GB2420420B - Method and apparatus for testing a transmission path across one or more printed circuit boards - Google Patents
Method and apparatus for testing a transmission path across one or more printed circuit boardsInfo
- Publication number
- GB2420420B GB2420420B GB0503641A GB0503641A GB2420420B GB 2420420 B GB2420420 B GB 2420420B GB 0503641 A GB0503641 A GB 0503641A GB 0503641 A GB0503641 A GB 0503641A GB 2420420 B GB2420420 B GB 2420420B
- Authority
- GB
- United Kingdom
- Prior art keywords
- testing
- printed circuit
- transmission path
- circuit boards
- boards
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000005540 biological transmission Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/088—Aspects of digital computing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/993,387 US7631230B2 (en) | 2004-11-19 | 2004-11-19 | Method and apparatus for testing a transmission path |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0503641D0 GB0503641D0 (en) | 2005-03-30 |
GB2420420A GB2420420A (en) | 2006-05-24 |
GB2420420B true GB2420420B (en) | 2006-11-15 |
Family
ID=34423600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0503641A Active GB2420420B (en) | 2004-11-19 | 2005-02-22 | Method and apparatus for testing a transmission path across one or more printed circuit boards |
Country Status (2)
Country | Link |
---|---|
US (1) | US7631230B2 (en) |
GB (1) | GB2420420B (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7568122B2 (en) * | 2005-03-16 | 2009-07-28 | Dot Hill Systems Corporation | Method and apparatus for identifying a faulty component on a multiple component field replaceable unit |
US7514937B2 (en) * | 2005-11-21 | 2009-04-07 | Sun Microsystems, Inc. | Method and apparatus for interconnect diagnosis |
US7609068B2 (en) * | 2007-10-04 | 2009-10-27 | Delphi Technologies, Inc. | System and method for particulate sensor diagnostic |
US7979754B2 (en) * | 2008-01-30 | 2011-07-12 | Oracle America, Inc. | Voltage margin testing for proximity communication |
US9638742B2 (en) * | 2008-11-14 | 2017-05-02 | Teradyne, Inc. | Method and apparatus for testing electrical connections on a printed circuit board |
US8035409B2 (en) * | 2009-04-29 | 2011-10-11 | International Business Machines Corporation | System and method implementing short-pulse propagation technique on production-level boards with incremental accuracy and productivity levels |
KR101796116B1 (en) | 2010-10-20 | 2017-11-10 | 삼성전자 주식회사 | Semiconductor device, memory module and memory system having the same and operating method thereof |
JP2012177626A (en) * | 2011-02-25 | 2012-09-13 | Fujitsu Semiconductor Ltd | Semiconductor device, test program, test method, and testing device |
US9354262B2 (en) * | 2012-06-29 | 2016-05-31 | Kaysight Technologies, Inc. | Passive intermodulation measurement apparatus |
US9151795B2 (en) * | 2012-11-21 | 2015-10-06 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Apparatus for inspecting passive component having signal transmission line |
US9519019B2 (en) * | 2013-04-11 | 2016-12-13 | Ge Aviation Systems Llc | Method for detecting or predicting an electrical fault |
DE102014116484B4 (en) * | 2014-11-12 | 2019-02-14 | Infineon Technologies Ag | Signal processing system and sensor system for determining information about a movement of an object |
DE102017216771A1 (en) * | 2017-09-21 | 2019-03-21 | Bender Gmbh & Co. Kg | Method and circuit arrangements for locating a fault location on an electrical line on the basis of time domain reflectometry |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2143954A (en) * | 1983-07-22 | 1985-02-20 | Sharetree Ltd | A capacitive method and apparatus for checking connections of a printed circuit board |
US6104198A (en) * | 1997-05-20 | 2000-08-15 | Zen Licensing Group Llp | Testing the integrity of an electrical connection to a device using an onboard controllable signal source |
JP2001201753A (en) * | 2000-01-18 | 2001-07-27 | Oht Kk | Method and instrument for inspecting simple matrix type liquid crystal panel, method and instrument for inspecting plasma display panel |
US20040164755A1 (en) * | 2001-06-11 | 2004-08-26 | Shuji Yamaoka | Circuit pattern inspection device, circuit pattern inspection method, and recording medium |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7109728B2 (en) * | 2003-02-25 | 2006-09-19 | Agilent Technologies, Inc. | Probe based information storage for probes used for opens detection in in-circuit testing |
US6998849B2 (en) * | 2003-09-27 | 2006-02-14 | Agilent Technologies, Inc. | Capacitive sensor measurement method for discrete time sampled system for in-circuit test |
US6933730B2 (en) * | 2003-10-09 | 2005-08-23 | Agilent Technologies, Inc. | Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies |
-
2004
- 2004-11-19 US US10/993,387 patent/US7631230B2/en active Active
-
2005
- 2005-02-22 GB GB0503641A patent/GB2420420B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2143954A (en) * | 1983-07-22 | 1985-02-20 | Sharetree Ltd | A capacitive method and apparatus for checking connections of a printed circuit board |
US6104198A (en) * | 1997-05-20 | 2000-08-15 | Zen Licensing Group Llp | Testing the integrity of an electrical connection to a device using an onboard controllable signal source |
JP2001201753A (en) * | 2000-01-18 | 2001-07-27 | Oht Kk | Method and instrument for inspecting simple matrix type liquid crystal panel, method and instrument for inspecting plasma display panel |
US20040164755A1 (en) * | 2001-06-11 | 2004-08-26 | Shuji Yamaoka | Circuit pattern inspection device, circuit pattern inspection method, and recording medium |
Also Published As
Publication number | Publication date |
---|---|
US7631230B2 (en) | 2009-12-08 |
GB2420420A (en) | 2006-05-24 |
US20060123289A1 (en) | 2006-06-08 |
GB0503641D0 (en) | 2005-03-30 |
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