JP2003528459A - 半導体接触器を平坦化するための方法と装置 - Google Patents

半導体接触器を平坦化するための方法と装置

Info

Publication number
JP2003528459A
JP2003528459A JP2001569861A JP2001569861A JP2003528459A JP 2003528459 A JP2003528459 A JP 2003528459A JP 2001569861 A JP2001569861 A JP 2001569861A JP 2001569861 A JP2001569861 A JP 2001569861A JP 2003528459 A JP2003528459 A JP 2003528459A
Authority
JP
Japan
Prior art keywords
substrate
probe card
card assembly
assembly
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001569861A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003528459A5 (enExample
Inventor
マシュー，ゲータン，エル
エルドリッジ，ベンジャミン，エヌ
グルーブ，ゲーリー，ダブリュー
Original Assignee
フォームファクター，インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27062552&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2003528459(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from US09/528,064 external-priority patent/US6509751B1/en
Application filed by フォームファクター，インコーポレイテッド filed Critical フォームファクター，インコーポレイテッド
Publication of JP2003528459A publication Critical patent/JP2003528459A/ja
Publication of JP2003528459A5 publication Critical patent/JP2003528459A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2001569861A 2000-03-17 2001-03-16 半導体接触器を平坦化するための方法と装置 Pending JP2003528459A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US52793100A 2000-03-17 2000-03-17
US09/528,064 US6509751B1 (en) 2000-03-17 2000-03-17 Planarizer for a semiconductor contactor
US09/527,931 2000-03-17
US09/528,064 2000-03-17
PCT/US2001/008746 WO2001071779A2 (en) 2000-03-17 2001-03-16 Method and apparatus for planarizing a semiconductor contactor

Related Child Applications (3)

Application Number Title Priority Date Filing Date
JP2004353370A Division JP2005164601A (ja) 2000-03-17 2004-12-06 半導体接触器を平坦化するための方法と装置
JP2004353354A Division JP2005164600A (ja) 2000-03-17 2004-12-06 半導体接触器を平坦化するための方法と装置
JP2006223552A Division JP2006343350A (ja) 2000-03-17 2006-08-18 半導体接触器を平坦化するための方法と装置

Publications (2)

Publication Number Publication Date
JP2003528459A true JP2003528459A (ja) 2003-09-24
JP2003528459A5 JP2003528459A5 (enExample) 2005-04-14

Family

ID=27062552

Family Applications (4)

Application Number Title Priority Date Filing Date
JP2001569861A Pending JP2003528459A (ja) 2000-03-17 2001-03-16 半導体接触器を平坦化するための方法と装置
JP2004353354A Pending JP2005164600A (ja) 2000-03-17 2004-12-06 半導体接触器を平坦化するための方法と装置
JP2004353370A Pending JP2005164601A (ja) 2000-03-17 2004-12-06 半導体接触器を平坦化するための方法と装置
JP2006223552A Pending JP2006343350A (ja) 2000-03-17 2006-08-18 半導体接触器を平坦化するための方法と装置

Family Applications After (3)

Application Number Title Priority Date Filing Date
JP2004353354A Pending JP2005164600A (ja) 2000-03-17 2004-12-06 半導体接触器を平坦化するための方法と装置
JP2004353370A Pending JP2005164601A (ja) 2000-03-17 2004-12-06 半導体接触器を平坦化するための方法と装置
JP2006223552A Pending JP2006343350A (ja) 2000-03-17 2006-08-18 半導体接触器を平坦化するための方法と装置

Country Status (7)

Country Link
EP (1) EP1266230B1 (enExample)
JP (4) JP2003528459A (enExample)
KR (1) KR100459050B1 (enExample)
AU (1) AU2001250876A1 (enExample)
DE (1) DE60142030D1 (enExample)
TW (2) TW588400B (enExample)
WO (1) WO2001071779A2 (enExample)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005164601A (ja) * 2000-03-17 2005-06-23 Formfactor Inc 半導体接触器を平坦化するための方法と装置
JP2005338061A (ja) * 2004-05-28 2005-12-08 Feinmetall Gmbh 検査品の電気的検査のための検査装置
JPWO2005083773A1 (ja) * 2004-02-27 2007-08-30 株式会社アドバンテスト プローブカード及びその製造方法
JP2008539394A (ja) * 2005-04-19 2008-11-13 フォームファクター， インコーポレイテッド プローブカードアセンブリの熱により誘起される運動に対処するための装置と方法
JP2009527728A (ja) * 2005-12-02 2009-07-30 フォームファクター， インコーポレイテッド プローブの配向を調整する装置および方法
US7586316B2 (en) 2007-03-05 2009-09-08 Kabushiki Kaisha Nihon Micronics Probe board mounting apparatus
DE112007003211T5 (de) 2007-03-20 2009-11-12 Kabushiki Kaisha Nihon Micronics Elektrische Verbindungsvorrichtung
DE112005003731B4 (de) 2005-10-24 2013-04-18 Kabushiki Kaisha Nihon Micronics Verfahren zur Montage einer elektrischen Verbindungsvorrichtung
DE112005003580B4 (de) * 2005-05-23 2013-05-16 Kabushiki Kaisha Nihon Micronics Sondenanordnung, Verfahren zu ihrer Herstellung und elektrische Verbindungsvorrichtung
KR20230127344A (ko) 2021-02-24 2023-08-31 주식회사 아도반테스토 반도체 웨이퍼 시험 장치, 반도체 웨이퍼 시험 시스템,평탄도 측정 장치 및 배선판의 평탄도 조정 방법
WO2024024492A1 (ja) * 2022-07-28 2024-02-01 株式会社日本マイクロニクス 電気的接続装置

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6911835B2 (en) 2002-05-08 2005-06-28 Formfactor, Inc. High performance probe system
US6965244B2 (en) 2002-05-08 2005-11-15 Formfactor, Inc. High performance probe system
JP3621938B2 (ja) 2002-08-09 2005-02-23 日本電子材料株式会社 プローブカード
US7071715B2 (en) 2004-01-16 2006-07-04 Formfactor, Inc. Probe card configuration for low mechanical flexural strength electrical routing substrates
JP4634867B2 (ja) 2005-06-03 2011-02-16 株式会社ミツトヨ 画像測定システム及び方法
US7471094B2 (en) * 2005-06-24 2008-12-30 Formfactor, Inc. Method and apparatus for adjusting a multi-substrate probe structure
JP4791473B2 (ja) 2005-08-02 2011-10-12 株式会社日本マイクロニクス 電気的接続装置
JP4642603B2 (ja) * 2005-08-25 2011-03-02 東京エレクトロン株式会社 プローブカード
JP4823667B2 (ja) 2005-12-05 2011-11-24 日本発條株式会社 プローブカード
WO2007066622A1 (ja) 2005-12-05 2007-06-14 Nhk Spring Co., Ltd. プローブカード
US7365553B2 (en) * 2005-12-22 2008-04-29 Touchdown Technologies, Inc. Probe card assembly
JP5426161B2 (ja) * 2006-06-08 2014-02-26 日本発條株式会社 プローブカード
KR100821996B1 (ko) * 2006-09-08 2008-04-15 윌테크놀러지(주) 평탄도 조절 가능한 프로브 유닛
JP2008134170A (ja) * 2006-11-29 2008-06-12 Micronics Japan Co Ltd 電気的接続装置
JP5190195B2 (ja) * 2006-11-29 2013-04-24 株式会社日本マイクロニクス 電気的接続装置
US8456184B2 (en) 2007-03-14 2013-06-04 Nhk Spring Co., Ltd. Probe card for a semiconductor wafer
KR101242004B1 (ko) 2007-03-19 2013-03-11 (주) 미코티엔 프로브 카드
KR100806736B1 (ko) * 2007-05-11 2008-02-27 주식회사 에이엠에스티 프로브 카드 및 그 제조방법
KR100911661B1 (ko) * 2007-07-11 2009-08-10 (주)엠투엔 평탄화 수단을 구비한 프로브 카드
WO2009011365A1 (ja) 2007-07-19 2009-01-22 Nhk Spring Co., Ltd. プローブカード
JP4941169B2 (ja) * 2007-08-15 2012-05-30 横河電機株式会社 プローブカード機構
JP5326240B2 (ja) * 2007-08-24 2013-10-30 富士通株式会社 プローブボードおよび電子デバイスの検査方法
CN101946183B (zh) 2008-02-29 2014-11-26 日本发条株式会社 配线基板及探针卡
US7923290B2 (en) * 2009-03-27 2011-04-12 Stats Chippac Ltd. Integrated circuit packaging system having dual sided connection and method of manufacture thereof
KR100954451B1 (ko) * 2009-06-19 2010-04-27 박영주 반도체 웨이퍼 테스트용 프로브 카드의 평탄화 장치 및 평탄화 장치의 평탄 조절체 인서트 적층방법
DE202009014987U1 (de) * 2009-10-28 2010-02-18 Feinmetall Gmbh Prüfvorrichtung zur elektrischen Prüfung von elektrischen Prüflingen
KR101108726B1 (ko) * 2010-01-26 2012-02-29 삼성전기주식회사 수평도 조절부재
KR101148635B1 (ko) * 2011-07-25 2012-05-25 삼성전기주식회사 프로브 카드
JPWO2013108759A1 (ja) 2012-01-18 2015-05-11 日本発條株式会社 スペーストランスフォーマおよびプローブカード
JP5991823B2 (ja) * 2012-02-14 2016-09-14 株式会社日本マイクロニクス 電気的接続装置及びその組立方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07109471B2 (ja) * 1986-12-23 1995-11-22 株式会社コパル ストロボ発光制御方式
JPH0680716B2 (ja) * 1990-10-11 1994-10-12 日本電子材料株式会社 プローブカードの位置決め機構
US5094536A (en) * 1990-11-05 1992-03-10 Litel Instruments Deformable wafer chuck
JP2802849B2 (ja) * 1992-03-16 1998-09-24 日立電子エンジニアリング株式会社 プローブカードの反り補正機構
DE69531996T2 (de) * 1994-11-15 2004-07-22 Formfactor, Inc., Livermore Elektrische kontaktstruktur aus flexiblem draht
JP2900240B2 (ja) * 1995-10-09 1999-06-02 日本電子材料株式会社 異方性導電シートの製造方法
JP2737774B2 (ja) * 1996-03-15 1998-04-08 日本電気株式会社 ウェハテスタ
JPH1031034A (ja) * 1996-07-17 1998-02-03 Denki Kagaku Kogyo Kk 平行度調整器付きプローブカード
JPH11163059A (ja) * 1997-11-25 1999-06-18 Yamamoto Isamu 集積回路用半導体薄板検査装置およびその検査方法
TW588400B (en) * 2000-03-17 2004-05-21 Formfactor Inc Apparatus for planarizing a semiconductor contactor

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006343350A (ja) * 2000-03-17 2006-12-21 Formfactor Inc 半導体接触器を平坦化するための方法と装置
JP2005164601A (ja) * 2000-03-17 2005-06-23 Formfactor Inc 半導体接触器を平坦化するための方法と装置
JPWO2005083773A1 (ja) * 2004-02-27 2007-08-30 株式会社アドバンテスト プローブカード及びその製造方法
JP2005338061A (ja) * 2004-05-28 2005-12-08 Feinmetall Gmbh 検査品の電気的検査のための検査装置
JP2008539394A (ja) * 2005-04-19 2008-11-13 フォームファクター， インコーポレイテッド プローブカードアセンブリの熱により誘起される運動に対処するための装置と方法
DE112005003580B4 (de) * 2005-05-23 2013-05-16 Kabushiki Kaisha Nihon Micronics Sondenanordnung, Verfahren zu ihrer Herstellung und elektrische Verbindungsvorrichtung
DE112005003731B4 (de) 2005-10-24 2013-04-18 Kabushiki Kaisha Nihon Micronics Verfahren zur Montage einer elektrischen Verbindungsvorrichtung
JP2009527728A (ja) * 2005-12-02 2009-07-30 フォームファクター， インコーポレイテッド プローブの配向を調整する装置および方法
US7586316B2 (en) 2007-03-05 2009-09-08 Kabushiki Kaisha Nihon Micronics Probe board mounting apparatus
US7859282B2 (en) 2007-03-20 2010-12-28 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
DE112007003211T9 (de) 2007-03-20 2010-03-25 Kabushiki Kaisha Nihon Micronics Elektrische Verbindungsvorrichtung
DE112007003211T5 (de) 2007-03-20 2009-11-12 Kabushiki Kaisha Nihon Micronics Elektrische Verbindungsvorrichtung
KR20230127344A (ko) 2021-02-24 2023-08-31 주식회사 아도반테스토 반도체 웨이퍼 시험 장치, 반도체 웨이퍼 시험 시스템,평탄도 측정 장치 및 배선판의 평탄도 조정 방법
WO2024024492A1 (ja) * 2022-07-28 2024-02-01 株式会社日本マイクロニクス 電気的接続装置

Also Published As

Publication number Publication date
EP1266230B1 (en) 2010-05-05
TW588400B (en) 2004-05-21
JP2005164601A (ja) 2005-06-23
KR100459050B1 (ko) 2004-12-03
TW588404B (en) 2004-05-21
DE60142030D1 (de) 2010-06-17
WO2001071779A2 (en) 2001-09-27
WO2001071779A3 (en) 2002-03-14
JP2006343350A (ja) 2006-12-21
EP1266230A2 (en) 2002-12-18
JP2005164600A (ja) 2005-06-23
AU2001250876A1 (en) 2001-10-03
KR20020095151A (ko) 2002-12-20

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