TW200732653A - Apparatus and method for use in automatically inspecting and repairing prined circuit boards, and apparatus for use in automatically marking printed circuit boards - Google Patents

Apparatus and method for use in automatically inspecting and repairing prined circuit boards, and apparatus for use in automatically marking printed circuit boards

Info

Publication number
TW200732653A
TW200732653A TW095138484A TW95138484A TW200732653A TW 200732653 A TW200732653 A TW 200732653A TW 095138484 A TW095138484 A TW 095138484A TW 95138484 A TW95138484 A TW 95138484A TW 200732653 A TW200732653 A TW 200732653A
Authority
TW
Taiwan
Prior art keywords
circuit boards
printed circuit
automatically
repair
repairing
Prior art date
Application number
TW095138484A
Other languages
English (en)
Other versions
TWI414782B (zh
Inventor
Amir Noy
Gilad Davara
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Publication of TW200732653A publication Critical patent/TW200732653A/zh
Application granted granted Critical
Publication of TWI414782B publication Critical patent/TWI414782B/zh

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/225—Correcting or repairing of printed circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/17—Post-manufacturing processes
    • H05K2203/175—Configurations of connections suitable for easy deletion, e.g. modifiable circuits or temporary conductors for electroplating; Processes for deleting connections
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/027—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed by irradiation, e.g. by photons, alpha or beta particles

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW095138484A 2005-10-21 2006-10-18 適於自動檢測及修補印刷電路板之裝置及方法，及適於自動標記印刷電路板之裝置 TWI414782B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/254,756 US8290239B2 (en) 2005-10-21 2005-10-21 Automatic repair of electric circuits

Publications (2)

Publication Number Publication Date
TW200732653A true TW200732653A (en) 2007-09-01
TWI414782B TWI414782B (zh) 2013-11-11

Family

ID=37985442

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095138484A TWI414782B (zh) 2005-10-21 2006-10-18 適於自動檢測及修補印刷電路板之裝置及方法，及適於自動標記印刷電路板之裝置

Country Status (6)

Country Link
US (2) US8290239B2 (zh)
JP (1) JP4993995B2 (zh)
KR (1) KR101319682B1 (zh)
CN (1) CN1960602B (zh)
IL (1) IL178320A (zh)
TW (1) TWI414782B (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI582721B (zh) * 2016-11-03 2017-05-11 英業達股份有限公司 工件導電特徵檢查方法及工件導電特徵檢查系統
CN109142380A (zh) * 2018-09-19 2019-01-04 广州视源电子科技股份有限公司 电路板的故障检测方法、装置和系统
TWI757825B (zh) * 2019-08-09 2022-03-11 大陸商蘇州康代智能科技股份有限公司 基於假點缺陷檢測之pcb檢修系統及檢修方法
TWI769688B (zh) * 2020-11-18 2022-07-01 大陸商蘇州康代智能科技股份有限公司 一種印刷電路板遠程光學檢修方法及系統

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8290239B2 (en) * 2005-10-21 2012-10-16 Orbotech Ltd. Automatic repair of electric circuits
US8904315B2 (en) * 2007-12-17 2014-12-02 Nokia Corporation Circuit arrangements and associated apparatus and methods
DE102008028869A1 (de) * 2008-06-19 2009-12-24 Vistec Semiconductor Systems Gmbh Verfahren und Vorrichtung zur Inspektion eines scheibenförmigen Gegenstandes
JP4941422B2 (ja) * 2008-07-14 2012-05-30 パナソニック株式会社 部品実装システム
CN101646308B (zh) * 2008-08-05 2011-09-21 富葵精密组件(深圳)有限公司 电路板线路补偿系统及运用该补偿系统补偿线路的方法
DE102008038119A1 (de) * 2008-08-17 2010-02-18 Du, Keming, Dr. Kompakte und intelligente Laserbearbeitungsköpfe
CN102065642A (zh) * 2009-07-08 2011-05-18 卡姆特有限公司 切割元件的方法和系统
US8164818B2 (en) 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
KR101933549B1 (ko) * 2011-07-06 2018-12-28 삼성전자주식회사 레이저를 이용한 반도체 칩의 제거장치 및 그의 제거방법
US9092842B2 (en) 2011-08-04 2015-07-28 Sharp Laboratories Of America, Inc. System for defect detection and repair
US9885934B2 (en) 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
US9507232B2 (en) * 2011-09-14 2016-11-29 View, Inc. Portable defect mitigator for electrochromic windows
US9341912B2 (en) 2012-03-13 2016-05-17 View, Inc. Multi-zone EC windows
ES2683188T3 (es) 2012-03-13 2018-09-25 View, Inc. Mitigación estenopeica para dispositivos ópticos
EP2849915B1 (en) 2012-05-18 2023-11-01 View, Inc. Circumscribing defects in optical devices
CN103687328A (zh) * 2012-09-26 2014-03-26 光宝电子(广州)有限公司 焊锡检测及自动修补系统及其方法
US20140375957A1 (en) * 2013-06-20 2014-12-25 Northrop Grumman Systems Corporation Discrete area circuit board image projection system and method
CN103731999A (zh) * 2014-01-21 2014-04-16 深圳市精益盛电子有限公司 修补线的方法及装置
CN106404796A (zh) * 2015-08-03 2017-02-15 奥蒂玛光学科技（深圳）有限公司 电路板在线检测修复设备和电路板在线检测修复方法
TWI608322B (zh) * 2016-11-02 2017-12-11 Printed circuit board inspection device
US11137356B2 (en) * 2017-11-03 2021-10-05 Sela Semiconductor Engineering Laboratories Ltd. System and method of cleaving of buried defects
CN108393273A (zh) * 2017-12-22 2018-08-14 苏州信立盛电子有限公司 一种pcb板的外观检测方法
CN108581114A (zh) * 2018-05-31 2018-09-28 深圳市阿拉玎光电自动化有限公司 一种电路板焊点维修方法、装置和系统
CN108848620B (zh) * 2018-06-13 2020-02-14 深圳市百柔新材料技术有限公司 印刷线路板的线路修补方法
US11281877B2 (en) * 2018-06-26 2022-03-22 Columbia Insurance Company Methods and systems for guided lock-tag-try process
DE102018125216B3 (de) * 2018-10-11 2020-02-06 Neotech AMT GmbH Verfahren zur Vorbereitung der automatisierten Herstellung einer Elektronikkomponente, Verfahren zur automatisierten Herstellung und/oder zum automatisierten Nachbearbeiten einer Elektronikkomponente, Recheneinrichtung, Computerprogramm und elektronisch lesbarer Datenträger
JP6653929B1 (ja) * 2019-07-18 2020-02-26 Ｊｅインターナショナル株式会社 自動判別処理装置、自動判別処理方法、検査システム、プログラム、および記録媒体
US20210097674A1 (en) * 2019-09-27 2021-04-01 Ford Global Technologies, Llc System for identifying and correcting irregularities of the surfaces of an object
CN111054638A (zh) * 2019-11-27 2020-04-24 奥特斯科技(重庆)有限公司 制造部件承载件的方法及在制造期间操控面板的设备
CN111079564B (zh) 2019-11-27 2021-06-01 奥特斯科技(重庆)有限公司 处理部件承载件的方法及光学检查设备和计算机可读介质
TW202134634A (zh) * 2020-03-13 2021-09-16 由田新技股份有限公司 共生式複檢系統、及共生式複檢方法
TW202144765A (zh) * 2020-05-26 2021-12-01 由田新技股份有限公司 影像重製裝置及其檢測方法
TW202208831A (zh) * 2020-08-21 2022-03-01 由田新技股份有限公司 集中式複判系統及方法
US20220308564A1 (en) * 2021-03-23 2022-09-29 International Business Machines Corporation Multicomponent module design and fabrication
WO2022246643A1 (zh) * 2021-05-25 2022-12-01 京东方科技集团股份有限公司 图像获取方法及装置、存储介质
CN113368916A (zh) * 2021-07-15 2021-09-10 合肥市华达半导体有限公司 一种适用于32位mcu芯片的检测维修一体平台
CN113686900A (zh) * 2021-08-31 2021-11-23 江西炬森智能装备有限公司 一种pcb板的外观缺陷检测、修复一体化方法以及装置
CN115754670B (zh) * 2022-11-15 2023-07-18 广东炬森智能装备有限公司 一种pcb线路板短路缺陷的修补复检方法及设备

Family Cites Families (146)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3866398A (en) * 1973-12-20 1975-02-18 Texas Instruments Inc In-situ gas-phase reaction for removal of laser-scribe debris
US4190759A (en) * 1975-08-27 1980-02-26 Hitachi, Ltd. Processing of photomask
JPS5371563A (en) * 1976-12-08 1978-06-26 Hitachi Ltd Automatic inspection correcting method for mask
US4166540A (en) * 1978-01-26 1979-09-04 A. C. Nielsen Company Document sorter utilizing cascaded sorting steps
US4258078A (en) * 1978-06-22 1981-03-24 Bell Telephone Laboratories, Incorporated Metallization for integrated circuits
JPS586127A (ja) * 1981-07-03 1983-01-13 Hitachi Ltd フオトマスク欠陥修正方法とその装置
US4406844A (en) * 1981-10-19 1983-09-27 International Business Machines Corporation Fabrication of semiconductor modules with ceramic substrates and detection of residual glass
US4504727A (en) * 1982-12-30 1985-03-12 International Business Machines Corporation Laser drilling system utilizing photoacoustic feedback
DE3586668T2 (de) * 1984-06-20 1993-04-01 Gould Inc Laserverfahren zur photomaskenreparatur.
US4588468A (en) * 1985-03-28 1986-05-13 Avco Corporation Apparatus for changing and repairing printed circuit boards
US4636403A (en) * 1985-04-29 1987-01-13 At&T Technologies, Inc. Method of repairing a defective photomask
US4752668A (en) * 1986-04-28 1988-06-21 Rosenfield Michael G System for laser removal of excess material from a semiconductor wafer
US5087396A (en) * 1988-09-15 1992-02-11 Unisys Corporation Method of forming holes in unfired ceramic layers of integrated circuit packages
JPH0687170B2 (ja) * 1988-10-05 1994-11-02 学校法人東京理科大学 パターン欠陥の修正方法
US4877175A (en) * 1988-12-30 1989-10-31 General Electric Company Laser debridging of microelectronic solder joints
JPH02198193A (ja) * 1989-01-27 1990-08-06 Hitachi Seiko Ltd プリント基板の穴明け方法
US5099101A (en) * 1989-02-27 1992-03-24 National Semiconductor Corporation Laser trimming system for semiconductor integrated circuit chip packages
US4983817A (en) * 1989-03-01 1991-01-08 Battelle Memorial Institute Background compensating bar code readers
EP0429739B1 (en) * 1989-11-28 1993-10-27 International Business Machines Corporation Method for photoemission inspection of via studs in integrated circuit packages
JP3150322B2 (ja) * 1990-05-18 2001-03-26 株式会社日立製作所 レーザによる配線切断加工方法及びレーザ加工装置
US5171963A (en) * 1990-05-21 1992-12-15 Ntn Corporation Laser processing device and laser processing method
JPH0786466B2 (ja) * 1990-07-18 1995-09-20 大日本スクリーン製造株式会社 プリント基板のパターン検査装置
IL95205A0 (en) * 1990-07-27 1991-06-10 Optrotech Ltd Method and apparatus for optical inspection of substrates
US5127730A (en) * 1990-08-10 1992-07-07 Regents Of The University Of Minnesota Multi-color laser scanning confocal imaging system
US5116641A (en) * 1990-08-20 1992-05-26 Ford Motor Company Method for laser scribing substrates
US5214712A (en) * 1990-09-11 1993-05-25 Matsushita Electric Industrial Co., Ltd. Pattern inspection system for inspecting defect of land pattern for through-hole on printed board
US5104480A (en) * 1990-10-12 1992-04-14 General Electric Company Direct patterning of metals over a thermally inefficient surface using a laser
US5175774A (en) * 1990-10-16 1992-12-29 Micron Technology, Inc. Semiconductor wafer marking for identification during processing
US5093279A (en) * 1991-02-01 1992-03-03 International Business Machines Corporation Laser ablation damascene process
US5164565A (en) * 1991-04-18 1992-11-17 Photon Dynamics, Inc. Laser-based system for material deposition and removal
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
WO1993000695A1 (en) * 1991-06-24 1993-01-07 Durel Corporation Electroluminescent lamp
US5258077A (en) * 1991-09-13 1993-11-02 Solec International, Inc. High efficiency silicon solar cells and method of fabrication
JP2519363B2 (ja) 1991-11-21 1996-07-31 株式会社日立製作所 プリント基板における配線パタ―ンの欠陥検査方法
JP3088175B2 (ja) * 1992-01-14 2000-09-18 日本メクトロン株式会社 可撓性回路配線基板の製造法
US5319183A (en) * 1992-02-18 1994-06-07 Fujitsu Limited Method and apparatus for cutting patterns of printed wiring boards and method and apparatus for cleaning printed wiring boards
IL101063A (en) * 1992-02-25 1995-03-30 Orbotech Ltd Verification and repair station for pcbs
IL105925A (en) * 1992-06-22 1997-01-10 Martin Marietta Corp Ablative process for printed circuit board technology
JP3212405B2 (ja) * 1992-07-20 2001-09-25 富士通株式会社 エキシマレーザ加工方法及び装置
JP2707189B2 (ja) * 1992-08-26 1998-01-28 株式会社日立製作所 電子部品の基板からの取外し方法及び装置
JPH0682801A (ja) 1992-08-31 1994-03-25 Ntn Corp 欠陥検査修正装置
US5325582A (en) * 1992-10-19 1994-07-05 Trw Inc. Multi-function workstation for assembly and repair of printed wiring board assemblies
US5657075A (en) * 1993-02-05 1997-08-12 Teradyne, Inc. Method and apparatus for locating and facilitating the repair of defects on a printed circuit board
US5513099A (en) * 1993-02-08 1996-04-30 Probot Incorporated Circuit board repair and rework apparatus
JP3153682B2 (ja) * 1993-08-26 2001-04-09 松下電工株式会社 回路板の製造方法
US6546308B2 (en) * 1993-12-28 2003-04-08 Hitachi, Ltd, Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices
US5849149A (en) * 1994-01-21 1998-12-15 Westvaco Corporation Magnetic deinking of waste papers
US5608225A (en) * 1994-03-08 1997-03-04 Hitachi Maxell, Ltd. Fluorescent detecting apparatus and method
JP3400067B2 (ja) * 1994-03-16 2003-04-28 富士通株式会社 印刷配線板の導体切断方法及び装置
US5470644A (en) * 1994-04-21 1995-11-28 Durant; David Apparatus and method for fabrication of printed circuit boards
US5539174A (en) * 1994-05-26 1996-07-23 Lsi Logic Corporation Clean laser cutting of metal lines on microelectronic circuit substrates using reactive gases
KR100191675B1 (ko) * 1994-10-13 1999-07-01 세구치 류이치 댐바 절단 장치 및 방법
JP3396548B2 (ja) 1994-10-13 2003-04-14 Ｎｔｎ株式会社 欠陥部位置合せ方法
US5812693A (en) * 1994-10-17 1998-09-22 Chrysler Corporation Integrated machine vision inspection and rework system -- CIP
US6291796B1 (en) * 1994-10-17 2001-09-18 National University Of Singapore Apparatus for CFC-free laser surface cleaning
JP3273401B2 (ja) * 1995-01-17 2002-04-08 オムロン株式会社 修正支援方法および装置
JPH08229920A (ja) 1995-03-01 1996-09-10 Hitachi Ltd スル−ホ−ルの検査・修正装置
JP2950190B2 (ja) * 1995-03-28 1999-09-20 株式会社田村電機製作所 カード発行装置
US5903342A (en) * 1995-04-10 1999-05-11 Hitachi Electronics Engineering, Co., Ltd. Inspection method and device of wafer surface
US5961860A (en) * 1995-06-01 1999-10-05 National University Of Singapore Pulse laser induced removal of mold flash on integrated circuit packages
