JP2011521438A5 - - Google Patents
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- Publication number
- JP2011521438A5 JP2011521438A5 JP2010545889A JP2010545889A JP2011521438A5 JP 2011521438 A5 JP2011521438 A5 JP 2011521438A5 JP 2010545889 A JP2010545889 A JP 2010545889A JP 2010545889 A JP2010545889 A JP 2010545889A JP 2011521438 A5 JP2011521438 A5 JP 2011521438A5
- Authority
- JP
- Japan
- Prior art keywords
- feature
- pattern
- polymerizable material
- labyrinth
- mesa
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 18
- 239000000463 material Substances 0.000 claims 8
- 239000000758 substrate Substances 0.000 claims 4
- 238000001459 lithography Methods 0.000 claims 2
- 238000000059 patterning Methods 0.000 claims 2
- 230000000737 periodic effect Effects 0.000 claims 2
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US2715308P | 2008-02-08 | 2008-02-08 | |
| US61/027,153 | 2008-02-08 | ||
| US9409208P | 2008-09-04 | 2008-09-04 | |
| US61/094,092 | 2008-09-04 | ||
| US12/367,079 | 2009-02-06 | ||
| US12/367,079 US8361371B2 (en) | 2008-02-08 | 2009-02-06 | Extrusion reduction in imprint lithography |
| PCT/US2009/000803 WO2009099666A1 (en) | 2008-02-08 | 2009-02-09 | Extrusion reduction in imprint lithography |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011521438A JP2011521438A (ja) | 2011-07-21 |
| JP2011521438A5 true JP2011521438A5 (enExample) | 2012-03-22 |
| JP5216871B2 JP5216871B2 (ja) | 2013-06-19 |
Family
ID=40938224
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010545889A Active JP5216871B2 (ja) | 2008-02-08 | 2009-02-09 | インプリント・リソグラフィにおけるはみ出し低減 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US8361371B2 (enExample) |
| EP (1) | EP2240826A4 (enExample) |
| JP (1) | JP5216871B2 (enExample) |
| KR (3) | KR102065400B1 (enExample) |
| CN (1) | CN101939704B (enExample) |
| TW (1) | TWI430015B (enExample) |
| WO (1) | WO2009099666A1 (enExample) |
Families Citing this family (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2150398A2 (en) * | 2007-04-23 | 2010-02-10 | Tessera North America, Inc. | Mass production of micro-optical devices, corresponding tools, and resultant structures |
| JP5238742B2 (ja) * | 2010-03-19 | 2013-07-17 | 株式会社東芝 | 加工方法および加工装置 |
| JP5836652B2 (ja) | 2011-06-10 | 2015-12-24 | キヤノン株式会社 | インプリント方法、インプリント装置及び物品の製造方法 |
| JP5906598B2 (ja) * | 2011-08-03 | 2016-04-20 | 大日本印刷株式会社 | 半導体インプリント用テンプレート |
| JP2013038117A (ja) * | 2011-08-04 | 2013-02-21 | Jx Nippon Oil & Energy Corp | 微細パターンを転写するための転写ヘッド及びそれを用いた微細パターンの形成方法 |
| JP6200135B2 (ja) * | 2012-07-24 | 2017-09-20 | キヤノン株式会社 | インプリント装置、インプリント方法、および、物品製造方法 |
| US20140205702A1 (en) * | 2013-01-24 | 2014-07-24 | Kabushiki Kaisha Toshiba | Template, manufacturing method of the template, and position measuring method in the template |
| US20140209567A1 (en) * | 2013-01-29 | 2014-07-31 | Kabushiki Kaisha Toshiba | Template, manufacturing method of the template, and strain measuring method in the template |
| JP5851442B2 (ja) * | 2013-03-25 | 2016-02-03 | 株式会社東芝 | モールド及びその製造方法 |
| JP6361238B2 (ja) * | 2013-04-23 | 2018-07-25 | 大日本印刷株式会社 | インプリント用モールドおよびインプリント方法 |
| FR3010829B1 (fr) * | 2013-09-19 | 2017-01-27 | St Microelectronics Sa | Procede de realisation d'un filtre optique au sein d'un circuit integre, et circuit integre correspondant |
| WO2015089158A1 (en) * | 2013-12-10 | 2015-06-18 | Canon Nanotechnologies, Inc. | Imprint lithography template and method for zero-gap imprinting |
| US10265724B2 (en) * | 2014-04-01 | 2019-04-23 | Dai Nippon Printing Co., Ltd. | Imprint mold and imprint method |
| JP6448469B2 (ja) * | 2015-05-27 | 2019-01-09 | 東芝メモリ株式会社 | テンプレートおよびパターン形成方法 |
| US10211051B2 (en) | 2015-11-13 | 2019-02-19 | Canon Kabushiki Kaisha | Method of reverse tone patterning |
| JP6571028B2 (ja) * | 2016-03-08 | 2019-09-04 | 東芝メモリ株式会社 | パターン形成方法 |
| US10035296B2 (en) | 2016-10-13 | 2018-07-31 | Canon Kabushiki Kaisha | Methods for controlling spread of imprint material |
| US10627715B2 (en) | 2016-10-31 | 2020-04-21 | Canon Kabushiki Kaisha | Method for separating a nanoimprint template from a substrate |
| US10549313B2 (en) | 2016-10-31 | 2020-02-04 | Canon Kabushiki Kaisha | Edge field imprint lithography |
| JP7027099B2 (ja) * | 2017-09-29 | 2022-03-01 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| WO2019078060A1 (ja) * | 2017-10-17 | 2019-04-25 | キヤノン株式会社 | インプリント装置、及び、物品の製造方法 |
| JP6686090B2 (ja) * | 2017-10-23 | 2020-04-22 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| JP6650980B2 (ja) * | 2017-10-17 | 2020-02-19 | キヤノン株式会社 | インプリント装置、及び、物品の製造方法 |
| CN111247623B (zh) * | 2017-10-17 | 2024-03-08 | 佳能株式会社 | 压印装置和物品制造方法 |
| CN115257026A (zh) * | 2017-10-17 | 2022-11-01 | 奇跃公司 | 用于铸造聚合物产品的方法和装置 |
| US10663869B2 (en) * | 2017-12-11 | 2020-05-26 | Canon Kabushiki Kaisha | Imprint system and imprinting process with spatially non-uniform illumination |
| JP7030533B2 (ja) * | 2018-01-15 | 2022-03-07 | キオクシア株式会社 | インプリント装置、インプリント方法、及び半導体装置の製造方法 |
| US11194247B2 (en) | 2018-01-31 | 2021-12-07 | Canon Kabushiki Kaisha | Extrusion control by capillary force reduction |
| US10948818B2 (en) | 2018-03-19 | 2021-03-16 | Applied Materials, Inc. | Methods and apparatus for creating a large area imprint without a seam |
| US10976657B2 (en) | 2018-08-31 | 2021-04-13 | Canon Kabushiki Kaisha | System and method for illuminating edges of an imprint field with a gradient dosage |
| JP6593504B2 (ja) * | 2018-09-05 | 2019-10-23 | 大日本印刷株式会社 | インプリントモールド、インプリントモールド用ブランクス、並びにインプリントモールド用基板の製造方法及びインプリントモールドの製造方法 |
| US11281095B2 (en) * | 2018-12-05 | 2022-03-22 | Canon Kabushiki Kaisha | Frame curing template and system and method of using the frame curing template |
| JP2020096138A (ja) * | 2018-12-14 | 2020-06-18 | キヤノン株式会社 | インプリント装置、情報処理装置及び物品の製造方法 |
| US10901327B2 (en) * | 2018-12-20 | 2021-01-26 | Canon Kabushiki Kaisha | Automatic defect analyzer for nanoimprint lithography using image analysis |
| JP7237646B2 (ja) * | 2019-02-26 | 2023-03-13 | キヤノン株式会社 | インプリント方法、インプリント装置、および物品の製造方法 |
| JP7267801B2 (ja) | 2019-03-26 | 2023-05-02 | キヤノン株式会社 | インプリント装置、インプリント方法、および物品の製造方法 |
| JP7327973B2 (ja) * | 2019-03-29 | 2023-08-16 | キヤノン株式会社 | インプリント装置、インプリント方法、および物品の製造方法 |
| JP2020179370A (ja) * | 2019-04-26 | 2020-11-05 | キヤノン株式会社 | 吐出材吐出装置、およびインプリント装置 |
| US11181819B2 (en) * | 2019-05-31 | 2021-11-23 | Canon Kabushiki Kaisha | Frame curing method for extrusion control |
| US11327409B2 (en) | 2019-10-23 | 2022-05-10 | Canon Kabushiki Kaisha | Systems and methods for curing an imprinted field |
| US11429022B2 (en) | 2019-10-23 | 2022-08-30 | Canon Kabushiki Kaisha | Systems and methods for curing a shaped film |
| JP7379091B2 (ja) | 2019-10-30 | 2023-11-14 | キヤノン株式会社 | インプリント装置、インプリント方法、及び物品の製造方法 |
| US11366384B2 (en) | 2019-12-18 | 2022-06-21 | Canon Kabushiki Kaisha | Nanoimprint lithography system and method for adjusting a radiation pattern that compensates for slippage of a template |
| JP7433949B2 (ja) * | 2020-02-06 | 2024-02-20 | キヤノン株式会社 | インプリント装置、インプリント方法及び物品の製造方法 |
| US11747731B2 (en) | 2020-11-20 | 2023-09-05 | Canon Kabishiki Kaisha | Curing a shaped film using multiple images of a spatial light modulator |
Family Cites Families (65)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2701765B2 (ja) * | 1994-12-28 | 1998-01-21 | 日本電気株式会社 | 半導体装置の製造方法 |
| EP1001311A1 (en) | 1998-11-16 | 2000-05-17 | International Business Machines Corporation | Patterning device |
| US6334960B1 (en) * | 1999-03-11 | 2002-01-01 | Board Of Regents, The University Of Texas System | Step and flash imprint lithography |
| EP2264522A3 (en) * | 2000-07-16 | 2011-12-14 | The Board of Regents of The University of Texas System | Method of forming a pattern on a substrate |
| US20050160011A1 (en) * | 2004-01-20 | 2005-07-21 | Molecular Imprints, Inc. | Method for concurrently employing differing materials to form a layer on a substrate |
| CN1262883C (zh) * | 2000-07-17 | 2006-07-05 | 得克萨斯州大学系统董事会 | 影印用于平版印刷工艺中的自动化液体分配的方法和系统 |
| AU2001297642A1 (en) * | 2000-10-12 | 2002-09-04 | Board Of Regents, The University Of Texas System | Template for room temperature, low pressure micro- and nano-imprint lithography |
| US6653030B2 (en) | 2002-01-23 | 2003-11-25 | Hewlett-Packard Development Company, L.P. | Optical-mechanical feature fabrication during manufacture of semiconductors and other micro-devices and nano-devices that include micron and sub-micron features |
| US6926929B2 (en) * | 2002-07-09 | 2005-08-09 | Molecular Imprints, Inc. | System and method for dispensing liquids |
| US7442336B2 (en) * | 2003-08-21 | 2008-10-28 | Molecular Imprints, Inc. | Capillary imprinting technique |
| US6932934B2 (en) * | 2002-07-11 | 2005-08-23 | Molecular Imprints, Inc. | Formation of discontinuous films during an imprint lithography process |
| US6900881B2 (en) * | 2002-07-11 | 2005-05-31 | Molecular Imprints, Inc. | Step and repeat imprint lithography systems |
| US7077992B2 (en) * | 2002-07-11 | 2006-07-18 | Molecular Imprints, Inc. | Step and repeat imprint lithography processes |
| US7019819B2 (en) * | 2002-11-13 | 2006-03-28 | Molecular Imprints, Inc. | Chucking system for modulating shapes of substrates |
| US6916584B2 (en) * | 2002-08-01 | 2005-07-12 | Molecular Imprints, Inc. | Alignment methods for imprint lithography |
| US7027156B2 (en) * | 2002-08-01 | 2006-04-11 | Molecular Imprints, Inc. | Scatterometry alignment for imprint lithography |
| US7019656B2 (en) * | 2002-08-06 | 2006-03-28 | Kendro Laboratory Products, Inc. | Empty gas supply tank pending warning |
| US7071088B2 (en) * | 2002-08-23 | 2006-07-04 | Molecular Imprints, Inc. | Method for fabricating bulbous-shaped vias |
| US6936194B2 (en) * | 2002-09-05 | 2005-08-30 | Molecular Imprints, Inc. | Functional patterning material for imprint lithography processes |
| CN1329111C (zh) * | 2002-09-09 | 2007-08-01 | 国际商业机器公司 | 使用橡胶印模的印刷方法 |
| US20040065252A1 (en) * | 2002-10-04 | 2004-04-08 | Sreenivasan Sidlgata V. | Method of forming a layer on a substrate to facilitate fabrication of metrology standards |
| US6980282B2 (en) * | 2002-12-11 | 2005-12-27 | Molecular Imprints, Inc. | Method for modulating shapes of substrates |
| US6871558B2 (en) * | 2002-12-12 | 2005-03-29 | Molecular Imprints, Inc. | Method for determining characteristics of substrate employing fluid geometries |
| EP1606834B1 (en) * | 2003-03-27 | 2013-06-05 | Korea Institute Of Machinery & Materials | Uv nanoimprint lithography process using elementwise embossed stamp |
| US6777147B1 (en) * | 2003-05-21 | 2004-08-17 | International Business Machines Corporation | Method for evaluating the effects of multiple exposure processes in lithography |
| TWI228638B (en) * | 2003-06-10 | 2005-03-01 | Ind Tech Res Inst | Method for and apparatus for bonding patterned imprint to a substrate by adhering means |
| US7136150B2 (en) * | 2003-09-25 | 2006-11-14 | Molecular Imprints, Inc. | Imprint lithography template having opaque alignment marks |
| US7090716B2 (en) * | 2003-10-02 | 2006-08-15 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
| US8211214B2 (en) * | 2003-10-02 | 2012-07-03 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
| US20050084804A1 (en) * | 2003-10-16 | 2005-04-21 | Molecular Imprints, Inc. | Low surface energy templates |
| US20050106321A1 (en) * | 2003-11-14 | 2005-05-19 | Molecular Imprints, Inc. | Dispense geometery to achieve high-speed filling and throughput |
| US20050098534A1 (en) | 2003-11-12 | 2005-05-12 | Molecular Imprints, Inc. | Formation of conductive templates employing indium tin oxide |
| US20050189676A1 (en) * | 2004-02-27 | 2005-09-01 | Molecular Imprints, Inc. | Full-wafer or large area imprinting with multiple separated sub-fields for high throughput lithography |
| JP4481698B2 (ja) * | 2004-03-29 | 2010-06-16 | キヤノン株式会社 | 加工装置 |
| JP2005294468A (ja) | 2004-03-31 | 2005-10-20 | Canon Inc | 位置決め装置、露光装置及びデバイス製造方法 |
| US7140861B2 (en) * | 2004-04-27 | 2006-11-28 | Molecular Imprints, Inc. | Compliant hard template for UV imprinting |
| US20050276919A1 (en) * | 2004-06-01 | 2005-12-15 | Molecular Imprints, Inc. | Method for dispensing a fluid on a substrate |
| US20050270516A1 (en) * | 2004-06-03 | 2005-12-08 | Molecular Imprints, Inc. | System for magnification and distortion correction during nano-scale manufacturing |
| WO2005120834A2 (en) * | 2004-06-03 | 2005-12-22 | Molecular Imprints, Inc. | Fluid dispensing and drop-on-demand dispensing for nano-scale manufacturing |
| US20070228593A1 (en) * | 2006-04-03 | 2007-10-04 | Molecular Imprints, Inc. | Residual Layer Thickness Measurement and Correction |
| US7309225B2 (en) * | 2004-08-13 | 2007-12-18 | Molecular Imprints, Inc. | Moat system for an imprint lithography template |
| US7547504B2 (en) * | 2004-09-21 | 2009-06-16 | Molecular Imprints, Inc. | Pattern reversal employing thick residual layers |
| US20060062922A1 (en) * | 2004-09-23 | 2006-03-23 | Molecular Imprints, Inc. | Polymerization technique to attenuate oxygen inhibition of solidification of liquids and composition therefor |
| US7244386B2 (en) * | 2004-09-27 | 2007-07-17 | Molecular Imprints, Inc. | Method of compensating for a volumetric shrinkage of a material disposed upon a substrate to form a substantially planar structure therefrom |
| EP1825502A4 (en) * | 2004-12-01 | 2008-01-23 | Molecular Imprints Inc | EXPOSURE METHODS FOR THERMAL MANAGEMENT OF PRINTING LITHOGRAPHY METHODS |
