GB8827629D0 - Testing of analogue circuits - Google Patents

Testing of analogue circuits

Info

Publication number
GB8827629D0
GB8827629D0 GB888827629A GB8827629A GB8827629D0 GB 8827629 D0 GB8827629 D0 GB 8827629D0 GB 888827629 A GB888827629 A GB 888827629A GB 8827629 A GB8827629 A GB 8827629A GB 8827629 D0 GB8827629 D0 GB 8827629D0
Authority
GB
United Kingdom
Prior art keywords
testing
analogue circuits
analogue
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB888827629A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LSI Logic Europe Ltd
Original Assignee
LSI Logic Europe Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LSI Logic Europe Ltd filed Critical LSI Logic Europe Ltd
Priority to GB888827629A priority Critical patent/GB8827629D0/en
Publication of GB8827629D0 publication Critical patent/GB8827629D0/en
Priority to EP19900900272 priority patent/EP0416047A1/en
Priority to JP50081790A priority patent/JPH03502373A/en
Priority to PCT/GB1989/001408 priority patent/WO1990006521A1/en
Pending legal-status Critical Current

Links

GB888827629A 1988-11-25 1988-11-25 Testing of analogue circuits Pending GB8827629D0 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB888827629A GB8827629D0 (en) 1988-11-25 1988-11-25 Testing of analogue circuits
EP19900900272 EP0416047A1 (en) 1988-11-25 1989-11-24 Testing of analogue circuits in semiconductor devices
JP50081790A JPH03502373A (en) 1988-11-25 1989-11-24 Testing of analog circuits in semiconductor devices
PCT/GB1989/001408 WO1990006521A1 (en) 1988-11-25 1989-11-24 Testing of analogue circuits in semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888827629A GB8827629D0 (en) 1988-11-25 1988-11-25 Testing of analogue circuits

Publications (1)

Publication Number Publication Date
GB8827629D0 true GB8827629D0 (en) 1988-12-29

Family

ID=10647502

Family Applications (1)

Application Number Title Priority Date Filing Date
GB888827629A Pending GB8827629D0 (en) 1988-11-25 1988-11-25 Testing of analogue circuits

Country Status (4)

Country Link
EP (1) EP0416047A1 (en)
JP (1) JPH03502373A (en)
GB (1) GB8827629D0 (en)
WO (1) WO1990006521A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2719381B1 (en) * 1994-04-29 1996-06-21 Suisse Electronique Microtech Sensor comprising a plurality of local sensors, in particular photodiodes.

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3526485A1 (en) * 1985-07-24 1987-02-05 Heinz Krug CIRCUIT ARRANGEMENT FOR TESTING INTEGRATED CIRCUIT UNITS
US4739250A (en) * 1985-11-20 1988-04-19 Fujitsu Limited Semiconductor integrated circuit device with test circuit
US4714876A (en) * 1986-04-14 1987-12-22 Ncr Corporation Circuit for initiating test modes

Also Published As

Publication number Publication date
JPH03502373A (en) 1991-05-30
WO1990006521A1 (en) 1990-06-14
EP0416047A1 (en) 1991-03-13

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