JPS5527907A - Logic tester - Google Patents

Logic tester

Info

Publication number
JPS5527907A
JPS5527907A JP10006278A JP10006278A JPS5527907A JP S5527907 A JPS5527907 A JP S5527907A JP 10006278 A JP10006278 A JP 10006278A JP 10006278 A JP10006278 A JP 10006278A JP S5527907 A JPS5527907 A JP S5527907A
Authority
JP
Japan
Prior art keywords
circuit
tested
decision
signals
check
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10006278A
Other languages
Japanese (ja)
Other versions
JPS6046667B2 (en
Inventor
Toshiyuki Nakao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP53100062A priority Critical patent/JPS6046667B2/en
Publication of JPS5527907A publication Critical patent/JPS5527907A/en
Publication of JPS6046667B2 publication Critical patent/JPS6046667B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To check intermittent abnormalities quickly by making multiple sampling in one cycle of decision results of tested logical signals.
CONSTITUTION: A tested logic circuit 12 transfers determined output from a tester control circuit 15 to a check circuit 13 in response to a special pattern. In the circuit 13 a comparison circuit 31 compares tested signals with a threshold value by the level, supplies test signals to a decision circuit 32. The coincidence of the logical level with an expected value pattern is decided and the decision outputs are written in a fail memory 33 one after another by use of a multiple sampling clock.
COPYRIGHT: (C)1980,JPO&Japio
JP53100062A 1978-08-18 1978-08-18 logic tester Expired JPS6046667B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53100062A JPS6046667B2 (en) 1978-08-18 1978-08-18 logic tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53100062A JPS6046667B2 (en) 1978-08-18 1978-08-18 logic tester

Publications (2)

Publication Number Publication Date
JPS5527907A true JPS5527907A (en) 1980-02-28
JPS6046667B2 JPS6046667B2 (en) 1985-10-17

Family

ID=14263973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53100062A Expired JPS6046667B2 (en) 1978-08-18 1978-08-18 logic tester

Country Status (1)

Country Link
JP (1) JPS6046667B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2026079A3 (en) * 2007-08-14 2009-03-25 Fluke Corporation Digital multimeter having improved recording functionality
US8076926B2 (en) 2007-08-14 2011-12-13 Fluke Corporation Rotary switch memory for digital multimeter
US8198884B2 (en) 2007-08-14 2012-06-12 Fluke Corporation Mini-measurement display for digital multimeter
US8269481B2 (en) 2007-08-14 2012-09-18 Fluke Corporation Automatic capture and storage of measurements in digital multimeter
US8456152B2 (en) 2007-08-14 2013-06-04 Fluke Corporation Digital multimeter with context-sensitive explanatory information
US8456153B2 (en) 2007-08-14 2013-06-04 Fluke Corporation Digital multimeter having improved recording functionality
US9347975B2 (en) 2007-08-14 2016-05-24 Fluke Corporation Auto-numbering of measurements in digital multimeter

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2026079A3 (en) * 2007-08-14 2009-03-25 Fluke Corporation Digital multimeter having improved recording functionality
US7679356B2 (en) 2007-08-14 2010-03-16 Fluke Corporation Digital multimeter having improved recording functionality
US8076926B2 (en) 2007-08-14 2011-12-13 Fluke Corporation Rotary switch memory for digital multimeter
US8198884B2 (en) 2007-08-14 2012-06-12 Fluke Corporation Mini-measurement display for digital multimeter
US8269481B2 (en) 2007-08-14 2012-09-18 Fluke Corporation Automatic capture and storage of measurements in digital multimeter
US8456152B2 (en) 2007-08-14 2013-06-04 Fluke Corporation Digital multimeter with context-sensitive explanatory information
US8456153B2 (en) 2007-08-14 2013-06-04 Fluke Corporation Digital multimeter having improved recording functionality
US9347975B2 (en) 2007-08-14 2016-05-24 Fluke Corporation Auto-numbering of measurements in digital multimeter
US9739803B2 (en) 2007-08-14 2017-08-22 Fluke Corporation Auto-numbering of measurements in digital multimeter
US10191087B2 (en) 2007-08-14 2019-01-29 Fluke Corporation Automated storage of successive stable measurements in a digital multimeter

Also Published As

Publication number Publication date
JPS6046667B2 (en) 1985-10-17

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