JP2014109453A5 - - Google Patents

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Publication number
JP2014109453A5
JP2014109453A5 JP2012262826A JP2012262826A JP2014109453A5 JP 2014109453 A5 JP2014109453 A5 JP 2014109453A5 JP 2012262826 A JP2012262826 A JP 2012262826A JP 2012262826 A JP2012262826 A JP 2012262826A JP 2014109453 A5 JP2014109453 A5 JP 2014109453A5
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JP
Japan
Prior art keywords
flip
flop
semiconductor device
comparator
detection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012262826A
Other languages
English (en)
Japanese (ja)
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JP2014109453A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2012262826A priority Critical patent/JP2014109453A/ja
Priority claimed from JP2012262826A external-priority patent/JP2014109453A/ja
Priority to EP13190845.1A priority patent/EP2738941A1/en
Priority to US14/077,277 priority patent/US9229046B2/en
Priority to CN201310628016.2A priority patent/CN103852713B/zh
Publication of JP2014109453A publication Critical patent/JP2014109453A/ja
Publication of JP2014109453A5 publication Critical patent/JP2014109453A5/ja
Priority to US14/955,015 priority patent/US9350333B2/en
Pending legal-status Critical Current

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JP2012262826A 2012-11-30 2012-11-30 半導体装置 Pending JP2014109453A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2012262826A JP2014109453A (ja) 2012-11-30 2012-11-30 半導体装置
EP13190845.1A EP2738941A1 (en) 2012-11-30 2013-10-30 Semiconductor device
US14/077,277 US9229046B2 (en) 2012-11-30 2013-11-12 Semiconductor device
CN201310628016.2A CN103852713B (zh) 2012-11-30 2013-11-29 半导体装置
US14/955,015 US9350333B2 (en) 2012-11-30 2015-11-30 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012262826A JP2014109453A (ja) 2012-11-30 2012-11-30 半導体装置

Publications (2)

Publication Number Publication Date
JP2014109453A JP2014109453A (ja) 2014-06-12
JP2014109453A5 true JP2014109453A5 (https=) 2015-10-08

Family

ID=49546251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012262826A Pending JP2014109453A (ja) 2012-11-30 2012-11-30 半導体装置

Country Status (4)

Country Link
US (2) US9229046B2 (https=)
EP (1) EP2738941A1 (https=)
JP (1) JP2014109453A (https=)
CN (1) CN103852713B (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6360387B2 (ja) * 2014-08-19 2018-07-18 ルネサスエレクトロニクス株式会社 プロセッサシステム、エンジン制御システム及び制御方法
KR102617240B1 (ko) * 2017-02-28 2023-12-27 에스케이하이닉스 주식회사 반도체 장치
WO2019106225A1 (en) * 2017-12-01 2019-06-06 Minima Processor Oy Method and arrangement for ensuring valid data at a second stage of a digital register circuit
US12182260B2 (en) * 2017-12-18 2024-12-31 Nuvoton Technology Corporation System and method for detecting fault injection attacks
JP2019113939A (ja) * 2017-12-21 2019-07-11 ルネサスエレクトロニクス株式会社 半導体装置
US12085611B2 (en) 2018-10-16 2024-09-10 Minima Processor Oy Applications of adaptive microelectronic circuits that are designed for testability

Family Cites Families (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63755A (ja) * 1986-06-20 1988-01-05 Fujitsu Ltd 半導体記憶装置
JP3077075B2 (ja) * 1993-09-22 2000-08-14 株式会社日立製作所 電力変換装置
EP0653708B1 (en) * 1993-10-15 2000-08-16 Hitachi, Ltd. Logic circuit having error detection function, redundant resource management method, and fault tolerant system using it
US5815512A (en) * 1994-05-26 1998-09-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory testing device
JPH0875825A (ja) * 1994-09-09 1996-03-22 Fujitsu Ltd 試験回路及びその試験方法並びに試験回路を用いた試験方法
US5923830A (en) * 1997-05-07 1999-07-13 General Dynamics Information Systems, Inc. Non-interrupting power control for fault tolerant computer systems
TW428092B (en) * 1998-05-20 2001-04-01 Advantest Corp Semiconductor test system
US6981176B2 (en) * 1999-05-10 2005-12-27 Delphi Technologies, Inc. Secured microcontroller architecture
US6693436B1 (en) * 1999-12-23 2004-02-17 Intel Corporation Method and apparatus for testing an integrated circuit having an output-to-output relative signal
JP4174167B2 (ja) * 2000-04-04 2008-10-29 株式会社アドバンテスト 半導体集積回路の故障解析方法および故障解析装置
JP4488595B2 (ja) * 2000-06-08 2010-06-23 株式会社アドバンテスト テストパターン生成方法
JP2002107425A (ja) * 2000-09-29 2002-04-10 Hitachi Ltd 半導体集積回路
JP2002181893A (ja) * 2000-12-11 2002-06-26 Mitsubishi Electric Corp 半導体装置の検査方法および検査装置
JP2003035747A (ja) * 2001-07-19 2003-02-07 Mitsubishi Electric Corp 半導体検査システムおよび半導体検査方法
JP2003036697A (ja) * 2001-07-25 2003-02-07 Mitsubishi Electric Corp 半導体メモリのテスト回路および半導体メモリデバイス
JP2003234647A (ja) * 2002-02-13 2003-08-22 Allied Tereshisu Kk 半導体デバイス用誤動作抑制回路
WO2003076959A1 (fr) * 2002-03-08 2003-09-18 Advantest Corporation Dispositif testeur a semi-conducteur et procede de mesure de synchronisation pour ce dispositif
JP4628096B2 (ja) * 2002-06-10 2011-02-09 株式会社アドバンテスト 半導体試験装置
KR100545748B1 (ko) * 2002-08-09 2006-01-24 마쯔시다덴기산교 가부시키가이샤 반도체 집적회로 장치의 설계 방법 및 설계 장치
WO2004057354A1 (ja) * 2002-12-20 2004-07-08 Advantest Corporation 半導体試験装置
JP4232477B2 (ja) * 2003-02-13 2009-03-04 パナソニック株式会社 半導体集積回路の検証方法
WO2004102217A1 (ja) * 2003-05-15 2004-11-25 Advantest Corporation 試験装置
JP2005300308A (ja) * 2004-04-09 2005-10-27 Oki Electric Ind Co Ltd 半導体集積回路
WO2005124378A1 (ja) * 2004-06-17 2005-12-29 Advantest Corporation 試験装置及び試験方法
DE102004036145A1 (de) * 2004-07-26 2006-03-23 Infineon Technologies Ag Halbleiterschaltungseinrichtung und System zum Testen einer Halbleitervorrichtung
JP2006269477A (ja) * 2005-03-22 2006-10-05 Seiko Epson Corp 半導体集積回路
JP2006352304A (ja) * 2005-06-14 2006-12-28 Renesas Technology Corp 半導体集積回路
JP4762754B2 (ja) * 2006-02-17 2011-08-31 富士通セミコンダクター株式会社 半導体装置および電子装置
US7970565B2 (en) * 2006-02-27 2011-06-28 Advantest Corporation Measuring device, test device, electronic device, program, and recording medium
JP4949707B2 (ja) * 2006-03-22 2012-06-13 ルネサスエレクトロニクス株式会社 半導体装置及びそのテスト方法
JP5173216B2 (ja) * 2006-04-18 2013-04-03 パナソニック株式会社 半導体集積回路システム、半導体集積回路、オペレーティングシステム及び半導体集積回路の制御方法
JP4684942B2 (ja) * 2006-05-10 2011-05-18 ルネサスエレクトロニクス株式会社 半導体装置及び観測用フリップフロップの配置方法
