JP2014109453A - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP2014109453A
JP2014109453A JP2012262826A JP2012262826A JP2014109453A JP 2014109453 A JP2014109453 A JP 2014109453A JP 2012262826 A JP2012262826 A JP 2012262826A JP 2012262826 A JP2012262826 A JP 2012262826A JP 2014109453 A JP2014109453 A JP 2014109453A
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JP
Japan
Prior art keywords
flip
flop
data
circuit
malfunction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012262826A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014109453A5 (https=
Inventor
Kazuyuki Ito
一幸 伊藤
Hiroshi Shirota
博史 城田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2012262826A priority Critical patent/JP2014109453A/ja
Priority to EP13190845.1A priority patent/EP2738941A1/en
Priority to US14/077,277 priority patent/US9229046B2/en
Priority to CN201310628016.2A priority patent/CN103852713B/zh
Publication of JP2014109453A publication Critical patent/JP2014109453A/ja
Publication of JP2014109453A5 publication Critical patent/JP2014109453A5/ja
Priority to US14/955,015 priority patent/US9350333B2/en
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
JP2012262826A 2012-11-30 2012-11-30 半導体装置 Pending JP2014109453A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2012262826A JP2014109453A (ja) 2012-11-30 2012-11-30 半導体装置
EP13190845.1A EP2738941A1 (en) 2012-11-30 2013-10-30 Semiconductor device
US14/077,277 US9229046B2 (en) 2012-11-30 2013-11-12 Semiconductor device
CN201310628016.2A CN103852713B (zh) 2012-11-30 2013-11-29 半导体装置
US14/955,015 US9350333B2 (en) 2012-11-30 2015-11-30 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012262826A JP2014109453A (ja) 2012-11-30 2012-11-30 半導体装置

Publications (2)

Publication Number Publication Date
JP2014109453A true JP2014109453A (ja) 2014-06-12
JP2014109453A5 JP2014109453A5 (https=) 2015-10-08

Family

ID=49546251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012262826A Pending JP2014109453A (ja) 2012-11-30 2012-11-30 半導体装置

Country Status (4)

Country Link
US (2) US9229046B2 (https=)
EP (1) EP2738941A1 (https=)
JP (1) JP2014109453A (https=)
CN (1) CN103852713B (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6360387B2 (ja) * 2014-08-19 2018-07-18 ルネサスエレクトロニクス株式会社 プロセッサシステム、エンジン制御システム及び制御方法
KR102617240B1 (ko) * 2017-02-28 2023-12-27 에스케이하이닉스 주식회사 반도체 장치
WO2019106225A1 (en) * 2017-12-01 2019-06-06 Minima Processor Oy Method and arrangement for ensuring valid data at a second stage of a digital register circuit
US12182260B2 (en) * 2017-12-18 2024-12-31 Nuvoton Technology Corporation System and method for detecting fault injection attacks
JP2019113939A (ja) * 2017-12-21 2019-07-11 ルネサスエレクトロニクス株式会社 半導体装置
US12085611B2 (en) 2018-10-16 2024-09-10 Minima Processor Oy Applications of adaptive microelectronic circuits that are designed for testability

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875825A (ja) * 1994-09-09 1996-03-22 Fujitsu Ltd 試験回路及びその試験方法並びに試験回路を用いた試験方法
JP2001526809A (ja) * 1997-05-07 2001-12-18 ゼネラル・ダイナミックス・インフォメーション・システムズ・インコーポレーテッド コンピュータ・システム用非割り込み電力制御
JP2002107425A (ja) * 2000-09-29 2002-04-10 Hitachi Ltd 半導体集積回路
US20020077782A1 (en) * 1999-05-10 2002-06-20 Fruehling Terry L. Secured microcontroller architecture
JP2002181893A (ja) * 2000-12-11 2002-06-26 Mitsubishi Electric Corp 半導体装置の検査方法および検査装置
JP2003036697A (ja) * 2001-07-25 2003-02-07 Mitsubishi Electric Corp 半導体メモリのテスト回路および半導体メモリデバイス
JP2006269477A (ja) * 2005-03-22 2006-10-05 Seiko Epson Corp 半導体集積回路
JP2009200739A (ja) * 2008-02-20 2009-09-03 Panasonic Corp 半導体集積回路

Family Cites Families (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63755A (ja) * 1986-06-20 1988-01-05 Fujitsu Ltd 半導体記憶装置
JP3077075B2 (ja) * 1993-09-22 2000-08-14 株式会社日立製作所 電力変換装置
EP0653708B1 (en) * 1993-10-15 2000-08-16 Hitachi, Ltd. Logic circuit having error detection function, redundant resource management method, and fault tolerant system using it
US5815512A (en) * 1994-05-26 1998-09-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory testing device
TW428092B (en) * 1998-05-20 2001-04-01 Advantest Corp Semiconductor test system
US6693436B1 (en) * 1999-12-23 2004-02-17 Intel Corporation Method and apparatus for testing an integrated circuit having an output-to-output relative signal
JP4174167B2 (ja) * 2000-04-04 2008-10-29 株式会社アドバンテスト 半導体集積回路の故障解析方法および故障解析装置
JP4488595B2 (ja) * 2000-06-08 2010-06-23 株式会社アドバンテスト テストパターン生成方法
JP2003035747A (ja) * 2001-07-19 2003-02-07 Mitsubishi Electric Corp 半導体検査システムおよび半導体検査方法
JP2003234647A (ja) * 2002-02-13 2003-08-22 Allied Tereshisu Kk 半導体デバイス用誤動作抑制回路
WO2003076959A1 (fr) * 2002-03-08 2003-09-18 Advantest Corporation Dispositif testeur a semi-conducteur et procede de mesure de synchronisation pour ce dispositif
JP4628096B2 (ja) * 2002-06-10 2011-02-09 株式会社アドバンテスト 半導体試験装置
KR100545748B1 (ko) * 2002-08-09 2006-01-24 마쯔시다덴기산교 가부시키가이샤 반도체 집적회로 장치의 설계 방법 및 설계 장치
WO2004057354A1 (ja) * 2002-12-20 2004-07-08 Advantest Corporation 半導体試験装置
JP4232477B2 (ja) * 2003-02-13 2009-03-04 パナソニック株式会社 半導体集積回路の検証方法
WO2004102217A1 (ja) * 2003-05-15 2004-11-25 Advantest Corporation 試験装置
JP2005300308A (ja) * 2004-04-09 2005-10-27 Oki Electric Ind Co Ltd 半導体集積回路
WO2005124378A1 (ja) * 2004-06-17 2005-12-29 Advantest Corporation 試験装置及び試験方法
DE102004036145A1 (de) * 2004-07-26 2006-03-23 Infineon Technologies Ag Halbleiterschaltungseinrichtung und System zum Testen einer Halbleitervorrichtung
JP2006352304A (ja) * 2005-06-14 2006-12-28 Renesas Technology Corp 半導体集積回路
JP4762754B2 (ja) * 2006-02-17 2011-08-31 富士通セミコンダクター株式会社 半導体装置および電子装置
US7970565B2 (en) * 2006-02-27 2011-06-28 Advantest Corporation Measuring device, test device, electronic device, program, and recording medium
JP4949707B2 (ja) * 2006-03-22 2012-06-13 ルネサスエレクトロニクス株式会社 半導体装置及びそのテスト方法
JP5173216B2 (ja) * 2006-04-18 2013-04-03 パナソニック株式会社 半導体集積回路システム、半導体集積回路、オペレーティングシステム及び半導体集積回路の制御方法
JP4684942B2 (ja) * 2006-05-10 2011-05-18 ルネサスエレクトロニクス株式会社 半導体装置及び観測用フリップフロップの配置方法
JP4984214B2 (ja) * 2006-05-11 2012-07-25 日産自動車株式会社 シリンダブロック用鉄系溶射薄膜及びシリンダブロック
JP2007309733A (ja) * 2006-05-17 2007-11-29 Matsushita Electric Ind Co Ltd 半導体集積回路および半導体集積回路の検査方法
JP2008028345A (ja) * 2006-07-25 2008-02-07 Matsushita Electric Ind Co Ltd 誤動作検知回路を含む半導体集積回路とその設計方法
JP2008042367A (ja) * 2006-08-03 2008-02-21 Renesas Technology Corp 半導体装置
US8270225B2 (en) * 2007-03-22 2012-09-18 Advantest Corporation Data receiving circuit
JP2008256491A (ja) 2007-04-04 2008-10-23 Matsushita Electric Ind Co Ltd 信号遅延検出用回路及びそれを用いた集積回路の検査方法
KR101085564B1 (ko) * 2007-04-27 2011-11-24 가부시키가이샤 어드밴티스트 시험 장치 및 시험 방법
JP4924223B2 (ja) * 2007-06-12 2012-04-25 富士通セミコンダクター株式会社 半導体装置
US7827454B2 (en) * 2007-07-17 2010-11-02 Renesas Electronics Corporation Semiconductor device
US8132136B2 (en) * 2007-08-06 2012-03-06 International Business Machines Corporation Dynamic critical path detector for digital logic circuit paths
JP2009048674A (ja) * 2007-08-14 2009-03-05 Nec Electronics Corp 半導体集積回路
JP5023983B2 (ja) * 2007-11-14 2012-09-12 横河電機株式会社 半導体試験装置
JP2009150726A (ja) * 2007-12-19 2009-07-09 Panasonic Corp 半導体装置
JP2009290857A (ja) * 2008-01-11 2009-12-10 Toshiba Corp 半導体装置
KR101138196B1 (ko) * 2008-01-23 2012-05-14 가부시키가이샤 어드밴티스트 시험 장치
US7834639B2 (en) * 2008-01-30 2010-11-16 Advantest Corporation Jitter injection circuit, pattern generator, test apparatus, and electronic device
JP5301299B2 (ja) * 2008-01-31 2013-09-25 株式会社半導体エネルギー研究所 半導体装置
US7923733B2 (en) * 2008-02-07 2011-04-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP4557018B2 (ja) * 2008-02-28 2010-10-06 ソニー株式会社 位相検出装置、位相比較装置およびクロック同期装置
KR100951567B1 (ko) * 2008-02-29 2010-04-09 주식회사 하이닉스반도체 데이터 전달의 신뢰성을 보장하기 위한 반도체 메모리 장치
KR100929835B1 (ko) * 2008-02-29 2009-12-07 주식회사 하이닉스반도체 안정적인 초기 동작을 수행하는 반도체 메모리 장치
US8384406B2 (en) * 2008-04-14 2013-02-26 Advantest Corporation Semiconductor test apparatus and test method
JP5292925B2 (ja) * 2008-05-30 2013-09-18 富士通株式会社 半導体集積回路及びその制御方法、並びに情報処理装置
JP2010092306A (ja) * 2008-10-08 2010-04-22 Nec Electronics Corp データ処理装置
KR101547302B1 (ko) * 2009-02-09 2015-08-26 삼성전자주식회사 펄스 기반 플립플롭의 클럭 스큐 흡수특성을 고려한 셋업 시간 측정 방법
US8438518B2 (en) * 2009-03-03 2013-05-07 Nec Corporation Apparatus for designing semiconductor integrated circuit, method of designing semiconductor integrated circuit, and program for designing semiconductor integrated circuit
JP2010256130A (ja) * 2009-04-23 2010-11-11 Renesas Electronics Corp 半導体集積回路、および半導体集積回路のテスト方法
US8402328B2 (en) * 2009-07-24 2013-03-19 StarDFX Technologies, Inc. Apparatus and method for protecting soft errors
US8489947B2 (en) * 2010-02-15 2013-07-16 Mentor Graphics Corporation Circuit and method for simultaneously measuring multiple changes in delay
US8555124B2 (en) * 2010-06-07 2013-10-08 Arm Limited Apparatus and method for detecting an approaching error condition
US8222943B2 (en) * 2010-09-22 2012-07-17 Freescale Semiconductor, Inc. Master-slave flip-flop with timing error correction

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875825A (ja) * 1994-09-09 1996-03-22 Fujitsu Ltd 試験回路及びその試験方法並びに試験回路を用いた試験方法
JP2001526809A (ja) * 1997-05-07 2001-12-18 ゼネラル・ダイナミックス・インフォメーション・システムズ・インコーポレーテッド コンピュータ・システム用非割り込み電力制御
US20020077782A1 (en) * 1999-05-10 2002-06-20 Fruehling Terry L. Secured microcontroller architecture
JP2002107425A (ja) * 2000-09-29 2002-04-10 Hitachi Ltd 半導体集積回路
JP2002181893A (ja) * 2000-12-11 2002-06-26 Mitsubishi Electric Corp 半導体装置の検査方法および検査装置
JP2003036697A (ja) * 2001-07-25 2003-02-07 Mitsubishi Electric Corp 半導体メモリのテスト回路および半導体メモリデバイス
JP2006269477A (ja) * 2005-03-22 2006-10-05 Seiko Epson Corp 半導体集積回路
JP2009200739A (ja) * 2008-02-20 2009-09-03 Panasonic Corp 半導体集積回路

Also Published As

Publication number Publication date
US9350333B2 (en) 2016-05-24
US9229046B2 (en) 2016-01-05
CN103852713A (zh) 2014-06-11
US20160087612A1 (en) 2016-03-24
CN103852713B (zh) 2017-11-17
EP2738941A1 (en) 2014-06-04
US20140152334A1 (en) 2014-06-05

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