TW423082B - Highly integrated chip-on-chip packaging - Google Patents

Highly integrated chip-on-chip packaging Download PDF

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Publication number
TW423082B
TW423082B TW088107987A TW88107987A TW423082B TW 423082 B TW423082 B TW 423082B TW 088107987 A TW088107987 A TW 088107987A TW 88107987 A TW88107987 A TW 88107987A TW 423082 B TW423082 B TW 423082B
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Taiwan
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wafers
group
patent application
connection
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TW088107987A
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English (en)
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Claude Louis Bertin
Thomas George Ference
Wayne John Howell
Edmund Juris Sprogis
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Ibm
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
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    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/065Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
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    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1532Connection portion the connection portion being formed on the die mounting surface of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1532Connection portion the connection portion being formed on the die mounting surface of the substrate
    • H01L2924/1533Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
    • H01L2924/15331Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA

Description

經濟部智慧財產局員工消費合作社印製 j 4230 8 2 ' A7 _B7_ 五、發明說明(1) 相關申請案 本申請案係有關兩個待審的專利申請案有關,這兩個專 利申請案為Bertin等人的美國專利申請案_"Microflex Technology in Semiconductor Packages"(^ BU9-97- 064)、及Ference等人的美國專利申請案_"Chip-on-
Chip Interconnections of Varied Characteristics”(内部案號 BU9-98-011 )。這些相關申請案係與本案同時提出申請,並讓渡 給本案同一受讓人,本案特此引用該等兩個專利申請案以 供參照。 發明背景 1 .技術領域: 本發明係大致有關半導體裝置,尤係有關半導體裝置中 之晶片®上晶片封裝。 2 .背景技術: 在最近的五十年中,電子裝置的開發及封裝都有了相當 的進展。積體電路的集積密度繼續以極快的速率增加。然 而,在八〇年代之前,在晶片内形成的電路之外的連接電 路之密度並無法對應地配合積體電路之集積密度。然後出 現了許多新的封裝技術。有一特定的技術被稱為"晶片疊 上晶片模组"(_'chip-on-chip module")技術。本發明係有關此 種特定的晶片疊上晶片模組技術領域。 在許多情形中,設計新的基底積體電路,即可以更快速 且成本更低之方式製造晶片疊上晶片模組。因為集積密度 的増加,所以晶片疊上晶片模組技術是有利的。由於集積 -4- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) --」---J-------,展*-----I I 訂.-------- (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 4230 82 a? ___B7_ 五、發明說明(2) 密度的增加,所以同時也改良了信號傳送的速度及整體的 裝置重量,這些都是其他的方式所無法達到的。現有的晶 片疊上晶片模組構造通常包含一印刷電路板基底,且係將 一系列的積體電路組件係直接連接到該基底。 還有一些不同的技術領域與將晶片疊上晶片模組的基底 連接電路在外部連接到基底上的電路之方式相關聯。這些 技術領域包括導線連接(wire bonding)、晶粒接合(Tape Automated Bonding ;簡稱 TAB)、覆晶粒接合(flip-TAB) ' 及 覆晶(flip-chip)。若要得知一些實例,可參照下列的美國專 利:於1994年6月授與Fogal等人的美國專利5,323,060 “Multichip Module Having a Stacked Chip Arrangement";於 1997 年2月授與Bone等人的美國專利5,600,541 "Vertical IC Chip Stack With Discrete Chip Carriers Formed From Dielectric Tape"; 於1996年2月授與Korneld等人的美國專利5,495,394 “Three Dimensional Die Packaging in Multi-chip Modules";以及於 1995 年 3 月授與 Rostoker 的美國專利 5,399,898"Multi-Chip Semiconductor Arrangements Using Flip Chip Dies”。 但是很不幸,這些技術都要耗用相當高的成本,且大部 分無法對構裝成分進行重作(亦即移除及替換),因而降低 了產品良率,且提高了成本。晶片層級的訂製也受到相當 大的限制。目前只能在晶圓層級或構裝層級上對晶片進行 訂製。由於無法在晶圓製造後及晶片封裝前對晶片進行訂 製,所以對產品應用的彈性及製造成本都無法有顯著的效 益。 -5- 本紙張尺度適用中國國家標準<CNS)A4規格(210 X 297公釐) I I ,1 I I r-------- *-------— — — — — — — I* — 411 (t先閲請背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 ^A23〇 82 A7 ------B7 ___ 五、發明說明(3 ) 發明概述 因此,本發明之一優點在於提供了並無上述限制及其他 限制的日曰片疊上晶片组件、連接、以及製造晶片疊上晶片 組件與連接之方法。 叫片疊上晶片模組及—晶片疊上晶片组件連接/互連 裝置實現了本發明之優點,其中該晶片疊上晶片模组具有 土)兩個在電氣上連接在一起的全功能之獨立晶片,而該 晶片疊上晶片組件連接/互連裝置將該等晶片在電氣上連 接到外部電路。 右參照下文中對本發明較佳實施例之詳細説明,並配合 各附圖,將可易於了解本發明的前述及其他優點與特徵。 附圖簡述 下文中將配合各附圖而説明本發明之較佳實施例,在這 些附圖中,相同的代號表示相同的元件,這些附圖有: 圖1是具有一根據本發明一較佳實施例的第一例示晶片疊 上晶片組件連接裝置的一晶片疊上晶片組件之橫斷面圖; 圖2、3、及4是具有一根據本發明該較佳實施例的第 二、第三、及第四例示晶片疊上晶片組件連接裝置的一晶 片疊上晶片組件之橫斷面圖; 圖5是使用圖4所示例示晶片疊上晶片組件連接裝置的 一晶片叠上晶片構裝之橫斷面圖; 圖6疋具有_第五例示晶片疊上晶片組件連接裝置的圖 1所示晶片眷上晶片組件之橫斷面圖; 圖7是使用圖6所示例示晶片疊上晶片组件連接裝置的 __ -6- 本紙張尺度適用中國®家標準(CNS)A4雖⑽X 29?公爱―)-- 1^ f I J ----I I I I -----I — I 訂 * — — 1 — _ (請先閱1SN►面之注各?事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 82 A7 _____B7_____ —_ 五、發明說明(4 ) 一晶片疊上晶片構裝之橫斷面圖; 圖8 ' 9、10、11 ' 12 '及13是根據本發明一第二實 施例的一晶片疊上晶片組件的製造順序之橫斷面圖; 圖14是根據本發明一第三實施例的一晶片疊上晶片組 件之橫斷面圖; 圖15是使用圖14所示晶片疊上晶片組件的一晶片疊上 晶片構裝之橫斷面圖; 圖16是根據本發明一第四實施例的一晶片疊上晶片组 件之橫斷面圖; 圖17是根據本發明一第五實施例的一晶片疊上晶片組 件之橫斷面圖;以及 圖18是使用圖17所示晶片眷上晶片組件的一晶片巷上 晶片構裝之橫斷面圖。 圖式之詳細説明 請參閱圖1 ,圖中示出根據本發明一較佳實施例的晶片 疊上晶片组件(10)之第一實例。晶片疊上晶片組件(10)包 含一第一晶片(30)、一第二晶片(40)、及晶片疊上晶片组件 連接裝置(20)。第一晶片(3〇)之作用區(35 )係經由諸如 C 々(Controlled Collapse Chip Connection ;銲料熔接受控制的 晶片連接)銲球連接(5〇)等的晶片間電氣連接或經由光學式 連接而在電氣上連接到第二晶片(40)之作用區(45)。鲜球 連接(50)使晶片間的訊息傳送具有高性能的電氣通路。由 於此種晶片間之互連加上晶片導線各有的高性能,所以使 第一晶片(30)及第二晶片(40)的晶片外驅動器(圖中未示出 ___-7- 本紙張尺度適用中國國家標準<CNS)A4規格(210 X 297公爱) ~~---. ------,-------裝--------訂---------線 (請先閱讀背面之注意事項再填寫本頁) A7 五、 經濟部智慧財產局員工消費合作社印製 ^ 423082 發明說明(5 )之尺寸及功率消耗大幅降低。雖然在後面的實例中係特 別述及銲球及銲料柱,但是我們當了解,亦可使用其他不 同成分的互連裝置,例如聚合物及金屬的合成物互連裝置 '鍍銅柱、微velcro連接裝置等。 在該特定實例中,晶片疊上晶片組件連接裝置(20)是— 銲料柱(22),該銲料柱(22)係連接到第一晶片(3〇)。銲料柱 (22)通常可經由一基底而將晶片疊上晶片組件(1〇)連接到 外部電路。 圖2示出一第二例示晶片疊上晶片组件,其中晶片疊上 晶片組件連接裝置(2〇)包含若干銲球。在圖1及圖2中, 製造銲料柱及銲球的例示方法可參閲IBM内部案號標示爲 BU9-98-011之專利申請案,該案也是前文所引用之相關申 請案。亦可利用下列步驟來製造該等銲料柱及銲球: (Ό製造具有可銲接金屬墊之第一晶片a可用於銲料柱 塾的各外圍區銲墊可具有125微米的直徑及250微米的間 距。中央區銲墊可具有50微米的直徑及1 〇〇微米的間距。 (2) 製造具有C4銲球陣列之第二晶片。該C4銲球的成分 可以是97比3的鉛/錫,且C4銲球必須配合該第一晶片的 中央區銲墊之間距。 (3) 將該第一晶片連接到該第二晶片。可利用標準晶片 選取及放置(Chip Pick and Place ;簡稱CPP)技術,或利用諸 如非勻稱助銲劑、PADS、具有熔爐循環流動的松香浴助 銲劑等的聯合製程,而執行該晶片連接步驟。 (4) 將銲料柱或銲球連接到該第二晶片。可利用銲料注 -8- ----^---^-------裝--------訂---------線 ί請先閱讀背面之注意事項再填寫本頁) 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公芨) Α7 ϊ 4230 Β2 五、發明說明(6 ) 射塑製之方式執行該連接步驟β (5)將該晶片疊上晶片组件接合到該基底a利用標準選 取及接合技術接合基底TSM銲墊上的共晶體(eutectic)銲料 ’即可執行該接合步驟。 圈3及4示出晶片疊上晶片組件之第三及第四實例,其 中晶片眷上晶片組件連接裝置(20)包含若干銲球(26)及導 線(25)(圖3 )、或導線接合(圖4)。在圖3中,於基底 (57)中設有—凹處(Μ),可使第二晶片(4〇)的上方與基底 (57)之上方齊平。然後使各銲球(26)與各銲球連接(50)有相 同的尺寸’以便將該晶片疊上晶片组件連接裝置到基底 (57) °圖4又示出將一晶片疊上晶片組件連接到一導線架 (29) ’其中情形詳述於IBM内部案號標示爲BU9-97-0 6 4之 專利申請案,而前文在相關申請案中也引用了該案。 圖5示出使用圖4所示晶片疊上晶片组件(10A)之一晶片 疊上晶片構裝。導線接合(28)係連接到基底(72)之上表面 °基底(72)之下表面設有若干銲球(76),用以將該晶片疊 上晶片構裝連接到一不同層級的構裝。接合劑(71)以機械 方式將晶片疊上晶片組件(10A)連接到基底(72)。一樹脂凸 起物(66)及密封物(64)保護晶片(30)及(40),並使導線接合 及晶片結構(60)具有耐久性。金屬蓋(62)提供了小尺寸、 耐久、且強化散熱的晶片疊上晶片構裝。 如圖6及7所示,晶片疊上晶片组件(10B)之晶片疊上晶 片纽件連接裝置(2〇)包含一鲜球插入器(32)。録球插入器 (32)提供了到基底的電氣連接及所需的高度,而容許有第 -9- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) I---^---^--------- I I I 1 I I I ^ --- ------ (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 霧4 2 3 :) A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(7 ) 二晶片(40)的餘隙。銲球插入器(32)包含:第一组銲球, 該組銲球係連接到其中一個晶片(4〇)之作用區;第二組鲜 球,該組銲球係連接到外部電路;以及在該第一組銲球與 該第二組銲球間之一導電通路。該導電通路被非導電材料 所包圍。圖7示出使用圖6所示晶片疊上晶片組件(10B)之 一晶片疊上晶片構裝。該銲球插入器係連接到基底(72)之 上表面。基底(72)之下表面設有若干銲球(76),用以將該 晶片疊上晶片構裝連接到一不同層級的構裝。利用—接合 劑(78)將一散熱片(74)連接到該第一晶片(30)。散熱片可散 逸晶片疊上晶片组件(10B)產生的熱量。 圖1 - 7所示晶片疊上晶片組件及後文所述例之某些優點 包括:可利用不同的半導體技術來製造晶片(3〇)及(4〇), 再將該等晶片連接起來,而不會受到在一單晶片上使用這 些技術時固有的限制。例如,晶片(3〇)可以是一邏輯晶片 ,且晶片(40)可以是一 DRAM晶片,而在晶片疊上晶片組 件的層級上產生了一種合併式的邏輯/ DRAM晶片。第二, 與具有每一晶片所有的全功能及電路之一單晶片比較時, 晶片(30)及(40)各自是較小且較不複雜的。第三,可將大 量的記憶體設於接近處理器之處。第四,因爲晶片疊上晶 片組件的極端平面及冶金特徵,所以可得到較大的互連密 度。最後,本發明的晶片疊上晶片組件與提供相同功能的 高集積度單晶片相比,可提供更低的成本、更低的電力消 耗、及更南的效能。 圖8 - 13是根據本發明第二實施例的一晶片疊上晶片組 ___-10 _ 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公餐^ " I n —-J I--装· ----11 訂·--------線 (請先閱讀背面之注意事項再填寫本頁) A7 A7 經濟部智慧財產局員工消費合作社印製 Β7 五、發明說明(8 ) 件的製造順序之橫斷面圖。在圖8中,示出具有主動電路 及連接層(145)之一晶圓(140)。該晶圓(14〇)可以是諸如一 矽晶圓、砷化鎵晶圓、矽鍺晶圓等。該主動電路及連接層 (145)包含用於外部連接所需之結構及特性。在圖9中, 係知兩類的组件連接到晶圓(140) ’這兩類組件包括積體電 路(1C)晶片(130)及銲球插入器(亦稱爲間隔物)(32)。ic晶 片(130)係在電氣上搞合到晶圓(140)中之主動電路,並較高 階的積體電路功能。亦可使用諸如具有密封物的銲球及導 線接合之電氣連接裝置。各銲球插入器(32 )在晶圓(14〇)上 的主動電路層(145)與1C晶片(130)的主動電路層面形成的 平面之間提供了一導電路徑。雖然該實例中特別示出銲球 插入器(32) ’但是亦可使用諸如具有穿孔的矽晶片多層 陶瓷及有機印刷電路板間隔物外部電路等的其他間隔物。 此外’雖然在本實例中利用銲球將各1C晶片(130)及銲球 插入器(32)連接到晶圓(140),但是亦可使用其他的連接裝 置,例如導電環氧樹脂、;PMC膏、各向異性導電接合劑、 及暫態液相接合等。可利用銲球密封物(圖中未示出)來包 圍住這些鲜球。 如圖10所示’係在整個表面上沈積了 一層保形塗層 (3句(例如paralene)。然後如圖丨1所示,係利用一機械及( 或)化學裝置將該塗層平面化。平面化的一個實例即是利 用標準晶圓抛光技術以機械方式將該表面拋光。該平面化 製程可得到一種銲球插入器(32)中之連接通孔係出現在表 面之結構。這些通孔可連接到外部電路。圖丨2示出在銲球 本紙張尺度適用中國國家標单相这βιη X ?07 ---1----------裏--------訂--------- (請先閱讀背面之汍意事項再填寫本頁) 11 -
»4 230 五、發明說明(9 器()上製造銲球(36)以連接到外部電路之情形。 各預疋㈣上切割該晶片叠上晶片組件,而形成可利用 ^求(36)連接到外部電路之,,超級晶片,,。圖13示出該超級 晶片係連接到—晶片載體/基底(72)。BI 13所示之超級晶 片製造方式有幾個優點。某些優點包括:制多種不同的 半導龍術而得到-極高的集積m件速度、頻寬要 求及W片外速度上有優異的效能;纟成分晶片有較小的 尺寸,且不需要複雜的電路或製造技術,因而可達到較高 々良率及車X低的成本;且以各種組態連接數種成分組件, 即可達到訂製的要求。 圖14及15疋根據本發明一第三實施例的晶片疊上晶片 組件(80)之橫斷面圖。晶片疊上晶片组件(8〇)包含兩組的 兩個晶片(3〇)與(40)、以及(30A)與(40A)(例如圖1所示的 兩個ag片$上晶片组件(1 〇)),其中每一組具有一個在電氣 上連接到一第二晶片•之第—晶片。在該實例中,晶片(3〇) 及(30A)之後表面係相互面對。係經由晶片疊上晶片組件連 接裝置(20A)(在本實例中爲一連接基底(88))而將這兩组晶 片在電氣上連接在一起。連接基底(88)亦經由諸如導線接 合(84)、C4連接裝置(86)、及金屬墊連接(82)等電氣連接 裝置而將晶片疊上晶片組件(80)連接到外部裝置。雖然爲 了便於説明而在圖14及15的晶片疊上晶片組件(80)上示出 不同類型的連接裝置,但是在單一應用中通常只使用一種 類型的連接裝置(亦即連接裝置(82)、(84)、及(86)都是諸 如C4連接裝置)。圖15示出使用圖1 4所示晶片疊上晶片 -12- -- . 装--------訂----------線 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中關家標準(CNS)A4規格(210 X 297公爱) 經濟部智慧財產局員工消費合作社印製 霤 4230^, A7 -------------- 五、發明說明(1〇 ) 组件(80)之一晶片疊上晶片構裝。利用接合劑(94 )將兩個 散熱片(92)連接到晶片(3〇)及(30A)。散熱片可散逸晶片疊 上晶片组件(80)所產生的熱量。然後經由銲球(86)將晶片 #上晶片组件(80)耦合到基底(57)(圖14)。因此,根據本 發明的該實施例所示,在數個晶片中,每一晶片提供一獨 立且特定的功能’且可能利用不同的半導體技術製造每一 晶片時,可將這幾個晶片接合在一起。 圖16是一可插入晶片疊上晶片構裝之橫斷面圖,該可 插入晶片疊上晶片構裝包含根據本發明一第四實施例的晶 片疊上晶片組件(80A)。晶片疊上晶片組件(80A)包含晶片 (30)、(30A)、(40)、(40A)、連接基底(88A)、及耦合基底(88B) 。在本實例中,係以密封物(96)包封晶片疊上晶片組件 (80A) ’因而提供了 —種高可靠性之組件。連接基底(88八) 可經由一可插入介面(90)而在電氣上連接到外部電路。 圖17是根據本發明一第五實施例的一晶片疊上晶片組 件(80B)之橫斷面圖。晶片疊上晶片組件(8〇B)類似於晶片 疊上晶片組件(80)(圖14),但不同之處在於晶片疊上晶片 組件連接裝置(20A)包含一個延伸到晶片疊上晶片组件 (80B)的上表面及下表面之可堆疊連接基底(88C)。晶片叠 上晶片组件連接裝置(20A)之上表面包含若干可銲接金屬墊 (82),且晶片疊上晶片組件連接裝置(2〇A)之下表面包含若 邊1干球(86)。晶片疊上晶片组件(8〇b)是三维可堆疊模組之 一例示單元結構。另一例示單元結構包含:取消晶片⑴ 及(40A),並在晶片(30)及(30A)上延伸晶片疊上晶片組件連 ____ -13- 紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱)~~~----- I-----Γ1 —--— II ---— [II— - - - ------ I <請先閱讀背面之注意事項再填寫本頁) 423082 A7 B7 玉、發明說明(11 ) 接裝置(20A)。圖! 8示出一個包含圖丨7所示的兩個晶片疊 上晶片組件單元結構(8〇B)之堆疊模組β 堆#模组及單元結構之某些優點包括:第一,可易於適 應不同尺寸及厚度之晶片。第二,該結構是可重作的 (reworkable)。第三’在沒有顯著預定條件的情形下,可以 有不同尺寸的結構。第四,可進行各單元結構間之熱散逸 管理。 因此’根據本發明之晶片疊上晶片組件及連接可提供高 集積度的技術以及高可靠性且小尺寸之半導體構裝。晶片 受上晶片構裝也提供了強化的電氣、機械 '及熱散逸效能。 雖然已參知一較佳實施例而詳細示出並說明了本發明, 但是熟悉本門技術者當可了肖,在不脱離本發明的精神及 範圍下,仍可對纟發明之形式及細節⑽出前述的及其他的 改變。 ----!---;---------------訂---------線 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 14- 本紙張尺度週用中國國家標準(CNS)A4規格(210 X 297公釐)

Claims (1)

  1. 經濟部中央揉準局貝工消費合作社印製 > a ^ j u y ^ 第881〇7987號專利申請案 S Λ月#正/费正/_、鲁 中文申請專利範圍修正本(89年11月)85 愚 六、申請專利範圍 1 .—種晶片疊上晶片裝置,包含: 一晶片疊上晶片模組,該晶片疊上晶片模组具有至少 兩個設有在電氣上連接在一起的作用區之獨立晶片, 其中該等兩個晶片之該等作用區係相互面對;以及 一晶片疊上晶片组件連接裝置,用以在電氣上將該等 晶片連接到外部電路。 2 ·如申請專利範圍第丨項之裝置,其t該晶片疊上晶片 組件連接裝置是一銲球插入器,該銲球插入器包含: 第一组銲球,該第一組銲球係連接到其中—個該等晶 片之該等作用區; 第二組銲球’用以連接到該外部電路;以及 連接於該第一組銲球與該第二組銲球之間的一導電路 徑’其中係以非導電材料包園該導電路徑。 3 ‘如申請專利範圍第1項之裝置,其中係以不同的技術 製造該等至少兩個晶片。 4 .如申請專利範圍第丨項之裝置,其中該晶片疊上晶片 组件連接裝置是一連接基底,該連接基底包含: 連接到該等晶片的該等作用區之第_組連接元件; 第二组連接元件’用以連接到該外部電路;以及 一個具有若千導電線路之基底,該等導電線路係將該 弟一組連接元件連接到該第二組連接·元件。 5.如申請專利範圍第4項之裝置,其中該外部電路是一 導線架。 —^1 ! n —LI ^^1 I ϋ^— I an 1^1 n----I - TT {請先s讀背面之注意事¾再嗔寫本頁}
    4230 〇 A8 BS C8 D8 六、申請專利範圍 6 .如申請專利範圍第4項之裝置,其中該第二组連接元 件包含: 第二組銲球’該第二組銲球係與該等至少兩個晶片中 之—個晶片之一第一後表面在同一平面;以及 第二组金屬墊,該第二组金屬墊係與該等至少兩個晶 片中之另一晶片之一第二後表面在同一平面, 其中該晶片疊上晶片模組之該第二组銲球係將該晶片 叠上晶片模组經由一第二晶片疊上晶片模组之各金屬 塾而連接到該第二晶片疊上晶片模組。 7 ·如申請專利範圍第2項之裝置,其中該銲球插入器之 局度至少與該晶片疊上晶片模组的該等至少兩個晶片 中之一個晶片之高度相同。 8 . —種製造一晶片疊上晶片组件之方法,該方法包含下 列步驟: (a) 製造一晶片疊上晶片模組,該晶片疊上晶片模組 具有至少兩個設有在電氣上連接在一起的作用區之獨 立晶片’其中該等兩個晶片之該等作用區係相互面 對;以及 (b) 製造一晶片疊上晶片组件連接裝置,用以在電氣 上將該晶片叠上晶片模組連接到外部電路^ 9 如申請專利範圍第8項之方法’其中該步驟(a)及步锦 (b)進一步包含: (1)提供一具有一晶圓作用區之晶圓; __-2- 本紙張尺度逍用中國國家揉準(CNS > A4規格(210X297公着) n - 1 -I I * I n i^i · -1 -- -I —I- - I Hi n 丁 «3 *T (請先閲讀背面之注$項再填寫本頁) 經濟部中央橾準局員工消费合作社印裝 2308 A8 BS C8 D8 經濟部中央橾率局βτ工消費合作社印$L 、申請專利範圍 (2) 將具有積體電路(IC)作用區之積體電路(IC)晶片連 接到該晶圓,其中該等1C作用區係連接到該晶圓作用 區; (3) 將遠等晶片疊上晶片组件連接裝置連接到該晶圓 作用區’其中該等晶片疊上晶片組件連接裝置之高度 至少與該等1C晶片之高度相同; (4) 在在晶圓、該等被連接的1C晶片、及該等被連接 的晶片疊上晶片组件連接裝置上沈積一保形塗層; (5) 使該塗層平面化,且該塗層之高度至少與該等晶 片叠上晶片組件連接裝置之高度相同,以便形成一晶 片疊上晶片的晶圓;以及 (6) 在遠晶片疊上晶片的晶圓之各預定點上切割,而 形成一個具有該晶片疊上晶片模组及該等晶片疊上晶 片组件連接裝置之晶片疊上晶片组件, 10.如申請專利範圍第8項之方法,其中該步驟⑻進一步 包含下列步驟: (1) 提供一第一組銲球; (2) 將該第一組銲球連接到其中一個該等晶片之該等 作用區; (3) 提供一第二组銲球,用以連接到該外部電路;以 及 (4) 以一個由非導電材料包園的導電路徑連該第一组 及該第二組銲球,而形成一銲球插入器。 -3- 衣紙張;^度適用中國國家搮準(CNS ) A4規格(2I0X297公瘦) I------- n I— n . ^ n - n ___T i請先閲讀背面之注意事項再填寫本頁) 經濟部中央揉準局貝工消费合作社印製 4230 82 a8 B8 C8 ____D8 七、申請專利範圍— 一 ^ -- 11. 如申請專利範圍第8項之方法’其中係以不同的技術 製造該等至少兩個晶片。 12. 如申請專利範圍第8項之方法,其中該步驟(b)進—步 包含下列步碌: (1) 提供一第一組連接元件; (2) 將該第一組連接元件連接到其中一個該等晶片之 該等作用區; (3) 提供一第二組連接元件,用以連接到該外部電 路;以及 (4) 以一個具有若干導電線路之基底連接該第—组及 该第·一組知球’而形成·—連接基底》 13. 如申請專利範圍第12項之方法,其中該外部電路是一 可插入連接裝置。 14_如申請專利範圍第12項之方法,其中該步驟(3)進一步 包含下列步驟: (3a)使該連接基底與該等至少兩個晶片中之一個晶片 之一第一後表面在同一平面,並使該連接基底與該等 至少兩個晶片中之另一晶片之一第二後表面在同一平 面; (3b)提供第二组銲球,該第二组銲球係與該第一後表 面在同一平面; (3c )提供第二組金屬塾,該第二組金屬塾係與該第二 後表面在同一平面;以及 -4- 本紙張尺度適用中固國家標準(CNS ) A4规格(210X297公嫠) (請先閲讀背面之注意#.項再填寫本頁) 装. 訂 ^4230^ as Β8 CS 六、申請專利範i —1 一~~ (3d)將該晶片疊上晶片模組經由該第二组連接元件而 連接到該第二晶片疊上晶片模组。 15. —種晶片疊上晶片構裝,包含: 一外部組件; 一晶片疊上晶片模組’該晶片疊上晶片模组具有至少 兩個設有在電氣上連接在一起的作用區之獨立晶片, 其中該等兩個晶片之該等作用區係相互面對;以及 一晶片疊上晶片組件連接裝置,用以在電氣上連接該 %晶片及該外部組件β 16. 如申請專利範圍第Μ項之晶片疊上晶片構裝,其中該 晶片疊上晶片組件連接裝置是—銲球插入器,該銲球 插入器包含: 第一组銲球’該第一组銲球係連接到其中一個該等晶 f之該等作用區; 經濟部中央標準局貝工消費合作社印策 第二组銲球’用以連接到該外部組件;以及 連接於該第一组銲球與該第二組辉球之間的一導電路 徑,其中係以非導電材料包圍該導電路徑。 17. 如申請專利範圍第15項之晶片疊上晶片構装’其中係 以不同的技術製造該等至少兩個晶片。 18_如申請專利範圍第15項之晶片疊上晶片構装,其中該 晶片疊上晶片組件連接裝置是一連接基底,該連接基 底包含: 連接到該等晶片的該等作用區之第一組連接元件; ____ -5- __ 本紙張^^適用中困國家標準(〔灿)八4^11^(21{^297公羡)'一* ' 一一' 423082 Α8 Β8 C8 DS 申清專利範圍 不一?且運接元件,用以連接到該外邵砠件;以及 一個具有若干導電線路之基底’該等導電線路係將諸 第一组連接元件連接到該第二組連.接元件。 19,如申請專利範圍第18項之晶片疊上晶片構裝,其中該 外部組件是一可插入連接裝置。 2〇·如申請專利範圍第is項之晶片疊上晶片構裝,其中該 第二組連接元件包含: 第二組銲球,該第二組銲球係與該等至少兩個晶片中 之一個晶片之一第一後表面在同一平面:以及 第二組金屬墊,該第二組金屬墊係與該等至少兩個晶 片中之另一晶片之一第二後表面在同一平面, 其中該晶片昼上晶片模组之該.第二组鲜球係將該晶片 疊上晶片模組經由一第二晶片叠上晶片模组之各金屬 墊而連接到該第二晶片疊上晶片模組。 (請先閲讀背面之注意事項再填寫本頁) ¥ Γ 經濟部中央標準局貝工消費合作社印製 6 本紙張尺度適用中國國家梯準(CNS ) Α4说格(210Χ297公釐)
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