NL194873B - Dunnefilmtransistorenreeks en daarvan gebruikmakende vloeibare kristalweergeefinrichting. - Google Patents
Dunnefilmtransistorenreeks en daarvan gebruikmakende vloeibare kristalweergeefinrichting.Info
- Publication number
- NL194873B NL194873B NL9301406A NL9301406A NL194873B NL 194873 B NL194873 B NL 194873B NL 9301406 A NL9301406 A NL 9301406A NL 9301406 A NL9301406 A NL 9301406A NL 194873 B NL194873 B NL 194873B
- Authority
- NL
- Netherlands
- Prior art keywords
- liquid crystal
- display device
- thin film
- crystal display
- film transistors
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136204—Arrangements to prevent high voltage or static electricity failures
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (10)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21597292A JP3213067B2 (ja) | 1992-08-13 | 1992-08-13 | 薄膜トランジスタアレイ及びその製造方法 |
JP21597192 | 1992-08-13 | ||
JP21597192A JP3231410B2 (ja) | 1992-08-13 | 1992-08-13 | 薄膜トランジスタアレイ及びその製造方法 |
JP21597292 | 1992-08-13 | ||
JP34760692 | 1992-12-28 | ||
JP34760392A JP3153369B2 (ja) | 1992-12-28 | 1992-12-28 | 液晶表示装置及びその駆動方法 |
JP34760692A JPH06202152A (ja) | 1992-12-28 | 1992-12-28 | 薄膜トランジスタアレイ |
JP34760592A JPH06202151A (ja) | 1992-12-28 | 1992-12-28 | 薄膜トランジスタアレイ |
JP34760592 | 1992-12-28 | ||
JP34760392 | 1992-12-28 |
Publications (3)
Publication Number | Publication Date |
---|---|
NL9301406A NL9301406A (nl) | 1994-03-01 |
NL194873B true NL194873B (nl) | 2003-01-06 |
NL194873C NL194873C (nl) | 2003-05-06 |
Family
ID=27529612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL9301406A NL194873C (nl) | 1992-08-13 | 1993-08-13 | Dunnefilmtransistorenreeks en daarvan gebruikmakende vloeibare kristalweergeefinrichting. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5504348A (nl) |
KR (1) | KR100228520B1 (nl) |
CN (1) | CN1065051C (nl) |
NL (1) | NL194873C (nl) |
Families Citing this family (61)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05341315A (ja) * | 1992-06-08 | 1993-12-24 | Hitachi Ltd | 薄膜トランジスタ基板、液晶表示パネルおよび液晶表示装置 |
US5852480A (en) * | 1994-03-30 | 1998-12-22 | Nec Corporation | LCD panel having a plurality of shunt buses |
JP2753549B2 (ja) * | 1994-06-21 | 1998-05-20 | カシオ計算機株式会社 | 液晶表示デバイス |
JPH0822024A (ja) * | 1994-07-05 | 1996-01-23 | Mitsubishi Electric Corp | アクティブマトリクス基板およびその製法 |
GB9416899D0 (en) * | 1994-08-20 | 1994-10-12 | Philips Electronics Uk Ltd | Manufacture of electronic devices comprising thin-film circuitry |
JPH0876141A (ja) * | 1994-09-07 | 1996-03-22 | Hitachi Ltd | 液晶表示基板 |
JP2715936B2 (ja) * | 1994-09-30 | 1998-02-18 | 日本電気株式会社 | 薄膜トランジスタ型液晶表示装置とその製造方法 |
US6011607A (en) * | 1995-02-15 | 2000-01-04 | Semiconductor Energy Laboratory Co., | Active matrix display with sealing material |
KR0166894B1 (ko) * | 1995-02-20 | 1999-03-30 | 구자홍 | 액정표시장치 |
JP3315834B2 (ja) * | 1995-05-31 | 2002-08-19 | 富士通株式会社 | 薄膜トランジスタマトリクス装置及びその製造方法 |
WO1997005654A1 (en) * | 1995-07-31 | 1997-02-13 | Litton Systems Canada Limited | Semiconductor switch array with electrostatic discharge protection and method of fabricating |
DE69532724T2 (de) * | 1995-08-07 | 2005-03-17 | Hitachi, Ltd. | Gegen statische elektrizität unempfindliche flüssigkristall-anzeigevorrichtung mit aktiver matrix |
JP3007025B2 (ja) * | 1995-08-25 | 2000-02-07 | シャープ株式会社 | アクティブマトリクス型液晶表示装置及びその製造方法 |
US5767929A (en) * | 1995-09-21 | 1998-06-16 | Advanced Display Inc. | Liquid crystal display apparatus with shorting ring |
JP3477301B2 (ja) * | 1995-12-19 | 2003-12-10 | 株式会社半導体エネルギー研究所 | アクティブマトリクス型液晶表示装置及びその製造方法 |
US5608245A (en) * | 1995-12-21 | 1997-03-04 | Xerox Corporation | Array on substrate with repair line crossing lines in the array |
US5731803A (en) * | 1995-12-21 | 1998-03-24 | Xerox Corporation | Array with light active units sized to eliminate artifact from size difference |
JP4179483B2 (ja) * | 1996-02-13 | 2008-11-12 | 株式会社半導体エネルギー研究所 | 表示装置の作製方法 |
JP3326327B2 (ja) * | 1996-05-13 | 2002-09-24 | 株式会社日立製作所 | 液晶表示パネル |
KR980003731A (ko) * | 1996-06-11 | 1998-03-30 | 김광호 | 표시 패널용 정전 파괴 보호 장치 및 그 제조 방법 |
KR100232177B1 (ko) * | 1996-07-22 | 1999-12-01 | 구본준 | 액정 표시 장치의 쇼팅바 및 그의 제조방법 |
KR100242437B1 (ko) * | 1996-08-07 | 2000-02-01 | 윤종용 | 액정 모듈 및 그 제조 방법 |
KR100244182B1 (ko) * | 1996-11-29 | 2000-02-01 | 구본준 | 액정표시장치 |
KR100252308B1 (ko) * | 1997-01-10 | 2000-04-15 | 구본준, 론 위라하디락사 | 박막트랜지스터 어레이 |
KR100244449B1 (ko) * | 1997-02-11 | 2000-02-01 | 구본준 | 박막 트랜지스터 검사용 단락 배선을 갖는 액정 표시 장치와 그 제조 방법(liquid crystal display having shorting bar for testing tft and method for manufacturing the same) |
JPH10268794A (ja) | 1997-03-26 | 1998-10-09 | Sharp Corp | 表示パネル |
JPH10288950A (ja) * | 1997-04-14 | 1998-10-27 | Casio Comput Co Ltd | 液晶表示装置 |
KR100502097B1 (ko) * | 1998-03-12 | 2005-11-11 | 삼성전자주식회사 | 액정 표시 장치용 정전기 보호 회로 |
KR100502089B1 (ko) * | 1998-03-20 | 2005-11-21 | 삼성전자주식회사 | 액정 표시 장치의 정전기 보호 회로 및 그 제조방법 |
JP3527168B2 (ja) * | 1999-06-02 | 2004-05-17 | シャープ株式会社 | 液晶表示装置 |
TW507258B (en) * | 2000-02-29 | 2002-10-21 | Semiconductor Systems Corp | Display device and method for fabricating the same |
JP2002050754A (ja) * | 2000-05-08 | 2002-02-15 | Canon Inc | 半導体装置とその製造方法、放射線検出装置とそれを用いた放射線検出システム |
KR100658526B1 (ko) * | 2000-08-08 | 2006-12-15 | 엘지.필립스 엘시디 주식회사 | 액정 표시장치의 정전 손상 보호장치 |
JP2002208644A (ja) * | 2001-01-11 | 2002-07-26 | Mitsubishi Electric Corp | 半導体装置 |
US6833590B2 (en) * | 2001-01-11 | 2004-12-21 | Renesas Technology Corp. | Semiconductor device |
KR100776768B1 (ko) | 2001-07-21 | 2007-11-16 | 삼성전자주식회사 | 액정표시패널용 기판 및 그 제조방법 |
KR100800330B1 (ko) * | 2001-12-20 | 2008-02-01 | 엘지.필립스 엘시디 주식회사 | 라인 온 글래스형 신호라인 검사를 위한 액정표시패널 |
US7038377B2 (en) * | 2002-01-16 | 2006-05-02 | Seiko Epson Corporation | Display device with a narrow frame |
KR100847817B1 (ko) * | 2002-04-08 | 2008-07-23 | 엘지디스플레이 주식회사 | 라인 온 글래스형 액정표시장치 |
KR100717184B1 (ko) * | 2003-08-01 | 2007-05-11 | 비오이 하이디스 테크놀로지 주식회사 | 액정 디스플레이 패널 |
KR100635061B1 (ko) * | 2004-03-09 | 2006-10-17 | 삼성에스디아이 주식회사 | 평판 표시 장치 및 그의 제조 방법 |
US8355015B2 (en) | 2004-05-21 | 2013-01-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device and electronic device including a diode electrically connected to a signal line |
US8013816B2 (en) * | 2004-06-30 | 2011-09-06 | Samsung Mobile Display Co., Ltd. | Light emitting display |
JP2006065284A (ja) * | 2004-07-26 | 2006-03-09 | Seiko Epson Corp | 発光装置及び電子機器 |
CN101251986B (zh) * | 2004-07-26 | 2012-01-04 | 精工爱普生株式会社 | 发光装置 |
JP2006163222A (ja) * | 2004-12-10 | 2006-06-22 | Seiko Epson Corp | 電気光学装置および電子機器 |
US8044882B1 (en) * | 2005-06-25 | 2011-10-25 | Nongqiang Fan | Method of driving active matrix displays |
KR100911972B1 (ko) * | 2007-10-24 | 2009-08-13 | 삼성모바일디스플레이주식회사 | 유기전계발광 표시장치 |
TWI361484B (en) * | 2007-10-30 | 2012-04-01 | Hannstar Display Corp | Display device |
JP5442228B2 (ja) * | 2008-08-07 | 2014-03-12 | 株式会社ジャパンディスプレイ | 表示装置及び表示装置の製造方法 |
JP5351268B2 (ja) * | 2010-01-06 | 2013-11-27 | パナソニック株式会社 | アクティブマトリクス基板、表示パネル及びそれらの検査方法 |
JP5707914B2 (ja) * | 2010-12-13 | 2015-04-30 | ソニー株式会社 | 酸化物半導体を用いる装置、表示装置、及び、電子機器 |
TWI486928B (zh) * | 2012-11-16 | 2015-06-01 | Au Optronics Corp | 顯示面板及其檢測方法 |
CN103513454B (zh) * | 2013-08-29 | 2015-06-10 | 京东方科技集团股份有限公司 | 阵列基板及其检测方法和制备方法 |
CN103676255B (zh) * | 2013-12-26 | 2016-02-24 | 深圳市华星光电技术有限公司 | 阵列基板的防静电结构 |
CN103838049B (zh) * | 2014-03-10 | 2017-02-22 | 深圳市华星光电技术有限公司 | 阵列基板及液晶显示面板 |
CN104280908A (zh) * | 2014-10-21 | 2015-01-14 | 深圳市华星光电技术有限公司 | 一种检测电路和液晶显示面板及其制造方法 |
JP2018057342A (ja) * | 2016-10-06 | 2018-04-12 | 株式会社東芝 | 細胞分取装置および細胞分取システム |
CN106647024A (zh) * | 2016-12-09 | 2017-05-10 | 重庆英洛凡科技有限公司 | 一种可防静电的led显示屏 |
CN108333221A (zh) * | 2018-01-29 | 2018-07-27 | 东莞隆润光学技术有限公司 | 基于电介质薄膜电场强度特性的抗激光损伤能力对比方法 |
CN108510856B (zh) * | 2018-06-17 | 2023-11-24 | 承德石油高等专科学校 | 一种物理实验用滚筒式电位差计教具及其使用方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59166984A (ja) * | 1983-03-14 | 1984-09-20 | 三菱電機株式会社 | マトリクス型液晶表示装置の製造方法 |
US4667189A (en) * | 1984-04-25 | 1987-05-19 | Energy Conversion Devices, Inc. | Programmable semiconductor switch for a display matrix or the like and method for making same |
FR2579806B1 (fr) * | 1985-03-26 | 1987-05-07 | Morin Francois | Procede de fabrication d'un ecran d'affichage a cristaux liquides et a reseau de diodes |
JPS62156622A (ja) * | 1985-12-28 | 1987-07-11 | Konishiroku Photo Ind Co Ltd | 液晶表示装置 |
JPS62219662A (ja) * | 1986-03-20 | 1987-09-26 | Fujitsu Ltd | アモルフアスシリコン薄膜トランジスタマトリクスアレイ |
US4803536A (en) * | 1986-10-24 | 1989-02-07 | Xerox Corporation | Electrostatic discharge protection network for large area transducer arrays |
IL90944A0 (en) * | 1988-07-13 | 1990-02-09 | Raychem Ltd | Electrical circuit protection arrangement |
JPH02137366A (ja) * | 1988-11-18 | 1990-05-25 | Nec Corp | ダイオード型アクティブマトリクス基板 |
US5200876A (en) * | 1989-04-10 | 1993-04-06 | Matsushita Electric Industrial Co., Ltd. | Electrostatic breakdown protection circuit |
US5019002A (en) * | 1989-07-12 | 1991-05-28 | Honeywell, Inc. | Method of manufacturing flat panel backplanes including electrostatic discharge prevention and displays made thereby |
US5053347A (en) * | 1989-08-03 | 1991-10-01 | Industrial Technology Research Institute | Amorphous silicon thin film transistor with a depletion gate |
JP2764139B2 (ja) * | 1989-10-20 | 1998-06-11 | ホシデン・フィリップス・ディスプレイ株式会社 | アクティブマトリックス液晶表示素子 |
JPH03278466A (ja) * | 1990-03-27 | 1991-12-10 | Toshiba Corp | 薄膜トランジスタおよびその製造方法 |
JP2687667B2 (ja) * | 1990-04-17 | 1997-12-08 | 日本電気株式会社 | マトリクス電極基板およびその製造方法 |
US5081687A (en) * | 1990-11-30 | 1992-01-14 | Photon Dynamics, Inc. | Method and apparatus for testing LCD panel array prior to shorting bar removal |
US5220443A (en) * | 1991-04-29 | 1993-06-15 | Nec Corporation | Matrix wiring substrate and active matrix display having non-linear resistance elements for electrostatic discharge protection |
US5233448A (en) * | 1992-05-04 | 1993-08-03 | Industrial Technology Research Institute | Method of manufacturing a liquid crystal display panel including photoconductive electrostatic protection |
-
1993
- 1993-08-13 NL NL9301406A patent/NL194873C/nl not_active IP Right Cessation
- 1993-08-13 KR KR1019930015725A patent/KR100228520B1/ko not_active IP Right Cessation
- 1993-08-13 CN CN931092817A patent/CN1065051C/zh not_active Expired - Lifetime
-
1995
- 1995-03-20 US US08/406,644 patent/US5504348A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR940004375A (ko) | 1994-03-15 |
NL194873C (nl) | 2003-05-06 |
CN1065051C (zh) | 2001-04-25 |
KR100228520B1 (ko) | 1999-11-01 |
US5504348A (en) | 1996-04-02 |
CN1083598A (zh) | 1994-03-09 |
NL9301406A (nl) | 1994-03-01 |
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Legal Events
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A1A | A request for search or an international-type search has been filed | ||
BB | A search report has been drawn up | ||
BC | A request for examination has been filed | ||
NP1 | Patent granted (not automatically) | ||
V4 | Discontinued because of reaching the maximum lifetime of a patent |
Effective date: 20130813 |