WO2008004633A1 - composant STRATIFIE - Google Patents
composant STRATIFIE Download PDFInfo
- Publication number
- WO2008004633A1 WO2008004633A1 PCT/JP2007/063500 JP2007063500W WO2008004633A1 WO 2008004633 A1 WO2008004633 A1 WO 2008004633A1 JP 2007063500 W JP2007063500 W JP 2007063500W WO 2008004633 A1 WO2008004633 A1 WO 2008004633A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- ceramic layer
- magnetic
- nonmagnetic ceramic
- ferrite
- Prior art date
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- 239000000919 ceramic Substances 0.000 claims abstract description 112
- 229910000859 α-Fe Inorganic materials 0.000 claims abstract description 86
- 239000004020 conductor Substances 0.000 claims abstract description 60
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 16
- 229910052802 copper Inorganic materials 0.000 claims abstract description 15
- 238000005245 sintering Methods 0.000 claims abstract description 12
- 238000003475 lamination Methods 0.000 claims description 6
- 229910006501 ZrSiO Inorganic materials 0.000 claims description 5
- 229910052596 spinel Inorganic materials 0.000 claims description 5
- 239000011029 spinel Substances 0.000 claims description 5
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 229910052742 iron Inorganic materials 0.000 claims description 3
- 235000012489 doughnuts Nutrition 0.000 claims description 2
- 229910052797 bismuth Inorganic materials 0.000 abstract description 14
- 238000010030 laminating Methods 0.000 abstract description 3
- 239000002131 composite material Substances 0.000 description 26
- 238000004519 manufacturing process Methods 0.000 description 22
- 238000000034 method Methods 0.000 description 22
- 230000008569 process Effects 0.000 description 20
- 239000000843 powder Substances 0.000 description 15
- 239000000203 mixture Substances 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 10
- 230000032798 delamination Effects 0.000 description 9
- 238000005336 cracking Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 8
- 230000004907 flux Effects 0.000 description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical group [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 6
- 229910001928 zirconium oxide Inorganic materials 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 229910052799 carbon Inorganic materials 0.000 description 4
- 230000035699 permeability Effects 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 229910001035 Soft ferrite Inorganic materials 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 3
- 239000011230 binding agent Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 235000012255 calcium oxide Nutrition 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000000280 densification Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000007606 doctor blade method Methods 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- 238000007654 immersion Methods 0.000 description 2
- 238000009766 low-temperature sintering Methods 0.000 description 2
- 238000013507 mapping Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 230000002250 progressing effect Effects 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- ZTQSAGDEMFDKMZ-UHFFFAOYSA-N Butyraldehyde Chemical compound CCCC=O ZTQSAGDEMFDKMZ-UHFFFAOYSA-N 0.000 description 1
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- 229910017706 MgZn Inorganic materials 0.000 description 1
- 229910003962 NiZn Inorganic materials 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N Oxozirconium Chemical compound [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 229910007541 Zn O Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical class [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 description 1
- 239000002003 electrode paste Substances 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004898 kneading Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052863 mullite Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052845 zircon Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/04—Fixed inductances of the signal type with magnetic core
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
- H01F17/0013—Printed inductances with stacked layers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B18/00—Layered products essentially comprising ceramics, e.g. refractory products
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/26—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on ferrites
- C04B35/265—Compositions containing one or more ferrites of the group comprising manganese or zinc and one or more ferrites of the group comprising nickel, copper or cobalt
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- H01—ELECTRIC ELEMENTS
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- H01F17/00—Fixed inductances of the signal type
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- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F3/00—Cores, Yokes, or armatures
- H01F3/10—Composite arrangements of magnetic circuits
- H01F3/14—Constrictions; Gaps, e.g. air-gaps
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- C04B2235/3232—Titanium oxides or titanates, e.g. rutile or anatase
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- C04B2235/327—Iron group oxides, their mixed metal oxides, or oxide-forming salts thereof
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- C04B2235/327—Iron group oxides, their mixed metal oxides, or oxide-forming salts thereof
- C04B2235/3275—Cobalt oxides, cobaltates or cobaltites or oxide forming salts thereof, e.g. bismuth cobaltate, zinc cobaltite
- C04B2235/3277—Co3O4
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- C04B2235/327—Iron group oxides, their mixed metal oxides, or oxide-forming salts thereof
- C04B2235/3279—Nickel oxides, nickalates, or oxide-forming salts thereof
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- C04B2235/3281—Copper oxides, cuprates or oxide-forming salts thereof, e.g. CuO or Cu2O
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- C04B2235/34—Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3418—Silicon oxide, silicic acids, or oxide forming salts thereof, e.g. silica sol, fused silica, silica fume, cristobalite, quartz or flint
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- H—ELECTRICITY
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- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/02—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets
- H01F41/04—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets for manufacturing coils
- H01F41/041—Printed circuit coils
- H01F41/046—Printed circuit coils structurally combined with ferromagnetic material
Definitions
- the present invention relates to a multilayer component such as a multilayer inductor with a built-in coil, and particularly relates to a multilayer component that has excellent characteristics in which internal stress is reduced and delamination and cracking are eliminated.
