JP2014143401A - 半導体装置およびその作製方法 - Google Patents
半導体装置およびその作製方法 Download PDFInfo
- Publication number
- JP2014143401A JP2014143401A JP2013261022A JP2013261022A JP2014143401A JP 2014143401 A JP2014143401 A JP 2014143401A JP 2013261022 A JP2013261022 A JP 2013261022A JP 2013261022 A JP2013261022 A JP 2013261022A JP 2014143401 A JP2014143401 A JP 2014143401A
- Authority
- JP
- Japan
- Prior art keywords
- film
- oxide
- oxide semiconductor
- semiconductor film
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 670
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 30
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 201
- 239000001301 oxygen Substances 0.000 claims abstract description 199
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 196
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 101
- 238000012545 processing Methods 0.000 claims abstract description 39
- 238000000034 method Methods 0.000 claims description 100
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 20
- 150000002500 ions Chemical class 0.000 claims description 19
- 238000005468 ion implantation Methods 0.000 claims description 15
- 239000002344 surface layer Substances 0.000 claims description 3
- 206010021143 Hypoxia Diseases 0.000 abstract description 7
- 239000010408 film Substances 0.000 description 1587
- 239000011701 zinc Substances 0.000 description 210
- 239000013078 crystal Substances 0.000 description 125
- 108091006146 Channels Proteins 0.000 description 116
- 239000000758 substrate Substances 0.000 description 109
- 239000003990 capacitor Substances 0.000 description 91
- 239000000523 sample Substances 0.000 description 77
- 238000004544 sputter deposition Methods 0.000 description 74
- 238000010438 heat treatment Methods 0.000 description 67
- 239000010410 layer Substances 0.000 description 64
- 238000010894 electron beam technology Methods 0.000 description 61
- 239000007789 gas Substances 0.000 description 56
- 239000000843 powder Substances 0.000 description 54
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 51
- 238000005259 measurement Methods 0.000 description 51
- 238000005477 sputtering target Methods 0.000 description 51
- 239000002245 particle Substances 0.000 description 50
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 48
- 229910052710 silicon Inorganic materials 0.000 description 47
- 239000010703 silicon Substances 0.000 description 47
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 45
- 239000000463 material Substances 0.000 description 45
- 229910052814 silicon oxide Inorganic materials 0.000 description 42
- 229910052739 hydrogen Inorganic materials 0.000 description 41
- 239000001257 hydrogen Substances 0.000 description 40
- 239000012535 impurity Substances 0.000 description 39
- 239000012298 atmosphere Substances 0.000 description 38
- 230000006870 function Effects 0.000 description 37
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 35
- 125000004429 atom Chemical group 0.000 description 32
- 150000004767 nitrides Chemical class 0.000 description 30
- 229910052581 Si3N4 Inorganic materials 0.000 description 29
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 29
- 239000002585 base Substances 0.000 description 28
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 27
- 238000002441 X-ray diffraction Methods 0.000 description 27
- 229910052721 tungsten Inorganic materials 0.000 description 25
- 239000004020 conductor Substances 0.000 description 24
- 238000002524 electron diffraction data Methods 0.000 description 24
- 229910052751 metal Inorganic materials 0.000 description 24
- 229910052786 argon Inorganic materials 0.000 description 23
- 238000005530 etching Methods 0.000 description 23
- 238000000151 deposition Methods 0.000 description 21
- 230000008021 deposition Effects 0.000 description 21
- 235000013339 cereals Nutrition 0.000 description 20
- 238000006243 chemical reaction Methods 0.000 description 20
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 20
- 239000010937 tungsten Substances 0.000 description 20
- 238000010586 diagram Methods 0.000 description 19
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 18
- 238000010521 absorption reaction Methods 0.000 description 18
- 238000003917 TEM image Methods 0.000 description 17
- 230000008569 process Effects 0.000 description 17
- 230000007547 defect Effects 0.000 description 16
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 16
- 229910001868 water Inorganic materials 0.000 description 16
- 230000004888 barrier function Effects 0.000 description 15
- 239000004973 liquid crystal related substance Substances 0.000 description 15
- 239000002184 metal Substances 0.000 description 15
- 229910052738 indium Inorganic materials 0.000 description 14
- 238000004458 analytical method Methods 0.000 description 13
- 238000001228 spectrum Methods 0.000 description 13
- 230000001133 acceleration Effects 0.000 description 12
- 229910052782 aluminium Inorganic materials 0.000 description 12
- 238000001514 detection method Methods 0.000 description 12
- 238000009826 distribution Methods 0.000 description 12
- 230000005540 biological transmission Effects 0.000 description 11
- 238000002003 electron diffraction Methods 0.000 description 11
- 239000000203 mixture Substances 0.000 description 11
- 229910052757 nitrogen Inorganic materials 0.000 description 11
- 238000003860 storage Methods 0.000 description 11
- 238000005229 chemical vapour deposition Methods 0.000 description 10
- 229910052733 gallium Inorganic materials 0.000 description 10
- 229910000449 hafnium oxide Inorganic materials 0.000 description 10
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 10
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 description 10
- PLDDOISOJJCEMH-UHFFFAOYSA-N neodymium(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Nd+3].[Nd+3] PLDDOISOJJCEMH-UHFFFAOYSA-N 0.000 description 10
- 230000001590 oxidative effect Effects 0.000 description 10
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 9
- 238000004364 calculation method Methods 0.000 description 9
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 9
- 230000003287 optical effect Effects 0.000 description 9
- 239000010936 titanium Substances 0.000 description 9
- 229910052725 zinc Inorganic materials 0.000 description 9
- 239000011787 zinc oxide Substances 0.000 description 9
- 150000001875 compounds Chemical class 0.000 description 8
- 230000006378 damage Effects 0.000 description 8
- 238000009792 diffusion process Methods 0.000 description 8
- 125000005843 halogen group Chemical group 0.000 description 8
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 8
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 8
- 238000003776 cleavage reaction Methods 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 230000005684 electric field Effects 0.000 description 7
- 238000002955 isolation Methods 0.000 description 7
- 230000002093 peripheral effect Effects 0.000 description 7
- 230000000630 rising effect Effects 0.000 description 7
- 230000007017 scission Effects 0.000 description 7
- 229910052719 titanium Inorganic materials 0.000 description 7
- 238000004380 ashing Methods 0.000 description 6
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 6
- 229910001195 gallium oxide Inorganic materials 0.000 description 6
- 150000002431 hydrogen Chemical class 0.000 description 6
- -1 machines Substances 0.000 description 6
- 230000003647 oxidation Effects 0.000 description 6
- 238000007254 oxidation reaction Methods 0.000 description 6
- 229910052684 Cerium Inorganic materials 0.000 description 5
- 238000000560 X-ray reflectometry Methods 0.000 description 5
- 238000000231 atomic layer deposition Methods 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 229910001873 dinitrogen Inorganic materials 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 229910052732 germanium Inorganic materials 0.000 description 5
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 238000007654 immersion Methods 0.000 description 5
- 230000001788 irregular Effects 0.000 description 5
- 229910052746 lanthanum Inorganic materials 0.000 description 5
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 5
- 239000000395 magnesium oxide Substances 0.000 description 5
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 5
- 229910044991 metal oxide Inorganic materials 0.000 description 5
- 150000004706 metal oxides Chemical class 0.000 description 5
- 239000002159 nanocrystal Substances 0.000 description 5
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 5
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 description 5
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 5
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 5
- 230000003071 parasitic effect Effects 0.000 description 5
- 238000004549 pulsed laser deposition Methods 0.000 description 5
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 5
- 229910001936 tantalum oxide Inorganic materials 0.000 description 5
- 229910001928 zirconium oxide Inorganic materials 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 4
- 229910052779 Neodymium Inorganic materials 0.000 description 4
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 229910052804 chromium Inorganic materials 0.000 description 4
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 4
- KMHJKRGRIJONSV-UHFFFAOYSA-N dioxygen(.1+) Chemical compound [O+]=O KMHJKRGRIJONSV-UHFFFAOYSA-N 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 4
- 230000005669 field effect Effects 0.000 description 4
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 229910001416 lithium ion Inorganic materials 0.000 description 4
- 238000001451 molecular beam epitaxy Methods 0.000 description 4
- 229910052750 molybdenum Inorganic materials 0.000 description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 239000012299 nitrogen atmosphere Substances 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 229910052718 tin Inorganic materials 0.000 description 4
- 229910052726 zirconium Inorganic materials 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 229910018137 Al-Zn Inorganic materials 0.000 description 3
- 229910018573 Al—Zn Inorganic materials 0.000 description 3
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 3
- 229910052692 Dysprosium Inorganic materials 0.000 description 3
- 229910052691 Erbium Inorganic materials 0.000 description 3
- 229910052693 Europium Inorganic materials 0.000 description 3
- 229910052688 Gadolinium Inorganic materials 0.000 description 3
- 229910052689 Holmium Inorganic materials 0.000 description 3
- 229910052777 Praseodymium Inorganic materials 0.000 description 3
- 229910052772 Samarium Inorganic materials 0.000 description 3
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 3
- 229910052771 Terbium Inorganic materials 0.000 description 3
- 229910052775 Thulium Inorganic materials 0.000 description 3
- 229910052769 Ytterbium Inorganic materials 0.000 description 3
- 230000009471 action Effects 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 238000003491 array Methods 0.000 description 3
- 239000000969 carrier Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000003795 desorption Methods 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 229910001882 dioxygen Inorganic materials 0.000 description 3
- 238000001312 dry etching Methods 0.000 description 3
- 238000007667 floating Methods 0.000 description 3
- 229910052735 hafnium Inorganic materials 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000005012 migration Effects 0.000 description 3
- 238000013508 migration Methods 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 229910052707 ruthenium Inorganic materials 0.000 description 3
- 229910000077 silane Inorganic materials 0.000 description 3
- 239000003381 stabilizer Substances 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- 229910018120 Al-Ga-Zn Inorganic materials 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- 102100040844 Dual specificity protein kinase CLK2 Human genes 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 101000749291 Homo sapiens Dual specificity protein kinase CLK2 Proteins 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- 229910052765 Lutetium Inorganic materials 0.000 description 2
- 240000007711 Peperomia pellucida Species 0.000 description 2
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 2
- 229910020868 Sn-Ga-Zn Inorganic materials 0.000 description 2
- 229910020994 Sn-Zn Inorganic materials 0.000 description 2
- 229910009069 Sn—Zn Inorganic materials 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 2
- 150000001342 alkaline earth metals Chemical class 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 238000002485 combustion reaction Methods 0.000 description 2
- 229910021419 crystalline silicon Inorganic materials 0.000 description 2
- 238000001887 electron backscatter diffraction Methods 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 238000002513 implantation Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229960001730 nitrous oxide Drugs 0.000 description 2
- 125000004430 oxygen atom Chemical group O* 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 2
- 238000000851 scanning transmission electron micrograph Methods 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 239000000779 smoke Substances 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000013589 supplement Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- MGWGWNFMUOTEHG-UHFFFAOYSA-N 4-(3,5-dimethylphenyl)-1,3-thiazol-2-amine Chemical compound CC1=CC(C)=CC(C=2N=C(N)SC=2)=C1 MGWGWNFMUOTEHG-UHFFFAOYSA-N 0.000 description 1
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonium chloride Substances [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 1
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 102100040862 Dual specificity protein kinase CLK1 Human genes 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 235000015842 Hesperis Nutrition 0.000 description 1
- 101000749294 Homo sapiens Dual specificity protein kinase CLK1 Proteins 0.000 description 1
- 235000012633 Iberis amara Nutrition 0.000 description 1
- 102000004129 N-Type Calcium Channels Human genes 0.000 description 1
- 108090000699 N-Type Calcium Channels Proteins 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 241001591005 Siga Species 0.000 description 1
- 229910020833 Sn-Al-Zn Inorganic materials 0.000 description 1
- 229910020944 Sn-Mg Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 229910009369 Zn Mg Inorganic materials 0.000 description 1
- 229910007541 Zn O Inorganic materials 0.000 description 1
- 229910007573 Zn-Mg Inorganic materials 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 235000011114 ammonium hydroxide Nutrition 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- XJVBHCCEUWWHMI-UHFFFAOYSA-N argon(.1+) Chemical compound [Ar+] XJVBHCCEUWWHMI-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000502 dialysis Methods 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical compound [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 230000012447 hatching Effects 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- KJZYNXUDTRRSPN-UHFFFAOYSA-N holmium atom Chemical compound [Ho] KJZYNXUDTRRSPN-UHFFFAOYSA-N 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910000765 intermetallic Inorganic materials 0.000 description 1
- 230000005596 ionic collisions Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 239000013081 microcrystal Substances 0.000 description 1
- 229910021423 nanocrystalline silicon Inorganic materials 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- JCXJVPUVTGWSNB-UHFFFAOYSA-N nitrogen dioxide Inorganic materials O=[N]=O JCXJVPUVTGWSNB-UHFFFAOYSA-N 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000001272 nitrous oxide Substances 0.000 description 1
- 235000013842 nitrous oxide Nutrition 0.000 description 1
- 239000003208 petroleum Substances 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000001552 radio frequency sputter deposition Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000001350 scanning transmission electron microscopy Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- 238000000391 spectroscopic ellipsometry Methods 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 238000012916 structural analysis Methods 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- FRNOGLGSGLTDKL-UHFFFAOYSA-N thulium atom Chemical compound [Tm] FRNOGLGSGLTDKL-UHFFFAOYSA-N 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- 238000004627 transmission electron microscopy Methods 0.000 description 1
- VEDJZFSRVVQBIL-UHFFFAOYSA-N trisilane Chemical compound [SiH3][SiH2][SiH3] VEDJZFSRVVQBIL-UHFFFAOYSA-N 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66969—Multistep manufacturing processes of devices having semiconductor bodies not comprising group 14 or group 13/15 materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78696—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
Abstract
【解決手段】酸化物半導体膜を形成し、酸化物半導体膜上に導電膜を形成し、導電膜の形成と同時に酸化物半導体膜と導電膜との間に低抵抗領域を形成し、導電膜を加工してソース電極およびドレイン電極を形成し、ソース電極およびドレイン電極との間の低抵抗領域に対して、酸素を添加し、低抵抗領域より高抵抗なチャネル形成領域と、チャネル形成領域を挟む第1の低抵抗領域および第2の低抵抗領域を形成する。
【選択図】図1
Description
本実施の形態では、本発明の一態様の半導体装置について図面を用いて説明する。
本実施の形態では、実施の形態1で説明した図1に示すトランジスタ150の作製方法について説明する。
本実施の形態では、実施の形態1で説明したトランジスタとは異なる構造のトランジスタについて説明する。
本実施の形態では、実施の形態3で説明した図10に示すトランジスタ250の作製方法について説明する。
本実施の形態では、本発明の一態様であるトランジスタを使用し、電力が供給されない状況でも記憶内容の保持が可能で、かつ、書き込み回数にも制限が無い半導体装置(記憶装置)の一例を、図面を用いて説明する。
本実施の形態では、本発明の一態様であるトランジスタを使用し、電力が供給されない状況でも記憶内容の保持が可能で、かつ、書き込み回数にも制限が無い半導体装置について、実施の形態5に示した構成と異なる半導体装置の説明を行う。
本実施の形態では、上記実施の形態で説明したトランジスタに用いることのできるCAAC−OS膜の結晶成長のモデルについて、図18乃至図20を用いて説明する。
本実施の形態では、本発明の一態様に係るスパッタリング用ターゲットについて説明する。
本実施の形態では、本発明の一態様に用いることのできるCAAC−OS膜について、電子線回折パターンの観察結果を説明する。
本実施の形態では、先の実施の形態で説明したトランジスタを用いることの半導体装置(表示装置)の例について説明する。
図26(A)に、半導体装置の一例を示す。図26(A)に示す半導体装置は、画素部1100と、走査線駆動回路1104と、信号線駆動回路1106と、各々が平行または略平行に配設され、かつ走査線駆動回路1104によって電位が制御されるm本の走査線1107と、各々が平行または略平行に配設され、かつ信号線駆動回路1106によって電位が制御されるn本の信号線1109と、を有する。さらに、画素部1100はマトリクス状に配設された複数の画素1101を有する。また、走査線1107に沿って、各々が平行または略平行に配設された容量線1115を有する。なお、容量線1115は、信号線1109に沿って、各々が平行または略平行に配設されていてもよい。
本実施の形態では、先の実施の形態で説明したトランジスタを用いることのできる電子機器の例について説明する。
トランジスタのVg−Id特性において、トランジスタのチャネル長が短くなるとドレイン電圧Vdによるオン電流が流れ始めるゲート電圧(立ち上がりゲート電圧ともいう)が異なることが観測されている。そこで、計算によりチャネル長と立ち上がりゲート電圧の関係を調べた。
102 下地絶縁膜
104 多層膜
104a 酸化物膜
104b 酸化物半導体膜
104c 酸化物膜
104d 領域
104e 酸化物膜
105 低抵抗領域
105a 低抵抗領域
105b 低抵抗領域
105c 領域
106 導電膜
106a ソース電極
106b ドレイン電極
107a 導電膜
107b 導電膜
108 ゲート絶縁膜
110 ゲート電極
112 酸化物絶縁膜
114 窒化物絶縁膜
120 酸素
150 トランジスタ
190 トランジスタ
195 トランジスタ
200 トランジスタ
210 トランジスタ
220 トランジスタ
230 トランジスタ
240 トランジスタ
250 トランジスタ
290 トランジスタ
295 トランジスタ
300 トランジスタ
310 トランジスタ
320 トランジスタ
330 トランジスタ
340 トランジスタ
400 トランジスタ
402 トランジスタ
404 容量素子
406 素子分離絶縁層
410 基板
420 絶縁膜
550 メモリセル
551 メモリセルアレイ
551a メモリセルアレイ
551b メモリセルアレイ
553 周辺回路
554 容量素子
562 トランジスタ
600 スパッタリング用ターゲット
601 イオン
602 スパッタリング粒子
603 被成膜面
700 マイクロコンピュータ
701 直流電源
702 バスライン
703 パワーゲートコントローラー
704 パワーゲート
705 CPU
706 揮発性記憶部
707 不揮発性記憶部
708 インターフェース
709 検出部
711 光センサ
712 アンプ
713 ADコンバータ
730 発光素子
801 半導体基板
803 素子分離領域
804 ゲート電極
805a 低抵抗領域
805b 低抵抗領域
806a 酸化物膜
806b 酸化物半導体膜
806c 酸化物膜
807 ゲート絶縁膜
809 ゲート電極
811a 不純物領域
811b 不純物領域
812 ゲート絶縁膜
815 絶縁膜
816a ソース電極
816b ドレイン電極
816c 電極
817 絶縁膜
818 酸化物絶縁膜
819a コンタクトプラグ
819b コンタクトプラグ
820 絶縁膜
821 絶縁膜
822 絶縁膜
823a 配線
823b 配線
825 絶縁膜
845 絶縁膜
849 配線
856 配線
860 半導体膜
870 トランジスタ
880 トランジスタ
890 光電変換素子
901 スイッチング素子
902 メモリセル
903 メモリセル群
919 ROMインターフェース
920 基板
921 ALU
922 ALUコントローラ
923 インストラクションデコーダ
924 インタラプトコントローラ
925 タイミングコントローラ
926 レジスタ
927 レジスタコントローラ
928 バスインターフェース
929 ROM
1000 表示装置
1001 筐体
1002 表示部
1003 スピーカー部
1004 CPU
1010 警報装置
1011 マイクロコンピュータ
1020 室内機
1021 筐体
1022 送風口
1023 CPU
1024 室外機
1030 電気冷凍冷蔵庫
1031 筐体
1032 冷蔵室用扉
1033 冷凍室用扉
1034 CPU
1040 電気自動車
1041 二次電池
1042 制御回路
1043 駆動装置
1044 処理装置
1100 画素部
1101 画素
1102 基板
1103 トランジスタ
1104 走査線駆動回路
1105 容量素子
1106 信号線駆動回路
1107 走査線
1108 液晶素子
1109 信号線
1111 半導体膜
1113 導電膜
1115 容量線
1117 開口
1120 導電膜
1121a 電極
1121b 画素電極
1123a 開口
1123b 開口
1125 導電膜
1127 ゲート絶縁膜
1129 絶縁膜
1131 絶縁膜
1133 絶縁膜
1154 対向電極
1623 トランジスタ
1627 ゲート電極
1628 半導体膜
1629 ソース電極
1639 ドレイン電極
1641 導電膜
2211 半導体基板
2212 絶縁膜
2213 ゲート電極
2214 ゲート絶縁膜
2215 ソース領域およびドレイン領域
Claims (11)
- 酸化物半導体膜と、
前記酸化物半導体膜上のソース電極およびドレイン電極と、
前記酸化物半導体膜と前記ソース電極との間に設けられた第1の低抵抗領域と、
前記酸化物半導体膜と前記ドレイン電極との間に設けられた第2の低抵抗領域と、
前記酸化物半導体膜中の、前記第1の低抵抗領域および前記第2の低抵抗領域に挟まれたチャネル形成領域と、を有し、
前記第1の低抵抗領域は、前記酸化物半導体膜と前記ソース電極との界面から前記酸化物半導体膜の深さ方向に0nmより大きく15nm以下の領域にあり、
前記第2の低抵抗領域は、前記酸化物半導体膜と前記ドレイン電極との界面から前記酸化物半導体膜の深さ方向に0nmより大きく15nm以下の領域にあることを特徴とする半導体装置。 - 酸化物半導体膜と、
前記酸化物半導体膜上のソース電極およびドレイン電極と、
前記酸化物半導体膜と前記ソース電極との間に設けられた第1の低抵抗領域と、
前記酸化物半導体膜と前記ドレイン電極との間に設けられた第2の低抵抗領域と、
前記酸化物半導体膜中の、前記第1の低抵抗領域および前記第2の低抵抗領域に挟まれたチャネル形成領域と、
前記酸化物半導体膜、前記ソース電極および前記ドレイン電極上のゲート絶縁膜と、
前記ゲート絶縁膜上の前記酸化物半導体膜と重畳するゲート電極と、を有し、
前記第1の低抵抗領域は、前記酸化物半導体膜と前記ソース電極との界面から前記酸化物半導体膜の深さ方向に0nmより大きく15nm以下の領域にあり、
前記第2の低抵抗領域は、前記酸化物半導体膜と前記ドレイン電極との界面から前記酸化物半導体膜の深さ方向に0nmより大きく15nm以下の領域にあることを特徴とする半導体装置。 - ゲート電極と、
前記ゲート電極上のゲート絶縁膜と、
前記ゲート絶縁膜上の酸化物半導体膜と、
前記酸化物半導体膜上のソース電極およびドレイン電極と、
前記酸化物半導体膜と前記ソース電極との間に設けられた第1の低抵抗領域と、
前記酸化物半導体膜と前記ドレイン電極との間に設けられた第2の低抵抗領域と、
前記酸化物半導体膜中の、前記第1の低抵抗領域および前記第2の低抵抗領域に挟まれたチャネル形成領域と、
前記酸化物半導体膜、前記ソース電極および前記ドレイン電極上の絶縁膜と、を有し、
前記第1の低抵抗領域は、前記酸化物半導体膜と前記ソース電極との界面から前記酸化物半導体膜の深さ方向に0nmより大きく15nm以下の領域にあり、
前記第2の低抵抗領域は、前記酸化物半導体膜と前記ドレイン電極との界面から前記酸化物半導体膜の深さ方向に0nmより大きく15nm以下の領域にあることを特徴とする半導体装置。 - 請求項1乃至請求項3のいずれか一項において、
前記酸化物半導体膜を挟む第1の酸化物膜および第2の酸化物膜を有し、
前記第1の酸化物膜および前記第2の酸化物膜は、前記酸化物半導体膜よりも伝導帯下端のエネルギーが0.05eV以上2eV以下の範囲で真空準位に近いことを特徴とする半導体装置。 - 請求項1乃至請求項4のいずれか一項において、
前記ソース電極と前記ドレイン電極間の長さと前記第1の低抵抗領域と前記第2の低抵抗領域間の長さの差は、前記ソース電極と前記ドレイン電極間の長さの30%未満であることを特徴とする半導体装置。 - 請求項1乃至請求項5のいずれか一項において、
前記チャネル形成領域の表層から前記酸化物半導体膜の深さ方向に対して、順に酸素の含有量が多くなる領域を有することを特徴とする半導体装置。 - 請求項2乃至請求項6のいずれか一項において、
前記ゲート絶縁膜は、酸化アルミニウムを有することを特徴とする半導体装置。 - 酸化物半導体膜を形成し、
前記酸化物半導体膜上に導電膜を形成し、
前記導電膜の形成と同時に、前記酸化物半導体膜と前記導電膜との間に低抵抗領域を形成し、
前記導電膜を加工してソース電極およびドレイン電極を形成し、
前記ソース電極および前記ドレイン電極と重畳しない前記低抵抗領域に対して、酸素を添加し、前記低抵抗領域より高抵抗なチャネル形成領域と、前記チャネル形成領域を挟む第1の低抵抗領域および第2の低抵抗領域を形成することを特徴とする半導体装置の作製方法。 - 酸化物半導体膜を形成し、
前記酸化物半導体膜上に導電膜を形成し、
前記導電膜の形成と同時に、前記酸化物半導体膜と前記導電膜との間に低抵抗領域を形成し、
前記導電膜を加工してソース電極およびドレイン電極を形成し、
前記酸化物半導体膜、前記ソース電極および前記ドレイン電極上にゲート絶縁膜を形成し、
前記ソース電極および前記ドレイン電極と重畳しない前記低抵抗領域に対して、酸素を添加し、前記低抵抗領域より高抵抗なチャネル形成領域と、前記チャネル形成領域を挟む第1の低抵抗領域および第2の低抵抗領域を形成し、
前記ゲート絶縁膜上の前記酸化物半導体膜と重畳するゲート電極を形成することを特徴とする半導体装置の作製方法。 - ゲート電極を形成し、
前記ゲート電極上にゲート絶縁膜を形成し、
前記ゲート絶縁膜上に酸化物半導体膜を形成し、
前記酸化物半導体膜上に導電膜を形成し、
前記導電膜の形成と同時に、前記酸化物半導体膜と前記導電膜との間に低抵抗領域を形成し、
前記導電膜を加工してソース電極およびドレイン電極を形成し、
前記ソース電極および前記ドレイン電極と重畳しない前記低抵抗領域に対して、酸素を添加し、前記低抵抗領域より高抵抗なチャネル形成領域と、前記チャネル形成領域を挟む第1の低抵抗領域および第2の低抵抗領域を形成し、
前記酸化物半導体膜、前記ソース電極および前記ドレイン電極上に絶縁膜を形成することを特徴とする半導体装置の作製方法。 - 請求項8乃至請求10のいずれか一項において、
前記酸素の添加は、イオンドーピング法またはイオンインプランテーション法により行うことを特徴とする半導体装置の作製方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013261022A JP6430698B2 (ja) | 2012-12-25 | 2013-12-18 | 半導体装置 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012281801 | 2012-12-25 | ||
JP2012281801 | 2012-12-25 | ||
JP2013261022A JP6430698B2 (ja) | 2012-12-25 | 2013-12-18 | 半導体装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018206523A Division JP2019054260A (ja) | 2012-12-25 | 2018-11-01 | 半導体装置の作製方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014143401A true JP2014143401A (ja) | 2014-08-07 |
JP6430698B2 JP6430698B2 (ja) | 2018-11-28 |
Family
ID=50973635
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013261022A Expired - Fee Related JP6430698B2 (ja) | 2012-12-25 | 2013-12-18 | 半導体装置 |
JP2018206523A Withdrawn JP2019054260A (ja) | 2012-12-25 | 2018-11-01 | 半導体装置の作製方法 |
JP2020135574A Active JP6987192B2 (ja) | 2012-12-25 | 2020-08-11 | 半導体装置 |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018206523A Withdrawn JP2019054260A (ja) | 2012-12-25 | 2018-11-01 | 半導体装置の作製方法 |
JP2020135574A Active JP6987192B2 (ja) | 2012-12-25 | 2020-08-11 | 半導体装置 |
Country Status (5)
Country | Link |
---|---|
US (5) | US20140175435A1 (ja) |
JP (3) | JP6430698B2 (ja) |
DE (1) | DE112013006219T5 (ja) |
TW (4) | TWI726237B (ja) |
WO (1) | WO2014103901A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016122833A (ja) * | 2014-11-28 | 2016-07-07 | 株式会社半導体エネルギー研究所 | 半導体装置、半導体装置の作製方法、及び該半導体装置を有する表示装置 |
JP2018006727A (ja) * | 2015-12-15 | 2018-01-11 | 株式会社半導体エネルギー研究所 | 半導体装置及び表示装置 |
JP2021034577A (ja) * | 2019-08-26 | 2021-03-01 | 株式会社ジャパンディスプレイ | 半導体装置および半導体装置の製造方法 |
JP2021108407A (ja) * | 2014-09-19 | 2021-07-29 | 株式会社半導体エネルギー研究所 | 半導体装置 |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102113160B1 (ko) * | 2012-06-15 | 2020-05-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US20140027762A1 (en) * | 2012-07-27 | 2014-01-30 | Semiconductor Energy Laboratory Co. Ltd. | Semiconductor device |
KR102207028B1 (ko) | 2012-12-03 | 2021-01-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
TWI614813B (zh) | 2013-01-21 | 2018-02-11 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
US9190527B2 (en) | 2013-02-13 | 2015-11-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method of semiconductor device |
US9153650B2 (en) | 2013-03-19 | 2015-10-06 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor |
TWI652822B (zh) | 2013-06-19 | 2019-03-01 | 日商半導體能源研究所股份有限公司 | 氧化物半導體膜及其形成方法 |
TWI608523B (zh) | 2013-07-19 | 2017-12-11 | 半導體能源研究所股份有限公司 | Oxide semiconductor film, method of manufacturing oxide semiconductor film, and semiconductor device |
CN103412450A (zh) * | 2013-07-26 | 2013-11-27 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法和显示装置 |
KR102281300B1 (ko) | 2013-09-11 | 2021-07-26 | 삼성디스플레이 주식회사 | 박막 트랜지스터, 박막 트랜지스터의 제조 방법 및 박막 트랜지스터를 포함하는 표시장치 |
TWI721409B (zh) | 2013-12-19 | 2021-03-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
KR102317297B1 (ko) | 2014-02-19 | 2021-10-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물, 반도체 장치, 모듈, 및 전자 장치 |
TWI663726B (zh) | 2014-05-30 | 2019-06-21 | Semiconductor Energy Laboratory Co., Ltd. | 半導體裝置、模組及電子裝置 |
JP6676316B2 (ja) | 2014-09-12 | 2020-04-08 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US9722091B2 (en) | 2014-09-12 | 2017-08-01 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US9704704B2 (en) | 2014-10-28 | 2017-07-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device including the same |
US20160225915A1 (en) * | 2015-01-30 | 2016-08-04 | Cindy X. Qiu | Metal oxynitride transistor devices |
KR20160114511A (ko) | 2015-03-24 | 2016-10-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
US9806200B2 (en) | 2015-03-27 | 2017-10-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
EP3332033B1 (en) * | 2015-08-06 | 2021-04-21 | Pacific Biosciences of California, Inc. | Single-molecule nanofet sequencing systems and methods |
TWI619941B (zh) * | 2015-12-28 | 2018-04-01 | 國立臺灣大學 | 生物感測器裝置 |
WO2017153882A1 (en) | 2016-03-11 | 2017-09-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, manufacturing method thereof, and display device including the semiconductor device |
WO2018069359A1 (de) * | 2016-10-10 | 2018-04-19 | Demasius Kai Uwe | Kapazitive matrixanordnung und verfahren zu deren ansteuerung |
KR102384624B1 (ko) * | 2016-10-21 | 2022-04-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US11545581B2 (en) * | 2019-08-02 | 2023-01-03 | South China University Of Technology | Metal oxide (MO) semiconductor and thin-film transistor and application thereof |
CN107369716B (zh) * | 2017-07-17 | 2021-02-12 | 京东方科技集团股份有限公司 | 薄膜晶体管及制作方法、显示装置 |
US11395254B2 (en) * | 2018-01-16 | 2022-07-19 | Maarten Van Laere | Cellular alerting add-on |
US11167375B2 (en) | 2018-08-10 | 2021-11-09 | The Research Foundation For The State University Of New York | Additive manufacturing processes and additively manufactured products |
CN113675276A (zh) * | 2021-08-25 | 2021-11-19 | 合肥鑫晟光电科技有限公司 | Tft结构及其制备方法、显示面板、显示装置 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09121056A (ja) * | 1995-10-26 | 1997-05-06 | Advanced Display:Kk | 半導体装置の製法 |
JP2010177450A (ja) * | 2009-01-29 | 2010-08-12 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
JP2010226101A (ja) * | 2009-02-27 | 2010-10-07 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
JP2011119714A (ja) * | 2009-11-06 | 2011-06-16 | Semiconductor Energy Lab Co Ltd | 半導体装置、及び半導体装置の作製方法 |
JP2011151382A (ja) * | 2009-12-21 | 2011-08-04 | Semiconductor Energy Lab Co Ltd | 薄膜トランジスタとその作製方法 |
JP2011228622A (ja) * | 2010-03-30 | 2011-11-10 | Sony Corp | 薄膜トランジスタおよびその製造方法、並びに表示装置 |
JP2011228695A (ja) * | 2010-04-02 | 2011-11-10 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2012015491A (ja) * | 2010-06-04 | 2012-01-19 | Semiconductor Energy Lab Co Ltd | 光電変換装置 |
JP2012212880A (ja) * | 2011-03-23 | 2012-11-01 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
JP2012253329A (ja) * | 2011-05-06 | 2012-12-20 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
Family Cites Families (215)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60198861A (ja) | 1984-03-23 | 1985-10-08 | Fujitsu Ltd | 薄膜トランジスタ |
JPH0244256B2 (ja) | 1987-01-28 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn2o5deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
JPH0244260B2 (ja) | 1987-02-24 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn5o8deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
JPS63210023A (ja) | 1987-02-24 | 1988-08-31 | Natl Inst For Res In Inorg Mater | InGaZn↓4O↓7で示される六方晶系の層状構造を有する化合物およびその製造法 |
JPH0244258B2 (ja) | 1987-02-24 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn3o6deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
JPH0244262B2 (ja) | 1987-02-27 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn6o9deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
JPH0244263B2 (ja) | 1987-04-22 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn7o10deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
JPH05251705A (ja) | 1992-03-04 | 1993-09-28 | Fuji Xerox Co Ltd | 薄膜トランジスタ |
US5436474A (en) | 1993-05-07 | 1995-07-25 | Board Of Regents Of The University Of Texas System | Modulation doped field effect transistor having built-in drift field |
JP3479375B2 (ja) | 1995-03-27 | 2003-12-15 | 科学技術振興事業団 | 亜酸化銅等の金属酸化物半導体による薄膜トランジスタとpn接合を形成した金属酸化物半導体装置およびそれらの製造方法 |
EP0820644B1 (en) | 1995-08-03 | 2005-08-24 | Koninklijke Philips Electronics N.V. | Semiconductor device provided with transparent switching element |
JP3625598B2 (ja) | 1995-12-30 | 2005-03-02 | 三星電子株式会社 | 液晶表示装置の製造方法 |
JP4170454B2 (ja) | 1998-07-24 | 2008-10-22 | Hoya株式会社 | 透明導電性酸化物薄膜を有する物品及びその製造方法 |
JP2000150861A (ja) | 1998-11-16 | 2000-05-30 | Tdk Corp | 酸化物薄膜 |
JP3276930B2 (ja) | 1998-11-17 | 2002-04-22 | 科学技術振興事業団 | トランジスタ及び半導体装置 |
JP3209270B2 (ja) | 1999-01-29 | 2001-09-17 | 日本電気株式会社 | ヘテロ接合電界効果トランジスタ |
TW460731B (en) | 1999-09-03 | 2001-10-21 | Ind Tech Res Inst | Electrode structure and production method of wide viewing angle LCD |
JP4089858B2 (ja) | 2000-09-01 | 2008-05-28 | 国立大学法人東北大学 | 半導体デバイス |
US6690042B2 (en) | 2000-09-27 | 2004-02-10 | Sensor Electronic Technology, Inc. | Metal oxide semiconductor heterostructure field effect transistor |
KR20020038482A (ko) | 2000-11-15 | 2002-05-23 | 모리시타 요이찌 | 박막 트랜지스터 어레이, 그 제조방법 및 그것을 이용한표시패널 |
JP3997731B2 (ja) | 2001-03-19 | 2007-10-24 | 富士ゼロックス株式会社 | 基材上に結晶性半導体薄膜を形成する方法 |
JP2002289859A (ja) | 2001-03-23 | 2002-10-04 | Minolta Co Ltd | 薄膜トランジスタ |
US6674101B2 (en) | 2001-06-01 | 2004-01-06 | Furukawa Electric Co Ltd | GaN-based semiconductor device |
CA2454269C (en) | 2001-07-24 | 2015-07-07 | Primit Parikh | Insulating gate algan/gan hemt |
JP3925839B2 (ja) | 2001-09-10 | 2007-06-06 | シャープ株式会社 | 半導体記憶装置およびその試験方法 |
JP4090716B2 (ja) | 2001-09-10 | 2008-05-28 | 雅司 川崎 | 薄膜トランジスタおよびマトリクス表示装置 |
JP4164562B2 (ja) | 2002-09-11 | 2008-10-15 | 独立行政法人科学技術振興機構 | ホモロガス薄膜を活性層として用いる透明薄膜電界効果型トランジスタ |
WO2003040441A1 (en) | 2001-11-05 | 2003-05-15 | Japan Science And Technology Agency | Natural superlattice homologous single crystal thin film, method for preparation thereof, and device using said single crystal thin film |
JP4083486B2 (ja) | 2002-02-21 | 2008-04-30 | 独立行政法人科学技術振興機構 | LnCuO(S,Se,Te)単結晶薄膜の製造方法 |
CN1445821A (zh) | 2002-03-15 | 2003-10-01 | 三洋电机株式会社 | ZnO膜和ZnO半导体层的形成方法、半导体元件及其制造方法 |
JP3933591B2 (ja) | 2002-03-26 | 2007-06-20 | 淳二 城戸 | 有機エレクトロルミネッセント素子 |
US7339187B2 (en) | 2002-05-21 | 2008-03-04 | State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University | Transistor structures |
JP2004022625A (ja) | 2002-06-13 | 2004-01-22 | Murata Mfg Co Ltd | 半導体デバイス及び該半導体デバイスの製造方法 |
US7105868B2 (en) | 2002-06-24 | 2006-09-12 | Cermet, Inc. | High-electron mobility transistor with zinc oxide |
US7067843B2 (en) | 2002-10-11 | 2006-06-27 | E. I. Du Pont De Nemours And Company | Transparent oxide semiconductor thin film transistors |
JP4166105B2 (ja) | 2003-03-06 | 2008-10-15 | シャープ株式会社 | 半導体装置およびその製造方法 |
JP2004273732A (ja) | 2003-03-07 | 2004-09-30 | Sharp Corp | アクティブマトリクス基板およびその製造方法 |
JP2004273922A (ja) | 2003-03-11 | 2004-09-30 | Seiko Epson Corp | 薄膜トランジスタの製造方法、薄膜トランジスタ、表示装置、並びに電子機器 |
JP4108633B2 (ja) | 2003-06-20 | 2008-06-25 | シャープ株式会社 | 薄膜トランジスタおよびその製造方法ならびに電子デバイス |
US7262463B2 (en) | 2003-07-25 | 2007-08-28 | Hewlett-Packard Development Company, L.P. | Transistor including a deposited channel region having a doped portion |
KR101078509B1 (ko) | 2004-03-12 | 2011-10-31 | 도꾸리쯔교세이호징 가가꾸 기쥬쯔 신꼬 기꼬 | 박막 트랜지스터의 제조 방법 |
US7282782B2 (en) | 2004-03-12 | 2007-10-16 | Hewlett-Packard Development Company, L.P. | Combined binary oxide semiconductor device |
US7145174B2 (en) | 2004-03-12 | 2006-12-05 | Hewlett-Packard Development Company, Lp. | Semiconductor device |
US7297977B2 (en) | 2004-03-12 | 2007-11-20 | Hewlett-Packard Development Company, L.P. | Semiconductor device |
US7211825B2 (en) | 2004-06-14 | 2007-05-01 | Yi-Chi Shih | Indium oxide-based thin film transistors and circuits |
JP2006100760A (ja) | 2004-09-02 | 2006-04-13 | Casio Comput Co Ltd | 薄膜トランジスタおよびその製造方法 |
US7285501B2 (en) | 2004-09-17 | 2007-10-23 | Hewlett-Packard Development Company, L.P. | Method of forming a solution processed device |
US7298084B2 (en) | 2004-11-02 | 2007-11-20 | 3M Innovative Properties Company | Methods and displays utilizing integrated zinc oxide row and column drivers in conjunction with organic light emitting diodes |
US7453065B2 (en) | 2004-11-10 | 2008-11-18 | Canon Kabushiki Kaisha | Sensor and image pickup device |
US7863611B2 (en) | 2004-11-10 | 2011-01-04 | Canon Kabushiki Kaisha | Integrated circuits utilizing amorphous oxides |
US7829444B2 (en) | 2004-11-10 | 2010-11-09 | Canon Kabushiki Kaisha | Field effect transistor manufacturing method |
JP5126729B2 (ja) * | 2004-11-10 | 2013-01-23 | キヤノン株式会社 | 画像表示装置 |
KR100911698B1 (ko) | 2004-11-10 | 2009-08-10 | 캐논 가부시끼가이샤 | 비정질 산화물을 사용한 전계 효과 트랜지스터 |
WO2006051994A2 (en) | 2004-11-10 | 2006-05-18 | Canon Kabushiki Kaisha | Light-emitting device |
EP2453481B1 (en) | 2004-11-10 | 2017-01-11 | Canon Kabushiki Kaisha | Field effect transistor with amorphous oxide |
US7791072B2 (en) | 2004-11-10 | 2010-09-07 | Canon Kabushiki Kaisha | Display |
US7579224B2 (en) | 2005-01-21 | 2009-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a thin film semiconductor device |
TWI390735B (zh) | 2005-01-28 | 2013-03-21 | Semiconductor Energy Lab | 半導體裝置,電子裝置,和半導體裝置的製造方法 |
TWI412138B (zh) | 2005-01-28 | 2013-10-11 | Semiconductor Energy Lab | 半導體裝置,電子裝置,和半導體裝置的製造方法 |
