JP2018516465A5 - - Google Patents

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Publication number
JP2018516465A5
JP2018516465A5 JP2017562997A JP2017562997A JP2018516465A5 JP 2018516465 A5 JP2018516465 A5 JP 2018516465A5 JP 2017562997 A JP2017562997 A JP 2017562997A JP 2017562997 A JP2017562997 A JP 2017562997A JP 2018516465 A5 JP2018516465 A5 JP 2018516465A5
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JP
Japan
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metal layer
gas
substrate
feature
layer
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JP2017562997A
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Japanese (ja)
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JP2018516465A (ja
JP7066929B2 (ja
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Priority claimed from PCT/US2016/035724 external-priority patent/WO2016196937A1/en
Publication of JP2018516465A publication Critical patent/JP2018516465A/ja
Publication of JP2018516465A5 publication Critical patent/JP2018516465A5/ja
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JP2017562997A 2015-06-05 2016-06-03 インターコネクトのためのルテニウムメタルによるフィーチャ充填 Active JP7066929B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562171739P 2015-06-05 2015-06-05
US62/171,739 2015-06-05
PCT/US2016/035724 WO2016196937A1 (en) 2015-06-05 2016-06-03 Ruthenium metal feature fill for interconnects

Publications (3)

Publication Number Publication Date
JP2018516465A JP2018516465A (ja) 2018-06-21
JP2018516465A5 true JP2018516465A5 (enExample) 2019-07-04
JP7066929B2 JP7066929B2 (ja) 2022-05-16

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JP2017562997A Active JP7066929B2 (ja) 2015-06-05 2016-06-03 インターコネクトのためのルテニウムメタルによるフィーチャ充填

Country Status (6)

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US (2) US9711449B2 (enExample)
JP (1) JP7066929B2 (enExample)
KR (1) KR102542758B1 (enExample)
CN (1) CN107836034B (enExample)
TW (1) TWI621161B (enExample)
WO (1) WO2016196937A1 (enExample)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10049927B2 (en) * 2016-06-10 2018-08-14 Applied Materials, Inc. Seam-healing method upon supra-atmospheric process in diffusion promoting ambient
JP7027432B2 (ja) 2017-01-20 2022-03-01 東京エレクトロン株式会社 相互接続構造及びその形成方法
US10224224B2 (en) 2017-03-10 2019-03-05 Micromaterials, LLC High pressure wafer processing systems and related methods
US10622214B2 (en) 2017-05-25 2020-04-14 Applied Materials, Inc. Tungsten defluorination by high pressure treatment
KR102405723B1 (ko) 2017-08-18 2022-06-07 어플라이드 머티어리얼스, 인코포레이티드 고압 및 고온 어닐링 챔버
US10276411B2 (en) 2017-08-18 2019-04-30 Applied Materials, Inc. High pressure and high temperature anneal chamber
KR102601862B1 (ko) * 2017-10-04 2023-11-13 도쿄엘렉트론가부시키가이샤 상호접속부를 위한 루테늄 금속 피처 충전
US10790188B2 (en) 2017-10-14 2020-09-29 Applied Materials, Inc. Seamless ruthenium gap fill
US10672649B2 (en) 2017-11-08 2020-06-02 International Business Machines Corporation Advanced BEOL interconnect architecture
CN111357090B (zh) 2017-11-11 2024-01-05 微材料有限责任公司 用于高压处理腔室的气体输送系统
KR20200075892A (ko) 2017-11-17 2020-06-26 어플라이드 머티어리얼스, 인코포레이티드 고압 처리 시스템을 위한 컨덴서 시스템
US10269698B1 (en) 2017-12-20 2019-04-23 International Business Machines Corporation Binary metallization structure for nanoscale dual damascene interconnects
TWI799494B (zh) 2018-01-19 2023-04-21 荷蘭商Asm 智慧財產控股公司 沈積方法
KR102702244B1 (ko) 2018-03-09 2024-09-03 어플라이드 머티어리얼스, 인코포레이티드 금속 함유 재료들을 위한 고압 어닐링 프로세스
US10950429B2 (en) 2018-05-08 2021-03-16 Applied Materials, Inc. Methods of forming amorphous carbon hard mask layers and hard mask layers formed therefrom
US10748783B2 (en) 2018-07-25 2020-08-18 Applied Materials, Inc. Gas delivery module
JP7547037B2 (ja) * 2018-08-20 2024-09-09 エーエスエム・アイピー・ホールディング・ベー・フェー 周期的堆積プロセスによって基材の誘電体表面上にモリブデン金属膜を堆積させる方法および関連する半導体デバイス構造
JP7182970B2 (ja) * 2018-09-20 2022-12-05 東京エレクトロン株式会社 埋め込み方法及び処理システム
US11631680B2 (en) 2018-10-18 2023-04-18 Applied Materials, Inc. Methods and apparatus for smoothing dynamic random access memory bit line metal
WO2020117462A1 (en) 2018-12-07 2020-06-11 Applied Materials, Inc. Semiconductor processing system
WO2020176814A1 (en) * 2019-02-28 2020-09-03 Tokyo Electron Limited Dual silicide wrap-around contacts for semiconductor devices
US11901222B2 (en) 2020-02-17 2024-02-13 Applied Materials, Inc. Multi-step process for flowable gap-fill film
JP7206355B2 (ja) * 2020-11-12 2023-01-17 アプライド マテリアルズ インコーポレイテッド ダイナミックランダムアクセスメモリビット線金属を滑らかにするための方法及び装置
US20220165852A1 (en) * 2020-11-23 2022-05-26 Applied Materials, Inc. Methods and apparatus for metal fill in metal gate stack
US20220223472A1 (en) 2021-01-11 2022-07-14 Applied Materials, Inc. Ruthenium Reflow For Via Fill
KR102659491B1 (ko) * 2021-08-12 2024-04-23 한국과학기술연구원 배선 재료용 저저항 필름의 제조 방법
US20240282709A1 (en) * 2023-02-22 2024-08-22 Applied Materials, Inc. Layered Substrate with Ruthenium Layer and Method for Producing
US20240355673A1 (en) * 2023-04-20 2024-10-24 Applied Materials, Inc. Hybrid molybdenum fill scheme for low resistivity semiconductor applications
US20240363410A1 (en) * 2023-04-25 2024-10-31 Tokyo Electron Limited Methods for making semiconductor devices that include metal cap layers

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6475903B1 (en) 1993-12-28 2002-11-05 Intel Corporation Copper reflow process
JP3393436B2 (ja) * 1996-12-03 2003-04-07 ソニー株式会社 配線の形成方法
JPH10209157A (ja) * 1997-01-21 1998-08-07 Hitachi Ltd 半導体装置の製造方法
KR100227843B1 (ko) * 1997-01-22 1999-11-01 윤종용 반도체 소자의 콘택 배선 방법 및 이를 이용한 커패시터 제조방법
KR100230418B1 (ko) * 1997-04-17 1999-11-15 윤종용 백금족 금속층 형성방법 및 이를 이용한 커패시터 제조방법
JP2000091269A (ja) * 1998-09-10 2000-03-31 Fujitsu Ltd 半導体装置の製造方法
KR100408410B1 (ko) * 2001-05-31 2003-12-06 삼성전자주식회사 엠아이엠(mim) 커패시터를 갖는 반도체 소자 및 그제조 방법
KR100416602B1 (ko) * 2001-08-08 2004-02-05 삼성전자주식회사 스택형 캐패시터의 제조 방법
US7270848B2 (en) * 2004-11-23 2007-09-18 Tokyo Electron Limited Method for increasing deposition rates of metal layers from metal-carbonyl precursors
US7273814B2 (en) * 2005-03-16 2007-09-25 Tokyo Electron Limited Method for forming a ruthenium metal layer on a patterned substrate
TW200734482A (en) * 2005-03-18 2007-09-16 Applied Materials Inc Electroless deposition process on a contact containing silicon or silicide
US20070059502A1 (en) * 2005-05-05 2007-03-15 Applied Materials, Inc. Integrated process for sputter deposition of a conductive barrier layer, especially an alloy of ruthenium and tantalum, underlying copper or copper alloy seed layer
WO2008049019A2 (en) * 2006-10-17 2008-04-24 Enthone Inc. Copper deposition for filling features in manufacture of microelectronic devices
US7829454B2 (en) 2007-09-11 2010-11-09 Tokyo Electron Limited Method for integrating selective ruthenium deposition into manufacturing of a semiconductior device
US7704879B2 (en) * 2007-09-27 2010-04-27 Tokyo Electron Limited Method of forming low-resistivity recessed features in copper metallization
US7776740B2 (en) * 2008-01-22 2010-08-17 Tokyo Electron Limited Method for integrating selective low-temperature ruthenium deposition into copper metallization of a semiconductor device
JP2010067638A (ja) * 2008-09-08 2010-03-25 Tokyo Electron Ltd ルテニウム膜の成膜方法
JP2010199349A (ja) 2009-02-26 2010-09-09 Toshiba Corp 半導体装置の製造方法
TWI536451B (zh) * 2010-04-26 2016-06-01 應用材料股份有限公司 使用具金屬系前驅物之化學氣相沉積與原子層沉積製程之n型金氧半導體金屬閘極材料、製造方法及設備
US8637390B2 (en) * 2010-06-04 2014-01-28 Applied Materials, Inc. Metal gate structures and methods for forming thereof
US9048296B2 (en) * 2011-02-11 2015-06-02 International Business Machines Corporation Method to fabricate copper wiring structures and structures formed thereby
KR101444527B1 (ko) * 2011-08-05 2014-09-24 도쿄엘렉트론가부시키가이샤 반도체 장치의 제조 방법
JP5862353B2 (ja) * 2011-08-05 2016-02-16 東京エレクトロン株式会社 半導体装置の製造方法
KR20130096949A (ko) * 2012-02-23 2013-09-02 삼성전자주식회사 반도체 소자의 형성 방법
US8517769B1 (en) 2012-03-16 2013-08-27 Globalfoundries Inc. Methods of forming copper-based conductive structures on an integrated circuit device
TWI576961B (zh) * 2012-04-26 2017-04-01 應用材料股份有限公司 用於高深寬比塡充的半導體重流處理
US9245798B2 (en) * 2012-04-26 2016-01-26 Applied Matrials, Inc. Semiconductor reflow processing for high aspect ratio fill
JP2014033139A (ja) * 2012-08-06 2014-02-20 Ulvac Japan Ltd デバイスの製造方法
EP2779224A3 (en) * 2013-03-15 2014-12-31 Applied Materials, Inc. Methods for producing interconnects in semiconductor devices
JP2014204014A (ja) * 2013-04-08 2014-10-27 三菱電機株式会社 半導体装置およびその製造方法

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