GB8523419D0 - Burn-in of integrated circuits - Google Patents

Burn-in of integrated circuits

Info

Publication number
GB8523419D0
GB8523419D0 GB858523419A GB8523419A GB8523419D0 GB 8523419 D0 GB8523419 D0 GB 8523419D0 GB 858523419 A GB858523419 A GB 858523419A GB 8523419 A GB8523419 A GB 8523419A GB 8523419 D0 GB8523419 D0 GB 8523419D0
Authority
GB
United Kingdom
Prior art keywords
burn
integrated circuits
circuits
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB858523419A
Other versions
GB2180959B (en
GB2180959A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHARETREE Ltd
Original Assignee
SHARETREE Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHARETREE Ltd filed Critical SHARETREE Ltd
Priority to GB8523419A priority Critical patent/GB2180959B/en
Publication of GB8523419D0 publication Critical patent/GB8523419D0/en
Priority to EP86905874A priority patent/EP0238598B1/en
Priority to PCT/GB1986/000570 priority patent/WO1987001813A1/en
Priority to DE8686905874T priority patent/DE3683284D1/en
Publication of GB2180959A publication Critical patent/GB2180959A/en
Priority to US07/053,107 priority patent/US4881591A/en
Application granted granted Critical
Publication of GB2180959B publication Critical patent/GB2180959B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B9/00—Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity
    • F27B9/30—Details, accessories, or equipment peculiar to furnaces of these types
    • F27B9/3077—Arrangements for treating electronic components, e.g. semiconductors
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1917—Control of temperature characterised by the use of electric means using digital means
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Mechanical Engineering (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
GB8523419A 1985-09-23 1985-09-23 Apparatus for the burn-in of integrated circuits Expired GB2180959B (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
GB8523419A GB2180959B (en) 1985-09-23 1985-09-23 Apparatus for the burn-in of integrated circuits
EP86905874A EP0238598B1 (en) 1985-09-23 1986-09-23 An oven for the burn-in of integrated circuits
PCT/GB1986/000570 WO1987001813A1 (en) 1985-09-23 1986-09-23 An oven for the burn-in of integrated circuits
DE8686905874T DE3683284D1 (en) 1985-09-23 1986-09-23 OVEN FOR BURNING IN INTEGRATED CIRCUITS.
US07/053,107 US4881591A (en) 1985-09-23 1987-05-21 Oven for the burn-in of integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8523419A GB2180959B (en) 1985-09-23 1985-09-23 Apparatus for the burn-in of integrated circuits

Publications (3)

Publication Number Publication Date
GB8523419D0 true GB8523419D0 (en) 1985-10-30
GB2180959A GB2180959A (en) 1987-04-08
GB2180959B GB2180959B (en) 1989-09-13

Family

ID=10585581

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8523419A Expired GB2180959B (en) 1985-09-23 1985-09-23 Apparatus for the burn-in of integrated circuits

Country Status (1)

Country Link
GB (1) GB2180959B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1000697A6 (en) * 1987-10-28 1989-03-14 Irish Transformers Ltd Device for testing integrated electrical circuits.
FR2631165B1 (en) * 1988-05-05 1992-02-21 Moulene Daniel TEMPERATURE CONDITIONING MEDIUM FOR SMALL OBJECTS SUCH AS SEMICONDUCTOR COMPONENTS AND THERMAL REGULATION METHOD USING THE SAME
WO2003027686A2 (en) * 2001-09-27 2003-04-03 Advanced Micro Devices, Inc. Method and apparatus for temperature control of a device during testing

Also Published As

Publication number Publication date
GB2180959B (en) 1989-09-13
GB2180959A (en) 1987-04-08

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee