FR3005745B1 - Banc de test d'equipements electroniques - Google Patents

Banc de test d'equipements electroniques

Info

Publication number
FR3005745B1
FR3005745B1 FR1301128A FR1301128A FR3005745B1 FR 3005745 B1 FR3005745 B1 FR 3005745B1 FR 1301128 A FR1301128 A FR 1301128A FR 1301128 A FR1301128 A FR 1301128A FR 3005745 B1 FR3005745 B1 FR 3005745B1
Authority
FR
France
Prior art keywords
electronic equipment
test bench
bench
test
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1301128A
Other languages
English (en)
Other versions
FR3005745A1 (fr
Inventor
David Houlbert
Michel Charrier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thales SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales SA filed Critical Thales SA
Priority to FR1301128A priority Critical patent/FR3005745B1/fr
Publication of FR3005745A1 publication Critical patent/FR3005745A1/fr
Application granted granted Critical
Publication of FR3005745B1 publication Critical patent/FR3005745B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
FR1301128A 2013-05-16 2013-05-16 Banc de test d'equipements electroniques Active FR3005745B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1301128A FR3005745B1 (fr) 2013-05-16 2013-05-16 Banc de test d'equipements electroniques

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1301128A FR3005745B1 (fr) 2013-05-16 2013-05-16 Banc de test d'equipements electroniques

Publications (2)

Publication Number Publication Date
FR3005745A1 FR3005745A1 (fr) 2014-11-21
FR3005745B1 true FR3005745B1 (fr) 2016-10-14

Family

ID=48795618

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1301128A Active FR3005745B1 (fr) 2013-05-16 2013-05-16 Banc de test d'equipements electroniques

Country Status (1)

Country Link
FR (1) FR3005745B1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6331770B1 (en) * 2000-04-12 2001-12-18 Advantest Corp. Application specific event based semiconductor test system
EP1607758B1 (fr) * 2003-03-27 2008-01-23 Advantest Corporation Appareil d'essai
US7362089B2 (en) * 2004-05-21 2008-04-22 Advantest Corporation Carrier module for adapting non-standard instrument cards to test systems
US8362791B2 (en) * 2008-06-20 2013-01-29 Advantest Corporation Test apparatus additional module and test method

Also Published As

Publication number Publication date
FR3005745A1 (fr) 2014-11-21

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