WO2005088700A1 - ダイシングダイボンドシート - Google Patents
ダイシングダイボンドシートInfo
- Publication number
- WO2005088700A1 WO2005088700A1 PCT/JP2005/004513 JP2005004513W WO2005088700A1 WO 2005088700 A1 WO2005088700 A1 WO 2005088700A1 JP 2005004513 W JP2005004513 W JP 2005004513W WO 2005088700 A1 WO2005088700 A1 WO 2005088700A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- adhesive layer
- compound
- dicing
- dicing die
- group
- Prior art date
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
- C09J163/10—Epoxy resins modified by unsaturated compounds
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B27/08—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
- C09J133/062—Copolymers with monomers not covered by C09J133/06
- C09J133/068—Copolymers with monomers not covered by C09J133/06 containing glycidyl groups
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J161/00—Adhesives based on condensation polymers of aldehydes or ketones; Adhesives based on derivatives of such polymers
- C09J161/04—Condensation polymers of aldehydes or ketones with phenols only
- C09J161/06—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J161/00—Adhesives based on condensation polymers of aldehydes or ketones; Adhesives based on derivatives of such polymers
- C09J161/20—Condensation polymers of aldehydes or ketones with only compounds containing hydrogen attached to nitrogen
- C09J161/26—Condensation polymers of aldehydes or ketones with only compounds containing hydrogen attached to nitrogen of aldehydes with heterocyclic compounds
- C09J161/28—Condensation polymers of aldehydes or ketones with only compounds containing hydrogen attached to nitrogen of aldehydes with heterocyclic compounds with melamine
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J175/00—Adhesives based on polyureas or polyurethanes; Adhesives based on derivatives of such polymers
- C09J175/04—Polyurethanes
- C09J175/14—Polyurethanes having carbon-to-carbon unsaturated bonds
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/35—Heat-activated
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/27—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L2666/00—Composition of polymers characterized by a further compound in the blend, being organic macromolecular compounds, natural resins, waxes or and bituminous materials, non-macromolecular organic substances, inorganic substances or characterized by their function in the composition
- C08L2666/02—Organic macromolecular compounds, natural resins, waxes or and bituminous materials
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L2666/00—Composition of polymers characterized by a further compound in the blend, being organic macromolecular compounds, natural resins, waxes or and bituminous materials, non-macromolecular organic substances, inorganic substances or characterized by their function in the composition
- C08L2666/02—Organic macromolecular compounds, natural resins, waxes or and bituminous materials
- C08L2666/14—Macromolecular compounds according to C08L59/00 - C08L87/00; Derivatives thereof
- C08L2666/22—Macromolecular compounds not provided for in C08L2666/16 - C08L2666/20
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/20—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive itself
- C09J2301/208—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive itself the adhesive layer being constituted by at least two or more adjacent or superposed adhesive layers, e.g. multilayer adhesive
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/30—Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
- C09J2301/302—Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier the adhesive being pressure-sensitive, i.e. tacky at temperatures inferior to 30°C
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2461/00—Presence of condensation polymers of aldehydes or ketones
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2463/00—Presence of epoxy resin
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2475/00—Presence of polyurethane
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
Definitions
- the present invention relates to a dicing die bonding sheet used in both a dicing step of cutting and separating a semiconductor wafer into semiconductor elements and a die bonding step of bonding the semiconductor elements to a support member.
- a semiconductor wafer manufactured in a large diameter state is cut and separated (diced) into semiconductor elements (semiconductor chips), and each semiconductor element is bonded to a supporting member such as a lead frame or an organic substrate (die bonding).
- a wafer backside bonding method has been widely used.
- a film adhesive 11 is attached to the back surface of the semiconductor wafer 10
- a dicing tape 14 having an adhesive layer 12 provided on a base film 13 is adhered to the other surface of the film adhesive, and (3) a semiconductor element is singulated from the semiconductor wafer by dicing.
- the semiconductor device 16 with the film-like adhesive separated into pieces is picked up and bonded (die-bonded) to a supporting member, and the semiconductor device 16 is formed by applying a gold wire 15 and heating and curing. Will be obtained.
- a film piece sticking method As another method, there is a film piece sticking method.
- a semiconductor device is obtained by joining (die bonding) semiconductor elements singulated by dicing onto a film adhesive, and through steps such as attaching gold wires and heat curing.
- the semiconductor wafer and the film adhesive are simultaneously separated into pieces and the semiconductor element with the film adhesive is bonded to the supporting member. It is not necessary to use a device for converting and pasting to a support member, and it can be used by using a conventional silver paste assembly device as it is or by modifying a part of the device such as adding a hot plate. For this reason, the wafer backside bonding method uses a film adhesive This method has attracted attention as a method of keeping production costs relatively low among ⁇ a standing methods.
- an object of the present invention is to provide a dicing tape which can be bonded to a semiconductor wafer and used for dicing, and the semiconductor element and the adhesive layer can be easily bonded to each other when picking up.
- An object of the present invention is to provide a dicing die-bonding sheet which can be used by peeling off from the adhesive layer and has an adhesive layer having sufficient adhesiveness as a die-bonding material.
- the present invention is a dicing die bond sheet in which a pressure-sensitive adhesive layer and an adhesive layer are formed in this order on a base film, wherein the pressure-sensitive adhesive layer has an iodine value of 0.5 in a molecule.
- the adhesive layer contains an epoxy resin (a), a phenol resin (b) having a hydroxyl equivalent of 150 gZeq or more, glycidyl atalylate or glycidyl metharylate in a weight average molecular weight of 100,000.
- the epoxy group-containing acrylic copolymer (c) A dicing die-bonding film characterized by containing a coloring agent (d) and a curing accelerator (e).
