TW563231B - Semiconductor device substrate and manufacturing method thereof and semiconductor package - Google Patents
Semiconductor device substrate and manufacturing method thereof and semiconductor package Download PDFInfo
- Publication number
- TW563231B TW563231B TW091122868A TW91122868A TW563231B TW 563231 B TW563231 B TW 563231B TW 091122868 A TW091122868 A TW 091122868A TW 91122868 A TW91122868 A TW 91122868A TW 563231 B TW563231 B TW 563231B
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- Taiwan
- Prior art keywords
- substrate
- semiconductor element
- silicon substrate
- patent application
- mounting terminal
- Prior art date
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- 239000000758 substrate Substances 0.000 title claims abstract description 194
- 239000004065 semiconductor Substances 0.000 title claims abstract description 145
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 83
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 83
- 239000010703 silicon Substances 0.000 claims abstract description 83
- 238000000034 method Methods 0.000 claims abstract description 28
- 239000002184 metal Substances 0.000 claims description 28
- 229910052751 metal Inorganic materials 0.000 claims description 28
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 16
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 16
- 239000004575 stone Substances 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 13
- 239000013078 crystal Substances 0.000 claims description 7
- 238000005530 etching Methods 0.000 claims description 6
- 238000000227 grinding Methods 0.000 claims description 5
- 238000007373 indentation Methods 0.000 claims 2
- 229910000679 solder Inorganic materials 0.000 description 9
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 7
- 229910052737 gold Inorganic materials 0.000 description 5
- 239000010931 gold Substances 0.000 description 5
- 238000005476 soldering Methods 0.000 description 4
- 238000009713 electroplating Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 229910052762 osmium Inorganic materials 0.000 description 2
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 241000220317 Rosa Species 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- ILCYGSITMBHYNK-UHFFFAOYSA-N [Si]=O.[Hf] Chemical compound [Si]=O.[Hf] ILCYGSITMBHYNK-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 210000004556 brain Anatomy 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- KMWHNPPKABDZMJ-UHFFFAOYSA-N cyclobuten-1-ylbenzene Chemical compound C1CC(C=2C=CC=CC=2)=C1 KMWHNPPKABDZMJ-UHFFFAOYSA-N 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000855 fermentation Methods 0.000 description 1
- 230000004151 fermentation Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
- 238000001721 transfer moulding Methods 0.000 description 1
- 230000007306 turnover Effects 0.000 description 1
Classifications
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- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
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- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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Description
563231 實施方纖式酵說明)▲ L明戶斤3 發明範疇 本發明概有關於半導體元件基材,尤係關於一種半體 體·元件基材乃使用一石夕基材而具有精細佈線設於其上者, 5 及其製造方法。
L· iltr U 相關技術描述 隨著半導體元件的高度密集化,各半導體元件端子的 安裝間距已變得愈來愈小。但,由於用來裝設一半導體元 10件之電路板的連結、端子接塾間距係被製成比該半導體元件 之安裝端子的間距更大,故會難以將該半導體元件依其原 樣來安裝。 因此’該半導體元件會被裝在一基材上,其乃被視為 一中介物,而經由該中介物來將該半導體元件安裝在一電 15路板上。即是,遂座一導-韙士彳牛的_务電極會被該中介物來重 辦瘦列丄_俾.歩成ϋ释大間距的安裝端子,巧來匹略該電 -卜’ ,—__ 路板上之連結端子接墊的間距。 一般而言,上述的半導體元件基材(中介物)會具有一多 層結構,其中導電構件會由該半導體元件所裝設之一表面 20上延伸至另一反面上,其上乃設有安裝端子等。通常,一 有機的細小基材會被用來作為該中介物。為能獲得更精細 的佈線圖案,故矽基材會在許多情況下來被使用。一多層 結構係藉在一矽基材上堆疊絕緣層和導電層等而來形成。 貫穿一絕緣層的導電物乃可輕易地以一貫孔,例如一強化 0續次頁(侧說類顿使用時噶_用顏) 563231 玫、發明說明 發明麵續頁 基材的電鍵通孔而來製成。一石夕基材要有較 保持作為一中介物的強度。因此,須要有一特殊的製造方 法來形成該等導電物,它們會以微小的間距來沿該厚度的 方向延伸。 5 一種製成延伸貫穿一石夕基材之導電物的方法乃說明如 下。 首先,一厚矽基材會被備妥,然後各細圓筒狀的小孔 會被形成於該矽基材中,而相同於安裝端子的排列方式。 忒各具有細圓筒狀的小孔係被稱為盲孔道,其會延伸至該 10矽基材的中間。在該各小孔的内壁上形成一絕緣膜之後, 一金屬會被以電鍍來填入各小孔中,或填注一金屬漿料。 所填入的金屬最後會變成貫入該矽基材的導電物,而其末 端會形成可被連接於電路板的安裝端子。 在將該金屬填設於該等小孔内之後,一佈線層會被形 15 成於邊石夕基材的頂面上。在該石夕基材之各小孔内的導電物 及ό又於5亥佈線層頂面上的電極接塾等,將會經由通孔等來 互相電連接。該半導體元件的電極等將會被連接於該等電 極接墊。 當該佈線層被形成於該矽基材的頂面之後,在該矽基 20 材之各小孔内的導電物末端,將會被以研磨(背面研磨)或蝕 刻該矽基材的背面而來曝現。該矽基材的背面亦可被研磨 ,直到在該矽表面之各小孔内的導電物末端被磨到為止; 且然後,該等導電物的末端會被藉選擇性地蝕刻該矽基材 而稍微凸出。如此製成之凸出的末端即會形成安裝端子, 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 7 563231 玖、發明說明 發明說明續胃 故被衣。又於,亥半‘體元件基材(中介物)上的半導體元件將可 被倒裝在一電路板上。 以上述之中介物的製造方法,乃須要在一矽基材中製 成許多深筒狀孔,並以_小間距來平行排列。為了在1 基材中製成該等深孔,乃必須使用特殊的乾餘刻法,例如 反應離子钱刻(ICP-RIE)。該反應離子餘刻法並未被使用於 一般的半導體元件製程中(供製造-安裝基板例如-中介物 的製程),而需要特殊且昂貴的裝置和製程。因此,該半導 體元件基材(中介物)的製造成本將會增加。 又,上述的方法里^要二將金展填注於鼓应^材之深 孔内的製·程。但是,报難將-金屬填入於級 隙或空隙。且以電鍍來填設一金屬亦須要較長域理時^ 〇 【發明内容】 15 發明概要 本叙月之概括目的係提供一種改良且實用的半導體 元件基材,而可消除上述問題者。 本發明之一具體目的係為提供一種半導體元件基材, 其具有小間距的細微端子,且可不必使用特殊製程而以低 20 成本來容易製成者。 為達到上述目的,本發明之一態樣乃在提供一種半導 體元件基材,其包含··一石夕基材具有一第一表面及一第二 表面相反於第-表面;至少一安裝端子具有角錐形狀而延 伸於第一與第二表面之間,該安裝端子的一端會由該第一 0續次頁(發_頓不雜觸,_記纖臓頁) 8 563231
玖、發明說明 表面或第二表面之一者突出; 第一表面上,該佈線層包含一 子0 及一佈線層設在該矽基材的 導電層會電連接於該安裝端 5 战月辉狀的安裝端子係可藉形成於女 石夕基材中的凹穴來輕易製成,因為該等具有角㈣ 穴將可藉蝕刻來容易地形成該矽基材中,而 j理裝置。此外’由於安裝端子具有—角錐狀頂部:故該
安裝端子的頂端將可被刺人_其所連接的構件中,而達成 一良好的電接觸。 在本發明的半導體元件基材中,一由氧化石夕膜製成的 絕緣膜可被介設於該安裝端子及石夕基材之間。此外,該石夕 基材的第一表面亦被一由有機絕緣膜製成的絕緣層來覆蓋 。又’财基材的第二表面亦可被由_有機絕緣膜製成的 絕緣層來覆蓋。該佈線層可具有一多層結構,其中各絕緣 15 層與導電層會交替堆疊。
在本發明的半導體元件基材中,該安裝端子的角錐造 型係可由該石夕基材的晶體平面來形成。該石夕基材的第一和 第二表面乃可平行於石夕晶體的_)平面。該安裝端子亦可 具有-中空角錐造型。該安裝端子的頂端係可由該石夕基材 2〇 的第二表面突出。 又,依據本發明的另一態樣乃在提供一種製造一半導 體元件基材的方法,其包含下列步驟:在一矽基材的第一 表面中製成-角錐狀的凹穴;在該矽基材的第一表面及該 凹穴的内表面上製成-絕緣膜;在該凹穴内製成一導電層 13續次頁(棚說頓不雛觸,請_嚴用顧) 9 563231 玖、發明說明 發明說明續頁 ,其會被成形且排列形成一安裝端子;在該矽基材的第一 表面上製成-佈線層,其包含-導電層電連接於該凹穴内 的導電層;由該矽基材相反於該第一表面之一第二表面上 除掉部货的石夕基材,而使在該凹穴内的導電層呈突出狀態 5 來曝現。 依據上述方法,具有角錐造型的安襄端子將能使用設 於該矽基材中的凹穴來容易地製成。脸的 級錄1 故基勒殊· 理又且,具有角錐狀頂部的安裝端子之頂端將會被 10戳入一所要連接的構件中,故可達到良好的電接觸。 在本發明的方法中’製成該等凹穴的步驟乃可包括藉 ㈣來除去該石夕基材中一呈角錐狀的預定部份。依據本發 明的方法更可包含-步驟’即在去除該石夕基材之後,於該 石夕基材相反於第-表面的第二表面上再形成—絕緣膜。 15 在该第二表面上形成該絕緣膜的步驟,乃可包括在該 第二表面上製成一氧化石夕膜。或者,在該第二表面上形成 該絕緣膜的步驟,亦可包括在該第二表面上製成一有機絕 緣膜。而該去除步驟可包括:一第一步驟即研磨該石夕基材 的第二表面;及一第二步驟即在第一步驟之後藉蝕刻來除 2〇去石夕基材,而使該安裝端子的末端由祕刻表面突出。 此外,依據本發明之另一態樣係在提供一種半導體封 裝體,其包含··-半導體元件基材;及一半導體元件具有 至少一金屬凸體設在其一電極接塾上;而該半導體元件基 材包含有:一石夕基材具有一第一表面及一第二表面相反於 曜次頁(翻_頁不離_,臟記雌纖頁) 563231 玖、發明說明 發明麵續頁 該第—表面;至少一安裝端子具一角雖形狀而延伸於該第 -與第二表面之間,該安裝端子的—端會由該第—或第二 表面來突出;及-佈線層設在該石夕基材的第一表面上,該 佈線層包含-導電層會電連接於該安裳端子,且該半導體 元件基材之安裝端子的一端,係以突入該金屬凸體的狀態 而來連接該金屬凸體。因此’可在該半導體元件與該半導 體元件基材之間形成良好的電連接。 10 15 又,依據本發明之另一態樣,係在提供一種半導體封 裝體’其包含:-半導體元件基材;及_半導體元件具有 至少-金屬凸體設在其-電極㈣上;而該半導體元件基 材包含:-石夕基材具有-第-表面及_第二表面相反於該 第表面,至;一安裝端子具一角錐造型而延伸於第一與 第二表面之間,該安裝端子的一端會由該第一或第二表面 突出;及一佈線層設在該矽基材的第一表面上,而包含一 導電層電連接於該安裝端子,其中該半導體元件係被固設 在該半導體元件基材的佈線層上,且該角錐狀的安裝端子 係被用來作為外部連接端子。因此,該半導體封裝體的外 部連接端子會變成-⑽造型,而在#該封裝體被連接於 一電路板時,將能提供一良好的電接觸。 20 又’依據本發明之另一態樣,乃在提供一種半導體封 裝體,其包含··一半導體元件;一半導體元件基材具有一 第一表面及一第二表面相反於該第一表面,而該半導體元 件係被設於該第-表面±;及一封裝體基材係、面對該半導 體7L件基材的第二表面,並經由該半導體元件基材來電連 0續次頁(發明說觀不驗卿,瞧記並使用續頁) 11 玫、發明說明 ^ _ 發明說明續頁 接於該半導體元件;其中該半導體元件基材包含:一石夕基 材具有該第一表面及第二表面相反於該第一表面;至少一 安裝端子具有角錐造型而延伸於第一和第二表面之間,該 安裝端子的一端會由該第一或第二表面突出;及一佈線層 設於或矽基材的第一表面上,而包含一導電層電連接於安 裝端子。因該半導體元件基材可被製成一細微結構,故該 具有細微結構的半導體元件能被中接安裝在該封裝體基材 上,而不必將該封裝體基材製成細微結構。 本發明之其它目的、特徵及優點等,將可由以下詳細 說明配合所附圖式而更清楚瞭解。 圖式簡箪說明 第1圖為本發明第一實施例之中介物的放大截面圖; 第2圖為一安裝端子之頂視平面圖; 第3A圖為設於一基材中之一凹穴的平面圖; 第3B圖為設有該凹穴之基材的部份截面圖; 第4圖為供說明該中介物之製造程序的圖表; 第5 A至51圖為第4圖中所示之各步驟中的中介物之截面 圖; 第6 A圖為一背面沒有絕緣膜之中介物的截面圖; 第6B圖為在背面設有一有機絕緣膜之中介物的截面圖 第7圖為一半導體封裝體的截面圖,其係將一半導體元 件裝設於第1圖所示之中介物的安裝端子來製成者; 第8圖為一半導體封裝體的截面圖,其中有一半導體元 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 玖、發明說明 發明說明續頁 件係連接於第1圖之中介物的安裝端子; 第9圖為一半導體封裝體的戴面圖,其係將第8圖的半 導體封裝體安裝於一封裝體基材上來製成者; 第10圖為一半導體封裝體的截面圖,其係將一半導體 元件倒裝固設於第1圖之中介物設有連接墊丨4的一面上來製 成者; 第11圖為一半導體封裝體的截面圖,其係將一半導體 元件接線於第1圖的中介物來製成者; 第12圖為一半導體封裝體的截面圖,其係將第圖中 的半導體封裝體再安裝於一封裝體基材上來製成者; 第13圖為類似第12圖中之半導體封裝體的截面圖,其 中該等安裝端子係直接連接於該封裝體基材的連接塾上, 而未使用焊球凸體; 第14圖為本發明第二實施例之中介物的放大截面圖,· 第15A至15H圖為第14圖中的中介物之各製程截面圖; 第16圖為第14圖中的中介物之一變化例的截面圖;及 第17圖為一配設第14圖所示中介物之一半導體封装體 的截面圖。 【實施方式3 較佳實施例詳細描述 現將參照第1圖來說明一中介物,其係為本發明第一實 施例的半導體元件基材。第1圖為本發明第一實施例之中介 物1的放大截面圖。 第1圖中所示的中介物1乃包含一矽基材2 , 一多層佈線 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 563231 玖、發明說明 發明說明纏賓 層4設在該矽基材2的頂面上,及許多的安裝端子6等由該矽 基材2的底面突出。一半導體元件會被裝設於該中介物1之 佈線層4的頂面上,而來形成一半導體封裝體。該半導體封 裝體會透過該等由矽基材2底面伸出的安裝端子6來被倒裝 5 在一電路板上。 該等安裝端子6係由一導電層所製成,而其外部形狀係 為一角錐造型如第2圖所示。該角錐造型的頂部會由該矽基 材2的底面突出。該各安裝端子6的造型係對應於一凹穴的 這型(倒角錐狀),其係由一平面(1〇〇)上蝕刻該矽基材2, 10並藉於平面(111)與其它平面之間的蝕刻率不同而來製成者 ,如第3A與3B圖所示。製成該等安裝端子6的方法將於後 詳述。 設在該矽基材2之頂面上的多層佈線層4具有一多層結 構,乃包含數導電層8·〗、8_2、8_3等形成各佈線圖案,及 15數絕緣層:um、1〇_2、1(M、1(M等隔絕於各導電層之間。 該各導電層8-1、8-2、8_3等及一由該等安裝端子6之根部伸 出的導電層6-1,將會藉孔道12等來連接。因此,設在最上 層之導電層8_3中的連接㈣等,將會電連接於各對應的安 裝端子6。 -要陳明的疋上述多層式佈線層4的多層佈線結構係相同 於既存的有機細小基材之多層佈線結構,故其詳細說明將 予省略。此外,有一作為絕緣層的氧化矽膜16會被設在該 矽基材的頂面上,及設有該安裝端子之各凹穴的内表面上 。另一作為絕緣膜的氧化矽膜18則被設在該矽基材2的底面 0續次頁(__頁不敷使觸,謙記雌用觀) 563231 玖、發明說明 發明說明續頁 上。請瞭解一有機絕緣膜亦可被設來取代該氧化矽膜。 要陳明的是,在本實施例中,該矽基材的厚度係約為 30//m’而形成安裝端子6的導電層之厚度係等於或大於 m。各安裝端子6的間距係約為2〇〇(15〇)//m,而各安裝端子 5 6之末端由該矽基材2背面突出的長度係約為40/zm。 本發明該實施例之中介物1的製造方法,現將參照第4 及5A至51圖來說明。第4圖為該中介物1之製程的說明圖。 第5A至51圖為該中介物1在第4圖中之各步驟的截面圖。 首先,一厚度為650mc而其上具有一氧化矽膜的矽基材 1〇將會備妥,而在步驟1中,一阻抗圖案會被設於該矽基材的 頂面上。嗣,對應於各内部要製成安裝端子6之凹穴2a形狀 的開孔等,將會藉圖案化該阻抗層而來形成。然後,在步 驟2中,該石夕基材2會被使用蝕刻劑例如4〇0/〇的koh溶液來 蝕刻,而製成該等凹穴2a(參見第5入圖)。在本實施例中, 15所使用的矽基材2係具有一表面平行於晶體平面(001)。因此 ,當該矽基材2由正面側被蝕刻時,將會形成倒角錐狀的凹 穴2a等,因為該矽基材之晶體平面(111)與其它晶體平面之 間的I虫刻速率不同(例如,(1 1 〇) : ( 1 1 1 )= 1 : J )。 然後,在步驟3中,該阻抗物會被除去··而在步驟4中 20 ,泫氧化矽膜(Si〇2)會被形成於該矽基材2的正面上來作為 一絕緣膜。由於該氧化矽膜係以熱處理來製成。故該氧化 石夕膜會被形成於該石夕基材2的整個表面上,包括該等凹穴仏 的正面内面,及该矽基材2的背面等。該氧化矽膜的形成 亦可藉化子蒸况沈積(CVD)法來完成。嗣,在步驟5中, 0續次頁(翻說頓顿使觸,_記用顏) 15 563231 玖、發明說明 發明說明續頁 有一厚度例如為1 /z m或更小的晶種金屬層,會被以激射或 無電鍍著法,來被形成於設在該矽基材2正面及凹穴2a之内 表面上的氧化矽膜上(參見第5B圖)。該晶種金屬層較好是 以Cr或Ti的濺鍍來製成。 5 然後’在步驟6中,一阻抗層會被設於該晶種金屬層上 ’且該阻抗層會被圖案化,以供製成該等安裝端子6及導電 層6-1。嗣,在步驟7中,一金屬製成的導電層會被設在該 晶種金屬·層上。於本實施例中,該導電層係以電鍍來 製成(參見第5C圖)。該導電層會對應於該等安裝端子6及導 10 電層6-1,而其厚度係約為5//m。由於該導電層係沿著各凹 穴2a的内表面來形成,故安裝端子6的外部形狀將會變形角 錐狀。 再來’該阻抗物會於步驟8中被除去,且存在於被除去 之阻抗物底下的晶種金屬層將會在步驟9中被餘刻除去。因 15 該晶種金屬層具有較小的厚度,故光蝕刻即已足夠。嗣, 在步驟10中,一絕緣層10-1會被設於該矽基材2的正面上, 且通孔等會被形成於要製設孔道12的位置處(參見第5E圖) 。該絕緣層10-1係以聚醯亞胺或苯環丁烯(BCB)的旋塗來製 成。 20 然後,在步驟11中,一晶種金屬層會被以濺射法來設 在該絕緣層10-1上,而一阻抗層會在第步驟12中被設在該 晶種金屬層上並被圖案化。嗣,在步驟13中,一對應於一 電路圖案的導電層8·〗會被以金屬鍍著法(銅之電鍍)來製成 。在此時,電連接該導電層8-1與導電層6-1的孔道12等亦會 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 16 玖、發明說明 續頁 被同時形成。嗣,該阻抗物會在步驟14被除去,且該晶種 金屬會在步驟15中被蝕刻(參見第5F圖)。 該多層佈線層4可藉重複上述步驟10至15來製成(參見 第5G圖)。在製成所需的多層結構之後,在步驟丨6中,將會 對形成於最上層(在本實施例中之導電層8-3)的連接墊14等 來鍍以鎳和金。 嗣,在步驟17中,該矽基材2的背面會被以一磨料或 磨石來研磨(背面研磨)。於此時,該研磨僅會在達到該等 没於矽基材2中之各安裝端子6的頂端之前來稍微地前進。 然後,在步驟18中,僅有該矽基材2與氧化矽膜會被使用 一電漿氣體以乾蝕刻來選擇性地除去,而曝露出該等安裝 端子6的頂端(參見第5H圖)。在此製程中,黏附於安裝端 子6頂端上的氧化矽膜(其係於步驟4所製成)亦會被同時除 去。又,該矽基材2的厚度最後會被設為約30 μηι。嗣,在 步驟19中,一作為絕緣膜的氧化矽膜18會被以cVD法來形 成於該矽基材2的背面上。 在上述製程中,為了在一晶圓狀的矽基材上同時一起 來製成多數的中介物丨,故第丨圖中所示的中介物丨將會藉 切割該矽基材2來個別分開各中介物1而被製成。 又,如第6A圖所示,該矽基材2亦可在步驟19中不製 成忒氧化矽膜18,而形成背面曝露的狀態。在步驟19中製 成亥、巴、、彖膜的原因’係為了避免在該等安裝端子6的曝露 頂端與石夕基材2的背面之間造成短路。但,由於有氧化矽 膜被叹來形成安裝端子6與矽基材2之間的絕緣層,故即 _次頁(到_ι:不離觸,_隨使用顧) 563231 發明說明續頁 玖、發明說明 ,亦可保持 使該矽基材2的背面並未被該絕緣層丨8所覆蓋
某種程度的絕緣。又,如第6B圖所示,一有機絕緣膜18A 亦可藉旋塗法等來形成,而取代該氧化矽膜18。 使用上述中介物1來製成一半導體封裝體之例將說明 5 如下。 第7圖為一半導體封裝體的截面圖,其係將一半導體 疋件裝設於該中介物1的安裝端子6而來製成者。焊接凸體 22等會被設在該半導體元件20的各電極端子2〇&上,且該 等焊接凸體22會被接合於該中介物i的安裝端子6上。由於 〇 °亥等女裝端子6的頂端係呈角錐狀而被製成較尖銳,故該 等女裝端子6乃可僅藉壓迫該等焊接凸體22而來突入該各 凸體22中,故能形成良好的電接觸。請注意金的凸體亦可 被用來取代該等焊接凸體。在此情況下,一底部填料會 被填入於該中介物1與半導體元件2〇之間,而將該中介物1 15 固接於該半導體元件20。 又,如第8圖所示,該等安裝端子6亦可被直接連接於 該半導體元件20的電極接墊2〇a上。在此情況下,一軟質 金屬膜會被用來作為該電極表面上的金屬(安裝端子6),且 在該軟金屬膜被帶至與該等電極接墊2〇a接觸之後,該中 20介物1會被該底部填料24所固定。即使在此情況下,由於 該等具有尖銳頂端之安裝端子6的作用,故在安裝端子6與 電極接墊20之間亦能獲得良好的電接觸。 且,第7及8圖中所示的半導體封裝體又可再安裝於一 封裝體基材30上,而來形成一半導體封裝體。第9圖為該 _次頁(翻麵頁不敷使觸,請註記並麵顏) 18 563231 發明說明續頁 體封裝體安 玖、發明說明 半導體封裝體的戴面圖,其係將第7圖的半導 裝於封裝體基材30上而來製成者。至於該封裝體基材3〇, 各種基材皆可使用,例如一玻璃陶竟基材,一氧化銘基材 ,強化基材,基材,及一有機基材如Βτ基材等 5等。又,在該作為巾接基材的巾介物1被安裝於該封裝體 基材30之後,該含有中介物1的半導體封裝體,乃可藉將 底部填料28填入於該中介物丨與封裝體基材3〇之間,而被 固定於該封裝體基材30上。如第9圖所示,該半導體封裝 體係可將·該中介物1作為一中接基材而來製成,但不在該 10封裝體基材上形成細微佈線,即使該半導體元件的電極接 墊數目很大,且該等電極接墊具有細微結構亦無妨。 第10圖為一半導體封裝體的截面圖,其係將半導體元 件20倒裝在該中介物1的連接墊14之侧上而來製成者。該 半導體元件20的電極接墊2〇a等與該中介物!的各連接墊14 15係以焊球26來互相連接。該等焊球26係可事先製設於該半 導體元件20的電極接墊2〇a上,或亦可設在該中介物丨的連 接墊14上。在第1〇圖的半導體封裝體之例中,該半導體封 裝體係使用該等安裝端子6來裝設於一電路板,例如一母 板上。 20 第11圖為一半導體封裝體的截面圖,其係將該半導體 元件20接線於該中介物1的連接墊14而來製成者。該半導 體元件20係以倒裝方式來安裝於中介物1的多層佈線層4上 ,並被以錕漿32或類似物來固定。嗣,該半導體元件2〇的 電極接墊20a與該中介物1的連接墊14等,會被以接線34例 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 19 玖、發明說明 發明說明續頁 如金線來互相電連接。雖該半導體元件20與該等金線34係 被一連結密封樹脂36所封罩,惟其亦能以移轉模成型法來 洽、封。應凊注意,雖在第1 〇及丨1圖中所示之例皆裝設一單 一的半導體元件,但多數的半導體元件亦可被安裝。 第12圖為一半導體封裝體的截面圖,其係將第1〇圖中 所不的半導體封裝體再安裝於該封裝體基材3〇上而來製成 者。在第12圖所示之例中,該中介物丨的安裝端子6及該封 裝體基材30的連接墊3〇a等,係以焊接凸體38等來互相連 接。或等焊接凸體38係可事先設在該等安裝端子6上,或 没於该封裝體基材3〇的連接墊3〇a上。又,金(au)凸體亦 可被用來取代該等焊接凸體。藉著事先在該等接墊3〇a上 製成该焊接凸體3 8,則可僅藉將該等安裝端子6壓迫於 该等凸體上,以使各端子6的尖端突入該等凸體38内,而 來獲得充分良好的電連接。 第13圖係為第12圖中所示之半導體封裝體的截面圖, 其中該等安裝端子6係直接連接於該半導體基材30的連接 塾30a,而不使用該等焊接凸體38。在此情況下,藉使該 等安裝端子6的頂端突入該封裝體基材30的連接墊3〇a中, 亦可得到充分的電連接。 現將參照第14及第15A至15H圖,來說明本發明第二 實施例之一半導體元件基材。第14圖為本發明第二實施例 之一中介物40的放大載面圖。而第15A至15H圖為第14圖 之中介物40在各製程中的截面圖。於第14及15A至15H圖 中’與第1圖中相同的構件會被以相同標號來表示,而其 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 563231 玖、發明說明 ^ • : : · ..:. ::; 說明將予省略。 本發明第二實施例的中介物4〇具有一結構,其中有一 多層佈線層4 A會被設在第1圖所示中介物1的矽基材2之背 面上。因此’該等安裝端子6的頂端會突入該佈線層4A中 5 ’而沿該石夕基材2之各凹穴2a内表面來形成的部份,將會 被作為外部連接端子。 在第15A至15H圖所示的製造程序中,於第15A至15D 圖中所示的製程係相當於第5人至5D圖中所示者。但是, 在第15C圖中,該導電層係僅被設在用來作為安裝端子6的 10 部份,而未設有導電層6_ 1。 在本實施例中,該背面研磨及化學蝕刻係在該等安裝 端子6被製成於矽基材2之後立即來進行,如第15£圖所示 。此程序係可用與第5H圖中所示之相同製法來進行。故, 該等安裝端子6的頂端將會由該矽基材2的背面突出。然後 15 ,如第15F圖所示,該氧化矽膜18會被形成於矽基材2的背 面上成為一絕緣膜。一有機絕緣膜亦可被設來取代該氧化 矽膜。 嗣,如第15G圖所示,一導電層42會被使用一罩幕來 製成於該矽基材2的背面上,而該罩幕係以一設於該矽基 2〇材2背面上之圖案化阻抗物來形成。該導電層42將會被製 成連接於該等安裝端子6頂端的佈線圖案。嗣,如第i5H圖 所示,該多層佈線層4A會被形成於導電層42上,而在最頂 部製成該等連接塾14,則即完成第14圖中所示的中介物4〇 。請注意雖於第14圖中所示的多層佈線層4八具有三層結構 0續次頁(翻說類不敷使觸,離記並使賺頁) 563231 玖、發明說明 發明說#續頁 ,惟該層4A亦可具有四層結構,如第i圖中之多層佈線層4 一般,或亦可為具有任意層數的多層結構。 第16圖為一中介物40A之截面圖,其係為第14圖所示 之中介物的變化例。在該中介物4〇A中,其多層佈線層 5 4A·1的導電層8-1與安裝端子6等係經由孔道12來連接,而 未設有該_導電層42。 第17圖為一配設第14圖所示之中介物4〇的半導體封裝 體之截面圖。该半導體元件2〇係透過該中介物4〇來裝設在 該封裝體基材30上。即,該半導體元件2〇的電極接墊2〇a 1〇等係藉焊接凸體22等來連接於該中介物40的連接墊14等, 且该半導體元件20及中介物40係藉該底部填料24填設其間 而互相固定。又,該中介物4〇的安裝端子6及封裝體基材 3〇的連锋墊30a等係以焊球26來連接,且該中介物4〇和封 裝體基材30亦以底部填料28填設其間而互相固定。由於該 15等焊球26係被容納於角錐狀安裝端子6的内部,故其接觸 面積會較大而形成更佳的接觸。 在上述各實施例中,矽基材係被用來作為該中介物的 基材,而角錐狀的凹穴係藉蝕刻來形成,故可製成具有對 應角錐形狀的安裝端子等。惟本發明並不限於該矽基材, 20而任何基材皆可被使用,只要其能夠容易製成一具有角錐 形狀的凹穴即可,包括三角錐、五角錐或其它多角錐等。 且,5亥4凹穴的形狀並不限於角錐形,其點角度相對較大 的圓錐構造亦可被使用。 本發明並不限於所揭之特定實施例,各種變化修正乃 0續次頁(翻翻好雜腦,謙記雌臓頁) 22 563231 玫、發明說明 發明論明續頁 可被製成而不超出本發明的範圍。 【圖式簡軍^软^明】 第1圖為本發明第一實施例之中介物的放大截面圖; 第2圖為一安裝端子之頂視平面圖; 5 第3A圖為設於一基材中之一凹穴的平面圖; 第3B圖為設有該凹穴之基材的部份截面圖; 第4圖為供說明該中介物之製造程序的圖表; 第5A至51圖為第4圖中所示之各步驟中的中介物之截面 圖; 10 第6A圖為一背面沒有絕緣膜之中介物的截面圖; 第6B圖為在背面設有一有機絕緣膜之中介物的截面圖 第7圖為一半導體封裝體的截面圖,其係將一半導體元 件裝設於第1圖所示之中介物的安裝端子來製成者; I5 第8圖為一半導體封裝體的截面圖,其中有一半導體元 件係連接於第1圖之中介物的安裝端子; 第9圖為一半導體封裝體的截面圖,其係將第8圖的半 導體封裝體安裝於一封裝體基材上來製成者; 第10圖為一半導體封裝體的截面圖,其係將一半導體 20 元件倒裝固設於第1圖之中介物設有連接墊14的一面上來製 成者; 第11圖為一半導體封裝體的戴面圖,其係將一半導體 元件接線於第1圖的中介物來製成者; 第12圖為一半導體封裝體的截面圖,其係將第1〇圖中 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 23 563231 玫、發明說明 發明說明續頁 的半導體封裝體再安裝於一封裝體基材上來製成者; 第13圖為類似第12圖中之半導體封裝體的截面圖,其 中該等安裝端子係直接連接於該封裝體基材的連接墊上, 而未使用焊球凸體; 5 第Μ圖為本發明第二實施例之中介物的放大截面圖; 第15A至15H圖為第14圖中的中介物之各製程截面圖; 第16圖為第14圖中的中介物之一變化例的截面圖;及 第17圖為一配設第14圖所示中介物之一半導體封裝體 的截面圖。 10 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 563231 發明說明末頁 玖、發明說明 【圖式之主要元件代表符號表】 1,40…中介物 2…碎基材 2a···凹穴 4,4A…佈線層 6…安裝端子 8,6-1,42…導電層 10…絕緣層 12…孔道 14,30a…連接墊 16,18…氧化矽膜
20…半導體元件 20a…電極端子(接墊) 22,38…焊接凸體 24,28…填料 26…焊球 30…封裝體基材 32…銀聚 34…接線 36…密封樹脂
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Claims (1)
- 563231 拾、申請專利範圍 :: : ; , . 1. 一種半導體元件基材,包含: 一石夕基材具有-第-表面及-第二表面相反於該 第一表面; 至夕女裝端子具有角錐造型而延伸於第一與第 5 二表面之間,該安裝端子的一端會由第一或第二表面 之一者突出;及 一佈線層設在該矽基材的第一表面上,而含有一 導電層電連接於該安裝端子。 2. 如申請專利範圍第1項之半導體元件基材,其中有一 氧化梦膜I成的絕緣膜會被設於該安裝端子與碎基材 之間。 3·如申·請專利範圍第1項之半導體元件基材,其中該矽 基材的第一表面係被一有機絕緣膜形成的絕緣層所覆 蓋。 15 4·如申請專利範圍第1項之半導體元件基材,其中該矽 基材的第二表面係被一有機絕緣膜形成的絕緣層所覆 蓋。 5·如申請專利範圍第1項之半導體元件基材,其中該佈 線層具有一多層結構,係由多數絕緣層與導電層交替 20 堆疊而成。 6. 如申請專利範圍第1項之半導體元件基材,其中該等 安裝端子的角錐造型係由該矽基材的晶體平面所形成 〇 7. 如申請專利範圍第6項之半導體元件基材,其中該矽 0級次頁(發明說明頁不敷使用時,請註記並使用續頁) 26 563231 拾、毕請專利範圍 申請靡利範圍續頁 基材的第一與第二表面係平行於矽晶體的(〇〇 U平面 〇 8·如申請專利範圍第7項之半導體元件基材,其中該安 裝端子具有一中空角錐造型。 9.如申請專利範圍第1項之半導體元件基材,其中該安 裝端子的頂端會由該矽基材的第二表面突出。 1〇· —種製造一半導體元件基材的方法,包含下列步驟·· 在一石夕基材之一第一表面中製成一角錐狀的凹穴 9 在該石夕基材的第一表面上及該凹穴的内表面上製 成一絕緣膜; 在戎凹穴内製成一導電層,該導電層會被成形且 排列成一安裝端子; 在該矽基材的第一表面上製成一佈線層,其含有 一導電層電連接於該凹穴内的導電層;及 由該矽基材相反於第一表面的第二表面上來除掉 部份的矽基材,而使在該凹穴内的導電層呈突伸狀態 來曝現。 11.如申請專利範圍第10項之方法,其中製成凹穴的步驟 乃包括藉姓刻來除去該石夕基材中一呈角錐形狀的預定 部份。 12·如申請專利範圍第10項之方法,乃更包含一步驟,即 在除去部份石夕基材的步驟之後,在該矽基材相反於第 一表面的第二表面上製成一絕緣膜。 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 27 563231 拾、申請專利範圍 :: 申請專利範圍續Η: 13·如申請專利範圍第12項之方法,其中在該第二表面上 製成該絕緣膜的步驟,乃包括在該第二表面上製成一 氧化矽膜。 如申請專利範圍第12項之方法,其中在該第二表面上 製成該絕緣膜的步驟,乃包括在該第二表面上製成一 有機絕緣膜。 15.如申請專利範圍第10項之方法,其中該除去的步驟乃 包括: 一第一步驟係研磨該矽基材的第二表面;及 一第二步驟係在第一步驟之後藉蝕刻來除去該部 份基材,而使安裝端子的一端由該蝕刻表面突出。 16•—種半導體封裝體,包含: 一半導體元件基材;及 一半導體元件具有至少一金屬凸體設在其電極接 墊上; 其中該半導體元件基材係包含: 一矽基材具有一第一表面及一第二表面相反於該 第一表面; 至> 一女裝端子具有角錐造型而延伸於第一與第 二表面之間,該安裝端子的一端會由第一或第二表面 之一.者突出;及 一佈線層設在該矽基材的第一表面上,而含有一 導電層電連接於該安裝端子;且 該半導體元件基材之安裝端子的一端係以突入於 0續次頁(發明說明頁不敷使用時,請註記並使用續頁) 28 申請專利範圍績頁 拾、申請專利範圍 該金屬凸體的狀態來連接於該金屬凸體 17· /種半導體封裝體,包含: 一半導體元件基材;及 -半導體元件具有至少一金屬凸體設在其電極接 墊上; 其中戎半導體元件基材係包含: •-矽基材具有一第一表面及一第二表面相反於該 第一表面; 至少一女裝端子具有角錐造型而延伸於第一與第 二表面之間,該安裝端子的一端會由第一或第二表面 之一者突出;及 一佈線層設在該矽基材的第一表面上,而含有一 導電層電連接於該安裝端子;且 .該半導體元件係裝設在該半導體元件基材的佈線 層上,而該等角錐狀的安裝端子係被用作為外部連接 端子。 18. —種半導體封裝體,包含·· 一半導體元件; 一半導體元件基材具有一第一表面及一第二表面 相反於該第一表面,而該半導體元件係被裝在第一表 面上;及 一封裝體基材面對該半導體元件基材的第二表面 ’並透過該半導體元件基材來電連接於該半導體元件 0$買次頁(發明說明頁不敷使用時,請註記並使用續頁) 563231 申請專利範圍末頁 拾、申請專利範圍 其中該半導體元件基材係包含: 一矽基材具有該第一表面及該第二表面相反於該 第一表面; 至少一安裝端子具有角錐造型而延伸於第一與第 二表面之間,該安裝端子的一端會由第一或第二表面 之一者突出;及 一佈線層設在該矽基材的第一表面上,而含有一 導電層電連接於該安裝端子。 ίο30
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