JP3980156B2 - アクティブマトリクス型表示装置 - Google Patents
アクティブマトリクス型表示装置 Download PDFInfo
- Publication number
- JP3980156B2 JP3980156B2 JP06228198A JP6228198A JP3980156B2 JP 3980156 B2 JP3980156 B2 JP 3980156B2 JP 06228198 A JP06228198 A JP 06228198A JP 6228198 A JP6228198 A JP 6228198A JP 3980156 B2 JP3980156 B2 JP 3980156B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- insulating film
- black mask
- interlayer insulating
- inorganic insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136213—Storage capacitors associated with the pixel electrode
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136209—Light shielding layers, e.g. black matrix, incorporated in the active matrix substrate, e.g. structurally associated with the switching element
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/481—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Power Engineering (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP06228198A JP3980156B2 (ja) | 1998-02-26 | 1998-02-26 | アクティブマトリクス型表示装置 |
| US09/252,813 US6271543B1 (en) | 1998-02-26 | 1999-02-19 | Active matrix type display device and method of manufacturing the same |
| US09/865,545 US6620660B2 (en) | 1998-02-26 | 2001-05-29 | Active matrix type display device and method of manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP06228198A JP3980156B2 (ja) | 1998-02-26 | 1998-02-26 | アクティブマトリクス型表示装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007113630A Division JP4628393B2 (ja) | 2007-04-24 | 2007-04-24 | アクティブマトリクス型液晶表示装置の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11249171A JPH11249171A (ja) | 1999-09-17 |
| JPH11249171A5 JPH11249171A5 (https=) | 2005-06-30 |
| JP3980156B2 true JP3980156B2 (ja) | 2007-09-26 |
Family
ID=13195605
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP06228198A Expired - Fee Related JP3980156B2 (ja) | 1998-02-26 | 1998-02-26 | アクティブマトリクス型表示装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US6271543B1 (https=) |
| JP (1) | JP3980156B2 (https=) |
Families Citing this family (75)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3126661B2 (ja) * | 1996-06-25 | 2001-01-22 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
| US6088070A (en) * | 1997-01-17 | 2000-07-11 | Semiconductor Energy Laboratory Co., Ltd. | Active matrix liquid crystal with capacitor between light blocking film and pixel connecting electrode |
| KR100262953B1 (ko) * | 1997-06-11 | 2000-08-01 | 구본준 | 액정 표시 장치 및 그 액정 표시 장치의 제조 방법 |
| JP3592535B2 (ja) * | 1998-07-16 | 2004-11-24 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP3355143B2 (ja) * | 1998-12-22 | 2002-12-09 | 松下電器産業株式会社 | 液晶表示装置およびその製造方法 |
| US6576924B1 (en) | 1999-02-12 | 2003-06-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having at least a pixel unit and a driver circuit unit over a same substrate |
| US6576926B1 (en) | 1999-02-23 | 2003-06-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
| US6677613B1 (en) * | 1999-03-03 | 2004-01-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating the same |
| EP1041641B1 (en) * | 1999-03-26 | 2015-11-04 | Semiconductor Energy Laboratory Co., Ltd. | A method for manufacturing an electrooptical device |
| US6346730B1 (en) | 1999-04-06 | 2002-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device having a pixel TFT formed in a display region and a drive circuit formed in the periphery of the display region on the same substrate |