JP3331127B2 (ja) * 1995-08-22 2002-10-07 株式会社東芝 マスク欠陥修正装置および修正方法
US5838361A (en) * 1996-01-11 1998-11-17 Micron Technology, Inc. Laser marking techniques
US5773808A (en) * 1996-05-17 1998-06-30 Laser; Vadim Method and apparatus for reading invisible messages
US6205239B1 (en) * 1996-05-31 2001-03-20 Texas Instruments Incorporated System and method for circuit repair
US6631558B2 (en) * 1996-06-05 2003-10-14 Laservia Corporation Blind via laser drilling system
US6037103A (en) * 1996-12-11 2000-03-14 Nitto Denko Corporation Method for forming hole in printed board
US6165649A (en) * 1997-01-21 2000-12-26 International Business Machines Corporation Methods for repair of photomasks
JPH10267628A (ja) * 1997-01-23 1998-10-09 Hitachi Ltd ３次元形状検出方法およびその装置並びに基板の製造方法
JPH10297127A (ja) * 1997-04-28 1998-11-10 Mitsubishi Electric Corp 印刷パターンの欠陥修正用シート及び印刷パターンの欠陥修正装置及び印刷パターンの欠陥修正方法
US6033503A (en) * 1997-05-05 2000-03-07 Steven K. Radowicz Adhesive sensing assembly for end jointed beam
JPH10340935A (ja) * 1997-06-06 1998-12-22 Mitsubishi Electric Corp 検査装置
US6046429A (en) * 1997-06-12 2000-04-04 International Business Machines Corporation Laser repair process for printed wiring boards
US6849363B2 (en) * 1997-06-27 2005-02-01 Kabushiki Kaisha Toshiba Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device
US6246472B1 (en) * 1997-07-04 2001-06-12 Hitachi, Ltd. Pattern inspecting system and pattern inspecting method
EP0905762A1 (en) * 1997-09-30 1999-03-31 STMicroelectronics S.r.l. Method for removing moulding residues in the fabrication of plastic packages for semiconductor devices
US6074571A (en) * 1997-09-30 2000-06-13 International Business Machines Corporation Cut and blast defect to avoid chrome roll over annealing
US6455331B2 (en) * 1997-10-31 2002-09-24 International Business Machines Corporation Process of top-surface-metallurgy plate-up bonding and rewiring for multilayer devices
FI982568A (fi) * 1997-12-02 1999-06-03 Samsung Electro Mech Menetelmä monikerroksisen painetun piirilevyn valmistamiseksi
US6038336A (en) * 1997-12-04 2000-03-14 Daewoo Electronics Co., Ltd. PCB testing circuit for an automatic inserting apparatus and a testing method therefor
US6091996A (en) * 1998-03-02 2000-07-18 Electronic Packaging Company Printed circuit board analysis and repair system
US6494217B2 (en) * 1998-03-12 2002-12-17 Motorola, Inc. Laser cleaning process for semiconductor material and the like
JPH11284340A (ja) 1998-03-27 1999-10-15 Nippon Avionics Co Ltd 多層プリント配線板の製造方法
US6329830B1 (en) * 1998-04-28 2001-12-11 Delaware Capital Formation, Inc. Screen display for automated verification and repair station
JP3114693B2 (ja) 1998-05-06 2000-12-04 日立エーアイシー株式会社 配線基板を修正する溶断装置
TW388197B (en) 1998-06-08 2000-04-21 Mitsubishi Electric Corp Laser processing method
JP3052934B2 (ja) 1998-06-12 2000-06-19 日本電気株式会社 バリ取り装置及びバリ除去方法
JP2000009993A (ja) * 1998-06-17 2000-01-14 Nikon Corp 広角レンズ
US6054090A (en) * 1998-07-09 2000-04-25 Johnson & Johnson Vision Products, Inc. Method of steam-sterilizing contact lens label
WO2000009993A1 (fr) 1998-08-10 2000-02-24 Mitsubishi Denki Kabushiki Kaisha Dispositif de verification de cartes a circuit imprime
US6713685B1 (en) * 1998-09-10 2004-03-30 Viasystems Group, Inc. Non-circular micro-via
TW374288B (en) 1998-09-18 1999-11-11 Ind Tech Res Inst Automatic ball mounting machine and method for BGA substrate
JP2000098591A (ja) 1998-09-22 2000-04-07 Dainippon Printing Co Ltd フォトマスク欠陥修正方法
US6243188B1 (en) * 1998-11-16 2001-06-05 General Scanning, Inc. Light beam scanning system
US6300590B1 (en) * 1998-12-16 2001-10-09 General Scanning, Inc. Laser processing
US6277526B1 (en) * 1998-12-28 2001-08-21 Micron Technology, Inc. Method for repairing MoSi attenuated phase shift masks
JP3696426B2 (ja) 1999-01-14 2005-09-21 シャープ株式会社 パターン欠陥修正装置
JP4163319B2 (ja) 1999-03-23 2008-10-08 住友重機械工業株式会社 レーザ穴あけ加工装置用のデスミア方法及びデスミア装置
US6483937B1 (en) * 1999-06-17 2002-11-19 International Business Machines Corporation Process for inspecting an object
IL131282A (en) * 1999-08-05 2009-02-11 Orbotech Ltd Apparatus and methods for inspection of objects
JP3805936B2 (ja) * 1999-12-28 2006-08-09 株式会社東芝 マスクパターン補正方法及びマスクパターン作成システム
US6337122B1 (en) * 2000-01-11 2002-01-08 Micron Technology, Inc. Stereolithographically marked semiconductors devices and methods
US6852553B2 (en) * 2000-02-15 2005-02-08 Renesas Technology Corp. Semiconductor device fabrication method and semiconductor device fabrication apparatus
US6322935B1 (en) * 2000-02-28 2001-11-27 Metron Technology Method and apparatus for repairing an alternating phase shift mask
IL135522A (en) * 2000-04-06 2005-11-20 Orbotech Ltd Optical inspection of laser vias
AU2001250208A1 (en) * 2000-04-11 2001-10-23 Gsi Lumonics Inc. A method and system for laser drilling
JP2001356099A (ja) 2000-06-15 2001-12-26 Nippon Avionics Co Ltd プリント配線板外観検査および修理装置
JP2002057252A (ja) * 2000-08-07 2002-02-22 Hitachi Ltd 半導体装置及びその製造方法
US6602430B1 (en) * 2000-08-18 2003-08-05 Micron Technology, Inc. Methods for finishing microelectronic device packages
JP2002110799A (ja) * 2000-09-27 2002-04-12 Toshiba Corp 半導体装置及びその製造方法
US6870611B2 (en) * 2001-07-26 2005-03-22 Orbotech Ltd. Electrical circuit conductor inspection
TW479917U (en) 2000-10-21 2002-03-11 Utechzone Co Ltd Quality maintenance and feedback system for printed circuit board process
JP4792660B2 (ja) 2000-12-25 2011-10-12 パナソニック電工株式会社 回路基板の製造方法
JP4038988B2 (ja) 2001-02-06 2008-01-30 株式会社トッパンＮｅｃサーキットソリューションズ 多層プリント配線板用レーザ孔あけ加工機
US6873720B2 (en) * 2001-03-20 2005-03-29 Synopsys, Inc. System and method of providing mask defect printability analysis
US6753688B2 (en) * 2001-04-10 2004-06-22 International Business Machines Corporation Interconnect package cluster probe short removal apparatus and method
US7127099B2 (en) * 2001-05-11 2006-10-24 Orbotech Ltd. Image searching defect detector
US20020170897A1 (en) * 2001-05-21 2002-11-21 Hall Frank L. Methods for preparing ball grid array substrates via use of a laser
JP3901961B2 (ja) 2001-07-24 2007-04-04 Ｎｔｎ株式会社 パターン修正装置およびパターン修正方法
JP3904419B2 (ja) * 2001-09-13 2007-04-11 株式会社日立製作所 検査装置および検査システム
JP4249966B2 (ja) 2001-09-27 2009-04-08 省栄株式会社 プリント配線基板の検査方法及び検査装置
SG96648A1 (en) * 2001-10-01 2003-06-16 Inst Data Storage Method and apparatus for deflashing of integrated circuit packages
JP3977061B2 (ja) 2001-11-21 2007-09-19 シャープ株式会社 液晶表示装置及びその欠陥修復方法
US7994450B2 (en) * 2002-01-07 2011-08-09 International Business Machines Corporation Debris minimization and improved spatial resolution in pulsed laser ablation of materials
US7236847B2 (en) * 2002-01-16 2007-06-26 Kla-Tencor Technologies Corp. Systems and methods for closed loop defect reduction
US7119351B2 (en) * 2002-05-17 2006-10-10 Gsi Group Corporation Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system
JP4084969B2 (ja) 2002-07-24 2008-04-30 インスペック株式会社 パターン検査装置及びパターン検査方法
US7120068B2 (en) * 2002-07-29 2006-10-10 Micron Technology, Inc. Column/row redundancy architecture using latches programmed from a look up table
TWI244359B (en) 2002-10-09 2005-11-21 Wei Kuang Mechanical Eng Co Lt Automatic optical detecting system for defect components on printed circuit board
CN1318839C (zh) * 2002-11-28 2007-05-30 威光机械工程股份有限公司 印刷电路板上瑕疵组件的自动光学检测方法
US7203355B2 (en) 2002-12-24 2007-04-10 Orbotech Ltd. Automatic optical inspection system and method
US6927003B2 (en) * 2003-02-11 2005-08-09 Synopsys, Inc. Simulation based PSM clear defect repair method and system
JP2004257824A (ja) * 2003-02-25 2004-09-16 Shimadzu Corp 液晶基板管理装置
JP4348979B2 (ja) 2003-03-27 2009-10-21 東レ株式会社 リペア装置およびリペア方法
TWI233998B (en) 2004-02-26 2005-06-11 Genialpro Technology Co Ltd Testing and adjusting method for automation process of display device
US7355692B2 (en) * 2004-03-05 2008-04-08 Orbotech Ltd System and method for inspecting electrical circuits utilizing reflective and fluorescent imagery
US7026175B2 (en) * 2004-03-29 2006-04-11 Applied Materials, Inc. High throughput measurement of via defects in interconnects
JP4416556B2 (ja) * 2004-03-31 2010-02-17 パナソニック株式会社 プラズマディスプレイ用電極修理方法及び電極修理装置
US7020582B1 (en) * 2004-04-28 2006-03-28 Altera Corporation Methods and apparatus for laser marking of integrated circuit faults
US7650028B1 (en) * 2004-10-26 2010-01-19 Sandia Corporation Vicinal light inspection of translucent materials
US7528342B2 (en) * 2005-02-03 2009-05-05 Laserfacturing, Inc. Method and apparatus for via drilling and selective material removal using an ultrafast pulse laser
US7668364B2 (en) * 2005-04-26 2010-02-23 Hitachi Via Mechanics, Ltd. Inspection method and apparatus for partially drilled microvias
US7339391B2 (en) * 2005-05-27 2008-03-04 United Microelectronics Corp. Defect detection method
US8290239B2 (en) * 2005-10-21 2012-10-16 Orbotech Ltd. Automatic repair of electric circuits
JP4958489B2 (ja) * 2006-06-30 2012-06-20 株式会社キーエンス レーザ加工装置、レーザ加工条件設定装置、レーザ加工条件設定方法、レーザ加工条件設定プログラム
JP5589318B2 (ja) * 2008-08-11 2014-09-17 住友電気工業株式会社 レーザマーキング方法
JP5353179B2 (ja) * 2008-10-22 2013-11-27 ソニー株式会社 欠陥修正装置および欠陥修正方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI582721B (zh) * 2016-11-03 2017-05-11 英業達股份有限公司 工件導電特徵檢查方法及工件導電特徵檢查系統
CN109142380A (zh) * 2018-09-19 2019-01-04 广州视源电子科技股份有限公司 电路板的故障检测方法、装置和系统
TWI757825B (zh) * 2019-08-09 2022-03-11 大陸商蘇州康代智能科技股份有限公司 基於假點缺陷檢測之pcb檢修系統及檢修方法
TWI769688B (zh) * 2020-11-18 2022-07-01 大陸商蘇州康代智能科技股份有限公司 一種印刷電路板遠程光學檢修方法及系統

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JP4993995B2 (ja) 2012-08-08
TWI414782B (zh) 2013-11-11
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IL178320A0 (en) 2007-02-11
CN1960602A (zh) 2007-05-09
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IL178320A (en) 2013-08-29
US8290239B2 (en) 2012-10-16

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