- the present invention relates to the dicing die-bonding sheet, wherein the glass transition point of the compound (A) is -70 ° C-0 ° C.
- the present invention also relates to the above dicing die bond sheet, wherein the hydroxyl value of the compound (A) is 5-100.
- the present invention relates to the above dicing die bond sheet, wherein the acid value of the compound (A) is 0.5 to 30.
- the present invention also relates to the above dicing die bond sheet, wherein the hydroxyl value of the compound (A) is 5-100 and the acid value is 0.5-30.
- the present invention when the total weight of the epoxy resin (a) and the phenol resin (b) is X, and the weight of the epoxy group-containing acrylic copolymer (c) is Y, the ratio XZY Is 0.24—1.
- the phenol resin (b) is represented by the general formula (I):
- R 1 is a hydrogen atom which may be the same or different, a linear or branched alkyl group having 110 carbon atoms, a cyclic alkyl group, an aralkyl group, an alkenyl group, a hydroxyl group, an aryl group. , Or a halogen atom, n represents an integer of 13 and m represents an integer of 0-50)
- the present invention also relates to the dicing die bond sheet (d), wherein the filler has an average particle size force of 0.005 ⁇ m to 0.1 ⁇ m.
- the present invention provides the above dicing die bond sheet wherein the filler (d) is a silica filler. About.
- the present invention relates to the above dicing die bond sheet, wherein (e) the curing accelerator is an imidazole.
- FIG. 1 is a schematic cross-sectional view of a dicing die bond sheet of the present invention.
- FIG. 2 is a schematic cross-sectional view showing an example of how to use the dicing die bond sheet of the present invention.
- FIG. 3 is a schematic cross-sectional view showing a conventional method for manufacturing a semiconductor device.
- the dicing die bond sheet 1 of the present invention has a structure in which an adhesive layer 3 and an adhesive layer 2 are provided on a base film 4 in this order.
- the layer may be cut (precut) into a predetermined shape in advance in accordance with the use process or the apparatus.Also, a cover film (not shown) may be provided to protect the adhesive layer or the adhesive layer.
- the dicing die bond sheet of the present invention may be cut for each semiconductor wafer, or may be in the form of a long roll. Next, each configuration of the dicing die bond sheet of the present invention will be described in order.
- the pressure-sensitive adhesive layer comprises a compound (A) having a radiation-curable carbon-carbon double bond having an iodine value of 0.5 to 20 in a molecule, a polyisocyanate, and a melamine 'formaldehyde resin'. And an acrylic pressure-sensitive adhesive containing at least one compound (B) selected from epoxy resins.
- radiation refers to light such as ultraviolet light or ionizing radiation such as an electron beam.
- the amount of the radiation-curable carbon-carbon double bond introduced into the compound (A) is 0.5-20, preferably 0.8-10 in terms of iodine value.
- the iodine value is 0.5 or more, the effect of reducing the adhesive strength after irradiation can be obtained. Since the fluidity is sufficient and the element gap after stretching can be sufficiently obtained, the problem that image recognition of each element becomes difficult at the time of pickup can be suppressed. Further, the compound (A) itself is stable and easy to produce.
- the above compound (A) preferably has a glass transition point of ⁇ 70 ° C. to 0 ° C., more preferably ⁇ 66 ° C. to 1-28 ° C. If the glass transition point (hereinafter also referred to as “Tg”) is -70 ° C or more, the heat resistance to the heat accompanying radiation irradiation is sufficient, and if it is 0 ° C or less, the wafer has a rough surface. In this case, the effect of preventing the element from scattering after dicing can be sufficiently obtained.
- Tg glass transition point
- the compound (A) may be produced by any method.
- the compound (A) has a radiation-curable carbon-carbon double bond such as an acrylic copolymer or a methacrylic copolymer, and A compound obtained by reacting a compound having a functional group ((1)) with a compound having a functional group capable of reacting with the functional group ((2)) is used.
- ((1)) is composed of a monomer ((1) -1) having a radiation-curable carbon-carbon double bond, such as an alkyl acrylate or an alkyl methacrylate, and a monomer having a functional group ( (1) It can be obtained by copolymerizing 2).
- Monomers ((1) 1) include hexyl atalylate having 6 to 12 carbon atoms, n-amino octyl acrylate, isooctyl acrylate, 2-ethyl hexyl acrylate, and dodecyl acrylate Pentyl acrylate, n-butyl acrylate, isobutyl acrylate, ethyl acrylate, methyl acrylate, methyl acrylate, and the like, and the like. be able to.
- the glass transition point becomes lower as the monomer has a larger carbon number. Therefore, a desired glass transition point can be produced.
- low molecular weight compounds having a carbon-carbon double bond such as vinyl acetate, styrene, and acrylonitrile may be added for the purpose of improving the compatibility and various performances of the monomer ((1) 1).
- Examples of the functional group of the monomer ((1) 2) include a carboxyl group, a hydroxyl group, an amino group, a cyclic acid anhydride group, an epoxy group, an isocyanate group, and the like. 2) Specific examples of 2) include acrylic acid, methacrylic acid, cinnamic acid, itaconic acid, fumaric acid, and phthalic acid.
- the functional group used is a compound ((1)), that is, a monomer ((1)
- the functional group contained in 2) is a carboxyl group or a cyclic acid anhydride group
- examples thereof include a hydroxyl group, an epoxy group, and an isocyanate group; and when the functional group is a hydroxyl group, a cyclic acid anhydride group and an isocyanate group.
- Groups such as an amino group, an epoxy group and an isocyanate group; and an epoxy group, a carboxyl group, a cyclic acid anhydride group and an amino group. Specific examples thereof include those similar to the specific examples of the monomer ((1) 2).
- ketone, ester, alcohol and aromatic solvents can be used as the organic solvent when the reaction is carried out by solution polymerization.
- solvents of acrylic polymers such as toluene, ethyl acetate, isopropyl alcohol, benzene, methyl sorb, ethyl sorb, acetone and methyl ethyl ketone, and solvents having a boiling point of 60 to 120 ° C. are preferred.
- a radical generator such as an azobis type such as a, a'-azobisisobutyl nitrile and an organic peroxide type such as benzoylperoxide is generally used.
- a catalyst and a polymerization inhibitor can be used in combination, and the compound (A) having a desired molecular weight can be obtained by adjusting the polymerization temperature and the polymerization time. Further, with respect to adjusting the molecular weight, it is preferable to use mercaptan or a tetrahydrocarbon solvent. This reaction is a solution polymerization. However, other methods such as bulk polymerization and suspension polymerization may be used.
- the compound (A) can be obtained.
- the molecular weight of the compound (A) is preferably about 300,000 to 1,000,000. If the molecular weight is less than 300,000, the cohesive force due to irradiation is reduced, and when the wafer is diced, the elements are liable to shift, and image recognition may be difficult. In order to minimize the displacement of the element, it is preferable that the molecular weight is 400,000 or more. When the molecular weight exceeds 1,000,000, gelling may occur during synthesis and coating.
- the molecular weight in the present invention is a weight average molecular weight in terms of polystyrene.
- the compound (A) preferably has an OH group having a hydroxyl value of 5 to 100 because the adhesive strength after irradiation can be reduced, thereby further reducing the risk of pickup error. Further, the compound (A) preferably has a COOH group that provides an acid value of 0.5 to 30.
- (B) is a compound selected from at least one of polyisocyanates, melamine 'formaldehyde resin, and epoxy resin, and can be used alone or in combination of two or more.
- This compound (B) acts as a cross-linking agent, and the cross-linking structure formed as a result of reaction with the compound (A) or the base film reduces the cohesive force of the pressure-sensitive adhesive containing the compounds (A) and (B) as main components. It can be improved after application of the agent.
- Polyisocyanates are not particularly limited.
- 4,4'-diphenylmethane di-isocyanate, tolylene di-isocyanate, xylylene di-isocyanate, 4,4'-diphenyl ether di-isocyanate Aromatic isocyanates such as 4,4 '-[2,2-bis (4-phenoxyphenyl) propane] diisocyanate, hexamethylene diisocyanate, 2,2,4-trimethinole hexamethylene diisocyanate, Isophorone diisocyanate, 4, 4 'dicyclohexynolemethane diisocyanate, 2, 4' dicyclohexynolemethane diisocyanate And lysine diisocyanate and lysine triisocyanate.
- Coronate L or the like can be used as a commercial product.
- melamine 'formaldehyde resin' examples include commercially available products such as Nikarak MX-45 (manufactured by Sanwa Chemical Co., Ltd.) and melan (manufactured by Hitachi Chemical Co., Ltd.). it can. Further, as the epoxy resin, TETRAD-X (registered trademark, manufactured by Mitsubishi Chemical Corporation) or the like can be used. In the present invention, it is particularly preferable to use polyisocyanates.
- the added amount of the kneaded kneader (B) is preferably 0.1 to 10 parts by weight with respect to 100 parts by weight of the compound (A), and more preferably 0.4 to 3 parts by weight. preferable. If the amount is less than 0.1 part by weight, the effect of improving the cohesive strength tends to be insufficient.If the amount exceeds 10 parts by weight, the curing reaction proceeds rapidly during the operation of compounding and applying the adhesive, forming a crosslinked structure. Workability tends to be impaired.
- the pressure-sensitive adhesive layer preferably contains a photopolymerization initiator (C).
- a conventionally known photopolymerization initiator (C) containing an adhesive layer is not particularly limited.
- benzophenones such as benzophenone, 4,4'-dimethylaminobenzophenone, 4,4'-jetylaminobenzophenone, 4,4 'diclo mouth benzophenone, etc.
- acetophenones such as acetophenone, diethoxyacetophenone, etc .
- 2-anthraquinones such as 2-ethylanthraquinone and t-butylanthraquinone
- 2-cyclohexylthioxantone benzoinethyl ether, benzoin isopropyl ether; benzyl; 2,4,5-triarylimidazole dimer (mouth fin dimer ), Athalidine compounds and the like, and these can be used alone or in combination of two or more.
- the amount of the added kneading of (C) is preferably 0.01 to 5 parts by weight with respect to 100 parts by weight of compound (A), and more preferably 0.01 to 4 parts by weight. preferable.
- the radiation-curable pressure-sensitive adhesive used in the present invention may further contain, if necessary, a tackifier, a pressure-adjusting agent, a surfactant, and the like, or other modifiers and conventional components.
- the thickness of the pressure-sensitive adhesive layer is not particularly limited, but is usually 2-50 / zm.
- the adhesive layer in the dicing die-bonding sheet of the present invention comprises epoxy resin (a), phenol resin (b) having a hydroxyl equivalent of 150 gZeq or more, glycidyl atalylate or dalicidyl methacrylate, in a weight of 0.5 to 6 weight. % Of an epoxy group-containing acrylic copolymer having a weight average molecular weight of 100,000 or more (c), a filler (d) and a curing accelerator (e).
- epoxy resin a
- phenol resin having a hydroxyl equivalent of 150 gZeq or more
- glycidyl atalylate or dalicidyl methacrylate in a weight of 0.5 to 6 weight.
- % of an epoxy group-containing acrylic copolymer having a weight average molecular weight of 100,000 or more a filler (d) and a curing accelerator (e).
- each component will be described.
- the (a) epoxy resin used in the present invention is not particularly limited as long as it cures and exhibits an adhesive action, but it has two or more functional groups, and preferably has a molecular weight of less than 5,000. More preferably, less than 3000 epoxy resins can be used. Further, an epoxy resin having a molecular weight of preferably 500 or more, more preferably 800 or more can be used.
- Examples of such an epoxy resin include bisphenol A-type epoxy resin, bisphenol F- type epoxy resin, bisphenol S-type epoxy resin, alicyclic epoxy resin, and aliphatic chain epoxy resin. Fat, phenol novolak epoxy resin, cresol novolac epoxy resin, bisphenol A novolak epoxy resin, diglycidyl etherified biphenyl, diglycidyl etherified naphthalene diol, diglycidyl etherified phenol And diglycidyl etherified products of alcohols, and bifunctional epoxy resins such as alkyl-substituted, halogenated and hydrogenated products thereof, and novolac epoxy resins.
- a polyfunctional epoxy resin and a heterocyclic-containing epoxy resin can also be applied. These can be used alone or in combination of two or more. Further, components other than epoxy resin may be contained as impurities within a range that does not impair the characteristics.
- epicote 807, epicote 815 epicote 825, epicote 827, epicote 828, epicote 834, epicote 1001, epicote 1002, epicote 1003, epicote 1055, Epicoat 1004, Epicoat 1004AF, Epicoat 1007, Epicoat 1009, Epicoat 1003F, Epicoat 1004F (all made by Japan Epoxy Resin Co., Ltd., trade name), DER-330, DER-301, DER-361, DER-661, DER -662, DER-663U, DER-664, DER-664U, DER-667, DER-642U, DER-672U, DER— 673MF, DER— 668, DER— 669 (above, manufactured by Dazumi Chemical Co., trade name), YD8125, YDF8170 (Tokyo Kasei Co., Ltd.
- Bisphenol A-type epoxy resin such as product name
- bisphenol F-type epoxy resin such as YDF-2004 (manufactured by Toto Kasei Co., Ltd.)
- epicoat 152 epicoat 154 (all manufactured by Japan Epoxy Resin Co., Ltd., Phenol novolak type epoxy resin such as EPPN-201 (trade name, manufactured by Nippon Kayaku Co., Ltd.), DEN-438 (trade name, manufactured by Dow Chemical Co., Ltd.) , Araldite ECN1273, Araldite ECN1280, Araldite ECN1299 (above, manufactured by Ciba Specialty Chemicals, trade name), YDCN-701, YDCN-702, YDCN-703, YDCN-704 (above, Toto Kasei)
- an epoxy resin which is solid at room temperature and has a softening point of 50 ° C. or more as measured by a ring and ball method.
- the amount used is preferably at least 20% by weight of the entire epoxy resin ( a ), more preferably at least 40% by weight. More preferably 60% by weight or more is more preferable.
- YDCN-703, YDCN-704 trade names, manufactured by Toto Kasei Co., Ltd.
- Epicoat 1004 Epicoat 1007 (trade names, manufactured by Japan Epoxy Resin Co., Ltd.) Can be.
- An epoxy resin having a molecular weight of 600 or more and a softening point of 50 ° C. or more has a large difference in polarity with an epoxy group-containing acrylic copolymer (c) described later, and is hardly compatible with the epoxy resin. Therefore, it is preferable to use such an epoxy resin.
- the epoxy equivalent of the epoxy resin (a) is preferably from 100 to 2000 gZeq, more preferably from 150 to 100 gZeq, more preferably from 150 to 300 gZeq, and still more preferably from 150 to 300 gZeq. . If the epoxy equivalent is less than 100 gZeq, the cured product tends to be brittle and the adhesiveness tends to decrease. If it exceeds 2000 gZeq, the Tg tends to decrease and the heat resistance tends to deteriorate.
- the phenolic resin (b) is not particularly limited as long as it has a hydroxyl equivalent of 150 gZeq or more. However, since it has excellent resistance to electric corrosion when absorbing moisture, it is preferable to use a novolak-type or resol-type resin. preferable.
- the hydroxyl group equivalent is preferably 150 to 400 gZeq, more preferably 180 to 300 gZeq, and still more preferably 180 to 250 gZeq. If the hydroxyl group equivalent is less than 150 gZeq, the water absorption tends to increase and reflow resistance tends to deteriorate, and if it exceeds 4 OOgZeq, Tg tends to decrease and heat resistance tends to deteriorate.
- R 1 is a hydrogen atom which may be the same or different, a linear or branched alkyl group having 1-10 carbon atoms, a cyclic alkyl group, an aralkyl group, an alkenyl group, a hydroxyl group, , An aryl group, or a halogen atom, n represents an integer of 13 and m represents an integer of 0 to 50).
- the phenol resin (b) preferably has a water absorption of 2% by weight or less after 48 hours in a constant temperature and humidity chamber of 85 ° C and 85% RH.
- thermogravimetric analyzer TGA
- the phenolic resin of the present invention represented by the formula (I) is obtained, for example, by reacting a phenolic conjugate with a xylylene compound that is a divalent linking group in the absence of a catalyst or in the presence of an acid catalyst. be able to.
- a xylylene compound that is a divalent linking group in the absence of a catalyst or in the presence of an acid catalyst.
- Examples of commercially available products include the MILEX XLC-series and the XL series (all trade names, manufactured by Mitsui Chemicals, Inc.).
- the compounding amounts of the phenol resin (b) and the epoxy resin (a) are 0.70 / 0.30-0.30 / 0.70 in the equivalents of the hydroxyl equivalent and the epoxy equivalent, respectively.
- Force S is preferred, more preferably 0.65 / 0.35—0.35 / 0.65, and still more preferably 0.60 / 0.40—0.40 / 0.60. It is particularly preferred that the ratio is 0.55 / 0.45-0.45 / 0.55. If the compounding ratio exceeds the above range, the curability of the adhesive may be poor.
- the phenolic conjugates used in the production of the phenolic resin of the formula (I) include phenol, o-creso-nore, m-creso-no-re, p-creso-no-re, o-ethino-le-no-nore, p —Ethynolephenol, o—n-propylphenol, m—n-propylphenol, ⁇ —n-propylphenol, o-isopropylphenol, m-isopropylphenol, p-isopropylphenol, o—n-butynolephenol, m— n-butynolephenol, ⁇ -n-butynolephenol, o isobutylphenol, m isobutylphenol, p isobutylphenol, octylphenol, norphenol, 2,4-xylenol, 2,6-xylenol, 3,5 —Xyl
- phenolic conjugates may be used alone or in combination of two or more. Particularly preferred are phenol, o-cresol, m-cresol, p-talesol and the like.
- the following xylylene dinolide, xylylene diglycol and derivatives thereof can be used. . That is, (X, a 'dichloro- ⁇ -xylene, a, a' -dichloro-m-xylene, a, a '-dichloro-o-xylene, OL, at' -jib-mouth mo-p-xylene, ⁇ , a '-jib-mouth Mo m-xylene, a, a 'One jib mouth Mo o-xylene, a, a' Jordo p-xylene, a, x '—Joido m-xylene, a, a' —Joido o-xylene ,, A 'dihydroxy-p-xylene,
- the reaction molar ratio between the phenolic ligated product and the xylylene ligated product is usually such that the phenolic ligated product is used in excess, and after the reaction, the unreacted phenolic ligated product is recovered.
- the average molecular weight is determined by the amount of the phenolic compound, and the more the phenolic compound is in excess, the lower the phenolic resin having a lower average molecular weight is obtained.
- the phenolic resin in which the phenolic conjugate is an arylphenol is produced, for example, by producing a non-arylated phenolic resin, reacting it with an arylyl chloride, passing through an aryl ether, and undergoing Claisen rearrangement. It can be obtained by the method of Rui-dani.
- the epoxy group-containing acrylic copolymer (c) of the present invention contains 0.5 to 6% by weight of glycidyl atalylate or glycidyl methacrylate having an epoxy group. In order to obtain a high adhesive strength, 0.5 wt% or more is preferable, and 6 wt% or less can suppress gelling.
- the glass transition point (Tg) of the epoxy group-containing acrylic copolymer (c) is preferably from -50 ° C to 30 ° C, more preferably from -10 ° C to 30 ° C.
- the amount of glycidyl atalylate or glycidyl metharylate used as the functional group monomer is a copolymer ratio of 0.5 to 6% by weight. That is, in the present invention, the epoxy group-containing Ryl copolymer (c) is glycidyl atalylate or glycidyl metharylate as a raw material.
- the remainder can be a mixture of alkyl acrylates having an alkyl group having 18 carbon atoms, such as methyl acrylate and methyl methacrylate, alkyl methacrylate, and styrene and acrylate tritol.
- alkyl acrylates having an alkyl group having 18 carbon atoms such as methyl acrylate and methyl methacrylate, alkyl methacrylate, and styrene and acrylate tritol.
- ethyl (meth) acrylate and Z or butyl (meth) acrylate are particularly preferred.
- the mixing ratio is preferably adjusted in consideration of the Tg of the copolymer.
- the polymerization method is not particularly limited, and examples thereof include pearl polymerization, solution polymerization and the like, and a copolymer can be obtained by these methods.
- An example of such an epoxy group-containing ataryl copolymer is HTR-860P-3 (trade name, manufactured by Nagase ChemteX Corporation).
- the weight average molecular weight of the epoxy group-containing acrylic copolymer is 100,000 or more, and within this range, the adhesiveness and heat resistance are high, and preferably 300,000 to 300,000. More preferably, it is 10,000. When it is 3,000,000 or less, the flowability is reduced, so that the possibility that the filling property of the wiring circuit formed on the support member to which the semiconductor element is attached as necessary is reduced can be reduced.
- the weight average molecular weight is a value in terms of polystyrene using a calibration curve with standard polystyrene by gel permeation chromatography (GPC).
- the amount of the epoxy group-containing acrylic copolymer (c) to be added is such that the elastic modulus can be reduced and the flowability during molding can be suppressed, so that the (a) epoxy resin and (b) the phenol resin are mixed.
- the ratio XZY is preferably 0.24-1.
- the elastic modulus at a high temperature can be 0.5 MPa or more, and there is a tendency that heat resistance is improved and an effect of suppressing flowability at the time of molding is obtained. If it is 1 or less, the handleability at high temperatures tends to be excellent.
- a filler and (e) a curing accelerator are further added.
- the filler include an inorganic filler and an organic filler. It is preferable to add an inorganic filler for the purpose of improving thermal conductivity, adjusting melt viscosity and imparting thixotropic properties.
- the inorganic filler is not particularly limited.
- examples include aluminum, aluminum borate, boron nitride, crystalline silica, and amorphous silica. These may be used alone or in combination of two or more.
- aluminum oxide, aluminum nitride, boron nitride, crystalline silica, amorphous silica, and the like are preferable.
- Silica is preferred from the viewpoint of the balance of properties.
- the average particle size of the filler is preferably 0.005 to 0.1 ⁇ m, and 0.008 to 0.1.
- the average particle size of the filler is less than 0.005 ⁇ m, the wettability to the adherend tends to decrease, and the adhesion tends to decrease. The effect is reduced and the heat resistance tends to decrease.
- the average particle size refers to an average value from which the particle size force of 100 fillers measured by TEM, SEM, or the like is also determined.
- silica is manufactured by Nano Chemical Co., Ltd.
- Alumina is supplied by Nanotech Al O (contact angle: 55 degrees, average particle size)
- Antimony trioxide is sold by Nippon Seiko Co., Ltd. under the trade name PATOX-U (contact angle: 43 degrees, average particle size: 0.02 ⁇ m) t.
- the compounding amount of the (d) filler is preferably 3 to 50% by weight based on the total amount of the epoxy resin (a) and the phenol resin (b). More preferably 10 to 40% by weight, more preferably 15 to 30% by weight. If the amount of the filler is less than 3% by weight, the reinforcing effect of the filler-added kashimi tends to decrease, and the heat resistance tends to decrease. If the amount exceeds 50% by weight, the wettability to the adherend decreases. However, the adhesiveness tends to decrease.
- the (e) curing accelerator used in the adhesive of the present invention is not particularly limited, and examples thereof include tertiary amines, imidazoles, and quaternary ammonium salts.
- Examples of the imidazoles preferably used in the present invention include, for example, 2-methylimidazole, 2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-phenylimidazole trimellitate These may be used alone or in combination of two or more.
- Imidazoles are commercially available, for example, from Shikoku Chemicals Corporation under the trade names 2E4MZ, 2PZ-CN, and 2PZ-CNS.
- the amount of the curing accelerator is preferably 0.01 to 5% by weight based on the total amount of the epoxy resin (a) and the phenol resin (b).
- the content is more preferably set to 3% by weight, and further preferably set to 0.2 to 3% by weight. If the amount of the curing accelerator is less than 0.01% by weight, the crosslinking of the epoxy resin is insufficient, and the heat resistance tends to decrease. If it exceeds 5% by weight, the storage stability decreases. However, the pot life tends to be insufficient.
- the cured product of the adhesive preferably has a tensile modulus of 11 to 20 MPa when measured at 240 ° C.
- the tensile modulus exceeds 20 MPa, the stress relaxation property is reduced, and warpage or the like is likely to occur.
- the tensile modulus is less than IMPa, reflow cracks are likely to occur.
- the adhesive composition of the present invention may further contain various coupling agents in order to improve interfacial bonding between different kinds of materials.
- coupling agents silane-based, Forces such as tan-based and aluminum-based silane-based coupling agents are most preferred.
- the amount of the coupling agent to be added is preferably 0 to 10 parts by weight with respect to the total 100 parts by weight of the resin in view of the effect, heat resistance and cost.
- the adhesive layer in the present invention comprises (a) an epoxy resin, (b) a phenol resin, (c) an epoxy group-containing acrylic copolymer, (d) a filler, and (e) ) A composition containing a curing accelerator
- the composition preferably has components separated into two phases in the cross section of the cured product at the stage of curing.
- the term “two phases” as used herein means that the cured product has a sea-Z island structure.
- the sea-Z island structure in the present invention refers to, for example, “Polymer new material one”, when a cross section of a cured adhesive composition is polished and observed using a scanning electron microscope or the like. point polymer alloy ”means that the observed image has an inhomogeneous structure in which both the continuous phase (“ sea ”and“ u ”) and the dispersed phase (“ island ”and“ u ”) forces are observed, as described on page 16 .
- the adhesive layer in the dicing die bond sheet of the present invention has excellent moisture absorption resistance by using a phenolic resin (b) having a hydroxyl equivalent of 150 gZeq or more, and excellent stress by using an epoxy group-containing acrylic copolymer. This will provide ease of relaxation. Further, by adding the inorganic filler, the high-temperature elastic modulus and the high-temperature peel strength are increased, the effect of preventing reflow cracks works, and an adhesive composition having excellent reflow crack resistance can be obtained.
- the base film used in the dicing die bond sheet of the present invention will be described.
- the substrate film radiation-transmissive materials are preferred. Specifically, plastics, rubbers, and the like are usually preferably used, and are not particularly limited as long as they transmit radiation.
- the radiation-curable pressure-sensitive adhesive is cured, a material having good light transmission can be selected as the substrate.
- Examples of polymers that can be selected as such a base material include polyethylene, polypropylene, ethylene propylene copolymer, polybutene 1, poly 4-methylpentene 1, ethylene-vinyl acetate copolymer, and ethylene acrylate copolymer.
- ⁇ -olefins such as copolymers, ethylene methyl acrylate copolymers, ethylene acrylic acid copolymers, and ionomers.
- polyethylene polyethylene
- engineering plastics such as polyethylene terephthalate, polycarbonate, and polymethyl methacrylate
- polyurethane polyurethane
- styrene ethylene butene or pentene copolymers polyamide polyol copolymers
- polyamide polyol copolymers polyamide polyol copolymers.
- Thermoplastic elastomers such as polymers and mixtures thereof can be listed.
- polyurethane or molecular weight that minimizes necking (occurrence of partial elongation due to poor force transmission when a base film is radially stretched).
- a styrene-ethylene-butene or pentene-based copolymer having a limited styrene content For example, it is effective to use a crosslinked base film to prevent elongation or bending during dicing.
- the thickness of the base film 30 to 300 / zm is usually appropriate from the viewpoint of strength and elongation characteristics and radiation transmittance.
- the surface of the base film opposite to the side on which the radiation-curable pressure-sensitive adhesive layer is applied is textured or coated with a lubricant, blocking is prevented and friction between the pressure-sensitive adhesive tape and the jig during radial stretching of the pressure-sensitive adhesive tape is reduced. It is preferable because it has the effect of preventing necking of the base film due to this. /.
- the dicing die bond sheet of the present invention is formed by forming a pressure-sensitive adhesive layer, an adhesive layer, and a force on a base film in this order.
- the method of laminating the pressure-sensitive adhesive layer and the adhesive layer on the base film is not particularly limited.
- a pressure-sensitive adhesive layer is formed on the base film, and the adhesive is further formed on the pressure-sensitive adhesive layer according to a conventionally known method.
- the layers may be stacked.
- the pressure-sensitive adhesive layer can be provided by, for example, directly applying and drying the pressure-sensitive adhesive composition on the above-described base film. Coating and drying can be performed in the same manner as the method for forming an adhesive layer on a support film described later.
- a temporary support film (hereinafter, also referred to as “adhesive film”) on which the adhesive layer is formed in advance, and a pressure-sensitive adhesive layer
- the base film on which is formed (hereinafter, also referred to as “adhesive sheet”) is laminated so that the adhesive layer surface and the adhesive layer surface are in contact with each other, and then the temporary support film may be peeled off.
- the lamination conditions are preferably such that a linear pressure of 0.1 to 100 kgf / cm is applied at 10 to 100 ° C.
- the material contained in the adhesive layer is dissolved in a solvent!
- / ⁇ ⁇ is dispersed to form a varnish, a polytetrafluoroethylene film, and polyethylene terephthalate whose surface is subjected to a release treatment. It is obtained as an adhesive layer formed on the support film by coating, heating, drying and removing the solvent on a support film such as a film.
- the heating conditions at this time are preferably, for example, 80 to 250 ° C. for about 10 minutes to about 20 hours.
- a plastic film such as a polytetrafluoroethylene film, a polyethylene terephthalate film, a polyethylene film, a polypropylene film, a polymethylpentene film, and a polyimide film can be used.
- the film can be used after releasing the surface.
- the support film can be peeled off at the time of use and only the adhesive layer can be used, or it can be used together with the support film and removed later.
- a known method can be used, for example, a knife coating method, a roll coating method, a spray coating method, a gravure coating method, a bar coating method, a curtain coating method. And the like.
- the thickness of the adhesive layer is not particularly limited, it is preferably 3 to 300 m, more preferably 5 to 250 / zm, and more preferably 10 to 200 / zm. More preferably, it is particularly preferably 20 to 100 m. If it is thinner than 3 m, the effect of stress relaxation tends to be poor, and if it is thicker than 300 m, it is not economical.
- the solvent for the varnishing is not particularly limited, but in consideration of volatility at the time of film production, methyl ethyl ketone, acetone, methyl isobutyl ketone, 2-ethoxyethanol, toluene, xylene, and the like. It is preferable to use a solvent having a relatively low boiling point, such as butyl cellosolve, methanol, ethanol, or 2-methoxyethanol. For the purpose of improving the coating properties, a solvent having a relatively high boiling point such as dimethylacetamide, dimethylformamide, N-methylpyrrolidone, and cyclohexanone can be added.
- the present invention it is preferable to use, for example, a la, ka !, a machine, a three-roll mill, a ball mill, a bead mill, or the like in consideration of the dispersibility of the filler (d). These can be used in combination.
- a la, ka ! a machine, a three-roll mill, a ball mill, a bead mill, or the like in consideration of the dispersibility of the filler (d).
- an adhesive composition by mixing a curing accelerator (e).
- two or more adhesive layers of the present invention can be laminated to obtain a desired thickness. In this case, the adhesive layers are bonded so that the adhesive layers do not peel off from each other.
- a method of using the dicing die bond sheet of the present invention will be described with reference to Fig. 2.
- lamination is performed so that the adhesive layer 2 of the dicing die bond sheet 1 is in contact with the back surface of the semiconductor wafer 5 (1).
- dicing is performed to divide the device (2).
- the light irradiation can be appropriately selected depending on the properties of the pressure-sensitive adhesive layer 3 before or after dicing.
- the device is picked up by the pick-up means 6 to obtain an element with an adhesive layer (3). After that, it is bonded (die-bonded) to a supporting member, and a semiconductor device is obtained by applying gold wires, heating and curing, and the like.
- the dicing die bond sheet of the present invention can be used as a dicing tape when dicing by bonding to a semiconductor wafer, and when picking up, the semiconductor element and the adhesive layer are easily peeled off from the adhesive layer. Further, since the adhesive layer has sufficient adhesiveness as a die-bonding material, it enables direct die bonding of a semiconductor element.
- a radiation-curable pressure-sensitive adhesive was prepared as shown in Example 16 and Comparative Example 13 as described below, and applied on an ethylene-butyl acetate copolymer film as described below, and a pressure-sensitive adhesive tape was applied. Created. Next, an adhesive film prepared in advance as described later was bonded on the adhesive layer of the pressure-sensitive adhesive tape to prepare a dicing die bond sheet.
- Peeling force It is an index for examining the easiness of peeling of the adhered adhesive film and the adhesive tape. Before UV irradiation, the pass is about 0.8 NZ25mm or more to hold the wafer chips through the dicing process, and after UV irradiation, the pass is 0.5NZ25mm or less.
- the dicing die bond sheet was bonded to a 5-inch diameter silicon wafer heated on a hot plate at 80 ° C. for about 10 seconds, and the peeling force before and after ultraviolet irradiation was measured in accordance with JIS-0237. (90 ° peeling, peeling speed 50mm / min)
- the dicing die bond sheet was bonded to the wafer by heating at 80 ° C. for 1 hour, and then diced to 10 mm ⁇ 10 mm. Thereafter, air-cooled high-pressure mercury lamp ultraviolet rays to the adhesive layer (80WZ cm, irradiation distance 10 cm) was 200MjZcm 2 irradiated by performs pickup test by a die bonder one device (NEC Machinery Nally trade name CPS-100 fM), pickup chip The pickup success rate with 100 pieces was calculated. At this time, a device in which the picked-up element holds the adhesive layer peeled off from the pressure-sensitive adhesive layer was determined to have been successfully picked up.
- a mixture of 128 g of n-butyl acrylate, 307 g of 2-ethylhexyl acrylate, 67 g of methyl methacrylate, 1.5 g of methacrylic acid, and benzoyl peroxide as a polymerization initiator was added to 400 g of toluene as a solvent. The amount was adjusted, the reaction temperature and the reaction time were adjusted, and a solution of the compound having a functional group ((2)) was obtained.
- Adhesive composition 1-6, 11-1 12 Use for making compound (A)!
- the compound (B) which does not react the above materials was added to prepare a pressure-sensitive adhesive composition 13.
- the iodine value was calculated based on the Das method under the reaction conditions of 40 ° C for 24 hours, and the molecular weight was determined by dissolving a 1% solution in tetrahydrofuran by gel permeation.
- the value measured by mouth chromatography (trade name: 150-C ALC / GPC, manufactured by Waters) is calculated as a weight average molecular weight in terms of polystyrene.
- the hydroxyl value was calculated by the FTIR method, and the acid value was calculated according to JIS K 5407, 11.1.
- pressure-sensitive adhesive composition 1-6 and pressure-sensitive adhesive composition 11-13 was applied to a 100 ⁇ m-thick ethylene butyl acetate copolymer film so as to have a dry film thickness of 10 m. It was dried at ° C for 3 minutes to prepare adhesive tapes 16 and 11-13.
- Epoxy resin YDCN- 703 (trade name, manufactured by Toto Kasei Co., Ltd., Cresol novolac type epoxy resin, epoxy equivalent 210, molecular weight 1200, softening point 80 ° C) 55 parts by weight, phenol resin Milex XLC- LL (Mitsui Chemicals Co., Ltd., phenolic resin represented by formula (I), hydroxyl equivalent 175, water absorption 1.8%, loss of heating weight at 350% at 350%) 45 parts by weight
- a silane coupling agent NUC A-189 (trade name, manufactured by Nippon Tuker Co., Ltd., ⁇ -mercaptopropyltrimethoxysilane) 1.7 parts by weight and NUC II—1160 (trade name, manufactured by Nyukar Co., Ltd.) ⁇ -ureidopropyltriethoxysilane) 3.2 parts by weight, Aerosil R972 as a filler (Silica surface coated with dimethyldichlorosilane, hydrolyzed in
- silica average particle size: 0.016 / zm
- Akurirugo arm HTR- 860P- 3 comprising (Nagase ChemteX Corp. trade name, weight average molecular weight of 800,000) 28 0 parts by weight and 0.5 parts by weight of Curazole 2PZ-CN (trade name, manufactured by Shikoku Chemicals Co., Ltd., 1-cyanoethyl-2-phenylimidazole) as a curing accelerator, mixed with stirring, degassed under vacuum, and varnished Obtained.
- Curazole 2PZ-CN trade name, manufactured by Shikoku Chemicals Co., Ltd., 1-cyanoethyl-2-phenylimidazole
- the varnish was applied on a release-treated polyethylene terephthalate film having a thickness of 35 ⁇ m, and dried by heating at 140 ° C for 5 minutes to form a B-stage coating film having a film thickness of 10 / zm. Then, an adhesive film 1 provided with a carrier film was produced.
- the adhesive film 1 was bonded to the above-mentioned pressure-sensitive adhesive tape, and dicing die bond sheets of Examples 1 to 6 and Comparative Examples 1 to 3 as shown in Table 1 were prepared, and their characteristics were evaluated.
- Example 1-16 As shown in Example 1-16, in the dicing die bond sheet prepared by laminating the adhesive film 1 to the adhesive tape using the adhesive composition 116, the adhesive was irradiated by radiation after dicing. The peeling force of the layer is sufficiently reduced, and the element is peeled between the adhesive layer and the adhesive layer at the time of element pickup, and the pickup success rate is good. In addition, even if the entire dicing die bond sheet is irradiated with radiation after dicing with these dicing die bond sheets, the element gap can be sufficiently increased when the dicing die bond sheet is radially stretched, and each element at the time of pickup can be obtained. Was easy to recognize.
- the dicing die bond sheet prepared by laminating the adhesive film 1 to the adhesive tape using the adhesive composition 11-13 also adheres to radiation after dicing.
- the peel strength of the adhesive layer is insufficiently reduced, and the adhesive layer cannot be peeled off from the adhesive layer, so that the success rate of element pickup is extremely low.
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Abstract
Description
Claims
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HK07100539.1A HK1095427A1 (en) | 2004-03-15 | 2007-01-16 | Dicing/die boding sheet |
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US20080063871A1 (en) * | 2006-09-11 | 2008-03-13 | Jung Ki S | Adhesive film composition for semiconductor assembly, associated dicing die bonding film and semiconductor package |
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TW200727446A (en) * | 2005-03-28 | 2007-07-16 | Toshiba Kk | Stack type semiconductor device manufacturing method and stack type electronic component manufacturing method |
JP4954569B2 (ja) * | 2006-02-16 | 2012-06-20 | 日東電工株式会社 | 半導体装置の製造方法 |
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KR20060033726A (ko) | 2006-04-19 |
CN1806326A (zh) | 2006-07-19 |
SG133607A1 (en) | 2007-07-30 |
TW200533729A (en) | 2005-10-16 |
CN100411138C (zh) | 2008-08-13 |
MY138566A (en) | 2009-06-30 |
US20070026572A1 (en) | 2007-02-01 |
JP2011139077A (ja) | 2011-07-14 |
HK1095427A1 (en) | 2007-05-04 |
KR100723980B1 (ko) | 2007-06-04 |
US7517724B2 (en) | 2009-04-14 |
TWI298084B (en) | 2008-06-21 |
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