TWI657716B - 顯示裝置 - Google Patents
顯示裝置 Download PDFInfo
- Publication number
- TWI657716B TWI657716B TW105143921A TW105143921A TWI657716B TW I657716 B TWI657716 B TW I657716B TW 105143921 A TW105143921 A TW 105143921A TW 105143921 A TW105143921 A TW 105143921A TW I657716 B TWI657716 B TW I657716B
- Authority
- TW
- Taiwan
- Prior art keywords
- film
- etching
- electrode layer
- transistor
- layer
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0231—Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13069—Thin film transistor [TFT]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Geometry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Thin Film Transistor (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Control Of El Displays (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-055024 | 2008-03-05 | ||
| JP2008055024 | 2008-03-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201714489A TW201714489A (zh) | 2017-04-16 |
| TWI657716B true TWI657716B (zh) | 2019-04-21 |
Family
ID=41052679
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105143921A TWI657716B (zh) | 2008-03-05 | 2009-02-26 | 顯示裝置 |
| TW098106187A TWI486096B (zh) | 2008-03-05 | 2009-02-26 | 電致發光顯示裝置的製造方法 |
| TW104107395A TWI622321B (zh) | 2008-03-05 | 2009-02-26 | 顯示裝置 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW098106187A TWI486096B (zh) | 2008-03-05 | 2009-02-26 | 電致發光顯示裝置的製造方法 |
| TW104107395A TWI622321B (zh) | 2008-03-05 | 2009-02-26 | 顯示裝置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8101442B2 (enExample) |
| JP (11) | JP5512988B2 (enExample) |
| KR (1) | KR101519890B1 (enExample) |
| CN (2) | CN101527284B (enExample) |
| TW (3) | TWI657716B (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7749820B2 (en) * | 2008-03-07 | 2010-07-06 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor, manufacturing method thereof, display device, and manufacturing method thereof |
| US8207026B2 (en) * | 2009-01-28 | 2012-06-26 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of thin film transistor and manufacturing method of display device |
| US7989234B2 (en) * | 2009-02-16 | 2011-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing thin film transistor and method for manufacturing display device |
| US8202769B2 (en) | 2009-03-11 | 2012-06-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| JP5539765B2 (ja) * | 2009-03-26 | 2014-07-02 | 株式会社半導体エネルギー研究所 | トランジスタの作製方法 |
| JP5323945B2 (ja) * | 2009-11-26 | 2013-10-23 | シャープ株式会社 | タッチパネルの製造方法、及び、タッチパネルを備えた表示装置の製造方法 |
| KR20130044124A (ko) * | 2010-05-10 | 2013-05-02 | 파나소닉 액정 디스플레이 주식회사 | 결정성 반도체막의 제조 방법, 결정성 반도체막을 갖는 기판, 박막 트랜지스터 |
| US8766253B2 (en) * | 2010-09-10 | 2014-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| TWI556317B (zh) | 2010-10-07 | 2016-11-01 | 半導體能源研究所股份有限公司 | 薄膜元件、半導體裝置以及它們的製造方法 |
| US8679986B2 (en) | 2010-10-14 | 2014-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing display device |
| WO2012117695A1 (ja) * | 2011-02-28 | 2012-09-07 | シャープ株式会社 | 半導体装置及びその製造方法並びに表示装置 |
| JP6076038B2 (ja) * | 2011-11-11 | 2017-02-08 | 株式会社半導体エネルギー研究所 | 表示装置の作製方法 |
| JP6033071B2 (ja) * | 2011-12-23 | 2016-11-30 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| KR101996438B1 (ko) * | 2012-12-13 | 2019-07-05 | 삼성디스플레이 주식회사 | 표시 장치용 기판, 이를 포함한 표시 장치 및 표시 장치의 제조 방법 |
| US9096426B2 (en) * | 2013-04-05 | 2015-08-04 | The United States Of America As Represented By The Secretary Of The Army | Electronic device structure and method of making electronic devices and integrated circuits using grayscale technology and multilayer thin-film composites |
| CN104062843A (zh) * | 2014-07-18 | 2014-09-24 | 深圳市华星光电技术有限公司 | 一种掩膜板、阵列基板制作方法及阵列基板 |
| CN105390551B (zh) * | 2015-10-28 | 2018-05-29 | 京东方科技集团股份有限公司 | 薄膜晶体管及其制造方法、阵列基板、显示装置 |
| CN105789327B (zh) * | 2016-05-17 | 2019-05-03 | 京东方科技集团股份有限公司 | 一种薄膜晶体管及其制备方法、阵列基板、显示装置 |
| EP4068265B1 (en) | 2019-11-29 | 2025-03-26 | BOE Technology Group Co., Ltd. | Display substrate and manufacturing method therefor, and display device |
| CN115295563A (zh) * | 2022-08-25 | 2022-11-04 | 昆山国显光电有限公司 | 阵列基板及其制备方法 |
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| TW331598B (en) * | 1995-07-25 | 1998-05-11 | Hitachi Ltd | LCD and method of making same |
| JP2001202035A (ja) * | 2000-01-18 | 2001-07-27 | Sharp Corp | 有機エレクトロルミネッセンス表示装置 |
| US20050219433A1 (en) * | 2004-04-01 | 2005-10-06 | Oh Kwang S | Liquid crystal display device and method for fabricating the same |
| CN101097320A (zh) * | 2006-06-29 | 2008-01-02 | Lg.菲利浦Lcd株式会社 | 液晶显示装置及其制造方法 |
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2009
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- 2009-03-05 KR KR1020090018828A patent/KR101519890B1/ko not_active Expired - Fee Related
- 2009-03-05 CN CN201410220695.4A patent/CN103987146B/zh active Active
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| US20090224249A1 (en) | 2009-09-10 |
| TW201714489A (zh) | 2017-04-16 |
| JP6190015B2 (ja) | 2017-08-30 |
| JP2022058527A (ja) | 2022-04-12 |
| JP5824557B2 (ja) | 2015-11-25 |
| JP7008095B2 (ja) | 2022-01-25 |
| TW200950583A (en) | 2009-12-01 |
| JP5982550B2 (ja) | 2016-08-31 |
| JP2014063179A (ja) | 2014-04-10 |
| CN101527284B (zh) | 2014-07-02 |
| JP2018005239A (ja) | 2018-01-11 |
| CN101527284A (zh) | 2009-09-09 |
| JP2009239272A (ja) | 2009-10-15 |
| JP2019040215A (ja) | 2019-03-14 |
| CN103987146A (zh) | 2014-08-13 |
| JP2016212435A (ja) | 2016-12-15 |
| JP5512988B2 (ja) | 2014-06-04 |
| TWI622321B (zh) | 2018-04-21 |
| JP2020096193A (ja) | 2020-06-18 |
| JP2014206753A (ja) | 2014-10-30 |
| JP5674899B2 (ja) | 2015-02-25 |
| JP7225441B2 (ja) | 2023-02-20 |
| TWI486096B (zh) | 2015-05-21 |
| JP2016048378A (ja) | 2016-04-07 |
| JP2023065419A (ja) | 2023-05-12 |
| JP7609906B2 (ja) | 2025-01-07 |
| JP6666986B2 (ja) | 2020-03-18 |
| KR20090095520A (ko) | 2009-09-09 |
| US8101442B2 (en) | 2012-01-24 |
| CN103987146B (zh) | 2017-04-19 |
| TW201524264A (zh) | 2015-06-16 |
| KR101519890B1 (ko) | 2015-05-21 |
| JP2025032370A (ja) | 2025-03-11 |
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