ES8601486A1 - Digital pin electronics module for computerized automatic diagnostic testing systems - Google Patents

Digital pin electronics module for computerized automatic diagnostic testing systems

Info

Publication number
ES8601486A1
ES8601486A1 ES534331A ES534331A ES8601486A1 ES 8601486 A1 ES8601486 A1 ES 8601486A1 ES 534331 A ES534331 A ES 534331A ES 534331 A ES534331 A ES 534331A ES 8601486 A1 ES8601486 A1 ES 8601486A1
Authority
ES
Spain
Prior art keywords
uut
pattern
stored
data
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES534331A
Other languages
Spanish (es)
Other versions
ES534331A0 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSTRUMENTATION ENGINEERING
Original Assignee
INSTRUMENTATION ENGINEERING
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INSTRUMENTATION ENGINEERING filed Critical INSTRUMENTATION ENGINEERING
Publication of ES534331A0 publication Critical patent/ES534331A0/en
Publication of ES8601486A1 publication Critical patent/ES8601486A1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

The word generator transmits test data or patterns to a unit under test (UUT). It then collects the output or response patterns of the UUT and compares them with a pre-generated expected data pattern stored in a RAM memory. The memory is programmed with a specific response pattern corresponding to the UUT known state. The UUT is then massaged with stimulus data, and its output monitored until it matches the stored pattern. - Where a UUT produces an incorrect response requiring further analysis by the host computer, a mask pattern is stored in the memory. The mask is used to mask out 'don't care' portions of the error data to be transmitted to the host. The pattern is 01D'ed with the error data prior to the latter being sent to the host computer.
ES534331A 1983-07-13 1984-07-13 Digital pin electronics module for computerized automatic diagnostic testing systems Expired ES8601486A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US51335483A 1983-07-13 1983-07-13

Publications (2)

Publication Number Publication Date
ES534331A0 ES534331A0 (en) 1985-10-16
ES8601486A1 true ES8601486A1 (en) 1985-10-16

Family

ID=24042907

Family Applications (1)

Application Number Title Priority Date Filing Date
ES534331A Expired ES8601486A1 (en) 1983-07-13 1984-07-13 Digital pin electronics module for computerized automatic diagnostic testing systems

Country Status (2)

Country Link
ES (1) ES8601486A1 (en)
GB (1) GB2144228B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3515802A1 (en) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT FOR FAST GENERATION OF LARGE TESTING DATA WORDS IN A TESTING DEVICE
DE3633464A1 (en) * 1986-10-01 1988-04-14 Siemens Ag TEST SYSTEM FOR DIGITAL CIRCUITS
US4799220A (en) * 1987-02-19 1989-01-17 Grumman Aerospace Corporation Dynamic system for testing an equipment
FR2615975A1 (en) * 1987-05-29 1988-12-02 Mo Aviat I DATA TRAINER AND AUTOMATIC TESTER WITH GROUPS OF SUCH TRAINERS IN APPLICATION
GB8826921D0 (en) * 1988-11-17 1988-12-21 Datatrace Ltd Circuit testing
CA2038295A1 (en) * 1990-03-16 1991-09-17 Brian Jerrold Arkin High speed fail processor
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
RU2363975C2 (en) * 2007-03-23 2009-08-10 Открытое Акционерное Общество "Дольта" Portable programmable-diagnostics complex
US9449714B2 (en) * 2013-08-14 2016-09-20 Advantest Corporation Flexible interrupt generation mechanism

Also Published As

Publication number Publication date
ES534331A0 (en) 1985-10-16
GB2144228A (en) 1985-02-27
GB8417901D0 (en) 1984-08-15
GB2144228B (en) 1987-08-05

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