US20110208448A1 - Test apparatus and information processing system - Google Patents
Test apparatus and information processing system Download PDFInfo
- Publication number
- US20110208448A1 US20110208448A1 US12/945,758 US94575810A US2011208448A1 US 20110208448 A1 US20110208448 A1 US 20110208448A1 US 94575810 A US94575810 A US 94575810A US 2011208448 A1 US2011208448 A1 US 2011208448A1
- Authority
- US
- United States
- Prior art keywords
- interrupt
- control section
- section
- control apparatus
- processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
Definitions
- the present invention relates to a test apparatus that tests a device under test and an information processing system.
- a test apparatus for testing a semiconductor device or the like includes one or more test units and a control apparatus. Each test unit supplies a test signal to the device under test.
- the control apparatus can be realized as a computer connected to the test units via a serial communication cable or the like.
- the control apparatus issues an access request to each of the test units to control the test units.
- Each test unit includes a processing section such as a pattern generator.
- Each processing section can request an interrupt for the control apparatus.
- each processing section can request an interrupt by supplying an interrupt control section in the test unit with an interrupt signal that changes from logic L to logic H.
- the interrupt control section that receives the interrupt signal transmits a packet indicating the interrupt to the control apparatus.
- Each test unit may include a plurality of processing sections that request interrupts for the control apparatus.
- the interrupt control section receives the interrupt signals from the plurality of processing sections and generates a packet indicating an interrupt for each processing section.
- the interrupt control section supplies the control apparatus with the interrupt request from the second processing section during or immediately before the execution of the interrupt from the first processing section by the control apparatus. In such a case, the control apparatus cannot properly perform the processes corresponding to the respective interrupt requests.
- the interrupt control section may perform an OR operation on the interrupt signals output from the processing sections and generate the packet indicating the interrupt based on an edge of the signal resulting from the OR operation.
- test apparatus that tests a device under test, comprising a plurality of processing sections that each send and receive signals to and from the device under test; a control apparatus that controls the processing sections; and an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections.
- the interrupt control section when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state; when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt; and when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
- an information processing system comprising a plurality of processing sections; a control apparatus that controls the processing sections; and an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections.
- the interrupt control section when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state; when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt; and when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
- FIG. 1 shows a configuration of a test apparatus 10 according to an embodiment of the present invention.
- FIG. 2 shows a configuration of a test unit 12 according to the present embodiment.
- FIG. 3 shows state transitions of the interrupt control section 46 .
- FIG. 1 shows a configuration of a test apparatus 10 according to an embodiment of the present invention.
- the test apparatus 10 tests a device under test such as a semiconductor device.
- the test apparatus 10 includes one or more test units 12 and a control apparatus 14 .
- Each test unit 12 sends and receives signals to and from the device under test.
- each test unit 12 may supply the device under test with a test signal having a waveform corresponding to a test pattern, and judge acceptability of the device under test by comparing a response signal from the device under test to a logic value corresponding to an expected value pattern.
- the control apparatus 14 provides an access request to each of the one or more test units 12 to control the test units 12 .
- the control apparatus 14 may be realized as a computer that functions as the control apparatus 14 by executing a program.
- One or more transmission lines 22 which each have a length of several meters, may be connected between the control apparatus 14 and the one or more test units 12 to transmit serial data.
- FIG. 2 shows a configuration of a test unit 12 according to the present embodiment.
- Each of the one or more test units 12 includes a plurality of processing sections 42 , a signal combining section 44 , an interrupt control section 46 , and a packet processing section 48 .
- the processing sections 42 send and receive signals to and from the device under test.
- the test unit 12 includes a first processing section 42 - 1 and a second processing section 42 - 2 .
- the first processing section 42 - 1 performs a functional test on the device under test.
- the second processing section 42 - 2 supplies DC power supply voltage to the device under test.
- the second processing section 42 - 2 also performs a DC test on the device under test.
- Each processing section 42 operates according to commands received from the control apparatus 14 .
- the processing sections 42 are controlled by the control apparatus 14 .
- Each processing section 42 makes an interrupt request to the control apparatus 14 .
- each processing section 42 issues an interrupt signal that is at a first level, e.g. logic level L, when not making an interrupt request to the control apparatus 14 and at a second level, e.g. logic level H, when making an interrupt request to the control apparatus 14 .
- each processing section 42 generates an interrupt signal that indicates generation of an interrupt request when changing from the first level to the second level.