- Inductors have come to use a multilayer type instead of the conventional stranded type.
- Multilayer inductors are made by laminating a magnetic sheet or base made of soft ferrite and a conductive paste for internal electrodes (conductor pattern) made of a metal or alloy such as Ag or Cu, which is a good conductor. Then, it is baked and manufactured by printing or transferring an external electrode paste on the surface of the obtained fired body and baking it.
- a DC-DC converter is required to have an inductor with a stable direct current superposition characteristic having a stable inductance even at a high frequency or a high magnetic field.
- inductance is required to exhibit nonlinear characteristics with respect to DC current.
- the soft ferrite used for the inductor does not easily saturate even in a high magnetic field, that is, has a high saturation magnetic flux density Bs.
- MnZn ferrite is known as a soft ferrite with high Bs, but its electrical resistance is low, so it is not suitable for lamination. For this reason, NiZn-based ferrite, NiCuZn-based ferrite, MgZn-based ferrite, etc. with high electrical resistance are used, although Bs is lower than MnZn-based ferrite.
- Multilayer inductors have several problems. The first problem is that permeability changes when ferrite is strained.
- Such a phenomenon is called a magnetostriction effect.
- the main factors that give strain to ferrite are (a) compressive stress generated by resin shrinkage during resin molding, and (b) stress generated by the difference in linear expansion coefficient between the inductor and the printed circuit board. And (c) Internal stress due to the difference in linear expansion coefficient between ferrite and internal electrode metal.
- ferrite is about +10 ppmZ ° C
- Ag is about +20 ppmZ ° C.
- the internal stress of a multilayer inductor causes a crack in the component when a thermal shock is applied in a process such as soldering, which only reduces the magnetic properties (inductance, quality factor Q value) of the ferrite. As a result, the performance of multilayer inductors varies, reducing reliability.
- Japanese Patent Application Laid-Open No. 8-64421 discloses a laminate in which stress is relieved by forming a hollow layer by eliminating carbon paste provided between magnetic layers.
- Type inductors are proposed.
- the strength of the multilayer inductor is reduced by the cavities that not only provide sufficient stress relaxation by the formation of the cavities.
- the gas generated when the carbon paste disappears causes delamination (delamination) and ferrite cracking. If delamination or cracking occurs, the squeezing solution may enter and cause a short circuit of the conductor pattern.
- JP-A-56-155516 discloses that an open magnetic circuit type inductor having a magnetic gap in a magnetic circuit by interposing a nonmagnetic insulating layer between magnetic layers to improve DC superposition characteristics. is suggesting.
- Japanese Patent Application Laid-Open No. 56-155516 does not consider any change in magnetic properties due to internal stress.
- the nonmagnetic insulating layer extends to the outer surface of the inductor, so that the squeezing liquid or the like is caused by cracking or delamination generated at the interface between the magnetic layer and the nonmagnetic insulating layer.
- the conductor pattern is easy to short circuit.
- an object of the present invention is to relieve residual stress due to internal electrodes and to delamination
- the aim is to provide a laminated part that suppresses cracking and cracking, has stable characteristics such as inductance, Q value, etc., and has excellent DC folding characteristics.
- the laminated component of the present invention includes a plurality of magnetic ferrite layers, a conductor pattern formed on each magnetic ferrite layer so as to be connected in the lamination direction to form a coil, and the conductor pattern in the lamination direction.
- a nonmagnetic ceramic layer formed on at least one magnetic ferrite layer so as to overlap, and the nonmagnetic ceramic layer is mainly composed of a nonmagnetic ceramic having a sintering temperature higher than that of the magnetic ferrite, and Cu, It contains one or more of Zn and Bi in the form of an acid salt.
- the nonmagnetic ceramic layer has a donut shape, and at least one edge thereof extends from the corresponding edge of the conductor pattern in the plane direction of the magnetic ferrite layer. ing.
- the length of the nonmagnetic ceramic layer extending from the edge of the conductor pattern may be about 1/4 to 4 times the width of the conductor pattern.
- the nonmagnetic ceramic layer has a plate shape that covers at least an inner region of the conductor pattern. In this case, it is preferable that the nonmagnetic ceramic layer overlaps at least the inner edge of the conductor pattern in the stacking direction.
- the outer edge of the nonmagnetic ceramic layer may be located inside or outside the outer edge of the conductor pattern.
- the nonmagnetic ceramic layer may be formed on at least one magnetic ferrite layer which is not necessarily formed on all the magnetic ferrite layers. For example, (a) even if one non-magnetic ceramic layer is provided at the center of the coil in the stacking direction, or (b) a pair of non-magnetic ceramic layers is provided at both ends of the coil in the stacking direction, Lamination direction Even if a nonmagnetic ceramic layer is provided at the center and both ends, (d) a nonmagnetic ceramic layer is provided between every other conductor pattern, or (e) nonmagnetic is provided between all conductor patterns.
- a ceramic layer may be provided.
- the nonmagnetic ceramic layers according to the first and second embodiments may be combined. That is, Even if a donut-shaped nonmagnetic ceramic layer is formed on at least one magnetic ferrite layer, and a plate-shaped nonmagnetic ceramic layer covering the inner region of the conductor pattern is formed on at least one other magnetic ferrite layer good.
- the nonmagnetic ceramic layer has a different linear expansion coefficient from the conductor pattern, it is necessary to consider the change in stress distribution due to the formation of the nonmagnetic ceramic layer.
- stress concentration is achieved by extending both edges of the nonmagnetic ceramic layer in the plane direction from both edges of the conductor pattern so that the edge of the conductor pattern and the edge of the nonmagnetic ceramic layer are sufficiently separated from each other. It is possible to prevent cracks from occurring in the magnetic ferrite layer.
- the conductor pattern is sandwiched between the nonmagnetic ceramic layers so that the conductor pattern is located at approximately the center in the surface direction of the nonmagnetic ceramic layers adjacent to each other in the stacking direction.
- the nonmagnetic ceramic layer reaches the outer surface of the multilayer component, there is a risk that the squeezing liquid or the like may enter the inside due to cracking or delamination at the interface between the magnetic ferrite layer and the nonmagnetic ceramic layer. Therefore, it is preferable that the nonmagnetic ceramic layer is not exposed on the outer surface of the laminated component.
- the conductor patterns are connected in the stacking direction via conductors filled in via holes of the magnetic ferrite layer and the non-magnetic ceramic layer.
- the nonmagnetic ceramic layer is made of ZrO, ZrSiO, Al
- the nonmagnetic ceramic is preferably formed of ZrO powder having an average particle size of 0.5 to 3 m.
- the magnetic ferrite layer is composed mainly of Fe, Ni, and Zn (which may be substituted by Cu in the — part).
- the spinel type ferrite which is preferably made of a spinel type ferrite, preferably contains Bi as a secondary component.
- the laminated component of the present invention relieves residual stress due to internal electrodes and suppresses delamination cracking, stabilizes characteristics such as inductance and Q value, and has excellent DC superposition characteristics.
- the multilayer component of the present invention having such characteristics includes a multilayer inductor having a magnetic gap, a ferrite substrate with an inductor provided with an electrode on which a semiconductor element can be mounted, a module in which a semiconductor element, a reactance element, etc. are mounted on a ferrite substrate, etc. It is useful as
- FIG. 1 is a perspective view showing an appearance of a multilayer inductor according to an embodiment of the present invention.
- FIG. 2 is a cross-sectional view taken along the line AA ′ in FIG.
- FIG. 3 is a plan view showing a process for manufacturing the first composite layer of the multilayer inductor according to one embodiment of the present invention.
- FIG. 4 is a plan view showing a process for manufacturing a second composite layer of the multilayer inductor according to one embodiment of the present invention.
- FIG. 5 is a plan view showing a process for manufacturing a third composite layer of the multilayer inductor according to one embodiment of the present invention.
- FIG. 6 is a plan view showing a process for manufacturing a fourth composite layer of the multilayer inductor according to one embodiment of the present invention.
- FIG. 7 is an exploded perspective view showing a manufacturing process of the multilayer inductor according to one embodiment of the present invention.
- FIG. 8 is a cross-sectional view showing the internal structure of a multilayer inductor according to another embodiment of the present invention.
- FIG. 9 is a plan view showing a process of manufacturing a first composite layer of a multilayer inductor according to another embodiment of the present invention.
- FIG. 10 is a plan view showing a process of manufacturing the second composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 11 A plan view showing a process of manufacturing the third composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 12 is a plan view showing a process of manufacturing the fourth composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 13 is a plan view showing a process of manufacturing the fifth composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 14 A plan view showing a process of manufacturing the sixth composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 15 A plan view showing a process of manufacturing the seventh composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 16 is a plan view showing a process of manufacturing the eighth composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 17 is a plan view showing a process of manufacturing the ninth composite layer of the multilayer inductor according to another embodiment of the present invention.
- FIG. 18 is an exploded perspective view showing the manufacturing process of the multilayer inductor according to another embodiment of the present invention.
- FIG. 20 is a plan view showing a process for manufacturing one composite layer of the multilayer inductor according to still another embodiment of the present invention.
- FIG. 22 is a plan view showing a process for manufacturing the first composite layer of the multilayer inductor according to still another embodiment of the present invention.
- FIG. 23 is a plan view showing a process of manufacturing the second composite layer of the multilayer inductor according to still another embodiment of the present invention.
- FIG. 24 A plan view showing a process of manufacturing the third composite layer of the multilayer inductor according to still another embodiment of the present invention.
- FIG. 25 is a plan view showing a process for manufacturing the fourth composite layer of the multilayer inductor according to still another embodiment of the present invention.
- FIG. 26 is a partial cross-sectional view showing an overlap between a nonmagnetic ceramic layer and a conductor pattern in a multilayer inductor according to still another embodiment of the present invention.
- FIG. 27 is a cross-sectional view showing an internal structure of a multilayer inductor according to still another embodiment of the present invention.
- FIG. 28 is a cross-sectional view showing the internal structure of the multilayer inductor of Example 1.
- FIG. 29 is a cross-sectional view showing the internal structure of the multilayer inductor of Example 2.
- FIG. 30 is a cross-sectional view showing the internal structure of the multilayer inductor of Example 3.
- FIG. 31 is a cross-sectional view showing the internal structure of the multilayer inductors of Examples 4, 5 and 7.
- FIG. 32 is a cross-sectional view showing the internal structure of the multilayer inductor of Example 6.
- FIG. 33 is a cross-sectional view showing the internal structure of the multilayer inductor of Comparative Example 1.
- FIG. 34 is a diagram showing an equivalent circuit of a step-down DC-DC converter.
- FIG. 35 is a graph showing the frequency distribution of the quality factor Q of the multilayer inductors of Example 5 and Comparative Example 1.
- FIG. 1 shows the appearance of the multilayer inductor according to the first embodiment of the present invention
- FIG. 2 is a cross-sectional view taken along the line AA ′ of FIG. 1, and FIGS.
- the multilayer inductor according to the present embodiment includes a coil embedded in the ferrite multilayer body, and both ends of the coil are connected to external electrodes 5 formed by baking a conductive paste such as Ag on the surface of the multilayer body.
- the nonmagnetic ceramic layers 11, 21, 31, 41 are in contact with the conductor patterns 12, 22, 32, 42 constituting the coil.
- the conductive paste for external electrodes is not particularly limited, and examples thereof include an Ag alloy containing one or more of Pt, Pd, Au, Cu, and Ni.
- the magnetic ferrite layer is mainly composed of, for example, Fe 0, ZnO, or NiO (some of which may be replaced with CuO).
- the main component composition is preferably from 47 to 50.5 mol% of Fe 0, 19 to 30 mole 0/0 of ZnO, is the balance NiO (may be replaced with 15 mol 0/0 or less CuO) [0025]
- the ferrite composition contains 47 to 50.5 mol% Fe (converted to Fe 0) because the permeability is
- the ferrite composition contains Zn of 19 to 30 mole 0/0 (converted to ZnO) is to obtain a high saturation magnetic flux density. If Zn is less than 19 mol%, a desired magnetic flux density cannot be obtained. If Zn is more than 30 mol%, the Curie temperature becomes lower than the practical range. Ni is the remaining amount of the main component minus Fe 0 and ZnO.
- the part may be replaced with 15 mol% or less (CuO equivalent) of Cu.
- the molar ratio of NiOZCuO is preferably 0.3 to 5.8.
- the ferrite composition contains 0.01 to 1% by mass (converted to Nb 0) of Nb oxide as an auxiliary component,
- Group power consisting of calcium oxides (converted) and silicon oxides of 0.1 to 1.5 mass% (converted to SiO)
- Low-temperature sintering is promoted by containing V (converted to 0). 0.01-2% by mass (converted to TiO)
- the content of the accessory component is excessive, the low-temperature sinterability is hindered, the sintered density is lowered, and the mechanical strength (bending strength) is lowered. If the amount is too small, sufficient addition effect Cannot be obtained.
- Subcomponents may be added alone or in combination of two or more. In the case of complex addition, the total amount is preferably 5% by mass or less. If the total amount exceeds 5% by mass, the sinterability may be impaired.
- the amount of inevitable impurities such as Na, S, CI, P, W, and B contained in the raw material should be as small as possible.
- the content in the raw material is preferably 0.05% by mass or less.
- the content of the main component and subcomponent in the flight composition is measured by X-ray fluorescence analysis and ICP emission spectroscopic analysis.
- the elements contained are identified in advance by fluorescent X-ray analysis and quantified by a calibration curve method by comparison with a standard sample.
- the ferrite composition raw materials are mixed and calcined and then pulverized.
- Ferrite powder having a BET specific surface area of 5 to 20 m 2 / g is obtained by adjusting the grinding conditions and classifying the ground powder.
- the same ferrite powder can be obtained by spraying an aqueous solution of Ni and Zn salts and then baking.
- the ferrite powder is mixed with an organic binder such as polybutyl butyral and a solvent such as ethanol, toluene and xylene, and kneaded in a ball mill to form a slurry. After adjusting the viscosity, it is applied onto a resin film such as a polyester film by a doctor blade method or the like and dried to obtain a magnetic ferrite sheet.
- an organic binder such as polybutyl butyral and a solvent such as ethanol, toluene and xylene
- the non-magnetic ceramic layer is composed of zircoyu (ZrO 2), zircon (ZrSiO 2), alumina (A1 0), and
- Group force consisting of 2 4 2 3 and mullite (3A1 0 -2SiO) at least one non-magnetic ceramic selected
- the nonmagnetic ceramic powder preferably has a BET specific surface area of 5 to 20 m 2 / g.
- the BET specific surface area force is less than m 2 / g, it is difficult to form a nonmagnetic ceramic layer having the following thickness.
- the BET specific surface area exceeds 20 m 2 / g, the viscosity of the paste becomes too high and the coating becomes difficult, and the densification proceeds too much during the integral sintering with the magnetic ferrite layer. , The effect of relieving internal stress is reduced.
- the nonmagnetic ceramic powder is preferably a ZrO powder having an average particle diameter of 0.5 to 3 ⁇ m.
- Cu, Zn, and Bi contained in the nonmagnetic ceramic layer after sintering function as a sintering accelerator and densify the structure.
- Cu, Zn and Bi may be added to the nonmagnetic ceramic powder paste in the form of an oxide, or may be added to the magnetic ferrite layer and diffused into the nonmagnetic ceramic layer during sintering.
- Bi is more contained in nonmagnetic ceramics than Cu and Zn. It is easy to control the amount of diffusion into the nonmagnetic ceramic layer, where the amount has little influence on the magnetic properties. However, if too much Bi is added to the nonmagnetic ceramic, abnormal sintering may occur.
- An organic binder such as ethyl cellulose and a solvent are blended with each powder, and the resulting blend is kneaded with three rolls to produce a nonmagnetic ceramic paste.
- a homogenizer or a sand mill may be used for chaos.
- Zn, Cu, and Bi that promote densification may be added in advance to the nonmagnetic ceramic paste in an oxide state, or may be diffused into the nonmagnetic ceramic layer during firing.
- Cu, Zn, and Bi contained in the nonmagnetic ceramic layer after sintering are preferably 3 to 18% by mass in total, with the entire nonmagnetic ceramic layer being 100% by mass. If the total amount of Cu, Zn and Bi is less than 3% by mass, the effect of densifying the nonmagnetic ceramic layer is not sufficient. On the other hand, if the content exceeds 18% by mass, diffusion into the magnetic ferrite layer becomes remarkable, and ferrite sintering is promoted too much, and abnormal grain growth may occur. Abnormal growth of crystal grains causes problems such as an increase in core loss. Since Cu and Bi are easy to diffuse, the total is more preferably 12% by mass or less.
- the sintered non-magnetic ceramic layer is densified to such an extent that the ceramic does not easily fall out even if it is injured with a scribing needle, but has more voids than the magnetic ferrite layer. For this reason, the stress caused by the difference in linear expansion coefficient is dispersed in the nonmagnetic ceramic layer, and the residual stress acting on the magnetic ferrite layer is released.
- the non-magnetic ceramic is originally sintered and densified at a high temperature of about 1300 ° C. However, in the present invention, it is sintered at about 900 ° C, so the densification is insufficient, and the inside With vacancies. For this reason, even if a crack occurs in the nonmagnetic ceramic layer due to internal stress, the cracks are prevented from progressing due to the pores, resulting in discontinuous microcracks and hardly progressing toward the magnetic ferrite layer. If the non-magnetic ceramic layer is not exposed to the outer surface of the multilayer inductor, the squeezing liquid or moisture will not penetrate into the multilayer component through the holes of the non-magnetic ceramic layer.
- FIG. 3 to 7 show a process of forming a conductor pattern on the magnetic ferrite sheet.
- the magnetic ferrite sheet 10 [Fig. 3 (a)] is printed with the nonmagnetic ceramic layer 11 [Fig. 3 (b)], dried, and then dried.
- a conductive paste 12 is formed on the top surface of the substrate by printing a conductive paste [Fig. 3 (c)]. If a large step exceeding 30 m occurs due to the formation of the conductor pattern 12, the crimping may be insufficient and delamination may occur. Therefore, the same composition as the magnetic ferrite sheet 10 is used to cover parts other than the conductor pattern 12.
- the magnetic ceramic paste may be printed to form the magnetic ceramic layer 13 for eliminating the step [FIG. 3 (d)]. In this way, the first composite layer [Fig. 7 (a)] is formed.
- the second to fourth composite layers [(b) to (d) in FIG. 7] have substantially the same basic configuration as the first composite layer except that they have via holes (indicated by black circles in the figure).
- the via hole is formed by forming through holes 27, 37, 47 in the magnetic ferrite sheets 20, 30, 40 with a laser or the like, and a nonmagnetic ceramic with through holes 25, 35, 45 at positions matching these through holes. Do this by printing layer 11.
- a conductor pattern 12 is formed and the via holes are filled with the conductive paste.
- the first to fourth composite layers in which the coil conductor patterns 12, 22, 32, 42 and the nonmagnetic ceramic layers 11, 21, 31, 41 are formed are connected to the conductor patterns 12, 22, 32, 42.
- Lamination is performed so as to form a spiral coil, and a magnetic green sheet (dummy layer) 50 is stacked and pressure-bonded to form a laminate.
- the laminate is cut to a predetermined size (for example, the size after sintering is 3.2 mm ⁇ 1.6 mm ⁇ 1.2 mm), debindered, and then fired in the atmosphere at 900 ° C., for example.
- Cu, Zn, etc. are deposited on the magnetic ferrite layer in the form of simple metals or low resistance oxides such as Cu 0, Zn O
- At least the maximum temperature holding step and the cooling step in firing in an atmosphere or an oxygen-excess atmosphere.
- An Ag-based conductive paste is applied to the surface of the fired body where the conductor pattern is exposed, and is baked at, for example, about 600 ° C to form external electrodes, thereby producing a multilayer inductor.
- the multilayer inductor of the present invention is formed in a substrate shape, and external terminals and mounting electrodes for controlling semiconductor integrated circuit components are provided on the outer surface, and the semiconductor integrated circuit components are mounted on the mounting electrodes.
- a coil can be connected to make a DC-DC converter as shown in the equivalent circuit of FIG. With such a configuration, the characteristics of the DC-DC converter are stable, the mounting area on the circuit board can be reduced by the amount of semiconductor integrated circuit components, and the number of connection lines provided on the circuit board can be reduced. Equipment can be miniaturized.
- FIG. 8 shows a cross section of the multilayer inductor according to the second embodiment (corresponding to the AA ′ cross section of FIG. 1), and FIGS. 9 to 18 show the manufacturing process thereof. Since the multilayer inductor of the second embodiment has the same components as those of the first embodiment, only different portions will be described in detail below.
- nonmagnetic ceramic layers 101, 121, 141, 161, and 181 are formed between the conductor patterns 112, 132, 152, and 172 constituting the coil.
- Conductor patterns 112, 132, 152, 172 and nonmagnetic ceramic layers 101, 121, 141, 161, 181 are formed on different magnetic ferrite sheets 100, 110, 120, 130, 140, 150, 160, 170, 180. It has been done.
- the connection between the conductor patterns is made by using magnetic ferrite sheets 120, 140, 160 with a nonmagnetic ceramic layer and via holes 127, 137, 160 formed on the magnetic ferrite sheets 130, 150, 170 with conductor patterns. 147, 157, 167, 177.
- Through holes 125, 145, and 165 are formed in the nonmagnetic ceramic layers 121, 141, and 161.
- the nonmagnetic ceramic layer can be formed with high precision so that the conductor pattern is located at substantially the center of the nonmagnetic ceramic layer. If the thickness of each magnetic ferrite sheet is half that of the first embodiment, a multilayer inductor having the same thickness as that of the first embodiment can be obtained.
- FIG. 19 shows a cross section of the multilayer inductor according to the third embodiment (corresponding to the AA ′ cross section of FIG. 1)
- FIG. 20 shows the manufacturing process.
- the nonmagnetic ceramic layer is formed in the entire region (including the region inside the coil) that covers the coil.
- the nonmagnetic ceramic layer functions as a magnetic gap that divides the magnetic flux inside the coil, improving the DC superposition characteristics and obtaining high inductance at high frequencies.
- the multilayer inductor of this embodiment is not different from that of the first embodiment.
- FIG. 21 shows a cross section of the multilayer inductor according to the fourth embodiment (corresponding to the AA ′ cross section of FIG. 1), and FIGS. 22 to 25 show the first to fourth composite layers constituting the multilayer inductor.
- Fig. 26 shows the overlap between the nonmagnetic ceramic layer and the conductor pattern.
- the nonmagnetic ceramic layer is formed over the entire region covering the coil (including the region inside the coil).
- the composite layer can be thinned, and the multilayer inductor can be reduced in height.
- the nonmagnetic ceramic layer functions as a magnetic gap that divides the magnetic flux in the coil inner region, the direct current superimposition characteristic is improved and a high inductance is obtained at a high frequency.
- the conductor patterns 12, 22, 32, 42 are formed after the nonmagnetic ceramic layers 11, 21, 31, 41. However, the reverse is also possible.
- the fifth embodiment is such that the conductor pattern comes to substantially the center of the nonmagnetic ceramic layer as shown in FIG.
- the nonmagnetic ceramic layers 220, 221, and 222 are formed on the substrate.
- the nonmagnetic ceramic layers 220, 221, and 222 are formed in the same manner as in the second embodiment. With such a configuration, it is possible to improve the DC superposition characteristics while obtaining a sufficient stress relaxation effect, and to obtain a low-profile multilayer inductor.
- % SnO and 0.5% by mass of 0 as a minor component were wet-mixed and dried, and then 2% at 850 ° C.
- Temporarily calcined The calcined body was wet-ground for 20 hours with a ball mill until the BET specific surface area reached 7.0 m 2 / g to prepare a calcined powder of the ferrite composition.
- This calcined powder is kneaded in a ball mill together with polybutyral and ethanol to make a slurry, and after adjusting the viscosity, it is applied onto a polyethylene terephthalate (PET) film by a doctor-blade method and dried.
- PET polyethylene terephthalate
- ZrO zirconium oxide
- a non-magnetic ceramic paste was prepared by blending cetate and ethanol and kneading with three rolls.
- a conductor pattern composed of a nonmagnetic ceramic layer and an Ag-based conductive paste was formed in the three patterns shown in Table 1, and shown in Figs. 3 to 6 and 9 to 17.
- the magnetic sheet shown was produced.
- the thickness of the magnetic ferrite sheet was changed in order to keep the conductor pattern spacing constant.
- the thickness of the dummy layer provided above and below the coil is 15 m, 30 m, or 60 ⁇ m depending on the sheet pattern so that the thickness of the part where the conductor pattern and nonmagnetic ceramic layer are not formed is the same for all samples. m.
- the obtained composite layer was laminated and pressure-bonded, and the obtained laminated body had a size after sintering of 3.2 mm.
- Example 1 79.5-82.2 Cracks in nonmagnetic ceramic layer
- Example 5 81.6-82.0 Microcracks are present in nonmagnetic ceramic layer
- Comparative Example 1 in 9 out of 10 samples, cracks occurred in the magnetic ferrite layer between the conductor patterns, running substantially parallel to the conductor patterns. The crack generation site was mainly in the middle of the magnetic ferrite layer in the thickness direction. On the other hand, in the samples of Examples 1 to 6, fine cracks occurred in the nonmagnetic ceramic layer, but no cracks occurred in the magnetic ferrite layer. As a result, variations in inductance and Q value were reduced in the comparative example. In two of the ten samples of Example 7, fine cracks were also generated in the magnetic ferrite layer in the immediate vicinity of the nonmagnetic ceramic layer as well as the edge. The force and cracks are practically unproblematic, and the comparative example has small variations in inductance and Q value.
- Example 5 100 samples of Example 5 were separately extracted, immersed in eutectic solder heated to 400 ° C for 3 seconds, and a heat shock test was performed to measure the inductance and Q value before and after immersion. As a result, it was found that there was no substantial difference in inductance and Q value variations before and after immersion. When 10 samples after the test were arbitrarily extracted and the cross section was observed with SEM, the magnetic ferrite layer did not crack.
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
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- Ceramic Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Composite Materials (AREA)
- Coils Or Transformers For Communication (AREA)
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07768249.0A EP2040272A4 (en) | 2006-07-05 | 2007-07-05 | Laminated component |
US12/307,433 US8004381B2 (en) | 2006-07-05 | 2007-07-05 | Laminated device |
CN2007800254311A CN101529535B (zh) | 2006-07-05 | 2007-07-05 | 层叠部件 |
KR1020087032222A KR101421453B1 (ko) | 2006-07-05 | 2007-07-05 | 적층 부품 |
JP2008523735A JP5446262B2 (ja) | 2006-07-05 | 2007-07-05 | 積層部品 |
Applications Claiming Priority (2)
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JP2006185669 | 2006-07-05 | ||
JP2006-185669 | 2006-07-05 |
Publications (1)
Publication Number | Publication Date |
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WO2008004633A1 true WO2008004633A1 (fr) | 2008-01-10 |
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ID=38894600
Family Applications (1)
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PCT/JP2007/063500 WO2008004633A1 (fr) | 2006-07-05 | 2007-07-05 | composant STRATIFIE |
Country Status (6)
Country | Link |
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US (1) | US8004381B2 (ja) |
EP (1) | EP2040272A4 (ja) |
JP (1) | JP5446262B2 (ja) |
KR (1) | KR101421453B1 (ja) |
CN (1) | CN101529535B (ja) |
WO (1) | WO2008004633A1 (ja) |
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JP2020061410A (ja) * | 2018-10-05 | 2020-04-16 | 株式会社村田製作所 | 積層型電子部品 |
US11749448B2 (en) | 2018-10-05 | 2023-09-05 | Murata Manufacturing Co., Ltd. | Laminated electronic component |
US11842846B2 (en) | 2018-10-05 | 2023-12-12 | Murata Manufacturing Co., Ltd. | Laminated electronic component |
JP2021163812A (ja) * | 2020-03-31 | 2021-10-11 | 太陽誘電株式会社 | コイル部品 |
WO2023090156A1 (ja) * | 2021-11-19 | 2023-05-25 | 株式会社村田製作所 | 積層コイル部品 |
WO2023090158A1 (ja) * | 2021-11-19 | 2023-05-25 | 株式会社村田製作所 | 積層コイル部品 |
Also Published As
Publication number | Publication date |
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KR20090026318A (ko) | 2009-03-12 |
CN101529535B (zh) | 2012-05-23 |
JPWO2008004633A1 (ja) | 2009-12-03 |
US20100033286A1 (en) | 2010-02-11 |
US8004381B2 (en) | 2011-08-23 |
EP2040272A4 (en) | 2017-04-19 |
KR101421453B1 (ko) | 2014-07-22 |
JP5446262B2 (ja) | 2014-03-19 |
CN101529535A (zh) | 2009-09-09 |
EP2040272A1 (en) | 2009-03-25 |
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