US7858451B2 (en) | 2005-02-03 | 2010-12-28 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device, semiconductor device and manufacturing method thereof |
US7948171B2 (en) | 2005-02-18 | 2011-05-24 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US20060197092A1 (en) | 2005-03-03 | 2006-09-07 | Randy Hoffman | System and method for forming conductive material on a substrate |
US8681077B2 (en) | 2005-03-18 | 2014-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, and display device, driving method and electronic apparatus thereof |
US7544967B2 (en) | 2005-03-28 | 2009-06-09 | Massachusetts Institute Of Technology | Low voltage flexible organic/transparent transistor for selective gas sensing, photodetecting and CMOS device applications |
US7645478B2 (en) | 2005-03-31 | 2010-01-12 | 3M Innovative Properties Company | Methods of making displays |
US8300031B2 (en) | 2005-04-20 | 2012-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising transistor having gate and drain connected through a current-voltage conversion element |
JP2006344849A (ja) | 2005-06-10 | 2006-12-21 | Casio Comput Co Ltd | 薄膜トランジスタ |
US7402506B2 (en) | 2005-06-16 | 2008-07-22 | Eastman Kodak Company | Methods of making thin film transistors comprising zinc-oxide-based semiconductor materials and transistors made thereby |
US7691666B2 (en) | 2005-06-16 | 2010-04-06 | Eastman Kodak Company | Methods of making thin film transistors comprising zinc-oxide-based semiconductor materials and transistors made thereby |
US7507618B2 (en) | 2005-06-27 | 2009-03-24 | 3M Innovative Properties Company | Method for making electronic devices using metal oxide nanoparticles |
KR100711890B1 (ko) | 2005-07-28 | 2007-04-25 | 삼성에스디아이 주식회사 | 유기 발광표시장치 및 그의 제조방법 |
JP2007059128A (ja) | 2005-08-23 | 2007-03-08 | Canon Inc | 有機el表示装置およびその製造方法 |
JP5116225B2 (ja) | 2005-09-06 | 2013-01-09 | キヤノン株式会社 | 酸化物半導体デバイスの製造方法 |
JP2007073705A (ja) | 2005-09-06 | 2007-03-22 | Canon Inc | 酸化物半導体チャネル薄膜トランジスタおよびその製造方法 |
JP4280736B2 (ja) | 2005-09-06 | 2009-06-17 | キヤノン株式会社 | 半導体素子 |
JP4850457B2 (ja) | 2005-09-06 | 2012-01-11 | キヤノン株式会社 | 薄膜トランジスタ及び薄膜ダイオード |
EP1770788A3 (en) | 2005-09-29 | 2011-09-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having oxide semiconductor layer and manufacturing method thereof |
JP5037808B2 (ja) | 2005-10-20 | 2012-10-03 | キヤノン株式会社 | アモルファス酸化物を用いた電界効果型トランジスタ、及び該トランジスタを用いた表示装置 |
KR101397571B1 (ko) | 2005-11-15 | 2014-05-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치 및 그의 제조방법 |
TWI292281B (en) | 2005-12-29 | 2008-01-01 | Ind Tech Res Inst | Pixel structure of active organic light emitting diode and method of fabricating the same |
US7867636B2 (en) | 2006-01-11 | 2011-01-11 | Murata Manufacturing Co., Ltd. | Transparent conductive film and method for manufacturing the same |
JP4977478B2 (ja) | 2006-01-21 | 2012-07-18 | 三星電子株式会社 | ZnOフィルム及びこれを用いたTFTの製造方法 |
US7576394B2 (en) | 2006-02-02 | 2009-08-18 | Kochi Industrial Promotion Center | Thin film transistor including low resistance conductive thin films and manufacturing method thereof |
US7977169B2 (en) | 2006-02-15 | 2011-07-12 | Kochi Industrial Promotion Center | Semiconductor device including active layer made of zinc oxide with controlled orientations and manufacturing method thereof |
KR20070101595A (ko) | 2006-04-11 | 2007-10-17 | 삼성전자주식회사 | ZnO TFT |
US20070252928A1 (en) | 2006-04-28 | 2007-11-01 | Toppan Printing Co., Ltd. | Structure, transmission type liquid crystal display, reflection type display and manufacturing method thereof |
JP5028033B2 (ja) | 2006-06-13 | 2012-09-19 | キヤノン株式会社 | 酸化物半導体膜のドライエッチング方法 |
JP4999400B2 (ja) | 2006-08-09 | 2012-08-15 | キヤノン株式会社 | 酸化物半導体膜のドライエッチング方法 |
JP4609797B2 (ja) | 2006-08-09 | 2011-01-12 | Nec液晶テクノロジー株式会社 | 薄膜デバイス及びその製造方法 |
JP4332545B2 (ja) | 2006-09-15 | 2009-09-16 | キヤノン株式会社 | 電界効果型トランジスタ及びその製造方法 |
JP4274219B2 (ja) | 2006-09-27 | 2009-06-03 | セイコーエプソン株式会社 | 電子デバイス、有機エレクトロルミネッセンス装置、有機薄膜半導体装置 |
JP5164357B2 (ja) | 2006-09-27 | 2013-03-21 | キヤノン株式会社 | 半導体装置及び半導体装置の製造方法 |
US7622371B2 (en) | 2006-10-10 | 2009-11-24 | Hewlett-Packard Development Company, L.P. | Fused nanocrystal thin film semiconductor and method |
US7772021B2 (en) | 2006-11-29 | 2010-08-10 | Samsung Electronics Co., Ltd. | Flat panel displays comprising a thin-film transistor having a semiconductive oxide in its channel and methods of fabricating the same for use in flat panel displays |
JP2008140684A (ja) | 2006-12-04 | 2008-06-19 | Toppan Printing Co Ltd | カラーelディスプレイおよびその製造方法 |
KR101303578B1 (ko) | 2007-01-05 | 2013-09-09 | 삼성전자주식회사 | 박막 식각 방법 |
US8207063B2 (en) | 2007-01-26 | 2012-06-26 | Eastman Kodak Company | Process for atomic layer deposition |
KR100851215B1 (ko) | 2007-03-14 | 2008-08-07 | 삼성에스디아이 주식회사 | 박막 트랜지스터 및 이를 이용한 유기 전계 발광표시장치 |
US7795613B2 (en) | 2007-04-17 | 2010-09-14 | Toppan Printing Co., Ltd. | Structure with transistor |
KR101325053B1 (ko) | 2007-04-18 | 2013-11-05 | 삼성디스플레이 주식회사 | 박막 트랜지스터 기판 및 이의 제조 방법 |
KR20080094300A (ko) | 2007-04-19 | 2008-10-23 | 삼성전자주식회사 | 박막 트랜지스터 및 그 제조 방법과 박막 트랜지스터를포함하는 평판 디스플레이 |
KR101334181B1 (ko) | 2007-04-20 | 2013-11-28 | 삼성전자주식회사 | 선택적으로 결정화된 채널층을 갖는 박막 트랜지스터 및 그제조 방법 |
US8274078B2 (en) | 2007-04-25 | 2012-09-25 | Canon Kabushiki Kaisha | Metal oxynitride semiconductor containing zinc |
KR101345376B1 (ko) | 2007-05-29 | 2013-12-24 | 삼성전자주식회사 | ZnO 계 박막 트랜지스터 및 그 제조방법 |
US8420456B2 (en) | 2007-06-12 | 2013-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing for thin film transistor |
JP5213421B2 (ja) | 2007-12-04 | 2013-06-19 | キヤノン株式会社 | 酸化物半導体薄膜トランジスタ |
US8202365B2 (en) | 2007-12-17 | 2012-06-19 | Fujifilm Corporation | Process for producing oriented inorganic crystalline film, and semiconductor device using the oriented inorganic crystalline film |
KR100941850B1 (ko) * | 2008-04-03 | 2010-02-11 | 삼성모바일디스플레이주식회사 | 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치 |
JP5608347B2 (ja) | 2008-08-08 | 2014-10-15 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法 |
JP4623179B2 (ja) | 2008-09-18 | 2011-02-02 | ソニー株式会社 | 薄膜トランジスタおよびその製造方法 |
JP5451280B2 (ja) | 2008-10-09 | 2014-03-26 | キヤノン株式会社 | ウルツ鉱型結晶成長用基板およびその製造方法ならびに半導体装置 |
US8741702B2 (en) | 2008-10-24 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
RU2011124916A (ru) * | 2008-11-20 | 2012-12-27 | Шарп Кабусики Кайся | Полупроводниковый слой и способ его формирования |
WO2011013596A1 (en) | 2009-07-31 | 2011-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
WO2011027664A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method for manufacturing the same |
KR102246529B1 (ko) | 2009-09-16 | 2021-04-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011043164A1 (en) | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the semiconductor device |
KR101754701B1 (ko) | 2009-10-09 | 2017-07-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 이를 제조하기 위한 방법 |
IN2012DN01823A (ja) | 2009-10-16 | 2015-06-05 | Semiconductor Energy Lab | |
CN102598284B (zh) | 2009-11-06 | 2015-04-15 | 株式会社半导体能源研究所 | 半导体器件 |
WO2011055668A1 (en) | 2009-11-06 | 2011-05-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR20120107079A (ko) | 2009-11-20 | 2012-09-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 박막 트랜지스터 |
KR101396015B1 (ko) * | 2009-11-28 | 2014-05-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR20110060479A (ko) * | 2009-11-30 | 2011-06-08 | 삼성모바일디스플레이주식회사 | 오믹 콘택층으로 산화물 반도체층을 갖는 박막 트랜지스터 및 그 제조방법 |
JP5497417B2 (ja) * | 2009-12-10 | 2014-05-21 | 富士フイルム株式会社 | 薄膜トランジスタおよびその製造方法、並びにその薄膜トランジスタを備えた装置 |
CN102822980B (zh) | 2010-03-26 | 2015-12-16 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
JP5731244B2 (ja) | 2010-03-26 | 2015-06-10 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
CN102834921B (zh) | 2010-03-26 | 2016-04-27 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
WO2011118741A1 (en) | 2010-03-26 | 2011-09-29 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US9190522B2 (en) | 2010-04-02 | 2015-11-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having an oxide semiconductor |
US8884282B2 (en) | 2010-04-02 | 2014-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9147768B2 (en) | 2010-04-02 | 2015-09-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having an oxide semiconductor and a metal oxide film |
US9196739B2 (en) | 2010-04-02 | 2015-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including oxide semiconductor film and metal oxide film |
KR20130014562A (ko) | 2010-04-02 | 2013-02-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011125454A1 (en) | 2010-04-09 | 2011-10-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8653514B2 (en) * | 2010-04-09 | 2014-02-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
WO2011129456A1 (en) | 2010-04-16 | 2011-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Deposition method and method for manufacturing semiconductor device |
WO2011132556A1 (en) | 2010-04-23 | 2011-10-27 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
KR101437081B1 (ko) | 2010-04-23 | 2014-09-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
WO2011132591A1 (en) | 2010-04-23 | 2011-10-27 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
KR101877377B1 (ko) | 2010-04-23 | 2018-07-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
DE112011106082B3 (de) | 2010-04-23 | 2019-05-16 | Semiconductor Energy Laboratory Co., Ltd. | Verfahren zum Herstellen einer Halbleitervorrichtung |
KR101806271B1 (ko) | 2010-05-14 | 2017-12-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
US8629438B2 (en) | 2010-05-21 | 2014-01-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
WO2011155302A1 (en) | 2010-06-11 | 2011-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9209314B2 (en) | 2010-06-16 | 2015-12-08 | Semiconductor Energy Laboratory Co., Ltd. | Field effect transistor |
WO2011158704A1 (en) | 2010-06-18 | 2011-12-22 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
CN102959713B (zh) | 2010-07-02 | 2017-05-10 | 株式会社半导体能源研究所 | 半导体装置 |
US8685787B2 (en) | 2010-08-25 | 2014-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
US8883555B2 (en) | 2010-08-25 | 2014-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device, manufacturing method of electronic device, and sputtering target |
JP5626978B2 (ja) * | 2010-09-08 | 2014-11-19 | 富士フイルム株式会社 | 薄膜トランジスタおよびその製造方法、並びにその薄膜トランジスタを備えた装置 |
KR102637010B1 (ko) | 2010-12-03 | 2024-02-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체막 및 반도체 장치 |
KR101680768B1 (ko) * | 2010-12-10 | 2016-11-29 | 삼성전자주식회사 | 트랜지스터 및 이를 포함하는 전자장치 |
US8916867B2 (en) * | 2011-01-20 | 2014-12-23 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor element and semiconductor device |
KR102111015B1 (ko) | 2011-01-28 | 2020-05-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 및 반도체 장치 |
JP5404963B2 (ja) * | 2011-03-01 | 2014-02-05 | シャープ株式会社 | 薄膜トランジスタおよび表示装置 |
SG10201505586UA (en) * | 2011-06-17 | 2015-08-28 | Semiconductor Energy Lab | Semiconductor device and method for manufacturing the same |
KR20130007426A (ko) | 2011-06-17 | 2013-01-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US9166055B2 (en) * | 2011-06-17 | 2015-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US9385238B2 (en) | 2011-07-08 | 2016-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Transistor using oxide semiconductor |
US8748886B2 (en) | 2011-07-08 | 2014-06-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
US9214474B2 (en) | 2011-07-08 | 2015-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
US8952377B2 (en) | 2011-07-08 | 2015-02-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
TWI613824B (zh) | 2011-12-23 | 2018-02-01 | 半導體能源研究所股份有限公司 | 半導體裝置 |
JP5917385B2 (ja) | 2011-12-27 | 2016-05-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TWI562361B (en) | 2012-02-02 | 2016-12-11 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
KR20230157542A (ko) | 2012-04-13 | 2023-11-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US9331689B2 (en) | 2012-04-27 | 2016-05-03 | Semiconductor Energy Laboratory Co., Ltd. | Power supply circuit and semiconductor device including the same |
US9048323B2 (en) | 2012-04-30 | 2015-06-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR20230104756A (ko) | 2012-05-10 | 2023-07-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP6208469B2 (ja) | 2012-05-31 | 2017-10-04 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR102119914B1 (ko) | 2012-05-31 | 2020-06-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
WO2013180040A1 (en) | 2012-05-31 | 2013-12-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8901557B2 (en) | 2012-06-15 | 2014-12-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102113160B1 (ko) | 2012-06-15 | 2020-05-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US9059219B2 (en) | 2012-06-27 | 2015-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
KR102161077B1 (ko) | 2012-06-29 | 2020-09-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US9190525B2 (en) | 2012-07-06 | 2015-11-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including oxide semiconductor layer |
KR20140009023A (ko) | 2012-07-13 | 2014-01-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR102368865B1 (ko) | 2012-07-20 | 2022-03-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치, 및 표시 장치를 포함하는 전자 장치 |
US20140027762A1 (en) | 2012-07-27 | 2014-01-30 | Semiconductor Energy Laboratory Co. Ltd. | Semiconductor device |
JP6134598B2 (ja) | 2012-08-02 | 2017-05-24 | 株式会社半導体エネルギー研究所 | 半導体装置 |
IN2015DN01663A (ja) | 2012-08-03 | 2015-07-03 | Semiconductor Energy Lab | |
KR102171650B1 (ko) | 2012-08-10 | 2020-10-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US9245958B2 (en) | 2012-08-10 | 2016-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US9929276B2 (en) | 2012-08-10 | 2018-03-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
WO2014024808A1 (en) | 2012-08-10 | 2014-02-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP6220597B2 (ja) | 2012-08-10 | 2017-10-25 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2014025002A1 (en) | 2012-08-10 | 2014-02-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for fabricating the same |
US8981372B2 (en) | 2012-09-13 | 2015-03-17 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic appliance |
US9018624B2 (en) | 2012-09-13 | 2015-04-28 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic appliance |
KR102211215B1 (ko) | 2012-09-14 | 2021-02-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
WO2014046222A1 (en) | 2012-09-24 | 2014-03-27 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
TWI627750B (zh) | 2012-09-24 | 2018-06-21 | 半導體能源研究所股份有限公司 | 半導體裝置 |
JP6283191B2 (ja) | 2012-10-17 | 2018-02-21 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US9166021B2 (en) | 2012-10-17 | 2015-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR102168987B1 (ko) | 2012-10-17 | 2020-10-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 마이크로컨트롤러 및 그 제조 방법 |
KR102094568B1 (ko) | 2012-10-17 | 2020-03-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그의 제작 방법 |
WO2014061567A1 (en) | 2012-10-17 | 2014-04-24 | Semiconductor Energy Laboratory Co., Ltd. | Programmable logic device |
JP5951442B2 (ja) | 2012-10-17 | 2016-07-13 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP6059501B2 (ja) | 2012-10-17 | 2017-01-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
KR102220279B1 (ko) | 2012-10-19 | 2021-02-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체막을 포함하는 다층막 및 반도체 장치의 제작 방법 |
JP6204145B2 (ja) | 2012-10-23 | 2017-09-27 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US9865743B2 (en) | 2012-10-24 | 2018-01-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including oxide layer surrounding oxide semiconductor layer |
TWI637517B (zh) | 2012-10-24 | 2018-10-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
WO2014065343A1 (en) | 2012-10-24 | 2014-05-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9287411B2 (en) | 2012-10-24 | 2016-03-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR102279459B1 (ko) | 2012-10-24 | 2021-07-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
JP6220641B2 (ja) | 2012-11-15 | 2017-10-25 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TWI620323B (zh) | 2012-11-16 | 2018-04-01 | 半導體能源研究所股份有限公司 | 半導體裝置 |
KR102248765B1 (ko) | 2012-11-30 | 2021-05-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US9153649B2 (en) | 2012-11-30 | 2015-10-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for evaluating semiconductor device |
US9246011B2 (en) | 2012-11-30 | 2016-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP6320009B2 (ja) | 2012-12-03 | 2018-05-09 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
KR102207028B1 (ko) | 2012-12-03 | 2021-01-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
-
2013
- 2013-12-16 WO PCT/JP2013/084180 patent/WO2014103901A1/en active Application Filing
- 2013-12-16 DE DE112013006219.4T patent/DE112013006219T5/de not_active Ceased
- 2013-12-18 JP JP2013261022A patent/JP6430698B2/ja not_active Expired - Fee Related
- 2013-12-20 US US14/137,476 patent/US20140175435A1/en not_active Abandoned
- 2013-12-23 TW TW107131445A patent/TWI726237B/zh not_active IP Right Cessation
- 2013-12-23 TW TW112114796A patent/TW202333384A/zh unknown
- 2013-12-23 TW TW102147774A patent/TWI642189B/zh not_active IP Right Cessation
- 2013-12-23 TW TW110109598A patent/TWI802854B/zh active
-
2018
- 2018-07-02 US US16/024,967 patent/US10672913B2/en active Active
- 2018-11-01 JP JP2018206523A patent/JP2019054260A/ja not_active Withdrawn
-
2020
- 2020-03-30 US US16/833,918 patent/US11049974B2/en active Active
- 2020-08-11 JP JP2020135574A patent/JP6987192B2/ja active Active
-
2021
- 2021-06-25 US US17/358,295 patent/US11705522B2/en active Active
-
2023
- 2023-06-20 US US18/211,652 patent/US20230335646A1/en active Pending
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09121056A (ja) * | 1995-10-26 | 1997-05-06 | Advanced Display:Kk | 半導体装置の製法 |
JP2010177450A (ja) * | 2009-01-29 | 2010-08-12 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
JP2010226101A (ja) * | 2009-02-27 | 2010-10-07 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
JP2011119714A (ja) * | 2009-11-06 | 2011-06-16 | Semiconductor Energy Lab Co Ltd | 半導体装置、及び半導体装置の作製方法 |
JP2011151382A (ja) * | 2009-12-21 | 2011-08-04 | Semiconductor Energy Lab Co Ltd | 薄膜トランジスタとその作製方法 |
JP2011228622A (ja) * | 2010-03-30 | 2011-11-10 | Sony Corp | 薄膜トランジスタおよびその製造方法、並びに表示装置 |
JP2011228695A (ja) * | 2010-04-02 | 2011-11-10 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2012015491A (ja) * | 2010-06-04 | 2012-01-19 | Semiconductor Energy Lab Co Ltd | 光電変換装置 |
JP2012212880A (ja) * | 2011-03-23 | 2012-11-01 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
JP2012253329A (ja) * | 2011-05-06 | 2012-12-20 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021108407A (ja) * | 2014-09-19 | 2021-07-29 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP2016122833A (ja) * | 2014-11-28 | 2016-07-07 | 株式会社半導体エネルギー研究所 | 半導体装置、半導体装置の作製方法、及び該半導体装置を有する表示装置 |
JP2018006727A (ja) * | 2015-12-15 | 2018-01-11 | 株式会社半導体エネルギー研究所 | 半導体装置及び表示装置 |
US11764309B2 (en) | 2015-12-15 | 2023-09-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device |
JP2021034577A (ja) * | 2019-08-26 | 2021-03-01 | 株式会社ジャパンディスプレイ | 半導体装置および半導体装置の製造方法 |
JP7412924B2 (ja) | 2019-08-26 | 2024-01-15 | 株式会社ジャパンディスプレイ | 半導体装置および半導体装置の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
TW202127672A (zh) | 2021-07-16 |
US20140175435A1 (en) | 2014-06-26 |
US20190035937A1 (en) | 2019-01-31 |
TWI642189B (zh) | 2018-11-21 |
TWI802854B (zh) | 2023-05-21 |
US11705522B2 (en) | 2023-07-18 |
US20210320212A1 (en) | 2021-10-14 |
JP6987192B2 (ja) | 2021-12-22 |
JP2020198441A (ja) | 2020-12-10 |
US11049974B2 (en) | 2021-06-29 |
US20200227566A1 (en) | 2020-07-16 |
US20230335646A1 (en) | 2023-10-19 |
TW201438238A (zh) | 2014-10-01 |
JP2019054260A (ja) | 2019-04-04 |
WO2014103901A1 (en) | 2014-07-03 |
DE112013006219T5 (de) | 2015-09-24 |
TWI726237B (zh) | 2021-05-01 |
TW201921692A (zh) | 2019-06-01 |
TW202333384A (zh) | 2023-08-16 |
JP6430698B2 (ja) | 2018-11-28 |
US10672913B2 (en) | 2020-06-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6430698B2 (ja) | 半導体装置 | |
US9852904B2 (en) | Method for manufacturing semiconductor device | |
JP6285153B2 (ja) | 半導体装置 | |
US9570625B2 (en) | Semiconductor device | |
JP6329395B2 (ja) | 半導体装置 | |
JP6203601B2 (ja) | 半導体装置 | |
US9263259B2 (en) | Semiconductor device comprising an oxide semiconductor | |
JP2014168049A (ja) | 半導体装置およびその作製方法 | |
JP6293229B2 (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20161216 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20171011 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20171017 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20171214 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20180206 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20180406 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20181002 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20181101 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6430698 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |