JP5731394B2 - 光サブサンプリングを通じて、光コヒーレンストモグラヒィーのイメージング深度範囲を伸ばすためのシステム、装置及び方法 - Google Patents
光サブサンプリングを通じて、光コヒーレンストモグラヒィーのイメージング深度範囲を伸ばすためのシステム、装置及び方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims description 26
- 238000012014 optical coherence tomography Methods 0.000 title description 27
- 238000003384 imaging method Methods 0.000 title description 25
- 230000003287 optical effect Effects 0.000 title description 24
- 230000005855 radiation Effects 0.000 claims description 39
- 238000005259 measurement Methods 0.000 claims description 29
- 230000002452 interceptive effect Effects 0.000 claims description 4
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/68—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient
- A61B5/6846—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be brought in contact with an internal body part, i.e. invasive
- A61B5/6847—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be brought in contact with an internal body part, i.e. invasive mounted on an invasive device
- A61B5/6852—Catheters
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0062—Arrangements for scanning
- A61B5/0066—Optical coherence imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
- G01B9/02008—Two or more frequencies or sources used for interferometric measurement by using a frequency comb
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
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Description
Claims (18)
- 少なくとも一つのサンプルに関するデータを有する、少なくとも一つのイメージを作成するためのシステムであって、
前記少なくとも一つのサンプルからの、少なくとも一つの第一の放射の散乱又は反射によって提供される少なくとも一つの第二の放射を生じるために、前記少なくとも一つの第一の放射を前記少なくとも一つのサンプルに転送するように構成された少なくとも一つの光源である第一の構成、及び
a.前記少なくとも一つのサンプルからの前記少なくとも一つの第二の放射を受光するように、及び
b.前記少なくとも一つのサンプルの少なくとも一つの部分の少なくとも一つの特性の、サブサンプリングされた特定の数(N)の測定を作成するように構成された、
少なくとも一つの検出器である第二の構成を含み、
ここで、前記Nの測定の各々は座標の関数として得られ、
ここで、前記Nの測定の各々の深度距離間隔は少なくとも特定の値(d)であり、及び
ここで、前記データは、前記少なくとも一つのサンプルの前記少なくとも一つの部分のNとdの積より大きい物理的な全深度範囲(R)にわたる前記少なくとも一つのサンプルに関連している、システム。 - 前記少なくとも一つの第二の構成が、前記少なくとも一つのサンプルからの前記少なくとも一つの第二の放射及び参照構成からの少なくとも一つの第三の放射を受光し、少なくとも一つの干渉シグナルを作成するために、前記第二及び第三の放射を干渉させる少なくとも一つの干渉法構成を含み、そして、
前記少なくとも一つの第二の構成が、前記少なくとも一つの干渉シグナルに基づいて前記Nの測定を作成するように構成されている、請求項1に記載のシステム。 - 前記システムが、
a.前記Nの測定に基づいて前記少なくとも一つのサンプルの前記少なくとも一つのイメージを作成するように、ここで、前記少なくとも一つのイメージは、前記少なくとも一つのサンプルのそれぞれの複数の連続するセグメントと関連した複数の部位からなる、及び
b.少なくとも二つのそれぞれのセグメントに関連した前記少なくとも一つのイメージの少なくとも一つの連続しかつ途切れのない部分を形成するために、前記少なくとも一つのイメージの少なくとも二つの隣接する部位を互いに連結するように構成されている、
少なくとも一つの第三の構成を更に含む請求項1に記載のシステム。 - 前記Nの測定における波長が、k空間にて等間隔である、請求項1に記載のシステム。
- 前記少なくとも一つの第一の構成が、時間とともに、前記少なくとも一つの第一の放射の波長を変化させるように構成されている請求項1に記載のシステム。
- 少なくとも一つのサンプルと関連するデータを含む、少なくとも一つのイメージを作成する方法であって、
前記少なくとも一つのサンプルからの、少なくとも一つのさらなる放射の散乱または反射によって提供され、前記少なくとも一つのサンプルの少なくとも一つの部分から受光した少なくとも一つの放射に基づいて、前記少なくとも一つのサンプルの少なくとも一つの部分の少なくとも一つの特性の、サブサンプリングされた特定の数(N)の測定を作成する工程を含み、
ここで、各々のNの測定は座標の関数として得られ、
ここで、Nの測定の各々の深度距離間隔は少なくとも特定の値(d)であり、
ここで、前記データは、前記少なくとも一つのサンプルの少なくとも一つの部分の、Nとdの積より大きい物理的な全深度範囲(R)にわたる少なくとも一つのサンプルに関連している、方法。 - 少なくとも一つのサンプルに関連したデータを含む、少なくとも一つのイメージを作成するためのシステムであって、
前記少なくとも一つのサンプルからの前記少なくとも一つの第一の放射の散乱または反射によって提供される少なくとも一つの第二の放射を生じるために、前記少なくとも一つの第一の放射を前記少なくとも一つのサンプルに転送するように構成された少なくとも一つの光源である第一の構成、及び
a.前記少なくとも一つのサンプルからの前記少なくとも一つの第二の放射を受光するように、及び
b.前記少なくとも一つの第一の放射の波長の関数として、前記少なくとも一つのサンプルの少なくとも一つの部分の少なくとも一つの特性の、サブサンプリングされた特定の数(N)の測定を作成する、ように構成された少なくとも一つの検出器である第二の構成を含み、
ここで、前記Nの測定の各々は座標の関数として得られ、
ここで、前記Nの測定の各々の深度距離間隔は少なくとも特定の値(d)であり、及び
ここで、前記データは、前記少なくとも一つのサンプルの少なくとも一つの部分の、Nとdの積より大きい物理的な全深度範囲(R)にわたる少なくとも一つのサンプルに関連している、システム。 - 前記少なくとも一つの第二の構成が、前記少なくとも一つのサンプルからの前記少なくとも一つの第二の放射及び参照構成からの少なくとも一つの第三の放射を受光し、少なくとも一つの干渉シグナルを作成するために、前記第二及び第三の放射を干渉させる少なくとも一つの干渉法構成を含み、そして、
前記少なくとも一つの第二の構成は、前記少なくとも一つの干渉シグナルに基づいて前記Nの測定を作成するように構成されている、請求項7に記載のシステム。 - 前記システムが、
a.前記Nの測定に基づいて前記少なくとも一つのサンプルの前記少なくとも一つのイメージを作成するように、ここで、前記少なくとも一つのイメージは、前記少なくとも一つのサンプルのそれぞれの複数の連続したセグメントに関連した複数の部位からなる、及び
b.少なくとも二つのそれぞれのセグメントに関連した前記少なくとも一つのイメージの少なくとも一つの連続しかつ途切れのない部分を形成するために、前記少なくとも一つのイメージの少なくとも二つの隣接する部位を互いに連結するように構成されている、
少なくとも一つの第三の構成を更に含む請求項7に記載のシステム。 - 前記Nの測定における波長が、k空間において等しく間隔を空けている、請求項7に記載のシステム。
- 前記少なくとも一つの第一の構成が、時間とともに前記少なくとも一つの第一の放射の波長を変化させるように構成されている請求項7に記載のシステム。
- 少なくとも一つのサンプルに関連するデータを含む、少なくとも一つのイメージを作成するためのシステムであって、
前記少なくとも一つのサンプルからの前記少なくとも一つの第一の放射の散乱又は反射によって提供される少なくとも一つの第二の放射を生じるために、前記少なくとも一つの第一の放射を前記少なくとも一つのサンプルに転送するように構成された少なくとも一つの光源である第一の構成、及び
a.前記少なくとも一つのサンプルからの前記少なくとも一つの第二の放射を受光するように、及び
b.前記少なくとも一つの第一の放射の波長の関数としての前記少なくとも一つの第二の放射に基づいて、前記少なくとも一つのサンプルの少なくとも一つの部分に関する、別個のサブサンプリングされた複数の測定を作成する、ように構成された、
少なくとも一つの検出器である第二の構成を含み、
ここで、前記Nの測定の各々は座標の関数として得られ、
ここで、前記Nの測定の各々の深度距離間隔は少なくとも特定の値(d)であり、及び
ここで、前記データは、前記少なくとも一つのサンプルの少なくとも一つの部分の、Nとdの積より大きい物理的な全深度範囲(R)にわたる少なくとも一つのサンプルに関連している、システム。 - 前記少なくとも一つの第二の構成が、前記少なくとも一つのサンプルからの前記少なくとも一つの第二の放射及び参照構成からの少なくとも一つの第三の放射を受光し、少なくとも一つの干渉シグナルを作成するために、前記第二及び第三の放射を干渉させる少なくとも一つの干渉法構成を含み、そして、
前記少なくとも一つの第二の構成は、前記少なくとも一つの干渉シグナルに基づいて前記Nの測定を作成するように構成されている、請求項12に記載のシステム。 - 前記システムが、
a.前記Nの測定に基づいて前記少なくとも一つのサンプルの前記少なくとも一つのイメージを作成するように、ここで、前記少なくとも一つのイメージは、前記少なくとも一つのサンプルの複数の連続するセグメントのそれぞれに関連した複数の部位からなる、及び
b.少なくとも二つのそれぞれのセグメントに関連した前記少なくとも一つのイメージの少なくとも一つの連続しかつ途切れのない部分を形成するために、前記少なくとも一つのイメージの少なくとも二つの隣接する部位を互いに連結するように構成されている、
少なくとも一つの第三の構成を更に含む請求項12に記載のシステム。 - 前記Nの測定における波長が、k空間にて等しく間隔を空けている、請求項12に記載のシステム。
- 前記少なくとも一つのイメージが、タイリングにより作成される、請求項12に記載のシステム。
- 前記少なくとも一つのイメージが、タイリングにより作成される、請求項1に記載のシステム。
- 前記少なくとも一つのイメージが、タイリングにより作成される、請求項7に記載のシステム。
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US12131208P | 2008-12-10 | 2008-12-10 | |
US61/121,312 | 2008-12-10 | ||
PCT/US2009/067512 WO2010068764A2 (en) | 2008-12-10 | 2009-12-10 | Systems, apparatus and methods for extending imaging depth range of optical coherence tomography through optical sub-sampling |
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US (1) | US8937724B2 (ja) |
EP (2) | EP2359121A4 (ja) |
JP (1) | JP5731394B2 (ja) |
ES (1) | ES2957932T3 (ja) |
WO (1) | WO2010068764A2 (ja) |
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US9192294B2 (en) | 2012-05-10 | 2015-11-24 | Carl Zeiss Meditec, Inc. | Systems and methods for faster optical coherence tomography acquisition and processing |
CA3014324A1 (en) * | 2016-02-12 | 2017-08-17 | The General Hospital Corporation | Apparatus and methods for high-speed and long depth range imaging using optical coherence tomography |
US10502544B2 (en) | 2016-06-15 | 2019-12-10 | Carl Zeiss Meditec, Inc. | Efficient sampling of optical coherence tomography data for explicit ranging over extended depth |
US11073611B2 (en) * | 2017-03-20 | 2021-07-27 | International Business Machines Corporation | High spatial resolution 3D radar based on a single sensor |
US20220012926A1 (en) * | 2020-07-10 | 2022-01-13 | Mitsubishi Electric Research Laboratories, Inc. | Coherent Optical Sensor with Sparse Illumination |
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US8937724B2 (en) | 2015-01-20 |
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ES2957932T3 (es) | 2024-01-30 |
EP3330696B1 (en) | 2023-07-12 |
US20100150422A1 (en) | 2010-06-17 |
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