SG11201508356SA - Testing head of electronic devices - Google Patents
Testing head of electronic devicesInfo
- Publication number
- SG11201508356SA SG11201508356SA SG11201508356SA SG11201508356SA SG11201508356SA SG 11201508356S A SG11201508356S A SG 11201508356SA SG 11201508356S A SG11201508356S A SG 11201508356SA SG 11201508356S A SG11201508356S A SG 11201508356SA SG 11201508356S A SG11201508356S A SG 11201508356SA
- Authority
- SG
- Singapore
- Prior art keywords
- electronic devices
- testing head
- testing
- head
- electronic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07321—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support the probes being of different lengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT000561A ITMI20130561A1 (en) | 2013-04-09 | 2013-04-09 | HEAD OF MEASUREMENT OF ELECTRONIC DEVICES |
PCT/IB2014/000528 WO2014167410A2 (en) | 2013-04-09 | 2014-04-08 | Testing head of electronic devices |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201508356SA true SG11201508356SA (en) | 2015-11-27 |
Family
ID=48579233
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201508356SA SG11201508356SA (en) | 2013-04-09 | 2014-04-08 | Testing head of electronic devices |
Country Status (11)
Country | Link |
---|---|
US (1) | US9829508B2 (en) |
EP (1) | EP2984492B1 (en) |
JP (1) | JP6416205B2 (en) |
KR (1) | KR102146512B1 (en) |
CN (1) | CN105102990A (en) |
IT (1) | ITMI20130561A1 (en) |
MY (1) | MY177726A (en) |
PH (1) | PH12015502354B1 (en) |
SG (1) | SG11201508356SA (en) |
TW (1) | TWI636259B (en) |
WO (1) | WO2014167410A2 (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6245876B2 (en) * | 2013-07-26 | 2017-12-13 | 株式会社日本マイクロニクス | Probe card |
WO2016087369A2 (en) * | 2014-12-04 | 2016-06-09 | Technoprobe S.P.A. | Testing head comprising vertical probes |
CN116183986A (en) * | 2014-12-30 | 2023-05-30 | 泰克诺探头公司 | Method for manufacturing contact probes for test heads |
US10151774B2 (en) * | 2015-06-10 | 2018-12-11 | Asm Technology Singapore Pte Ltd | Electrical contact having electrical isolated members for contacting an electrical component |
CN105353260B (en) * | 2015-12-25 | 2019-01-08 | 东莞市海轮电子科技有限公司 | A kind of test device and test method of connection terminal |
IT201600079679A1 (en) * | 2016-07-28 | 2018-01-28 | Technoprobe Spa | Measurement board for electronic devices |
IT201600079694A1 (en) * | 2016-07-28 | 2018-01-28 | Technoprobe Spa | Measuring head of electronic devices and relative measurement card |
IT201600084921A1 (en) * | 2016-08-11 | 2018-02-11 | Technoprobe Spa | Contact probe and relative measuring head of a test device for electronic devices |
EP3607332A4 (en) * | 2017-04-03 | 2021-01-06 | Kes Systems & Service (1993) Pte Ltd. | Electrical test apparatus having adjustable contact pressure |
IT201700046645A1 (en) | 2017-04-28 | 2018-10-28 | Technoprobe Spa | Measurement board for a test device of electronic devices |
TWI663407B (en) * | 2018-06-06 | 2019-06-21 | 中華精測科技股份有限公司 | Probe card device and three-dimensional signal transfer structure |
IT201900014208A1 (en) | 2019-08-07 | 2021-02-07 | Technoprobe Spa | Measuring head of electronic devices and relative measuring card |
CN111122927A (en) * | 2019-12-24 | 2020-05-08 | 杭州易正科技有限公司 | Integrated circuit test probe seat |
KR102174269B1 (en) * | 2020-09-22 | 2020-11-04 | 주식회사 새한마이크로텍 | Probe assembly for inspection of chip parts |
JP2022108835A (en) * | 2021-01-14 | 2022-07-27 | 株式会社日本マイクロニクス | Electrical connection device and manufacturing method for electrical connection device |
IT202100022508A1 (en) * | 2021-08-30 | 2023-03-02 | Dmi S R L | TAPERED DIAMETERS MEASURING HEAD WITH DOUBLE PARALLELOGRAM |
KR20230152313A (en) * | 2022-04-27 | 2023-11-03 | (주)티에스이 | Probe head with adjustable protrusion length of probe |
KR20230152314A (en) * | 2022-04-27 | 2023-11-03 | (주)티에스이 | Probe head with adjustable protrusion length of probe |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4901013A (en) * | 1988-08-19 | 1990-02-13 | American Telephone And Telegraph Company, At&T Bell Laboratories | Apparatus having a buckling beam probe assembly |
