KR100475986B1 - 고전압 및 저전압 버스용 출력 버퍼 - Google Patents

고전압 및 저전압 버스용 출력 버퍼 Download PDF

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Publication number
KR100475986B1
KR100475986B1 KR10-2002-7003229A KR20027003229A KR100475986B1 KR 100475986 B1 KR100475986 B1 KR 100475986B1 KR 20027003229 A KR20027003229 A KR 20027003229A KR 100475986 B1 KR100475986 B1 KR 100475986B1
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South Korea
Prior art keywords
output buffer
transistor
pull
circuit configuration
transistors
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Expired - Fee Related
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KR10-2002-7003229A
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English (en)
Korean (ko)
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KR20020036852A (ko
Inventor
클라크로렌스티.
모즈드젠토마스제이.
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인텔 코오퍼레이션
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Publication of KR100475986B1 publication Critical patent/KR100475986B1/ko
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175Coupling arrangements; Interface arrangements
    • H03K19/0185Coupling arrangements; Interface arrangements using field effect transistors only
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175Coupling arrangements; Interface arrangements
    • H03K19/0185Coupling arrangements; Interface arrangements using field effect transistors only
    • H03K19/018585Coupling arrangements; Interface arrangements using field effect transistors only programmable

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
KR10-2002-7003229A 1999-09-10 2000-08-18 고전압 및 저전압 버스용 출력 버퍼 Expired - Fee Related KR100475986B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/393,134 1999-09-10
US09/393,134 US6512401B2 (en) 1999-09-10 1999-09-10 Output buffer for high and low voltage bus

Publications (2)

Publication Number Publication Date
KR20020036852A KR20020036852A (ko) 2002-05-16
KR100475986B1 true KR100475986B1 (ko) 2005-03-10

Family

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Application Number Title Priority Date Filing Date
KR10-2002-7003229A Expired - Fee Related KR100475986B1 (ko) 1999-09-10 2000-08-18 고전압 및 저전압 버스용 출력 버퍼

Country Status (7)

Country Link
US (2) US6512401B2 (enExample)
JP (1) JP4666860B2 (enExample)
KR (1) KR100475986B1 (enExample)
CN (1) CN1241328C (enExample)
AU (1) AU6919000A (enExample)
TW (1) TW478250B (enExample)
WO (1) WO2001018967A1 (enExample)

Families Citing this family (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4740518B2 (ja) * 2000-07-17 2011-08-03 ボード・オブ・リージエンツ,ザ・ユニバーシテイ・オブ・テキサス・システム 転写リソグラフィ・プロセスのための自動液体ディスペンス方法およびシステム
US20060005657A1 (en) * 2004-06-01 2006-01-12 Molecular Imprints, Inc. Method and system to control movement of a body for nano-scale manufacturing
US6952112B2 (en) * 2000-11-30 2005-10-04 Renesas Technology Corporation Output buffer circuit with control circuit for modifying supply voltage and transistor size
US6515516B2 (en) 2001-01-22 2003-02-04 Micron Technology, Inc. System and method for improving signal propagation
KR100465599B1 (ko) * 2001-12-07 2005-01-13 주식회사 하이닉스반도체 데이타 출력 버퍼
US7019819B2 (en) * 2002-11-13 2006-03-28 Molecular Imprints, Inc. Chucking system for modulating shapes of substrates
KR100466540B1 (ko) * 2002-08-28 2005-01-15 한국전자통신연구원 입출력 포트 회로
US7641840B2 (en) * 2002-11-13 2010-01-05 Molecular Imprints, Inc. Method for expelling gas positioned between a substrate and a mold
US6980035B1 (en) * 2003-03-18 2005-12-27 Xilinx, Inc. Auto-detect level shifter for multiple output voltage standards
US6954100B2 (en) * 2003-09-12 2005-10-11 Freescale Semiconductor, Inc. Level shifter
DE10352812B4 (de) * 2003-11-12 2008-08-14 Infineon Technologies Ag Verfahren und Schaltungsanordnung zur Erzeugung ternärer Signale
US7002371B2 (en) 2003-12-29 2006-02-21 Freescale Semiconductor, Inc. Level shifter
US20050174158A1 (en) * 2004-02-06 2005-08-11 Khan Qadeer A. Bidirectional level shifter
EP1714286B1 (en) * 2004-02-11 2008-12-10 Nxp B.V. High voltage driver circuit with fast reading operation
US7411415B2 (en) * 2004-02-25 2008-08-12 Ashfaq Shaikh Bus termination scheme having concurrently powered-on transistors
KR100533383B1 (ko) * 2004-03-12 2005-12-06 주식회사 하이닉스반도체 출력 드라이버 회로
US20050285658A1 (en) * 2004-06-29 2005-12-29 Schulmeyer Kyle C Level shifter with reduced duty cycle variation
US7798801B2 (en) * 2005-01-31 2010-09-21 Molecular Imprints, Inc. Chucking system for nano-manufacturing
EP1843884A4 (en) * 2005-01-31 2008-12-17 Molecular Imprints Inc CHUCK SYSTEM FOR NANO-MANUFACTURING
US7215150B2 (en) * 2005-01-31 2007-05-08 Freescale Semiconductor, Inc. Method and circuit for maintaining I/O pad characteristics across different I/O supply voltages
US7635263B2 (en) * 2005-01-31 2009-12-22 Molecular Imprints, Inc. Chucking system comprising an array of fluid chambers
US7636999B2 (en) 2005-01-31 2009-12-29 Molecular Imprints, Inc. Method of retaining a substrate to a wafer chuck
JP2006226263A (ja) * 2005-02-21 2006-08-31 Denso Corp 電磁駆動装置およびそれを用いた燃料噴射弁
KR100670685B1 (ko) * 2005-03-31 2007-01-17 주식회사 하이닉스반도체 반도체 소자의 출력 드라이버
US7212463B2 (en) * 2005-09-23 2007-05-01 Sigma Tel, Inc. Method and system of operating mode detection
KR100753123B1 (ko) * 2005-09-29 2007-08-29 주식회사 하이닉스반도체 출력 드라이빙 장치
US7670530B2 (en) 2006-01-20 2010-03-02 Molecular Imprints, Inc. Patterning substrates employing multiple chucks
CN104317161A (zh) * 2005-12-08 2015-01-28 分子制模股份有限公司 用于衬底双面图案形成的方法和系统
US8045353B2 (en) * 2005-12-30 2011-10-25 Stmicroelectronics Pvt. Ltd. Integrated circuit capable of operating at different supply voltages
US8215946B2 (en) 2006-05-18 2012-07-10 Molecular Imprints, Inc. Imprint lithography system and method
JP5110247B2 (ja) * 2006-07-31 2012-12-26 ミツミ電機株式会社 半導体集積回路装置
US7432739B2 (en) * 2006-10-27 2008-10-07 Macronix International Co., Ltd. Low voltage complementary metal oxide semiconductor process tri-state buffer
TWI316715B (en) * 2006-11-23 2009-11-01 Realtek Semiconductor Corp Memory controller and output signal driving circuit thereof
