US8134084B2 - Noise-suppressing wiring-member and printed wiring board - Google Patents

Noise-suppressing wiring-member and printed wiring board Download PDF

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Publication number
US8134084B2
US8134084B2 US11/769,386 US76938607A US8134084B2 US 8134084 B2 US8134084 B2 US 8134084B2 US 76938607 A US76938607 A US 76938607A US 8134084 B2 US8134084 B2 US 8134084B2
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Prior art keywords
layer
noise suppressing
region
conductive layer
conductive
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US11/769,386
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US20080049410A1 (en
Inventor
Toshiyuki Kawaguchi
Kazutoki Tahara
Tsutomu SAGA
Mitsuaki NEGISHI
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Shin Etsu Polymer Co Ltd
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Shin Etsu Polymer Co Ltd
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Priority claimed from JP2006181179A external-priority patent/JP5138185B2/ja
Priority claimed from JP2006199286A external-priority patent/JP4916803B2/ja
Application filed by Shin Etsu Polymer Co Ltd filed Critical Shin Etsu Polymer Co Ltd
Assigned to SHIN-ETSU POLYMER CO., LTD. reassignment SHIN-ETSU POLYMER CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAWAGUCHI, TOSHIYUKI, NEGISHI, MITSUAKI, SAGA, TSUTOMU, TAHARA, KAZUTOKI
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/03—Use of materials for the substrate
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0213—Electrical arrangements not otherwise provided for
    • H05K1/0216—Reduction of cross-talk, noise or electromagnetic interference
    • H05K1/023—Reduction of cross-talk, noise or electromagnetic interference using auxiliary mounted passive components or auxiliary substances
    • H05K1/0234—Resistors or by disposing resistive or lossy substances in or near power planes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0296—Conductive pattern lay-out details not covered by sub groups H05K1/02 - H05K1/0295
    • H05K1/0298—Multilayer circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
    • H05K1/167—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed resistors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01—Dielectrics
    • H05K2201/0183—Dielectric layers
    • H05K2201/0191—Dielectric layers wherein the thickness of the dielectric plays an important role
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03—Conductive materials
    • H05K2201/0302—Properties and characteristics in general
    • H05K2201/0317—Thin film conductor layer; Thin film passive component
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03—Conductive materials
    • H05K2201/032—Materials
    • H05K2201/0326—Inorganic, non-metallic conductor, e.g. indium-tin oxide [ITO]
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09209—Shape and layout details of conductors
    • H05K2201/0929—Conductive planes
    • H05K2201/093—Layout of power planes, ground planes or power supply conductors, e.g. having special clearance holes therein
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09209—Shape and layout details of conductors
    • H05K2201/0929—Conductive planes
    • H05K2201/09309—Core having two or more power planes; Capacitive laminate of two power planes

Definitions

  • the present invention relates to a noise-suppressing wiring-member for composing a printed wiring board and the printed wiring board. Also, the present invention relates to a noise suppressing structure and a multilayer printed wiring board.
  • a central processing unit (CPU) with a high clock frequency in a sub-microwave band such as in a personal computer, personal digital electronics, local area wireless networks, Bluetooth, optical modules, mobile phones, game equipment, personal digital assistants, intelligent transport information systems, and the like, electronic equipment which utilizes a high-frequency bus, and an information communication device which utilizes an electric wave
  • a micro processing unit (MPU) will be required to have high-speed performance, multi-functions, integrated functions, and high-speed digitization performance, and in which devices will be required to offer high performance even when driven at a low-voltage, is on the horizon.
  • the printed wiring board (1) is considered that a high-frequency eddy current flowing on the surface of the copper foil can be attenuated therein, as a result of which an electric potential of power supply or the like can be stabilized and the radiation of unwanted noises can be suppressed even if semiconductor elements are simultaneously switched.
  • a high-frequency current surface current
  • a metallic film with a thickness of several micro meters, the thickness being approximately equal to the surface depth a material with a considerably high specific resistance is required depending on the frequency of the high-frequency current to be attenuated.
  • the printed wiring board (2) is considered that the high-frequency eddy current can be attenuated therein in a similar way to the above.
  • a step of forming an anisotropically conductive film with a surface roughness of copper foil equal to or greater than the surface depth is complicated
  • the printed wiring board (2) also cannot exhibit sufficient noise suppressing effects.
  • a method for suppressing radiation noise (i) a method in which an electromagnetic shielding material which reflects an electromagnetic wave is used; and (ii) a method in which an electromagnetic wave absorption material which absorbs an electromagnetic wave propagating in space is used, are exemplified.
  • a method for suppressing generation of a conduction noise and a radiation noise (iii) a method in which a high-frequency current flowing in conductors is suppressed before generating a conduction noise or a radiation noise is exemplified.
  • the radiation noise returns to oneself by unwanted radiation or reflection or the radiation noise by the shielding material.
  • the electromagnetic wave absorption material such as, for example, one disclosed in Patent Document 3 (Japanese Unexamined Patent Application, First Publication No. H9-93034 and one disclosed in Patent 4 (Japanese Unexamined Patent Application, First Publication No. H9-181476) is heavy, thick, and fragile, it is not suitable for a device required to be small and light. Also, the conduction noise cannot be suppressed by the methods (i) and (ii). Accordingly, the method (iii) has attracted attention.
  • Patent Document 1 discloses that a metallic film with a high resistance is formed on each copper foil layer composing a power supply layer or a ground layer.
  • the metallic film with a high resistance is a monolayer film or an alloy film formed by plating nickel, cobalt, tin, tungsten, and the like, which has a specific resistance higher than that of copper.
  • the metallic film with a high resistance is considered to be able to stabilize the potential variation of a power supply layer and a ground layer and suppress unwanted electromagnetic waves (radiation noise) radiated outward by eliminating the high-frequency current, even if semiconductor elements are switched.
  • Patent Document 5 Japanese Patent Publication No. 2867985 discloses a multilayer printed wiring board in which a resistive element such as carbon, graphite, or the like, is provided between a power supply layer and a ground layer at a peripheral end part of a multilayer printed wiring board.
  • the resistive element when the resistive element is provided at only the peripheral end part, only the resonance frequency is changed by varying the impedance at the peripheral end part.
  • the electric field intensity and the magnetic field intensity at other portions of the multilayer printed wiring board are enhanced. Accordingly, the radiation noise or the like, caused by resonance, cannot be suppressed still, and further countermeasures are required.
  • Patent Document 6 Japanese Patent Publication No. 2738590 discloses a capacitive printed wiring board equipped with a capacitor laminate in which a dielectric sheet is held between two conductive foil layer, the conductive foil layers being electronically connected to each device.
  • the capacitive printed wiring board is required to be thick because the capacitor laminate has a certain thickness, and therefore it is not suitable for high density mounting.
  • the capacitive printed wiring board is thick, the resonance easily occurs between conductors with a parallel flat plate structure, and thereby the generation of the radiation noise cannot be sufficiently suppressed.
  • a first aspect of the present invention relates to a wiring member containing: a copper foil layer having a smooth surface with a surface roughness Rz of 2 ⁇ m or less; a noise suppressing layer containing a metallic material or a conductive ceramic and having a thickness of 5 to 200 nm; and an insulating resin layer provided between the smooth surface of the copper foil layer and the noise suppressing layer.
  • the noise suppressing layer have a portion in which the metallic material or the conductive ceramic is absent.
  • the wiring member further contain an adhesion promoting layer provided between the smooth surface of the copper foil layer and the insulating resin layer.
  • the wiring member further contain an adhesion promoting layer provided on a surface of the noise suppressing layer, the surface being on the side opposite to a side facing the copper foil layer.
  • the insulating resin layer have a thickness of 0.1 to 10 ⁇ m.
  • a second aspect of the present invention relates to a printed wiring board containing the wiring member of the first aspect.
  • the printed wiring board contain a power supply layer composed of the copper foil layer, the noise suppressing layer, and a ground layer, the noise suppressing layer being provided between the power supply layer and the ground layer.
  • a third aspect of the present invention relates to a noise suppressing structure containing: a first conductive layer; a second conductive layer; a noise suppressing layer provided between the first conductive layer and the second conductive layer, the noise suppressing layer being to be electromagnetically-coupled with the first conductive layer, the noise suppressing layer comprising a metallic material or a conductive ceramic, and the noise suppressing layer having a thickness of 5 to 300 nm; a first insulating layer provided between the first conductive layer and the noise suppressing layer; and a second insulating layer provided between the second conductive layer and the noise suppressing layer; wherein the noise suppressing structure has: a region (I) in which the noise suppressing layer and the first conductive layer face each other; and a region (II) in which the noise suppressing layer and the first conductive layer do not face each other but the noise suppressing layer and the second conductive layer face each other, the regions (I) and (II) neighboring each other.
