JPS5549761A - Logical operation circuit testing unit - Google Patents
Logical operation circuit testing unitInfo
- Publication number
- JPS5549761A JPS5549761A JP12224578A JP12224578A JPS5549761A JP S5549761 A JPS5549761 A JP S5549761A JP 12224578 A JP12224578 A JP 12224578A JP 12224578 A JP12224578 A JP 12224578A JP S5549761 A JPS5549761 A JP S5549761A
- Authority
- JP
- Japan
- Prior art keywords
- operation circuit
- logical operation
- circuit
- tri
- output pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE: To facilitate a test for a large-scale logical operation circuit by providing a means which applies test data to the output pin in a high-impedance state of a tri- state element in the ligical operation circuit.
CONSTITUTION: Logical operation circuit 1 consists of IC 3 mounted on IC board 2, tri-state element 4 which can take a high-impedance state besides binary states, external input terminal 5, external output terminal 6, output pin 7 in the high-impedance state of tri-state element 4, observation point 8 and clock terminal 9. The test pattern stored in testpattern storage circuit 19 is applied to output pin 7, and the operation result of logical operation circuit 1 for the test pattern above is read from external output terminal 6 or observation point 8 and is sent to output comparator circuit 17 through I/0 control circuit 14 and is compared with a correct solution value.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12224578A JPS5549761A (en) | 1978-10-03 | 1978-10-03 | Logical operation circuit testing unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12224578A JPS5549761A (en) | 1978-10-03 | 1978-10-03 | Logical operation circuit testing unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5549761A true JPS5549761A (en) | 1980-04-10 |
Family
ID=14831177
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12224578A Pending JPS5549761A (en) | 1978-10-03 | 1978-10-03 | Logical operation circuit testing unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5549761A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6028208A (en) * | 1983-07-27 | 1985-02-13 | 松下電器産業株式会社 | Method of assembling resistor |
JPS6478331A (en) * | 1987-09-19 | 1989-03-23 | Fujitsu Ltd | Automatic production system for test pattern |
-
1978
- 1978-10-03 JP JP12224578A patent/JPS5549761A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6028208A (en) * | 1983-07-27 | 1985-02-13 | 松下電器産業株式会社 | Method of assembling resistor |
JPH0546081B2 (en) * | 1983-07-27 | 1993-07-13 | Matsushita Electric Ind Co Ltd | |
JPS6478331A (en) * | 1987-09-19 | 1989-03-23 | Fujitsu Ltd | Automatic production system for test pattern |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5549761A (en) | Logical operation circuit testing unit | |
JPS5338373A (en) | Ic for watch | |
JPS5527907A (en) | Logic tester | |
JPS5552967A (en) | Pattern signal generator | |
JPS5515559A (en) | Test input circuit of microcomputer | |
JPS5564699A (en) | Semiconductor integrated-circuit memory | |
JPS53118327A (en) | Automatic test data generator | |
JPS5395545A (en) | Test method of electronic circuit | |
JPS5556262A (en) | Operation hysteresis retention system | |
JPS5479569A (en) | Intergrated circuit | |
JPS5444480A (en) | Package for integrated circuit | |
JPS5549757A (en) | Test method of testing shift path | |
JPS5487029A (en) | Information transfer system | |
JPS52113259A (en) | Testing mechanism for electronic clock | |
JPS5587963A (en) | System for testing semiconductor integrated circuit element | |
JPS6479673A (en) | Test system for ram contained lsi chip | |
JPS55935A (en) | Signal synchronization system | |
JPS554683A (en) | Test device for logic circuit | |
JPS5422137A (en) | Bus line chekcing device | |
JPS55110341A (en) | Logic circuit | |
JPS5563767A (en) | Package with two stage terminal | |
JPS6435675A (en) | Testing device for ic card | |
JPS5476037A (en) | Pla logic circuit | |
JPS5379329A (en) | Test method of memory circuit | |
JPS5694453A (en) | Test signal generating device |