IN164539B - - Google Patents

Info

Publication number
IN164539B
IN164539B IN461/CAL/86A IN461CA1986A IN164539B IN 164539 B IN164539 B IN 164539B IN 461CA1986 A IN461CA1986 A IN 461CA1986A IN 164539 B IN164539 B IN 164539B
Authority
IN
India
Prior art keywords
circuit
test
mother board
test circuit
take
Prior art date
Application number
IN461/CAL/86A
Other languages
English (en)
Inventor
Heinz Krug
Original Assignee
Heinz Krug
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heinz Krug filed Critical Heinz Krug
Publication of IN164539B publication Critical patent/IN164539B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/92—Conductor layers on different levels connected in parallel, e.g. to reduce resistance

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
IN461/CAL/86A 1985-07-24 1986-06-20 IN164539B (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19853526485 DE3526485A1 (de) 1985-07-24 1985-07-24 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten

Publications (1)

Publication Number Publication Date
IN164539B true IN164539B (fr) 1989-04-01

Family

ID=6276647

Family Applications (1)

Application Number Title Priority Date Filing Date
IN461/CAL/86A IN164539B (fr) 1985-07-24 1986-06-20

Country Status (7)

Country Link
US (1) US4961053A (fr)
EP (1) EP0212208B1 (fr)
JP (1) JPS6316633A (fr)
CN (1) CN1011085B (fr)
AT (1) ATE67861T1 (fr)
DE (2) DE3526485A1 (fr)
IN (1) IN164539B (fr)

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Also Published As

Publication number Publication date
US4961053A (en) 1990-10-02
EP0212208B1 (fr) 1991-09-25
DE3526485C2 (fr) 1987-08-06
EP0212208A1 (fr) 1987-03-04
DE3681657D1 (de) 1991-10-31
ATE67861T1 (de) 1991-10-15
CN86105604A (zh) 1987-02-11
DE3526485A1 (de) 1987-02-05
CN1011085B (zh) 1991-01-02
JPS6316633A (ja) 1988-01-23

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