JP2001237472A5 - - Google Patents

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JP2001237472A5
JP2001237472A5 JP2000182152A JP2000182152A JP2001237472A5 JP 2001237472 A5 JP2001237472 A5 JP 2001237472A5 JP 2000182152 A JP2000182152 A JP 2000182152A JP 2000182152 A JP2000182152 A JP 2000182152A JP 2001237472 A5 JP2001237472 A5 JP 2001237472A5
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film
ferromagnetic film
element according
ferromagnetic
magnetoresistive effect
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JP3589346B2 (ja
JP2001237472A (ja
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JP2000182152A 1999-06-17 2000-06-16 磁気抵抗効果素子および磁気抵抗効果記憶素子 Expired - Lifetime JP3589346B2 (ja)

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JP2000182152A JP3589346B2 (ja) 1999-06-17 2000-06-16 磁気抵抗効果素子および磁気抵抗効果記憶素子

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JP17048699 1999-06-17
JP35296299 1999-12-13
JP11-352962 1999-12-13
JP11-170486 1999-12-13
JP2000182152A JP3589346B2 (ja) 1999-06-17 2000-06-16 磁気抵抗効果素子および磁気抵抗効果記憶素子

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JP2003402316A Division JP2004179667A (ja) 1999-06-17 2003-12-01 磁気抵抗効果素子および磁気抵抗効果記憶素子およびデジタル信号を記憶させる方法

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JP2001237472A JP2001237472A (ja) 2001-08-31
JP2001237472A5 true JP2001237472A5 (enExample) 2004-11-11
JP3589346B2 JP3589346B2 (ja) 2004-11-17

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JP2003402316A Withdrawn JP2004179667A (ja) 1999-06-17 2003-12-01 磁気抵抗効果素子および磁気抵抗効果記憶素子およびデジタル信号を記憶させる方法

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US (2) US6436526B1 (enExample)
EP (1) EP1061592A3 (enExample)
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KR (2) KR100436318B1 (enExample)

Families Citing this family (203)

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Publication number Priority date Publication date Assignee Title
JP3589346B2 (ja) * 1999-06-17 2004-11-17 松下電器産業株式会社 磁気抵抗効果素子および磁気抵抗効果記憶素子
WO2000079522A1 (en) * 1999-06-22 2000-12-28 Fujitsu Limited Magnetic head slider and magnetic head assembly
US6424561B1 (en) 2000-07-18 2002-07-23 Micron Technology, Inc. MRAM architecture using offset bits for increased write selectivity
US6767655B2 (en) * 2000-08-21 2004-07-27 Matsushita Electric Industrial Co., Ltd. Magneto-resistive element
TW544677B (en) * 2000-12-26 2003-08-01 Matsushita Electric Industrial Co Ltd Magneto-resistance memory device
US6905780B2 (en) * 2001-02-01 2005-06-14 Kabushiki Kaisha Toshiba Current-perpendicular-to-plane-type magnetoresistive device, and magnetic head and magnetic recording-reproducing apparatus using the same
JP3677455B2 (ja) 2001-02-13 2005-08-03 Necエレクトロニクス株式会社 不揮発性磁気記憶装置およびその製造方法
US6798624B2 (en) * 2001-03-15 2004-09-28 Seagate Technology Llc Magnetization sensor for sensing the write field characteristics of a perpendicular or longitudinal recording head
DE10118197C2 (de) * 2001-04-11 2003-04-03 Infineon Technologies Ag Integrierte magnetoresistive Halbleiterspeicheranordnung und Verfahren zum Beschreiben derselben
JP5019681B2 (ja) 2001-04-26 2012-09-05 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP2002334971A (ja) * 2001-05-09 2002-11-22 Nec Corp 磁性メモリ及びその動作方法
US6744086B2 (en) 2001-05-15 2004-06-01 Nve Corporation Current switched magnetoresistive memory cell
JP3849460B2 (ja) * 2001-05-29 2006-11-22 ソニー株式会社 磁気抵抗効果素子、磁気抵抗効果型磁気センサ、および磁気抵抗効果型磁気ヘッド
WO2002099906A1 (en) * 2001-06-04 2002-12-12 Matsushita Electric Industrial Co., Ltd. Magnetoresistance element and magnetoresistance storage element and magnetic memory
DE10128964B4 (de) * 2001-06-15 2012-02-09 Qimonda Ag Digitale magnetische Speicherzelleneinrichtung
US6937447B2 (en) * 2001-09-19 2005-08-30 Kabushiki Kaisha Toshiba Magnetoresistance effect element, its manufacturing method, magnetic reproducing element and magnetic memory
US6538917B1 (en) * 2001-09-25 2003-03-25 Hewlett-Packard Development Company, L.P. Read methods for magneto-resistive device having soft reference layer
DE10149737A1 (de) * 2001-10-09 2003-04-24 Infineon Technologies Ag Halbleiterspeicher mit sich kreuzenden Wort- und Bitleitungen, an denen magnetoresistive Speicherzellen angeordnet sind
JP4428051B2 (ja) * 2001-10-12 2010-03-10 ソニー株式会社 磁気抵抗効果素子、磁気メモリ素子、磁気メモリ装置
US6545906B1 (en) * 2001-10-16 2003-04-08 Motorola, Inc. Method of writing to scalable magnetoresistance random access memory element
JP2003151262A (ja) 2001-11-15 2003-05-23 Toshiba Corp 磁気ランダムアクセスメモリ
DE10158795B4 (de) * 2001-11-30 2005-12-22 Infineon Technologies Ag Magnetoresistive Speicherzelle mit dynamischer Referenzschicht
TW569442B (en) 2001-12-18 2004-01-01 Toshiba Corp Magnetic memory device having magnetic shield layer, and manufacturing method thereof
US6735111B2 (en) * 2002-01-16 2004-05-11 Micron Technology, Inc. Magnetoresistive memory devices and assemblies
US6498747B1 (en) * 2002-02-08 2002-12-24 Infineon Technologies Ag Magnetoresistive random access memory (MRAM) cross-point array with reduced parasitic effects
JP2003243630A (ja) 2002-02-18 2003-08-29 Sony Corp 磁気メモリ装置およびその製造方法
KR100469750B1 (ko) * 2002-02-23 2005-02-02 학교법인 성균관대학 다층산화물 인공격자를 갖는 소자
JP2003283000A (ja) 2002-03-27 2003-10-03 Toshiba Corp 磁気抵抗効果素子およびこれを有する磁気メモリ
US6728132B2 (en) * 2002-04-03 2004-04-27 Micron Technology, Inc. Synthetic-ferrimagnet sense-layer for high density MRAM applications
JP4100025B2 (ja) 2002-04-09 2008-06-11 ソニー株式会社 磁気抵抗効果素子及び磁気メモリ装置
JP2003318460A (ja) * 2002-04-24 2003-11-07 Alps Electric Co Ltd 磁気検出素子及びその製造方法
KR100505104B1 (ko) * 2002-04-30 2005-07-29 삼성전자주식회사 자기 램 셀들, 그 구조체들 및 그 구동방법
JP4042478B2 (ja) * 2002-06-19 2008-02-06 ソニー株式会社 磁気抵抗効果素子及び磁気メモリ装置
US6507513B1 (en) * 2002-06-20 2003-01-14 Hewlett-Packard Company Using delayed electrical pulses with magneto-resistive devices
JP4242117B2 (ja) 2002-07-11 2009-03-18 株式会社ルネサステクノロジ 記憶装置
US6850433B2 (en) * 2002-07-15 2005-02-01 Hewlett-Packard Development Company, Lp. Magnetic memory device and method
US7095646B2 (en) 2002-07-17 2006-08-22 Freescale Semiconductor, Inc. Multi-state magnetoresistance random access cell with improved memory storage density
JP4674433B2 (ja) * 2002-07-18 2011-04-20 ソニー株式会社 磁気抵抗効果素子及び磁気メモリ装置
US6654278B1 (en) * 2002-07-31 2003-11-25 Motorola, Inc. Magnetoresistance random access memory
JP4178867B2 (ja) * 2002-08-02 2008-11-12 ソニー株式会社 磁気抵抗効果素子及び磁気メモリ装置
US6831312B2 (en) * 2002-08-30 2004-12-14 Freescale Semiconductor, Inc. Amorphous alloys for magnetic devices
US6803274B2 (en) * 2002-08-30 2004-10-12 Hewlett-Packard Development Company, L.P. Magnetic memory cell having an annular data layer and a soft reference layer
JP3788964B2 (ja) * 2002-09-10 2006-06-21 株式会社東芝 磁気ランダムアクセスメモリ
US7064974B2 (en) * 2002-09-12 2006-06-20 Nec Corporation Magnetic random access memory and method for manufacturing the same
US6903909B2 (en) * 2002-11-01 2005-06-07 Hewlett-Packard Development Company, L.P. Magnetoresistive element including ferromagnetic sublayer having smoothed surface
JP3935049B2 (ja) * 2002-11-05 2007-06-20 株式会社東芝 磁気記憶装置及びその製造方法
US6836429B2 (en) * 2002-12-07 2004-12-28 Hewlett-Packard Development Company, L.P. MRAM having two write conductors
JP4873338B2 (ja) * 2002-12-13 2012-02-08 独立行政法人科学技術振興機構 スピン注入デバイス及びこれを用いた磁気装置
US6842389B2 (en) * 2003-01-17 2005-01-11 Hewlett-Packard Development Company, L.P. System for and method of four-conductor magnetic random access memory cell and decoding scheme
US6917087B2 (en) 2003-02-21 2005-07-12 Micron Technology, Inc. Tilted array geometry for improved MRAM switching
JP3964818B2 (ja) * 2003-04-01 2007-08-22 株式会社東芝 磁気ランダムアクセスメモリ
US6667901B1 (en) * 2003-04-29 2003-12-23 Hewlett-Packard Development Company, L.P. Dual-junction magnetic memory device and read method
US7020009B2 (en) * 2003-05-14 2006-03-28 Macronix International Co., Ltd. Bistable magnetic device using soft magnetic intermediary material
US6865109B2 (en) * 2003-06-06 2005-03-08 Seagate Technology Llc Magnetic random access memory having flux closure for the free layer and spin transfer write mechanism
KR100560661B1 (ko) 2003-06-19 2006-03-16 삼성전자주식회사 자기 메모리의 읽기 방법
US6956763B2 (en) 2003-06-27 2005-10-18 Freescale Semiconductor, Inc. MRAM element and methods for writing the MRAM element
US7911832B2 (en) 2003-08-19 2011-03-22 New York University High speed low power magnetic devices based on current induced spin-momentum transfer
US8755222B2 (en) 2003-08-19 2014-06-17 New York University Bipolar spin-transfer switching
US7573737B2 (en) * 2003-08-19 2009-08-11 New York University High speed low power magnetic devices based on current induced spin-momentum transfer
US6967366B2 (en) 2003-08-25 2005-11-22 Freescale Semiconductor, Inc. Magnetoresistive random access memory with reduced switching field variation
JP2005085805A (ja) * 2003-09-04 2005-03-31 Fujitsu Ltd 半導体装置
US7050326B2 (en) * 2003-10-07 2006-05-23 Hewlett-Packard Development Company, L.P. Magnetic memory device with current carrying reference layer
US20050110004A1 (en) * 2003-11-24 2005-05-26 International Business Machines Corporation Magnetic tunnel junction with improved tunneling magneto-resistance
KR100624417B1 (ko) * 2004-01-31 2006-09-18 삼성전자주식회사 터널링 자기 저항 소자
JP4433820B2 (ja) * 2004-02-20 2010-03-17 Tdk株式会社 磁気検出素子およびその形成方法ならびに磁気センサ、電流計
KR100867662B1 (ko) 2004-03-12 2008-11-10 도쿠리쓰교세이호징 가가쿠 기주쓰 신코 기코 자기저항소자, 터널 장벽층 및 자기저항소자의 제조방법
US7102920B2 (en) 2004-03-23 2006-09-05 Hewlett-Packard Development Company, L.P. Soft-reference three conductor magnetic memory storage device
WO2005098953A1 (ja) * 2004-03-31 2005-10-20 Nec Corporation 磁化方向制御方法、及びそれを応用したmram
JP4747507B2 (ja) * 2004-04-16 2011-08-17 ソニー株式会社 磁気メモリ及びその記録方法
US7449345B2 (en) * 2004-06-15 2008-11-11 Headway Technologies, Inc. Capping structure for enhancing dR/R of the MTJ device
JP4692805B2 (ja) * 2004-06-30 2011-06-01 Tdk株式会社 磁気検出素子およびその形成方法
US7067330B2 (en) * 2004-07-16 2006-06-27 Headway Technologies, Inc. Magnetic random access memory array with thin conduction electrical read and write lines
US7466525B2 (en) * 2004-09-03 2008-12-16 Tdk Corporation Magnetic sensing element including laminated film composed of half-metal and NiFe alloy as free layer
JP4292128B2 (ja) 2004-09-07 2009-07-08 キヤノンアネルバ株式会社 磁気抵抗効果素子の製造方法
US7129098B2 (en) 2004-11-24 2006-10-31 Freescale Semiconductor, Inc. Reduced power magnetoresistive random access memory elements
US7390530B2 (en) * 2004-11-30 2008-06-24 Headway Technologies, Inc. Structure and process for composite free layer in CPP GMR device
KR100601994B1 (ko) * 2005-03-02 2006-07-18 삼성전자주식회사 외부 자기장 발생수단을 구비하는 메모리 장치와 그 동작및 제조 방법
JP4877575B2 (ja) 2005-05-19 2012-02-15 日本電気株式会社 磁気ランダムアクセスメモリ
US7888721B2 (en) 2005-07-06 2011-02-15 Micron Technology, Inc. Surround gate access transistors with grown ultra-thin bodies
US7768051B2 (en) 2005-07-25 2010-08-03 Micron Technology, Inc. DRAM including a vertical surround gate transistor
US7696567B2 (en) 2005-08-31 2010-04-13 Micron Technology, Inc Semiconductor memory device
US7557032B2 (en) 2005-09-01 2009-07-07 Micron Technology, Inc. Silicided recessed silicon
US7399671B2 (en) 2005-09-01 2008-07-15 Micron Technology, Inc. Disposable pillars for contact formation
US7416943B2 (en) 2005-09-01 2008-08-26 Micron Technology, Inc. Peripheral gate stacks and recessed array gates
US7687342B2 (en) 2005-09-01 2010-03-30 Micron Technology, Inc. Method of manufacturing a memory device
CN101277997B (zh) * 2005-10-07 2011-11-09 柯尼卡美能达精密光学株式会社 纤维素酯膜的制造方法、纤维素酯膜、偏振片和液晶显示装置
JP4786331B2 (ja) 2005-12-21 2011-10-05 株式会社東芝 磁気抵抗効果素子の製造方法
JP4864464B2 (ja) * 2006-01-11 2012-02-01 株式会社東芝 磁気抵抗効果素子とその製造方法、およびそれを用いた磁気ヘッドと磁気再生装置と磁気メモリ
JP4514721B2 (ja) * 2006-02-09 2010-07-28 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気抵抗効果ヘッド、磁気記録再生装置及び磁気記憶装置
JP2007281229A (ja) * 2006-04-07 2007-10-25 Toshiba Corp 磁気抵抗ランダムアクセスメモリ、その書き込み方法、およびテスト方法
JP2007299880A (ja) 2006-04-28 2007-11-15 Toshiba Corp 磁気抵抗効果素子,および磁気抵抗効果素子の製造方法
JP4550777B2 (ja) 2006-07-07 2010-09-22 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッド、磁気記録再生装置及び磁気メモリ
JP5044157B2 (ja) * 2006-07-11 2012-10-10 株式会社東芝 磁気抵抗効果素子,磁気ヘッド,および磁気再生装置
JP5210533B2 (ja) 2006-09-21 2013-06-12 アルプス電気株式会社 トンネル型磁気検出素子及びその製造方法
JP2008103662A (ja) * 2006-09-21 2008-05-01 Alps Electric Co Ltd トンネル型磁気検出素子及びその製造方法
JP2008085220A (ja) 2006-09-28 2008-04-10 Toshiba Corp 磁気抵抗効果素子、磁気ヘッド、および磁気再生装置
JP5003109B2 (ja) * 2006-11-14 2012-08-15 富士通株式会社 強磁性トンネル接合素子、その製造方法、及びそれを用いた磁気ヘッド、磁気メモリ
JP2008227297A (ja) 2007-03-14 2008-09-25 Tdk Corp トンネル型磁気検出素子及びその製造方法
JP4388093B2 (ja) 2007-03-27 2009-12-24 株式会社東芝 磁気抵抗効果素子、磁気ヘッド、磁気記録再生装置
US7923373B2 (en) 2007-06-04 2011-04-12 Micron Technology, Inc. Pitch multiplication using self-assembling materials
JP4553927B2 (ja) * 2007-08-10 2010-09-29 ルネサスエレクトロニクス株式会社 半導体装置
US9812184B2 (en) 2007-10-31 2017-11-07 New York University Current induced spin-momentum transfer stack with dual insulating layers
US7751231B2 (en) * 2008-05-05 2010-07-06 Qimonda Ag Method and integrated circuit for determining the state of a resistivity changing memory cell
JP4698712B2 (ja) * 2008-09-05 2011-06-08 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP5039006B2 (ja) * 2008-09-26 2012-10-03 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置
JP5032429B2 (ja) * 2008-09-26 2012-09-26 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置
JP5032430B2 (ja) * 2008-09-26 2012-09-26 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置
JP5039007B2 (ja) * 2008-09-26 2012-10-03 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置
JP2010080839A (ja) 2008-09-29 2010-04-08 Toshiba Corp 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリおよび磁気記録再生装置
JP2009218611A (ja) * 2009-05-18 2009-09-24 Sony Corp 磁気抵抗効果素子及び磁気メモリ装置、磁気抵抗効果素子及び磁気メモリ装置の製造方法
EP2276034B1 (en) * 2009-07-13 2016-04-27 Crocus Technology S.A. Self-referenced magnetic random access memory cell
KR101115039B1 (ko) 2009-08-21 2012-03-07 한국과학기술연구원 자기터널접합 디바이스 및 그 제조 방법
US9207292B2 (en) * 2011-02-02 2015-12-08 Infineon Technologies Ag Magnetoresistive device and method for manufacturing the same
JP5859735B2 (ja) * 2011-03-15 2016-02-16 国立大学法人信州大学 薄膜磁気デバイス及びその磁気特性制御方法
US8686484B2 (en) 2011-06-10 2014-04-01 Everspin Technologies, Inc. Spin-torque magnetoresistive memory element and method of fabricating same
JP5684081B2 (ja) 2011-09-22 2015-03-11 株式会社東芝 アナログ/デジタル変換器
JP5684080B2 (ja) 2011-09-22 2015-03-11 株式会社東芝 アナログ/デジタル変換器
US9082888B2 (en) * 2012-10-17 2015-07-14 New York University Inverted orthogonal spin transfer layer stack
US9082950B2 (en) 2012-10-17 2015-07-14 New York University Increased magnetoresistance in an inverted orthogonal spin transfer layer stack
EP2953178B1 (en) 2013-02-04 2017-11-22 Alps Electric Co., Ltd. Giant magnetoresistive element and current sensor using same
US8982613B2 (en) 2013-06-17 2015-03-17 New York University Scalable orthogonal spin transfer magnetic random access memory devices with reduced write error rates
WO2014205634A1 (zh) * 2013-06-24 2014-12-31 吉瑞高新科技股份有限公司 电子烟发热装置及电子烟
US9263667B1 (en) 2014-07-25 2016-02-16 Spin Transfer Technologies, Inc. Method for manufacturing MTJ memory device
US9337412B2 (en) 2014-09-22 2016-05-10 Spin Transfer Technologies, Inc. Magnetic tunnel junction structure for MRAM device
US9728712B2 (en) 2015-04-21 2017-08-08 Spin Transfer Technologies, Inc. Spin transfer torque structure for MRAM devices having a spin current injection capping layer
US10468590B2 (en) 2015-04-21 2019-11-05 Spin Memory, Inc. High annealing temperature perpendicular magnetic anisotropy structure for magnetic random access memory
US9853206B2 (en) 2015-06-16 2017-12-26 Spin Transfer Technologies, Inc. Precessional spin current structure for MRAM
US9773974B2 (en) 2015-07-30 2017-09-26 Spin Transfer Technologies, Inc. Polishing stop layer(s) for processing arrays of semiconductor elements
US10163479B2 (en) 2015-08-14 2018-12-25 Spin Transfer Technologies, Inc. Method and apparatus for bipolar memory write-verify
EP4514109A3 (en) 2015-12-10 2025-04-30 Everspin Technologies, Inc. Magnetoresistive stack, seed region therefor and method of manufacturing same
US10483320B2 (en) 2015-12-10 2019-11-19 Everspin Technologies, Inc. Magnetoresistive stack with seed region and method of manufacturing the same
US9741926B1 (en) 2016-01-28 2017-08-22 Spin Transfer Technologies, Inc. Memory cell having magnetic tunnel junction and thermal stability enhancement layer
US10361361B2 (en) * 2016-04-08 2019-07-23 International Business Machines Corporation Thin reference layer for STT MRAM
US10366774B2 (en) 2016-09-27 2019-07-30 Spin Memory, Inc. Device with dynamic redundancy registers
US10546625B2 (en) 2016-09-27 2020-01-28 Spin Memory, Inc. Method of optimizing write voltage based on error buffer occupancy
US11151042B2 (en) 2016-09-27 2021-10-19 Integrated Silicon Solution, (Cayman) Inc. Error cache segmentation for power reduction
US10360964B2 (en) 2016-09-27 2019-07-23 Spin Memory, Inc. Method of writing contents in memory during a power up sequence using a dynamic redundancy register in a memory device
US10818331B2 (en) 2016-09-27 2020-10-27 Spin Memory, Inc. Multi-chip module for MRAM devices with levels of dynamic redundancy registers
US10628316B2 (en) 2016-09-27 2020-04-21 Spin Memory, Inc. Memory device with a plurality of memory banks where each memory bank is associated with a corresponding memory instruction pipeline and a dynamic redundancy register
US10446210B2 (en) 2016-09-27 2019-10-15 Spin Memory, Inc. Memory instruction pipeline with a pre-read stage for a write operation for reducing power consumption in a memory device that uses dynamic redundancy registers
US10437491B2 (en) 2016-09-27 2019-10-08 Spin Memory, Inc. Method of processing incomplete memory operations in a memory device during a power up sequence and a power down sequence using a dynamic redundancy register
US11119936B2 (en) 2016-09-27 2021-09-14 Spin Memory, Inc. Error cache system with coarse and fine segments for power optimization
US10437723B2 (en) 2016-09-27 2019-10-08 Spin Memory, Inc. Method of flushing the contents of a dynamic redundancy register to a secure storage area during a power down in a memory device
US11119910B2 (en) 2016-09-27 2021-09-14 Spin Memory, Inc. Heuristics for selecting subsegments for entry in and entry out operations in an error cache system with coarse and fine grain segments
US10460781B2 (en) 2016-09-27 2019-10-29 Spin Memory, Inc. Memory device with a dual Y-multiplexer structure for performing two simultaneous operations on the same row of a memory bank
US10991410B2 (en) 2016-09-27 2021-04-27 Spin Memory, Inc. Bi-polar write scheme
US9633706B1 (en) 2016-10-10 2017-04-25 Qualcomm Incorporated Voltage self-boosting circuit for generating a boosted voltage for driving a word line write in a memory array for a memory write operation
WO2018125634A1 (en) * 2016-12-27 2018-07-05 Everspin Technologies, Inc. Data storage in synthetic antiferromagnets included in magnetic tunnel junctions
US10665777B2 (en) 2017-02-28 2020-05-26 Spin Memory, Inc. Precessional spin current structure with non-magnetic insertion layer for MRAM
US10672976B2 (en) 2017-02-28 2020-06-02 Spin Memory, Inc. Precessional spin current structure with high in-plane magnetization for MRAM
US10032978B1 (en) 2017-06-27 2018-07-24 Spin Transfer Technologies, Inc. MRAM with reduced stray magnetic fields
US10529439B2 (en) 2017-10-24 2020-01-07 Spin Memory, Inc. On-the-fly bit failure detection and bit redundancy remapping techniques to correct for fixed bit defects
US10656994B2 (en) 2017-10-24 2020-05-19 Spin Memory, Inc. Over-voltage write operation of tunnel magnet-resistance (“TMR”) memory device and correcting failure bits therefrom by using on-the-fly bit failure detection and bit redundancy remapping techniques
US10489245B2 (en) 2017-10-24 2019-11-26 Spin Memory, Inc. Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to short during testing and using on-the-fly bit failure detection and bit redundancy remapping techniques to correct them
US10481976B2 (en) 2017-10-24 2019-11-19 Spin Memory, Inc. Forcing bits as bad to widen the window between the distributions of acceptable high and low resistive bits thereby lowering the margin and increasing the speed of the sense amplifiers
US10679685B2 (en) 2017-12-27 2020-06-09 Spin Memory, Inc. Shared bit line array architecture for magnetoresistive memory
US10395712B2 (en) 2017-12-28 2019-08-27 Spin Memory, Inc. Memory array with horizontal source line and sacrificial bitline per virtual source
US10516094B2 (en) 2017-12-28 2019-12-24 Spin Memory, Inc. Process for creating dense pillars using multiple exposures for MRAM fabrication
US10395711B2 (en) 2017-12-28 2019-08-27 Spin Memory, Inc. Perpendicular source and bit lines for an MRAM array
US10811594B2 (en) 2017-12-28 2020-10-20 Spin Memory, Inc. Process for hard mask development for MRAM pillar formation using photolithography
US10891997B2 (en) 2017-12-28 2021-01-12 Spin Memory, Inc. Memory array with horizontal source line and a virtual source line
US10424726B2 (en) 2017-12-28 2019-09-24 Spin Memory, Inc. Process for improving photoresist pillar adhesion during MRAM fabrication
US10360962B1 (en) 2017-12-28 2019-07-23 Spin Memory, Inc. Memory array with individually trimmable sense amplifiers
US10784439B2 (en) 2017-12-29 2020-09-22 Spin Memory, Inc. Precessional spin current magnetic tunnel junction devices and methods of manufacture
US10840436B2 (en) 2017-12-29 2020-11-17 Spin Memory, Inc. Perpendicular magnetic anisotropy interface tunnel junction devices and methods of manufacture
US10360961B1 (en) 2017-12-29 2019-07-23 Spin Memory, Inc. AC current pre-charge write-assist in orthogonal STT-MRAM
US10840439B2 (en) 2017-12-29 2020-11-17 Spin Memory, Inc. Magnetic tunnel junction (MTJ) fabrication methods and systems
US10424723B2 (en) 2017-12-29 2019-09-24 Spin Memory, Inc. Magnetic tunnel junction devices including an optimization layer
US10270027B1 (en) 2017-12-29 2019-04-23 Spin Memory, Inc. Self-generating AC current assist in orthogonal STT-MRAM
US10236047B1 (en) 2017-12-29 2019-03-19 Spin Memory, Inc. Shared oscillator (STNO) for MRAM array write-assist in orthogonal STT-MRAM
US10546624B2 (en) 2017-12-29 2020-01-28 Spin Memory, Inc. Multi-port random access memory
US10367139B2 (en) 2017-12-29 2019-07-30 Spin Memory, Inc. Methods of manufacturing magnetic tunnel junction devices
US10236048B1 (en) 2017-12-29 2019-03-19 Spin Memory, Inc. AC current write-assist in orthogonal STT-MRAM
US10886330B2 (en) 2017-12-29 2021-01-05 Spin Memory, Inc. Memory device having overlapping magnetic tunnel junctions in compliance with a reference pitch
US10199083B1 (en) 2017-12-29 2019-02-05 Spin Transfer Technologies, Inc. Three-terminal MRAM with ac write-assist for low read disturb
US10236439B1 (en) 2017-12-30 2019-03-19 Spin Memory, Inc. Switching and stability control for perpendicular magnetic tunnel junction device
US10339993B1 (en) 2017-12-30 2019-07-02 Spin Memory, Inc. Perpendicular magnetic tunnel junction device with skyrmionic assist layers for free layer switching
US10229724B1 (en) 2017-12-30 2019-03-12 Spin Memory, Inc. Microwave write-assist in series-interconnected orthogonal STT-MRAM devices
US10319900B1 (en) 2017-12-30 2019-06-11 Spin Memory, Inc. Perpendicular magnetic tunnel junction device with precessional spin current layer having a modulated moment density
US10141499B1 (en) 2017-12-30 2018-11-27 Spin Transfer Technologies, Inc. Perpendicular magnetic tunnel junction device with offset precessional spin current layer
US10255962B1 (en) 2017-12-30 2019-04-09 Spin Memory, Inc. Microwave write-assist in orthogonal STT-MRAM
US10468588B2 (en) 2018-01-05 2019-11-05 Spin Memory, Inc. Perpendicular magnetic tunnel junction device with skyrmionic enhancement layers for the precessional spin current magnetic layer
US10438996B2 (en) 2018-01-08 2019-10-08 Spin Memory, Inc. Methods of fabricating magnetic tunnel junctions integrated with selectors
US10438995B2 (en) 2018-01-08 2019-10-08 Spin Memory, Inc. Devices including magnetic tunnel junctions integrated with selectors
US10388861B1 (en) 2018-03-08 2019-08-20 Spin Memory, Inc. Magnetic tunnel junction wafer adaptor used in magnetic annealing furnace and method of using the same
US10446744B2 (en) 2018-03-08 2019-10-15 Spin Memory, Inc. Magnetic tunnel junction wafer adaptor used in magnetic annealing furnace and method of using the same
US10784437B2 (en) 2018-03-23 2020-09-22 Spin Memory, Inc. Three-dimensional arrays with MTJ devices including a free magnetic trench layer and a planar reference magnetic layer
US10529915B2 (en) 2018-03-23 2020-01-07 Spin Memory, Inc. Bit line structures for three-dimensional arrays with magnetic tunnel junction devices including an annular free magnetic layer and a planar reference magnetic layer
US11107978B2 (en) 2018-03-23 2021-08-31 Spin Memory, Inc. Methods of manufacturing three-dimensional arrays with MTJ devices including a free magnetic trench layer and a planar reference magnetic layer
US11107974B2 (en) 2018-03-23 2021-08-31 Spin Memory, Inc. Magnetic tunnel junction devices including a free magnetic trench layer and a planar reference magnetic layer
US10411185B1 (en) 2018-05-30 2019-09-10 Spin Memory, Inc. Process for creating a high density magnetic tunnel junction array test platform
US10593396B2 (en) 2018-07-06 2020-03-17 Spin Memory, Inc. Multi-bit cell read-out techniques for MRAM cells with mixed pinned magnetization orientations
US10600478B2 (en) 2018-07-06 2020-03-24 Spin Memory, Inc. Multi-bit cell read-out techniques for MRAM cells with mixed pinned magnetization orientations
US10692569B2 (en) 2018-07-06 2020-06-23 Spin Memory, Inc. Read-out techniques for multi-bit cells
US10559338B2 (en) 2018-07-06 2020-02-11 Spin Memory, Inc. Multi-bit cell read-out techniques
US10650875B2 (en) 2018-08-21 2020-05-12 Spin Memory, Inc. System for a wide temperature range nonvolatile memory
US10699761B2 (en) 2018-09-18 2020-06-30 Spin Memory, Inc. Word line decoder memory architecture
US10971680B2 (en) 2018-10-01 2021-04-06 Spin Memory, Inc. Multi terminal device stack formation methods
US11621293B2 (en) 2018-10-01 2023-04-04 Integrated Silicon Solution, (Cayman) Inc. Multi terminal device stack systems and methods
US10580827B1 (en) 2018-11-16 2020-03-03 Spin Memory, Inc. Adjustable stabilizer/polarizer method for MRAM with enhanced stability and efficient switching
US11107979B2 (en) 2018-12-28 2021-08-31 Spin Memory, Inc. Patterned silicide structures and methods of manufacture
JP2021144967A (ja) 2020-03-10 2021-09-24 キオクシア株式会社 記憶装置
CN111521859B (zh) * 2020-06-22 2021-06-04 南方电网数字电网研究院有限公司 电力设备的线路电流测量方法、装置及计算机设备

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4243358A1 (de) * 1992-12-21 1994-06-23 Siemens Ag Magnetowiderstands-Sensor mit künstlichem Antiferromagneten und Verfahren zu seiner Herstellung
JPH0714710A (ja) 1993-06-25 1995-01-17 Fujitsu Ltd 磁気抵抗効果素子
US5841611A (en) 1994-05-02 1998-11-24 Matsushita Electric Industrial Co., Ltd. Magnetoresistance effect device and magnetoresistance effect type head, memory device, and amplifying device using the same
US5640343A (en) 1996-03-18 1997-06-17 International Business Machines Corporation Magnetic memory array using magnetic tunnel junction devices in the memory cells
US5650958A (en) 1996-03-18 1997-07-22 International Business Machines Corporation Magnetic tunnel junctions with controlled magnetic response
US5734605A (en) 1996-09-10 1998-03-31 Motorola, Inc. Multi-layer magnetic tunneling junction memory cells
US5801984A (en) 1996-11-27 1998-09-01 International Business Machines Corporation Magnetic tunnel junction device with ferromagnetic multilayer having fixed magnetic moment
US5838608A (en) 1997-06-16 1998-11-17 Motorola, Inc. Multi-layer magnetic random access memory and method for fabricating thereof
US6111784A (en) 1997-09-18 2000-08-29 Canon Kabushiki Kaisha Magnetic thin film memory element utilizing GMR effect, and recording/reproduction method using such memory element
DE19853447A1 (de) 1998-11-19 2000-05-25 Siemens Ag Magnetischer Speicher
JP3589346B2 (ja) * 1999-06-17 2004-11-17 松下電器産業株式会社 磁気抵抗効果素子および磁気抵抗効果記憶素子
US6767655B2 (en) * 2000-08-21 2004-07-27 Matsushita Electric Industrial Co., Ltd. Magneto-resistive element

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