|
LU35237A1
(enExample)
|
1956-06-27 |
|
|
|
|
US3035176A
(en)
|
1959-11-23 |
1962-05-15 |
Packard Bell Electronics Corp |
Monoscopic range finder
|
|
CH388657A
(fr)
|
1963-04-17 |
1965-02-28 |
Paillard Sa |
Dispositif pour détecter le maximum de netteté d'une image
|
|
US3562785A
(en)
|
1968-11-20 |
1971-02-09 |
Logetronics Inc |
Image adjusting method
|
|
US3564268A
(en)
|
1969-06-27 |
1971-02-16 |
Standard Change Makers Inc |
Document verifier using photovoltaic cell with light sensitive bars
|
|
US3873823A
(en)
|
1972-12-06 |
1975-03-25 |
Sanders Associates Inc |
Alignment indicating beacon
|
|
SE407976B
(sv)
|
1973-03-13 |
1979-04-30 |
Bofors Ab |
Forfarande och anordning for malfoljning
|
|
JPS5625648B2
(enExample)
|
1973-04-11 |
1981-06-13 |
|
|
|
JPS5634842B2
(enExample)
|
1973-10-26 |
1981-08-13 |
|
|
|
FR2271590B1
(enExample)
|
1974-01-15 |
1978-12-01 |
Thomson Brandt |
|
|
US4079247A
(en)
|
1975-05-16 |
1978-03-14 |
Claude Bricot |
Optical focussing device
|
|
US4256513A
(en)
|
1978-10-19 |
1981-03-17 |
Matsushita Electric Industrial Co., Ltd. |
Photoelectric conversion device
|
|
JPS55159445A
(en)
|
1979-05-31 |
1980-12-11 |
Ricoh Co Ltd |
Electrophotographic receptor
|
|
EP0020879A1
(en)
|
1979-06-06 |
1981-01-07 |
Erwin Sick GmbH Optik-Elektronik |
Optical electronic distance sensor
|
|
NL187374C
(nl)
|
1981-07-10 |
1991-09-02 |
Philips Nv |
Inrichting voor het detecteren van straling.
|
|
JPS58175091A
(ja)
|
1982-04-06 |
1983-10-14 |
株式会社東芝 |
セキユリテイ・ストレツド検出装置
|
|
US4548886A
(en)
|
1982-06-08 |
1985-10-22 |
Canon Kabushiki Kaisha |
Radiation sensitive organic thin film comprising an azulenium salt
|
|
US4508847A
(en)
|
1982-07-20 |
1985-04-02 |
Exxon Research & Engineering Co. |
Carbon-containing molybdenum and tungsten sulfide catalysts
|
|
JPS5950579A
(ja)
|
1982-09-16 |
1984-03-23 |
Komatsu Ltd |
半導体光位置検出器
|
|
US4593187A
(en)
|
1982-10-29 |
1986-06-03 |
The Perkin-Elmer Corporation |
Non-imaging illumination incidence angle detection system
|
|
JPS5979805A
(ja)
|
1982-10-29 |
1984-05-09 |
Matsushita Electric Works Ltd |
距離センサ
|
|
AU2239683A
(en)
|
1982-12-16 |
1984-06-21 |
Vickers Plc |
Photoconductive compositions
|
|
JPS60160716A
(ja)
|
1984-02-01 |
1985-08-22 |
Nec Corp |
電圧制御減衰器
|
|
JPS61245579A
(ja)
|
1984-02-17 |
1986-10-31 |
アメリカン サイアナミド カンパニ− |
半導体装置と製法
|
|
US4584704A
(en)
|
1984-03-01 |
1986-04-22 |
Bran Ferren |
Spatial imaging system
|
|
US4773751A
(en)
|
1984-03-09 |
1988-09-27 |
Minolta Camera Kabushiki Kaisha |
Infinite level setting device for a distance measuring device
|
|
JPH0657912B2
(ja)
|
1984-03-16 |
1994-08-03 |
東レ株式会社 |
難燃性繊維複合体
|
|
JPS60199906A
(ja)
|
1984-03-19 |
1985-10-09 |
Toray Ind Inc |
紡糸ブロツク
|
|
US4582839A
(en)
|
1984-03-21 |
1986-04-15 |
Takeda Chemical Industries, Ltd. |
2,4-thiazolidinediones
|
|
DE3585044D1
(de)
|
1984-03-29 |
1992-02-13 |
Konishiroku Photo Ind |
Photographisches silberhalogenidmaterial.
|
|
DE3421616A1
(de)
|
1984-06-09 |
1985-12-12 |
Hoechst Ag, 6230 Frankfurt |
Behaelter mit auskleidung
|
|
JPS6182466A
(ja)
|
1984-09-29 |
1986-04-26 |
Toshiba Corp |
光センサ
|
|
JPS6189501A
(ja)
|
1984-10-08 |
1986-05-07 |
Hitachi Ltd |
境界面測定装置
|
|
GB2165641B
(en)
|
1984-10-13 |
1988-01-13 |
Graviner Ltd |
Measuring distance to a fire
|
|
US4557916A
(en)
|
1984-10-22 |
1985-12-10 |
J. M. Huber Corporation |
Synthetic calcium silicates and methods of preparation
|
|
US4602158A
(en)
|
1984-10-26 |
1986-07-22 |
Itek Corporation |
PbS-PbSe IR detector arrays
|
|
AU4817385A
(en)
|
1984-10-29 |
1986-05-08 |
Mobil Oil Corporation |
Hydrotreating and dewaxing
|
|
US4603258A
(en)
|
1984-11-16 |
1986-07-29 |
Sri International |
Photocapacitive detector array
|
|
JPS61135280A
(ja)
|
1984-12-06 |
1986-06-23 |
Toshiba Corp |
三次元撮像素子
|
|
EP0185005B1
(en)
|
1984-12-10 |
1992-01-22 |
Monsanto Company |
Insertion of the bacillus thuringiensis crystal protein gene into plant-colonizing microorganisms and their use
|
|
DE3582576D1
(de)
|
1985-01-03 |
1991-05-23 |
Ciba Geigy Ag |
Dithioketo-pyrrolo-pyrrole, verfahren zu deren herstellung und verwendung.
|
|
FR2576694B1
(fr)
|
1985-01-28 |
1987-05-29 |
Gilles Karcher |
Collimateur pour tomoscintigraphie
|
|
JPS61186804A
(ja)
|
1985-02-11 |
1986-08-20 |
ゼロツクス コーポレーシヨン |
光検出装置
|
|
FR2577732B1
(fr)
|
1985-02-15 |
1987-03-20 |
Thomson Csf |
Dispositif precorrecteur du signal audiofrequence dans une chaine de modulation d'impulsions en largeur d'emetteur de signaux radioelectriques a modulation d'amplitude
|
|
GB8508670D0
(en)
|
1985-04-03 |
1985-05-09 |
Crop Control Products Ltd |
Electrostatic spraying apparatus
|
|
US4647193A
(en)
|
1985-06-10 |
1987-03-03 |
Rca Corporation |
Optical target ranging apparatus
|
|
US4760004A
(en)
|
1986-11-10 |
1988-07-26 |
Ciba-Geigy Corporation |
Thioquinacridones and isothioquinacridones, preparation and use thereof
|
|
JPS6417485A
(en)
|
1987-07-10 |
1989-01-20 |
Mitsubishi Electric Corp |
Image sensing element
|
|
DE3789505T2
(de)
|
1987-09-28 |
1994-10-20 |
Kobe Steel Ltd |
Vorrichtung und Verfahren zum Feststellen der Richtung von einfallendem Licht.
|
|
US5082363A
(en)
|
1988-02-12 |
1992-01-21 |
Omron Tateisi Electronics Co. |
Optical distance measuring apparatus and method using light projection pulses
|
|
CH674596A5
(enExample)
|
1988-02-12 |
1990-06-15 |
Sulzer Ag |
|
|
US5343291A
(en)
|
1988-02-16 |
1994-08-30 |
Canon Kabushiki Kaisha |
Method and apparatus for measuring an interval between two objects
|
|
US4952472A
(en)
|
1988-07-01 |
1990-08-28 |
Xerox Corporation |
Indigoid photoconductor imaging members
|
|
JP2687154B2
(ja)
|
1988-12-23 |
1997-12-08 |
株式会社小松製作所 |
三次元位置計測装置
|
|
JPH04240817A
(ja)
|
1991-01-25 |
1992-08-28 |
Seiko Epson Corp |
光学素子
|
|
AU650878B2
(en)
|
1990-04-17 |
1994-07-07 |
Ecole Polytechnique Federale De Lausanne |
Photovoltaic cells
|
|
DE4211875A1
(de)
|
1990-10-09 |
1993-10-14 |
Zeiss Carl Fa |
Optischer Abstandssensor
|
|
JP3187897B2
(ja)
|
1991-02-26 |
2001-07-16 |
オリンパス光学工業株式会社 |
測距装置
|
|
US5375008A
(en)
|
1991-07-17 |
1994-12-20 |
Electronic Warfare Associates, Inc. |
Systems for distinguishing between friendly ground targets and those of a foe
|
|
JPH0548833A
(ja)
|
1991-08-07 |
1993-02-26 |
Asahi Optical Co Ltd |
色収差補正構造
|
|
US5227985A
(en)
|
1991-08-19 |
1993-07-13 |
University Of Maryland |
Computer vision system for position monitoring in three dimensions using non-coplanar light sources attached to a monitored object
|
|
JP3110095B2
(ja)
|
1991-09-20 |
2000-11-20 |
富士通株式会社 |
測距方法及び測距装置
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|
US5216476A
(en)
|
1991-10-15 |
1993-06-01 |
Synectics Corporation |
Photogrammetric laser system
|
|
US5291066A
(en)
|
1991-11-14 |
1994-03-01 |
General Electric Company |
Moisture-proof electrical circuit high density interconnect module and method for making same
|
|
US5355241A
(en)
|
1991-12-09 |
1994-10-11 |
Kelley Clifford W |
Identification friend or foe discriminator
|
|
AT401829B
(de)
|
1992-02-25 |
1996-12-27 |
Oesterr Nationalbank |
Verfahren zur zustands-, qualitäts- bzw. passerkontrolle von optischen sicherheitsmerkmalenauf wertpapieren, insbesondere banknoten, und vorrichtung zur durchführung des verfahrens
|
|
JPH05240640A
(ja)
|
1992-02-26 |
1993-09-17 |
Omron Corp |
光学式距離測定装置
|
|
JPH06133321A
(ja)
|
1992-10-15 |
1994-05-13 |
Sony Corp |
Ｃｃｄ撮像装置
|
|
JP3406656B2
(ja)
|
1992-12-19 |
2003-05-12 |
ペンタックス株式会社 |
測距装置
|
|
JPH07142761A
(ja)
|
1993-11-18 |
1995-06-02 |
Mitsubishi Electric Corp |
受光素子ならびに受光素子アレイおよび画像検出装置ならびに画像検出方法
|
|
JPH07146113A
(ja)
|
1993-11-25 |
1995-06-06 |
Hitachi Zosen Corp |
レーザ変位計
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JP3143319B2
(ja)
|
1994-05-26 |
2001-03-07 |
防衛庁技術研究本部長 |
電子光学機器
|
|
FR2720515B1
(fr)
*
|
1994-05-27 |
1996-08-23 |
Aerospatiale |
Instrument spatial d'observation laser, et véhicule spatial le comportant.
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|
US5589928A
(en)
|
1994-09-01 |
1996-12-31 |
The Boeing Company |
Method and apparatus for measuring distance to a target
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US5596454A
(en)
*
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1994-10-28 |
1997-01-21 |
The National Registry, Inc. |
Uneven surface image transfer apparatus
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JPH08159714A
(ja)
|
1994-11-30 |
1996-06-21 |
Omron Corp |
位置検出センサ
|
|
JPH08292586A
(ja)
|
1995-04-21 |
1996-11-05 |
Hodogaya Chem Co Ltd |
電子写真用感光体
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US6363164B1
(en)
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1996-05-13 |
2002-03-26 |
Cummins-Allison Corp. |
Automated document processing system using full image scanning
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JP2004039248A
(ja)
*
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1995-05-30 |
2004-02-05 |
Matsushita Electric Ind Co Ltd |
対物レンズ、光ヘッド装置および光ディスク装置
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US6229913B1
(en)
|
1995-06-07 |
2001-05-08 |
The Trustees Of Columbia University In The City Of New York |
Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two-images due to defocus
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CA2196563A1
(en)
|
1995-06-07 |
1996-12-19 |
Shree K. Nayar |
Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus
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DE19526526A1
(de)
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1995-07-20 |
1997-01-23 |
Bayerische Motoren Werke Ag |
Vorrichtung zum optischen Abtasten von Meßflächen
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EP0852732A1
(en)
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1995-09-21 |
1998-07-15 |
Omniplanar, Inc. |
Method and apparatus for determining position and orientation
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JP3364382B2
(ja)
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1996-07-12 |
2003-01-08 |
株式会社東芝 |
試料面位置測定装置及び測定方法
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JPH10221064A
(ja)
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1997-02-07 |
1998-08-21 |
Nippon Soken Inc |
光学式測距装置
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FR2761151B1
(fr)
*
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1997-03-21 |
1999-07-16 |
Samuel Bucourt |
Systeme optronique de mesure de distance sans contact d'une source lumineuse par analyse de la courbure du point d'onde issu de celle-ci
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EP0911758B1
(en)
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1997-07-29 |
2005-11-30 |
Nhk Spring Co.Ltd. |
Optical identification system using cholesteric liquid crystals
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WO1999009603A1
(en)
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1997-08-15 |
1999-02-25 |
Uniax Corporation |
Organic diodes with switchable photosensitivity
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JPH11230860A
(ja)
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1998-02-12 |
1999-08-27 |
Fujitsu Ltd |
光学的薄膜計測方法及び装置並びにこの装置に用いられる光学的薄膜計測妨害光除去装置
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JPH11257917A
(ja)
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1998-03-12 |
1999-09-24 |
Omron Corp |
反射型光式センサ
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JPH11325825A
(ja)
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1998-05-13 |
1999-11-26 |
Olympus Optical Co Ltd |
距離測定装置
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(en)
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1998-06-22 |
2001-02-20 |
Citizen Watch Co., Ltd. |
Variable focal length lens panel and fabricating the same
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US6266142B1
(en)
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1998-09-21 |
2001-07-24 |
The Texas A&M University System |
Noncontact position and orientation measurement system and method
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JP3219387B2
(ja)
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1999-01-08 |
2001-10-15 |
ミノルタ株式会社 |
撮像装置および該撮像装置を用いた測距装置
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1999-06-17 |
2002-03-19 |
Chemmotif, Inc. |
Spectral sensitization of nanocrystalline solar cells
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US6417836B1
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1999-08-02 |
2002-07-09 |
Lucent Technologies Inc. |
Computer input device having six degrees of freedom for controlling movement of a three-dimensional object
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WO2001029576A1
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1999-10-21 |
2001-04-26 |
Psc Scanning, Inc. |
Rangefinder using collected spot spread and insert shadowing
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(en)
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1999-11-24 |
2004-08-31 |
Ricoh Company, Ltd. |
Optical scanning device having a temperature compensation unit
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ES2462369T3
(es)
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2000-01-21 |
2014-05-22 |
Jds Uniphase Corporation |
Dispositivos de seguridad ópticamente variables
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JP4547760B2
(ja)
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2000-02-28 |
2010-09-22 |
株式会社島津製作所 |
放射線検出器および放射線撮像装置
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JP4132546B2
(ja)
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2000-02-29 |
2008-08-13 |
富士フイルム株式会社 |
光拡散板、光拡散板の製造方法および表示装置
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US6590224B2
(en)
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2000-03-22 |
2003-07-08 |
Fuji Photo Film Co., Ltd. |
Image storage medium and method of manufacturing the same
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JP3554929B2
(ja)
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2000-05-09 |
2004-08-18 |
韓国科学技術院 |
多方向反射体を用いたハードディスクドライブスライダーの６自由度運動の測定のためのスイングアーム光学系
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EP1176646A1
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2000-07-28 |
2002-01-30 |
Ecole Polytechnique Féderale de Lausanne (EPFL) |
Solid state heterojunction and solid state sensitized photovoltaic cell
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US6699728B2
(en)
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2000-09-06 |
2004-03-02 |
Osram Opto Semiconductors Gmbh |
Patterning of electrodes in oled devices
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US7057337B1
(en)
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2000-09-06 |
2006-06-06 |
Osram Opto Semiconductors Gmbh |
Patterning of electrodes in OLED devices
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DE10146752B4
(de)
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2000-09-25 |
2006-03-23 |
Leuze Electronic Gmbh & Co Kg |
Optoelektronische Vorrichtung
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JP2002100469A
(ja)
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2000-09-25 |
2002-04-05 |
Pioneer Electronic Corp |
有機エレクトロルミネッセンス表示パネル
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JP4278080B2
(ja)
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2000-09-27 |
2009-06-10 |
富士フイルム株式会社 |
高感度受光素子及びイメージセンサー
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ATE298754T1
(de)
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2001-03-23 |
2005-07-15 |
Basf Ag |
Tert.-alkylphenoxysubstituierte polycyclische verbindungen
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EP1396033A4
(en)
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2001-06-11 |
2011-05-18 |
Univ Princeton |
ORGANIC PHOTOVOLTAIC COMPONENTS
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DE10130763A1
(de)
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2001-06-26 |
2003-01-02 |
Bosch Gmbh Robert |
Vorrichtung zur optischen Distanzmessung über einen grossen Messbereich
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DE10134132A1
(de)
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2001-07-13 |
2003-01-30 |
Siemens Ag |
Vorrichtung und Verfahren zum kontinuierlichen Drucken von organischen Leuchtdioden
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US6656611B2
(en)
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2001-07-20 |
2003-12-02 |
Osram Opto Semiconductors Gmbh |
Structure-defining material for OLEDs
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EP1412697A1
(en)
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2001-08-01 |
2004-04-28 |
National Research Council Of Canada |
System and method of light spot position and color detection
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NO316632B1
(no)
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2001-11-16 |
2004-03-15 |
Thin Film Electronics Asa |
Matriseadresserbart optoelektronisk apparat og elektrodeanordning i samme
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JP2003209665A
(ja)
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2002-01-16 |
2003-07-25 |
Fuji Photo Film Co Ltd |
画像読取方法および画像記録読取装置
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US20030147002A1
(en)
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2002-02-06 |
2003-08-07 |
Eastman Kodak Company |
Method and apparatus for a color sequential scannerless range imaging system
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JP2003333757A
(ja)
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2002-05-14 |
2003-11-21 |
Sony Corp |
電源装置
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CH695914A5
(de)
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2002-05-17 |
2006-10-13 |
Hera Rotterdam Bv |
Vorrichtung und Verfahren zur optischen Erfassung von Gegenständen.
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WO2003098617A2
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2002-05-17 |
2003-11-27 |
Ciba Specialty Chemicals Holding Inc. |
Optical storage media comprising pentacyclic xanthylium dyes
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US20050122308A1
(en)
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2002-05-28 |
2005-06-09 |
Matthew Bell |
Self-contained interactive video display system
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EP1376205A1
(fr)
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2002-06-21 |
2004-01-02 |
Asulab S.A. |
Moyens de connexion destinés à établir une liaison électrique entre une cellule, notamment à cristaux liquides, et un circuit d'alimentation ou de commande
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US20040031519A1
(en)
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2002-08-13 |
2004-02-19 |
Agfa-Gevaert |
Nano-porous metal oxide semiconductor spectrally sensitized with metal oxide chalcogenide nano-particles
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DE10238994A1
(de)
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2002-08-20 |
2004-02-26 |
Basf Ag |
Rylenfarbstoffe
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GB2395261A
(en)
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2002-11-11 |
2004-05-19 |
Qinetiq Ltd |
Ranging apparatus
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(en)
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2002-11-25 |
2005-09-20 |
Eastman Kodak Company |
Organic vertical cavity laser and imaging system
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2003-02-11 |
2015-11-03 |
Sony Computer Entertainment Inc. |
Method and apparatus for real time motion capture
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WO2004081502A2
(en)
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2003-03-12 |
2004-09-23 |
O-Pen Aps |
A system and a method of determining the position of a radiation emitting element
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US6995445B2
(en)
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2003-03-14 |
2006-02-07 |
The Trustees Of Princeton University |
Thin film organic position sensitive detectors
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EP1464990B8
(de)
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2003-03-31 |
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