  • the noise suppressing layer have an area substantially equal to that of the second conductive layer.
  • the region (I) be provided at periphery end portions of the first conductive layer, and a region (III) in which the first conductive layer exists without facing the noise suppressing layer be further provided.
  • the first conductive layer may be divided into plural parts.
  • the first insulating layer have a thickness of 0.05 to 25 ⁇ m.
  • the first insulating layer have a relative dielectric constant of 2 or more.
  • the noise suppressing layer have a portion in which the metallic material or the conductive ceramic is absent.
  • the region (I) have an average width of 0.1 mm or more, the average width being calculated in accordance with the following formula (1):
  • the average width (mm) of the region (I) an area (mm 2 ) of the region (I)/a length (mm) of a boundary line between the region (I) and the region (II) (1).
  • the region (II) have an average width of 1 to 50 mm, the average width being calculated in accordance with the following formula (2):
  • the average width (mm) of the region (II) an area (mm 2 ) of the region (II)/a length (mm) of a boundary line between the region (I) and the region (II) (2).
  • a fourth aspect of the present invention relates to a multilayer printed wiring board containing the noise suppressing structure of the third aspect.
  • one of the first conductive layer and the second conductive layer be made a power supply layer, and the other be made a ground layer.
  • the multilayer printed wiring board further contain a signal transmission layer, wherein either the power supply layer or the ground layer exist between the signal transmission layer and the noise suppressing layer.
  • the noise suppressing structure serve as a capacitive laminated product.
  • FIG. 1 is a schematic cross-sectional view showing one aspect of a wiring member according to the present invention.
  • FIG. 2 is an image displayed on a field emission type scanning electron microscope observing the surface of a noise suppressing layer.
  • FIG. 3 is a schema of FIG. 2 .
  • FIG. 4 is an image displayed on a high resolution transmission electron microscope observing a cross section of the noise suppressing layer shown in FIG. 2 .
  • FIG. 5 is a schematic cross-sectional view showing one aspect of a printed wiring board according to the present invention.
  • FIG. 6 is a cross-sectional view showing one aspect of a noise suppressing structure according to the present invention.
  • FIG. 7 is a top view of the noise suppressing structure shown in FIG. 6 .
  • FIG. 8 is a top view of a noise suppressing structure, which shows a boundary line between a region (I) and a region (II).
  • FIG. 9 is a cross-sectional view showing another aspect of the noise suppressing structure according to the present invention.
  • FIG. 10 is a cross-sectional view showing another aspect of the noise suppressing structure according to the present invention.
  • FIG. 11 is a cross-sectional view showing one aspect of a multilayer printed wiring board according to the present invention.
  • FIG. 12 is a graph indicating S 21 (transmission attenuation amounts) of printed wiring boards of Example 1 and Comparative Example 3.
  • FIG. 13 is a graph indicating S 21 (transmission attenuation amounts) of printed wiring boards of Example 2 and Comparative Example 3.
  • FIG. 14 is a graph indicating S 21 (transmission attenuation amounts) of printed wiring boards of Example 3 and Comparative Example 3.
  • FIG. 15 is a graph indicating S 21 (transmission attenuation amounts) of printed wiring boards of Comparative Example 2 and Comparative Example 4.
  • FIG. 16 is a cross-sectional view showing a noise suppressing structure prepared in Examples 4 to 6.
  • FIG. 17 is a schematic diagram showing a system for measuring S parameters.
  • FIG. 18 is a graph indicating S 21 (transmission attenuation amounts) of Example 4 and Comparative Example 5.
  • FIG. 19 is a graph showing S 21 (transmission attenuation amounts) of Example 5 and Comparative Example 6.
  • FIG. 20 is a graph showing S 21 (transmission attenuation amounts) of Example 6 and Comparative Example 7.
  • FIG. 21 is a graph showing S 21 (transmission attenuation amounts) of Comparative Example 8 and Comparative Example 9.
  • FIG. 22 is a cross-sectional view showing a multilayer printed wiring board of Example 7.
  • FIG. 23 is a cross-sectional view of the multilayer printed wiring board sliced by the XVII-XVII face shown in FIG. 22 .
  • FIG. 24 is a graph showing a voltage variation of power supply layers of Example 7 and Comparative Example 10.
  • FIG. 25 is a cross-sectional view showing a noise suppressing structure of Example 8.
  • FIG. 26 is a graph showing S 21 (transmission attenuation amounts) of Examples 8 to 10.
  • An object of the present invention is to provide a wiring member for a printed wiring board, which can stabilize an electric potential of a power supply and suppress radiation of unwanted noise by suppressing resonance between a power supply layer and a ground layer caused by simultaneous switching, and also provide a printed wiring board equipped with the wiring member.
  • another object of the present invention is to provide a noise suppressing structure which can suppress generation of the conduction noise and radiation noise and can be thinned, and also to provide a multilayer printed wiring board.
  • FIG. 1 is a schematic cross-sectional view showing one aspect of the wiring member according to the present invention.
  • the wiring member 10 has a copper foil layer 11 , an insulating resin layer 12 formed on the copper foil layer 11 , and a noise suppressing layer 13 formed on the surface of the insulating resin layer 12 .
  • the copper foil layer 11 electrolytic copper foil, rolled copper foil, or the like may be used.
  • the surface of copper foil is generally treated to be roughened by adhering fine copper particles to the surface thereof for improving adherence to the insulating resin layer 12 .
  • the copper foil layer 11 according to the present invention has a smooth surface with a surface roughness Rz of 2 ⁇ m or less at a face nearing the noise suppressing layer 13 .
  • the smooth surface has a surface roughness Rz of 2 ⁇ m or less, sufficient noise suppressing effects can be exhibited by preventing the occurrence of defects such as pinholes caused by the surface-roughness of the copper foil layer 11 in the insulating resin layer 12 and preventing a short-circuit between the copper foil layer 11 and the noise suppressing layer 13 , even if the insulating resin layer 12 is thinly formed.
  • the surface roughness Rz means a ten point average roughness Rz determined in accordance with JIS B 0601-1994.
  • electrolytic copper foil is particularly preferable.
  • the electrolytic copper foil is obtained by precipitating copper on the surface of a cathode rotating drum using an electrolytic reaction, followed by separating the formed copper film from the rotating drum.
  • One surface of the obtained film contacting the drum is a smooth surface in which the surface condition of the drum is transferred.
  • the other surface on which the copper is electrolytic precipitated is a rough surface because the crystal growth rates of the copper precipitating in each crystal face are different from each other. Such a rough surface is favorable for adhering it to another insulating resin layer (which is not shown).
  • the thickness of the copper foil layer 11 be within the range of 3 to 50 ⁇ m.
  • the insulating resin layer 12 is a layer composed of a resin composition or a layer composed of a fiber-reinforced resin in which a resin composition is immersed in reinforcing-fiber such as glass fiber or the like.
  • the state of the fiber-reinforced resin may be at a B-stage (semi-cured state) or at a C-stage (cured state).
  • the resin composition is a composition mainly containing a resin.
  • a resin one having a thermal resistance for enduring heat at a time of preparing a printed wiring board, the thermal resistance being required for the printed wiring board, or one of which characteristic values required for designing a printed wiring board, such as dielectric constant, dielectric loss tangent, or the like, are known, is preferably used.
  • the resin include polyimide resin, epoxy resin, bismaleimide-triazine resin, polytetrafluoroethylene, polyphenylene ether, and the like.
  • the resin composition one containing an epoxy resin, and, as needed, a hardener, hardening accelerator, flexibility-imparting agent, or the like is preferable.
  • the epoxy resin examples include bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, novolac type epoxy resin, cresol novolac type epoxy resin, alicyclic epoxy resin, bromine epoxy resin, glycidylamine type epoxy resin, and the like.
  • the content of the epoxy resin is preferably within the range of 20 to 80% by mass with respect to 100% by mass of the resin composition.
  • hardener examples include: dicyandiamides; imidazoles; amines such as aromatic amines; phenols such as bisphenol A, bromine bisphenol A, and the like; novolac resins such as phenol novolac resins, cresol novolac resins, and the like; acid anhydrides such as phthalic anhydride, and the like.
  • hardening accelerator examples include tertiary amines, imidazole-based hardening accelerators, urea-based hardening accelerators, and the like.
  • flexibility-imparting agent examples include polyether sulphone resins, aromatic polyamide resins, elastomeric resins, and the like.
  • aromatic polyamide resins examples include ones synthesized by polycondensation of aromatic diamine and dicarboxylic acid.
  • aromatic diamine examples include 4,4′-diaminodiphenylmethane, 3,3′-diaminodiphenylsulphone, m-xylenediamine, 3,3′-oxydianiline, and the like.
  • dicarboxylic acid examples include phthalic acid, isophthalic acid, terephthalic acid, fumaric acid, and the like.
  • the elastomeric resin examples include natural rubber, styrene-butadiene rubber, butadiene rubber, butyl rubber, ethylene-propylene rubber, and the like.
  • a nitrile rubber, chloroprene rubber, silicone rubber, or urethane rubber may be used together.
  • a carboxy-terminated butadiene nitrile rubber (CTBN) is preferable.
  • the insulating resin layer 12 is formed, for example, by applying a varnish in which a resin composition is dissolved or dispersed in a solvent on the copper foil layer 11 (or the adhesion promoting layer 15 described below) and then drying.
  • the varnish is applied and dried in two or more times, and the insulating resin layer may be formed in two or more layers. Each layer may be formed by a varnish identical to or different from each other.
  • the thickness of the insulating resin layer 12 be within the range of 0.1 to 10 ⁇ m.
  • the thickness of the insulating resin layer 12 is 0.1 ⁇ m or more, sufficient insulation between the copper foil layer 11 and the noise suppressing layer 13 can be maintained, and the short-circuit between the copper foil layer 11 and the noise suppressing layer 13 can be suppressed, as a result of which sufficient noise suppressing effects can be realized. Also, the noise suppressing layer 13 is not affected by etching the copper foil layer 11 for patterning.
  • the thickness of the insulating resin layer 12 is 10 ⁇ m or less, the printed wiring board equipped with the wiring member can be thinned.
  • the noise suppressing layer 13 gets closer to the copper foil layer 11 , as a result of which the noise suppressing layer 13 is electromagnetically-coupled with the copper foil layer 11 tightly, and thereby sufficient noise suppressing effects can be exhibited. Also, the insulating resin layer 12 can be easily removed when patterning is performed on the noise suppressing layer 13 from the side near the copper foil layer 11 , and thereby time required for processing is shortened.
  • the noise suppressing layer 13 is a thin film containing a metallic material or a conductive ceramic, and the thickness thereof is 5 to 300 nm.
  • the thickness of the noise suppressing layer 13 When the thickness of the noise suppressing layer 13 is 5 nm or more, sufficient noise suppressing effects can be exhibited. On the other hand, when the thickness of the noise suppressing layer 13 is 300 nm or less, a microcluster as described below is not grown to form a uniform thin film composed of a metallic material or the like. When such a uniform thin film is formed, the surface resistance decreases, and the metal reflection increases, as a result of which the noise suppressing effects decrease.
  • the thickness of the noise suppressing layer 13 is determined by averaging values of the thickness of the noise suppressing layer measured at five points (dense portions) on an image taken by a high resolution transmission electron microscope (see, for example, FIG. 4 ) observing a cross-section in the thickness-direction of the noise suppressing layer.
  • the surface resistance of the noise suppressing layer 13 is preferably within the range of 1 ⁇ 10 0 to 1 ⁇ 10 4 ⁇ .
  • a limited material with a high volume specific resistance is required.
  • the surface resistance can be enhanced, by forming a portion in which the metallic material or the conductive ceramic is absent in the noise suppressing layer 13 to provide a physical defect which results in formation of an uneven thin film, or by making a sequencing product of a microcluster described below.
  • the surface resistance of the noise suppressing layer 13 is determined as described below.
  • the surface resistance is measured between two thin film metallic electrodes (with a length of 10 mm, a width of 5 mm, and an inter-electrode distance of 10 mm) with a measurement current of 1 mA or less while pressing a measuring product with the electrodes at a constant load of 50 g/cm 2 , for example, the electrodes being placed with an interval of a unit length, and being formed by depositing gold or the like onto silica glass.
  • the metallic material examples include a ferromagnetic metal, a paramagnetic metal, and the like.
  • the ferromagnetic metal include: iron, carbonyl iron; iron alloys such as Fe—Ni, Fe—Co, Fe—Cr, Fe—Si, Fe—Al, Fe—Cr—Si, Fe—Cr—Al, Fe—Al—Si, Fe—Pt, and the like; cobalt, nickel; alloys thereof, and the like.
  • paramagnetic metal examples include a gold, silver, copper, tin, lead, tungsten, silicon, aluminium, titanium, chromium, molybdenum, alloys thereof, amorphous alloys, alloys thereof with the ferromagnetic metal, and the like.
  • nickel, iron chromium alloys, tungsten, and noble metals are preferable because they have a resistance to acidification. Because the noble metals are expensive, a nickel, nickel chromium alloys, iron chromium alloys, and tungsten are preferable in terms of practical use, and nickel and nickel alloys are particularly preferable.
  • the conductive ceramic examples include alloys, intermetallic compounds, solid solutions, and the like, composed of a metal and at least one element selected from the group consisting of boron, carbon, nitrogen, silicon, phosphorus, and sulfur.
  • Specific examples thereof include nickel nitride, titanium nitride, tantalum nitride, chromium nitride, zirconium nitride, titanium carbide, zirconium carbide, chromium carbide, vanadium carbide, molybdenum carbide, tungsten carbide, silicon carbide, chromium boride, molybdenum boride, molybdenum silicide, zirconium silicide, and the like.
  • the noise suppressing layer containing the conductive ceramic does not extremely decrease the characteristic impedance. Accordingly, the metal reflection in the noise suppressing layer decreases. Also, the conductive ceramic does not have a particular resonance frequency, the range of the frequency realizing the noise suppressing effects is wide. Also, some advantages such as high chemical stability and storage stability can be realized.
  • the conductive ceramic nitrides or carbides, which are easily prepared using a reactive gas such as a nitrogen gas, methane gas, or the like, in accordance with a physical deposition process described below, are particularly preferable.
  • the method for forming the noise suppressing layer 13 As the method for forming the noise suppressing layer 13 , a conventional wet plating process, a physical deposition process, a chemical deposition process, or the like can be used. By these processes, although depending on conditions or materials used, an uneven thin film with a fine physical defect can be formed without forming any even thin film by ending the growth of the thin film at an early stage. Also, the uneven thin film can be formed by a process in which a defect is provided on an even thin film by performing etching with an acid or the like, or by performing laser ablation.
  • FIG. 2 shows an image taken by a field emission type scanning electron microscope observing the surface of the noise suppressing layer formed by physically depositing the metallic material on the surface of the insulating resin layer
  • FIG. 3 is a schema thereof.
  • the noise suppressing layer 13 is observed as an aggregation of plural microclusters 14 .
  • the microclusters 14 are formed by extremely thinly and physically depositing the metallic material on the (first) insulating resin layer 12 (or the second insulating layer 12 ′). Between the microclusters 14 , there are physical defects, and no even thin film is formed. Although the microclusters 14 contact with each other to agglomerate, there are many defects, that is, portions in which no metallic material is present between the agglomerated microclusters 14 .
  • FIG. 4 shows an image taken by a high resolution transmission electron microscope observing a cross-section of the noise suppressing layer 13 in the thickness-direction.
  • crystal lattices microclusters
  • metallic atoms are arranged as extremely fine crystals with a several ⁇ intervals, and portions in which any metallic materials are absent in an extremely small area. That is, there are vacant spaces between the microclusters and an even thin film composed of the metallic material is not formed.
  • the state with such a defect can be recognized by checking the relationship between the volume specific resistance R 1 ( ⁇ cm) calculated from the actual measurement value of the surface resistance of the noise suppressing layer 13 and the volume specific resistance R 0 ( ⁇ cm) (value disclosed in literature) of the metallic material (or conductive ceramic). That is, excellent noise suppressing effects can be exhibited when the volume specific resistance R 1 and the volume specific resistance R 0 satisfy the following formula: 0.5 ⁇ log R 1 ⁇ log R 0 ⁇ 3.
  • the noise suppressing layer 13 may be patterned to a predetermined shape, and be provided with an anti-pad such as a through hole.
  • the noise suppressing layer 13 may be processed to a predetermined shape by a conventional etching process, laser ablation process, or the like.
  • an adhesion promoting layer 15 be formed on the smooth surface of the copper foil layer 11 .
  • the adhesion promoting layer 15 may be formed by treating the smooth surface of the copper foil layer 11 with an adhesion promote.
  • adhesion promoter include silane coupling agents, titanate coupling agents, and the like.
  • silane coupling agents examples include vinyl triethoxy silane, vinyl tris(2-methoxyethoxy)silane, 3-methacryloxy propyl trimethoxy silane, 3-glycidoxy propyl trimethoxy silane, 2-(3,4-epoxy cyclohexyl)ethyl trimethoxy silane, N-2-(aminoethyl)3-amino propyl trimethoxy silane, N-2-(aminoethyl)3-aminopropyl methyl dimethoxy silane, 3-aminopropyl triethoxy silane, N-phenyl-3-aminopropyl trimethoxy silane, 3-mercaptopropyl trimethoxy silane, 3-chloropropyl trimethoxy silane, and the like.