- the signal combining section 44 supplies the interrupt control section 46 in the test unit 12 with a signal at the second level when at least one of the interrupt signals output by the processing sections 42 in the test unit 12 is the second level.
- the signal combining section 44 supplies the interrupt control section 46 with a signal obtained as the logical sum of the received interrupt signals.
- the interrupt control section 46 notifies the control apparatus 14 concerning the interrupt requests generated by the processing sections 42 .
- a detailed explanation of the control of the interrupt control section 46 is provided in FIG. 3 .
- the packet processing section 48 receives, via the transmission line 22 , a packet that includes a command or response transmitted from the control apparatus 14 to the test unit 12 .
- the packet processing section 48 extracts the command or response included in the packet.
- the packet processing section 48 then sends the extracted command or response to a destination processing section 42 indicated by the command or response.
- the packet processing section 48 receives the responses or commands to be sent from the signal combining sections 44 to the control apparatus 14 .
- the packet processing section 48 generates a packet including the received commands or responses.
- the packet processing section 48 transmits the generated packet to the control apparatus 14 via the transmission line 22 .
- the packet processing section 48 generates a packet providing notification about the interrupt request by the interrupt control section 46 , and sends this packet to the control apparatus 14 . After transmitting the packet providing interrupt request notification to the control apparatus 14 , the packet processing section 48 receives from the control apparatus 14 a packet indicating that subsequent interrupt requests can be received and processed. The packet processing section 48 then notifies the interrupt control section 46 that subsequent interrupt requests can be received and processed.
- FIG. 3 shows state transitions of the interrupt control section 46 .
- the interrupt control section 46 transitions between an interrupt enable state ST 100 and an interrupt disable state ST 200 , and switches the control process depending on the state.
- the interrupt control section 46 transitions to the interrupt enable state ST 100 .
- the interrupt control section 46 receives an interrupt request from a processing section 42 while in the interrupt enable state ST 100 .
- the interrupt control section 46 notifies the control apparatus 14 concerning this interrupt request.
- the interrupt control section 46 causes the packet processing section 48 to send a packet providing notification of the interrupt request to the control apparatus 14 .
- the interrupt control section 46 transitions from the interrupt enable state ST 100 to the interrupt disable state ST 200 .
- the control apparatus 14 processes the interrupt. Upon completing processing of the interrupt and becoming able to receive and process a subsequent interrupt request, the control apparatus 14 notifies the interrupt control section 46 that an interrupt request can be received. For example, the control apparatus 14 may transmit to the test unit 12 , via the transmission line 22 , a packet notifying the interrupt control section 46 that a subsequent interrupt request can be received. Furthermore, the processing section 42 in the test unit 12 that requested the interrupt changes the interrupt signal output therefrom from the second level to the first level in response to the control apparatus 14 completing the processing of the interrupt.
- the interrupt control section 46 When an interrupt request is received from a processing section 42 while in the interrupt disable state ST 200 , the interrupt control section 46 does not notify the control apparatus 14 concerning the interrupt request. In other words, even when at least one of the interrupt signals changes from the first level to the second level while the interrupt control section 46 is in the interrupt disable state ST 200 , the interrupt control section 46 does not transmit a packet providing notification of the interrupt request to the control apparatus 14 .
- the interrupt control section 46 transitions from the interrupt disable state ST 200 to the interrupt enable state ST 100 . More specifically, upon receiving notification from the control apparatus 14 that an interrupt request can be received, the interrupt control section 46 transitions to the interrupt enable state ST 100 .
- the interrupt control section 46 transitions to the interrupt disable state ST 200 during a period from when notification concerning the interrupt request is provided to the control apparatus 14 to when the control apparatus 14 becomes able to receive an interrupt request. As a result, during this period, the interrupt control section 46 does not notify the control apparatus 14 about other interrupts. Accordingly, the control apparatus 14 can correctly process each interrupt.
- the interrupt control section 46 when the interrupt control section 46 has transitioned from the interrupt disable state ST 200 to the interrupt enable state ST 100 , if at least one of the interrupt signals output by the processing sections 42 is the second level, the interrupt control section 46 transitions back to the interrupt disable state ST 200 and notifies the control apparatus 14 about the interrupt.
- the interrupt control section 46 when the interrupt control section 46 has transitioned from the interrupt disable state ST 200 to the interrupt enable state ST 100 , if the signal output by the signal combining section 44 is the second level, the interrupt control section 46 transitions back to the interrupt disable state ST 200 and notifies the control apparatus 14 about the interrupt.
- the interrupt control section 46 can notify the control apparatus 14 about each interrupt request without performing a process such as clearing the interrupt signals output by the processing sections 42 after the control apparatus 14 completes the process corresponding to the interrupt request.
- the technology described via the above embodiments is not limited to use in a test apparatus 10 , and can be applied in a common information processing system.
- the technology described via the above embodiments can be applied in an information processing system that includes one or more processing units that process information and a control apparatus that controls the processing units.
- the test units of the information processing system have the same function and configuration as the test units 12 according to the above embodiments and the control apparatus of the information processing system has the same function and configuration as the control apparatus 14 according to the above embodiments.
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Computer Networks & Wireless Communication (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
- Information Transfer Systems (AREA)
Abstract
Provided is a test apparatus that tests a device under test, comprising a plurality of processing sections that each send and receive signals to and from the device under test; a control apparatus that controls the processing sections; and an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections, wherein, when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state; when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt; and when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
Description
- 1. Technical Field
- The present invention relates to a test apparatus that tests a device under test and an information processing system.
- 2. Related Art
- A test apparatus for testing a semiconductor device or the like includes one or more test units and a control apparatus. Each test unit supplies a test signal to the device under test.
- The control apparatus can be realized as a computer connected to the test units via a serial communication cable or the like. The control apparatus issues an access request to each of the test units to control the test units.
- Each test unit includes a processing section such as a pattern generator. Each processing section can request an interrupt for the control apparatus. For example, each processing section can request an interrupt by supplying an interrupt control section in the test unit with an interrupt signal that changes from logic L to logic H. Upon detecting a rising edge of the interrupt signal, the interrupt control section that receives the interrupt signal transmits a packet indicating the interrupt to the control apparatus.
- Each test unit may include a plurality of processing sections that request interrupts for the control apparatus. In this case the interrupt control section receives the interrupt signals from the plurality of processing sections and generates a packet indicating an interrupt for each processing section.
- However, when sequential interrupt requests are generated in a short time by two processing sections, e.g. a first processing section and a second processing section, the interrupt control section supplies the control apparatus with the interrupt request from the second processing section during or immediately before the execution of the interrupt from the first processing section by the control apparatus. In such a case, the control apparatus cannot properly perform the processes corresponding to the respective interrupt requests.
- Furthermore, the interrupt control section may perform an OR operation on the interrupt signals output from the processing sections and generate the packet indicating the interrupt based on an edge of the signal resulting from the OR operation. As a result, even when two processing sections sequentially generate interrupt requests in a short time, the edge indicating the later interrupt request is eliminated, and so the interrupt control apparatus does not receive the interrupt request from the second processing section while executing the process corresponding to the interrupt request from the first processing section.
- However, when generating a packet requesting an interrupt based on a signal obtained by performing the OR operation on the interrupt signals output from a plurality of processing sections, even when the process corresponding to the earlier interrupt request is completed, an edge corresponding to the later interrupt request is not generated. Accordingly, in this case, a process such as clearing the signal resulting from the OR operation must be performed after completion of the process corresponding to the earlier interrupt request.
- Therefore, it is an object of an aspect of the innovations herein to provide a test apparatus and an information processing system, which are capable of overcoming the above drawbacks accompanying the related art. The above and other objects can be achieved by combinations described in the independent claims. The dependent claims define further advantageous and exemplary combinations of the innovations herein.
- According to a first aspect related to the innovations herein, provided is a test apparatus that tests a device under test, comprising a plurality of processing sections that each send and receive signals to and from the device under test; a control apparatus that controls the processing sections; and an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections. In the test apparatus, when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state; when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt; and when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
- According to a second aspect related to the innovations herein, provided is an information processing system comprising a plurality of processing sections; a control apparatus that controls the processing sections; and an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections. In the information processing system, when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state; when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt; and when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
- The summary clause does not necessarily describe all necessary features of the embodiments of the present invention. The present invention may also be a sub-combination of the features described above. The above and other features and advantages of the present invention will become more apparent from the following description of the embodiments taken in conjunction with the accompanying drawings.
-
FIG. 1 shows a configuration of atest apparatus 10 according to an embodiment of the present invention. -
FIG. 2 shows a configuration of atest unit 12 according to the present embodiment. -
FIG. 3 shows state transitions of theinterrupt control section 46. - Hereinafter, some embodiments of the present invention will be described. The embodiments do not limit the invention according to the claims, and all the combinations of the features described in the embodiments are not necessarily essential to means provided by aspects of the invention.
