AU2001250876A1 - Method and apparatus for planarizing a semiconductor contactor - Google Patents

Method and apparatus for planarizing a semiconductor contactor

Info

Publication number
AU2001250876A1
AU2001250876A1 AU2001250876A AU5087601A AU2001250876A1 AU 2001250876 A1 AU2001250876 A1 AU 2001250876A1 AU 2001250876 A AU2001250876 A AU 2001250876A AU 5087601 A AU5087601 A AU 5087601A AU 2001250876 A1 AU2001250876 A1 AU 2001250876A1
Authority
AU
Australia
Prior art keywords
planarizing
semiconductor contactor
contactor
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001250876A
Other languages
English (en)
Inventor
Benjamin N Eldridge
Gary W Grube
Gaetan L Mathieu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FormFactor Inc
Original Assignee
FormFactor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27062552&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=AU2001250876(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from US09/528,064 external-priority patent/US6509751B1/en
Application filed by FormFactor Inc filed Critical FormFactor Inc
Publication of AU2001250876A1 publication Critical patent/AU2001250876A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AU2001250876A 2000-03-17 2001-03-16 Method and apparatus for planarizing a semiconductor contactor Abandoned AU2001250876A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US52793100A 2000-03-17 2000-03-17
US09528064 2000-03-17
US09527931 2000-03-17
US09/528,064 US6509751B1 (en) 2000-03-17 2000-03-17 Planarizer for a semiconductor contactor
PCT/US2001/008746 WO2001071779A2 (en) 2000-03-17 2001-03-16 Method and apparatus for planarizing a semiconductor contactor

Publications (1)

Publication Number Publication Date
AU2001250876A1 true AU2001250876A1 (en) 2001-10-03

Family

ID=27062552

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001250876A Abandoned AU2001250876A1 (en) 2000-03-17 2001-03-16 Method and apparatus for planarizing a semiconductor contactor

Country Status (7)

Country Link
EP (1) EP1266230B1 (enExample)
JP (4) JP2003528459A (enExample)
KR (1) KR100459050B1 (enExample)
AU (1) AU2001250876A1 (enExample)
DE (1) DE60142030D1 (enExample)
TW (2) TW588400B (enExample)
WO (1) WO2001071779A2 (enExample)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW588400B (en) * 2000-03-17 2004-05-21 Formfactor Inc Apparatus for planarizing a semiconductor contactor
US6911835B2 (en) * 2002-05-08 2005-06-28 Formfactor, Inc. High performance probe system
US6965244B2 (en) 2002-05-08 2005-11-15 Formfactor, Inc. High performance probe system
JP3621938B2 (ja) 2002-08-09 2005-02-23 日本電子材料株式会社 プローブカード
US7071715B2 (en) 2004-01-16 2006-07-04 Formfactor, Inc. Probe card configuration for low mechanical flexural strength electrical routing substrates
WO2005083773A1 (ja) * 2004-02-27 2005-09-09 Advantest Corporation プローブカード及びその製造方法
DE102004027887B4 (de) * 2004-05-28 2010-07-29 Feinmetall Gmbh Prüfeinrichtung zur elektrischen Prüfung eines Prüflings
US7285968B2 (en) * 2005-04-19 2007-10-23 Formfactor, Inc. Apparatus and method for managing thermally induced motion of a probe card assembly
WO2006126279A1 (ja) * 2005-05-23 2006-11-30 Kabushiki Kaisha Nihon Micronics プローブ組立体、その製造方法および電気的接続装置
JP4634867B2 (ja) 2005-06-03 2011-02-16 株式会社ミツトヨ 画像測定システム及び方法
US7471094B2 (en) * 2005-06-24 2008-12-30 Formfactor, Inc. Method and apparatus for adjusting a multi-substrate probe structure
JP4791473B2 (ja) 2005-08-02 2011-10-12 株式会社日本マイクロニクス 電気的接続装置
JP4642603B2 (ja) * 2005-08-25 2011-03-02 東京エレクトロン株式会社 プローブカード
JP4567063B2 (ja) 2005-10-24 2010-10-20 株式会社日本マイクロニクス 電気的接続装置の組み立て方法
US7671614B2 (en) * 2005-12-02 2010-03-02 Formfactor, Inc. Apparatus and method for adjusting an orientation of probes
JP4823667B2 (ja) 2005-12-05 2011-11-24 日本発條株式会社 プローブカード
CN101322035B (zh) 2005-12-05 2011-12-21 日本发条株式会社 探针卡
US7365553B2 (en) * 2005-12-22 2008-04-29 Touchdown Technologies, Inc. Probe card assembly
KR101025895B1 (ko) * 2006-06-08 2011-03-30 니혼 하츠쵸 가부시키가이샤 프로브 카드
KR100821996B1 (ko) * 2006-09-08 2008-04-15 윌테크놀러지(주) 평탄도 조절 가능한 프로브 유닛
JP2008134170A (ja) * 2006-11-29 2008-06-12 Micronics Japan Co Ltd 電気的接続装置
JP5190195B2 (ja) * 2006-11-29 2013-04-24 株式会社日本マイクロニクス 電気的接続装置
JP2008216060A (ja) 2007-03-05 2008-09-18 Micronics Japan Co Ltd 電気的接続装置
US8456184B2 (en) 2007-03-14 2013-06-04 Nhk Spring Co., Ltd. Probe card for a semiconductor wafer
KR101242004B1 (ko) 2007-03-19 2013-03-11 (주) 미코티엔 프로브 카드
WO2008114464A1 (ja) 2007-03-20 2008-09-25 Kabushiki Kaisha Nihon Micronics 電気的接続装置
KR100806736B1 (ko) * 2007-05-11 2008-02-27 주식회사 에이엠에스티 프로브 카드 및 그 제조방법
KR100911661B1 (ko) * 2007-07-11 2009-08-10 (주)엠투엔 평탄화 수단을 구비한 프로브 카드
WO2009011365A1 (ja) 2007-07-19 2009-01-22 Nhk Spring Co., Ltd. プローブカード
JP4941169B2 (ja) * 2007-08-15 2012-05-30 横河電機株式会社 プローブカード機構
JP5326240B2 (ja) * 2007-08-24 2013-10-30 富士通株式会社 プローブボードおよび電子デバイスの検査方法
JPWO2009107747A1 (ja) 2008-02-29 2011-07-07 日本発條株式会社 配線基板およびプローブカード
US7923290B2 (en) * 2009-03-27 2011-04-12 Stats Chippac Ltd. Integrated circuit packaging system having dual sided connection and method of manufacture thereof
KR100954451B1 (ko) * 2009-06-19 2010-04-27 박영주 반도체 웨이퍼 테스트용 프로브 카드의 평탄화 장치 및 평탄화 장치의 평탄 조절체 인서트 적층방법
DE202009014987U1 (de) * 2009-10-28 2010-02-18 Feinmetall Gmbh Prüfvorrichtung zur elektrischen Prüfung von elektrischen Prüflingen
KR101108726B1 (ko) * 2010-01-26 2012-02-29 삼성전기주식회사 수평도 조절부재
KR101148635B1 (ko) * 2011-07-25 2012-05-25 삼성전기주식회사 프로브 카드
WO2013108759A1 (ja) 2012-01-18 2013-07-25 日本発條株式会社 スペーストランスフォーマおよびプローブカード
JP5991823B2 (ja) * 2012-02-14 2016-09-14 株式会社日本マイクロニクス 電気的接続装置及びその組立方法
JP7618014B2 (ja) 2021-02-24 2025-01-20 株式会社アドバンテスト 半導体ウェハ試験装置、半導体ウェハ試験システム、平坦度測定装置、及び、配線板の平坦度の調整方法
JP2024017497A (ja) * 2022-07-28 2024-02-08 株式会社日本マイクロニクス 電気的接続装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07109471B2 (ja) * 1986-12-23 1995-11-22 株式会社コパル ストロボ発光制御方式
JPH0680716B2 (ja) * 1990-10-11 1994-10-12 日本電子材料株式会社 プローブカードの位置決め機構
US5094536A (en) * 1990-11-05 1992-03-10 Litel Instruments Deformable wafer chuck
JP2802849B2 (ja) * 1992-03-16 1998-09-24 日立電子エンジニアリング株式会社 プローブカードの反り補正機構
KR100394205B1 (ko) * 1994-11-15 2003-08-06 폼팩터, 인크. 시험된 반도체 장치 및 시험된 반도체 장치의 제조방법
JP2900240B2 (ja) * 1995-10-09 1999-06-02 日本電子材料株式会社 異方性導電シートの製造方法
JP2737774B2 (ja) * 1996-03-15 1998-04-08 日本電気株式会社 ウェハテスタ
JPH1031034A (ja) * 1996-07-17 1998-02-03 Denki Kagaku Kogyo Kk 平行度調整器付きプローブカード
JPH11163059A (ja) * 1997-11-25 1999-06-18 Yamamoto Isamu 集積回路用半導体薄板検査装置およびその検査方法
TW588400B (en) * 2000-03-17 2004-05-21 Formfactor Inc Apparatus for planarizing a semiconductor contactor

Also Published As

Publication number Publication date
JP2005164600A (ja) 2005-06-23
DE60142030D1 (de) 2010-06-17
WO2001071779A3 (en) 2002-03-14
KR100459050B1 (ko) 2004-12-03
JP2005164601A (ja) 2005-06-23
EP1266230B1 (en) 2010-05-05
KR20020095151A (ko) 2002-12-20
TW588404B (en) 2004-05-21
JP2003528459A (ja) 2003-09-24
EP1266230A2 (en) 2002-12-18
WO2001071779A2 (en) 2001-09-27
JP2006343350A (ja) 2006-12-21
TW588400B (en) 2004-05-21

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