| US7281919B2 (en) * | 2004-12-07 | 2007-10-16 | Molecular Imprints, Inc. | System for controlling a volume of material on a mold |
| US20060177532A1 (en) * | 2005-02-04 | 2006-08-10 | Molecular Imprints, Inc. | Imprint lithography method to control extrusion of a liquid from a desired region on a substrate |
| US20060177535A1 (en) * | 2005-02-04 | 2006-08-10 | Molecular Imprints, Inc. | Imprint lithography template to facilitate control of liquid movement |
| US7762186B2 (en) * | 2005-04-19 | 2010-07-27 | Asml Netherlands B.V. | Imprint lithography |
| US20070228608A1 (en) * | 2006-04-03 | 2007-10-04 | Molecular Imprints, Inc. | Preserving Filled Features when Vacuum Wiping |
| US20060266916A1 (en) * | 2005-05-25 | 2006-11-30 | Molecular Imprints, Inc. | Imprint lithography template having a coating to reflect and/or absorb actinic energy |
| JP4290177B2 (ja) * | 2005-06-08 | 2009-07-01 | キヤノン株式会社 | モールド、アライメント方法、パターン形成装置、パターン転写装置、及びチップの製造方法 |
| JP2007027361A (ja) * | 2005-07-15 | 2007-02-01 | Toppan Printing Co Ltd | インプリント用モールド |
| US7316554B2 (en) * | 2005-09-21 | 2008-01-08 | Molecular Imprints, Inc. | System to control an atmosphere between a body and a substrate |
| JP2007109986A (ja) * | 2005-10-14 | 2007-04-26 | Victor Co Of Japan Ltd | 微細パターンの形成方法 |
| US7906058B2 (en) * | 2005-12-01 | 2011-03-15 | Molecular Imprints, Inc. | Bifurcated contact printing technique |
| US7670530B2 (en) | 2006-01-20 | 2010-03-02 | Molecular Imprints, Inc. | Patterning substrates employing multiple chucks |
| US7517211B2 (en) * | 2005-12-21 | 2009-04-14 | Asml Netherlands B.V. | Imprint lithography |
| US8142850B2 (en) * | 2006-04-03 | 2012-03-27 | Molecular Imprints, Inc. | Patterning a plurality of fields on a substrate to compensate for differing evaporation times |
| US8850980B2 (en) * | 2006-04-03 | 2014-10-07 | Canon Nanotechnologies, Inc. | Tessellated patterns in imprint lithography |
| WO2007117524A2 (en) * | 2006-04-03 | 2007-10-18 | Molecular Imprints, Inc. | Method of concurrently patterning a substrate having a plurality of fields and alignment marks |
| EP2001602B1 (en) * | 2006-04-03 | 2011-06-22 | Molecular Imprints, Inc. | Lithography imprinting system |
| TW200842934A (en) * | 2006-12-29 | 2008-11-01 | Molecular Imprints Inc | Imprint fluid control |
| US20090014917A1 (en) * | 2007-07-10 | 2009-01-15 | Molecular Imprints, Inc. | Drop Pattern Generation for Imprint Lithography |
| US20090053535A1 (en) * | 2007-08-24 | 2009-02-26 | Molecular Imprints, Inc. | Reduced Residual Formation in Etched Multi-Layer Stacks |
-
2009
- 2009-02-06 US US12/367,079 patent/US8361371B2/en active Active
- 2009-02-09 CN CN200980104592.9A patent/CN101939704B/zh active Active
- 2009-02-09 EP EP09707380A patent/EP2240826A4/en not_active Withdrawn
- 2009-02-09 TW TW098104081A patent/TWI430015B/zh active
- 2009-02-09 KR KR1020167011654A patent/KR102065400B1/ko active Active
- 2009-02-09 WO PCT/US2009/000803 patent/WO2009099666A1/en not_active Ceased
- 2009-02-09 KR KR1020197030480A patent/KR102171030B1/ko active Active
- 2009-02-09 JP JP2010545889A patent/JP5216871B2/ja active Active
- 2009-02-09 KR KR1020107018535A patent/KR20100123698A/ko not_active Ceased
-
2013
- 2013-01-17 US US13/743,772 patent/US8641958B2/en active Active
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