DE602004011490D1 - Testvorrichtung - Google Patents
TestvorrichtungInfo
- Publication number
- DE602004011490D1 DE602004011490D1 DE602004011490T DE602004011490T DE602004011490D1 DE 602004011490 D1 DE602004011490 D1 DE 602004011490D1 DE 602004011490 T DE602004011490 T DE 602004011490T DE 602004011490 T DE602004011490 T DE 602004011490T DE 602004011490 D1 DE602004011490 D1 DE 602004011490D1
- Authority
- DE
- Germany
- Prior art keywords
- test device
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003087049 | 2003-03-27 | ||
JP2003087049 | 2003-03-27 | ||
PCT/JP2004/003651 WO2004086071A1 (ja) | 2003-03-27 | 2004-03-18 | 試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602004011490D1 true DE602004011490D1 (de) | 2008-03-13 |
DE602004011490T2 DE602004011490T2 (de) | 2009-01-15 |
Family
ID=33095088
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004011490T Expired - Lifetime DE602004011490T2 (de) | 2003-03-27 | 2004-03-18 | Testvorrichtung |
Country Status (9)
Country | Link |
---|---|
US (1) | US7185255B2 (de) |
EP (1) | EP1607758B1 (de) |
JP (1) | JP4110169B2 (de) |
KR (1) | KR100717480B1 (de) |
CN (1) | CN100442073C (de) |
DE (1) | DE602004011490T2 (de) |
MY (1) | MY135253A (de) |
TW (1) | TWI261117B (de) |
WO (1) | WO2004086071A1 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4110169B2 (ja) | 2003-03-27 | 2008-07-02 | 株式会社アドバンテスト | 試験装置 |
DE10324080B4 (de) * | 2003-05-27 | 2006-03-23 | Infineon Technologies Ag | Verfahren zum Testen von zu testenden Schaltungseinheiten in einer Testvorrichtung |
JP2006275986A (ja) * | 2005-03-30 | 2006-10-12 | Advantest Corp | 診断プログラム、切替プログラム、試験装置、および診断方法 |
JP5021924B2 (ja) * | 2005-09-27 | 2012-09-12 | 株式会社アドバンテスト | パフォーマンスボード、試験装置及び試験方法 |
US7610538B2 (en) | 2007-04-13 | 2009-10-27 | Advantest Corporation | Test apparatus and performance board for diagnosis |
JP5153670B2 (ja) * | 2009-01-30 | 2013-02-27 | 株式会社アドバンテスト | 診断装置、診断方法および試験装置 |
KR101281823B1 (ko) * | 2012-11-30 | 2013-07-04 | 주식회사 아이티엔티 | 고정형 파워 보드와 교체형 코어 보드를 포함하는 자동 테스트 장치 |
FR3005745B1 (fr) * | 2013-05-16 | 2016-10-14 | Thales Sa | Banc de test d'equipements electroniques |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4795977A (en) * | 1987-03-19 | 1989-01-03 | Pacific Western Systems, Inc. | Interface system for interfacing a device tester to a device under test |
JPH06265594A (ja) * | 1993-03-15 | 1994-09-22 | Advantest Corp | Ic試験装置 |
GB2282244B (en) * | 1993-09-23 | 1998-01-14 | Advanced Risc Mach Ltd | Integrated circuit |
JP3628789B2 (ja) * | 1995-12-28 | 2005-03-16 | 株式会社アドバンテスト | 半導体テストシステムの自動校正装置 |
US5705743A (en) * | 1996-11-13 | 1998-01-06 | Ford Global Technologies, Inc. | Method for identifying parameter identifiers of a motor vehicle |
US5938776A (en) * | 1997-06-27 | 1999-08-17 | Digital Equipment Corporation | Detection of SCSI devices at illegal locations |
US6029261A (en) * | 1997-10-14 | 2000-02-22 | International Business Machines Corporation | Test circuit and system for interconnect testing of high-level packages |
JPH11304880A (ja) * | 1998-04-20 | 1999-11-05 | Advantest Corp | 半導体試験装置 |
US5999468A (en) * | 1998-11-17 | 1999-12-07 | Tanisys Technology, Inc. | Method and system for identifying a memory module configuration |
US6331770B1 (en) * | 2000-04-12 | 2001-12-18 | Advantest Corp. | Application specific event based semiconductor test system |
WO2003034202A2 (en) * | 2001-10-17 | 2003-04-24 | Koninklijke Philips Electronics N.V. | On the fly configuration of electronic device with attachable sub-modules |
JP4110169B2 (ja) | 2003-03-27 | 2008-07-02 | 株式会社アドバンテスト | 試験装置 |
-
2004
- 2004-03-18 JP JP2005504016A patent/JP4110169B2/ja not_active Expired - Fee Related
- 2004-03-18 EP EP04721691A patent/EP1607758B1/de not_active Expired - Fee Related
- 2004-03-18 DE DE602004011490T patent/DE602004011490T2/de not_active Expired - Lifetime
- 2004-03-18 CN CNB2004800082699A patent/CN100442073C/zh not_active Expired - Fee Related
- 2004-03-18 WO PCT/JP2004/003651 patent/WO2004086071A1/ja active IP Right Grant
- 2004-03-18 KR KR1020057017746A patent/KR100717480B1/ko active IP Right Grant
- 2004-03-23 TW TW093107729A patent/TWI261117B/zh not_active IP Right Cessation
- 2004-03-26 MY MYPI20041091A patent/MY135253A/en unknown
- 2004-06-01 US US10/858,456 patent/US7185255B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JPWO2004086071A1 (ja) | 2006-06-29 |
EP1607758B1 (de) | 2008-01-23 |
JP4110169B2 (ja) | 2008-07-02 |
WO2004086071A1 (ja) | 2004-10-07 |
TW200428006A (en) | 2004-12-16 |
EP1607758A1 (de) | 2005-12-21 |
TWI261117B (en) | 2006-09-01 |
MY135253A (en) | 2008-03-31 |
KR100717480B1 (ko) | 2007-05-14 |
DE602004011490T2 (de) | 2009-01-15 |
CN100442073C (zh) | 2008-12-10 |
US20040221214A1 (en) | 2004-11-04 |
KR20050109600A (ko) | 2005-11-21 |
CN1764846A (zh) | 2006-04-26 |
EP1607758A4 (de) | 2006-04-19 |
US7185255B2 (en) | 2007-02-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |