JP2018535413A - センサ素子およびセンサ素子を製造するための方法 - Google Patents
センサ素子およびセンサ素子を製造するための方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 34
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000000919 ceramic Substances 0.000 claims abstract description 27
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 5
- 238000007639 printing Methods 0.000 claims description 18
- 239000012876 carrier material Substances 0.000 claims description 10
- 238000005245 sintering Methods 0.000 claims description 8
- 238000004544 sputter deposition Methods 0.000 claims description 8
- 238000000608 laser ablation Methods 0.000 claims description 6
- 239000010409 thin film Substances 0.000 claims description 6
- 239000010410 layer Substances 0.000 description 74
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 23
- 239000000463 material Substances 0.000 description 21
- 239000010408 film Substances 0.000 description 20
- 229910052709 silver Inorganic materials 0.000 description 14
- 239000004332 silver Substances 0.000 description 14
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 13
- 229910052759 nickel Inorganic materials 0.000 description 11
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 8
- 229910052737 gold Inorganic materials 0.000 description 8
- 239000010931 gold Substances 0.000 description 8
- 238000005476 soldering Methods 0.000 description 6
- 229910052720 vanadium Inorganic materials 0.000 description 6
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 238000009966 trimming Methods 0.000 description 4
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 3
- 229910018516 Al—O Inorganic materials 0.000 description 3
- 229910018663 Mn O Inorganic materials 0.000 description 3
- 229910003176 Mn-O Inorganic materials 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000007873 sieving Methods 0.000 description 3
- 229910052596 spinel Inorganic materials 0.000 description 3
- 239000011029 spinel Substances 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 239000007772 electrode material Substances 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 101100073333 Homo sapiens KANSL3 gene Proteins 0.000 description 1
- 102100037489 KAT8 regulatory NSL complex subunit 3 Human genes 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000009817 primary granulation Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000009818 secondary granulation Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- G—PHYSICS
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28B—SHAPING CLAY OR OTHER CERAMIC COMPOSITIONS; SHAPING SLAG; SHAPING MIXTURES CONTAINING CEMENTITIOUS MATERIAL, e.g. PLASTER
- B28B11/00—Apparatus or processes for treating or working the shaped or preshaped articles
- B28B11/24—Apparatus or processes for treating or working the shaped or preshaped articles for curing, setting or hardening
- B28B11/243—Setting, e.g. drying, dehydrating or firing ceramic articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28B—SHAPING CLAY OR OTHER CERAMIC COMPOSITIONS; SHAPING SLAG; SHAPING MIXTURES CONTAINING CEMENTITIOUS MATERIAL, e.g. PLASTER
- B28B3/00—Producing shaped articles from the material by using presses; Presses specially adapted therefor
- B28B3/02—Producing shaped articles from the material by using presses; Presses specially adapted therefor wherein a ram exerts pressure on the material in a moulding space; Ram heads of special form
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/075—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques
- H01C17/08—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques by vapour deposition
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/075—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques
- H01C17/12—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques by sputtering
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/28—Apparatus or processes specially adapted for manufacturing resistors adapted for applying terminals
- H01C17/281—Apparatus or processes specially adapted for manufacturing resistors adapted for applying terminals by thick film techniques
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/28—Apparatus or processes specially adapted for manufacturing resistors adapted for applying terminals
- H01C17/281—Apparatus or processes specially adapted for manufacturing resistors adapted for applying terminals by thick film techniques
- H01C17/283—Precursor compositions therefor, e.g. pastes, inks, glass frits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/008—Thermistors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/04—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient
- H01C7/042—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient mainly consisting of inorganic non-metallic substances
- H01C7/043—Oxides or oxidic compounds
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
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- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Nonlinear Science (AREA)
- Structural Engineering (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Thermistors And Varistors (AREA)
- Measuring Fluid Pressure (AREA)
- Measuring Oxygen Concentration In Cells (AREA)
Abstract
Description
−1つのセラミック担体材料を準備するステップ。担体材料として、たとえばAl2O3,ZrO2,ATZ材料,またはZTA材料,またはMgOをベースにした、セラミック基板が用いられる。
−この担体材料を少なくとも部分的に、NTC層を形成するためのNTCペーストを用いて印刷するステップ。このNTCペーストは、様々なドーピングを含むY−Ca−Cr−Al−O系のペロブスカイトをベースにして製造され、または様々なドーピングを含むNi−Co−Mn−O系のスピネルをベースにして製造される。この担体材料の印刷は、少なくとも1回の印刷処理において、好ましくは複数回の印刷処理において行われる。たとえば2回、3回、5回、または10回の印刷処理が行われる。上記のNTC層の厚さおよび抵抗は、好ましくはこの印刷処理の回数によって調整される。
−この担体材料およびNTCペーストからなる系を焼結するステップ。
−薄膜電極(複数)をこのNTC層上にスパッタリングするステップ。代替として、これらの電極は、このNTC層上に印刷されてもよい(厚膜電極)。
−所定の抵抗値に調整するために、レーザーアブレーションを用いてこのNTC層を部分的に除去するステップ。
−1つのセラミック担体。
−少なくとも2つの電極。
−少なくとも1つのNTC層。ここで上記の担体はこのNTC層を用いて印刷されており、このNTC層は、この担体の表面の少なくとも一部を覆っている。
ここで上記の電極(複数)は、このNTC層上に配設されており、これらの電極は空間的に互いに離間されており、そして上記のセンサ素子は、このセンサ素子のワイヤリング無しの接続が可能であるように構成されている。
2 : 担体
3 : NTC層
4 : 電極
5 : 空き領域
6 : 凹部
7 : 空き縁部
Claims (12)
- 温度測定用のセンサ素子(1)であって、
1つのセラミック担体(2)と、
少なくとも1つのNTC層(3)と、
を備え、
前記担体(2)は前記NTC層(3)で印刷されており、
前記NTC層(3)は、前記担体(2)の1つの表面の少なくとも一部を覆っており、
前記センサ素子(1)は、ワイヤリング無しの接続用に構成されている、
ことを特徴とするセンサ素子。 - 請求項1に記載のセンサ素子において、
前記センサ素子(1)は、少なくとも2つの電極(4)を備え、 前記電極(4)は、前記NTC層(3)上に配設されており、
前記電極(4)は、1つの空き領域(5)によって互いに離間されている、
ことを特徴とするセンサ素子。 - 前記NTC層(3)は、前記担体(2)の第1の表面を完全に覆っていることを特徴とする、請求項1または2に記載のセンサ素子。
- 前記NTC層(3)の抵抗は、印刷処理の回数によって決定されていることを特徴とする、請求項1乃至3のいずれか1項に記載のセンサ素子。
- それぞれの前記電極(4)は、少なくとも1つのスパッタリングされた層を備えることを特徴とする、請求項1乃至4のいずれか1項に記載のセンサ素子。
- 前記スパッタリングされた層は、前記NTC層(3)上に直接取り付けられていることを特徴とする、請求項5に記載のセンサ素子。
- それぞれの前記電極(4)は、少なくとも1つの印刷された層を備えることを特徴とする、請求項1乃至4のいずれか1項に記載のセンサ素子。
- 前記印刷された層は、直接前記NTC層(3)上に印刷されていることを特徴とする、請求項7に記載のセンサ素子。
- 前記NTC層(3)は、1つの凹部(6)を備え、当該凹部(6)は、前記NTC層(3)の抵抗を調整するために設けられていることを特徴とする、請求項1乃至8のいずれか1項に記載のセンサ素子。
- センサ素子(1)を製造するための方法であって、
1つのセラミック担体材料を準備するステップと、
前記担体材料を少なくとも部分的に、NTC層(3)を形成するためのNTCペーストを用いて印刷するステップであって、当該印刷が、少なくとも1回の印刷処理で行われるステップと、
担体材料およびNTCペーストからなる系を焼結するステップと、
複数の薄膜電極を前記NTC層(3)上にスパッタリングするステップと、
を備えることを特徴とする方法。 - 前記NTC層(3)の厚さおよび抵抗は、前記印刷処理の回数によって調整されることを特徴とする、請求項10に記載の方法。
- 請求項10または11に記載の方法において、
前記方法はさらに、
所定の抵抗値に調整するために、レーザーアブレーションを用いて前記NTC層(3)を部分的に除去するステップを備えることを特徴とする方法。
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DE102015118720 | 2015-11-02 | ||
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DE102016101248.3A DE102016101248A1 (de) | 2015-11-02 | 2016-01-25 | Sensorelement und Verfahren zur Herstellung eines Sensorelements |
PCT/EP2016/074942 WO2017076631A1 (de) | 2015-11-02 | 2016-10-18 | Sensorelement und verfahren zur herstellung eines sensorelements |
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JP2018522611A Pending JP2019500589A (ja) | 2015-11-02 | 2016-10-18 | センサ構成体およびセンサ構成体を製造するための方法 |
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DE102016101249A1 (de) * | 2015-11-02 | 2017-05-04 | Epcos Ag | Sensorelement und Verfahren zur Herstellung eines Sensorelements |
US10648390B2 (en) * | 2016-03-02 | 2020-05-12 | Watlow Electric Manufacturing Company | System and method for axial zoning of heating power |
DE102017116533A1 (de) * | 2017-07-21 | 2019-01-24 | Tdk Electronics Ag | Anlegetemperaturmessfühler |
CN107819293B (zh) * | 2017-11-30 | 2024-02-27 | 杭州泽济电子科技有限公司 | 具有小型化电子标签的动触头 |
DE102019127915A1 (de) * | 2019-10-16 | 2021-04-22 | Tdk Electronics Ag | Sensorelement und Verfahren zur Herstellung eines Sensorelements |
DE102019127924B3 (de) * | 2019-10-16 | 2021-01-21 | Tdk Electronics Ag | Bauelement und Verfahren zur Herstellung eines Bauelements |
CN118676305A (zh) | 2019-11-15 | 2024-09-20 | 日本汽车能源株式会社 | 锂离子二次电池用正极及其制造方法和锂离子二次电池 |
DE102019131306A1 (de) * | 2019-11-20 | 2021-05-20 | Tdk Electronics Ag | Sensorelement und Verfahren zur Herstellung eines Sensorelements |
DE102020122923A1 (de) * | 2020-09-02 | 2022-03-03 | Tdk Electronics Ag | Sensorelement und Verfahren zur Herstellung eines Sensorelements |
DE102020133985A1 (de) | 2020-12-17 | 2022-06-23 | Tdk Electronics Ag | Sensoranordnung und Verfahren zur Herstellung einer Sensoranordnung |
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US20190204162A1 (en) | 2019-07-04 |
JP2019500589A (ja) | 2019-01-10 |
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JP6585844B2 (ja) | 2019-10-02 |
EP3371563B1 (de) | 2020-01-01 |
CN108351256A (zh) | 2018-07-31 |
JP2019502898A (ja) | 2019-01-31 |
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CN108139276A (zh) | 2018-06-08 |
CN108351258A (zh) | 2018-07-31 |
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EP3371562A1 (de) | 2018-09-12 |
CN108351257A (zh) | 2018-07-31 |
WO2017076638A1 (de) | 2017-05-11 |
US20180321091A1 (en) | 2018-11-08 |
EP3371565A1 (de) | 2018-09-12 |
EP3371565B1 (de) | 2020-01-01 |
DE102016101249A1 (de) | 2017-05-04 |
JP6564533B2 (ja) | 2019-08-21 |
DE102016101247A1 (de) | 2017-05-04 |
WO2017076632A1 (de) | 2017-05-11 |
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US10908030B2 (en) | 2021-02-02 |
US20180306647A1 (en) | 2018-10-25 |
EP3371562B1 (de) | 2020-05-13 |
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JP2019207241A (ja) | 2019-12-05 |
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