TWI325137B (en) * 2006-12-15 2010-05-21 Realtek Semiconductor Corp Output signal driving circuit and method thereof
US7605633B2 (en) * 2007-03-20 2009-10-20 Kabushiki Kaisha Toshiba Level shift circuit which improved the blake down voltage
US7804327B2 (en) * 2007-10-12 2010-09-28 Mediatek Inc. Level shifters
US7605611B2 (en) * 2007-10-24 2009-10-20 Micron Technology, Inc. Methods, devices, and systems for a high voltage tolerant buffer
US7675324B2 (en) * 2007-12-13 2010-03-09 Micron Technology, Inc. Pre-driver logic
US8347251B2 (en) * 2007-12-31 2013-01-01 Sandisk Corporation Integrated circuit and manufacturing process facilitating selective configuration for electromagnetic compatibility
EP2249227B1 (en) 2008-02-29 2015-05-27 Panasonic Corporation Interface device for host device, interface device for slave device, host device, slave device, communication system and interace voltage switching method
US7683668B1 (en) 2008-11-05 2010-03-23 Freescale Semiconductor, Inc. Level shifter
CN102396156A (zh) * 2009-02-12 2012-03-28 莫塞德技术公司 用于片内终结的终结电路
US8009481B2 (en) 2009-02-23 2011-08-30 Infineon Technologies Ag System and method for bit-line control
US20100315124A1 (en) * 2009-06-15 2010-12-16 Berkeley Law & Technology Group, Llp Low power receiver circuit
EP2278712A1 (fr) * 2009-07-01 2011-01-26 STMicroelectronics (Rousset) SAS Circuit intégré comprenant un circuit tampon haute tension large bande
KR101332039B1 (ko) * 2011-06-14 2013-11-22 한국과학기술원 전원발생회로 및 전원발생회로가 구비된 스위칭회로
US8643419B2 (en) 2011-11-04 2014-02-04 Silicon Laboratories Inc. Flexible low power slew-rate controlled output buffer
US8558603B2 (en) * 2011-12-15 2013-10-15 Apple Inc. Multiplexer with level shifter
WO2014006454A1 (en) 2012-07-06 2014-01-09 Freescale Semiconductor, Inc. Input/output driver circuit, integrated circuit and method therefor
US9042172B2 (en) * 2013-05-02 2015-05-26 Windbond Electronics Corporation Flash memory having dual supply operation
US9117547B2 (en) 2013-05-06 2015-08-25 International Business Machines Corporation Reduced stress high voltage word line driver
GB201314938D0 (en) * 2013-08-21 2013-10-02 Advanced Risc Mach Ltd Communication between voltage domains
TWI610314B (zh) * 2014-03-10 2018-01-01 Toshiba Memory Corp 半導體積體電路裝置
US9383794B2 (en) 2014-06-11 2016-07-05 Freescale Semiconductor, Inc. Integrated circuit with multi-voltage input/output (I/O) cells
CN107196643A (zh) * 2017-05-07 2017-09-22 长沙方星腾电子科技有限公司 一种模拟缓冲电路
US10403337B2 (en) * 2017-08-07 2019-09-03 Micron Technology, Inc. Output driver for multi-level signaling
CN107819462A (zh) * 2017-09-08 2018-03-20 灿芯创智微电子技术(北京)有限公司 一种新型高压与低压兼容的电路接口
US11114171B2 (en) 2017-11-08 2021-09-07 Samsung Electronics Co., Ltd. Non-volatile memory device
KR102491576B1 (ko) 2017-11-08 2023-01-25 삼성전자주식회사 비휘발성 메모리 장치
US10923164B2 (en) * 2018-09-29 2021-02-16 Intel Corporation Dual power I/O transmitter
US10727833B1 (en) * 2019-01-18 2020-07-28 Qualcomm Incorporated High-voltage and low-voltage data paths of a hybrid output driver
US10707876B1 (en) * 2019-01-18 2020-07-07 Qualcomm Incorporated High-voltage and low-voltage signaling output driver
US10707872B1 (en) 2019-03-20 2020-07-07 Semiconductor Components Industries, Llc Digital buffer circuit
US11307644B2 (en) * 2019-07-25 2022-04-19 Apple Inc. Cross-domain power control circuit
WO2021189282A1 (zh) * 2020-03-25 2021-09-30 深圳市汇顶科技股份有限公司 驱动电路以及相关芯片
KR102702558B1 (ko) * 2022-01-24 2024-09-04 주식회사 피델릭스 출력 신호의 스윙폭 조절이 용이한 출력 버퍼 회로