| US6777254B1 (en) * | 1999-07-06 | 2004-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
| CN1186683C (zh) * | 1999-09-08 | 2005-01-26 | 松下电器产业株式会社 | 显示装置及其制造方法 |
| US6876145B1 (en) * | 1999-09-30 | 2005-04-05 | Semiconductor Energy Laboratory Co., Ltd. | Organic electroluminescent display device |
| US6524877B1 (en) * | 1999-10-26 | 2003-02-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, and method of fabricating the same |
| JP4381526B2 (ja) * | 1999-10-26 | 2009-12-09 | 東京エレクトロン株式会社 | プラズマエッチング方法 |
| US6580094B1 (en) | 1999-10-29 | 2003-06-17 | Semiconductor Energy Laboratory Co., Ltd. | Electro luminescence display device |
| KR100686229B1 (ko) * | 2000-04-20 | 2007-02-22 | 삼성전자주식회사 | 액정 표시 장치 |
| CN1267782C (zh) | 2000-04-21 | 2006-08-02 | 精工爱普生株式会社 | 电光装置 |
| JP4599655B2 (ja) * | 2000-04-24 | 2010-12-15 | セイコーエプソン株式会社 | 電気光学装置及びプロジェクタ |
| JP4689009B2 (ja) * | 2000-07-05 | 2011-05-25 | 株式会社半導体エネルギー研究所 | 表示装置、電子機器および表示装置の作製方法 |
| KR100766493B1 (ko) * | 2001-02-12 | 2007-10-15 | 삼성전자주식회사 | 박막트랜지스터 액정표시장치 |
| SG118118A1 (en) * | 2001-02-22 | 2006-01-27 | Semiconductor Energy Lab | Organic light emitting device and display using the same |
| US7095460B2 (en) * | 2001-02-26 | 2006-08-22 | Samsung Electronics Co., Ltd. | Thin film transistor array substrate using low dielectric insulating layer and method of fabricating the same |
| GB2372620A (en) * | 2001-02-27 | 2002-08-28 | Sharp Kk | Active Matrix Device |
| JP4312420B2 (ja) * | 2001-05-18 | 2009-08-12 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
| JP4689900B2 (ja) * | 2001-08-22 | 2011-05-25 | Nec液晶テクノロジー株式会社 | 液晶表示装置 |
| KR100446940B1 (ko) * | 2001-08-29 | 2004-09-01 | 일진다이아몬드(주) | 액정표시장치용 박막 트랜지스터 및 그 제조방법 |
| JP4798907B2 (ja) | 2001-09-26 | 2011-10-19 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US7483001B2 (en) * | 2001-11-21 | 2009-01-27 | Seiko Epson Corporation | Active matrix substrate, electro-optical device, and electronic device |
| KR100415617B1 (ko) * | 2001-12-06 | 2004-01-24 | 엘지.필립스 엘시디 주식회사 | 에천트와 이를 이용한 금속배선 제조방법 및박막트랜지스터의 제조방법 |
| KR100475111B1 (ko) * | 2001-12-28 | 2005-03-10 | 엘지.필립스 엘시디 주식회사 | 액정표시장치의 제조방법 |
| JP2003207794A (ja) * | 2002-01-11 | 2003-07-25 | Sanyo Electric Co Ltd | アクティブマトリクス型表示装置 |
| WO2003075356A1 (en) * | 2002-03-07 | 2003-09-12 | Samsung Electronics Co., Ltd. | Contact portion of semiconductor device, and method for manufacturing the same, thin film transistor array panel for display device including the contact portion, and method for manufacturing the same |
| US7317208B2 (en) | 2002-03-07 | 2008-01-08 | Samsung Electronics Co., Ltd. | Semiconductor device with contact structure and manufacturing method thereof |
| JP3989761B2 (ja) | 2002-04-09 | 2007-10-10 | 株式会社半導体エネルギー研究所 | 半導体表示装置 |
| US7038239B2 (en) | 2002-04-09 | 2006-05-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor element and display device using the same |
| JP3989763B2 (ja) * | 2002-04-15 | 2007-10-10 | 株式会社半導体エネルギー研究所 | 半導体表示装置 |
| TWI270919B (en) * | 2002-04-15 | 2007-01-11 | Semiconductor Energy Lab | Display device and method of fabricating the same |
| US7242021B2 (en) * | 2002-04-23 | 2007-07-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display element using semiconductor device |
| TWI272556B (en) | 2002-05-13 | 2007-02-01 | Semiconductor Energy Lab | Display device |
| TWI263339B (en) * | 2002-05-15 | 2006-10-01 | Semiconductor Energy Lab | Light emitting device and method for manufacturing the same |
| US7256421B2 (en) | 2002-05-17 | 2007-08-14 | Semiconductor Energy Laboratory, Co., Ltd. | Display device having a structure for preventing the deterioration of a light emitting device |
| JP2004071777A (ja) * | 2002-08-06 | 2004-03-04 | Fujitsu Ltd | 有機絶縁膜の作製方法、半導体装置の製造方法、及びtft基板の製造方法 |
| JP4175877B2 (ja) * | 2002-11-29 | 2008-11-05 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
| JP4194362B2 (ja) * | 2002-12-19 | 2008-12-10 | 奇美電子股▲ふん▼有限公司 | 液晶表示セルおよび液晶ディスプレイ |
| JP4038485B2 (ja) * | 2003-03-12 | 2008-01-23 | 三星エスディアイ株式会社 | 薄膜トランジスタを備えた平板表示素子 |
| KR100669688B1 (ko) * | 2003-03-12 | 2007-01-18 | 삼성에스디아이 주식회사 | 박막트랜지스터 및 이를 구비한 평판표시소자 |
| KR100556701B1 (ko) * | 2003-10-14 | 2006-03-07 | 엘지.필립스 엘시디 주식회사 | 표시 소자용 박막 트랜지스터 기판 및 그 제조 방법 |
| CN100578688C (zh) * | 2003-10-28 | 2010-01-06 | 住友金属矿山株式会社 | 透明导电层叠体及其制造方法及使用了该层叠体的器件 |
| KR101012792B1 (ko) * | 2003-12-08 | 2011-02-08 | 삼성전자주식회사 | 박막 트랜지스터 표시판과 그 제조 방법 |
| KR101049001B1 (ko) * | 2004-05-31 | 2011-07-12 | 엘지디스플레이 주식회사 | 횡전계 방식(ips)의 컬러필터 온박막트랜지스터(cot) 구조의 액정표시장치 |
| JP2005342803A (ja) * | 2004-05-31 | 2005-12-15 | Sony Corp | Mems素子とその製造方法、光学mems素子、光変調素子、glvデバイス、及びレーザディスプレイ |
| KR101251993B1 (ko) * | 2005-02-25 | 2013-04-08 | 삼성디스플레이 주식회사 | 박막 트랜지스터 표시판 |
| US8305507B2 (en) * | 2005-02-25 | 2012-11-06 | Samsung Display Co., Ltd. | Thin film transistor array panel having improved storage capacitance and manufacturing method thereof |
| JP5117667B2 (ja) * | 2005-02-28 | 2013-01-16 | カシオ計算機株式会社 | 薄膜トランジスタパネル |
| JP2006245031A (ja) * | 2005-02-28 | 2006-09-14 | Casio Comput Co Ltd | 薄膜トランジスタパネル |
| JP4541421B2 (ja) | 2006-03-15 | 2010-09-08 | シャープ株式会社 | 液晶表示装置、テレビジョン受像機 |
| KR20070109192A (ko) * | 2006-05-10 | 2007-11-15 | 삼성전자주식회사 | 표시 기판과, 이의 제조 방법 및 이를 구비한 표시 장치 |
| JP5247008B2 (ja) * | 2006-06-07 | 2013-07-24 | キヤノン株式会社 | 透過型の表示装置 |
| EP2385423A1 (en) * | 2006-07-19 | 2011-11-09 | Sharp Kabushiki Kaisha | Active matrix substrate, liquid crystal display panel, television receiver |
| JP5500771B2 (ja) * | 2006-12-05 | 2014-05-21 | 株式会社半導体エネルギー研究所 | 半導体装置及びマイクロプロセッサ |
| US20110227087A1 (en) * | 2008-11-28 | 2011-09-22 | Sharp Kabushiki Kaisha | Substrate for display device, and display device |
| EP2357520A4 (en) * | 2008-12-10 | 2012-05-30 | Sharp Kk | ACTIVE MATRIX SUBSTRATE, PROCESS FOR PREPARING AN ACTIVE MATRIX SUBSTRATE, LIQUID CRYSTAL SCREEN, METHOD FOR PRODUCING A LIQUID CRYSTAL SCREEN, LIQUID CRYSTAL DISPLAY ARRANGEMENT, LIQUID CRYSTAL DISPLAY UNIT AND TV RECEIVER |
| US20100224878A1 (en) | 2009-03-05 | 2010-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US8471973B2 (en) * | 2009-06-12 | 2013-06-25 | Au Optronics Corporation | Pixel designs of improving the aperture ratio in an LCD |
| US8772752B2 (en) * | 2011-05-24 | 2014-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP5153921B2 (ja) * | 2011-06-27 | 2013-02-27 | 株式会社半導体エネルギー研究所 | 表示装置、及び携帯情報端末 |
| JP5909919B2 (ja) * | 2011-08-17 | 2016-04-27 | セイコーエプソン株式会社 | 電気光学装置及び電子機器 |
| TWI657539B (zh) * | 2012-08-31 | 2019-04-21 | Semiconductor Energy Laboratory Co., Ltd. | 半導體裝置 |
| JP5386626B2 (ja) * | 2012-11-06 | 2014-01-15 | 株式会社半導体エネルギー研究所 | 表示装置 |
| JP2013200574A (ja) * | 2013-06-05 | 2013-10-03 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| CN104240633B (zh) * | 2013-06-07 | 2018-01-09 | 上海和辉光电有限公司 | 薄膜晶体管和有源矩阵有机发光二极管组件及其制造方法 |
| CN104241390B (zh) * | 2013-06-21 | 2017-02-08 | 上海和辉光电有限公司 | 薄膜晶体管和有源矩阵有机发光二极管组件及制造方法 |
| JP5685633B2 (ja) * | 2013-10-08 | 2015-03-18 | 株式会社半導体エネルギー研究所 | 表示装置 |
| KR102905065B1 (ko) * | 2019-08-06 | 2025-12-29 | 엘지전자 주식회사 | 반도체 발광 소자를 이용한 디스플레이 장치 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6979840B1 (en) | 1991-09-25 | 2005-12-27 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistors having anodized metal film between the gate wiring and drain wiring |
| JP3133140B2 (ja) | 1992-04-01 | 2001-02-05 | 株式会社半導体エネルギー研究所 | 表示装置 |
| JPH06188419A (ja) * | 1992-12-16 | 1994-07-08 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタの製造方法 |
| TW435820U (en) | 1993-01-18 | 2001-05-16 | Semiconductor Energy Lab | MIS semiconductor device |
| JPH06347827A (ja) * | 1993-06-07 | 1994-12-22 | Hitachi Ltd | 液晶表示装置およびその製造方法 |
| JP2789293B2 (ja) | 1993-07-14 | 1998-08-20 | 株式会社半導体エネルギー研究所 | 半導体装置作製方法 |
| JPH07135323A (ja) | 1993-10-20 | 1995-05-23 | Semiconductor Energy Lab Co Ltd | 薄膜状半導体集積回路およびその作製方法 |
| JP2759415B2 (ja) | 1993-11-05 | 1998-05-28 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| TW299897U (en) | 1993-11-05 | 1997-03-01 | Semiconductor Energy Lab | A semiconductor integrated circuit |
| JP3153065B2 (ja) | 1993-12-27 | 2001-04-03 | 株式会社半導体エネルギー研究所 | 半導体集積回路の電極の作製方法 |
| JP3312083B2 (ja) | 1994-06-13 | 2002-08-05 | 株式会社半導体エネルギー研究所 | 表示装置 |
| JP2927679B2 (ja) | 1994-06-28 | 1999-07-28 | シャープ株式会社 | 液晶表示装置 |
| JP3729955B2 (ja) | 1996-01-19 | 2005-12-21 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JP3126661B2 (ja) | 1996-06-25 | 2001-01-22 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
| JP3708637B2 (ja) * | 1996-07-15 | 2005-10-19 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
| KR100207491B1 (ko) * | 1996-08-21 | 1999-07-15 | 윤종용 | 액정표시장치 및 그 제조방법 |
| US6038006A (en) * | 1996-09-02 | 2000-03-14 | Casio Computer Co., Ltd. | Liquid crystal display device with light shield and color filter overlapping two edges of pixel electrode |
| JP3525316B2 (ja) * | 1996-11-12 | 2004-05-10 | 株式会社半導体エネルギー研究所 | アクティブマトリクス型表示装置 |
| JPH10198292A (ja) * | 1996-12-30 | 1998-07-31 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| US6218219B1 (en) * | 1997-09-29 | 2001-04-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
| US6338988B1 (en) * | 1999-09-30 | 2002-01-15 | International Business Machines Corporation | Method for fabricating self-aligned thin-film transistors to define a drain and source in a single photolithographic step |
| US6429058B1 (en) * | 2000-06-02 | 2002-08-06 | International Business Machines Corporation | Method of forming fully self-aligned TFT improved process window |
| US6403407B1 (en) * | 2000-06-02 | 2002-06-11 | International Business Machines Corporation | Method of forming fully self-aligned TFT with improved process window |
-
1998
- 1998-02-26 JP JP06228198A patent/JP3980156B2/ja not_active Expired - Fee Related
-
1999
- 1999-02-19 US US09/252,813 patent/US6271543B1/en not_active Expired - Lifetime
-
2001
- 2001-05-29 US US09/865,545 patent/US6620660B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20020058362A1 (en) | 2002-05-16 |
| US6620660B2 (en) | 2003-09-16 |
| US6271543B1 (en) | 2001-08-07 |
| JPH11249171A (ja) | 1999-09-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3980156B2 (ja) | アクティブマトリクス型表示装置 | |
| JP3919900B2 (ja) | 液晶表示装置およびその作製方法 | |
| JP4118485B2 (ja) | 半導体装置の作製方法 | |
| US7732820B2 (en) | Substrate for display device having a protective layer provided between the pixel electrodes and wirings of the active matrix substrate, manufacturing method for same and display device | |
| US9177974B2 (en) | Active matrix substrate and liquid crystal display panel including the same, and method for manufacturing active matrix substrate with gate insulating film not provided where auxiliary capacitor is provided | |
| JP2001013520A (ja) | アクティブマトリックス型液晶表示装置 | |
| JP2001257350A (ja) | 半導体装置およびその作製方法 | |
| JP2001250953A (ja) | 半導体装置およびその作製方法 | |
| US7525605B2 (en) | Liquid crystal display device and manufacturing method thereof | |
| JP2003107523A (ja) | 液晶表示装置 | |
| US7602452B2 (en) | Liquid crystal display device and method for manufacturing the same | |
| US20160197165A1 (en) | Manufacturing method of thin film transistor display panel | |
| US20050243230A1 (en) | Method for manufacturing a panel of a thin film transistor liquid crystal display device | |
| JP2005123610A (ja) | 薄膜トランジスタアレイ基板の製造方法 | |
| WO2010119689A1 (ja) | 半導体装置およびその製造方法 | |
| JP4118706B2 (ja) | 液晶表示装置の作製方法 | |
| US7098062B2 (en) | Manufacturing method of pixel structure of thin film transistor liquid crystal display | |
| CN1983606A (zh) | 薄膜晶体管阵列基板及其制造方法 | |
| JP4097521B2 (ja) | 半導体装置の作製方法 | |
| US7619695B2 (en) | Liquid crystal display and manufacturing method therefor | |
| JP4628393B2 (ja) | アクティブマトリクス型液晶表示装置の作製方法 | |
| JP2008225514A (ja) | 液晶表示装置及びその製造方法 | |
| US7521298B2 (en) | Thin film transistor array panel of active liquid crystal display and fabrication method thereof | |
| JP4118704B2 (ja) | 液晶表示装置の作製方法 | |
| JP3169322B2 (ja) | アクティブマトリクス基板およびその製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20041018 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041018 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20061002 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20061017 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20061116 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070313 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070426 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20070626 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20070627 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100706 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100706 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100706 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110706 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110706 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110706 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120706 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120706 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120706 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120706 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130706 Year of fee payment: 6 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130706 Year of fee payment: 6 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |