JP2001201753A - Method and instrument for inspecting simple matrix type liquid crystal panel, method and instrument for inspecting plasma display panel - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a method and instrument for inspecting a simple matrix type liquid crystal panel, a method and instrument for inspecting a plasma display panel by which the disconnection of an electrode can more easily be inspected. SOLUTION: In this method for inspecting the disconnection of plural lines of electrodes 100 and 101 provided on a panel B, either one of the electrode 100 or 101 is selected, a voltage changing with time is supplied to one end of the selected electrode 101a, the voltage appearing through electrostatic capacity by the supply of the voltage to the electrode 101a is measured with respect to the electrode 100a orthogonally intersecting the selected electrode 101a and whether or not the measured voltage is within the prescribed range is decided by a computer 6, thus whether or not the disconnection occurred in the electrode 101a is decided.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for inspecting a circuit board, and more particularly to a method and an apparatus for inspecting a disconnection of an electrode constituting a simple matrix type liquid crystal panel or a plasma display panel.

[0002]

2. Description of the Related Art In a liquid crystal panel or a plasma display panel, one of a pair of opposing substrates is provided with a plurality of so-called scanning electrodes extending in a row direction on one substrate, and a scanning electrode extending along a column direction on the other substrate (scanning electrodes). An image is formed by providing a plurality of linear so-called signal electrodes (perpendicular to the above) and supplying power with these.

In such a liquid crystal panel or the like, it is necessary to inspect each electrode for disconnection in the manufacturing process.

As such an inspection method, there has been proposed a method in which a probe is brought into contact with both ends of an electrode to be inspected to check the continuity of the electrode. However, in recent panels where the mounting density of the panel has increased, it is not always easy to bring the probe into contact with both ends of the electrode. There is a problem that it is necessary to provide.

Therefore, as an example of an inspection method for solving this problem, there is an inspection method described in Japanese Patent Application Laid-Open No. 7-146323.

In this inspection method, a signal whose voltage changes with time is applied to an electrode to be inspected, and a non-contact probe is applied to the electrode through a capacitance interposed between the electrode and the non-contact probe. Thus, a signal appearing at the non-contact probe is detected, and a disconnection of the electrode is detected based on the intensity of the signal. This inspection method has an advantage that it is sufficient to provide an inspection pad only at one end of the electrode.

[0007]

SUMMARY OF THE INVENTION However, Japanese Patent Application Laid-Open No. 7-1
Even the inspection method described in Japanese Patent No. 46323 requires a non-contact probe, which may complicate the apparatus and the inspection procedure.

Accordingly, an object of the present invention is to provide an inspection method and an inspection apparatus for a simple matrix type liquid crystal panel, and an inspection method and an inspection apparatus for a plasma display panel, which can more easily inspect the disconnection of an electrode.

[0009]

According to the present invention, there is provided an inspection method for inspecting disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, wherein one of the electrodes is selected, Supplying a time-varying voltage to one end of the selected electrode; and measuring a voltage appearing by the supply of the voltage for any one of the plurality of electrodes orthogonal to the selected electrode. And, based on whether or not the measured voltage is within a predetermined range, the selected electrode is disconnected at a portion from the one end to the electrode at which the voltage was measured in the measuring step. And a determining step of determining whether or not an error has occurred. An inspection method for a simple matrix type liquid crystal panel is provided.

[0010] In this case, in the measuring step, the voltage may be measured for an electrode at a position most distant from one end of the selected electrode among a plurality of electrodes orthogonal to the selected electrode.

In this case, in the determining step,
When it is determined that a break has occurred in the electrode, of the plurality of electrodes orthogonal to the selected electrode, from the electrode whose voltage was measured in the measurement step, for each electrode located on the one end side In order, by measuring the voltage appearing by the supply of the voltage, and by specifying the electrodes whose measured voltage is in a predetermined range,
Specifying a disconnection point of the selected electrode.

Further, according to the present invention, there is provided an inspection method for inspecting disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, wherein one of the electrodes is selected and the selected electrode is selected. A step of supplying a time-varying voltage to a part, and a measuring step of measuring a voltage appearing by the supply of the voltage, for any one of the plurality of electrodes orthogonal to the selected electrode, Based on whether or not the measured voltage is within a predetermined range, a disconnection occurs in the portion between the selected electrode and the electrode from which the voltage was measured in the measurement step. And a determining step of determining whether or not the inspection is performed on a simple matrix type liquid crystal panel.

Further, according to the present invention, there is provided an inspection method for inspecting disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, wherein one of the electrodes is selected and the selected electrode is A step of supplying a time-varying voltage, a step of measuring a voltage appearing by the supply of the voltage for each of the plurality of electrodes orthogonal to the selected electrode, and comparing the measured voltages with each other. A determining step of determining whether or not the selected electrode is disconnected. A method of inspecting a simple matrix type liquid crystal panel is provided.

In this case, in the measuring step, among the electrodes orthogonal to the selected electrode, the voltage can be measured for the electrodes included in a region where disconnection is expected.

In this case, in the measuring step, the voltage can be measured for all the electrodes orthogonal to the selected electrode.

In this case, when it is determined in the determining step that the selected electrode is disconnected, the electrode whose voltage has changed is specified from each of the measured voltages, whereby Specifying a disconnection point of the selected electrode.

Further, according to the present invention, there is provided an inspection method for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected and one end of the selected electrode is provided. Supplying a time-varying voltage, and for any one of the plurality of electrodes orthogonal to the selected electrode, a measuring step of measuring a voltage appearing by the supply of the voltage, and the measured voltage However, based on whether or not it is within a predetermined range, whether or not the selected electrode has a disconnection in a portion from the one end to the electrode from which the voltage was measured in the measuring step. And a judging step of judging the plasma display panel.

Further, according to the present invention, there is provided an inspection method for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected and a part of the selected electrode is selected. Supplying a time-varying voltage to the, and for any one of the plurality of electrodes orthogonal to the selected electrode, a measuring step of measuring a voltage appearing by the supply of the voltage, Based on whether or not the voltage is within a predetermined range, whether the selected electrode has a disconnection in a portion from the part to the electrode whose voltage has been measured in the measurement step, And a determining step of determining whether or not the plasma display panel is inspected.

Further, according to the present invention, there is provided an inspection method for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected, and a time is applied to the selected electrode. Supplying a voltage that changes to a selected electrode, measuring a plurality of electrodes perpendicular to the selected electrode, measuring a voltage appearing by supplying the voltage, and comparing the measured voltages with each other. Accordingly, there is provided a method for inspecting a plasma display panel, comprising: a step of determining whether or not the selected electrode is disconnected.

Further, according to the present invention, there is provided an inspection apparatus for inspecting a plurality of electrodes of a simple matrix type liquid crystal panel for disconnection, wherein one end of one of the electrodes is selected. Means for supplying a time-varying voltage, and measuring means for measuring a voltage appearing by supplying the voltage, for any one of the plurality of electrodes orthogonal to the selected electrode, Based on whether or not the voltage is within a predetermined range, whether or not the selected electrode has a disconnection in a portion from the one end to the electrode where the voltage is measured by the measuring unit. A simple matrix type liquid crystal panel inspection device, comprising: a determination unit for determining whether or not the liquid crystal panel is simple.

[0021] In this case, the measuring means can measure the voltage for an electrode at a position most distant from one end of the selected electrode among a plurality of electrodes orthogonal to the selected electrode. .

In this case, when the determining means determines that the electrode is disconnected, the measuring means firstly applies a voltage to the plurality of electrodes orthogonal to the selected electrode. From the measured electrode, for each electrode located on the one end side, in order, by measuring the voltage appearing by the supply of the voltage, by specifying the electrode whose measured voltage is in a predetermined range, the Means for specifying the disconnection point of the selected electrode.

Further, according to the present invention, there is provided an inspection apparatus for inspecting disconnection of a plurality of electrodes included in a simple matrix type liquid crystal panel, wherein a part of one of the electrodes selected from the electrodes is provided. Means for supplying a time-varying voltage to the electrode; measuring means for measuring a voltage appearing when the voltage is supplied, for any one of the plurality of electrodes orthogonal to the selected electrode; and Based on whether or not the applied voltage is within a predetermined range, the selected electrode has a disconnection in a portion from the part to the electrode at which the measuring unit measures the voltage. A simple matrix type liquid crystal panel inspection apparatus, comprising: a determination unit for determining whether or not the inspection is performed.