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5196275A (enExample) * 1975-02-20 1976-08-24
US4408135A (en) * 1979-12-26 1983-10-04 Tokyo Shibaura Denki Kabushiki Kaisha Multi-level signal generating circuit
JPS5942690A (ja) * 1982-09-03 1984-03-09 Toshiba Corp 半導体記憶装置
US4731553A (en) * 1986-09-30 1988-03-15 Texas Instruments Incorporated CMOS output buffer having improved noise characteristics
JPH0728214B2 (ja) 1987-02-06 1995-03-29 株式会社日立製作所 半導体集積回路装置
US4958321A (en) * 1988-09-22 1990-09-18 Advanced Micro Devices, Inc. One transistor flash EPROM cell
JPH0777345B2 (ja) * 1988-11-04 1995-08-16 三菱電機株式会社 半導体装置
JPH03159313A (ja) * 1989-11-17 1991-07-09 Hitachi Ltd 出力回路および半導体集積回路装置
JP2843393B2 (ja) * 1989-12-29 1999-01-06 沖電気工業株式会社 多値レベル出力回路
JPH0435224A (ja) * 1990-05-28 1992-02-06 Nec Corp 半導体装置
JPH04192716A (ja) * 1990-11-26 1992-07-10 Mitsubishi Electric Corp Mosトランジスタ出力回路
JP3190086B2 (ja) * 1992-01-10 2001-07-16 株式会社日立製作所 昇圧回路
US5341045A (en) * 1992-11-06 1994-08-23 Intel Corporation Programmable input buffer
KR960006911B1 (ko) * 1992-12-31 1996-05-25 현대전자산업주식회사 데이타 출력버퍼
JP3221143B2 (ja) * 1993-03-22 2001-10-22 セイコーエプソン株式会社 多値論理半導体装置
US5399918A (en) 1993-09-30 1995-03-21 Intel Corporation Large fan-in, dynamic, bicmos logic gate
JPH08223016A (ja) * 1995-02-14 1996-08-30 Sony Corp ドライバ回路
JP3369775B2 (ja) * 1995-03-10 2003-01-20 株式会社東芝 論理回路
JPH09200031A (ja) * 1996-01-19 1997-07-31 Canon Inc 相補型トランジスタ出力回路
US6060905A (en) 1996-02-07 2000-05-09 International Business Machines Corporation Variable voltage, variable impedance CMOS off-chip driver and receiver interface and circuits
US5811997A (en) * 1996-04-26 1998-09-22 Silicon Graphics, Inc. Multi-configurable push-pull/open-drain driver circuit
US5830795A (en) 1996-06-10 1998-11-03 Advanced Micro Devices, Inc. Simplified masking process for programmable logic device manufacture
US5739700A (en) * 1996-09-09 1998-04-14 International Business Machines Corporation Method and apparatus with dual circuitry for shifting the level of a signal
KR19980058197A (ko) * 1996-12-30 1998-09-25 문정환 제어신호를 이용한 출력패드 회로
US5748303A (en) 1996-12-31 1998-05-05 Intel Corporation Light sensing device
US5894238A (en) * 1997-01-28 1999-04-13 Chien; Pien Output buffer with static and transient pull-up and pull-down drivers
US5914618A (en) * 1997-03-11 1999-06-22 Vlsi Technology, Inc. Optimum noise isolated I/O with minimized footprint
US5877632A (en) * 1997-04-11 1999-03-02 Xilinx, Inc. FPGA with a plurality of I/O voltage levels
JPH10303733A (ja) * 1997-05-01 1998-11-13 Hitachi Ltd 半導体装置
US6040592A (en) 1997-06-12 2000-03-21 Intel Corporation Well to substrate photodiode for use in a CMOS sensor on a salicide process
US5917348A (en) * 1997-09-02 1999-06-29 Industrial Technology Research Institute--Computer & Communication Research Labs. CMOS bidirectional buffer for mixed voltage applications
US6057586A (en) 1997-09-26 2000-05-02 Intel Corporation Method and apparatus for employing a light shield to modulate pixel color responsivity
US6133563A (en) 1997-09-29 2000-10-17 Intel Corporation Sensor cell having a soft saturation circuit
US5859450A (en) 1997-09-30 1999-01-12 Intel Corporation Dark current reducing guard ring
US5963053A (en) * 1997-10-09 1999-10-05 Pericom Semiconductor Corp. Self-biasing CMOS PECL receiver with wide common-mode range and multi-level-transmit to binary decoder
US6118482A (en) 1997-12-08 2000-09-12 Intel Corporation Method and apparatus for electrical test of CMOS pixel sensor arrays
US5939936A (en) 1998-01-06 1999-08-17 Intel Corporation Switchable N-well biasing technique for improved dynamic range and speed performance of analog data bus
US6097237A (en) * 1998-01-29 2000-08-01 Sun Microsystems, Inc. Overshoot/undershoot protection scheme for low voltage output buffer
US6110818A (en) * 1998-07-15 2000-08-29 Philips Electronics North America Corp. Semiconductor device with gate electrodes for sub-micron applications and fabrication thereof
US6144330A (en) 1998-09-03 2000-11-07 Intel Corporation Low power ramp generator for use in single slope A/D
US6133749A (en) * 1999-01-04 2000-10-17 International Business Machines Corporation Variable impedance output driver circuit using analog biases to match driver output impedance to load input impedance
US6452423B1 (en) * 2000-07-24 2002-09-17 Sun Microsystems, Inc. Circuit for avoiding contention in one-hot or one-cold multiplexer designs

Also Published As

Publication number Publication date
US20010043094A1 (en) 2001-11-22
CN1241328C (zh) 2006-02-08
US6512401B2 (en) 2003-01-28
US6903581B2 (en) 2005-06-07
WO2001018967A1 (en) 2001-03-15
US20030112041A1 (en) 2003-06-19
TW478250B (en) 2002-03-01
JP2003515259A (ja) 2003-04-22
KR20020036852A (ko) 2002-05-16
AU6919000A (en) 2001-04-10
CN1390387A (zh) 2003-01-08
JP4666860B2 (ja) 2011-04-06

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