JP4291832B2 - 基板焼成炉の給排気システム - Google Patents
基板焼成炉の給排気システム Download PDFInfo
- Publication number
- JP4291832B2 JP4291832B2 JP2006173910A JP2006173910A JP4291832B2 JP 4291832 B2 JP4291832 B2 JP 4291832B2 JP 2006173910 A JP2006173910 A JP 2006173910A JP 2006173910 A JP2006173910 A JP 2006173910A JP 4291832 B2 JP4291832 B2 JP 4291832B2
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- Prior art keywords
- substrate
- furnace
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- hot air
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Links
- 239000000758 substrate Substances 0.000 title claims description 105
- 238000010304 firing Methods 0.000 title claims description 49
- 239000003054 catalyst Substances 0.000 claims description 56
- 239000007789 gas Substances 0.000 claims description 51
- 238000000034 method Methods 0.000 claims description 26
- 239000005416 organic matter Substances 0.000 claims description 25
- 238000010438 heat treatment Methods 0.000 claims description 23
- 239000011261 inert gas Substances 0.000 claims description 11
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 5
- 239000001301 oxygen Substances 0.000 claims description 5
- 229910052760 oxygen Inorganic materials 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 3
- 239000011521 glass Substances 0.000 description 39
- 239000000126 substance Substances 0.000 description 20
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 9
- 238000011144 upstream manufacturing Methods 0.000 description 7
- 238000005338 heat storage Methods 0.000 description 5
- 230000001965 increasing effect Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000006864 oxidative decomposition reaction Methods 0.000 description 4
- 229910052697 platinum Inorganic materials 0.000 description 4
- 238000005979 thermal decomposition reaction Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000004080 punching Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Waste-Gas Treatment And Other Accessory Devices For Furnaces (AREA)
- Furnace Details (AREA)
Description
10 炉体
12 吹き出し口
13 耐熱HEPAフィルタ
14 排気口
20 循環経路
20a 加熱後熱風通過領域
21 ファン
22 ヒータ
30 排気管
31 触媒ユニット
32,42 流量調整バルブ
33 入り側圧力計
34 出側圧力計
40 給気管
40b バイパス管
50 熱交換器
90 制御部
91 カウンター
W ガラス基板
Claims (6)
- 基板を収容して焼成処理を行う炉体と、前記炉体から排出された熱風を循環させて再度前記炉体に供給する循環経路と、前記循環経路に設けられて熱風を循環させるファンと、前記循環経路に設けられて熱風を加熱するヒータと、を有する基板焼成炉と、
前記循環経路のうち前記ヒータから前記炉体の気体吹き出し口に至る加熱後熱風通過領域から熱風を排出する排気経路と、
前記排気経路に設けられ、前記循環経路から排出された熱風に含まれる有機物を分解するための触媒を有する触媒ユニットと、
前記触媒ユニットから排出された熱風と前記循環経路に新たに供給する気体との熱交換を行う熱交換器と、
を備えることを特徴とする基板焼成炉の給排気システム。 - 請求項1記載の基板焼成炉の給排気システムにおいて、
前記触媒ユニットは、前記排気経路が前記循環経路に接続される分岐接続点に配置されていることを特徴とする基板焼成炉の給排気システム。 - 請求項1または請求項2に記載の基板焼成炉の給排気システムにおいて、
前記炉体に収容して焼成処理を行っている基板の枚数を計数する計数手段と、
前記計数手段によって計数された基板枚数に応じて前記循環経路からの排気量および前記循環経路への給気量を制御する流量制御手段と、
をさらに備えることを特徴とする基板焼成炉の給排気システム。 - 請求項1から請求項3のいずれかに記載の基板焼成炉の給排気システムにおいて、
前記熱交換器を経由することなく前記循環経路に直接新たな給気を行うバイパス経路をさらに備えることを特徴とする基板焼成炉の給排気システム。 - 請求項4記載の基板焼成炉の給排気システムにおいて、
前記触媒ユニットから排出されて前記熱交換器に流入する熱風の圧力と前記熱交換器から排出される熱排気の圧力との圧力差を検知する圧損検知手段と、
前記圧力差が所定値以上となった時点で前記バイパス経路を作動させる給気経路切替手段と、
をさらに備えることを特徴とする基板焼成炉の給排気システム。 - 請求項1記載の基板焼成炉の給排気システムにおいて、
前記基板焼成炉は不活性ガス雰囲気中にて基板の焼成処理を行い、
前記触媒ユニットの入口側近傍に空気または酸素を供給する空気供給管をさらに備えることを特徴とする基板焼成炉の給排気システム。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006173910A JP4291832B2 (ja) | 2006-06-23 | 2006-06-23 | 基板焼成炉の給排気システム |
KR1020070058868A KR100941546B1 (ko) | 2006-06-23 | 2007-06-15 | 기판소성로의 급배기장치 |
TW096122127A TWI331671B (en) | 2006-06-23 | 2007-06-20 | Air intake and exhaust system for substrate baking furnace |
CN2007101120710A CN101093142B (zh) | 2006-06-23 | 2007-06-22 | 基板烧结炉的供排气系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006173910A JP4291832B2 (ja) | 2006-06-23 | 2006-06-23 | 基板焼成炉の給排気システム |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008188665A Division JP4331784B2 (ja) | 2008-07-22 | 2008-07-22 | 基板焼成炉の給排気方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008002766A JP2008002766A (ja) | 2008-01-10 |
JP4291832B2 true JP4291832B2 (ja) | 2009-07-08 |
Family
ID=38991525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006173910A Expired - Fee Related JP4291832B2 (ja) | 2006-06-23 | 2006-06-23 | 基板焼成炉の給排気システム |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4291832B2 (ja) |
KR (1) | KR100941546B1 (ja) |
CN (1) | CN101093142B (ja) |
TW (1) | TWI331671B (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008304182A (ja) * | 2008-07-22 | 2008-12-18 | Future Vision:Kk | 基板焼成炉の給排気方法 |
US8422434B2 (en) | 2003-02-18 | 2013-04-16 | Qualcomm Incorporated | Peak-to-average power ratio management for multi-carrier modulation in wireless communication systems |
CN106895704A (zh) * | 2017-01-11 | 2017-06-27 | 施华吉 | 一种冶炼炉 |
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JP4372806B2 (ja) * | 2006-07-13 | 2009-11-25 | エスペック株式会社 | 熱処理装置 |
JP4589941B2 (ja) * | 2007-05-29 | 2010-12-01 | エスペック株式会社 | 熱処理装置 |
JP4589942B2 (ja) * | 2007-05-29 | 2010-12-01 | エスペック株式会社 | 気体処理ユニット |
JP4550098B2 (ja) * | 2007-09-19 | 2010-09-22 | 国立大学法人東北大学 | 基板熱処理炉 |
JP5374061B2 (ja) * | 2008-03-25 | 2013-12-25 | 日本碍子株式会社 | 電子部品用焼成炉とその炉圧制御方法 |
JP4896952B2 (ja) * | 2008-12-04 | 2012-03-14 | エスペック株式会社 | 熱処理装置 |
CN102192652A (zh) * | 2010-03-08 | 2011-09-21 | 台技工业设备股份有限公司 | 加热装置及加热系统 |
CN101900418B (zh) * | 2010-08-12 | 2013-01-30 | 广州迪森热能技术股份有限公司 | 生物质有机热载体炉 |
JP5866937B2 (ja) * | 2011-09-30 | 2016-02-24 | セイコーエプソン株式会社 | 脱脂炉 |
CN103077999B (zh) * | 2011-10-25 | 2015-05-27 | 茂迪股份有限公司 | 热处理设备及过温保护监控方法 |
DE102012023430A1 (de) * | 2012-11-30 | 2014-06-05 | Bilstein Gmbh & Co. Kg | Haubenglühofen sowie Verfahren zum Betreiben eines solchen |
CN104006667B (zh) * | 2014-05-22 | 2016-06-22 | 丹阳正联知识产权运营管理有限公司 | 工业炉循环蓄热除尘装置 |
KR102170719B1 (ko) * | 2014-07-23 | 2020-10-27 | 주식회사 제우스 | 기판 열처리 시스템의 냉각장치 및 냉각방법과 이를 구비한 열풍식 기판 열처리 장치 |
JP5800969B1 (ja) * | 2014-08-27 | 2015-10-28 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法、プログラム、記録媒体 |
CN105674740A (zh) * | 2014-11-17 | 2016-06-15 | 简鸿志 | 无烟囱式热循环加热炉 |
JP6855687B2 (ja) * | 2015-07-29 | 2021-04-07 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び基板処理装置のメンテナンス方法及び記憶媒体 |
CN105002329B (zh) * | 2015-08-19 | 2017-03-08 | 苏州中门子工业炉科技有限公司 | 一种料匣式连续节拍热处理炉及其工艺 |
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CN106288795A (zh) * | 2016-08-19 | 2017-01-04 | 桂林百坚汽车附件有限公司 | 一种能检测粉尘的冶炼炉 |
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US20190160529A1 (en) * | 2017-11-29 | 2019-05-30 | Desktop Metal, Inc. | Furnace For Sintering Printed Objects |
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-
2006
- 2006-06-23 JP JP2006173910A patent/JP4291832B2/ja not_active Expired - Fee Related
-
2007
- 2007-06-15 KR KR1020070058868A patent/KR100941546B1/ko active IP Right Grant
- 2007-06-20 TW TW096122127A patent/TWI331671B/zh not_active IP Right Cessation
- 2007-06-22 CN CN2007101120710A patent/CN101093142B/zh not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8422434B2 (en) | 2003-02-18 | 2013-04-16 | Qualcomm Incorporated | Peak-to-average power ratio management for multi-carrier modulation in wireless communication systems |
US8811973B2 (en) | 2003-02-18 | 2014-08-19 | Qualcomm Incorporated | Peak-to-average power ratio management for multi-carrier modulation in wireless communication systems |
US9544897B2 (en) | 2003-02-18 | 2017-01-10 | Qualcomm Incorporated | Peak-to-average power ratio management for multi-carrier modulation in wireless communication systems |
US10064179B2 (en) | 2003-02-18 | 2018-08-28 | Qualcomm Incorporated | Carrier assignment for multi-carrier modulation in wireless communication |
JP2008304182A (ja) * | 2008-07-22 | 2008-12-18 | Future Vision:Kk | 基板焼成炉の給排気方法 |
CN106895704A (zh) * | 2017-01-11 | 2017-06-27 | 施华吉 | 一种冶炼炉 |
Also Published As
Publication number | Publication date |
---|---|
TW200811409A (en) | 2008-03-01 |
JP2008002766A (ja) | 2008-01-10 |
TWI331671B (en) | 2010-10-11 |
KR20070122137A (ko) | 2007-12-28 |
CN101093142A (zh) | 2007-12-26 |
CN101093142B (zh) | 2010-04-21 |
KR100941546B1 (ko) | 2010-02-10 |
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