  • titanate coupling agents examples include isopropyl triisostearoyl titanate, isopropyl tris(dioctyl pyrophosphate) titanate, isopropyl tri(N-aminoethyl-aminoethyl)titanate, tetraoctylbis(di-tridecyl phosphate)titanate, bis(dioctyl pyrophosphate)oxyacetate titanate, bis(dioctyl pyrophosphate)ethylene titanate, isopropyl trioctanoyl titanate, isopropyl dimethacryl isostearoyl titanate, isopropyl isostearoyl diacryl titanate, tetraisopropyl bis(dioctyl phosphate)titanate, and the like.
  • 3-glycidoxypropyltrimethoxysilane is generally used.
  • 3-mercaptopropyltrimethoxysilane is preferably used.
  • an applying method an immersing method, a showering method, a spraying method, or the like, may be used.
  • another adhesion promoting layer (which is not shown in the drawings) may be formed on the noise suppressing layer 13 so as to enhance the adhesiveness of the noise suppressing layer 13 to another insulating resin layer (which is also not shown in drawings).
  • the adhesion promoting layer may be formed by a method in which the above-mentioned silane coupling agent or titanate coupling agent is applied, or a method in which an epoxy resin or the like, in which the coupling agent is integrally blended, is applied.
  • the adhesion promoting layer may be formed after patterning the noise suppressing layer 13 .
  • a printed wiring board according to the present invention contains the wiring member according to the present invention.
  • the copper foil serves as a signal transmission layer, power supply layer, or ground layer.
  • the copper foil of the wiring member preferably serves as the power supply layer or the ground layer, and more preferably serves as the power supply layer.
  • the noise suppressing layer is preferably formed between the power supply layer and the ground layer.
  • FIG. 5 is a schematic cross-sectional view illustrating one aspect of the printed wiring board according to the present invention.
  • a signal transmission layer 21 which is patterned
  • a ground layer 22 which covers almost the entire surface of the printed wiring board 20
  • a power supply layer 23 which supplies almost the entire surface of the printed wiring board 20
  • another signal transmission layer 21 which is also patterned are laminated in this order from the top via insulating layers 24 .
  • the power supply layer 23 is the copper foil layer 11 of the wiring member 10 .
  • a noise suppressing layer 13 with almost the same size as that of the ground layer 22 is formed via the insulating resin layer 12 .
  • the power supply layer 23 is divided into two parts, and the divided parts are insulated from each other.
  • the printed wiring board 20 is manufactured as described below.
  • a prepreg prepared by immersing an epoxy resin or the like into a glass fiber or the like is hardened while holding it between the wiring member 10 and another copper foil layer to construct the copper foil layer 11 of the wiring member 10 as the power supply layer 23 , the another copper foil layer as the ground layer 22 , and a layer formed by the prepreg as the insulating layer 24 .
  • the copper foil layer 11 of the wiring member 10 is etched to provide a predetermined shape (two-division pattern) by a photolithography method.
  • the noise suppressing layer 13 is not injured by etching, because the insulating resin layer 12 exhibits resistance to an etching solution, and the insulating resin layer 12 does not have any pinholes or the like.
  • Copper foil is adhered to both outermost surfaces of the power supply layer 23 and the ground layer 22 , both being cores, using the prepreg to form signal transmission layers 21 .
  • the wiring member according to the present invention as described above includes the copper foil layer with a smooth surface having a surface roughness Rz of 2 ⁇ m or less, the noise suppressing layer containing a metal or a conductive ceramic with a thickness of 5 to 200 nm, and the insulating resin layer formed between the smooth surface of the copper foil layer and the noise suppressing layer, sufficient insulation can be realized between the copper foil layer and the noise suppressing layer.
  • the noise suppressing layer attenuates the high-frequency current directed into the power supply layer by simultaneous switching, and suppresses the generation of resonance between the power supply layer and the ground layer. As a result, the radiation of the noise from peripheral end parts of the board can be suppressed.
  • FIG. 6 is a cross-sectional view illustrating one aspect of the noise suppressing structure according to the present invention
  • FIG. 7 is a top view thereof.
  • the noise suppressing structure 110 has a first conductive layer 111 , a second conductive layer 112 , a noise suppressing layer 113 formed between the first conductive layer 111 and the second conductive layer 112 , a first insulating layer 114 formed between the first conductive layer 111 and the noise suppressing layer 113 , and a second insulating layer 115 formed between the second conductive layer 112 and the noise suppressing layer 113 .
  • the noise suppressing layer 113 is electromagnetically-coupled with the first conductive layer 111 .
  • the term “electromagnetically-coupled” means a state caused by a current flowing into the first conductive layer 111 , in which the current generates a magnetic flux which intersects with the noise suppressing layer 113 , and thereby a voltage is induced.
  • the noise suppressing layer 113 is required to be electromagnetically-coupled with the first conductive layer 111 via the first insulating layer 114 without electrically connecting to the first conductive layer 111 .
  • the noise suppressing structure 110 includes a region (I) in which the noise suppressing layer 113 and the first conductive layer 111 face each other, and a region (II) in which the noise suppressing layer 113 and the first conductive layer 111 do not face each other, but the noise suppressing layer 113 and the second conductive layer 112 face each other, the region (I) and the region (II) neighboring each other.
  • noise suppressing structure 110 Since the noise suppressing structure 110 has the regions (I) and (II) neighboring each other, noise suppressing effects can be realized. The reason for this is assumed as follows.
  • the noise suppressing layer 113 has fine conductive paths such as microclusters as described below.
  • the conductive paths have plural fine and complicated open stub structures provided on the second conductive layer 112 in the region (II).
  • the open stub structures serve as a transmission-line filter by electromagnetically-coupling to the first conductive layer 111 in the neighboring region (I).
  • the noise suppressing layer 113 and the first conductive layer 111 do not face each other, but the noise suppressing layer 113 and the second conductive layer 112 face each other. Also, in the region (I), it is required that the noise suppressing layer 113 and the first conductive layer 111 face each other, and the noise suppressing layer 113 electromagnetically-couples with the first conductive layer 111 .
  • the average width of the region (I) calculated in accordance with the following formula (1) be 0.1 mm or more so that the noise suppressing layer 113 is sufficiently electromagnetically-coupled with the first conductive layer 111 .
  • the average width of the region (I) (mm) is equal to the area of the region (I) (mm 2 ) divided by the length of the boundary line between the region (I) and the region (II) (mm).
  • the upper limit of the average width of the region (I) depends on the size of the first conductive layer 111 , and is an arbitrary value.
  • the length of the boundary line between the region (I) and the region (II) is a length of the boundary line (thick line shown in FIG. 8 as the reference number of 116 ) between the region (I) in which the first conductive layer 111 exists and the region (II) in which the first conductive layer 111 does not exist and therefore the first insulating layer 114 appears on the surface thereof.
  • the average width of the region (II) calculated in accordance with the following formula (2) be within the range of 1 to 50 mm.
  • the average width of the region (II) (mm) is equal to the area of the region (II) (mm 2 ) divided by the length of the boundary line between the region (I) and the region (II) (mm).
  • the noise suppressing effects can be realized in a low frequency region of 100 MHz or less.
  • the average width of the region (II) exceeds 50 nm, the area of the region (II) increases with respect to realized noise suppressing effects, and thereby the size of the noise suppressing structure 110 is unnecessarily enlarged, which may affect high density mounting. Also, there is a possibility in which the impedance of the first conductive layer 111 may be enhanced.
  • the area of the region (II) is not sufficient, and thereby the noise suppressing effects are small.
  • both of the noise suppressing layer 113 and the second conductive layer 112 have their largest size in the noise suppressing structure 110 .
  • the area of the noise suppressing layer 113 be substantially the same as that of the second conductive layer 112 (approximately 80 to 100% of the area of the second conductive layer 112 ).
  • FIG. 9 shows one aspect of the noise suppressing structure 110 having a region (I) in which periphery end portions of the first conductive layer 111 exist and a region (III) in which the first conductive layer 111 exists but the first conductive layer 111 does not face the noise suppressing layer 113 . Since the high-frequency current flowing into the first conductive layer 111 concentrates on the periphery end portions by edge effects, the noise suppressing layer 113 can be effectively electromagnetically-coupled with the first conductive layer 111 at the periphery end portions thereof. Also, existence of the region (III) makes it easy to form a through hole or via hole insulated from the noise suppressing layer 113 . The area of the region (I), that is, the noise suppressing effect is not effected by forming the through hole or the via hole.
  • FIG. 10 shows one aspect of the noise suppressing structure 110 in which the first conductive layer 111 is divided into two parts, that is, the first conductive layer 111 a and the first conductive layer 111 b .
  • the first conductive layer 111 is divided in such a way, even if the region (II) is narrow, an area of the first conductive layer 111 b is deemed as the region (II) from the standpoint of the first conductive layer 111 a . Accordingly, sufficient noise suppressing effects can be realized even if the region (II) has a limitation.
  • an area of the first conductive layer 111 a is deemed as the region (II) from the standpoint of the first conductive layer 111 b .
  • the first conductive layer 111 is divided in consideration of the difference between a digital circuit and an analog circuit, difference in the frequency, voltage, function, or the like.
  • each conductive layer a metallic foil; a film of conductive particle dispersion in which metal particles are dispersed in a polymeric binder, glass binder, or the like; or the like, can be exemplified.
  • the metal include copper, silver, gold, aluminium, nickel, tungsten, and the like.
  • Each conductive layer serves in a multilayer printed circuit board as a signal transmission layer, power supply layer, or ground layer, and is generally a copper foil layer.
  • the thickness of the copper foil layer is generally within the range of 3 to 35 ⁇ m.
  • the copper foil layer may be subjected to a roughening treatment for improving the adhesiveness to the insulating layer or a chemical conversion treatment using a silane coupling agent or the like.
  • the noise suppressing layer of the noise suppressing structure is substantially equal to the noise suppressing layer of the wiring member described above with reference to FIGS. 2 to 4 .
  • the insulating layer is a layer composed of a dielectric material having a surface resistance of 1 ⁇ 10 6 ⁇ or more.
  • a material forming the insulating layer may be an inorganic material or organic material, provided that the material is a dielectric material.
  • the inorganic material examples include ceramics such as aluminium oxide, aluminium nitride, silicon oxide, silicon nitride, and the like, foamed ceramics, and the like.
  • ceramics such as aluminium oxide, aluminium nitride, silicon oxide, silicon nitride, and the like
  • foamed ceramics and the like.
  • the organic material examples include: resins such as polyolefin, polyamide, polyester, polyether, polyketone, polyimide, polyurethane, polysiloxane, polysilazane, phenol resin, epoxy resin, acryl resin, polyacrylate, vinyl chloride resin, chlorinated polyethylene, and the like; diene rubbers such as natural rubber, isoprene rubber, butadiene rubber, styrene-butadiene rubber, and the like; non-diene rubbers such as butyl rubber, ethylene-propylene rubber, urethane rubber, silicone rubber, and the like.
  • the organic material may be thermoplastic or thermosetting, and may be an unhardened material thereof. Also, the organic material may be a denatured material, mixture, or copolymer of the above-mentioned resins.
  • the insulating layer When the insulating layer is composed of an organic material, the insulating layer has a complicated surface structure in nano level due to the morphology of the organic polymer material. Accordingly, aggregation of the microclusters is suppressed and an uneven aggregation structure of the microclusters are easily held, as a result of which a noise suppressing layer which can realize great noise suppressing effects can be obtained.
  • a layer with a surface having a group containing an element that realizes covalent binding to a metal, such as oxygen, nitrogen, sulfur, or the like, and a layer with a surface activated by radiating ultraviolet rays, plasma, or the like, thereto, are preferable in view of the adhesiveness to the clusters, and the capability of stabilizing dispersion of microclusters by suppressing aggregation and growing of the microcluster.
  • Examples of the group containing an element such as oxygen, nitrogen, sulfur, or the like include hydrophilic groups such as a hydroxy group, carboxyl group, ester group, amino group, amide group, thiol group, sulfone group, carbonyl group, epoxy group, isocyanate group, alkoxy group, and the like.
  • the thickness of the first insulating layer 114 be thinner than that of the second insulating layer 115 so that the noise of the first conductive layer 111 is suppressed.
  • the thickness of the first insulating layer 114 is preferably within the range of 0.05 to 25 ⁇ m. When the thickness of the first insulating layer 114 is 0.05 ⁇ m or more, the insulation between the noise suppressing layer 113 and the first conductive layer 111 is ensured and the noise suppressing effects are sufficiently exhibited. Also, the divided first conductive layer 111 (such as, for example, the first conductive layers 111 a and 111 b shown in FIG. 10 ) does not short-circuit.
  • the noise suppressing layer 113 is protected from an etching liquid or the like.
  • the thickness of the first insulating layer 114 is 25 ⁇ m or less, the noise suppressing layer 113 is sufficiently electromagnetically-coupled with the first conductive layer 111 . Also, the noise suppressing structure 110 can be thinned.
  • the relative dielectric constant of the first insulating layer 114 is preferably 2 or more, and more preferably 2.5 or more. When the relative dielectric constant of the first insulating layer 114 is 2 or more, the dielectric constant of the first insulating layer 114 sufficiently increases to form electromagnetic bonding between the noise suppressing layer 113 and the first conductive layer 111 .
  • the maximum value of the relative dielectric constant of current usable materials is 100,000.
  • the noise suppressing structure 110 can be considered a capacitive laminated product composed of the first conductive layer 111 and the second conductive layer 112 .
  • the noise suppressing structure 110 has a function as a capacitive laminated product, the same effects as those obtained by using in combination a bypass condenser, of which effects are conventionally recognized, are exhibited in a low frequency region of 1 GHz or less. Accordingly, the noise suppressing structure 110 can exhibit the noise suppressing effects in a wide region from a low frequency to a high frequency of ten and several GHz.
  • the area of the first conductive layer 111 is enlarged, or the distance between the first conductive layer 111 and the second conductive layer 112 is narrowed.
  • a conventional method may be selected depending on the material used.
  • a physical vapor deposition (PVD) method, a chemical vapor deposition (CVD) method, or the like, such as a sol-gel method, sputtering method, or the like may be used.
  • a method in which a resin solution is directly applied on a conductive layer by performing spin coating, spray coating, or the like a method in which an insulating layer gravure-coated on a base material with a releasability is transferred onto a conductive layer, or the like, may be used.
  • the noise suppressing structure 110 as described above exhibits excellent noise suppressing effects, because the noise suppressing layer 113 is a layer electromagnetically-coupled with the first conductive layer 111 , containing a metallic material or conductive ceramic, and having a thickness of 5 to 300 nm, and the noise suppressing layer 113 and the first conductive layer 111 face each other at the region (I), but the noise suppressing layer 113 and the first conductive layer 111 do not face each other at the region (II) in which the noise suppressing layer 113 and the second conductive layer 112 face each other, the region (I) and region (II) neighboring each other.
  • the noise suppressing structure 110 is not bulky and can be thinned, because the noise suppressing layer 113 is very thin.
  • the noise suppressing structure according to the present invention When the noise suppressing structure according to the present invention is incorporated in an electronic element, the high-frequency current flowing into the conductive layer of the electronic element, which causes the conduction noise, can be suppressed, as a result of which the radiation noise can be obviated.
  • the electronic element is equipped with conductors used for signal transmission, power supply, ground, or the like, and examples thereof include a semiconductor element, a semiconductor package such as a system-in-package (SIP) in which an electronic element such as the semiconductor element is mounted, a printed circuit board, and the like.
  • SIP system-in-package
  • a multilayer printed circuit board in which a semiconductor element is mounted is required to maintain the quality of waveform flowing to the signal transmission layer (signal integrity (SI)) on one hand, and required to decrease the power supply voltage so as to decrease electrical power consumption on the other hand, and thereby the signal to noise ratio (SN ratio) of a transmission signal deteriorates. Accordingly, it is required to stabilize the power supply (power integrity (PI)), and the suppression of high-frequency current is required. It is useful to apply the noise suppressing structure according to the present invention for the multilayer printed circuit board.
  • SI signal integrity
  • SN ratio signal to noise ratio
  • the multilayer printed circuit board according to the present invention includes the noise suppressing structure according to the present invention.
  • the conductor of the noise suppressing structure serves as a signal transmission layer, power supply layer, or ground layer.
  • the conductor of the noise suppressing structure serves as a signal transmission layer, power supply layer, or ground layer.
  • the noise suppressing layer deteriorates fast pulse signal of the signal transmission layer by suppressing high-frequency components. Accordingly, it is preferable that either the power supply layer or the ground layer exists between the signal transmission layer and the noise suppressing layer.
  • Each thickness of the signal transmission layer, power supply layer, and ground layer is generally equal to that of the copper foil layer, and is generally within the range of 3 to 35 ⁇ m.
  • the thickness of a prepreg or an adhesive sheet, which is to compose the second insulating layer is generally within the range of 3 ⁇ m to 1.6 mm. In order to thin the multilayer printed circuit board, every layer tends to be thin.
  • the multilayer printed circuit board may be prepared as follows, for example.
  • An epoxy varnish or the like is applied on a copper foil layer, and then dried and hardened to form a power supply layer on which the first insulating layer is formed.
  • the noise suppressing layer is formed, and then etched to a predetermined pattern.
  • a prepreg prepared by immersing an epoxy resin or the like in a glass fiber or the like and copper foil are laminated on the noise suppressing layer, followed by hardening the prepreg to form a core with the power supply layer and the ground layer (noise suppressing structure).
  • the power supply layer or the ground layer on the core is etched to a predetermined pattern by a photolithography process.
  • copper foil is adhered to both outermost surfaces of the power supply layer and the ground layer through the prepreg to form each signal transmission layer, and thus a four-layered printed circuit board is obtained.
  • FIG. 11 is a cross-sectional view showing one aspect of the multilayer printed circuit board according to the present invention.
  • the multilayer printed circuit board 120 is composed of a signal transmission layer 121 , an insulating layer 122 , a ground layer 123 (second conductive layer 112 ), an insulating layer 124 (second insulating layer 115 ), a noise suppressing layer 113 , an insulating layer 125 (first insulating layer 114 ), a power supply layer 126 (first conductive layer 111 ), an insulating layer 127 , and a signal transmission layer 128 , in this order from the top thereof.
  • the signal transmission layer 121 and the signal transmission layer 128 are connected through a through hole 131 .
  • a power supply line 132 and the power supply layer 126 is connected through a via hole 133 .
  • a ground line 134 and the ground layer 123 are connected through a via hole 135 .
  • an electronic element 141 such as a semiconductor element or the like and a bypass condenser 142 are mounted on the power supply line 132 and the ground line 134 .
  • the noise suppressing layer 113 and the power supply layer 126 face each other at the region (I), but the noise suppressing layer 113 and the power supply layer 126 (first conductive layer 111 ) do not face each other at the region (II) in which the noise suppressing layer 113 and the ground layer 123 (second conductive layer 112 ) face each other. Since the region (I) and the region (II) neighbor each other, the high-frequency current is suppressed, and the electric potential of the power supply layer 126 is stabilized, as a result of which the conduction noise such as simultaneous switching noise or the like, and the radiation noise caused by resonance can be suppressed.
  • the wiring member according to the present invention can stabilize the electric potential of the power supply and suppress the radiation of the unwanted noise by suppressing resonance between the power supply layer and the ground layer caused by simultaneous switching in a printed wiring board.
  • the resonance between the power supply layer and the ground layer caused by the simultaneous switching is suppressed, the electric potential of the power supply is stabilized, and the radiation of the unwanted noise is suppressed.
  • the noise suppressing structure and the multilayer printed wiring board according to the present invention the generation of the conduction noise and the radiation noise is suppressed. Also, the noise suppressing structure and the multilayer printed wiring board can be thinned.
  • the thickness of a noise suppressing layer was measured at five points by observing a cross section of the noise suppressing layer using a transmission electron microscope manufactured by Hitachi, Ltd., under the trade name of H9000NAR and the measured values were averaged.
  • the strength required for peeling a copper foil layer of a wiring member from an insulating resin layer was measured at a peeling rate of 50 mm/minutes and a peeling angle of 90° using a Tensilon tensile tester in accordance with JIS C5012.
  • a two-layered board composed of a ground layer and a power supply layer was prepared. At both ends of one of the power supply layer divided in two, SMA connectors linking to the power supply layer and the ground layer are mounted. S 21 (transmission attenuation amount, unit: dB) was measured in accordance with a scattering parameter (S parameter) method using a network analyzer (manufactured by Anritsu Company under the trade name of 37247D) connected to the SMA connectors, and the resonance state of the S 21 parameters was checked. When the noise suppressing effects were exhibited, the attenuation amount in the resonance frequency increases, and the graph illustrating the relationship between the attenuation amount and frequency becomes smooth.
  • S parameter scattering parameter
  • the resistance between the two divided power supply layers was measured by applying a measuring voltage at 50V while putting probes on each of the divided two power supply layers using a super insulation meter manufactured by DKK-TOA CORPRATION under the trade name of SM-8210.
  • An electrolytic copper foil layer with a thickness of 35 ⁇ m had a smooth surface and a roughened surface.
  • the surface roughness Rz of the smooth surface was 2 ⁇ m.
  • the surface roughness Rz of the roughened surface was 5.3 ⁇ m.
  • a solution containing 1% by mass of 3-glycidoxypropyltrimethoxysilane was applied and dried to form an adhesion promoting layer.
  • the varnish of the resin composition was applied on the adhesion promoting layer using a gravure coater so that a coating film with a thickness of 10 ⁇ m was formed after being dried. After the coating film was dried in air for 15 minutes, the coating film was hardened by heating it at 150° C. for 15 minutes to form an insulating resin layer.
  • a nickel metal was physically deposited on a whole area of the insulating resin layer by an EB deposition process.
  • the insulating resin layer was further hardened by heating it at 150° C. for 45 minutes to form an uneven noise suppressing layer with a thickness of 15 nm having a surface shown in FIG. 2 .
  • a wiring member with a total thickness of 45 ⁇ m was obtained.
  • Strip specimens with a width of 10 mm and a length of 100 mm were cut off from the wiring member. Three sheets of the strip specimens were arranged in a width direction of a prepreg with a width of 35 mm, a length of 50 mm, and a thickness of 1 mm, and the strip specimens and the prepreg were adhered to each other by applying pressure, followed by measuring the peeling strength (adhesive strength) and observing the peeled state. Results thereof are shown in Table 1. The peeling strength was calculated by averaging three values of the strip specimens.
  • the wiring member was integrated with copper foil with a thickness of 35 ⁇ m via the prepreg with a thickness of 0.2 mm to prepare a two-layered board.
  • a specimen with the dimensions of 74 mm ⁇ 160 mm was cut off from the two-layered board.
  • the wiring member side of the copper foil of the specimen was etched to divide a power supply layer in two portions with the dimensions of 36.5 mm ⁇ 160 mm, the divided portions being placed with an interval of 1 mm.
  • Each size of the noise suppressing layer and the ground layer was 74 mm ⁇ 160 mm.
  • the resistance between the power supply layers of the specimen was measured. Results thereof are shown in Table 1.
  • S 21 of the specimen was measured in accordance with a S parameter method. Results thereof are shown in FIG. 12 .
  • An electrolytic copper foil layer with a thickness of 18 ⁇ m had a smooth surface with a surface roughness Rz of 0.4 ⁇ m and a roughened surface with a surface roughness Rz of 5.3 ⁇ m.
  • a solution containing 1% by mass of 3-mercaptopropyltrimethoxysilane was applied and dried to form an adhesion promoting layer.
  • the varnish A was applied on the adhesion promoting layer so that a coating film with a thickness of 1 ⁇ m was formed after being dried. After the coating film was dried in air for 10 minutes, the coating film was hardened by heating it at 160° C. for 10 minutes to form an insulating resin layer A.
  • the varnish B was applied on the insulating resin layer A using a gravure coater so that a coating film with a thickness of 2 ⁇ m was formed after being dried. After the coating film was dried in air for 10 minutes, the coating film was hardened by heating it at 150° C. for 15 minutes to form an insulating resin layer B.
  • a tantalum metal was physically deposited on a whole area of the insulating resin layer B while inpouring nitrogen therein by a magnetron sputtering process.
  • the insulating resin layer was further hardened by heating it at 150° C. for 45 minutes to form an uneven noise suppressing layer with a thickness of 20 nm.
  • a wiring member with a total thickness of 21 ⁇ m was obtained.
  • the wiring member was evaluated by measuring the peeling strength and observing the peeled state thereof in the same way as that of Example 1. Results thereof are shown in Table 1.
  • the wiring member and copper foil with a thickness of 18 ⁇ m were integrated via a prepreg with a thickness of 0.1 mm to form a two-layered board.
  • a power supply layer of the two-layered board was divided in two portions to make specimens, and the resistance between the divided power supply layers was measured. Results thereof are shown in Table 1. Also, S21 of the specimen was measured by a S parameter method. Results thereof are shown in FIG. 13 .
  • Example 2 In a similar way to that of Example 1, a wiring member with a total thickness of 45 ⁇ m was prepared, except that a roughened electrolytic copper foil layer with a thickness of 35 ⁇ m, the surface roughness Rz of both-surfaces thereof being 5.3 ⁇ m, was used, and no adhesion promoting layer was formed.
  • the wiring member was evaluated by measuring the peeling strength and observing the peeled state in the same way as that of Example 1. Results thereof are shown in Table 1.
  • Example 2 In the same way as that of Example 1, a two-layered board was prepared using the wiring member, specimens were prepared, and then the resistance between power supply layers was measured. Results thereof are shown in Table 1. S 21 by the S parameters method was not performed.
  • Example 2 In a similar way to that of Example 1, a wiring member was prepared, except that no adhesion promoting layer was formed, and the thickness of an insulating resin layer was 25 ⁇ m. The wiring member was evaluated by measuring the peeling strength and observing the peeled state in the same way as that of Example 1. Results thereof are shown in Table 1.
  • Example 2 In the same way as that of Example 1, a two-layered board was prepared using the wiring member, specimens were prepared, and then the resistance between power supply layers was measured. Results thereof are shown in Table 1. S 21 was measured by the S parameters method. Results thereof are shown in FIG. 14 .
  • Example 2 In a similar way to that of Example 2, a wiring member with a total thickness of 18 ⁇ m was prepared, except that a noise suppressing layer was directly formed on a copper foil layer without forming any insulating resin layers.
  • the wiring member was evaluated by measuring the peeling strength and observing the peeled state in the same way as that of Example 1. Results thereof are shown in Table 1.
  • Example 2 In the same way as that of Example 1, a two-layered board was prepared using the wiring member. Although a power supply layer of the two-layered board was divided in two portions to prepare specimens, the noise suppressing layer was also divided in two portions with the same size as that of the divided power supply layers (36.5 mm ⁇ 160 mm) due to the absence of the insulating resin layer. The size of the ground layer was 74 mm ⁇ 160 mm. The resistance between the power supply layers of the specimens was measured. Results thereof are shown in Table 1. S 21 of the specimens was measured by an S parameters method. Results thereof are shown in FIG. 15 .
  • Example 2 In a similar way to that of Example 1, a wiring member was prepared, except that no noise suppressing layer was formed. In the same way as that of Example 1, a two-layered board was prepared using the wiring member, specimens were prepared, and S 21 was measured by a S parameter method. Results thereof are shown in FIGS. 12 to 14 .
  • Example 3 0.68 Peeling occurred at an interface between 2.8 Adhesive strength between the copper foil layer the copper foil layer and the insulating and the insulating resin layer was weak. Although resin layer, and disruption of the base the noise suppressing layer was slightly separated material of the insulating resin layer was from the power supply layer, noise suppressing not recognized. effects were recognized. Comparative 0.26 Peeling occurred at interface between the 3.1 Adhesive condition between the noise suppressing Example 2 copper foil layer and the noise layer and the copper foil layer was particularly suppressing layer. unfavorable. The noise suppressing layer with sufficient size was not formed, and noise suppressing effects were insufficient.
  • each noise suppressing layer was measured at five points by observing a cross section of the noise suppressing layer using a transmission electron microscope manufactured by Hitachi, Ltd., under the trade name of H9000NAR, and the measured values were averaged.
  • S parameters between SMA connectors of each specimen was measured using a vector network analyzer manufactured by Anritsu Company under the trade name of 37247D.
  • the voltage of each power supply layer was measured using a spectrum analyzer equipped with a tracking generator manucatured by Advantest Corporation under the trade name of R3132.
  • first insulating layer On a copper foil layer (first conductive layer) with a thickness of 18 ⁇ m, an epoxy-based varnish was applied, dried, and hardened, to form a first insulating layer with a thickness of 3 ⁇ m.
  • the surface resistance of the first insulating layer was 8 ⁇ 10 12 ⁇ .
  • a nickel metal was physically deposited on the whole surface of the first insulating layer under a nitrogen gas atmosphere by a reactive sputtering method to form an uneven noise suppressing layer with a thickness of 30 nm containing a nickel nitride.
  • the surface resistance of the noise suppressing layer was 97 ⁇ .
  • an epoxy-based prepreg with a thickness of 100 ⁇ m (second insulating layer, with a surface resistance of 6 ⁇ 10 14 ⁇ ) and a copper foil layer with a thickness of 18 ⁇ m (second conductive layer) were laminated, and then the prepreg was hardened to prepare a two-layered board.
  • a specimen with the dimensions of 74 mm ⁇ 160 mm was cut off from the two-layered board, and both end portions of the first conductive layer of the specimen along a longitudinal direction were etched to prepare a noise suppressing structure 110 having a region (II) with an average width (L) of 1.5 mm as shown in FIG. 16 .
  • SMA connectors 151 connecting to the first conductive layer 111 and the second conductive layer 112 were mounted on both end portions of the noise suppressing structure 110 in a longitudinal direction.
  • a vector network analyzer 152 was connected to measure S parameters at 400 points within a frequency range of 50 MHz to 10 GHz, followed by making a graph. The graph is shown in FIG. 18 . The values measured at the 400 points were summed as a pseudointegration value.
  • a two-layered board was prepared in a similar way to that of Example 4, except that no noise suppressing layer was formed.
  • a specimen was cut off from the two-layered board, and a copper foil layer of a first conductive layer was etched.
  • S parameters of the specimen was measured to make a graph. The graph is shown in FIG. 18 .
  • As a pseudointegration value the values measured at 400 points were summed.
  • the difference (absolute value) between the pseudointegration value of Example 4 and that of Comparative Example 5 is shown in Table 2.
  • the noise suppressing effects of the noise suppressing structure 110 of Example 4 increase in accordance with the increase of the absolute value.
  • a noise suppressing structure 110 was prepared in a similar way to that of Example 4, except that the average width (L) of the region (II) shown in FIG. 16 was 9 mm.
  • S parameters of the noise suppressing structure 110 were measured and a graph was made. The graph is shown in FIG. 19 .
  • As a pseudointegration value the values measured at 400 points were summed.
  • a two-layered board was prepared in a similar way to that of Example 4, except that no noise suppressing layer was formed.
  • a specimen was cut off from the two-layered board, and a copper foil layer of a first conductive layer was etched in the same way as that of Example 5.
  • S parameters of the specimen were measured and a graph was made. The graph is shown in FIG. 19 .
  • As a pseudointegration value the values measured at 400 points were summed. The difference (absolute value) between the pseudointegration value of Example 5 and that of Comparative Example 6 is shown in Table 2.
  • a noise suppressing structure 110 was prepared in a similar way to that of Example 4, except that the average width (L) of the region (II) shown in FIG. 16 was 18 mm.
  • S parameters of the noise suppressing structure 110 were measured and a graph was made. The graph is shown in FIG. 20 .
  • As a pseudointegration value values measured at 400 points were summed.
  • a two-layered board was prepared in a similar way to that of Example 4, except that no noise suppressing layer was formed.
  • a specimen was cut off from the two-layered board in the same way as that of Example 4, and a copper foil layer of a first conductive layer was etched in the same way as that of Example 6.
  • S parameters of a specimen were measured and a graph was made. The graph is shown in FIG. 20 .
  • As a pseudointegration value values measured at 400 points were summed. The difference (absolute value) between the pseudointegration value of Example 6 and that of Comparative Example 7 is shown in Table 2.
  • a specimen was prepared in a similar way to that of Example 4, except that a copper foil layer of a first conductive layer was not etched.
  • the average width (L) of the region (II) of the specimen as shown in FIG. 16 was 0 mm.
  • S parameters of the specimen were measured and a graph was made. The graph is shown in FIG. 21 .
  • As a pseudointegration value values measured at 400 points were summed.
  • a two-layered board was prepared in a similar way to that of Example 4, except that no noise suppressing layer was formed.
  • a specimen was cut off from the two-layered board.
  • a copper foil layer of a first conductive layer of the specimen was not etched.
  • S parameters of the specimen were measured and a graph was made. The graph is shown in FIG. 21 .
  • As a pseudointegration value values measured at 400 points were summed. The difference (absolute value) between the pseudointegration value of Comparative Example 8 and that of Comparative Example 9 is shown in Table 2.
  • Example 3 Example 4 Dimensions of noise suppressing structure 74 ⁇ 160 74 ⁇ 160 74 ⁇ 160 74 ⁇ 160 (mm ⁇ mm) Dimensions of second conductive layer 74 ⁇ 160 74 ⁇ 160 74 ⁇ 160 74 ⁇ 160 (mm ⁇ mm) Dimensions of noise suppressing layer 74 ⁇ 160 74 ⁇ 160 74 ⁇ 160 (mm ⁇ mm) Average width (L) of region (II) 1.5 9 18 0 (mm) Dimensions of first conductive layer 68 ⁇ 160 56 ⁇ 160 38 ⁇ 160 74 ⁇ 160 (mm ⁇ mm) Difference of 1772 2783 4311 689 pseudointegration values
  • a two-layered board was prepared in a similar way to that of Example 4, except that the thickness of the noise suppressing layer was 20 nm.
  • a large specimen with the dimensions of 100 mm ⁇ 200 mm was cut off from the two-layered board, and both ends of a copper foil layer of a first conductive layer of the specimen along a longitudinal direction was etched to prepare a noise suppressing structure 110 in which the region (II) had an average width (L) of 30 mm as shown in FIG. 16 .
  • an anti-pad was formed for preventing each layer from contacting to a through hole before laminating each layer.
  • the first conductive layer 111 of the noise suppressing structure 110 was made a power supply layer and the second conductive layer 112 was made a ground layer. To both outermost surfaces of the power supply layer and the ground layer, copper foil with a thickness of 18 ⁇ m was adhered via epoxy-based prepregs with a thickness of 50 ⁇ m to form each signal transmission layer. Then, each signal transmission layer was etched to a predetermined shape as shown in FIGS. 22 and 23 .
  • a through hole 131 is formed in the anti-pad to form a signal line 160 with an impedance of 50 ⁇ , the signal line 160 having a structure in which the through hole 131 passes from a signal transmission layer 121 to a signal transmission layer 128 and then returns to the signal transmission layer 121 again, and thus a multilayer printed wiring board 120 was prepared.
  • An input SMA connector was connected to the signal line 160 and the ground layer 123 , and an output SMA was connected to the power supply layer 126 and the ground layer 123 .
  • Signals with a frequency from 50 MHz to 3 GHz were input to the signal line 160 using a spectrum analyzer equipped with a tracking generator, and the voltage variation of the power supply layer 126 at that time was measured. Results of the measurement are shown in FIG. 24 .
  • a multilayer printed wiring board was prepared in a similar way as that of Example 7, except that the average width (L) of the region (II) was 0 mm. In the same way as that of Example 7, the voltage variation of the power supply layer was measured. Results thereof are shown in FIG. 24 .
  • a noise suppressing structure 110 including: a first conductive layer 111 with a width of 25 mm, a length of 60 mm, and a thickness of 12 ⁇ m; a second conductive layer 112 with a width of 60 mm, a length of 60 mm, and a thickness of 12 ⁇ m; a first insulating layer 114 (with a surface resistance of 2 ⁇ 10 9 ⁇ ) with a width of 60 mm, a length of 60 mm, and a thickness of 0.1 ⁇ m; and a second insulating layer 115 (with a surface resistance of 3 ⁇ 10 14 ⁇ ) with a width of 60 mm, a length of 60 mm, and a thickness of 50 ⁇ m; was prepared.
  • a noise suppressing layer 113 was formed by physically depositing silver on the first insulating layer 114 by an electron beam (EB) deposition process, so that the average width (L) of the region (II) was 3 mm, and the average width (M) of the region (III) was 0 mm, and the thickness thereof was 15 nm.
  • the surface resistance of the noise suppressing layer 113 was 55 ⁇ .
  • a noise suppressing structure 110 was prepared in a similar way to that of Example 8, except that the noise suppressing layer 113 was formed so that the average width (M) of the region (III) was 15 mm.
  • S parameters of the noise suppressing structure 110 were measured, and a graph thereof was formed. The graph is shown in FIG. 26 .
  • As a pseudointegration value values measured at 400 points were summed. The difference (absolute value) between the pseudointegration value and a pseudointegration value calculated when no noise suppressing layer was formed is shown in Table 3.
  • a noise suppressing structure 110 was prepared in a similar way to that of Example 8, except that a noise suppressing layer 113 was formed so that the average width (M) of the region (III) was 23 mm.
  • S parameters of the noise suppressing structure 110 were measured and a graph thereof was made. The graph is shown in FIG. 26 .
  • As a pseudointegration value values measured at 400 points were summed. The difference between the pseudointegration value and a pseudointegration value calculated when no noise suppressing layer was formed is shown in Table 3.
  • Example 6 Dimensions of noise suppressing 60 ⁇ 60 60 ⁇ 60 60 ⁇ 60 structure (mm ⁇ mm) Dimensions of first conductive layer 25 ⁇ 60 25 ⁇ 60 25 ⁇ 60 (mm ⁇ mm) Dimensions of second conductive 60 ⁇ 60 60 ⁇ 60 60 ⁇ 60 layer (mm ⁇ mm) Average width (L) of region (II) 3 3 3 (mm) Average width (M) of region (III) 0 15 23 (mm) Average width (N) of region (I) 25 5 1 (mm) Difference of pseudointegration 4597 4453 4804 values
  • the wiring member according to the present invention is useful as a member composing a printed wiring board which powers or signals a semiconductor element such as IC, LSI, or the like, an electronic element, or the like.
  • the noise suppressing structure and the multilayer printed wiring board according to the present invention are useful as a multilayer printed wiring board which powers or signals a semiconductor element such as IC, LSI, or the like, a power supply layer in an electronic element, and the electronic element.
US11/769,386 2006-06-30 2007-06-27 Noise-suppressing wiring-member and printed wiring board Expired - Fee Related US8134084B2 (en)

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JP2006181179A JP5138185B2 (ja) 2006-06-30 2006-06-30 プリント配線基板
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JPJP2006-199286 2006-07-21
JP2006199286A JP4916803B2 (ja) 2006-07-21 2006-07-21 多層プリント回路基板
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US20100201459A1 (en) * 2007-08-02 2010-08-12 Toshiyuki Kawaguchi Transmission noise suppressing structure and wiring circuit board
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US8254136B2 (en) * 2007-09-11 2012-08-28 Samsung Electronics Co., Ltd. Printed circuit board, display apparatus having a printed circuit board and method of manufacturing the printed circuit board
US9930770B2 (en) 2007-09-11 2018-03-27 Samsung Display Co., Ltd. Printed circuit board, display apparatus having a printed circuit board and method of manufacturing the printed circuit board
US20110073352A1 (en) * 2008-05-22 2011-03-31 Kanji Otsuka Paired low-characteristic impedance power line and ground line structure
US8507801B2 (en) * 2008-08-19 2013-08-13 Shin-Etsu Polymer Co., Ltd. Printed wiring board
US20110147053A1 (en) * 2008-08-19 2011-06-23 Shin-Etsu Polymer Co., Ltd. Printed wiring board
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US10348063B2 (en) 2011-05-31 2019-07-09 Server Technology, Inc. Method and apparatus for multiple input power distribution to adjacent outputs
US9419416B2 (en) 2011-05-31 2016-08-16 Server Technology, Inc. Method and apparatus for multiple input power distribution to adjacent outputs
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US11394179B2 (en) 2011-05-31 2022-07-19 Server Technology, Inc. Method and apparatus for multiple input power distribution to adjacent outputs
US10777977B2 (en) * 2011-05-31 2020-09-15 Server Technology, Inc. Method and apparatus for multiple input power distribution to adjacent outputs
US20130092427A1 (en) * 2011-10-14 2013-04-18 Hon Hai Precision Industry Co., Ltd. Printed circuit board capable of limiting electromagnetic interference
US20130108118A1 (en) * 2011-10-31 2013-05-02 Cisco Technology, Inc. Method and apparatus for determining surface roughness of metal foil within printed circuits
US8559678B2 (en) * 2011-10-31 2013-10-15 Cisco Technology, Inc. Method and apparatus for determining surface roughness of metal foil within printed circuits
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US10613283B2 (en) 2016-11-09 2020-04-07 International Business Machines Corporation Coaxial wire and optical fiber trace via hybrid structures and methods to manufacture
US11016255B2 (en) 2016-11-09 2021-05-25 International Business Machines Corporation Coaxial wire and optical fiber trace via hybrid structures and methods to manufacture
US11092763B2 (en) 2016-11-09 2021-08-17 International Business Machines Corporation Coaxial wire and optical fiber trace via hybrid structures and methods to manufacture
US10088642B2 (en) 2016-11-09 2018-10-02 International Business Machines Corporation Coaxial wire and optical fiber trace via hybrid structures and methods to manufacture
US10524399B2 (en) * 2017-03-03 2019-12-31 Tokin Corporation Device including a transmission line
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US20080049410A1 (en) 2008-02-28
EP2048919A4 (fr) 2010-01-06
WO2008001897A1 (fr) 2008-01-03
EP2222144A2 (fr) 2010-08-25
TWI341158B (en) 2011-04-21
EP2222144B1 (fr) 2014-07-30
KR20090024821A (ko) 2009-03-09
TW200814896A (en) 2008-03-16
KR101162405B1 (ko) 2012-07-04
EP2222144A3 (fr) 2011-04-20
EP2048919A1 (fr) 2009-04-15

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