test method for testing plurality of devices in parallel
PCT/JP2004/001649 WO2004072670A1 (en) 2003-02-14 2004-02-16 Method and structure to develop a test program for semiconductor integrated circuits
PCT/JP2004/001648 WO2004072669A1 (en) 2003-02-14 2004-02-16 Method and apparatus for testing integrated circuits

Publications (1)

Publication Number Publication Date
DE602004016891D1 true DE602004016891D1 (de) 2008-11-13

Family

ID=33161956

Family Applications (2)

Application Number Title Priority Date Filing Date
DE602004016891T Expired - Lifetime DE602004016891D1 (de) 2003-03-31 2004-03-30 Testvorrichtung
DE602004007498T Expired - Lifetime DE602004007498T2 (de) 2003-03-31 2004-03-30 Testemulationseinrichtung

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE602004007498T Expired - Lifetime DE602004007498T2 (de) 2003-03-31 2004-03-30 Testemulationseinrichtung

Country Status (7)

Country Link
EP (3) EP1870724A1 (de)
JP (1) JP3735636B2 (de)
KR (1) KR20050113273A (de)
DE (2) DE602004016891D1 (de)
MY (1) MY134825A (de)
TW (1) TWI389033B (de)
WO (1) WO2004090562A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7460988B2 (en) 2003-03-31 2008-12-02 Advantest Corporation Test emulator, test module emulator, and record medium storing program therein
US7913002B2 (en) 2004-08-20 2011-03-22 Advantest Corporation Test apparatus, configuration method, and device interface
JP2006275986A (ja) 2005-03-30 2006-10-12 Advantest Corp 診断プログラム、切替プログラム、試験装置、および診断方法
KR100731106B1 (ko) * 2005-12-29 2007-06-22 동부일렉트로닉스 주식회사 라이브러리 테스트 회로 및 그 방법
KR100768916B1 (ko) * 2006-07-03 2007-10-19 삼성전자주식회사 패킷 수집/분석 장치 및 이를 이용한 에뮬레이션 방법
JP5023582B2 (ja) * 2006-07-05 2012-09-12 横河電機株式会社 半導体集積回路試験装置及び方法
KR100873956B1 (ko) 2006-08-17 2008-12-15 삼성전자주식회사 에뮬레이션 시스템
KR100884983B1 (ko) * 2007-06-26 2009-02-23 주식회사 동부하이텍 표준 셀 라이브러리의 성능 개선을 위한 측정 장치
US20090119084A1 (en) * 2007-11-05 2009-05-07 Advantest Corporation System, method, and program product for simulating test equipment
US7779313B2 (en) * 2008-03-30 2010-08-17 Advantest Corporation Testing apparatus and testing method
US8165027B2 (en) 2008-12-08 2012-04-24 Advantest Corporation Test apparatus and test method
KR20110003182A (ko) 2009-07-03 2011-01-11 삼성전자주식회사 인쇄 회로 기판 설계 방법 및 인쇄 회로 기판을 포함하는 패키지 테스트 디바이스
JP2013113665A (ja) * 2011-11-28 2013-06-10 Advantest Corp 試験パターン生成装置、試験プログラム生成装置、生成方法、プログラム、および試験装置
KR101310609B1 (ko) * 2012-03-30 2013-09-24 주식회사 이노와이어리스 Ｙａｍｌ을 이용하여 ｌｔｅ 계측 장비를 위한 데이터 및 인터페이스 생성장치 및 생성방법
CN108628734B (zh) * 2017-03-21 2023-03-28 中兴通讯股份有限公司 一种功能程序调试方法和终端
KR102583174B1 (ko) 2018-06-12 2023-09-26 삼성전자주식회사 테스트 인터페이스 보드, 이를 포함하는 테스트 시스템 및 이의 동작 방법
CN111949365B (zh) * 2019-05-17 2024-06-18 中车株洲电力机车研究所有限公司 离线仿真方法及计算机存储介质
US11302412B2 (en) * 2019-06-03 2022-04-12 Advantest Corporation Systems and methods for simulated device testing using a memory-based communication protocol
CN111447016B (zh) * 2020-04-02 2022-06-21 上海创远仪器技术股份有限公司 针对信道模拟器的信道模型实现正确性验证处理的方法
CN113624250B (zh) * 2020-05-09 2024-05-10 航天科工惯性技术有限公司 一种自动温循测试装置和方法
TWI719917B (zh) * 2020-07-14 2021-02-21 金麗科技股份有限公司 將類比動態電路運用於數位測試工具的處理方法
CN113157573B (zh) * 2021-04-19 2024-06-07 上海湃星信息科技有限公司 一种软件测试验证系统及其构建方法
TWI772189B (zh) * 2021-09-24 2022-07-21 英業達股份有限公司 硬碟模擬裝置及應用該裝置的測試系統及其測試方法
CN115774663B (zh) * 2022-09-15 2024-07-09 江苏瑞蓝自动化设备集团有限公司 一种LabVIEW的测试系统的优化方法、装置、设备及存储介质
KR102558492B1 (ko) * 2022-10-12 2023-07-25 한국철도기술연구원 열차자동운행장치 시뮬레이션 고속화 시스템 및 이를 이용한 고속화 방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2570558B2 (ja) * 1992-11-20 1997-01-08 日本電気株式会社 ハードウェア・エミュレータ
JP2001184225A (ja) * 1999-12-27 2001-07-06 Toshiba Microelectronics Corp エミュレータ及びエミュレート方法

Also Published As

Publication number Publication date
TWI389033B (zh) 2013-03-11
EP1610136A4 (de) 2006-05-17
EP1610136B1 (de) 2007-07-11
EP1767955A1 (de) 2007-03-28
EP1870724A1 (de) 2007-12-26
JP3735636B2 (ja) 2006-01-18
DE602004007498D1 (de) 2007-08-23
MY134825A (en) 2007-12-31
WO2004090562A1 (ja) 2004-10-21
EP1610136A1 (de) 2005-12-28
EP1767955B1 (de) 2008-10-01
TW200428200A (en) 2004-12-16
JPWO2004090562A1 (ja) 2006-07-06
KR20050113273A (ko) 2005-12-01
DE602004007498T2 (de) 2008-03-13

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Legal Events

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