GB2253710B - Test circuit - Google Patents

Test circuit

Info

Publication number
GB2253710B
GB2253710B GB9206130A GB9206130A GB2253710B GB 2253710 B GB2253710 B GB 2253710B GB 9206130 A GB9206130 A GB 9206130A GB 9206130 A GB9206130 A GB 9206130A GB 2253710 B GB2253710 B GB 2253710B
Authority
GB
United Kingdom
Prior art keywords
test circuit
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9206130A
Other versions
GB2253710A (en
GB9206130D0 (en
Inventor
Peter Brian Denyer
David Renshaw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Edinburgh
Original Assignee
University of Edinburgh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB898921561A external-priority patent/GB8921561D0/en
Application filed by University of Edinburgh filed Critical University of Edinburgh
Priority to GB9206130A priority Critical patent/GB2253710B/en
Publication of GB9206130D0 publication Critical patent/GB9206130D0/en
Publication of GB2253710A publication Critical patent/GB2253710A/en
Application granted granted Critical
Publication of GB2253710B publication Critical patent/GB2253710B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
GB9206130A 1989-09-23 1992-03-20 Test circuit Expired - Fee Related GB2253710B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9206130A GB2253710B (en) 1989-09-23 1992-03-20 Test circuit

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB898921561A GB8921561D0 (en) 1989-09-23 1989-09-23 Designs and procedures for testing integrated circuits containing sensor arrays
PCT/GB1990/001451 WO1991004498A1 (en) 1989-09-23 1990-09-20 Test circuit
GB9206130A GB2253710B (en) 1989-09-23 1992-03-20 Test circuit

Publications (3)

Publication Number Publication Date
GB9206130D0 GB9206130D0 (en) 1992-06-03
GB2253710A GB2253710A (en) 1992-09-16
GB2253710B true GB2253710B (en) 1993-08-25

Family

ID=26295966

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9206130A Expired - Fee Related GB2253710B (en) 1989-09-23 1992-03-20 Test circuit

Country Status (1)

Country Link
GB (1) GB2253710B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2340997A (en) * 1998-08-26 2000-03-01 Lsi Logic Corp Optoelectronic integrated circuit and method of testing

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1984002580A1 (en) * 1982-12-27 1984-07-05 Storage Technology Partners Vlsi chip with integral testing circuit
EP0223714A2 (en) * 1985-11-20 1987-05-27 Fujitsu Limited Semiconductor integrated circuit device with test circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1984002580A1 (en) * 1982-12-27 1984-07-05 Storage Technology Partners Vlsi chip with integral testing circuit
EP0223714A2 (en) * 1985-11-20 1987-05-27 Fujitsu Limited Semiconductor integrated circuit device with test circuit

Non-Patent Citations (9)

* Cited by examiner, † Cited by third party
Title
(Bellingham,Washington US). EL Dereniak et al Microprocessor-based charge coupled *
1987 *
continue to improve their image" pages 64-67 *
device test console"(pages 942-944) *
et al "A self-testing ALU using built-in current sensing" pages2211-2214 *
Journal of Electronic Engineering Vol.25 No.263 Nov 1988 (Tokyo JP) A.Asano "Solid state sensors *
Optical Engineering Vol.21 No.5 Sept-Oct 1982 Soc. Photo- Optical Instrumentation Engineers *
Patent Abstracts of Japan Vol 11 No.265(E-535)(2712) 27 Aug.1987 and JP6269671 A MATSUSHITA 30 March *
Proc.IEEE 1989 Custom Integrated Circuits Conference,15-18 May 1989 San Diego California P Nigh *

Also Published As

Publication number Publication date
GB2253710A (en) 1992-09-16
GB9206130D0 (en) 1992-06-03

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040920