JP2006527923A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2006527923A5 JP2006527923A5 JP2006517174A JP2006517174A JP2006527923A5 JP 2006527923 A5 JP2006527923 A5 JP 2006527923A5 JP 2006517174 A JP2006517174 A JP 2006517174A JP 2006517174 A JP2006517174 A JP 2006517174A JP 2006527923 A5 JP2006527923 A5 JP 2006527923A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- polishing
- polishing pad
- workpiece
- polymer resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims 91
- 239000002952 polymeric resin Substances 0.000 claims 17
- -1 polytetrafluoroethylene Polymers 0.000 claims 17
- 229920003002 synthetic resin Polymers 0.000 claims 17
- 229920000058 polyacrylate Polymers 0.000 claims 7
- 239000000463 material Substances 0.000 claims 6
- 239000004677 Nylon Substances 0.000 claims 5
- 239000004642 Polyimide Substances 0.000 claims 5
- 239000004793 Polystyrene Substances 0.000 claims 5
- 239000004372 Polyvinyl alcohol Substances 0.000 claims 5
- 239000004433 Thermoplastic polyurethane Substances 0.000 claims 5
- 229920001577 copolymer Polymers 0.000 claims 5
- 239000000203 mixture Substances 0.000 claims 5
- 229920001778 nylon Polymers 0.000 claims 5
- 229920000412 polyarylene Polymers 0.000 claims 5
- 229920000515 polycarbonate Polymers 0.000 claims 5
- 239000004417 polycarbonate Substances 0.000 claims 5
- 229920000139 polyethylene terephthalate Polymers 0.000 claims 5
- 239000005020 polyethylene terephthalate Substances 0.000 claims 5
- 229920001721 polyimide Polymers 0.000 claims 5
- 229920000098 polyolefin Polymers 0.000 claims 5
- 229920002223 polystyrene Polymers 0.000 claims 5
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims 5
- 239000004810 polytetrafluoroethylene Substances 0.000 claims 5
- 229920002451 polyvinyl alcohol Polymers 0.000 claims 5
- 229920002803 thermoplastic polyurethane Polymers 0.000 claims 5
- 239000000853 adhesive Substances 0.000 claims 4
- 230000001070 adhesive effect Effects 0.000 claims 4
- 229920003229 poly(methyl methacrylate) Polymers 0.000 claims 4
- 239000004926 polymethyl methacrylate Substances 0.000 claims 4
- 239000004698 Polyethylene Substances 0.000 claims 3
- 230000005540 biological transmission Effects 0.000 claims 3
- 229920001971 elastomer Polymers 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
- 229920000573 polyethylene Polymers 0.000 claims 3
- 229920002635 polyurethane Polymers 0.000 claims 3
- 239000004814 polyurethane Substances 0.000 claims 3
- 229920002725 thermoplastic elastomer Polymers 0.000 claims 3
- 229920001187 thermosetting polymer Polymers 0.000 claims 3
- 239000004634 thermosetting polymer Substances 0.000 claims 3
- 229920002845 Poly(methacrylic acid) Polymers 0.000 claims 1
- 229920003235 aromatic polyamide Polymers 0.000 claims 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/463,680 | 2003-06-17 | ||
| US10/463,680 US6884156B2 (en) | 2003-06-17 | 2003-06-17 | Multi-layer polishing pad material for CMP |
| PCT/US2004/017564 WO2005000527A2 (en) | 2003-06-17 | 2004-06-03 | Multi-layer polishing pad material for cmp |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006527923A JP2006527923A (ja) | 2006-12-07 |
| JP2006527923A5 true JP2006527923A5 (enExample) | 2007-07-05 |
