GB8925711D0 - Circuit testing - Google Patents

Circuit testing

Info

Publication number
GB8925711D0
GB8925711D0 GB898925711A GB8925711A GB8925711D0 GB 8925711 D0 GB8925711 D0 GB 8925711D0 GB 898925711 A GB898925711 A GB 898925711A GB 8925711 A GB8925711 A GB 8925711A GB 8925711 D0 GB8925711 D0 GB 8925711D0
Authority
GB
United Kingdom
Prior art keywords
circuit testing
testing
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB898925711A
Other versions
GB2225866A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DATATRACE Ltd
Original Assignee
DATATRACE Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DATATRACE Ltd filed Critical DATATRACE Ltd
Publication of GB8925711D0 publication Critical patent/GB8925711D0/en
Publication of GB2225866A publication Critical patent/GB2225866A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB8925711A 1988-11-17 1989-11-14 Testing electrical circuits Withdrawn GB2225866A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888826921A GB8826921D0 (en) 1988-11-17 1988-11-17 Circuit testing

Publications (2)

Publication Number Publication Date
GB8925711D0 true GB8925711D0 (en) 1990-01-04
GB2225866A GB2225866A (en) 1990-06-13

Family

ID=10647024

Family Applications (2)

Application Number Title Priority Date Filing Date
GB888826921A Pending GB8826921D0 (en) 1988-11-17 1988-11-17 Circuit testing
GB8925711A Withdrawn GB2225866A (en) 1988-11-17 1989-11-14 Testing electrical circuits

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB888826921A Pending GB8826921D0 (en) 1988-11-17 1988-11-17 Circuit testing

Country Status (1)

Country Link
GB (2) GB8826921D0 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW253097B (en) * 1992-03-02 1995-08-01 At & T Corp

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
ES8601486A1 (en) * 1983-07-13 1985-10-16 Instrumentation Engineering Digital pin electronics module for computerized automatic diagnostic testing systems
GB8411733D0 (en) * 1984-05-09 1984-06-13 Gen Electric Co Plc Integrated circuit testing arrangements
US4635261A (en) * 1985-06-26 1987-01-06 Motorola, Inc. On chip test system for configurable gate arrays
US4680761A (en) * 1986-01-30 1987-07-14 Burkness Donald C Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VLSI
US4799220A (en) * 1987-02-19 1989-01-17 Grumman Aerospace Corporation Dynamic system for testing an equipment

Also Published As

Publication number Publication date
GB8826921D0 (en) 1988-12-21
GB2225866A (en) 1990-06-13

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)