GB8827629D0 - Testing of analogue circuits - Google Patents
Testing of analogue circuitsInfo
- Publication number
- GB8827629D0 GB8827629D0 GB888827629A GB8827629A GB8827629D0 GB 8827629 D0 GB8827629 D0 GB 8827629D0 GB 888827629 A GB888827629 A GB 888827629A GB 8827629 A GB8827629 A GB 8827629A GB 8827629 D0 GB8827629 D0 GB 8827629D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- testing
- analogue circuits
- analogue
- circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB888827629A GB8827629D0 (en) | 1988-11-25 | 1988-11-25 | Testing of analogue circuits |
EP19900900272 EP0416047A1 (en) | 1988-11-25 | 1989-11-24 | Testing of analogue circuits in semiconductor devices |
JP50081790A JPH03502373A (en) | 1988-11-25 | 1989-11-24 | Testing of analog circuits in semiconductor devices |
PCT/GB1989/001408 WO1990006521A1 (en) | 1988-11-25 | 1989-11-24 | Testing of analogue circuits in semiconductor devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB888827629A GB8827629D0 (en) | 1988-11-25 | 1988-11-25 | Testing of analogue circuits |
Publications (1)
Publication Number | Publication Date |
---|---|
GB8827629D0 true GB8827629D0 (en) | 1988-12-29 |
Family
ID=10647502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB888827629A Pending GB8827629D0 (en) | 1988-11-25 | 1988-11-25 | Testing of analogue circuits |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0416047A1 (en) |
JP (1) | JPH03502373A (en) |
GB (1) | GB8827629D0 (en) |
WO (1) | WO1990006521A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2719381B1 (en) * | 1994-04-29 | 1996-06-21 | Suisse Electronique Microtech | Sensor comprising a plurality of local sensors, in particular photodiodes. |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3526485A1 (en) * | 1985-07-24 | 1987-02-05 | Heinz Krug | CIRCUIT ARRANGEMENT FOR TESTING INTEGRATED CIRCUIT UNITS |
US4739250A (en) * | 1985-11-20 | 1988-04-19 | Fujitsu Limited | Semiconductor integrated circuit device with test circuit |
US4714876A (en) * | 1986-04-14 | 1987-12-22 | Ncr Corporation | Circuit for initiating test modes |
-
1988
- 1988-11-25 GB GB888827629A patent/GB8827629D0/en active Pending
-
1989
- 1989-11-24 JP JP50081790A patent/JPH03502373A/en active Pending
- 1989-11-24 WO PCT/GB1989/001408 patent/WO1990006521A1/en not_active Application Discontinuation
- 1989-11-24 EP EP19900900272 patent/EP0416047A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JPH03502373A (en) | 1991-05-30 |
WO1990006521A1 (en) | 1990-06-14 |
EP0416047A1 (en) | 1991-03-13 |
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