GB8826921D0 - Circuit testing - Google Patents
Circuit testingInfo
- Publication number
- GB8826921D0 GB8826921D0 GB888826921A GB8826921A GB8826921D0 GB 8826921 D0 GB8826921 D0 GB 8826921D0 GB 888826921 A GB888826921 A GB 888826921A GB 8826921 A GB8826921 A GB 8826921A GB 8826921 D0 GB8826921 D0 GB 8826921D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- circuit testing
- testing
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB888826921A GB8826921D0 (en) | 1988-11-17 | 1988-11-17 | Circuit testing |
GB8925711A GB2225866A (en) | 1988-11-17 | 1989-11-14 | Testing electrical circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB888826921A GB8826921D0 (en) | 1988-11-17 | 1988-11-17 | Circuit testing |
Publications (1)
Publication Number | Publication Date |
---|---|
GB8826921D0 true GB8826921D0 (en) | 1988-12-21 |
Family
ID=10647024
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB888826921A Pending GB8826921D0 (en) | 1988-11-17 | 1988-11-17 | Circuit testing |
GB8925711A Withdrawn GB2225866A (en) | 1988-11-17 | 1989-11-14 | Testing electrical circuits |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8925711A Withdrawn GB2225866A (en) | 1988-11-17 | 1989-11-14 | Testing electrical circuits |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB8826921D0 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW253097B (en) * | 1992-03-02 | 1995-08-01 | At & T Corp |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4357703A (en) * | 1980-10-09 | 1982-11-02 | Control Data Corporation | Test system for LSI circuits resident on LSI chips |
US4450560A (en) * | 1981-10-09 | 1984-05-22 | Teradyne, Inc. | Tester for LSI devices and memory devices |
GB2144228B (en) * | 1983-07-13 | 1987-08-05 | Instrumentation Engineering | Digital pin electronics module for computerized automatic diagnostic testing systems |
GB8411733D0 (en) * | 1984-05-09 | 1984-06-13 | Gen Electric Co Plc | Integrated circuit testing arrangements |
US4635261A (en) * | 1985-06-26 | 1987-01-06 | Motorola, Inc. | On chip test system for configurable gate arrays |
US4680761A (en) * | 1986-01-30 | 1987-07-14 | Burkness Donald C | Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VLSI |
US4799220A (en) * | 1987-02-19 | 1989-01-17 | Grumman Aerospace Corporation | Dynamic system for testing an equipment |
-
1988
- 1988-11-17 GB GB888826921A patent/GB8826921D0/en active Pending
-
1989
- 1989-11-14 GB GB8925711A patent/GB2225866A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
GB2225866A (en) | 1990-06-13 |
GB8925711D0 (en) | 1990-01-04 |
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