JP4984214B2 (ja) * 2006-05-11 2012-07-25 日産自動車株式会社 シリンダブロック用鉄系溶射薄膜及びシリンダブロック
JP2007309733A (ja) * 2006-05-17 2007-11-29 Matsushita Electric Ind Co Ltd 半導体集積回路および半導体集積回路の検査方法
JP2008028345A (ja) * 2006-07-25 2008-02-07 Matsushita Electric Ind Co Ltd 誤動作検知回路を含む半導体集積回路とその設計方法
JP2008042367A (ja) * 2006-08-03 2008-02-21 Renesas Technology Corp 半導体装置
US8270225B2 (en) * 2007-03-22 2012-09-18 Advantest Corporation Data receiving circuit
JP2008256491A (ja) 2007-04-04 2008-10-23 Matsushita Electric Ind Co Ltd 信号遅延検出用回路及びそれを用いた集積回路の検査方法
KR101085564B1 (ko) * 2007-04-27 2011-11-24 가부시키가이샤 어드밴티스트 시험 장치 및 시험 방법
JP4924223B2 (ja) * 2007-06-12 2012-04-25 富士通セミコンダクター株式会社 半導体装置
US7827454B2 (en) * 2007-07-17 2010-11-02 Renesas Electronics Corporation Semiconductor device
US8132136B2 (en) * 2007-08-06 2012-03-06 International Business Machines Corporation Dynamic critical path detector for digital logic circuit paths
JP2009048674A (ja) * 2007-08-14 2009-03-05 Nec Electronics Corp 半導体集積回路
JP5023983B2 (ja) * 2007-11-14 2012-09-12 横河電機株式会社 半導体試験装置
JP2009150726A (ja) * 2007-12-19 2009-07-09 Panasonic Corp 半導体装置
JP2009290857A (ja) * 2008-01-11 2009-12-10 Toshiba Corp 半導体装置
KR101138196B1 (ko) * 2008-01-23 2012-05-14 가부시키가이샤 어드밴티스트 시험 장치
US7834639B2 (en) * 2008-01-30 2010-11-16 Advantest Corporation Jitter injection circuit, pattern generator, test apparatus, and electronic device
JP5301299B2 (ja) * 2008-01-31 2013-09-25 株式会社半導体エネルギー研究所 半導体装置
US7923733B2 (en) * 2008-02-07 2011-04-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2009200739A (ja) * 2008-02-20 2009-09-03 Panasonic Corp 半導体集積回路
JP4557018B2 (ja) * 2008-02-28 2010-10-06 ソニー株式会社 位相検出装置、位相比較装置およびクロック同期装置
KR100951567B1 (ko) * 2008-02-29 2010-04-09 주식회사 하이닉스반도체 데이터 전달의 신뢰성을 보장하기 위한 반도체 메모리 장치
KR100929835B1 (ko) * 2008-02-29 2009-12-07 주식회사 하이닉스반도체 안정적인 초기 동작을 수행하는 반도체 메모리 장치
US8384406B2 (en) * 2008-04-14 2013-02-26 Advantest Corporation Semiconductor test apparatus and test method
JP5292925B2 (ja) * 2008-05-30 2013-09-18 富士通株式会社 半導体集積回路及びその制御方法、並びに情報処理装置
JP2010092306A (ja) * 2008-10-08 2010-04-22 Nec Electronics Corp データ処理装置
KR101547302B1 (ko) * 2009-02-09 2015-08-26 삼성전자주식회사 펄스 기반 플립플롭의 클럭 스큐 흡수특성을 고려한 셋업 시간 측정 방법
US8438518B2 (en) * 2009-03-03 2013-05-07 Nec Corporation Apparatus for designing semiconductor integrated circuit, method of designing semiconductor integrated circuit, and program for designing semiconductor integrated circuit
JP2010256130A (ja) * 2009-04-23 2010-11-11 Renesas Electronics Corp 半導体集積回路、および半導体集積回路のテスト方法
US8402328B2 (en) * 2009-07-24 2013-03-19 StarDFX Technologies, Inc. Apparatus and method for protecting soft errors
US8489947B2 (en) * 2010-02-15 2013-07-16 Mentor Graphics Corporation Circuit and method for simultaneously measuring multiple changes in delay
US8555124B2 (en) * 2010-06-07 2013-10-08 Arm Limited Apparatus and method for detecting an approaching error condition
US8222943B2 (en) * 2010-09-22 2012-07-17 Freescale Semiconductor, Inc. Master-slave flip-flop with timing error correction

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