US5175496A (en) * | 1990-08-31 | 1992-12-29 | Cray Research, Inc. | Dual contact beam assembly for an IC test fixture |
JPH04115167A (en) * | 1990-09-06 | 1992-04-16 | Nec Corp | Pin head for wiring inspection machine |
US5376889A (en) * | 1991-10-10 | 1994-12-27 | Hughes Aircraft Company | System and method for detecting and locating flaws on or beneath a surface |
JPH05340966A (en) * | 1992-06-05 | 1993-12-24 | Fujitsu Ltd | Probe card |
JP2799973B2 (en) * | 1995-07-06 | 1998-09-21 | 日本電子材料株式会社 | Vertically actuated probe card |
KR0150334B1 (en) * | 1995-08-17 | 1998-12-01 | 남재우 | Probe card having vertical needle |
US5977787A (en) * | 1997-06-16 | 1999-11-02 | International Business Machines Corporation | Large area multiple-chip probe assembly and method of making the same |
JPH1138044A (en) * | 1997-07-17 | 1999-02-12 | Mitsubishi Electric Corp | Perpendicular type probe card device |
US6927586B2 (en) * | 2000-03-06 | 2005-08-09 | Wentworth Laboratories, Inc. | Temperature compensated vertical pin probing device |
JP3486841B2 (en) * | 2000-08-09 | 2004-01-13 | 日本電子材料株式会社 | Vertical probe card |
US20040135594A1 (en) * | 2003-01-14 | 2004-07-15 | Beaman Brian Samuel | Compliant interposer assembly for wafer test and "burn-in" operations |
WO2005050706A2 (en) * | 2003-11-14 | 2005-06-02 | Wentworth Laboratories, Inc. | Die design with integrated assembly aid |
CN101019473A (en) * | 2004-05-20 | 2007-08-15 | 纳米纳克斯公司 | High density interconnect system having rapid fabrication cycle |
US20060066328A1 (en) * | 2004-09-30 | 2006-03-30 | Probelogic, Inc. | Buckling beam probe test assembly |
JP4860242B2 (en) * | 2005-11-11 | 2012-01-25 | 東京エレクトロン株式会社 | Probe device |
US7345492B2 (en) * | 2005-12-14 | 2008-03-18 | Microprobe, Inc. | Probe cards employing probes having retaining portions for potting in a retention arrangement |
US7365553B2 (en) | 2005-12-22 | 2008-04-29 | Touchdown Technologies, Inc. | Probe card assembly |
DE202007016398U1 (en) * | 2006-11-27 | 2008-02-21 | Feinmetall Gmbh | Contacting device for contacting an electrical DUT to be tested |
US7554348B2 (en) * | 2007-06-29 | 2009-06-30 | Wentworth Laboratories, Inc. | Multi-offset die head |
KR101108726B1 (en) | 2010-01-26 | 2012-02-29 | 삼성전기주식회사 | Member for adjusting horizontality |
KR101120405B1 (en) * | 2010-02-12 | 2012-03-20 | 리노공업주식회사 | Probe block assembly |
JP2012103125A (en) | 2010-11-10 | 2012-05-31 | Micronics Japan Co Ltd | Probe card |
-
2013
- 2013-04-09 IT IT000561A patent/ITMI20130561A1/en unknown
-
2014
- 2014-04-08 EP EP14782278.7A patent/EP2984492B1/en active Active
- 2014-04-08 SG SG11201508356SA patent/SG11201508356SA/en unknown
- 2014-04-08 MY MYPI2015703571A patent/MY177726A/en unknown
- 2014-04-08 CN CN201480020531.5A patent/CN105102990A/en active Pending
- 2014-04-08 TW TW103112813A patent/TWI636259B/en active
- 2014-04-08 KR KR1020157031973A patent/KR102146512B1/en active IP Right Grant
- 2014-04-08 JP JP2016507073A patent/JP6416205B2/en active Active
- 2014-04-08 WO PCT/IB2014/000528 patent/WO2014167410A2/en active Application Filing
-
2015
- 2015-07-02 US US14/791,012 patent/US9829508B2/en active Active
- 2015-10-09 PH PH12015502354A patent/PH12015502354B1/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN105102990A (en) | 2015-11-25 |
ITMI20130561A1 (en) | 2014-10-10 |
JP2016520816A (en) | 2016-07-14 |
EP2984492A2 (en) | 2016-02-17 |
PH12015502354A1 (en) | 2016-02-22 |
US9829508B2 (en) | 2017-11-28 |
WO2014167410A3 (en) | 2015-04-30 |
PH12015502354B1 (en) | 2016-02-22 |
US20150309076A1 (en) | 2015-10-29 |
KR20150140774A (en) | 2015-12-16 |
TWI636259B (en) | 2018-09-21 |
EP2984492B1 (en) | 2017-01-04 |
KR102146512B1 (en) | 2020-08-24 |
MY177726A (en) | 2020-09-23 |
TW201500740A (en) | 2015-01-01 |
WO2014167410A2 (en) | 2014-10-16 |
JP6416205B2 (en) | 2018-10-31 |
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