Further, according to the present invention, there is provided an inspection apparatus for inspecting disconnection of a plurality of electrodes included in a simple matrix type liquid crystal panel, wherein a time is applied to one of the electrodes selected from the electrodes. Means for supplying a voltage that changes to the selected electrode, measuring means for measuring a voltage appearing by the supply of the voltage for each of the plurality of electrodes orthogonal to the selected electrode, and comparing the measured voltages with each other. Thus, there is provided an inspection apparatus for a simple matrix type liquid crystal panel, comprising: a determination means for determining whether or not the selected electrode is disconnected.

[0025] In this case, the measuring means may measure the voltage with respect to the electrodes which are included in the area where the disconnection is expected among the electrodes orthogonal to the selected electrode.

In this case, the measuring means can measure the voltage for all the electrodes orthogonal to the selected electrode.

Further, in this case, when the determination means determines that the selected electrode is disconnected, the electrode whose voltage has changed is specified from each of the measured voltages, whereby Means for specifying the disconnection point of the selected electrode may be provided.

Further, according to the present invention, there is provided an inspection apparatus for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected and one end of the selected electrode is provided. Means for supplying a time-varying voltage, measuring means for measuring a voltage appearing by supplying the voltage, for any one of the plurality of electrodes orthogonal to the selected electrode, and measuring the measured voltage However, based on whether or not it is in a predetermined range, whether or not the selected electrode has a disconnection in a portion from the one end to the electrode from which the voltage is measured by the measuring means. And a determination unit for determining the plasma display panel.

Further, according to the present invention, there is provided an inspection apparatus for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected,
Means for supplying a time-varying voltage to a part of the selected electrode, and measurement for measuring a voltage appearing by the supply of the voltage for any one of the plurality of electrodes orthogonal to the selected electrode. Means, based on whether the measured voltage is within a predetermined range, based on whether or not the selected electrode is at a portion from the part to the electrode at which the voltage is measured by the measuring means. A determination unit for determining whether or not a disconnection has occurred.

Further, according to the present invention, there is provided an inspection apparatus for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected and a time is applied to the selected electrode. Means for supplying a voltage which changes to a plurality of electrodes, measuring means for measuring a voltage appearing by supplying the voltage for each of the plurality of electrodes orthogonal to the selected electrode, and comparing the measured voltages with each other. Accordingly, there is provided an inspection apparatus for a plasma display panel, comprising: a determination unit for determining whether or not the selected electrode is disconnected.

[0031]

DESCRIPTION OF THE PREFERRED EMBODIMENTS In the present invention, the simple matrix type liquid crystal panel includes, for example, an STN simple matrix type liquid crystal panel, a TN simple matrix type liquid crystal panel, and the like. Further, the term “electrode” means both a scanning electrode and a signal electrode.

Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a schematic diagram of an inspection apparatus A according to an embodiment of the present invention, and a simple matrix type liquid crystal panel to be inspected by the inspection apparatus A or an electrode group 100 of a panel B showing a plasma display panel. FIG. The electrode groups 100 and 101 are groups of electrodes corresponding to the scanning electrodes and the signal electrodes, respectively.

Inspection apparatus A includes electrode group 100 or 101
A signal generator 1 for supplying a time-varying voltage,
A signal processor 2 for amplifying and filtering the voltage appearing on the electrode group 100 or 101, an oscilloscope 3 for measuring a signal processed by the signal processor 2, and a probe connected to each electrode group 100 or 101 4, probe 4 and signal generator 1 or signal processor 2 or GN
A multiplexer 5 for switching the connection with the D and a computer 6 for controlling these and determining the disconnection of the electrode and specifying the disconnection position.

The signal generator 1 generates a signal whose voltage changes with time in accordance with an instruction from the computer 7. The degree (frequency) of the temporal change of the voltage is preferably, for example, between 500 kHz and 10 MHz. The generated signal may be a rectangular direct current or an alternating current. Further, the signal generator 1 may always generate the signal irrespective of the instruction of the computer 7.

The signal processor 2 comprises an electrode group 100 or 101
This is for performing filtering processing such as removing noise from the voltage appearing in, and processing for amplifying the voltage level.

The oscilloscope 3 measures the voltage level of the signal sent from the signal processor 2. The measurement result is sent to the computer 6.

The probes 4 are individually assigned to the respective electrodes of the electrode groups 100 and 101.
Has one end in contact with one end of each electrode and the other end connected to the multiplexer 5. In the present embodiment, the probe 4 is individually assigned to each electrode. However, when the probe 4 is assigned to each of the electrode group 100 and the electrode group 101 to inspect the disconnection of each electrode, manual or appropriate The probe 4 may be sequentially moved to each electrode by an appropriate device.

The multiplexer 5 selectively connects the other end of each probe 4 to one of the signal generator 1, the signal processor 2, and the GND. Done by FIG. 2 is a diagram showing an internal circuit of the multiplexer 5.

Next, an inspection method by the inspection apparatus A will be described.

First, the computer 6 selects an electrode to be inspected for disconnection. Here, it is assumed that the electrode 101a is selected. In addition, the computer 6 selects one electrode from the electrode group 100 orthogonal to the selected electrode 101a. Here, it is assumed that the electrode 100a is selected.

Next, the computer 6 switches the connection of the multiplexer 5, and connects the probe 4 connected to the electrode 101a to the signal generator 1 and the probe 4 connected to the electrode 100a to the signal processor 4, respectively. I do. In this case, if all the other probes 4 are connected to GND, more accurate inspection can be performed.

Next, the signal generator 1 generates a time-varying voltage, which is supplied to the multiplexer 5 and the probe 4.
Is supplied only to the electrode 101a.

At this time, the electrode 101 is connected to the electrode 100a.
A voltage appears according to the voltage supplied to the electrode 101a via the capacitance of the portion orthogonal to a.

The appearing voltage is processed by the signal processor 2 via the probe 4 and the multiplexer 5 and measured by the oscilloscope 3.

The computer 6 determines whether or not the voltage measured by the oscilloscope 3 is within a predetermined range. If the voltage is within the predetermined range, the computer 6 determines that the electrode 101a is not disconnected. If not, the electrode 101
It is determined that a is disconnected.

When it is determined that the electrode 101a is not disconnected, the inspection is shifted to another electrode.

Here, the predetermined range is determined based on data obtained by performing an inspection on the dummy panel B in accordance with the same procedure with respect to the electrodes that have been disconnected and the electrodes that have not been disconnected. Range.

In general, if a disconnection occurs in an electrode to be inspected, the level of the voltage obtained from an electrode perpendicular to the disconnection will decrease.

Therefore, a voltage level when no disconnection occurs and a voltage level when a disconnection occurs are measured in advance, and a value between these voltage levels is used as a threshold for determining disconnection. It is.

As described above, in the inspection apparatus A, disconnection inspection of the electrodes can be performed more easily by using the electrodes orthogonal to the electrodes to be inspected as a sensor.

Next, a description will be given of a method for specifying the position of the electrode 101a when a disconnection has occurred.

First, it is known from the above inspection that a disconnection has occurred between one end (probe 4 side) of the electrode 101a and the electrode 100a. Therefore, the multiplexer 5 replaces the electrode 100a with the electrode 100a. 100b
Is connected to the signal processor 2.

Then, it is determined whether or not the voltage appearing on the electrode 100b is within a predetermined range. If it is within a predetermined range, there is no disconnection of the electrode 101a between one end of the electrode 101a and the electrode 100b.
A disconnection has occurred between the electrode and the electrode 100b.

If it is not within the predetermined range, the electrode 101a
It is considered that the electrode 101a is disconnected from one end of the electrode 100b to the electrode 100b. Therefore, the multiplexer 5 connects the electrode 100c to the signal processor 2 instead of the electrode 100b.

Hereinafter, by repeating the same procedure,
The part where the electrode 101a is disconnected is found. For example,
If a disconnection occurs at the point X in FIG. 1, the voltage appearing at the electrodes changes at the boundary between the electrodes 100b and 100c.

These procedures are performed by the electrode groups 100 and 101.
Is performed for all the electrodes, the disconnection inspection of the panel B is completed. In this inspection method, since the disconnection point is also found, it is convenient for repairing the disconnection point.

In the above-described inspection method, when inspecting the disconnection of the electrode 101a, first, the electrode 10a at the most distant position from one end (probe 4 side) of the electrode 101a.
The voltage appearing at 0a was measured. This is for inspecting the disconnection of almost all portions of the electrode 101a in one inspection. However, for example, when the place where disconnection is likely to occur is limited, the voltage appearing on the electrode 100c which is not the most distant position may be measured. In this case, one end of the electrode 101a is connected to the electrode 100c.
The disconnection up to this point can be inspected.

In the above-described inspection method, a time-varying voltage is supplied to the electrode 101a by bringing the probe 4 into contact with one end of the electrode 101a. However, the position at which the probe 4 is brought into contact is not limited to this. Electrode 101a if possible
It may be supplied in contact with any part of the body.

In the above inspection method, one electrode 100a is selected from the electrode group 100 orthogonal to the electrode 101a to be inspected, and the voltage appearing on the electrode 100a is compared with a predetermined range. The electrode 101
It is determined whether or not the electrode 101a is disconnected by selecting a plurality of electrodes from the electrode group 100 and comparing the voltages appearing therewith with each other. May be. This is because if the electrode 101a is disconnected, the voltage appearing at each electrode orthogonal to the electrode 101a will be different. For example, if a disconnection occurs at the point X in FIG. 1, the voltage appearing at the electrode 100a and the electrode 100b is at substantially the same level, but the voltage appearing at the other electrodes, for example, the electrode 100c, is It is at a different level.

Adopting this method has the advantage that the trouble of measuring the above-mentioned "predetermined range" can be omitted, and the location of the disconnection can be specified simultaneously with the presence / absence of the disconnection of the electrode.

In this case, the voltage appearing on all the electrodes of the electrode group (electrode group 100) orthogonal to the electrode (electrode 101a) to be inspected may be measured, or the range in which a disconnection is expected may be measured. Considering this, the measurement may be performed on some of the electrodes of the orthogonal electrode group. Alternatively, measurement may be performed on electrodes at appropriate intervals, such as skipping one of the electrodes of the orthogonal electrode group and skipping two of the electrodes.

[0063]

As described above, according to the present invention,
Disconnection of the electrode can be inspected more easily.

[Brief description of the drawings]

FIG. 1 is a schematic view of an inspection apparatus A according to an embodiment of the present invention, and an electrode 10 of a panel B inspected by the inspection apparatus A.
It is the figure which showed 0 and 101.

FIG. 2 is a diagram showing an internal circuit of a multiplexer 5;

 ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2G014 AA02 AB21 AC08 2H092 GA05 GA33 GA41 JB77 MA56 NA25 NA27 NA30 PA06 QA07 QA10 5C006 AF53 BB12 EB01 5C080 AA05 AA10 BB05 DD15 DD28 JJ02

Claims (22)

[Claims] An inspection method for inspecting disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, wherein one of the electrodes is selected and one end of the selected electrode changes with time. Supplying a voltage to be measured, and measuring a voltage appearing by supplying the voltage for any one of the plurality of electrodes orthogonal to the selected electrode; and the measured voltage is predetermined. A determination is made as to whether or not the selected electrode has a disconnection in a portion between the one end and the electrode at which the voltage has been measured in the measuring step, based on whether or not there is a disconnection. Process and
A method for inspecting a simple matrix type liquid crystal panel, comprising: 2. The method according to claim 1, wherein, in the measuring step, the voltage is measured for an electrode at a position most distant from one end of the selected electrode among a plurality of electrodes orthogonal to the selected electrode. Item 2. The inspection method of a simple matrix type liquid crystal panel according to item 1. 3. In the determining step, when it is determined that a disconnection has occurred in the electrode, among the plurality of electrodes orthogonal to the selected electrode, the electrode whose voltage has been measured in the measuring step includes: For each electrode located on the one end side, in order, a step of measuring a voltage appearing by the supply of the voltage, and specifying the electrode whose measured voltage is in a predetermined range, thereby selecting the selected electrode. 3. The method for inspecting a simple matrix type liquid crystal panel according to claim 1, further comprising a step of specifying a disconnection point. 4. An inspection method for inspecting disconnection of a plurality of electrodes included in a simple matrix type liquid crystal panel, wherein one of the electrodes is selected and a part of the selected electrodes is temporally applied. A step of supplying a changing voltage; a measuring step of measuring a voltage appearing by the supply of the voltage with respect to any one of the plurality of electrodes orthogonal to the selected electrode; Based on whether or not it is within a predetermined range, it is determined whether or not a disconnection has occurred in the portion between the selected electrode and the electrode from which the voltage was measured in the measurement step. A determining step to be performed;
A method for inspecting a simple matrix type liquid crystal panel, comprising: 5. An inspection method for inspecting disconnection of a plurality of electrodes included in a simple matrix type liquid crystal panel, wherein one of the electrodes is selected, and a voltage which changes with time to the selected electrode. And supplying a plurality of the electrodes orthogonal to the selected electrode,
A measuring step of measuring each of the voltages appearing by the supply of the voltage, by comparing each of the measured voltages with each other,
A determining step of determining whether or not the selected electrode is disconnected. A method for inspecting a simple matrix type liquid crystal panel. 6. The method according to claim 5, wherein, in the measuring step, the voltage is measured for the electrodes included in an area where disconnection is expected among electrodes orthogonal to the selected electrode. Inspection method for simple matrix type liquid crystal panels. 7. The simple matrix type liquid crystal panel inspection method according to claim 5, wherein in the measuring step, the voltage is measured for all the electrodes orthogonal to the selected electrode. 8. When the selected electrode is determined to be disconnected in the determining step, the selected electrode is identified by identifying the electrode whose voltage has changed among the measured voltages. 6. A step of specifying a disconnection point of the step (c).
8. The method for inspecting a simple matrix type liquid crystal panel according to any one of items 1 to 7. 9. An inspection method for inspecting disconnection of a plurality of electrodes of a plasma display panel, the method comprising selecting one of the electrodes and applying a time-varying voltage to one end of the selected electrode. Supplying a voltage; and measuring a voltage appearing by supplying the voltage for any one of the plurality of electrodes orthogonal to the selected electrode; and measuring the measured voltage in a predetermined range. A determination step of determining whether or not a disconnection has occurred in a portion between the one end and the electrode at which the voltage has been measured in the measurement step, based on whether or not there is ,
A method for inspecting a plasma display panel, comprising: 10. An inspection method for inspecting disconnection of a plurality of electrodes of a plasma display panel, the method comprising selecting one of the electrodes and changing to a part of the selected electrode over time. A step of supplying a voltage; a measuring step of measuring a voltage appearing by the supply of the voltage for any one of the plurality of electrodes orthogonal to the selected electrode; and the measured voltage is predetermined. A determination is made as to whether or not the selected electrode has a disconnection in a part from the part to the electrode whose voltage has been measured in the measurement step, based on whether or not the electrode is within the range. Process and
A method for inspecting a plasma display panel, comprising: 11. An inspection method for inspecting disconnection of a plurality of electrodes of a plasma display panel, comprising selecting one of the electrodes and supplying a time-varying voltage to the selected electrode. And a plurality of the electrodes orthogonal to the selected electrode,
A measuring step of measuring each of the voltages appearing by the supply of the voltage, by comparing each of the measured voltages with each other,
A determining step of determining whether or not the selected electrode is disconnected. 12. An inspection device for inspecting disconnection of a plurality of electrodes included in a simple matrix type liquid crystal panel, wherein a time-varying voltage is applied to one end of one of the electrodes selected from the electrodes. Means for supplying, for any one of the plurality of electrodes orthogonal to the selected electrode, measuring means for measuring a voltage appearing by the supply of the voltage, the measured voltage is predetermined A determination is made as to whether or not the selected electrode has a disconnection in a portion from the one end to the electrode whose voltage has been measured by the measuring means, based on whether or not the voltage is within the range. Means,
An inspection apparatus for a simple matrix type liquid crystal panel, comprising: 13. The method according to claim 13, wherein the measuring unit measures the voltage for an electrode at a position most distant from one end of the selected electrode among the plurality of electrodes orthogonal to the selected electrode. The inspection apparatus for a simple matrix type liquid crystal panel according to claim 12. 14. When the determination unit determines that the electrode is disconnected, the measurement unit measures a voltage first among a plurality of electrodes orthogonal to the selected electrode. From the electrode, for each electrode located on the one end side, in order, measure the voltage appearing by the supply of the voltage, and specify the electrode whose measured voltage is in a predetermined range, thereby selecting the electrode. And means for identifying a broken portion of the electrode.
3. The inspection device for a simple matrix type liquid crystal panel according to 3. 15. An inspection device for inspecting disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, wherein the inspection device changes over time to a part of one of the electrodes selected from the electrodes. Means for supplying a voltage; measuring means for measuring a voltage appearing by supplying the voltage for any one of the plurality of electrodes orthogonal to the selected electrode; and the measured voltage is predetermined. It is determined whether or not the selected electrode has a disconnection in a part from the part to the electrode at which the measuring unit measures the voltage based on whether or not it is within the range. A simple matrix type liquid crystal panel inspection apparatus. 16. An inspection device for inspecting disconnection of a plurality of electrodes of a simple matrix type liquid crystal panel, wherein a time-varying voltage is supplied to one of the electrodes selected from the plurality of electrodes. Means, and, for a plurality of the electrodes orthogonal to the selected electrode, measuring means for respectively measuring the voltage appearing by the supply of the voltage, by comparing each of the measured voltages with each other,
Determining means for determining whether or not the selected electrode is disconnected. An inspection apparatus for a simple matrix type liquid crystal panel, comprising: 17. The apparatus according to claim 16, wherein the measuring unit measures the voltage of the electrodes included in a region where a disconnection is expected among electrodes orthogonal to the selected electrode. Simple matrix type liquid crystal panel inspection equipment. 18. The inspection apparatus for a simple matrix type liquid crystal panel according to claim 16, wherein the measuring means measures the voltage for all the electrodes orthogonal to the selected electrode. 19. When the determining means determines that the selected electrode is disconnected, the selected electrode is identified by identifying the electrode whose voltage has changed among the measured voltages. 17. A means for specifying a disconnection point of the vehicle.
19. The inspection device for a simple matrix type liquid crystal panel according to any one of items 18 to 18. 20. An inspection device for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected, and a time-varying voltage is applied to one end of the selected electrode. Means for supplying a voltage, for any one of the plurality of electrodes orthogonal to the selected electrode, a measuring means for measuring a voltage appearing by supplying the voltage, and the measured voltage is in a predetermined range. Based on whether or not there is, in the portion from the one end to the electrode from which the voltage is measured by the measuring means, the selected electrode determines whether or not a disconnection has occurred. ,
An inspection apparatus for a plasma display panel, comprising: 21. An inspection apparatus for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected and changes to a part of the selected electrodes over time. Means for supplying a voltage, measuring means for measuring a voltage appearing by supplying the voltage, for any one of the plurality of electrodes orthogonal to the selected electrode, wherein the measured voltage is predetermined. A determination is made as to whether or not the selected electrode has a disconnection in a part between the part and the electrode whose voltage has been measured by the measuring means, based on whether or not the electrode is within the range. Means,
An inspection apparatus for a plasma display panel, comprising: 22. An inspection device for inspecting disconnection of a plurality of electrodes of a plasma display panel, wherein one of the electrodes is selected and a time-varying voltage is supplied to the selected electrode. Means, and for a plurality of the electrodes orthogonal to the selected electrode,
Measuring means for measuring each voltage appearing by the supply of the voltage, and by comparing each of the measured voltages with each other,
A determination unit for determining whether or not the selected electrode is disconnected. An inspection apparatus for a plasma display panel, comprising: