|
US5930607A
(en)
*
|
1995-10-03 |
1999-07-27 |
Seiko Epson Corporation |
Method to prevent static destruction of an active element comprised in a liquid crystal display device
|
|
US6573195B1
(en)
*
|
1999-01-26 |
2003-06-03 |
Semiconductor Energy Laboratory Co., Ltd. |
Method for manufacturing a semiconductor device by performing a heat-treatment in a hydrogen atmosphere
|
|
US6858898B1
(en)
|
1999-03-23 |
2005-02-22 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device and method for manufacturing the same
|
|
US6461899B1
(en)
|
1999-04-30 |
2002-10-08 |
Semiconductor Energy Laboratory, Co., Ltd. |
Oxynitride laminate “blocking layer” for thin film semiconductor devices
|
|
US6653657B2
(en)
*
|
1999-12-10 |
2003-11-25 |
Semoconductor Energy Laboratory Co., Ltd. |
Semiconductor device and a method of manufacturing the same
|
|
JP3659103B2
(ja)
*
|
1999-12-28 |
2005-06-15 |
セイコーエプソン株式会社 |
電気光学装置、電気光学装置の駆動回路および駆動方法、電子機器
|
|
US6831299B2
(en)
*
|
2000-11-09 |
2004-12-14 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device
|
|
JP3436248B2
(ja)
*
|
2000-11-09 |
2003-08-11 |
日本電気株式会社 |
液晶表示装置及びその製造方法並びにcf基板
|
|
KR100962054B1
(ko)
*
|
2000-12-05 |
2010-06-08 |
가부시키가이샤 한도오따이 에네루기 켄큐쇼 |
반도체 장치 제조 방법
|
|
US6809023B2
(en)
*
|
2001-04-06 |
2004-10-26 |
Semiconductor Energy Laboratory Co., Ltd. |
Method of manufacturing semiconductor device having uniform crystal grains in a crystalline semiconductor film
|
|
JP2003221257A
(ja)
*
|
2002-01-31 |
2003-08-05 |
Nippon Sheet Glass Co Ltd |
透明薄膜の成形方法およびそれを備える透明基体
|
|
EP1333473A1
(en)
*
|
2002-01-31 |
2003-08-06 |
STMicroelectronics S.r.l. |
Interpoly dielectric manufacturing process for non volatile semiconductor memories
|
|
JP4165172B2
(ja)
*
|
2002-02-27 |
2008-10-15 |
セイコーエプソン株式会社 |
電気光学装置及び電子機器
|
|
US7358198B2
(en)
*
|
2002-03-08 |
2008-04-15 |
Kabushiki Kaisha Toshiba |
Semiconductor device and method for fabricating same
|
|
TWI288443B
(en)
*
|
2002-05-17 |
2007-10-11 |
Semiconductor Energy Lab |
SiN film, semiconductor device, and the manufacturing method thereof
|
|
JP2004071696A
(ja)
*
|
2002-08-02 |
2004-03-04 |
Semiconductor Energy Lab Co Ltd |
半導体装置及びその作製方法
|
|
KR100872494B1
(ko)
*
|
2002-12-31 |
2008-12-05 |
엘지디스플레이 주식회사 |
액정 표시 장치용 어레이 기판의 제조 방법
|
|
US7071519B2
(en)
*
|
2003-01-08 |
2006-07-04 |
Texas Instruments Incorporated |
Control of high-k gate dielectric film composition profile for property optimization
|
|
JP2004296963A
(ja)
|
2003-03-28 |
2004-10-21 |
Semiconductor Energy Lab Co Ltd |
半導体装置及び半導体装置の作製方法
|
|
US7520790B2
(en)
|
2003-09-19 |
2009-04-21 |
Semiconductor Energy Laboratory Co., Ltd. |
Display device and manufacturing method of display device
|
|
JP4823478B2
(ja)
*
|
2003-09-19 |
2011-11-24 |
株式会社半導体エネルギー研究所 |
発光装置の作製方法
|
|
TWI220240B
(en)
*
|
2003-09-30 |
2004-08-11 |
Au Optronics Corp |
Full-color organic electroluminescent device (OLED) display and method of fabricating the same
|
|
CN100499035C
(zh)
*
|
2003-10-03 |
2009-06-10 |
株式会社半导体能源研究所 |
半导体器件的制造方法
|
|
EP1524685B1
(en)
*
|
2003-10-17 |
2013-01-23 |
Imec |
Method for processing a semiconductor device comprising an silicon-oxy-nitride dielectric layer
|
|
US20050101160A1
(en)
*
|
2003-11-12 |
2005-05-12 |
Diwakar Garg |
Silicon thin film transistors and solar cells on plastic substrates
|
|
KR100546394B1
(ko)
*
|
2003-11-14 |
2006-01-26 |
삼성전자주식회사 |
비휘발성 메모리 소자 및 그 제조 방법
|
|
KR100626372B1
(ko)
*
|
2004-04-09 |
2006-09-20 |
삼성전자주식회사 |
전계 효과 트랜지스터를 갖는 반도체 소자 및 그 제조 방법
|
|
TW200537573A
(en)
*
|
2004-04-23 |
2005-11-16 |
Ulvac Inc |
Thin-film transistor and production method thereof
|
|
US7745293B2
(en)
*
|
2004-06-14 |
2010-06-29 |
Semiconductor Energy Laboratory Co., Ltd |
Method for manufacturing a thin film transistor including forming impurity regions by diagonal doping
|
|
JP2006100760A
(ja)
*
|
2004-09-02 |
2006-04-13 |
Casio Comput Co Ltd |
薄膜トランジスタおよびその製造方法
|
|
US20060113586A1
(en)
*
|
2004-11-29 |
2006-06-01 |
Macronix International Co., Ltd. |
Charge trapping dielectric structure for non-volatile memory
|
|
JP4961111B2
(ja)
*
|
2005-02-28 |
2012-06-27 |
富士フイルム株式会社 |
光電変換膜積層型固体撮像素子とその製造方法
|
|
US20060270066A1
(en)
|
2005-04-25 |
2006-11-30 |
Semiconductor Energy Laboratory Co., Ltd. |
Organic transistor, manufacturing method of semiconductor device and organic transistor
|
|
US8318554B2
(en)
|
2005-04-28 |
2012-11-27 |
Semiconductor Energy Laboratory Co., Ltd. |
Method of forming gate insulating film for thin film transistors using plasma oxidation
|
|
US7785947B2
(en)
|
2005-04-28 |
2010-08-31 |
Semiconductor Energy Laboratory Co., Ltd. |
Method for manufacturing semiconductor device comprising the step of forming nitride/oxide by high-density plasma
|
|
TWI408734B
(zh)
*
|
2005-04-28 |
2013-09-11 |
Semiconductor Energy Lab |
半導體裝置及其製造方法
|
|
TWI259534B
(en)
*
|
2005-05-20 |
2006-08-01 |
Ind Tech Res Inst |
Method for fabricating semiconductor device
|
|
US8129290B2
(en)
*
|
2005-05-26 |
2012-03-06 |
Applied Materials, Inc. |
Method to increase tensile stress of silicon nitride films using a post PECVD deposition UV cure
|
|
US8138104B2
(en)
*
|
2005-05-26 |
2012-03-20 |
Applied Materials, Inc. |
Method to increase silicon nitride tensile stress using nitrogen plasma in-situ treatment and ex-situ UV cure
|
|
US7732342B2
(en)
*
|
2005-05-26 |
2010-06-08 |
Applied Materials, Inc. |
Method to increase the compressive stress of PECVD silicon nitride films
|
|
US7566655B2
(en)
*
|
2005-05-26 |
2009-07-28 |
Applied Materials, Inc. |
Integration process for fabricating stressed transistor structure
|
|
US7608490B2
(en)
|
2005-06-02 |
2009-10-27 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device and manufacturing method thereof
|
|
US7638372B2
(en)
*
|
2005-06-22 |
2009-12-29 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device and method for manufacturing the same
|
|
US8115206B2
(en)
|
2005-07-22 |
2012-02-14 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device
|
|
US7838347B2
(en)
|
2005-08-12 |
2010-11-23 |
Semiconductor Energy Laboratory Co., Ltd. |
Display device and manufacturing method of display device
|
|
JP2007110071A
(ja)
*
|
2005-09-16 |
2007-04-26 |
Denso Corp |
半導体装置の製造方法及び半導体装置
|
|
JP5243046B2
(ja)
*
|
2006-01-25 |
2013-07-24 |
シャープ株式会社 |
半導体装置の製造方法、及び、半導体装置
|
|
JP4973504B2
(ja)
|
2006-02-07 |
2012-07-11 |
富士通株式会社 |
半導体装置とその製造方法
|
|
US7410593B2
(en)
*
|
2006-02-22 |
2008-08-12 |
Macronix International Co., Ltd. |
Plasma etching methods using nitrogen memory species for sustaining glow discharge
|
|
JP4675813B2
(ja)
*
|
2006-03-31 |
2011-04-27 |
Okiセミコンダクタ株式会社 |
半導体記憶装置およびその製造方法
|
|
US20070254112A1
(en)
*
|
2006-04-26 |
2007-11-01 |
Applied Materials, Inc. |
Apparatus and method for high utilization of process chambers of a cluster system through staggered plasma cleaning
|
|
US20070252233A1
(en)
*
|
2006-04-28 |
2007-11-01 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device and method for manufacturing the semiconductor device
|
|
US7692223B2
(en)
*
|
2006-04-28 |
2010-04-06 |
Semiconductor Energy Laboratory Co., Ltd |
Semiconductor device and method for manufacturing the same
|
|
US7910420B1
(en)
*
|
2006-07-13 |
2011-03-22 |
National Semiconductor Corporation |
System and method for improving CMOS compatible non volatile memory retention reliability
|
|
JP2008108891A
(ja)
*
|
2006-10-25 |
2008-05-08 |
Toshiba Corp |
半導体装置の製造方法
|
|
JP2008166529A
(ja)
*
|
2006-12-28 |
2008-07-17 |
Spansion Llc |
半導体装置の製造方法
|
|
US7935607B2
(en)
*
|
2007-04-09 |
2011-05-03 |
Freescale Semiconductor, Inc. |
Integrated passive device with a high resistivity substrate and method for forming the same
|
|
US7645662B2
(en)
*
|
2007-05-03 |
2010-01-12 |
Dsm Solutions, Inc. |
Transistor providing different threshold voltages and method of fabrication thereof
|
|
US8809203B2
(en)
*
|
2007-06-05 |
2014-08-19 |
Semiconductor Energy Laboratory Co., Ltd. |
Method for manufacturing semiconductor device using a microwave plasma CVD apparatus
|
|
US7776718B2
(en)
*
|
2007-06-25 |
2010-08-17 |
Semiconductor Energy Laboratory Co., Ltd. |
Method of manufacturing semiconductor substrate with reduced gap size between single-crystalline layers
|
|
KR100884977B1
(ko)
*
|
2007-10-18 |
2009-02-23 |
주식회사 동부하이텍 |
씨모스 이미지 센서 및 그의 제조 방법
|
|
DE102008004308A1
(de)
*
|
2008-01-15 |
2009-07-16 |
Biotronik Crm Patent Ag |
Durchführung für eine Batterie, Verfahren zur Herstellung derselben und Batterie
|
|
KR101651224B1
(ko)
*
|
2008-06-04 |
2016-09-06 |
삼성디스플레이 주식회사 |
유기 발광 표시 장치 및 그 제조 방법
|
|
US8258511B2
(en)
|
2008-07-02 |
2012-09-04 |
Applied Materials, Inc. |
Thin film transistors using multiple active channel layers
|
|
TWI518800B
(zh)
|
2008-08-08 |
2016-01-21 |
半導體能源研究所股份有限公司 |
半導體裝置的製造方法
|
|
JP2011003522A
(ja)
|
2008-10-16 |
2011-01-06 |
Semiconductor Energy Lab Co Ltd |
フレキシブル発光装置、電子機器及びフレキシブル発光装置の作製方法
|
|
TWI381534B
(zh)
*
|
2009-03-24 |
2013-01-01 |
Au Optronics Corp |
光學感測器與其製作方法以及具有光學感測器之顯示面板
|
|
US8669644B2
(en)
*
|
2009-10-07 |
2014-03-11 |
Texas Instruments Incorporated |
Hydrogen passivation of integrated circuits
|
|
KR101117728B1
(ko)
*
|
2009-12-16 |
2012-03-07 |
삼성모바일디스플레이주식회사 |
유기 발광 디스플레이 장치 및 그 제조 방법
|
|
US8324661B2
(en)
*
|
2009-12-23 |
2012-12-04 |
Intel Corporation |
Quantum well transistors with remote counter doping
|
|
US9490179B2
(en)
*
|
2010-05-21 |
2016-11-08 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor element and semiconductor device
|
|
KR101464209B1
(ko)
*
|
2010-11-04 |
2014-11-21 |
가부시키가이샤 히다치 고쿠사이 덴키 |
반도체 장치의 제조 방법, 기판 처리 방법, 기판 처리 장치 및 컴퓨터 판독 가능한 기록 매체
|
|
US8766361B2
(en)
|
2010-12-16 |
2014-07-01 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device and electronic device
|
|
US8388793B1
(en)
*
|
2011-08-29 |
2013-03-05 |
Visera Technologies Company Limited |
Method for fabricating camera module
|
|
JP5740270B2
(ja)
|
2011-09-27 |
2015-06-24 |
株式会社東芝 |
薄膜トランジスタ、その製造方法、および表示装置
|
|
CN103094276B
(zh)
*
|
2011-10-27 |
2016-03-02 |
元太科技工业股份有限公司 |
薄膜晶体管基板及其制造方法
|
|
JP2014225626A
(ja)
*
|
2012-08-31 |
2014-12-04 |
株式会社神戸製鋼所 |
薄膜トランジスタおよび表示装置
|
|
US20140117511A1
(en)
*
|
2012-10-30 |
2014-05-01 |
Infineon Technologies Ag |
Passivation Layer and Method of Making a Passivation Layer
|
|
US9018108B2
(en)
|
2013-01-25 |
2015-04-28 |
Applied Materials, Inc. |
Low shrinkage dielectric films
|
|
CN105493293B
(zh)
*
|
2013-09-09 |
2018-08-24 |
株式会社日立制作所 |
半导体装置及其制造方法
|
|
US9985139B2
(en)
|
2014-11-12 |
2018-05-29 |
Qualcomm Incorporated |
Hydrogenated p-channel metal oxide semiconductor thin film transistors
|
|
US9685542B2
(en)
|
2014-12-30 |
2017-06-20 |
Qualcomm Incorporated |
Atomic layer deposition of P-type oxide semiconductor thin films
|
|
KR102435391B1
(ko)
|
2015-09-25 |
2022-08-23 |
삼성디스플레이 주식회사 |
표시 장치
|
|
CN107195665B
(zh)
*
|
2017-06-23 |
2019-12-03 |
京东方科技集团股份有限公司 |
一种阵列基板、其制作方法、显示面板及显示装置
|
|
US11411120B2
(en)
*
|
2017-09-05 |
2022-08-09 |
Ulvac, Inc. |
Method for manufacturing semiconductor device using plasma CVD process
|
|
US12255273B2
(en)
*
|
2019-02-15 |
2025-03-18 |
Samsung Display Co., Ltd. |
Display device and method for fabricating the same
|
|
US12113115B2
(en)
*
|
2021-02-09 |
2024-10-08 |
Taiwan Semiconductor Manufacturing Company Limited |
Thin film transistor including a compositionally-graded gate dielectric and methods for forming the same
|
|
JP7587792B2
(ja)
*
|
2021-02-25 |
2024-11-21 |
株式会社デンソー |
窒化物半導体装置の製造方法
|
|
KR102832574B1
(ko)
*
|
2021-03-25 |
2025-07-11 |
주성엔지니어링(주) |
유기 발광 표시 장치 및 이의 제조 방법
|
|
CN113437164B
(zh)
*
|
2021-06-15 |
2023-02-17 |
南京理工大学泰州科技学院 |
光导型全硅基日盲紫外探测器及其制作方法
|
|
KR20230085644A
(ko)
*
|
2021-12-07 |
2023-06-14 |
삼성전자주식회사 |
반도체 소자 제조 방법
|