| JP5090732B2 JP5090732B2 (ja) | 2012-12-05 |
Family
ID=33517127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006517174A Expired - Fee Related JP5090732B2 (ja) | 2003-06-17 | 2004-06-03 | Cmp用多層研磨パッド材料 |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US6884156B2 (enExample) |
| EP (2) | EP2025469B1 (enExample) |
| JP (1) | JP5090732B2 (enExample) |
| KR (1) | KR101109367B1 (enExample) |
| CN (1) | CN100591483C (enExample) |
| AT (1) | ATE416881T1 (enExample) |
| DE (1) | DE602004018321D1 (enExample) |
| MY (1) | MY134466A (enExample) |
| SG (1) | SG149719A1 (enExample) |
| TW (1) | TWI295949B (enExample) |
| WO (1) | WO2005000527A2 (enExample) |
Families Citing this family (90)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100465649B1 (ko) * | 2002-09-17 | 2005-01-13 | 한국포리올 주식회사 | 일체형 연마 패드 및 그 제조 방법 |
| JP2004303983A (ja) * | 2003-03-31 | 2004-10-28 | Fuji Photo Film Co Ltd | 研磨パッド |
| EP1466699A1 (en) * | 2003-04-09 | 2004-10-13 | JSR Corporation | Abrasive pad, method and metal mold for manufacturing the same, and semiconductor wafer polishing method |
| US20040209066A1 (en) * | 2003-04-17 | 2004-10-21 | Swisher Robert G. | Polishing pad with window for planarization |
| KR100541545B1 (ko) * | 2003-06-16 | 2006-01-11 | 삼성전자주식회사 | 화학기계적 연마 장비의 연마 테이블 |
| US7435161B2 (en) * | 2003-06-17 | 2008-10-14 | Cabot Microelectronics Corporation | Multi-layer polishing pad material for CMP |
| JP2005007520A (ja) * | 2003-06-19 | 2005-01-13 | Nihon Micro Coating Co Ltd | 研磨パッド及びその製造方法並びに研磨方法 |
| US20040259479A1 (en) * | 2003-06-23 | 2004-12-23 | Cabot Microelectronics Corporation | Polishing pad for electrochemical-mechanical polishing |
| US7654885B2 (en) * | 2003-10-03 | 2010-02-02 | Applied Materials, Inc. | Multi-layer polishing pad |
| US8066552B2 (en) * | 2003-10-03 | 2011-11-29 | Applied Materials, Inc. | Multi-layer polishing pad for low-pressure polishing |
| US6951803B2 (en) * | 2004-02-26 | 2005-10-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method to prevent passivation layer peeling in a solder bump formation process |
| US7059936B2 (en) * | 2004-03-23 | 2006-06-13 | Cabot Microelectronics Corporation | Low surface energy CMP pad |
| US7204742B2 (en) * | 2004-03-25 | 2007-04-17 | Cabot Microelectronics Corporation | Polishing pad comprising hydrophobic region and endpoint detection port |
| CN100424830C (zh) * | 2004-04-23 | 2008-10-08 | Jsr株式会社 | 用于抛光半导体晶片的抛光垫、层叠体和方法 |
| US7252871B2 (en) * | 2004-06-16 | 2007-08-07 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad having a pressure relief channel |
| US7189156B2 (en) * | 2004-08-25 | 2007-03-13 | Jh Rhodes Company, Inc. | Stacked polyurethane polishing pad and method of producing the same |
| US20060089095A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US20060089094A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US20060089093A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| JP2006346805A (ja) * | 2005-06-15 | 2006-12-28 | Toyo Tire & Rubber Co Ltd | 積層研磨パッド |
| TWI378844B (en) * | 2005-08-18 | 2012-12-11 | Rohm & Haas Elect Mat | Polishing pad and method of manufacture |
| TW200709892A (en) * | 2005-08-18 | 2007-03-16 | Rohm & Haas Elect Mat | Transparent polishing pad |
| US20070111644A1 (en) * | 2005-09-27 | 2007-05-17 | Spencer Preston | Thick perforated polishing pad and method for making same |
| JP2007307885A (ja) * | 2005-11-04 | 2007-11-29 | Ricoh Co Ltd | 画像処理方法、記録物、プログラム、画像処理装置、画像形成装置及び画像形成システム、画像形成方法及びインク |
| KR100741984B1 (ko) * | 2006-02-17 | 2007-07-23 | 삼성전자주식회사 | 화학기계적 연마 장치의 연마 패드 및 그의 제조방법 |
| US20070212979A1 (en) * | 2006-03-09 | 2007-09-13 | Rimpad Tech Ltd. | Composite polishing pad |
| JP5033356B2 (ja) * | 2006-05-31 | 2012-09-26 | ニッタ・ハース株式会社 | 研磨パッド |
| JP5022635B2 (ja) * | 2006-05-31 | 2012-09-12 | ニッタ・ハース株式会社 | 研磨パッド |
| JP5033357B2 (ja) * | 2006-05-31 | 2012-09-26 | ニッタ・ハース株式会社 | 研磨パッド |
| JP5371251B2 (ja) * | 2007-01-30 | 2013-12-18 | 東レ株式会社 | 研磨パッド |
| JP2008221367A (ja) * | 2007-03-09 | 2008-09-25 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
| US8087975B2 (en) * | 2007-04-30 | 2012-01-03 | San Fang Chemical Industry Co., Ltd. | Composite sheet for mounting a workpiece and the method for making the same |
| US20080274674A1 (en) * | 2007-05-03 | 2008-11-06 | Cabot Microelectronics Corporation | Stacked polishing pad for high temperature applications |
| TWI411495B (zh) * | 2007-08-16 | 2013-10-11 | Cabot Microelectronics Corp | 拋光墊 |
| JP5078527B2 (ja) * | 2007-09-28 | 2012-11-21 | 富士紡ホールディングス株式会社 | 研磨布 |
| US8491360B2 (en) * | 2007-10-26 | 2013-07-23 | Innopad, Inc. | Three-dimensional network in CMP pad |
| US20110143539A1 (en) * | 2008-05-15 | 2011-06-16 | Rajeev Bajaj | Polishing pad with endpoint window and systems and methods using the same |
| WO2009139401A1 (ja) * | 2008-05-16 | 2009-11-19 | 東レ株式会社 | 研磨パッド |
| US7645186B1 (en) * | 2008-07-18 | 2010-01-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad manufacturing assembly |
| US7820005B2 (en) * | 2008-07-18 | 2010-10-26 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multilayer chemical mechanical polishing pad manufacturing process |
| JP5222070B2 (ja) * | 2008-09-17 | 2013-06-26 | 富士紡ホールディングス株式会社 | 研磨パッド |
| US8083570B2 (en) * | 2008-10-17 | 2011-12-27 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad having sealed window |
| TWI465315B (zh) * | 2008-11-12 | 2014-12-21 | Bestac Advanced Material Co Ltd | 可導電之拋光墊及其製造方法 |
| TWI370758B (en) * | 2008-12-15 | 2012-08-21 | Bestac Advanced Material Co Ltd | Method for making polishing pad |
| US8192249B2 (en) * | 2009-03-12 | 2012-06-05 | Hitachi Global Storage Technologies Netherlands, B.V. | Systems and methods for polishing a magnetic disk |
| TWM367052U (en) | 2009-04-24 | 2009-10-21 | Bestac Advanced Material Co Ltd | Polishing pad and polishing device |
| KR101352235B1 (ko) | 2009-05-27 | 2014-01-15 | 로저스코포레이션 | 연마 패드, 이를 위한 폴리우레탄층, 및 규소 웨이퍼의 연마 방법 |
| DE102009030297B3 (de) * | 2009-06-24 | 2011-01-20 | Siltronic Ag | Verfahren zum Polieren einer Halbleiterscheibe |
| US9017140B2 (en) | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
| TWI510328B (zh) * | 2010-05-03 | 2015-12-01 | Iv Technologies Co Ltd | 基底層、包括此基底層的研磨墊及研磨方法 |
| US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| TWI481470B (zh) * | 2010-10-13 | 2015-04-21 | San Fang Chemical Industry Co | 吸附墊片及其製造方法 |
| US8357446B2 (en) * | 2010-11-12 | 2013-01-22 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Hollow polymeric-silicate composite |
| WO2012068428A2 (en) * | 2010-11-18 | 2012-05-24 | Cabot Microelectronics Corporation | Polishing pad comprising transmissive region |
| US20120302148A1 (en) | 2011-05-23 | 2012-11-29 | Rajeev Bajaj | Polishing pad with homogeneous body having discrete protrusions thereon |
| DE102011114750A1 (de) | 2011-09-29 | 2013-04-04 | Giesecke & Devrient Gmbh | Verfahren zur Herstellung eines Mikrostrukturträgers |
| DE102011115125B4 (de) | 2011-10-07 | 2021-10-07 | Giesecke+Devrient Currency Technology Gmbh | Herstellung einer mikrooptischen Darstellungsanordnung |
| US9067298B2 (en) | 2011-11-29 | 2015-06-30 | Nexplanar Corporation | Polishing pad with grooved foundation layer and polishing surface layer |
| US9067297B2 (en) | 2011-11-29 | 2015-06-30 | Nexplanar Corporation | Polishing pad with foundation layer and polishing surface layer |
| SG10201508090WA (en) * | 2011-11-29 | 2015-10-29 | Nexplanar Corp | Polishing pad with foundation layer and polishing surface layer |
| JP5893413B2 (ja) * | 2012-01-17 | 2016-03-23 | 東洋ゴム工業株式会社 | 積層研磨パッドの製造方法 |
| US10722997B2 (en) | 2012-04-02 | 2020-07-28 | Thomas West, Inc. | Multilayer polishing pads made by the methods for centrifugal casting of polymer polish pads |
| US10022842B2 (en) * | 2012-04-02 | 2018-07-17 | Thomas West, Inc. | Method and systems to control optical transmissivity of a polish pad material |
| US11090778B2 (en) | 2012-04-02 | 2021-08-17 | Thomas West, Inc. | Methods and systems for centrifugal casting of polymer polish pads and polishing pads made by the methods |
| US9156125B2 (en) | 2012-04-11 | 2015-10-13 | Cabot Microelectronics Corporation | Polishing pad with light-stable light-transmitting region |
| US9597769B2 (en) * | 2012-06-04 | 2017-03-21 | Nexplanar Corporation | Polishing pad with polishing surface layer having an aperture or opening above a transparent foundation layer |
| JP2014113644A (ja) * | 2012-12-06 | 2014-06-26 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
| US9186772B2 (en) | 2013-03-07 | 2015-11-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with broad spectrum, endpoint detection window and method of polishing therewith |
| SG11201601175WA (en) * | 2013-08-22 | 2016-03-30 | Cabot Microelectronics Corp | Polishing pad with porous interface and solid core, and related apparatus and methods |
| TWI556910B (zh) | 2013-10-01 | 2016-11-11 | 三芳化學工業股份有限公司 | 複合硏磨墊及其製造方法 |
| SG11201606734RA (en) * | 2014-02-20 | 2016-09-29 | Thomas West Inc | Method and systems to control optical transmissivity of a polish pad material |
| WO2015171419A1 (en) | 2014-05-07 | 2015-11-12 | Cabot Microelectronics Corporation | Multi-layer polishing pad for cmp |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| CN107078048B (zh) | 2014-10-17 | 2021-08-13 | 应用材料公司 | 使用加成制造工艺的具复合材料特性的cmp衬垫建构 |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| KR102640690B1 (ko) * | 2015-09-25 | 2024-02-23 | 씨엠씨 머티리얼즈 엘엘씨 | 높은 탄성률 비를 갖는 폴리우레탄 화학 기계적 연마 패드 |
| CN105364731B (zh) * | 2015-09-28 | 2020-11-03 | 沈阳市盛世磨料磨具有限公司 | 一种重负荷砂轮的加工方法 |
| WO2017066077A1 (en) * | 2015-10-16 | 2017-04-20 | Applied Materials, Inc. | Method and apparatus for forming advanced polishing pads using an additive manufacturing process |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| US10213894B2 (en) * | 2016-02-26 | 2019-02-26 | Applied Materials, Inc. | Method of placing window in thin polishing pad |
| DE102016222063A1 (de) * | 2016-11-10 | 2018-05-17 | Siltronic Ag | Verfahren zum beidseitigen Polieren einer Halbleiterscheibe |
| US11072050B2 (en) * | 2017-08-04 | 2021-07-27 | Applied Materials, Inc. | Polishing pad with window and manufacturing methods thereof |
| KR101924566B1 (ko) * | 2017-09-04 | 2018-12-03 | 에스케이씨 주식회사 | 고단차 제거용 다층 연마패드 |
| KR102718259B1 (ko) * | 2019-07-23 | 2024-10-16 | 케이피엑스케미칼 주식회사 | 탄성 패드 및 그 제조 방법 |
| JP7105334B2 (ja) * | 2020-03-17 | 2022-07-22 | エスケーシー ソルミックス カンパニー,リミテッド | 研磨パッドおよびこれを用いた半導体素子の製造方法 |
| CN117677465A (zh) * | 2021-07-06 | 2024-03-08 | 应用材料公司 | 用于化学机械抛光的包含声学窗口的抛光垫 |
| TR2021017346A2 (tr) | 2021-11-08 | 2021-11-22 | T C Erciyes Ueniversitesi | Rezonans hasarlarini önleyen, öngeri̇lmesi̇z ve etri̇yesi̇z, yekpare, sürdürülebi̇li̇r beton travers |
| CN117381657B (zh) * | 2023-10-30 | 2025-10-17 | 安徽禾臣新材料有限公司 | 一种高孔隙率高模量抛光层的抛光垫及其制备方法 |
| CN118650542A (zh) * | 2024-06-03 | 2024-09-17 | 陈湛 | 一种碳化硅抛光的方法 |
Family Cites Families (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3504457A (en) | 1966-07-05 | 1970-04-07 | Geoscience Instr Corp | Polishing apparatus |
| US3581439A (en) | 1968-04-04 | 1971-06-01 | Geoscience Instr Corp | Buff apparatus and method of manufacturing buffs |
| US5257478A (en) | 1990-03-22 | 1993-11-02 | Rodel, Inc. | Apparatus for interlayer planarization of semiconductor material |
| US5196353A (en) | 1992-01-03 | 1993-03-23 | Micron Technology, Inc. | Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer |
| US6614529B1 (en) | 1992-12-28 | 2003-09-02 | Applied Materials, Inc. | In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
| US5658183A (en) | 1993-08-25 | 1997-08-19 | Micron Technology, Inc. | System for real-time control of semiconductor wafer polishing including optical monitoring |
| US5433651A (en) | 1993-12-22 | 1995-07-18 | International Business Machines Corporation | In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
| JP3270282B2 (ja) | 1994-02-21 | 2002-04-02 | 株式会社東芝 | 半導体製造装置及び半導体装置の製造方法 |
| US5489233A (en) | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| JP3313505B2 (ja) | 1994-04-14 | 2002-08-12 | 株式会社日立製作所 | 研磨加工法 |
| US5964643A (en) | 1995-03-28 | 1999-10-12 | Applied Materials, Inc. | Apparatus and method for in-situ monitoring of chemical mechanical polishing operations |
| US5893796A (en) | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| US5838447A (en) | 1995-07-20 | 1998-11-17 | Ebara Corporation | Polishing apparatus including thickness or flatness detector |
| US5605760A (en) | 1995-08-21 | 1997-02-25 | Rodel, Inc. | Polishing pads |
| US5910846A (en) * | 1996-05-16 | 1999-06-08 | Micron Technology, Inc. | Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
| US5872633A (en) | 1996-07-26 | 1999-02-16 | Speedfam Corporation | Methods and apparatus for detecting removal of thin film layers during planarization |
| US5692950A (en) | 1996-08-08 | 1997-12-02 | Minnesota Mining And Manufacturing Company | Abrasive construction for semiconductor wafer modification |
| US6475253B2 (en) * | 1996-09-11 | 2002-11-05 | 3M Innovative Properties Company | Abrasive article and method of making |
| US6328642B1 (en) * | 1997-02-14 | 2001-12-11 | Lam Research Corporation | Integrated pad and belt for chemical mechanical polishing |
| US6287185B1 (en) | 1997-04-04 | 2001-09-11 | Rodel Holdings Inc. | Polishing pads and methods relating thereto |
| ES2187960T3 (es) * | 1997-04-18 | 2003-06-16 | Cabot Microelectronics Corp | Tampon para pulir para un sustrato semiconductor. |
| US6108091A (en) * | 1997-05-28 | 2000-08-22 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing |
| US6117000A (en) * | 1998-07-10 | 2000-09-12 | Cabot Corporation | Polishing pad for a semiconductor substrate |
| JP2000071167A (ja) * | 1998-08-28 | 2000-03-07 | Toray Ind Inc | 研磨パッド |
| US6908374B2 (en) * | 1998-12-01 | 2005-06-21 | Nutool, Inc. | Chemical mechanical polishing endpoint detection |
| US6354915B1 (en) * | 1999-01-21 | 2002-03-12 | Rodel Holdings Inc. | Polishing pads and methods relating thereto |
| US6089963A (en) | 1999-03-18 | 2000-07-18 | Inland Diamond Products Company | Attachment system for lens surfacing pad |
| EP1176630B1 (en) * | 1999-03-31 | 2007-06-27 | Nikon Corporation | Polishing body, polisher, method for adjusting polisher, method for measuring thickness of polished film or end point of polishing, method for producing semiconductor device |
| US6224460B1 (en) * | 1999-06-30 | 2001-05-01 | Vlsi Technology, Inc. | Laser interferometry endpoint detection with windowless polishing pad for chemical mechanical polishing process |
| US6171181B1 (en) | 1999-08-17 | 2001-01-09 | Rodel Holdings, Inc. | Molded polishing pad having integral window |
| US6524164B1 (en) * | 1999-09-14 | 2003-02-25 | Applied Materials, Inc. | Polishing pad with transparent window having reduced window leakage for a chemical mechanical polishing apparatus |
| DE60011798T2 (de) * | 1999-09-29 | 2005-11-10 | Rohm and Haas Electronic Materials CMP Holdings, Inc., Wilmington | Schleifkissen |
| JP2001162510A (ja) * | 1999-09-30 | 2001-06-19 | Hoya Corp | 研磨方法並びに磁気記録媒体用ガラス基板の製造方法及び磁気記録媒体の製造方法 |
| US6626740B2 (en) * | 1999-12-23 | 2003-09-30 | Rodel Holdings, Inc. | Self-leveling pads and methods relating thereto |
| DE10004578C1 (de) * | 2000-02-03 | 2001-07-26 | Wacker Siltronic Halbleitermat | Verfahren zur Herstellung einer Halbleiterscheibe mit polierter Kante |
| JP2001319901A (ja) * | 2000-05-08 | 2001-11-16 | Nikon Corp | 研磨パッド、化学機械研磨装置、基板表面の平坦化方法、及び半導体デバイス製造方法 |
| US6428386B1 (en) | 2000-06-16 | 2002-08-06 | Micron Technology, Inc. | Planarizing pads, planarizing machines, and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies |
| JP2002001647A (ja) * | 2000-06-19 | 2002-01-08 | Rodel Nitta Co | 研磨パッド |
| JP3788729B2 (ja) * | 2000-08-23 | 2006-06-21 | 東洋ゴム工業株式会社 | 研磨パッド |
| JP2002124496A (ja) * | 2000-10-18 | 2002-04-26 | Hitachi Ltd | 研磨加工の終点検出計測方法及びその装置、並びにそれを用いた半導体デバイスの製造方法及びその製造装置 |
| JP2002170799A (ja) * | 2000-11-30 | 2002-06-14 | Nikon Corp | 測定装置、研磨状況モニタ装置、研磨装置、半導体デバイス製造方法、並びに半導体デバイス |
| JP2002178257A (ja) * | 2000-12-12 | 2002-06-25 | Nikon Corp | 研磨面観測装置及び研磨装置 |
| US6632129B2 (en) | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
| US6544107B2 (en) * | 2001-02-16 | 2003-04-08 | Agere Systems Inc. | Composite polishing pads for chemical-mechanical polishing |
| JP2003133270A (ja) * | 2001-10-26 | 2003-05-09 | Jsr Corp | 化学機械研磨用窓材及び研磨パッド |
| US6722249B2 (en) * | 2001-11-06 | 2004-04-20 | Rodel Holdings, Inc | Method of fabricating a polishing pad having an optical window |
| JP2003220550A (ja) * | 2002-01-24 | 2003-08-05 | Sumitomo Bakelite Co Ltd | 研磨用パッドおよびその製造方法 |
| US6524176B1 (en) * | 2002-03-25 | 2003-02-25 | Macronix International Co. Ltd. | Polishing pad |
| US6913517B2 (en) * | 2002-05-23 | 2005-07-05 | Cabot Microelectronics Corporation | Microporous polishing pads |
| KR100465649B1 (ko) * | 2002-09-17 | 2005-01-13 | 한국포리올 주식회사 | 일체형 연마 패드 및 그 제조 방법 |
| JP2005001083A (ja) * | 2003-06-13 | 2005-01-06 | Sumitomo Bakelite Co Ltd | 研磨用積層体および研磨方法 |
-
2003
- 2003-06-17 US US10/463,680 patent/US6884156B2/en not_active Expired - Lifetime
-
2004
- 2004-06-03 SG SG200705357-2A patent/SG149719A1/en unknown
- 2004-06-03 EP EP08017326.3A patent/EP2025469B1/en not_active Expired - Lifetime
- 2004-06-03 AT AT04776265T patent/ATE416881T1/de active
- 2004-06-03 JP JP2006517174A patent/JP5090732B2/ja not_active Expired - Fee Related
- 2004-06-03 EP EP04776265A patent/EP1651388B1/en not_active Expired - Lifetime
- 2004-06-03 DE DE602004018321T patent/DE602004018321D1/de not_active Expired - Lifetime
- 2004-06-03 WO PCT/US2004/017564 patent/WO2005000527A2/en not_active Ceased
- 2004-06-03 CN CN200480016709A patent/CN100591483C/zh not_active Expired - Lifetime
- 2004-06-03 KR KR1020057024127A patent/KR101109367B1/ko not_active Expired - Lifetime
- 2004-06-04 TW TW093116204A patent/TWI295949B/zh not_active IP Right Cessation
- 2004-06-15 MY MYPI20042300A patent/MY134466A/en unknown
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2006527923A5 (enExample) | ||
| TWI295949B (en) | Multi-layer polishing pad material for cmp | |
| JP2008544868A5 (enExample) | ||
| US5692950A (en) | Abrasive construction for semiconductor wafer modification | |
| JP2005534979A5 (enExample) | ||
| JP2001505489A5 (enExample) | ||
| EP1418197A4 (en) | BIAXIALLY ORIENTED LAYERED POLYESTER FOIL AND FILM WITH HARD COATING LAYER | |
| WO2006115924A1 (en) | Multi-layer polishing pad material for cmp | |
| ATE551721T1 (de) | Mehrschichtige folie zum schleifen einer halbleiterscheibenrückseite | |
| JP2003188124A (ja) | 研磨布 | |
| KR920703347A (ko) | 열 이미징 매체용 경화성 접착층 | |
| CN205342781U (zh) | 晶片抛光用抛光垫 | |
| US8087975B2 (en) | Composite sheet for mounting a workpiece and the method for making the same | |
| US20100146863A1 (en) | Polishing pad having insulation layer and method for making the same | |
| KR102440303B1 (ko) | Cmp용 다층 연마 패드 | |
| JP2017514718A5 (enExample) | ||
| JP2008036798A (ja) | 被加工物保持材およびその製造方法 | |
| TW201628783A (zh) | 研磨墊 | |
| JP3177463U (ja) | 水洗いで繰返し接着、取外し可能なゴムシート | |
| JPS62297064A (ja) | 半導体等のウエ−ハ保持用積層体 | |
| JP7193221B2 (ja) | 研磨パッド及びその製造方法、並びに、研磨加工品の製造方法 | |
| US9889630B2 (en) | Polishing equipment having discontinuous adhesion points and method for making the sheet | |
| CN1419694A (zh) | 制造单层盘片形成的光盘的方法、粘结剂片元件、卷绕元件 | |
| TWI647065B (zh) | 研磨墊及其製造方法以及研磨方法 | |
| CN105500186A (zh) | 晶片抛光用抛光垫及抛光垫的自吸附方法 |