-
FIG. 1 shows a configuration of atest apparatus 10 according to an embodiment of the present invention. Thetest apparatus 10 tests a device under test such as a semiconductor device. Thetest apparatus 10 includes one ormore test units 12 and acontrol apparatus 14. - Each
test unit 12 sends and receives signals to and from the device under test. For example, eachtest unit 12 may supply the device under test with a test signal having a waveform corresponding to a test pattern, and judge acceptability of the device under test by comparing a response signal from the device under test to a logic value corresponding to an expected value pattern. - The
control apparatus 14 provides an access request to each of the one ormore test units 12 to control thetest units 12. Thecontrol apparatus 14 may be realized as a computer that functions as thecontrol apparatus 14 by executing a program. One ormore transmission lines 22, which each have a length of several meters, may be connected between thecontrol apparatus 14 and the one ormore test units 12 to transmit serial data. -
FIG. 2 shows a configuration of atest unit 12 according to the present embodiment. Each of the one ormore test units 12 includes a plurality of processing sections 42, asignal combining section 44, aninterrupt control section 46, and apacket processing section 48. - The processing sections 42 send and receive signals to and from the device under test. In the present example, the
test unit 12 includes a first processing section 42-1 and a second processing section 42-2. The first processing section 42-1 performs a functional test on the device under test. The second processing section 42-2 supplies DC power supply voltage to the device under test. The second processing section 42-2 also performs a DC test on the device under test. - Each processing section 42 operates according to commands received from the
control apparatus 14. In other words, the processing sections 42 are controlled by thecontrol apparatus 14. - Each processing section 42 makes an interrupt request to the
control apparatus 14. In the present example, each processing section 42 issues an interrupt signal that is at a first level, e.g. logic level L, when not making an interrupt request to thecontrol apparatus 14 and at a second level, e.g. logic level H, when making an interrupt request to thecontrol apparatus 14. In other words, each processing section 42 generates an interrupt signal that indicates generation of an interrupt request when changing from the first level to the second level. - The
signal combining section 44 supplies theinterrupt control section 46 in thetest unit 12 with a signal at the second level when at least one of the interrupt signals output by the processing sections 42 in thetest unit 12 is the second level. When interrupt signals in which the first level is logic level L and the second level is logic level H are supplied from the processing sections 42, thesignal combining section 44 supplies theinterrupt control section 46 with a signal obtained as the logical sum of the received interrupt signals. - The
interrupt control section 46 notifies thecontrol apparatus 14 concerning the interrupt requests generated by the processing sections 42. A detailed explanation of the control of theinterrupt control section 46 is provided inFIG. 3 . - The
packet processing section 48 receives, via thetransmission line 22, a packet that includes a command or response transmitted from thecontrol apparatus 14 to thetest unit 12. Thepacket processing section 48 extracts the command or response included in the packet. Thepacket processing section 48 then sends the extracted command or response to a destination processing section 42 indicated by the command or response. - The
packet processing section 48 receives the responses or commands to be sent from thesignal combining sections 44 to thecontrol apparatus 14. Thepacket processing section 48 generates a packet including the received commands or responses. Thepacket processing section 48 transmits the generated packet to thecontrol apparatus 14 via thetransmission line 22. - Furthermore, the
packet processing section 48 generates a packet providing notification about the interrupt request by the interruptcontrol section 46, and sends this packet to thecontrol apparatus 14. After transmitting the packet providing interrupt request notification to thecontrol apparatus 14, thepacket processing section 48 receives from the control apparatus 14 a packet indicating that subsequent interrupt requests can be received and processed. Thepacket processing section 48 then notifies the interruptcontrol section 46 that subsequent interrupt requests can be received and processed. -
FIG. 3 shows state transitions of the interruptcontrol section 46. The interruptcontrol section 46 transitions between an interrupt enable state ST100 and an interrupt disable state ST200, and switches the control process depending on the state. - First, in an initial state, the interrupt
control section 46 transitions to the interrupt enable state ST100. When the interruptcontrol section 46 receives an interrupt request from a processing section 42 while in the interrupt enable state ST100, the interruptcontrol section 46 notifies thecontrol apparatus 14 concerning this interrupt request. In other words, when at least one of the interrupt signals changes from the first level to the second level, which in the present corresponds to the signal output by thesignal combining section 44 changing from the first level to the second level, while the interruptcontrol section 46 is in the interrupt enable state ST100, the interruptcontrol section 46 causes thepacket processing section 48 to send a packet providing notification of the interrupt request to thecontrol apparatus 14. At the same time, when the interruptcontrol section 46 receives an interrupt request from one of the processing sections 42 while in the interrupt enable state ST100, the interruptcontrol section 46 transitions from the interrupt enable state ST100 to the interrupt disable state ST200. - Here, when notification of the interrupt request is received from the interrupt
control section 46, thecontrol apparatus 14 processes the interrupt. Upon completing processing of the interrupt and becoming able to receive and process a subsequent interrupt request, thecontrol apparatus 14 notifies the interruptcontrol section 46 that an interrupt request can be received. For example, thecontrol apparatus 14 may transmit to thetest unit 12, via thetransmission line 22, a packet notifying the interruptcontrol section 46 that a subsequent interrupt request can be received. Furthermore, the processing section 42 in thetest unit 12 that requested the interrupt changes the interrupt signal output therefrom from the second level to the first level in response to thecontrol apparatus 14 completing the processing of the interrupt. - When an interrupt request is received from a processing section 42 while in the interrupt disable state ST200, the interrupt
control section 46 does not notify thecontrol apparatus 14 concerning the interrupt request. In other words, even when at least one of the interrupt signals changes from the first level to the second level while the interruptcontrol section 46 is in the interrupt disable state ST200, the interruptcontrol section 46 does not transmit a packet providing notification of the interrupt request to thecontrol apparatus 14. - When instructions are received from the
control apparatus 14 while in the interrupt disable state ST200, the interruptcontrol section 46 transitions from the interrupt disable state ST200 to the interrupt enable state ST100. More specifically, upon receiving notification from thecontrol apparatus 14 that an interrupt request can be received, the interruptcontrol section 46 transitions to the interrupt enable state ST100. - In this way, the interrupt
control section 46 transitions to the interrupt disable state ST200 during a period from when notification concerning the interrupt request is provided to thecontrol apparatus 14 to when thecontrol apparatus 14 becomes able to receive an interrupt request. As a result, during this period, the interruptcontrol section 46 does not notify thecontrol apparatus 14 about other interrupts. Accordingly, thecontrol apparatus 14 can correctly process each interrupt. - Furthermore, when the interrupt
control section 46 has transitioned from the interrupt disable state ST200 to the interrupt enable state ST100, if at least one of the interrupt signals output by the processing sections 42 is the second level, the interruptcontrol section 46 transitions back to the interrupt disable state ST200 and notifies thecontrol apparatus 14 about the interrupt. In the present example, when the interruptcontrol section 46 has transitioned from the interrupt disable state ST200 to the interrupt enable state ST100, if the signal output by thesignal combining section 44 is the second level, the interruptcontrol section 46 transitions back to the interrupt disable state ST200 and notifies thecontrol apparatus 14 about the interrupt. As a result, the interruptcontrol section 46 can notify thecontrol apparatus 14 about each interrupt request without performing a process such as clearing the interrupt signals output by the processing sections 42 after thecontrol apparatus 14 completes the process corresponding to the interrupt request. - While the embodiments of the present invention have been described, the technical scope of the invention is not limited to the above described embodiments. It is apparent to persons skilled in the art that various alterations and improvements can be added to the above-described embodiments. It is also apparent from the scope of the claims that the embodiments added with such alterations or improvements can be included in the technical scope of the invention.
- The technology described via the above embodiments is not limited to use in a
test apparatus 10, and can be applied in a common information processing system. For example, the technology described via the above embodiments can be applied in an information processing system that includes one or more processing units that process information and a control apparatus that controls the processing units. In this case, the test units of the information processing system have the same function and configuration as thetest units 12 according to the above embodiments and the control apparatus of the information processing system has the same function and configuration as thecontrol apparatus 14 according to the above embodiments.
Claims (6)
1. A test apparatus that tests a device under test, comprising:
a plurality of processing sections that each send and receive signals to and from the device under test;
a control apparatus that controls the processing sections; and
an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections, wherein
when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state,
when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt, and
when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
2. The test apparatus according to claim 1 , wherein
when an interrupt request notification is received from the interrupt control section, the control apparatus processes the interrupt, and
the control apparatus notifies the interrupt control section that an interrupt request can be received, in response to the control apparatus becoming able to receive and process a subsequent interrupt request.
3. The test apparatus according to claim 1 , further comprising a packet processing section that generates a packet providing notification concerning interrupt requests by the interrupt control section and transmits the packet to the control apparatus.
4. The test apparatus according to claim 1 , wherein
each processing section outputs an interrupt signal indicating that an interrupt request is generated when changing from a first level to a second level, and
when the interrupt control section has transitioned from the interrupt disable state to the interrupt enable state, if at least one of the interrupt signals output by the processing sections is the second level, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to the interrupt disable state.
5. The test apparatus according to claim 4 , comprising one or more test units that each include a plurality of the processing sections, the interrupt control section, and a signal combining section, wherein
in each of the one or more test units, when at least one of the interrupt signals output by the processing sections is the second level, the signal combining section supplies the interrupt control section with a signal at the second level.
6. An information processing system comprising:
a plurality of processing sections;
a control apparatus that controls the processing sections; and
an interrupt control section that notifies the control apparatus concerning interrupt requests generated by the processing sections, wherein
when an interrupt request is received from a processing section while the interrupt control section is in an interrupt enable state, the interrupt control section notifies the control apparatus concerning the interrupt and transitions to an interrupt disable state,
when an interrupt request is received from the processing section while the interrupt control section is in the interrupt disable state, the interrupt control section does not notify the control apparatus concerning the interrupt, and
when instructions are received from the control apparatus while the interrupt control section is in the interrupt disable state, the interrupt control section transitions to the interrupt enable state.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/945,758 US20110208448A1 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US5720608P | 2008-05-30 | 2008-05-30 | |
PCT/JP2008/064349 WO2009144839A1 (en) | 2008-05-30 | 2008-08-08 | Tester and information processing system |
US12/945,758 US20110208448A1 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/064349 Continuation WO2009144839A1 (en) | 2008-05-30 | 2008-08-08 | Tester and information processing system |
Publications (1)
Publication Number | Publication Date |
---|---|
US20110208448A1 true US20110208448A1 (en) | 2011-08-25 |
Family
ID=41376735
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/942,915 Abandoned US20110196638A1 (en) | 2008-05-30 | 2010-11-09 | Test apparatus, information processing system and data transfer method |
US12/945,736 Active 2031-08-24 US8942946B2 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
US12/945,758 Abandoned US20110208448A1 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
US12/945,731 Active 2031-03-30 US8805634B2 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and test method |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/942,915 Abandoned US20110196638A1 (en) | 2008-05-30 | 2010-11-09 | Test apparatus, information processing system and data transfer method |
US12/945,736 Active 2031-08-24 US8942946B2 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and information processing system |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/945,731 Active 2031-03-30 US8805634B2 (en) | 2008-05-30 | 2010-11-12 | Test apparatus and test method |
Country Status (4)
Country | Link |
---|---|
US (4) | US20110196638A1 (en) |
JP (4) | JP4674273B2 (en) |
KR (4) | KR101137537B1 (en) |
WO (4) | WO2009144837A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180321303A1 (en) * | 2017-05-03 | 2018-11-08 | Pegatron Corporation | Arrangement unit, testing system and testing method |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10288685B2 (en) * | 2014-04-30 | 2019-05-14 | Keysight Technologies, Inc. | Multi-bank digital stimulus response in a single field programmable gate array |
TWI615619B (en) * | 2016-06-24 | 2018-02-21 | 致伸科技股份有限公司 | Method for communicating with testing body and system using the same |
CN114968365B (en) * | 2022-07-27 | 2022-10-28 | 广州智慧城市发展研究院 | Adapter register unit and host adapter circuit comprising same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6263395B1 (en) * | 1999-01-06 | 2001-07-17 | Compaq Computer Corp. | System and method for serial interrupt scanning |
US6467007B1 (en) * | 1999-05-19 | 2002-10-15 | International Business Machines Corporation | Processor reset generated via memory access interrupt |
US20060085582A1 (en) * | 2004-10-20 | 2006-04-20 | Hitachi, Ltd. | Multiprocessor system |
US7340364B1 (en) * | 2003-02-26 | 2008-03-04 | Advantest Corporation | Test apparatus, and control method |
US20080091377A1 (en) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Test apparatus, and control method |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5460537A (en) | 1977-10-24 | 1979-05-16 | Nec Corp | Interruption control unit |
JPS5556259A (en) | 1978-10-19 | 1980-04-24 | Nec Corp | Interruption circuit |
JPS63213018A (en) | 1987-02-28 | 1988-09-05 | Ricoh Co Ltd | External memory control device |
US4949333A (en) * | 1987-04-02 | 1990-08-14 | Advanced Micro Devices, Inc. | Enhanced universal asynchronous receiver-transmitter |
JPH0581165A (en) * | 1991-09-19 | 1993-04-02 | Fujitsu Ltd | Data transfer circuit |
JPH06295268A (en) * | 1993-04-07 | 1994-10-21 | Fujitsu Ltd | Bus interface circuit |
US5875293A (en) * | 1995-08-08 | 1999-02-23 | Dell Usa, L.P. | System level functional testing through one or more I/O ports of an assembled computer system |
US5894484A (en) * | 1997-04-28 | 1999-04-13 | Credence Systems Corporation | Integrated circuit tester with distributed instruction processing |
KR100295559B1 (en) * | 1998-05-14 | 2001-07-12 | 박종섭 | Burn-in test board of rambus dram |
US6499121B1 (en) * | 1999-03-01 | 2002-12-24 | Formfactor, Inc. | Distributed interface for parallel testing of multiple devices using a single tester channel |
JP2002071762A (en) * | 2000-06-13 | 2002-03-12 | Advantest Corp | Semiconductor testing device and its monitoring device |
WO2002056541A2 (en) * | 2000-10-27 | 2002-07-18 | Tekelec Us | Methods and systems for testing comminications network components |
US6862703B2 (en) * | 2001-08-13 | 2005-03-01 | Credence Systems Corporation | Apparatus for testing memories with redundant storage elements |
US7035755B2 (en) * | 2001-08-17 | 2006-04-25 | Credence Systems Corporation | Circuit testing with ring-connected test instrument modules |
WO2004036439A1 (en) * | 2002-10-15 | 2004-04-29 | Socket Communications, Inc | Software compatible parallel interface with bidirectional handshaking for serial peripherals |
JP4124345B2 (en) * | 2003-05-30 | 2008-07-23 | シャープ株式会社 | Test equipment |
WO2005015250A1 (en) | 2003-08-06 | 2005-02-17 | Advantest Corporation | Test device, correction value management method, and program |
US7454681B2 (en) * | 2004-11-22 | 2008-11-18 | Teradyne, Inc. | Automatic test system with synchronized instruments |
JP2006275986A (en) * | 2005-03-30 | 2006-10-12 | Advantest Corp | Diagnosis program, switch program, test device, and diagnosis method |
KR100735920B1 (en) * | 2005-12-28 | 2007-07-06 | 삼성전자주식회사 | Device test apparatus and method, and interface apparatus thereof |
US7650555B2 (en) * | 2006-07-27 | 2010-01-19 | International Business Machines Corporation | Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzer |
WO2008044421A1 (en) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Tester and control method |
US20090063085A1 (en) * | 2007-09-05 | 2009-03-05 | Teradyne,Inc. | Pmu testing via a pe stage |
-
2008
- 2008-08-07 KR KR1020107025746A patent/KR101137537B1/en active IP Right Grant
- 2008-08-07 WO PCT/JP2008/064251 patent/WO2009144837A1/en active Application Filing
- 2008-08-07 JP JP2010514324A patent/JP4674273B2/en active Active
- 2008-08-08 JP JP2010514326A patent/JPWO2009144839A1/en active Pending
- 2008-08-08 KR KR1020107025469A patent/KR101215387B1/en not_active IP Right Cessation
- 2008-08-08 WO PCT/JP2008/064347 patent/WO2009144838A1/en active Application Filing
- 2008-08-08 JP JP2010514325A patent/JP4674274B2/en not_active Expired - Fee Related
- 2008-08-08 WO PCT/JP2008/064349 patent/WO2009144839A1/en active Application Filing
- 2008-08-08 KR KR1020107025609A patent/KR101138198B1/en active IP Right Grant
- 2008-08-29 JP JP2010514329A patent/JP4674275B2/en active Active
- 2008-08-29 WO PCT/JP2008/065598 patent/WO2009144844A1/en active Application Filing
- 2008-08-29 KR KR1020107026131A patent/KR101137539B1/en active IP Right Grant
-
2010
- 2010-11-09 US US12/942,915 patent/US20110196638A1/en not_active Abandoned
- 2010-11-12 US US12/945,736 patent/US8942946B2/en active Active
- 2010-11-12 US US12/945,758 patent/US20110208448A1/en not_active Abandoned
- 2010-11-12 US US12/945,731 patent/US8805634B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6263395B1 (en) * | 1999-01-06 | 2001-07-17 | Compaq Computer Corp. | System and method for serial interrupt scanning |
US6467007B1 (en) * | 1999-05-19 | 2002-10-15 | International Business Machines Corporation | Processor reset generated via memory access interrupt |
US7340364B1 (en) * | 2003-02-26 | 2008-03-04 | Advantest Corporation | Test apparatus, and control method |
US20060085582A1 (en) * | 2004-10-20 | 2006-04-20 | Hitachi, Ltd. | Multiprocessor system |
US20080091377A1 (en) * | 2006-10-12 | 2008-04-17 | Advantest Corporation | Test apparatus, and control method |
Non-Patent Citations (1)
Title |
---|
Microchip, PIC16F84A Data Sheet, 2001 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180321303A1 (en) * | 2017-05-03 | 2018-11-08 | Pegatron Corporation | Arrangement unit, testing system and testing method |
CN108805381A (en) * | 2017-05-03 | 2018-11-13 | 和硕联合科技股份有限公司 | Configuration unit, detection system and detection method |
US10816593B2 (en) * | 2017-05-03 | 2020-10-27 | Pegatron Corporation | Arrangement unit, testing system and testing method |
Also Published As
Publication number | Publication date |
---|---|
US20110208465A1 (en) | 2011-08-25 |
JP4674275B2 (en) | 2011-04-20 |
KR20110005283A (en) | 2011-01-17 |
WO2009144837A1 (en) | 2009-12-03 |
US8805634B2 (en) | 2014-08-12 |
WO2009144844A1 (en) | 2009-12-03 |
KR101138198B1 (en) | 2012-05-14 |
KR20110005271A (en) | 2011-01-17 |
JPWO2009144844A1 (en) | 2011-09-29 |
KR20110005265A (en) | 2011-01-17 |
JP4674274B2 (en) | 2011-04-20 |
JPWO2009144838A1 (en) | 2011-09-29 |
WO2009144838A1 (en) | 2009-12-03 |
KR101137537B1 (en) | 2012-04-23 |
US8942946B2 (en) | 2015-01-27 |
KR101215387B1 (en) | 2012-12-26 |
US20110282616A1 (en) | 2011-11-17 |
JPWO2009144839A1 (en) | 2011-09-29 |
JPWO2009144837A1 (en) | 2011-09-29 |
US20110196638A1 (en) | 2011-08-11 |
WO2009144839A1 (en) | 2009-12-03 |
JP4674273B2 (en) | 2011-04-20 |
KR20110005273A (en) | 2011-01-17 |
KR101137539B1 (en) | 2012-04-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8547125B2 (en) | Test apparatus and test module | |
EP1724599B1 (en) | Test device with test parameter adaptation | |
US8059547B2 (en) | Test apparatus and test method | |
JP5220873B2 (en) | Wafer inspection system | |
CN113514759B (en) | Multi-core test processor and integrated circuit test system and method | |
US8509057B2 (en) | Communication system, test apparatus, communication apparatus, communication method and test method | |
US20110208448A1 (en) | Test apparatus and information processing system | |
CN108983077B (en) | Circuit board test system and test method based on JTAG link | |
US20080312900A1 (en) | Simulation apparatus and simulation method | |
JP2000074997A (en) | Ic test device and composite ic test device | |
KR101550870B1 (en) | Test apparatus having probe card and testing method using the same | |
CN106612215A (en) | Integrated remote detection device and method based on Ethernet | |
US20110057681A1 (en) | Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method | |
US20090024875A1 (en) | Serial advanced technology attachment device and method testing the same | |
CN110224867B (en) | Network automation bus test bench and test method thereof | |
CN102436186A (en) | Performer simulator and satellite closed loop simulation system with performer simulator | |
US8692566B2 (en) | Test apparatus and test method | |
JP2008298458A (en) | Semiconductor testing device | |
US8060333B2 (en) | Test apparatus and test method | |
TW200712526A (en) | Apparatus and method for controlling frequency of an I/O clock for an integrated circuit during test | |
US20050210447A1 (en) | Recovering pending trace data within a data processing system | |
JP2010091450A (en) | Probe card and method of using same | |
US20240094293A1 (en) | Systems and methods of testing devices using cxl for increased parallelism | |
TW200944972A (en) | Testing apparatus | |
JP2007132755A (en) | Method and system for inspecting circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: ADVANTEST CORPORATION, JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:TAMURA, KAZUMOTO;REEL/FRAME:026251/0654 Effective date: 20101130 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |